Superseded
Standard
Historical
IEEE 1149.1:1990
IEEE Standard Test Access Port and Boundary-Scan Architecture
Summary
Revision Standard - Superseded.
Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.
Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.
Notes
Superseded
Technical characteristics
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Publication Date | 05/21/1990 |
| Edition | |
| Page Count | 139 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
| Brochures |
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No products.
Previous versions
13/05/2013
Withdrawn
Most Recent
23/07/2001
Superseded
, Confirmed
Historical
01/03/1995
Superseded
Historical
21/05/1990
Superseded
Historical