IEEE 1620:2004

New IEEE Standard - Superseded.
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

This project will develop standard methods for the characterization of organic transistors and materials. The methods will be independent of processing routes used to fabricate the transistors. The characterization methods will be usable for all transistors comprised of organic semiconductor materials.
There is currently no defined standard for characterizing organic transistors and materials and means of reporting performance and other data. This is intended to replace the diverse sets of procedures and measurements currently being used. However, without openly defined standard test methods the acceptance and diffusion of organic semiconductor technology will be severely impeded. These methods will enable the creation of a testing and reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will provide the necessary tools and procedures for validation.