Symfony Profiler

Components

3 Twig Components

5 Render Count

2 ms Render Time

84.0 MiB Memory Usage

Components

Name	Metadata	Render Count	Render Time
ProductState	"App\Twig\Components\ProductState" components/ProductState.html.twig	2	0.57ms
ProductMostRecent	"App\Twig\Components\ProductMostRecent" components/ProductMostRecent.html.twig	2	1.48ms
ProductType	"App\Twig\Components\ProductType" components/ProductType.html.twig	1	0.22ms

Render calls

ProductState	App\Twig\Components\ProductState	84.0 MiB	0.30 ms
Input props	["product" => App\Entity\Product\Product {#7310 #id: 10366 #code: "IEEE00004252" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039017 {#7274 date: 2025-06-27 17:43:37.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 36473 #name: "IEEE/IEC 62526:2007" #slug: "ieee-iec-62526-2007-ieee00004252-242018" #description: """ New IEEE Standard - Active.<br />\n Standard Test Interface Language (STIL) provides an interface between digital test<br />\n generation tools and test equipment. Extensions to the test interface language (contained in this<br />\n standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n (2) facilitate the use of the language for large designs encompassing subdesigns with reusable<br />\n patterns.<br />\n \t\t\t\t<br />\n Structures are defined in STIL to support usage as semiconductor simulation stimulus, including<br />\n (1) mapping signal names to equivalent design references, (2) interface between scan and built-in self test<br />\n (BIST) and the logic simulation, (3) data types to represent unresolved states in a pattern, (4) parallel or<br />\n asynchronous pattern execution on different design blocks, and (5) expression-based conditional execution<br />\n of pattern constructs.<br />\n Structures are defined in STIL to support the definition of test patterns for sub-blocks of a design4<br />\n (i.e., embedded cores) such that these tests can be incorporated into a complete higher level device test.<br />\n Structures are defined in STIL to relate fail information from device testing environments back to original<br />\n stimulus and design data elements.<br />\n 4 Syntax in this document that is used in the definition of patterns for sub-blocks is summarized in Annex O.<br />\n The STIL language definition is enhanced to support the usage of STIL in the design environment, which<br />\n includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used<br />\n as an intermediate form of data, and to allow STIL to capture design information needed to port simulation<br />\n data to device test environments.<br />\n In addition, define extensions to support the definition of subelement tests and to define the mechanisms to<br />\n integrate those tests into a complete device test. This effort is to be performed in conjunction with<br />\n IEEE Std 1500TM-2005 [B6] and IEEE P1450.6 [B5], which are defining standards for the definition and<br />\n integration of embedded cores.<br />\n Finally, define the constructs necessary to correlate test failure information back to the design environment,<br />\n to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1197154800 {#7318 date: 2007-12-09 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62526" -bookCollection: "" -pageCount: 128 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } "showFullLabel" => "true"]
Attributes	[`"showFullLabel" => "true"`]
Component	App\Twig\Components\ProductState {#93007+product: App\Entity\Product\Product {#7310 #id: 10366 #code: "IEEE00004252" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039017 {#7274 date: 2025-06-27 17:43:37.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 36473 #name: "IEEE/IEC 62526:2007" #slug: "ieee-iec-62526-2007-ieee00004252-242018" #description: """ New IEEE Standard - Active.<br />\n Standard Test Interface Language (STIL) provides an interface between digital test<br />\n generation tools and test equipment. Extensions to the test interface language (contained in this<br />\n standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n (2) facilitate the use of the language for large designs encompassing subdesigns with reusable<br />\n patterns.<br />\n \t\t\t\t<br />\n Structures are defined in STIL to support usage as semiconductor simulation stimulus, including<br />\n (1) mapping signal names to equivalent design references, (2) interface between scan and built-in self test<br />\n (BIST) and the logic simulation, (3) data types to represent unresolved states in a pattern, (4) parallel or<br />\n asynchronous pattern execution on different design blocks, and (5) expression-based conditional execution<br />\n of pattern constructs.<br />\n Structures are defined in STIL to support the definition of test patterns for sub-blocks of a design4<br />\n (i.e., embedded cores) such that these tests can be incorporated into a complete higher level device test.<br />\n Structures are defined in STIL to relate fail information from device testing environments back to original<br />\n stimulus and design data elements.<br />\n 4 Syntax in this document that is used in the definition of patterns for sub-blocks is summarized in Annex O.<br />\n The STIL language definition is enhanced to support the usage of STIL in the design environment, which<br />\n includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used<br />\n as an intermediate form of data, and to allow STIL to capture design information needed to port simulation<br />\n data to device test environments.<br />\n In addition, define extensions to support the definition of subelement tests and to define the mechanisms to<br />\n integrate those tests into a complete device test. This effort is to be performed in conjunction with<br />\n IEEE Std 1500TM-2005 [B6] and IEEE P1450.6 [B5], which are defining standards for the definition and<br />\n integration of embedded cores.<br />\n Finally, define the constructs necessary to correlate test failure information back to the design environment,<br />\n to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1197154800 {#7318 date: 2007-12-09 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62526" -bookCollection: "" -pageCount: 128 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } +appearance: "state-active" +labels: [ "Active" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}}

