Components
5
Twig Components
47
Render Count
115
ms
Render Time
220.0
MiB
Memory Usage
Components
| Name | Metadata | Render Count | Render Time |
|---|---|---|---|
| ProductCard |
"App\Twig\Components\ProductCard"components/ProductCard.html.twig |
15 | 110.42ms |
| ProductState |
"App\Twig\Components\ProductState"components/ProductState.html.twig |
15 | 2.72ms |
| ProductMostRecent |
"App\Twig\Components\ProductMostRecent"components/ProductMostRecent.html.twig |
15 | 8.79ms |
| PageBanner |
"App\Twig\Components\PageBanner"components/PageBanner.html.twig |
1 | 4.36ms |
| BackButton |
"App\Twig\Components\BackButton"components/BackButton.html.twig |
1 | 0.22ms |
Render calls
| PageBanner | App\Twig\Components\PageBanner | 220.0 MiB | 4.36 ms | |
|---|---|---|---|---|
| Input props | [ "backLabel" => "19 : Testing" "backUrl" => "/taxons/main/ics-2277/19-testing-4296" "paddingClasses" => "p-2 px-lg-5 py-lg-0" "searchPlaceholder" => "sylius.ui.search" "showSearch" => "true" "title" => "19.080 : Electrical and electronic testing" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\PageBanner {#94218 +supTitle: null +title: "19.080 : Electrical and electronic testing" +subTitle: null +backUrl: "/taxons/main/ics-2277/19-testing-4296" +backLabel: "19 : Testing" +customClasses: null +backgroundType: null +centered: true +showSearch: true +searchPlaceholder: "sylius.ui.search" +searchValue: null +paddingClasses: "p-2 px-lg-5 py-lg-0" } |
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| BackButton | App\Twig\Components\BackButton | 220.0 MiB | 0.22 ms | |
|---|---|---|---|---|
| Input props | [ "url" => "/taxons/main/ics-2277/19-testing-4296" "label" => "19 : Testing" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\BackButton {#94309 +label: "19 : Testing" +url: "/taxons/main/ics-2277/19-testing-4296" } |
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| ProductCard | App\Twig\Components\ProductCard | 220.0 MiB | 16.61 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94852 #id: 8257 #code: "IEEE00000161" #attributes: Doctrine\ORM\PersistentCollection {#94933 …} #variants: Doctrine\ORM\PersistentCollection {#94931 …} #options: Doctrine\ORM\PersistentCollection {#94927 …} #associations: Doctrine\ORM\PersistentCollection {#94929 …} #createdAt: DateTime @1751037264 {#94865 : 2025-06-27 17:14:24.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94884 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94943 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95468 #locale: "en_US" #translatable: App\Entity\Product\Product {#94852} #id: 28037 #name: "IEEE 4:1978" #slug: "ieee-4-1978-ieee00000161-239909" #description: """ Revision Standard - Superseded.<br />\n Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n \t\t\t\t<br />\n This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Techniques for High Voltage Testing" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94941 …} #channels: Doctrine\ORM\PersistentCollection {#94935 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94939 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94937 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94949 …} -apiLastModifiedAt: DateTime @1754517600 {#94889 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94863 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @249692400 {#94882 : 1977-11-30 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 127 -documents: Doctrine\ORM\PersistentCollection {#94947 …} -favorites: Doctrine\ORM\PersistentCollection {#94945 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#95352 +product: App\Entity\Product\Product {#94852 #id: 8257 #code: "IEEE00000161" #attributes: Doctrine\ORM\PersistentCollection {#94933 …} #variants: Doctrine\ORM\PersistentCollection {#94931 …} #options: Doctrine\ORM\PersistentCollection {#94927 …} #associations: Doctrine\ORM\PersistentCollection {#94929 …} #createdAt: DateTime @1751037264 {#94865 : 2025-06-27 17:14:24.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94884 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94943 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95468 #locale: "en_US" #translatable: App\Entity\Product\Product {#94852} #id: 28037 #name: "IEEE 4:1978" #slug: "ieee-4-1978-ieee00000161-239909" #description: """ Revision Standard - Superseded.<br />\n Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n \t\t\t\t<br />\n This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Techniques for High Voltage Testing" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94941 …} #channels: Doctrine\ORM\PersistentCollection {#94935 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94939 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94937 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94949 …} -apiLastModifiedAt: DateTime @1754517600 {#94889 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94863 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @249692400 {#94882 : 1977-11-30 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 127 -documents: Doctrine\ORM\PersistentCollection {#94947 …} -favorites: Doctrine\ORM\PersistentCollection {#94945 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 220.0 MiB | 0.63 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94852 #id: 8257 #code: "IEEE00000161" #attributes: Doctrine\ORM\PersistentCollection {#94933 …} #variants: Doctrine\ORM\PersistentCollection {#94931 …} #options: Doctrine\ORM\PersistentCollection {#94927 …} #associations: Doctrine\ORM\PersistentCollection {#94929 …} #createdAt: DateTime @1751037264 {#94865 : 2025-06-27 17:14:24.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94884 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94943 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95468 #locale: "en_US" #translatable: App\Entity\Product\Product {#94852} #id: 28037 #name: "IEEE 4:1978" #slug: "ieee-4-1978-ieee00000161-239909" #description: """ Revision Standard - Superseded.<br />\n Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n \t\t\t\t<br />\n This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Techniques for High Voltage Testing" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94941 …} #channels: Doctrine\ORM\PersistentCollection {#94935 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94939 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94937 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94949 …} -apiLastModifiedAt: DateTime @1754517600 {#94889 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94863 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @249692400 {#94882 : 1977-11-30 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 127 -documents: Doctrine\ORM\PersistentCollection {#94947 …} -favorites: Doctrine\ORM\PersistentCollection {#94945 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#95475 +product: App\Entity\Product\Product {#94852 #id: 8257 #code: "IEEE00000161" #attributes: Doctrine\ORM\PersistentCollection {#94933 …} #variants: Doctrine\ORM\PersistentCollection {#94931 …} #options: Doctrine\ORM\PersistentCollection {#94927 …} #associations: Doctrine\ORM\PersistentCollection {#94929 …} #createdAt: DateTime @1751037264 {#94865 : 2025-06-27 17:14:24.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94884 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94943 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95468 #locale: "en_US" #translatable: App\Entity\Product\Product {#94852} #id: 28037 #name: "IEEE 4:1978" #slug: "ieee-4-1978-ieee00000161-239909" #description: """ Revision Standard - Superseded.<br />\n Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n \t\t\t\t<br />\n This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Techniques for High Voltage Testing" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94941 …} #channels: Doctrine\ORM\PersistentCollection {#94935 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94939 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94937 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94949 …} -apiLastModifiedAt: DateTime @1754517600 {#94889 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94863 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @249692400 {#94882 : 1977-11-30 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 127 -documents: Doctrine\ORM\PersistentCollection {#94947 …} -favorites: Doctrine\ORM\PersistentCollection {#94945 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 220.0 MiB | 0.94 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94852 #id: 8257 #code: "IEEE00000161" #attributes: Doctrine\ORM\PersistentCollection {#94933 …} #variants: Doctrine\ORM\PersistentCollection {#94931 …} #options: Doctrine\ORM\PersistentCollection {#94927 …} #associations: Doctrine\ORM\PersistentCollection {#94929 …} #createdAt: DateTime @1751037264 {#94865 : 2025-06-27 17:14:24.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94884 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94943 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95468 #locale: "en_US" #translatable: App\Entity\Product\Product {#94852} #id: 28037 #name: "IEEE 4:1978" #slug: "ieee-4-1978-ieee00000161-239909" #description: """ Revision Standard - Superseded.<br />\n Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n \t\t\t\t<br />\n This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Techniques for High Voltage Testing" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94941 …} #channels: Doctrine\ORM\PersistentCollection {#94935 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94939 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94937 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94949 …} -apiLastModifiedAt: DateTime @1754517600 {#94889 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94863 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @249692400 {#94882 : 1977-11-30 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 127 -documents: Doctrine\ORM\PersistentCollection {#94947 …} -favorites: Doctrine\ORM\PersistentCollection {#94945 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#95569 +product: App\Entity\Product\Product {#94852 #id: 8257 #code: "IEEE00000161" #attributes: Doctrine\ORM\PersistentCollection {#94933 …} #variants: Doctrine\ORM\PersistentCollection {#94931 …} #options: Doctrine\ORM\PersistentCollection {#94927 …} #associations: Doctrine\ORM\PersistentCollection {#94929 …} #createdAt: DateTime @1751037264 {#94865 : 2025-06-27 17:14:24.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94884 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94943 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95468 #locale: "en_US" #translatable: App\Entity\Product\Product {#94852} #id: 28037 #name: "IEEE 4:1978" #slug: "ieee-4-1978-ieee00000161-239909" #description: """ Revision Standard - Superseded.