IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
€60.14
IEEE Guide for the Application of Thyristor Surge Protective Device Components
€145.59
IEC/IEEE Test methods for the characterization of organic transistors and materials
€219.44
IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
€155.09
IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
€69.63
