31.180 : Printed circuits and boards

IEEE 1101.7:1995

IEEE 1101.7:1995

Withdrawn Most Recent

IEEE Standard for Space Applications Module, Extended Height Format E Form Factor

€162.47

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IEEE 1149.1:1990

IEEE 1149.1:1990

Superseded Historical

IEEE Standard Test Access Port and Boundary-Scan Architecture

€162.47

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IEEE 1149.1:2001 (R2008)

IEEE 1149.1:2001 (R2008)

Superseded Historical

IEEE Standard Test Access Port and Boundary Scan Architecture

€169.86

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IEEE 1149.4:1999

IEEE 1149.4:1999

Superseded Historical

IEEE Standard for a Mixed-Signal Test Bus

€145.59

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IEEE 1532:2000

IEEE 1532:2000

Superseded Historical

IEEE Standard for In-System Configuration of Programmable Devices

€142.43

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IEEE 1687:2014

IEEE 1687:2014

Withdrawn Most Recent

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

€310.17

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IEEE 1149.4:2010

IEEE 1149.4:2010

Withdrawn Most Recent

IEEE Standard for a Mixed-Signal Test Bus

€269.03

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IEEE 1149.1:2013

IEEE 1149.1:2013

Withdrawn Most Recent

IEEE Standard for Test Access Port and Boundary-Scan Architecture

€335.49

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IEEE 1149.8.1:2012

IEEE 1149.8.1:2012

Withdrawn Most Recent

IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components

€95.00

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IEEE 1149.10:2017

IEEE 1149.10:2017

Active Most Recent

IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture

€94.00

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IEEE 370:2020

IEEE 370:2020

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IEEE Standard for Electrical Characterization of Printed Circuit Board and Related Interconnects at Frequencies up to 50 GHz

€144.00

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IEEE 2716:2022

IEEE 2716:2022

Active Most Recent

IEEE Guide for the Characterization of the Effectiveness of Printed Circuit Board Level Shielding

€73.85

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IEEE 1149.4:2024

IEEE 1149.4:2024

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IEEE Draft Standard for a Mixed-Signal Test Bus

€126.60

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