Components
4
Twig Components
10
Render Count
10
ms
Render Time
208.0
MiB
Memory Usage
Components
| Name | Metadata | Render Count | Render Time |
|---|---|---|---|
| ProductState |
"App\Twig\Components\ProductState"components/ProductState.html.twig |
4 | 1.25ms |
| ProductMostRecent |
"App\Twig\Components\ProductMostRecent"components/ProductMostRecent.html.twig |
4 | 3.61ms |
| ProductType |
"App\Twig\Components\ProductType"components/ProductType.html.twig |
1 | 0.29ms |
| ProductCard |
"App\Twig\Components\ProductCard"components/ProductCard.html.twig |
1 | 6.23ms |
Render calls
| ProductState | App\Twig\Components\ProductState | 208.0 MiB | 0.49 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7309 #id: 9392 #code: "IEEE00002238" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038227 {#7274 : 2025-06-27 17:30:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#7322 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 32577 #name: "IEEE 1500:2005 (R2011)" #slug: "ieee-1500-2005-r2011-ieee00002238-241044" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.<br />\n \t\t\t\t<br />\n IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.<br />\n The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores. This objective is achieved through provision of a core-centric methodology that enables successful integration of cores into SoCs.<br />\n IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation relies on information requirements (the information model) placed on the core provider to ensure that the core can be successfully integrated by the core user. The result is shorter time to market for core providers and core users.<br />\n The data transfer and reuse from the core provider to the core user are based on the premise that the core test data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the SoC. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Testability Method for Embedded Core-based Integrated Circuits" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1648764000 {#7292 : 2022-04-01 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1125266400 {#7318 : 2005-08-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1301522400 {#7316 : 2011-03-31 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1648076400 {#7315 : 2022-03-24 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1500" -bookCollection: "" -pageCount: 136 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#93056 +product: App\Entity\Product\Product {#7309 #id: 9392 #code: "IEEE00002238" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038227 {#7274 : 2025-06-27 17:30:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#7322 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 32577 #name: "IEEE 1500:2005 (R2011)" #slug: "ieee-1500-2005-r2011-ieee00002238-241044" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.<br />\n \t\t\t\t<br />\n IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.<br />\n The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores. This objective is achieved through provision of a core-centric methodology that enables successful integration of cores into SoCs.<br />\n IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation relies on information requirements (the information model) placed on the core provider to ensure that the core can be successfully integrated by the core user. The result is shorter time to market for core providers and core users.<br />\n The data transfer and reuse from the core provider to the core user are based on the premise that the core test data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the SoC. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Testability Method for Embedded Core-based Integrated Circuits" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1648764000 {#7292 : 2022-04-01 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1125266400 {#7318 : 2005-08-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1301522400 {#7316 : 2011-03-31 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1648076400 {#7315 : 2022-03-24 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1500" -bookCollection: "" -pageCount: 136 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" "Confirmed" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductType | App\Twig\Components\ProductType | 208.0 MiB | 0.29 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7309 #id: 9392 #code: "IEEE00002238" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038227 {#7274 : 2025-06-27 17:30:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#7322 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 32577 #name: "IEEE 1500:2005 (R2011)" #slug: "ieee-1500-2005-r2011-ieee00002238-241044" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.<br />\n \t\t\t\t<br />\n IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.<br />\n The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores. This objective is achieved through provision of a core-centric methodology that enables successful integration of cores into SoCs.<br />\n IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation relies on information requirements (the information model) placed on the core provider to ensure that the core can be successfully integrated by the core user. The result is shorter time to market for core providers and core users.<br />\n The data transfer and reuse from the core provider to the core user are based on the premise that the core test data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the SoC. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Testability Method for Embedded Core-based Integrated Circuits" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1648764000 {#7292 : 2022-04-01 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1125266400 {#7318 : 2005-08-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1301522400 {#7316 : 2011-03-31 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1648076400 {#7315 : 2022-03-24 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1500" -bookCollection: "" -pageCount: 136 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductType {#93247 +product: App\Entity\Product\Product {#7309 #id: 9392 #code: "IEEE00002238" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038227 {#7274 : 2025-06-27 17:30:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#7322 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 32577 #name: "IEEE 1500:2005 (R2011)" #slug: "ieee-1500-2005-r2011-ieee00002238-241044" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.