Superseded
Standard
Historical
IEEE 1671.6:2008
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
Summary
New IEEE Standard - Superseded.
An exchange format, utilizing XML, for identifying all of the hardware, software, and
documentation associated with a test station is specified in this document. This test station may
be used as a component of a test program set to test and diagnose a unit under test.
The scope of this standard is the definition of an exchange format, utilizing XML, for exchanging the test station information by defining the description of the test station (e.g., physical and electrical characteristics, components, capabilities/performance, and identification/classification).
The purpose of this standard is to provide a standardized format to promote and facilitate interoperability
between components of non-manual test systems, by allowing exchange of test station information. The
Test Station Schema becomes a class of information that can be used within the ATML family of standards.
Each instance document contains the definition of a single test station model. The Test Station schema
provides a structure for describing test station capabilities and structure.
This standard will allow common test station information to be transportable across a variety of ATE
within the automotive, semiconductor, aerospace and military industries.
An exchange format, utilizing XML, for identifying all of the hardware, software, and
documentation associated with a test station is specified in this document. This test station may
be used as a component of a test program set to test and diagnose a unit under test.
The scope of this standard is the definition of an exchange format, utilizing XML, for exchanging the test station information by defining the description of the test station (e.g., physical and electrical characteristics, components, capabilities/performance, and identification/classification).
The purpose of this standard is to provide a standardized format to promote and facilitate interoperability
between components of non-manual test systems, by allowing exchange of test station information. The
Test Station Schema becomes a class of information that can be used within the ATML family of standards.
Each instance document contains the definition of a single test station model. The Test Station schema
provides a structure for describing test station capabilities and structure.
This standard will allow common test station information to be transportable across a variety of ATE
within the automotive, semiconductor, aerospace and military industries.
Notes
Superseded
Technical characteristics
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Publication Date | 02/01/2013 |
| Edition | |
| Page Count | 34 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
| Brochures |
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08/05/2015
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