IEEE 1671.5:2008

New IEEE Standard - Superseded.
An exchange format, utilizing XML, for identifying all of the hardware, software, and
documentation associated with a test station is specified in this document. This test station may
be used as a component of a test program set to test and diagnose a unit under test.

The scope of this trial-use standard is the definition of an exchange format, utilizing XML, for exchanging the test adapter information by defining the interface between the UUT and the test station, which includes the description of the test adapter (e.g., physical and electrical characteristics, capabilities/performance, and identification/classification).
The purpose of this standard is to provide a standardized format to promote and facilitate interoperability between components of non-manual test systems, by allowing the exchange of test adapter information. The test adapter schema becomes a class of information that can be used within the ATML family of standards.
Each instance document contains the definition of a single test adapter model. The test adapter schema provides a structure for describing test adapter capabilities and structure.
This standard will allow test adapter information to be transportable across a variety of automatic test equipment (ATE) within the automotive, semiconductor, aerospace, and military industries.