<br />\n \t\t\t\t<br />\n IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.<br />\n The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores. This objective is achieved through provision of a core-centric methodology that enables successful integration of cores into SoCs.<br />\n IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation relies on information requirements (the information model) placed on the core provider to ensure that the core can be successfully integrated by the core user. The result is shorter time to market for core providers and core users.<br />\n The data transfer and reuse from the core provider to the core user are based on the premise that the core test data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the SoC. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Testability Method for Embedded Core-based Integrated Circuits" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1648764000 {#7292 : 2022-04-01 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1125266400 {#7318 : 2005-08-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1301522400 {#7316 : 2011-03-31 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1648076400 {#7315 : 2022-03-24 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1500" -bookCollection: "" -pageCount: 136 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } +label: "Standard" -typeAttributeCode: "type" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 208.0 MiB | 1.04 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7309 #id: 9392 #code: "IEEE00002238" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038227 {#7274 : 2025-06-27 17:30:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#7322 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 32577 #name: "IEEE 1500:2005 (R2011)" #slug: "ieee-1500-2005-r2011-ieee00002238-241044" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.<br />\n \t\t\t\t<br />\n IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.<br />\n The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores. This objective is achieved through provision of a core-centric methodology that enables successful integration of cores into SoCs.<br />\n IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation relies on information requirements (the information model) placed on the core provider to ensure that the core can be successfully integrated by the core user. The result is shorter time to market for core providers and core users.<br />\n The data transfer and reuse from the core provider to the core user are based on the premise that the core test data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the SoC. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Testability Method for Embedded Core-based Integrated Circuits" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1648764000 {#7292 : 2022-04-01 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1125266400 {#7318 : 2005-08-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1301522400 {#7316 : 2011-03-31 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1648076400 {#7315 : 2022-03-24 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1500" -bookCollection: "" -pageCount: 136 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#93314 +product: App\Entity\Product\Product {#7309 #id: 9392 #code: "IEEE00002238" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038227 {#7274 : 2025-06-27 17:30:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#7322 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 32577 #name: "IEEE 1500:2005 (R2011)" #slug: "ieee-1500-2005-r2011-ieee00002238-241044" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.<br />\n \t\t\t\t<br />\n IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.<br />\n The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores. This objective is achieved through provision of a core-centric methodology that enables successful integration of cores into SoCs.<br />\n IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation relies on information requirements (the information model) placed on the core provider to ensure that the core can be successfully integrated by the core user. The result is shorter time to market for core providers and core users.<br />\n The data transfer and reuse from the core provider to the core user are based on the premise that the core test data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the SoC. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Testability Method for Embedded Core-based Integrated Circuits" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1648764000 {#7292 : 2022-04-01 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1125266400 {#7318 : 2005-08-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1301522400 {#7316 : 2011-03-31 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1648076400 {#7315 : 2022-03-24 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1500" -bookCollection: "" -pageCount: 136 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductState | App\Twig\Components\ProductState | 208.0 MiB | 0.31 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#93740 #id: 12445 #code: "IEEE00007704" #attributes: Doctrine\ORM\PersistentCollection {#93722 …} #variants: Doctrine\ORM\PersistentCollection {#93719 …} #options: Doctrine\ORM\PersistentCollection {#93715 …} #associations: Doctrine\ORM\PersistentCollection {#93717 …} #createdAt: DateTime @1751040436 {#93748 : 2025-06-27 18:07:16.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608621 {#93727 : 2025-08-08 01:17:01.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#93733 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#93768 #locale: "en_US" #translatable: App\Entity\Product\Product {#93740} #id: 44789 #name: "IEEE 1500:2022" #slug: "ieee-1500-2022-ieee00007704-244099" #description: """ Revision Standard - Active.<br />\n A mechanism for the test of core designs within a system on chip (SoC) is defined. This mechanism is a hardware architecture and the core test language (CTL) is leveraged to facilitate communication between core designers and core integrators.