31.020 : Electronic components in general

IEEE 1641:2010

IEEE 1641:2010

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IEEE Standard for Signal and Test Definition

€491.63

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IEEE 1413:2010

IEEE 1413:2010

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IEEE Standard Framework for Reliability Prediction of Hardware

€99.17

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IEEE 1641.1:2013

IEEE 1641.1:2013

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IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition

€335.49

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IEEE 1573:2021

IEEE 1573:2021

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IEEE Recommended Practice for Electronic Power Subsystems: Parameters, Interfaces, Elements, and Performance

€141.37

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IEEE/IEC 62529:2012

IEEE/IEC 62529:2012

Superseded Historical

IEC 62529:2012(E) Standard for Signal and Test Definition

€382.97

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IEEE 1332:2012

IEEE 1332:2012

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IEEE Standard Reliability Program for the Development and Production of Electronic Products

€58.03

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IEEE 1641.1a:2018

IEEE 1641.1a:2018

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IEEE Guide for the Use of IEEE Std 1641(TM), IEEE Standard for Signal and Test Definition Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language

€60.14

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IEEE C37.248:2017

IEEE C37.248:2017

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IEEE Guide for Common Format for Naming Intelligent Electronic Devices (COMDEV)

€69.63

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IEEE 1641:2022

IEEE 1641:2022

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IEEE Standard for Signal and Test Definition

€216.28

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IEEE/IEC 62529:2024

IEEE/IEC 62529:2024

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IEEE/IEC International Standard for Signal and Test Definition

€217.33

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