<br />\n Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n \t\t\t\t<br />\n This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Techniques for High Voltage Testing" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94941 …} #channels: Doctrine\ORM\PersistentCollection {#94935 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94939 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94937 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94949 …} -apiLastModifiedAt: DateTime @1754517600 {#94889 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94863 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @249692400 {#94882 : 1977-11-30 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 127 -documents: Doctrine\ORM\PersistentCollection {#94947 …} -favorites: Doctrine\ORM\PersistentCollection {#94945 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 220.0 MiB | 5.86 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94920 #id: 8258 #code: "IEEE00000162" #attributes: Doctrine\ORM\PersistentCollection {#94914 …} #variants: Doctrine\ORM\PersistentCollection {#94916 …} #options: Doctrine\ORM\PersistentCollection {#94951 …} #associations: Doctrine\ORM\PersistentCollection {#94918 …} #createdAt: DateTime @1751037265 {#94925 : 2025-06-27 17:14:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94924 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94879 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95782 #locale: "en_US" #translatable: App\Entity\Product\Product {#94920} #id: 28041 #name: "IEEE 4:1995" #slug: "ieee-4-1995-ieee00000162-239910" #description: """ Revision Standard - Superseded.<br />\n This standard establishes standard methods to measure high-voltage and basic testing techniques, so far as they are generally applicable, to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltags, switching impulse voltages, and impulse currents. This revision implements many new procedures to improve accuracy, provide greater flexibility, and address practical problems associated with high-voltage measurements.<br />\n \t\t\t\t<br />\n Defines test procedures, equipment requirements and analysis aids for testing hardware and apparatus used for electric power distribution, by all electric utilities.<br />\n To define terms of general applicability; to present general requirements regarding test objects and test procedure. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Techniques for High-Voltage Testing" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94908 …} #channels: Doctrine\ORM\PersistentCollection {#94912 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94907 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94910 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94867 …} -apiLastModifiedAt: DateTime @1754517600 {#94923 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94922 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @813452400 {#94921 : 1995-10-12 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 135 -documents: Doctrine\ORM\PersistentCollection {#94866 …} -favorites: Doctrine\ORM\PersistentCollection {#94872 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "secondary-lighter" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#95760 +product: App\Entity\Product\Product {#94920 #id: 8258 #code: "IEEE00000162" #attributes: Doctrine\ORM\PersistentCollection {#94914 …} #variants: Doctrine\ORM\PersistentCollection {#94916 …} #options: Doctrine\ORM\PersistentCollection {#94951 …} #associations: Doctrine\ORM\PersistentCollection {#94918 …} #createdAt: DateTime @1751037265 {#94925 : 2025-06-27 17:14:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94924 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94879 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95782 #locale: "en_US" #translatable: App\Entity\Product\Product {#94920} #id: 28041 #name: "IEEE 4:1995" #slug: "ieee-4-1995-ieee00000162-239910" #description: """ Revision Standard - Superseded.<br />\n This standard establishes standard methods to measure high-voltage and basic testing techniques, so far as they are generally applicable, to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltags, switching impulse voltages, and impulse currents. This revision implements many new procedures to improve accuracy, provide greater flexibility, and address practical problems associated with high-voltage measurements.<br />\n \t\t\t\t<br />\n Defines test procedures, equipment requirements and analysis aids for testing hardware and apparatus used for electric power distribution, by all electric utilities.<br />\n To define terms of general applicability; to present general requirements regarding test objects and test procedure. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Techniques for High-Voltage Testing" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94908 …} #channels: Doctrine\ORM\PersistentCollection {#94912 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94907 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94910 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94867 …} -apiLastModifiedAt: DateTime @1754517600 {#94923 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94922 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @813452400 {#94921 : 1995-10-12 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 135 -documents: Doctrine\ORM\PersistentCollection {#94866 …} -favorites: Doctrine\ORM\PersistentCollection {#94872 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "secondary-lighter" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 220.0 MiB | 0.15 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94920 #id: 8258 #code: "IEEE00000162" #attributes: Doctrine\ORM\PersistentCollection {#94914 …} #variants: Doctrine\ORM\PersistentCollection {#94916 …} #options: Doctrine\ORM\PersistentCollection {#94951 …} #associations: Doctrine\ORM\PersistentCollection {#94918 …} #createdAt: DateTime @1751037265 {#94925 : 2025-06-27 17:14:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94924 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94879 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95782 #locale: "en_US" #translatable: App\Entity\Product\Product {#94920} #id: 28041 #name: "IEEE 4:1995" #slug: "ieee-4-1995-ieee00000162-239910" #description: """ Revision Standard - Superseded.<br />\n This standard establishes standard methods to measure high-voltage and basic testing techniques, so far as they are generally applicable, to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltags, switching impulse voltages, and impulse currents. This revision implements many new procedures to improve accuracy, provide greater flexibility, and address practical problems associated with high-voltage measurements.<br />\n \t\t\t\t<br />\n Defines test procedures, equipment requirements and analysis aids for testing hardware and apparatus used for electric power distribution, by all electric utilities.<br />\n To define terms of general applicability; to present general requirements regarding test objects and test procedure. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Techniques for High-Voltage Testing" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94908 …} #channels: Doctrine\ORM\PersistentCollection {#94912 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94907 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94910 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94867 …} -apiLastModifiedAt: DateTime @1754517600 {#94923 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94922 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @813452400 {#94921 : 1995-10-12 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 135 -documents: Doctrine\ORM\PersistentCollection {#94866 …} -favorites: Doctrine\ORM\PersistentCollection {#94872 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#95789 +product: App\Entity\Product\Product {#94920 #id: 8258 #code: "IEEE00000162" #attributes: Doctrine\ORM\PersistentCollection {#94914 …} #variants: Doctrine\ORM\PersistentCollection {#94916 …} #options: Doctrine\ORM\PersistentCollection {#94951 …} #associations: Doctrine\ORM\PersistentCollection {#94918 …} #createdAt: DateTime @1751037265 {#94925 : 2025-06-27 17:14:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94924 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94879 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95782 #locale: "en_US" #translatable: App\Entity\Product\Product {#94920} #id: 28041 #name: "IEEE 4:1995" #slug: "ieee-4-1995-ieee00000162-239910" #description: """ Revision Standard - Superseded.<br />\n This standard establishes standard methods to measure high-voltage and basic testing techniques, so far as they are generally applicable, to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltags, switching impulse voltages, and impulse currents. This revision implements many new procedures to improve accuracy, provide greater flexibility, and address practical problems associated with high-voltage measurements.<br />\n \t\t\t\t<br />\n Defines test procedures, equipment requirements and analysis aids for testing hardware and apparatus used for electric power distribution, by all electric utilities.<br />\n To define terms of general applicability; to present general requirements regarding test objects and test procedure. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Techniques for High-Voltage Testing" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94908 …} #channels: Doctrine\ORM\PersistentCollection {#94912 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94907 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94910 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94867 …} -apiLastModifiedAt: DateTime @1754517600 {#94923 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94922 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @813452400 {#94921 : 1995-10-12 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 135 -documents: Doctrine\ORM\PersistentCollection {#94866 …} -favorites: Doctrine\ORM\PersistentCollection {#94872 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 220.0 MiB | 0.58 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94920 #id: 8258 #code: "IEEE00000162" #attributes: Doctrine\ORM\PersistentCollection {#94914 …} #variants: Doctrine\ORM\PersistentCollection {#94916 …} #options: Doctrine\ORM\PersistentCollection {#94951 …} #associations: Doctrine\ORM\PersistentCollection {#94918 …} #createdAt: DateTime @1751037265 {#94925 : 2025-06-27 17:14:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94924 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94879 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95782 #locale: "en_US" #translatable: App\Entity\Product\Product {#94920} #id: 28041 #name: "IEEE 4:1995" #slug: "ieee-4-1995-ieee00000162-239910" #description: """ Revision Standard - Superseded.