<br />\n \t\t\t\t<br />\n IEEE Std 1500 is a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method supports the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that might have originated from different sources. This method is usable for all classes of digital cores, including hierarchical cores.<br />\n The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores. This objective is achieved through provision of a core-centric methodology that enables successful integration of cores into SoCs. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Testability Method for Embedded Core-based Integrated Circuits" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#93731 …} #channels: Doctrine\ORM\PersistentCollection {#93724 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#93729 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#93726 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93741 …} -apiLastModifiedAt: DateTime @1754517600 {#93711 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1739314800 {#93747 : 2025-02-12 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1665525600 {#93746 : 2022-10-12 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1500" -bookCollection: "" -pageCount: 168 -documents: Doctrine\ORM\PersistentCollection {#93737 …} -favorites: Doctrine\ORM\PersistentCollection {#93735 …} } "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#106892 +product: App\Entity\Product\Product {#93740 #id: 12445 #code: "IEEE00007704" #attributes: Doctrine\ORM\PersistentCollection {#93722 …} #variants: Doctrine\ORM\PersistentCollection {#93719 …} #options: Doctrine\ORM\PersistentCollection {#93715 …} #associations: Doctrine\ORM\PersistentCollection {#93717 …} #createdAt: DateTime @1751040436 {#93748 : 2025-06-27 18:07:16.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608621 {#93727 : 2025-08-08 01:17:01.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#93733 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#93768 #locale: "en_US" #translatable: App\Entity\Product\Product {#93740} #id: 44789 #name: "IEEE 1500:2022" #slug: "ieee-1500-2022-ieee00007704-244099" #description: """ Revision Standard - Active.<br />\n A mechanism for the test of core designs within a system on chip (SoC) is defined. This mechanism is a hardware architecture and the core test language (CTL) is leveraged to facilitate communication between core designers and core integrators.<br />\n \t\t\t\t<br />\n IEEE Std 1500 is a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method supports the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that might have originated from different sources. This method is usable for all classes of digital cores, including hierarchical cores.<br />\n The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores. This objective is achieved through provision of a core-centric methodology that enables successful integration of cores into SoCs. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Testability Method for Embedded Core-based Integrated Circuits" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#93731 …} #channels: Doctrine\ORM\PersistentCollection {#93724 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#93729 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#93726 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93741 …} -apiLastModifiedAt: DateTime @1754517600 {#93711 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1739314800 {#93747 : 2025-02-12 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1665525600 {#93746 : 2022-10-12 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1500" -bookCollection: "" -pageCount: 168 -documents: Doctrine\ORM\PersistentCollection {#93737 …} -favorites: Doctrine\ORM\PersistentCollection {#93735 …} } +appearance: "state-active" +labels: [ "Active" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 208.0 MiB | 0.95 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#93740 #id: 12445 #code: "IEEE00007704" #attributes: Doctrine\ORM\PersistentCollection {#93722 …} #variants: Doctrine\ORM\PersistentCollection {#93719 …} #options: Doctrine\ORM\PersistentCollection {#93715 …} #associations: Doctrine\ORM\PersistentCollection {#93717 …} #createdAt: DateTime @1751040436 {#93748 : 2025-06-27 18:07:16.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608621 {#93727 : 2025-08-08 01:17:01.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#93733 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#93768 #locale: "en_US" #translatable: App\Entity\Product\Product {#93740} #id: 44789 #name: "IEEE 1500:2022" #slug: "ieee-1500-2022-ieee00007704-244099" #description: """ Revision Standard - Active.<br />\n A mechanism for the test of core designs within a system on chip (SoC) is defined. This mechanism is a hardware architecture and the core test language (CTL) is leveraged to facilitate communication between core designers and core integrators.<br />\n \t\t\t\t<br />\n IEEE Std 1500 is a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method supports the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that might have originated from different sources. This method is usable for all classes of digital cores, including hierarchical cores.<br />\n The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores. This objective is achieved through provision of a core-centric methodology that enables successful integration of cores into SoCs. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Testability Method for Embedded Core-based Integrated Circuits" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#93731 …} #channels: Doctrine\ORM\PersistentCollection {#93724 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#93729 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#93726 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93741 …} -apiLastModifiedAt: DateTime @1754517600 {#93711 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1739314800 {#93747 : 2025-02-12 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1665525600 {#93746 : 2022-10-12 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1500" -bookCollection: "" -pageCount: 168 -documents: Doctrine\ORM\PersistentCollection {#93737 …} -favorites: Doctrine\ORM\PersistentCollection {#93735 …} } ] |
