Superseded
Standard
Historical
IEEE 592:2007
IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors
Summary
Revision Standard - Superseded.
Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.
This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.
This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
Notes
Superseded
Technical characteristics
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Publication Date | 05/08/2008 |
| Edition | |
| Page Count | 10 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
| Brochures |
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Amendments replaces
05/02/1991
Superseded
, Confirmed
Historical
Previous versions
08/05/2008
Superseded
Historical
05/02/1991
Superseded
, Confirmed
Historical