<br />\n This standard establishes standard methods to measure high-voltage and basic testing techniques, so far as they are generally applicable, to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltags, switching impulse voltages, and impulse currents. This revision implements many new procedures to improve accuracy, provide greater flexibility, and address practical problems associated with high-voltage measurements.<br />\n \t\t\t\t<br />\n Defines test procedures, equipment requirements and analysis aids for testing hardware and apparatus used for electric power distribution, by all electric utilities.<br />\n To define terms of general applicability; to present general requirements regarding test objects and test procedure. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Techniques for High-Voltage Testing" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94908 …} #channels: Doctrine\ORM\PersistentCollection {#94912 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94907 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94910 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94867 …} -apiLastModifiedAt: DateTime @1754517600 {#94923 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94922 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @813452400 {#94921 : 1995-10-12 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 135 -documents: Doctrine\ORM\PersistentCollection {#94866 …} -favorites: Doctrine\ORM\PersistentCollection {#94872 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#95866 +product: App\Entity\Product\Product {#94920 #id: 8258 #code: "IEEE00000162" #attributes: Doctrine\ORM\PersistentCollection {#94914 …} #variants: Doctrine\ORM\PersistentCollection {#94916 …} #options: Doctrine\ORM\PersistentCollection {#94951 …} #associations: Doctrine\ORM\PersistentCollection {#94918 …} #createdAt: DateTime @1751037265 {#94925 : 2025-06-27 17:14:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94924 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94879 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95782 #locale: "en_US" #translatable: App\Entity\Product\Product {#94920} #id: 28041 #name: "IEEE 4:1995" #slug: "ieee-4-1995-ieee00000162-239910" #description: """ Revision Standard - Superseded.<br />\n This standard establishes standard methods to measure high-voltage and basic testing techniques, so far as they are generally applicable, to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltags, switching impulse voltages, and impulse currents. This revision implements many new procedures to improve accuracy, provide greater flexibility, and address practical problems associated with high-voltage measurements.<br />\n \t\t\t\t<br />\n Defines test procedures, equipment requirements and analysis aids for testing hardware and apparatus used for electric power distribution, by all electric utilities.<br />\n To define terms of general applicability; to present general requirements regarding test objects and test procedure. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Techniques for High-Voltage Testing" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94908 …} #channels: Doctrine\ORM\PersistentCollection {#94912 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94907 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94910 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94867 …} -apiLastModifiedAt: DateTime @1754517600 {#94923 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94922 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @813452400 {#94921 : 1995-10-12 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 135 -documents: Doctrine\ORM\PersistentCollection {#94866 …} -favorites: Doctrine\ORM\PersistentCollection {#94872 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 220.0 MiB | 5.10 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94958 #id: 8259 #code: "IEEE00000164" #attributes: Doctrine\ORM\PersistentCollection {#94975 …} #variants: Doctrine\ORM\PersistentCollection {#94977 …} #options: Doctrine\ORM\PersistentCollection {#94981 …} #associations: Doctrine\ORM\PersistentCollection {#94979 …} #createdAt: DateTime @1751037266 {#94953 : 2025-06-27 17:14:26.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94954 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94965 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95991 #locale: "en_US" #translatable: App\Entity\Product\Product {#94958} #id: 28045 #name: "IEEE 4a:2001" #slug: "ieee-4a-2001-ieee00000164-239911" #description: """ Amendment Standard - Superseded.<br />\n This amendment sets forth a number of clarifications and corrections to IEEE Standard Techniques for High-Voltage Testing.<br />\n \t\t\t\t<br />\n This amendment is applicable to dielectric tests with alternating voltages and impulse voltages, when testing an apparatus with air gaps up to 1 meter in length. It specifies correction factors for air density and humidity, which may be applied when the specific apparatus standard allows. This amendment is to be applied in conjunction with IEEE Std 4-1995, IEEE Standard Techniques for High-Voltage Testing. The paragraph numbering beginning at 1.3.5, equations, and figure numbers are as they were in IEEE Std 4-1978. Thus a reference to this amendment for a specific clause, etc., will be the same as in the original standard.<br />\n This amendment adds the air density and humidity correction factors of the 1978 version of IEEE Std 4 to be used with the standardized rod-gap data when testing apparatus with air gaps up to 1 meter in length. Dielectric test voltage atmospheric correction factors The atmospheric correction factors listed in 1.3.5 may be applied for gap spacing up to 1 meter in length to the standardized rod-rod gap sparkover data for impulse test voltages found in 17.7, Table 11 of IEEE Std 4-1995. """ #metaKeywords: null #metaDescription: null #shortDescription: "Amendment to IEEE Standard Techniques for High-Voltage Testing" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94967 …} #channels: Doctrine\ORM\PersistentCollection {#94973 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94969 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94971 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94959 …} -apiLastModifiedAt: DateTime @1754517600 {#94955 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94956 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @985129200 {#94957 : 2001-03-21 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 12 -documents: Doctrine\ORM\PersistentCollection {#94961 …} -favorites: Doctrine\ORM\PersistentCollection {#94963 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#95971 +product: App\Entity\Product\Product {#94958 #id: 8259 #code: "IEEE00000164" #attributes: Doctrine\ORM\PersistentCollection {#94975 …} #variants: Doctrine\ORM\PersistentCollection {#94977 …} #options: Doctrine\ORM\PersistentCollection {#94981 …} #associations: Doctrine\ORM\PersistentCollection {#94979 …} #createdAt: DateTime @1751037266 {#94953 : 2025-06-27 17:14:26.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94954 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94965 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95991 #locale: "en_US" #translatable: App\Entity\Product\Product {#94958} #id: 28045 #name: "IEEE 4a:2001" #slug: "ieee-4a-2001-ieee00000164-239911" #description: """ Amendment Standard - Superseded.<br />\n This amendment sets forth a number of clarifications and corrections to IEEE Standard Techniques for High-Voltage Testing.<br />\n \t\t\t\t<br />\n This amendment is applicable to dielectric tests with alternating voltages and impulse voltages, when testing an apparatus with air gaps up to 1 meter in length. It specifies correction factors for air density and humidity, which may be applied when the specific apparatus standard allows. This amendment is to be applied in conjunction with IEEE Std 4-1995, IEEE Standard Techniques for High-Voltage Testing. The paragraph numbering beginning at 1.3.5, equations, and figure numbers are as they were in IEEE Std 4-1978. Thus a reference to this amendment for a specific clause, etc., will be the same as in the original standard.<br />\n This amendment adds the air density and humidity correction factors of the 1978 version of IEEE Std 4 to be used with the standardized rod-gap data when testing apparatus with air gaps up to 1 meter in length. Dielectric test voltage atmospheric correction factors The atmospheric correction factors listed in 1.3.5 may be applied for gap spacing up to 1 meter in length to the standardized rod-rod gap sparkover data for impulse test voltages found in 17.7, Table 11 of IEEE Std 4-1995. """ #metaKeywords: null #metaDescription: null #shortDescription: "Amendment to IEEE Standard Techniques for High-Voltage Testing" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94967 …} #channels: Doctrine\ORM\PersistentCollection {#94973 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94969 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94971 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94959 …} -apiLastModifiedAt: DateTime @1754517600 {#94955 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94956 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @985129200 {#94957 : 2001-03-21 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 12 -documents: Doctrine\ORM\PersistentCollection {#94961 …} -favorites: Doctrine\ORM\PersistentCollection {#94963 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 220.0 MiB | 0.15 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94958 #id: 8259 #code: "IEEE00000164" #attributes: Doctrine\ORM\PersistentCollection {#94975 …} #variants: Doctrine\ORM\PersistentCollection {#94977 …} #options: Doctrine\ORM\PersistentCollection {#94981 …} #associations: Doctrine\ORM\PersistentCollection {#94979 …} #createdAt: DateTime @1751037266 {#94953 : 2025-06-27 17:14:26.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94954 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94965 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95991 #locale: "en_US" #translatable: App\Entity\Product\Product {#94958} #id: 28045 #name: "IEEE 4a:2001" #slug: "ieee-4a-2001-ieee00000164-239911" #description: """ Amendment Standard - Superseded.<br />\n This amendment sets forth a number of clarifications and corrections to IEEE Standard Techniques for High-Voltage Testing.<br />\n \t\t\t\t<br />\n This amendment is applicable to dielectric tests with alternating voltages and impulse voltages, when testing an apparatus with air gaps up to 1 meter in length. It specifies correction factors for air density and humidity, which may be applied when the specific apparatus standard allows. This amendment is to be applied in conjunction with IEEE Std 4-1995, IEEE Standard Techniques for High-Voltage Testing. The paragraph numbering beginning at 1.3.5, equations, and figure numbers are as they were in IEEE Std 4-1978. Thus a reference to this amendment for a specific clause, etc., will be the same as in the original standard.