31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
IEEE 216:1960 (R1980)

IEEE 216:1960 (R1980)

Withdrawn Most Recent

IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms

€14.77

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IEEE 255:1963

IEEE 255:1963

Withdrawn Most Recent

IEEE Standard Letter Symbols for Semiconductor Devices

€55.92

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IEEE 428:1981

IEEE 428:1981

Withdrawn Most Recent

IEEE Standard Definitions and Requirements for Thyristor AC Power Controllers

€52.75

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IEEE 449:1990

IEEE 449:1990

Superseded Historical

IEEE Standard for Ferroresonant Voltage Regulators

€92.00

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IEEE 449:1998 (R2007)

IEEE 449:1998 (R2007)

Withdrawn Most Recent

IEEE Standard for Ferroresonant Voltage Regulators

€132.93

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IEEE 581:1978

IEEE 581:1978

Withdrawn Most Recent

IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors

€55.92

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IEEE 641:1987

IEEE 641:1987

Withdrawn Most Recent

IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays

€99.00

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IEEE 1005:1991

IEEE 1005:1991

Superseded Historical

IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays

€102.34

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IEEE 1005:1998

IEEE 1005:1998

Withdrawn Most Recent

IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays

€181.46

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IEEE C62.37:1996 (R2010)

IEEE C62.37:1996 (R2010)

Withdrawn Most Recent

IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices

€159.31

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IEEE C62.37.1:2000

IEEE C62.37.1:2000

Superseded Historical

IEEE Guide for the Application of Thyristor Surge Protective Devices

€133.99

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IEEE/ANSI N42.31:2003

IEEE/ANSI N42.31:2003

Active Most Recent

American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation

€92.00

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IEEE 1620:2004

IEEE 1620:2004

Superseded Historical

Standard for Test Methods for the Characterization of Organic Transistors and Materials

€148.76

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IEEE 1620.1:2006 (R2012)

IEEE 1620.1:2006 (R2012)

Withdrawn Most Recent

IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators

€91.79

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IEEE 1620:2008

IEEE 1620:2008

Withdrawn Most Recent

IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

€97.00

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