ProductState

App\Twig\Components\ProductState

84.0 MiB

0.30 ms

Input props

[
  "product" => App\Entity\Product\Product {#7310
    #id: 10366
    #code: "IEEE00004252"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039017 {#7274
      date: 2025-06-27 17:43:37.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 36473
        #name: "IEEE/IEC 62526:2007"
        #slug: "ieee-iec-62526-2007-ieee00004252-242018"
        #description: """
          New IEEE Standard - Active.<br />\n
          Standard Test Interface Language (STIL) provides an interface between digital test<br />\n
          generation tools and test equipment. Extensions to the test interface language (contained in this<br />\n
          standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n
          (2) facilitate the use of the language for large designs encompassing subdesigns with reusable<br />\n
          patterns.<br />\n
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          Structures are defined in STIL to support usage as semiconductor simulation stimulus, including<br />\n
          (1) mapping signal names to equivalent design references, (2) interface between scan and built-in self test<br />\n
          (BIST) and the logic simulation, (3) data types to represent unresolved states in a pattern, (4) parallel or<br />\n
          asynchronous pattern execution on different design blocks, and (5) expression-based conditional execution<br />\n
          of pattern constructs.<br />\n
          Structures are defined in STIL to support the definition of test patterns for sub-blocks of a design4<br />\n
          (i.e., embedded cores) such that these tests can be incorporated into a complete higher level device test.<br />\n
          Structures are defined in STIL to relate fail information from device testing environments back to original<br />\n
          stimulus and design data elements.<br />\n
          4 Syntax in this document that is used in the definition of patterns for sub-blocks is summarized in Annex O.<br />\n
          The STIL language definition is enhanced to support the usage of STIL in the design environment, which<br />\n
          includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used<br />\n
          as an intermediate form of data, and to allow STIL to capture design information needed to port simulation<br />\n
          data to device test environments.<br />\n
          In addition, define extensions to support the definition of subelement tests and to define the mechanisms to<br />\n
          integrate those tests into a complete device test. This effort is to be performed in conjunction with<br />\n
          IEEE Std 1500TM-2005 [B6] and IEEE P1450.6 [B5], which are defining standards for the definition and<br />\n
          integration of embedded cores.<br />\n
          Finally, define the constructs necessary to correlate test failure information back to the design environment,<br />\n
          to allow debug and diagnosis operations to be performed based on failure information in STIL format.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1197154800 {#7318
      date: 2007-12-09 00:00:00.0 Europe/Paris (+01:00)
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    -releasedAt: null
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    -canceledAt: null
    -edition: null
    -coreDocument: "62526"
    -bookCollection: ""
    -pageCount: 128
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  "showFullLabel" => "true"
]

Attributes

[
  "showFullLabel" => "true"
]