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| ProductState | App\Twig\Components\ProductState | 208.0 MiB | 0.26 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#7309 #id: 9392 #code: "IEEE00002238" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038227 {#7274 : 2025-06-27 17:30:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#7322 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 32577 #name: "IEEE 1500:2005 (R2011)" #slug: "ieee-1500-2005-r2011-ieee00002238-241044" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.<br />\n \t\t\t\t<br />\n IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.<br />\n The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores. This objective is achieved through provision of a core-centric methodology that enables successful integration of cores into SoCs.<br />\n IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation relies on information requirements (the information model) placed on the core provider to ensure that the core can be successfully integrated by the core user. The result is shorter time to market for core providers and core users.<br />\n The data transfer and reuse from the core provider to the core user are based on the premise that the core test data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the SoC. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Testability Method for Embedded Core-based Integrated Circuits" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1648764000 {#7292 : 2022-04-01 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1125266400 {#7318 : 2005-08-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1301522400 {#7316 : 2011-03-31 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1648076400 {#7315 : 2022-03-24 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1500" -bookCollection: "" -pageCount: 136 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#107030 +product: App\Entity\Product\Product {#7309 #id: 9392 #code: "IEEE00002238" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038227 {#7274 : 2025-06-27 17:30:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#7322 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 32577 #name: "IEEE 1500:2005 (R2011)" #slug: "ieee-1500-2005-r2011-ieee00002238-241044" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.<br />\n \t\t\t\t<br />\n IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.<br />\n The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores. This objective is achieved through provision of a core-centric methodology that enables successful integration of cores into SoCs.<br />\n IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation relies on information requirements (the information model) placed on the core provider to ensure that the core can be successfully integrated by the core user. The result is shorter time to market for core providers and core users.<br />\n The data transfer and reuse from the core provider to the core user are based on the premise that the core test data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the SoC. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Testability Method for Embedded Core-based Integrated Circuits" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1648764000 {#7292 : 2022-04-01 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1125266400 {#7318 : 2005-08-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1301522400 {#7316 : 2011-03-31 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1648076400 {#7315 : 2022-03-24 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1500" -bookCollection: "" -pageCount: 136 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" "Confirmed" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 208.0 MiB | 0.90 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#7309 #id: 9392 #code: "IEEE00002238" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038227 {#7274 : 2025-06-27 17:30:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#7322 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 32577 #name: "IEEE 1500:2005 (R2011)" #slug: "ieee-1500-2005-r2011-ieee00002238-241044" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.<br />\n \t\t\t\t<br />\n IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.<br />\n The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores. This objective is achieved through provision of a core-centric methodology that enables successful integration of cores into SoCs.<br />\n IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation relies on information requirements (the information model) placed on the core provider to ensure that the core can be successfully integrated by the core user. The result is shorter time to market for core providers and core users.<br />\n The data transfer and reuse from the core provider to the core user are based on the premise that the core test data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the SoC. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Testability Method for Embedded Core-based Integrated Circuits" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1648764000 {#7292 : 2022-04-01 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1125266400 {#7318 : 2005-08-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1301522400 {#7316 : 2011-03-31 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1648076400 {#7315 : 2022-03-24 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1500" -bookCollection: "" -pageCount: 136 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } ] |
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| Component | App\Twig\Components\ProductMostRecent {#107057 +product: App\Entity\Product\Product {#7309 #id: 9392 #code: "IEEE00002238" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038227 {#7274 : 2025-06-27 17:30:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#7322 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 32577 #name: "IEEE 1500:2005 (R2011)" #slug: "ieee-1500-2005-r2011-ieee00002238-241044" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.<br />\n \t\t\t\t<br />\n IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.<br />\n The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores. This objective is achieved through provision of a core-centric methodology that enables successful integration of cores into SoCs.<br />\n IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation relies on information requirements (the information model) placed on the core provider to ensure that the core can be successfully integrated by the core user. The result is shorter time to market for core providers and core users.