IEEE/IEC 62860-1:2013

Adoption Standard - Active.
Recommended methods and standardized reporting practices for electrical
characterization of printed and organic ring oscillators are covered. Due to the nature of printed
and organic circuits, significant measurement errors can be introduced if the electrical
characterization design-of-experiment is not properly addressed. This standard describes the
most common sources of measurement error, particularly for high-impedance electrical
measurements commonly required for printed and organic ring oscillators. This standard also
gives recommended practices in order to minimize and/or characterize the effect of measurement
artifacts and other sources of error encountered while measuring printed and organic ring
oscillators.

This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
The purpose of this standard is to provide a method for systematically characterizing organic transistorbased
ring oscillators. This standard is intended to maximize reproducibility of published results by
providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.