31.080.30 : Transistors

IEEE 581:1978

IEEE 581:1978

Withdrawn Most Recent

IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors

€55.92

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IEEE 1005:1991

IEEE 1005:1991

Superseded Historical

IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays

€102.34

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IEEE 1005:1998

IEEE 1005:1998

Withdrawn Most Recent

IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays

€181.46

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IEEE 1620:2004

IEEE 1620:2004

Superseded Historical

Standard for Test Methods for the Characterization of Organic Transistors and Materials

€148.76

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IEEE 1620.1:2006 (R2012)

IEEE 1620.1:2006 (R2012)

Withdrawn Most Recent

IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators

€91.79

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IEEE 1620:2008

IEEE 1620:2008

Withdrawn Most Recent

IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

€97.00

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IEEE/IEC 62860:2013

IEEE/IEC 62860:2013

Active Most Recent

IEC/IEEE Test methods for the characterization of organic transistors and materials

€219.44

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IEEE/IEC 62860-1:2013

IEEE/IEC 62860-1:2013

Active Most Recent

IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators

€155.09

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