Component

App\Twig\Components\ProductState {#93007
  +product: App\Entity\Product\Product {#7310
    #id: 10366
    #code: "IEEE00004252"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039017 {#7274
      date: 2025-06-27 17:43:37.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 36473
        #name: "IEEE/IEC 62526:2007"
        #slug: "ieee-iec-62526-2007-ieee00004252-242018"
        #description: """
          New IEEE Standard - Active.<br />\n
          Standard Test Interface Language (STIL) provides an interface between digital test<br />\n
          generation tools and test equipment. Extensions to the test interface language (contained in this<br />\n
          standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n
          (2) facilitate the use of the language for large designs encompassing subdesigns with reusable<br />\n
          patterns.<br />\n
          \t\t\t\t<br />\n
          Structures are defined in STIL to support usage as semiconductor simulation stimulus, including<br />\n
          (1) mapping signal names to equivalent design references, (2) interface between scan and built-in self test<br />\n
          (BIST) and the logic simulation, (3) data types to represent unresolved states in a pattern, (4) parallel or<br />\n
          asynchronous pattern execution on different design blocks, and (5) expression-based conditional execution<br />\n
          of pattern constructs.<br />\n
          Structures are defined in STIL to support the definition of test patterns for sub-blocks of a design4<br />\n
          (i.e., embedded cores) such that these tests can be incorporated into a complete higher level device test.<br />\n
          Structures are defined in STIL to relate fail information from device testing environments back to original<br />\n
          stimulus and design data elements.<br />\n
          4 Syntax in this document that is used in the definition of patterns for sub-blocks is summarized in Annex O.<br />\n
          The STIL language definition is enhanced to support the usage of STIL in the design environment, which<br />\n
          includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used<br />\n
          as an intermediate form of data, and to allow STIL to capture design information needed to port simulation<br />\n
          data to device test environments.<br />\n
          In addition, define extensions to support the definition of subelement tests and to define the mechanisms to<br />\n
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          IEEE Std 1500TM-2005 [B6] and IEEE P1450.6 [B5], which are defining standards for the definition and<br />\n
          integration of embedded cores.<br />\n
          Finally, define the constructs necessary to correlate test failure information back to the design environment,<br />\n
          to allow debug and diagnosis operations to be performed based on failure information in STIL format.
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        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments"
        -notes: "Active"
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    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1197154800 {#7318
      date: 2007-12-09 00:00:00.0 Europe/Paris (+01:00)
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    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62526"
    -bookCollection: ""
    -pageCount: 128
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +appearance: "state-active"
  +labels: [
    "Active"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

ProductType	App\Twig\Components\ProductType	84.0 MiB	0.22 ms
Input props	["product" => App\Entity\Product\Product {#7310 #id: 10366 #code: "IEEE00004252" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039017 {#7274 date: 2025-06-27 17:43:37.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 36473 #name: "IEEE/IEC 62526:2007" #slug: "ieee-iec-62526-2007-ieee00004252-242018" #description: """ New IEEE Standard - Active.<br />\n Standard Test Interface Language (STIL) provides an interface between digital test<br />\n generation tools and test equipment. Extensions to the test interface language (contained in this<br />\n standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n (2) facilitate the use of the language for large designs encompassing subdesigns with reusable<br />\n patterns.<br />\n \t\t\t\t<br />\n Structures are defined in STIL to support usage as semiconductor simulation stimulus, including<br />\n (1) mapping signal names to equivalent design references, (2) interface between scan and built-in self test<br />\n (BIST) and the logic simulation, (3) data types to represent unresolved states in a pattern, (4) parallel or<br />\n asynchronous pattern execution on different design blocks, and (5) expression-based conditional execution<br />\n of pattern constructs.<br />\n Structures are defined in STIL to support the definition of test patterns for sub-blocks of a design4<br />\n (i.e., embedded cores) such that these tests can be incorporated into a complete higher level device test.<br />\n Structures are defined in STIL to relate fail information from device testing environments back to original<br />\n stimulus and design data elements.<br />\n 4 Syntax in this document that is used in the definition of patterns for sub-blocks is summarized in Annex O.<br />\n The STIL language definition is enhanced to support the usage of STIL in the design environment, which<br />\n includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used<br />\n as an intermediate form of data, and to allow STIL to capture design information needed to port simulation<br />\n data to device test environments.<br />\n In addition, define extensions to support the definition of subelement tests and to define the mechanisms to<br />\n integrate those tests into a complete device test. This effort is to be performed in conjunction with<br />\n IEEE Std 1500TM-2005 [B6] and IEEE P1450.6 [B5], which are defining standards for the definition and<br />\n integration of embedded cores.<br />\n Finally, define the constructs necessary to correlate test failure information back to the design environment,<br />\n to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1197154800 {#7318 date: 2007-12-09 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62526" -bookCollection: "" -pageCount: 128 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} }]
Attributes	[]
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App\Twig\Components\ProductType

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ProductMostRecent	App\Twig\Components\ProductMostRecent	84.0 MiB	0.65 ms
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App\Twig\Components\ProductState

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ProductMostRecent

App\Twig\Components\ProductMostRecent

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  +label: "Most Recent"
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}

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