<br />\n This amendment adds the air density and humidity correction factors of the 1978 version of IEEE Std 4 to be used with the standardized rod-gap data when testing apparatus with air gaps up to 1 meter in length. Dielectric test voltage atmospheric correction factors The atmospheric correction factors listed in 1.3.5 may be applied for gap spacing up to 1 meter in length to the standardized rod-rod gap sparkover data for impulse test voltages found in 17.7, Table 11 of IEEE Std 4-1995. """ #metaKeywords: null #metaDescription: null #shortDescription: "Amendment to IEEE Standard Techniques for High-Voltage Testing" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94967 …} #channels: Doctrine\ORM\PersistentCollection {#94973 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94969 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94971 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94959 …} -apiLastModifiedAt: DateTime @1754517600 {#94955 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94956 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @985129200 {#94957 : 2001-03-21 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 12 -documents: Doctrine\ORM\PersistentCollection {#94961 …} -favorites: Doctrine\ORM\PersistentCollection {#94963 …} } ] |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 220.0 MiB | 0.54 ms | |
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| Component | App\Twig\Components\ProductMostRecent {#96283 +product: App\Entity\Product\Product {#94988 #id: 8288 #code: "IEEE00000209" #attributes: Doctrine\ORM\PersistentCollection {#95005 …} #variants: Doctrine\ORM\PersistentCollection {#95007 …} #options: Doctrine\ORM\PersistentCollection {#95011 …} #associations: Doctrine\ORM\PersistentCollection {#95009 …} #createdAt: DateTime @1751037290 {#94983 : 2025-06-27 17:14:50.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94984 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94995 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96199 #locale: "en_US" #translatable: App\Entity\Product\Product {#94988} #id: 28161 #name: "IEEE 62:1978" #slug: "ieee-62-1978-ieee00000209-239940" #description: """ New IEEE Standard - Superseded.<br />\n Diagnostic tests and measurements that are performed in the field on oil-immersed power transformers and regulators are described. Whenever possible, shunt reactors are treated in a similar manner to transformers. Tests are presented systematically in categories depending on the subsystem of the unit being examined. A diagnostic chart is included as an aid to identify the various subsystems. Additional information is provided regarding specialized test and measuring techniques.<br />\n \t\t\t\t<br />\n This guide discusses the significance of various types of tests commonly employed to evaluate the insulation of power apparatus in the field, where environmental conditions cannot readily be controlled; the equipment and techniques required for each type of test; problems peculiar to field testing, and methods of dealing with these problems; and the application of field tests to specific types of power apparatus. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Guide for Field Testing Power Apparatus Insulation" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94997 …} #channels: Doctrine\ORM\PersistentCollection {#95003 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94999 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95001 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94989 …} -apiLastModifiedAt: DateTime @1754517600 {#94985 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1704927600 {#94986 : 2024-01-11 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @282438000 {#94987 : 1978-12-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62" -bookCollection: "" -pageCount: 34 -documents: Doctrine\ORM\PersistentCollection {#94991 …} -favorites: Doctrine\ORM\PersistentCollection {#94993 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 220.0 MiB | 7.13 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95018 #id: 8592 #code: "IEEE00000717" #attributes: Doctrine\ORM\PersistentCollection {#95035 …} #variants: Doctrine\ORM\PersistentCollection {#95037 …} #options: Doctrine\ORM\PersistentCollection {#95041 …} #associations: Doctrine\ORM\PersistentCollection {#95039 …} #createdAt: DateTime @1751037546 {#95013 : 2025-06-27 17:19:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95014 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95025 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96408 #locale: "en_US" #translatable: App\Entity\Product\Product {#95018} #id: 29377 #name: "IEEE 488.2:1987" #slug: "ieee-488-2-1987-ieee00000717-240244" #description: """ New IEEE Standard - Superseded.<br />\n A set of codes and formats to be used by devices connected via the IEEE 488.1 bus is specified. This standard also defines communication protocols that are necessary to effect application-independent and device-dependent message exchanges, and further defines common commands and characteristics useful in instrument system applications. It is intended to apply to small-scale to medium-scale instrument systems comprised mainly of measurement, stimulus, and interconnect devices outside the scope of the instrument system environment. IEEE 488.1 subsets, standard message-handling protocols including error handling, unambiguous program and response-message syntactic structures, common commands useful in a wide range of instrument system applications, standard status reporting structures, and system configuration and synchronization protocols are covered.<br />\n \t\t\t\t<br />\n This standard specifies a set of codes and formats to be used by devices connected via the<br />\n IEEE 488.1 bus. 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| Component | App\Twig\Components\ProductCard {#96388 +product: App\Entity\Product\Product {#95018 #id: 8592 #code: "IEEE00000717" #attributes: Doctrine\ORM\PersistentCollection {#95035 …} #variants: Doctrine\ORM\PersistentCollection {#95037 …} #options: Doctrine\ORM\PersistentCollection {#95041 …} #associations: Doctrine\ORM\PersistentCollection {#95039 …} #createdAt: DateTime @1751037546 {#95013 : 2025-06-27 17:19:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95014 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95025 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96408 #locale: "en_US" #translatable: App\Entity\Product\Product {#95018} #id: 29377 #name: "IEEE 488.2:1987" #slug: "ieee-488-2-1987-ieee00000717-240244" #description: """ New IEEE Standard - Superseded.<br />\n A set of codes and formats to be used by devices connected via the IEEE 488.1 bus is specified. 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| ProductState | App\Twig\Components\ProductState | 220.0 MiB | 0.15 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95018 #id: 8592 #code: "IEEE00000717" #attributes: Doctrine\ORM\PersistentCollection {#95035 …} #variants: Doctrine\ORM\PersistentCollection {#95037 …} #options: Doctrine\ORM\PersistentCollection {#95041 …} #associations: Doctrine\ORM\PersistentCollection {#95039 …} #createdAt: DateTime @1751037546 {#95013 : 2025-06-27 17:19:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95014 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95025 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96408 #locale: "en_US" #translatable: App\Entity\Product\Product {#95018} #id: 29377 #name: "IEEE 488.2:1987" #slug: "ieee-488-2-1987-ieee00000717-240244" #description: """ New IEEE Standard - Superseded.<br />\n A set of codes and formats to be used by devices connected via the IEEE 488.1 bus is specified. This standard also defines communication protocols that are necessary to effect application-independent and device-dependent message exchanges, and further defines common commands and characteristics useful in instrument system applications. It is intended to apply to small-scale to medium-scale instrument systems comprised mainly of measurement, stimulus, and interconnect devices outside the scope of the instrument system environment. IEEE 488.1 subsets, standard message-handling protocols including error handling, unambiguous program and response-message syntactic structures, common commands useful in a wide range of instrument system applications, standard status reporting structures, and system configuration and synchronization protocols are covered.<br />\n \t\t\t\t<br />\n This standard specifies a set of codes and formats to be used by devices connected via the<br />\n IEEE 488.1 bus. This standard also defines communication protocols necessary to effect application<br />\n independent device-dependent message exchanges and further defines common commands and characteristics useful in instrument system applications.<br />\n This standard is intended to directly apply to small to medium-scale instrument systems. It applies to systems comprised mainly of measurement, stimulus, and interconnect devices with an instrumentation controller. The standard may also apply to certain devices outside the scope of the instrument system environment. As well as defdefining a variety of device-dependent messages, this standard extends and further interprets certain interface functions contained in ANSI/IEEE Std 488.1-1987 [2] while remaining compatible with that standard. This standard covers the following topics:<br />\n (1) IEEE 488.1 subsets<br />\n (2) Standard message handling protocols including error handling<br />\n (3) Unambiguous program and response message syntactic structures<br />\n (4) Common commands useful in a wide range of instrument system applications<br />\n ( 5 ) Standard status reporting structures<br />\n (6) System configuration and synchronization protocols<br />\n Use of this standard does not relieve the user from the burden of responsibility for system compatibility at the application level. The user must be familiar with the characteristics of all the system components in order to configure an optimum system.<br />\n The intended readers of this standard include both controller and device designers. