IEEE 930:2004 (R2010)

Revision Standard - Active.
Replaced by IEC 62539 Ed.1 (2007-07). This guide describes, with examples, statistical methods to analyze times to breakdown and breakdown voltage data obtained from electrical testing of solid insulating materials, for purposes including characterization of the system, comparison with another insulator system, and prediction of the probability of breakdown at given times or voltages.

To prepare a guide describing statistical methods to analyze breakdown test data (at constant or increasing voltage) for purposes including characterization of an insulation system, comparison with other systems and prediction of the probability of breakdown at given times or voltages. The statistical methods included in the guide are based on Weibull, lognormal and Gumbel distributions.
To provide statistical tools for the processing of life or breakdown voltage tests.