<br />\n The data transfer and reuse from the core provider to the core user are based on the premise that the core test data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the SoC. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Testability Method for Embedded Core-based Integrated Circuits" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1648764000 {#7292 : 2022-04-01 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1125266400 {#7318 : 2005-08-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1301522400 {#7316 : 2011-03-31 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1648076400 {#7315 : 2022-03-24 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1500" -bookCollection: "" -pageCount: 136 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 208.0 MiB | 6.23 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#128523 #id: 9152 #code: "IEEE00001728" #attributes: Doctrine\ORM\PersistentCollection {#128506 …} #variants: Doctrine\ORM\PersistentCollection {#128504 …} #options: Doctrine\ORM\PersistentCollection {#128499 …} #associations: Doctrine\ORM\PersistentCollection {#128501 …} #createdAt: DateTime @1751038014 {#128496 : 2025-06-27 17:26:54.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#128530 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#128517 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#128608 #locale: "en_US" #translatable: App\Entity\Product\Product {#128523} #id: 31617 #name: "IEEE 1149.1:2001 (R2008)" #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804" #description: """ Revision Standard - Superseded.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n \t\t\t\t<br />\n This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n printed circuit board or other substrate;<br />\n — testing the integrated circuit itself; and<br />\n — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#128515 …} #channels: Doctrine\ORM\PersistentCollection {#128508 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#128512 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#128510 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128481 …} -apiLastModifiedAt: DateTime @1754517600 {#128482 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#128524 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @995839200 {#128531 : 2001-07-23 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1206572400 {#128489 : 2008-03-27 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: null -edition: null -coreDocument: "1149.1" -bookCollection: "" -pageCount: 212 -documents: Doctrine\ORM\PersistentCollection {#128521 …} -favorites: Doctrine\ORM\PersistentCollection {#128519 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "additionalClasses" => "product__teaser--with-grey-border" "hasStretchedLink" => true "hoverType" => "shadow" "linkLabel" => "See more" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#128579 +product: App\Entity\Product\Product {#128523 #id: 9152 #code: "IEEE00001728" #attributes: Doctrine\ORM\PersistentCollection {#128506 …} #variants: Doctrine\ORM\PersistentCollection {#128504 …} #options: Doctrine\ORM\PersistentCollection {#128499 …} #associations: Doctrine\ORM\PersistentCollection {#128501 …} #createdAt: DateTime @1751038014 {#128496 : 2025-06-27 17:26:54.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#128530 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#128517 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#128608 #locale: "en_US" #translatable: App\Entity\Product\Product {#128523} #id: 31617 #name: "IEEE 1149.1:2001 (R2008)" #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804" #description: """ Revision Standard - Superseded.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n \t\t\t\t<br />\n This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n printed circuit board or other substrate;<br />\n — testing the integrated circuit itself; and<br />\n — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#128515 …} #channels: Doctrine\ORM\PersistentCollection {#128508 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#128512 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#128510 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128481 …} -apiLastModifiedAt: DateTime @1754517600 {#128482 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#128524 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @995839200 {#128531 : 2001-07-23 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1206572400 {#128489 : 2008-03-27 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: null -edition: null -coreDocument: "1149.1" -bookCollection: "" -pageCount: 212 -documents: Doctrine\ORM\PersistentCollection {#128521 …} -favorites: Doctrine\ORM\PersistentCollection {#128519 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "product__teaser--with-grey-border" +linkLabel: "See more" +imageFilter: "product_thumbnail_teaser" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "shadow" } |
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| ProductState | App\Twig\Components\ProductState | 208.0 MiB | 0.19 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#128523 #id: 9152 #code: "IEEE00001728" #attributes: Doctrine\ORM\PersistentCollection {#128506 …} #variants: Doctrine\ORM\PersistentCollection {#128504 …} #options: Doctrine\ORM\PersistentCollection {#128499 …} #associations: Doctrine\ORM\PersistentCollection {#128501 …} #createdAt: DateTime @1751038014 {#128496 : 2025-06-27 17:26:54.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#128530 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#128517 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#128608 #locale: "en_US" #translatable: App\Entity\Product\Product {#128523} #id: 31617 #name: "IEEE 1149.1:2001 (R2008)" #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804" #description: """ Revision Standard - Superseded.