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IEEE 2824:2024

IEEE Draft Guide for Testing Mechanical Acoustic Imaging of High Voltage Reactors

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High voltage reactor generates sound during operation due to vibration with the action of electrical and mechanical stress. These sound signals contain rich state information about the reactor. Therefore, the measurement and research into reactor sound signals can aid the evaluation of equipment status. The development of acoustic imaging technology also provides a solid technical foundation for locating abnormal noise in reactors. Acoustic imaging technology allows researchers to obtain the distribution of the sound field of reactor with a microphone array. Combined with knowledge of the reactor structure and operating status, this technology can effectively help researchers determine the position of a sound signal and diagnose the status of reactors. The characteristics of acoustic imaging technology include non-contact measurement, simple operation, and flexible arrangement. The measured results are important for diagnosing reactor status and identifying sound sources. To guide and provide instructions for the testing of on-site acoustic imaging for reactors, this guide is formulated to specify the test methods, provide the basic requirements and describe the test instruments, procedures, test data analysis methods, and data records, while providing guidance for the testing of acoustic imaging for reactor.

This guide defines test methodologies and technologies for mechanical acoustic imaging. Acoustic fault recognition mechanisms using acoustic imaging technology are described, enabling, for high voltage reactors, the identification and diagnosis of abnormal radiated noise in a reactor structure caused by mechanical structural abnormalities such as loose structural parts, metal foreign bodies and loose leads. Additional use cases and test considerations are described, to support fault acoustic signal testing of power transformers, switchers and gas insulated substation (GIS).

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Technical characteristics

Publisher Institute of Electrical and Electronics Engineers (IEEE)
Publication Date 12/23/2024
Page Count 43
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