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Codes, Formats, Protocols, and Common Commands For Use with ANSI/IEEE Std 488.1-1987 IEEE Standard Digital Interface for Programmable Instrumentation" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95027 …} #channels: Doctrine\ORM\PersistentCollection {#95033 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95029 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95031 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95019 …} -apiLastModifiedAt: DateTime @1754517600 {#95015 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95016 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @577663200 {#95017 : 1988-04-22 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "488.2" -bookCollection: "" -pageCount: 206 -documents: Doctrine\ORM\PersistentCollection {#95021 …} -favorites: Doctrine\ORM\PersistentCollection {#95023 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#96415 +product: App\Entity\Product\Product {#95018 #id: 8592 #code: "IEEE00000717" #attributes: Doctrine\ORM\PersistentCollection {#95035 …} #variants: Doctrine\ORM\PersistentCollection {#95037 …} #options: Doctrine\ORM\PersistentCollection {#95041 …} #associations: Doctrine\ORM\PersistentCollection {#95039 …} #createdAt: DateTime @1751037546 {#95013 : 2025-06-27 17:19:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95014 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95025 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96408 #locale: "en_US" #translatable: App\Entity\Product\Product {#95018} #id: 29377 #name: "IEEE 488.2:1987" #slug: "ieee-488-2-1987-ieee00000717-240244" #description: """ New IEEE Standard - Superseded.<br />\n A set of codes and formats to be used by devices connected via the IEEE 488.1 bus is specified. This standard also defines communication protocols that are necessary to effect application-independent and device-dependent message exchanges, and further defines common commands and characteristics useful in instrument system applications. It is intended to apply to small-scale to medium-scale instrument systems comprised mainly of measurement, stimulus, and interconnect devices outside the scope of the instrument system environment. IEEE 488.1 subsets, standard message-handling protocols including error handling, unambiguous program and response-message syntactic structures, common commands useful in a wide range of instrument system applications, standard status reporting structures, and system configuration and synchronization protocols are covered.<br />\n \t\t\t\t<br />\n This standard specifies a set of codes and formats to be used by devices connected via the<br />\n IEEE 488.1 bus. This standard also defines communication protocols necessary to effect application<br />\n independent device-dependent message exchanges and further defines common commands and characteristics useful in instrument system applications.<br />\n This standard is intended to directly apply to small to medium-scale instrument systems. It applies to systems comprised mainly of measurement, stimulus, and interconnect devices with an instrumentation controller. The standard may also apply to certain devices outside the scope of the instrument system environment. As well as defdefining a variety of device-dependent messages, this standard extends and further interprets certain interface functions contained in ANSI/IEEE Std 488.1-1987 [2] while remaining compatible with that standard. This standard covers the following topics:<br />\n (1) IEEE 488.1 subsets<br />\n (2) Standard message handling protocols including error handling<br />\n (3) Unambiguous program and response message syntactic structures<br />\n (4) Common commands useful in a wide range of instrument system applications<br />\n ( 5 ) Standard status reporting structures<br />\n (6) System configuration and synchronization protocols<br />\n Use of this standard does not relieve the user from the burden of responsibility for system compatibility at the application level. The user must be familiar with the characteristics of all the system components in order to configure an optimum system.<br />\n The intended readers of this standard include both controller and device designers. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Codes, Formats, Protocols, and Common Commands For Use with ANSI/IEEE Std 488.1-1987 IEEE Standard Digital Interface for Programmable Instrumentation" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95027 …} #channels: Doctrine\ORM\PersistentCollection {#95033 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95029 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95031 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95019 …} -apiLastModifiedAt: DateTime @1754517600 {#95015 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95016 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @577663200 {#95017 : 1988-04-22 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "488.2" -bookCollection: "" -pageCount: 206 -documents: Doctrine\ORM\PersistentCollection {#95021 …} -favorites: Doctrine\ORM\PersistentCollection {#95023 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 220.0 MiB | 0.67 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95018 #id: 8592 #code: "IEEE00000717" #attributes: Doctrine\ORM\PersistentCollection {#95035 …} #variants: Doctrine\ORM\PersistentCollection {#95037 …} #options: Doctrine\ORM\PersistentCollection {#95041 …} #associations: Doctrine\ORM\PersistentCollection {#95039 …} #createdAt: DateTime @1751037546 {#95013 : 2025-06-27 17:19:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95014 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95025 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96408 #locale: "en_US" #translatable: App\Entity\Product\Product {#95018} #id: 29377 #name: "IEEE 488.2:1987" #slug: "ieee-488-2-1987-ieee00000717-240244" #description: """ New IEEE Standard - Superseded.<br />\n A set of codes and formats to be used by devices connected via the IEEE 488.1 bus is specified. This standard also defines communication protocols that are necessary to effect application-independent and device-dependent message exchanges, and further defines common commands and characteristics useful in instrument system applications. It is intended to apply to small-scale to medium-scale instrument systems comprised mainly of measurement, stimulus, and interconnect devices outside the scope of the instrument system environment. IEEE 488.1 subsets, standard message-handling protocols including error handling, unambiguous program and response-message syntactic structures, common commands useful in a wide range of instrument system applications, standard status reporting structures, and system configuration and synchronization protocols are covered.<br />\n \t\t\t\t<br />\n This standard specifies a set of codes and formats to be used by devices connected via the<br />\n IEEE 488.1 bus. This standard also defines communication protocols necessary to effect application<br />\n independent device-dependent message exchanges and further defines common commands and characteristics useful in instrument system applications.<br />\n This standard is intended to directly apply to small to medium-scale instrument systems. It applies to systems comprised mainly of measurement, stimulus, and interconnect devices with an instrumentation controller. The standard may also apply to certain devices outside the scope of the instrument system environment. As well as defdefining a variety of device-dependent messages, this standard extends and further interprets certain interface functions contained in ANSI/IEEE Std 488.1-1987 [2] while remaining compatible with that standard. This standard covers the following topics:<br />\n (1) IEEE 488.1 subsets<br />\n (2) Standard message handling protocols including error handling<br />\n (3) Unambiguous program and response message syntactic structures<br />\n (4) Common commands useful in a wide range of instrument system applications<br />\n ( 5 ) Standard status reporting structures<br />\n (6) System configuration and synchronization protocols<br />\n Use of this standard does not relieve the user from the burden of responsibility for system compatibility at the application level. The user must be familiar with the characteristics of all the system components in order to configure an optimum system.<br />\n The intended readers of this standard include both controller and device designers. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Codes, Formats, Protocols, and Common Commands For Use with ANSI/IEEE Std 488.1-1987 IEEE Standard Digital Interface for Programmable Instrumentation" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95027 …} #channels: Doctrine\ORM\PersistentCollection {#95033 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95029 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95031 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95019 …} -apiLastModifiedAt: DateTime @1754517600 {#95015 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95016 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @577663200 {#95017 : 1988-04-22 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "488.2" -bookCollection: "" -pageCount: 206 -documents: Doctrine\ORM\PersistentCollection {#95021 …} -favorites: Doctrine\ORM\PersistentCollection {#95023 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#96492 +product: App\Entity\Product\Product {#95018 #id: 8592 #code: "IEEE00000717" #attributes: Doctrine\ORM\PersistentCollection {#95035 …} #variants: Doctrine\ORM\PersistentCollection {#95037 …} #options: Doctrine\ORM\PersistentCollection {#95041 …} #associations: Doctrine\ORM\PersistentCollection {#95039 …} #createdAt: DateTime @1751037546 {#95013 : 2025-06-27 17:19:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95014 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95025 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96408 #locale: "en_US" #translatable: App\Entity\Product\Product {#95018} #id: 29377 #name: "IEEE 488.2:1987" #slug: "ieee-488-2-1987-ieee00000717-240244" #description: """ New IEEE Standard - Superseded.<br />\n A set of codes and formats to be used by devices connected via the IEEE 488.1 bus is specified. This standard also defines communication protocols that are necessary to effect application-independent and device-dependent message exchanges, and further defines common commands and characteristics useful in instrument system applications. It is intended to apply to small-scale to medium-scale instrument systems comprised mainly of measurement, stimulus, and interconnect devices outside the scope of the instrument system environment. IEEE 488.1 subsets, standard message-handling protocols including error handling, unambiguous program and response-message syntactic structures, common commands useful in a wide range of instrument system applications, standard status reporting structures, and system configuration and synchronization protocols are covered.<br />\n \t\t\t\t<br />\n This standard specifies a set of codes and formats to be used by devices connected via the<br />\n IEEE 488.1 bus. This standard also defines communication protocols necessary to effect application<br />\n independent device-dependent message exchanges and further defines common commands and characteristics useful in instrument system applications.