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n \t\t\t\t<br />\n This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n printed circuit board or other substrate;<br />\n — testing the integrated circuit itself; and<br />\n — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#128515 …} #channels: Doctrine\ORM\PersistentCollection {#128508 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#128512 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#128510 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128481 …} -apiLastModifiedAt: DateTime @1754517600 {#128482 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#128524 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @995839200 {#128531 : 2001-07-23 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1206572400 {#128489 : 2008-03-27 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: null -edition: null -coreDocument: "1149.1" -bookCollection: "" -pageCount: 212 -documents: Doctrine\ORM\PersistentCollection {#128521 …} -favorites: Doctrine\ORM\PersistentCollection {#128519 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#128612 +product: App\Entity\Product\Product {#128523 #id: 9152 #code: "IEEE00001728" #attributes: Doctrine\ORM\PersistentCollection {#128506 …} #variants: Doctrine\ORM\PersistentCollection {#128504 …} #options: Doctrine\ORM\PersistentCollection {#128499 …} #associations: Doctrine\ORM\PersistentCollection {#128501 …} #createdAt: DateTime @1751038014 {#128496 : 2025-06-27 17:26:54.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#128530 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#128517 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#128608 #locale: "en_US" #translatable: App\Entity\Product\Product {#128523} #id: 31617 #name: "IEEE 1149.1:2001 (R2008)" #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804" #description: """ Revision Standard - Superseded.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n \t\t\t\t<br />\n This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n printed circuit board or other substrate;<br />\n — testing the integrated circuit itself; and<br />\n — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#128515 …} #channels: Doctrine\ORM\PersistentCollection {#128508 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#128512 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#128510 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128481 …} -apiLastModifiedAt: DateTime @1754517600 {#128482 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#128524 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @995839200 {#128531 : 2001-07-23 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1206572400 {#128489 : 2008-03-27 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: null -edition: null -coreDocument: "1149.1" -bookCollection: "" -pageCount: 212 -documents: Doctrine\ORM\PersistentCollection {#128521 …} -favorites: Doctrine\ORM\PersistentCollection {#128519 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 208.0 MiB | 0.72 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#128523 #id: 9152 #code: "IEEE00001728" #attributes: Doctrine\ORM\PersistentCollection {#128506 …} #variants: Doctrine\ORM\PersistentCollection {#128504 …} #options: Doctrine\ORM\PersistentCollection {#128499 …} #associations: Doctrine\ORM\PersistentCollection {#128501 …} #createdAt: DateTime @1751038014 {#128496 : 2025-06-27 17:26:54.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#128530 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#128517 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#128608 #locale: "en_US" #translatable: App\Entity\Product\Product {#128523} #id: 31617 #name: "IEEE 1149.1:2001 (R2008)" #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804" #description: """ Revision Standard - Superseded.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n \t\t\t\t<br />\n This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n printed circuit board or other substrate;<br />\n — testing the integrated circuit itself; and<br />\n — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#128515 …} #channels: Doctrine\ORM\PersistentCollection {#128508 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#128512 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#128510 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128481 …} -apiLastModifiedAt: DateTime @1754517600 {#128482 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#128524 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @995839200 {#128531 : 2001-07-23 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1206572400 {#128489 : 2008-03-27 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: null -edition: null -coreDocument: "1149.1" -bookCollection: "" -pageCount: 212 -documents: Doctrine\ORM\PersistentCollection {#128521 …} -favorites: Doctrine\ORM\PersistentCollection {#128519 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#128690 +product: App\Entity\Product\Product {#128523 #id: 9152 #code: "IEEE00001728" #attributes: Doctrine\ORM\PersistentCollection {#128506 …} #variants: Doctrine\ORM\PersistentCollection {#128504 …} #options: Doctrine\ORM\PersistentCollection {#128499 …} #associations: Doctrine\ORM\PersistentCollection {#128501 …} #createdAt: DateTime @1751038014 {#128496 : 2025-06-27 17:26:54.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#128530 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#128517 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#128608 #locale: "en_US" #translatable: App\Entity\Product\Product {#128523} #id: 31617 #name: "IEEE 1149.1:2001 (R2008)" #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804" #description: """ Revision Standard - Superseded.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n \t\t\t\t<br />\n This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n printed circuit board or other substrate;<br />\n — testing the integrated circuit itself; and<br />\n — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#128515 …} #channels: Doctrine\ORM\PersistentCollection {#128508 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#128512 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#128510 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128481 …} -apiLastModifiedAt: DateTime @1754517600 {#128482 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#128524 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @995839200 {#128531 : 2001-07-23 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1206572400 {#128489 : 2008-03-27 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: null -edition: null -coreDocument: "1149.1" -bookCollection: "" -pageCount: 212 -documents: Doctrine\ORM\PersistentCollection {#128521 …} -favorites: Doctrine\ORM\PersistentCollection {#128519 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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