Superseded
, Confirmed
Standard
Historical
IEEE 592:1990 (R1996)
IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors
Summary
Revision Standard - Inactive-Withdrawn.
This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
Notes
Inactive-Withdrawn
Technical characteristics
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Publication Date | 02/05/1991 |
| Confirmation Date | 09/19/1996 |
| Cancellation Date | 02/07/2003 |
| Edition | |
| Page Count | 10 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
| Brochures |
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Amendments replaces
Previous versions
08/05/2008
Superseded
Historical
05/02/1991
Superseded
, Confirmed
Historical