<br />\n This standard is intended to directly apply to small to medium-scale instrument systems. It applies to systems comprised mainly of measurement, stimulus, and interconnect devices with an instrumentation controller. The standard may also apply to certain devices outside the scope of the instrument system environment. As well as defdefining a variety of device-dependent messages, this standard extends and further interprets certain interface functions contained in ANSI/IEEE Std 488.1-1987 [2] while remaining compatible with that standard. This standard covers the following topics:<br />\n (1) IEEE 488.1 subsets<br />\n (2) Standard message handling protocols including error handling<br />\n (3) Unambiguous program and response message syntactic structures<br />\n (4) Common commands useful in a wide range of instrument system applications<br />\n ( 5 ) Standard status reporting structures<br />\n (6) System configuration and synchronization protocols<br />\n Use of this standard does not relieve the user from the burden of responsibility for system compatibility at the application level. The user must be familiar with the characteristics of all the system components in order to configure an optimum system.<br />\n The intended readers of this standard include both controller and device designers. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Codes, Formats, Protocols, and Common Commands For Use with ANSI/IEEE Std 488.1-1987 IEEE Standard Digital Interface for Programmable Instrumentation" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95027 …} #channels: Doctrine\ORM\PersistentCollection {#95033 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95029 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95031 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95019 …} -apiLastModifiedAt: DateTime @1754517600 {#95015 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95016 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @577663200 {#95017 : 1988-04-22 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "488.2" -bookCollection: "" -pageCount: 206 -documents: Doctrine\ORM\PersistentCollection {#95021 …} -favorites: Doctrine\ORM\PersistentCollection {#95023 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 220.0 MiB | 5.96 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95050 #id: 8612 #code: "IEEE00000746" #attributes: Doctrine\ORM\PersistentCollection {#95067 …} #variants: Doctrine\ORM\PersistentCollection {#95069 …} #options: Doctrine\ORM\PersistentCollection {#95073 …} #associations: Doctrine\ORM\PersistentCollection {#95071 …} #createdAt: DateTime @1751037562 {#95043 : 2025-06-27 17:19:22.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95044 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95057 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96617 #locale: "en_US" #translatable: App\Entity\Product\Product {#95050} #id: 29457 #name: "IEEE 510:1983 (R1992)" #slug: "ieee-510-1983-r1992-ieee00000746-240264" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Safety practices for those who are involved with making measurements on high-voltage sources or with high-power sources of various types, including power-system lines, 60-Hz test transformers, direct-voltage supplies, lightning-impulse generators, and switching-impulse generators are recommended. Electrical hazards involved in temporary measurements, as opposed to metering, relaying, or routine line work, are considered. Safety is considered in connection with testing in laboratories, in the field, in substations, and on lines, and with the test equipment utilized. Cable-fault location, large-capacitance-load testing, high-current testing, and direct connection to power lines are treated separately.<br />\n \t\t\t\t<br />\n This recommended practice is concerned with safety practices for those who are involved with making measurements on high-voltage sources or with high-power sources of various types including power-system lines, 60 Hz test transformers, direct-voltage supplies, lightning-impulse generators, and switching-impulse generators. This recommended practice is limited to safety practices with regard to electrical hazards involved in temporary measurements, as opposed to metering, relaying or routine line work.<br />\n Considerations of safety in electrical testing apply not only to personnel but to the test equipment and apparatus or system under test. This recommended practice deals generally with safety in connection with testing in laboratories, in the field, in substations and on lines, and with the test equipment utilized. Special areas involving cable-fault location, large capacitance load testing, high-current testing, and direct connection to power lines are treated separately. For applications of high-voltage test equipment and methods in areas not specifically covered. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practices for Safety in High-Voltage and High-Power Testing" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95059 …} #channels: Doctrine\ORM\PersistentCollection {#95065 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95061 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95063 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95051 …} -apiLastModifiedAt: DateTime @1754517600 {#95045 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95046 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @421279200 {#95047 : 1983-05-09 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @700959600 {#95048 : 1992-03-19 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @1106607600 {#95049 : 2005-01-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "510" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95053 …} -favorites: Doctrine\ORM\PersistentCollection {#95055 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "secondary-lighter" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#96597 +product: App\Entity\Product\Product {#95050 #id: 8612 #code: "IEEE00000746" #attributes: Doctrine\ORM\PersistentCollection {#95067 …} #variants: Doctrine\ORM\PersistentCollection {#95069 …} #options: Doctrine\ORM\PersistentCollection {#95073 …} #associations: Doctrine\ORM\PersistentCollection {#95071 …} #createdAt: DateTime @1751037562 {#95043 : 2025-06-27 17:19:22.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95044 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95057 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96617 #locale: "en_US" #translatable: App\Entity\Product\Product {#95050} #id: 29457 #name: "IEEE 510:1983 (R1992)" #slug: "ieee-510-1983-r1992-ieee00000746-240264" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Safety practices for those who are involved with making measurements on high-voltage sources or with high-power sources of various types, including power-system lines, 60-Hz test transformers, direct-voltage supplies, lightning-impulse generators, and switching-impulse generators are recommended. Electrical hazards involved in temporary measurements, as opposed to metering, relaying, or routine line work, are considered. Safety is considered in connection with testing in laboratories, in the field, in substations, and on lines, and with the test equipment utilized. Cable-fault location, large-capacitance-load testing, high-current testing, and direct connection to power lines are treated separately.<br />\n \t\t\t\t<br />\n This recommended practice is concerned with safety practices for those who are involved with making measurements on high-voltage sources or with high-power sources of various types including power-system lines, 60 Hz test transformers, direct-voltage supplies, lightning-impulse generators, and switching-impulse generators. This recommended practice is limited to safety practices with regard to electrical hazards involved in temporary measurements, as opposed to metering, relaying or routine line work.<br />\n Considerations of safety in electrical testing apply not only to personnel but to the test equipment and apparatus or system under test. This recommended practice deals generally with safety in connection with testing in laboratories, in the field, in substations and on lines, and with the test equipment utilized. Special areas involving cable-fault location, large capacitance load testing, high-current testing, and direct connection to power lines are treated separately. For applications of high-voltage test equipment and methods in areas not specifically covered. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practices for Safety in High-Voltage and High-Power Testing" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95059 …} #channels: Doctrine\ORM\PersistentCollection {#95065 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95061 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95063 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95051 …} -apiLastModifiedAt: DateTime @1754517600 {#95045 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95046 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @421279200 {#95047 : 1983-05-09 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @700959600 {#95048 : 1992-03-19 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @1106607600 {#95049 : 2005-01-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "510" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95053 …} -favorites: Doctrine\ORM\PersistentCollection {#95055 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "secondary-lighter" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 220.0 MiB | 0.15 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95050 #id: 8612 #code: "IEEE00000746" #attributes: Doctrine\ORM\PersistentCollection {#95067 …} #variants: Doctrine\ORM\PersistentCollection {#95069 …} #options: Doctrine\ORM\PersistentCollection {#95073 …} #associations: Doctrine\ORM\PersistentCollection {#95071 …} #createdAt: DateTime @1751037562 {#95043 : 2025-06-27 17:19:22.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95044 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95057 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96617 #locale: "en_US" #translatable: App\Entity\Product\Product {#95050} #id: 29457 #name: "IEEE 510:1983 (R1992)" #slug: "ieee-510-1983-r1992-ieee00000746-240264" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Safety practices for those who are involved with making measurements on high-voltage sources or with high-power sources of various types, including power-system lines, 60-Hz test transformers, direct-voltage supplies, lightning-impulse generators, and switching-impulse generators are recommended. Electrical hazards involved in temporary measurements, as opposed to metering, relaying, or routine line work, are considered. Safety is considered in connection with testing in laboratories, in the field, in substations, and on lines, and with the test equipment utilized. Cable-fault location, large-capacitance-load testing, high-current testing, and direct connection to power lines are treated separately.