Superseded
Standard
Historical
IEEE 1671:2006
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Summary
New IEEE Standard - Superseded.
This document specifies the framework for the family of ATML standards. ATML defines a standard exchange medium for sharing information between components of an Automatic Test System (ATS), utilizing the eXtensible Markup Language (XML).
ATML defines a standard exchange medium for sharing information between components of automatic test systems. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using the eXtensible Markup Language (XML). This document specifies the framework for the family of ATML standards.
The purpose of ATML is to support test program, test asset, and Unit Under Test (UUT) interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this document is to provide an overview of ATML goals as well as to provide guidance for usage of the ATML family of standards.
This document specifies the framework for the family of ATML standards. ATML defines a standard exchange medium for sharing information between components of an Automatic Test System (ATS), utilizing the eXtensible Markup Language (XML).
ATML defines a standard exchange medium for sharing information between components of automatic test systems. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using the eXtensible Markup Language (XML). This document specifies the framework for the family of ATML standards.
The purpose of ATML is to support test program, test asset, and Unit Under Test (UUT) interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this document is to provide an overview of ATML goals as well as to provide guidance for usage of the ATML family of standards.
Notes
Superseded
Technical characteristics
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Publication Date | 12/15/2006 |
| Edition | |
| Page Count | 89 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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