<br />\n \t\t\t\t<br />\n This recommended practice is concerned with safety practices for those who are involved with making measurements on high-voltage sources or with high-power sources of various types including power-system lines, 60 Hz test transformers, direct-voltage supplies, lightning-impulse generators, and switching-impulse generators. This recommended practice is limited to safety practices with regard to electrical hazards involved in temporary measurements, as opposed to metering, relaying or routine line work.<br />\n Considerations of safety in electrical testing apply not only to personnel but to the test equipment and apparatus or system under test. This recommended practice deals generally with safety in connection with testing in laboratories, in the field, in substations and on lines, and with the test equipment utilized. Special areas involving cable-fault location, large capacitance load testing, high-current testing, and direct connection to power lines are treated separately. For applications of high-voltage test equipment and methods in areas not specifically covered. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practices for Safety in High-Voltage and High-Power Testing" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95059 …} #channels: Doctrine\ORM\PersistentCollection {#95065 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95061 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95063 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95051 …} -apiLastModifiedAt: DateTime @1754517600 {#95045 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95046 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @421279200 {#95047 : 1983-05-09 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @700959600 {#95048 : 1992-03-19 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @1106607600 {#95049 : 2005-01-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "510" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95053 …} -favorites: Doctrine\ORM\PersistentCollection {#95055 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#96624 +product: App\Entity\Product\Product {#95050 #id: 8612 #code: "IEEE00000746" #attributes: Doctrine\ORM\PersistentCollection {#95067 …} #variants: Doctrine\ORM\PersistentCollection {#95069 …} #options: Doctrine\ORM\PersistentCollection {#95073 …} #associations: Doctrine\ORM\PersistentCollection {#95071 …} #createdAt: DateTime @1751037562 {#95043 : 2025-06-27 17:19:22.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95044 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95057 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96617 #locale: "en_US" #translatable: App\Entity\Product\Product {#95050} #id: 29457 #name: "IEEE 510:1983 (R1992)" #slug: "ieee-510-1983-r1992-ieee00000746-240264" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Safety practices for those who are involved with making measurements on high-voltage sources or with high-power sources of various types, including power-system lines, 60-Hz test transformers, direct-voltage supplies, lightning-impulse generators, and switching-impulse generators are recommended. Electrical hazards involved in temporary measurements, as opposed to metering, relaying, or routine line work, are considered. Safety is considered in connection with testing in laboratories, in the field, in substations, and on lines, and with the test equipment utilized. Cable-fault location, large-capacitance-load testing, high-current testing, and direct connection to power lines are treated separately.<br />\n \t\t\t\t<br />\n This recommended practice is concerned with safety practices for those who are involved with making measurements on high-voltage sources or with high-power sources of various types including power-system lines, 60 Hz test transformers, direct-voltage supplies, lightning-impulse generators, and switching-impulse generators. This recommended practice is limited to safety practices with regard to electrical hazards involved in temporary measurements, as opposed to metering, relaying or routine line work.<br />\n Considerations of safety in electrical testing apply not only to personnel but to the test equipment and apparatus or system under test. This recommended practice deals generally with safety in connection with testing in laboratories, in the field, in substations and on lines, and with the test equipment utilized. Special areas involving cable-fault location, large capacitance load testing, high-current testing, and direct connection to power lines are treated separately. For applications of high-voltage test equipment and methods in areas not specifically covered. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practices for Safety in High-Voltage and High-Power Testing" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95059 …} #channels: Doctrine\ORM\PersistentCollection {#95065 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95061 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95063 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95051 …} -apiLastModifiedAt: DateTime @1754517600 {#95045 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95046 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @421279200 {#95047 : 1983-05-09 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @700959600 {#95048 : 1992-03-19 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @1106607600 {#95049 : 2005-01-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "510" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95053 …} -favorites: Doctrine\ORM\PersistentCollection {#95055 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 220.0 MiB | 0.57 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95050 #id: 8612 #code: "IEEE00000746" #attributes: Doctrine\ORM\PersistentCollection {#95067 …} #variants: Doctrine\ORM\PersistentCollection {#95069 …} #options: Doctrine\ORM\PersistentCollection {#95073 …} #associations: Doctrine\ORM\PersistentCollection {#95071 …} #createdAt: DateTime @1751037562 {#95043 : 2025-06-27 17:19:22.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95044 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95057 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96617 #locale: "en_US" #translatable: App\Entity\Product\Product {#95050} #id: 29457 #name: "IEEE 510:1983 (R1992)" #slug: "ieee-510-1983-r1992-ieee00000746-240264" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Safety practices for those who are involved with making measurements on high-voltage sources or with high-power sources of various types, including power-system lines, 60-Hz test transformers, direct-voltage supplies, lightning-impulse generators, and switching-impulse generators are recommended. Electrical hazards involved in temporary measurements, as opposed to metering, relaying, or routine line work, are considered. Safety is considered in connection with testing in laboratories, in the field, in substations, and on lines, and with the test equipment utilized. Cable-fault location, large-capacitance-load testing, high-current testing, and direct connection to power lines are treated separately.<br />\n \t\t\t\t<br />\n This recommended practice is concerned with safety practices for those who are involved with making measurements on high-voltage sources or with high-power sources of various types including power-system lines, 60 Hz test transformers, direct-voltage supplies, lightning-impulse generators, and switching-impulse generators. This recommended practice is limited to safety practices with regard to electrical hazards involved in temporary measurements, as opposed to metering, relaying or routine line work.<br />\n Considerations of safety in electrical testing apply not only to personnel but to the test equipment and apparatus or system under test. This recommended practice deals generally with safety in connection with testing in laboratories, in the field, in substations and on lines, and with the test equipment utilized. Special areas involving cable-fault location, large capacitance load testing, high-current testing, and direct connection to power lines are treated separately. For applications of high-voltage test equipment and methods in areas not specifically covered. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practices for Safety in High-Voltage and High-Power Testing" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95059 …} #channels: Doctrine\ORM\PersistentCollection {#95065 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95061 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95063 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95051 …} -apiLastModifiedAt: DateTime @1754517600 {#95045 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95046 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @421279200 {#95047 : 1983-05-09 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @700959600 {#95048 : 1992-03-19 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @1106607600 {#95049 : 2005-01-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "510" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95053 …} -favorites: Doctrine\ORM\PersistentCollection {#95055 …} } ] |
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| Attributes | [] |
|||
| Component | App\Twig\Components\ProductMostRecent {#96701 +product: App\Entity\Product\Product {#95050 #id: 8612 #code: "IEEE00000746" #attributes: Doctrine\ORM\PersistentCollection {#95067 …} #variants: Doctrine\ORM\PersistentCollection {#95069 …} #options: Doctrine\ORM\PersistentCollection {#95073 …} #associations: Doctrine\ORM\PersistentCollection {#95071 …} #createdAt: DateTime @1751037562 {#95043 : 2025-06-27 17:19:22.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95044 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95057 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96617 #locale: "en_US" #translatable: App\Entity\Product\Product {#95050} #id: 29457 #name: "IEEE 510:1983 (R1992)" #slug: "ieee-510-1983-r1992-ieee00000746-240264" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Safety practices for those who are involved with making measurements on high-voltage sources or with high-power sources of various types, including power-system lines, 60-Hz test transformers, direct-voltage supplies, lightning-impulse generators, and switching-impulse generators are recommended. Electrical hazards involved in temporary measurements, as opposed to metering, relaying, or routine line work, are considered. Safety is considered in connection with testing in laboratories, in the field, in substations, and on lines, and with the test equipment utilized. Cable-fault location, large-capacitance-load testing, high-current testing, and direct connection to power lines are treated separately.<br />\n \t\t\t\t<br />\n This recommended practice is concerned with safety practices for those who are involved with making measurements on high-voltage sources or with high-power sources of various types including power-system lines, 60 Hz test transformers, direct-voltage supplies, lightning-impulse generators, and switching-impulse generators. This recommended practice is limited to safety practices with regard to electrical hazards involved in temporary measurements, as opposed to metering, relaying or routine line work.<br />\n Considerations of safety in electrical testing apply not only to personnel but to the test equipment and apparatus or system under test. This recommended practice deals generally with safety in connection with testing in laboratories, in the field, in substations and on lines, and with the test equipment utilized. Special areas involving cable-fault location, large capacitance load testing, high-current testing, and direct connection to power lines are treated separately. For applications of high-voltage test equipment and methods in areas not specifically covered. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practices for Safety in High-Voltage and High-Power Testing" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95059 …} #channels: Doctrine\ORM\PersistentCollection {#95065 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95061 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95063 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95051 …} -apiLastModifiedAt: DateTime @1754517600 {#95045 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95046 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @421279200 {#95047 : 1983-05-09 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @700959600 {#95048 : 1992-03-19 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @1106607600 {#95049 : 2005-01-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "510" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95053 …} -favorites: Doctrine\ORM\PersistentCollection {#95055 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductCard | App\Twig\Components\ProductCard | 220.0 MiB | 6.69 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95081 #id: 8768 #code: "IEEE00000986" #attributes: Doctrine\ORM\PersistentCollection {#95098 …} #variants: Doctrine\ORM\PersistentCollection {#95100 …} #options: Doctrine\ORM\PersistentCollection {#95104 …} #associations: Doctrine\ORM\PersistentCollection {#95102 …} #createdAt: DateTime @1751037693 {#95075 : 2025-06-27 17:21:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95076 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95088 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96826 #locale: "en_US" #translatable: App\Entity\Product\Product {#95081} #id: 30081 #name: "IEEE 748:1979" #slug: "ieee-748-1979-ieee00000986-240420" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Withdrawn Standard. This standard applies to frequenct scanning spectrum analyzers.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Spectrum Analyzers" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95090 …} #channels: Doctrine\ORM\PersistentCollection {#95096 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95092 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95094 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95082 …} -apiLastModifiedAt: DateTime @1754517600 {#95077 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95078 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @306972000 {#95079 : 1979-09-24 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @660438000 {#95080 : 1990-12-06 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "748" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95084 …} -favorites: Doctrine\ORM\PersistentCollection {#95086 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#96806 +product: App\Entity\Product\Product {#95081 #id: 8768 #code: "IEEE00000986" #attributes: Doctrine\ORM\PersistentCollection {#95098 …} #variants: Doctrine\ORM\PersistentCollection {#95100 …} #options: Doctrine\ORM\PersistentCollection {#95104 …} #associations: Doctrine\ORM\PersistentCollection {#95102 …} #createdAt: DateTime @1751037693 {#95075 : 2025-06-27 17:21:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95076 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95088 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96826 #locale: "en_US" #translatable: App\Entity\Product\Product {#95081} #id: 30081 #name: "IEEE 748:1979" #slug: "ieee-748-1979-ieee00000986-240420" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Withdrawn Standard. This standard applies to frequenct scanning spectrum analyzers.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Spectrum Analyzers" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95090 …} #channels: Doctrine\ORM\PersistentCollection {#95096 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95092 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95094 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95082 …} -apiLastModifiedAt: DateTime @1754517600 {#95077 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95078 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @306972000 {#95079 : 1979-09-24 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @660438000 {#95080 : 1990-12-06 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "748" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95084 …} -favorites: Doctrine\ORM\PersistentCollection {#95086 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 220.0 MiB | 0.14 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95081 #id: 8768 #code: "IEEE00000986" #attributes: Doctrine\ORM\PersistentCollection {#95098 …} #variants: Doctrine\ORM\PersistentCollection {#95100 …} #options: Doctrine\ORM\PersistentCollection {#95104 …} #associations: Doctrine\ORM\PersistentCollection {#95102 …} #createdAt: DateTime @1751037693 {#95075 : 2025-06-27 17:21:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95076 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95088 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96826 #locale: "en_US" #translatable: App\Entity\Product\Product {#95081} #id: 30081 #name: "IEEE 748:1979" #slug: "ieee-748-1979-ieee00000986-240420" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Withdrawn Standard. This standard applies to frequenct scanning spectrum analyzers.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Spectrum Analyzers" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95090 …} #channels: Doctrine\ORM\PersistentCollection {#95096 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95092 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95094 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95082 …} -apiLastModifiedAt: DateTime @1754517600 {#95077 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95078 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @306972000 {#95079 : 1979-09-24 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @660438000 {#95080 : 1990-12-06 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "748" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95084 …} -favorites: Doctrine\ORM\PersistentCollection {#95086 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
|||
| Component | App\Twig\Components\ProductState {#96833 +product: App\Entity\Product\Product {#95081 #id: 8768 #code: "IEEE00000986" #attributes: Doctrine\ORM\PersistentCollection {#95098 …} #variants: Doctrine\ORM\PersistentCollection {#95100 …} #options: Doctrine\ORM\PersistentCollection {#95104 …} #associations: Doctrine\ORM\PersistentCollection {#95102 …} #createdAt: DateTime @1751037693 {#95075 : 2025-06-27 17:21:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95076 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95088 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96826 #locale: "en_US" #translatable: App\Entity\Product\Product {#95081} #id: 30081 #name: "IEEE 748:1979" #slug: "ieee-748-1979-ieee00000986-240420" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Withdrawn Standard. This standard applies to frequenct scanning spectrum analyzers.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Spectrum Analyzers" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95090 …} #channels: Doctrine\ORM\PersistentCollection {#95096 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95092 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95094 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95082 …} -apiLastModifiedAt: DateTime @1754517600 {#95077 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95078 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @306972000 {#95079 : 1979-09-24 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @660438000 {#95080 : 1990-12-06 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "748" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95084 …} -favorites: Doctrine\ORM\PersistentCollection {#95086 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 220.0 MiB | 0.58 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95081 #id: 8768 #code: "IEEE00000986" #attributes: Doctrine\ORM\PersistentCollection {#95098 …} #variants: Doctrine\ORM\PersistentCollection {#95100 …} #options: Doctrine\ORM\PersistentCollection {#95104 …} #associations: Doctrine\ORM\PersistentCollection {#95102 …} #createdAt: DateTime @1751037693 {#95075 : 2025-06-27 17:21:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95076 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95088 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96826 #locale: "en_US" #translatable: App\Entity\Product\Product {#95081} #id: 30081 #name: "IEEE 748:1979" #slug: "ieee-748-1979-ieee00000986-240420" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Withdrawn Standard. This standard applies to frequenct scanning spectrum analyzers.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Spectrum Analyzers" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95090 …} #channels: Doctrine\ORM\PersistentCollection {#95096 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95092 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95094 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95082 …} -apiLastModifiedAt: DateTime @1754517600 {#95077 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95078 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @306972000 {#95079 : 1979-09-24 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @660438000 {#95080 : 1990-12-06 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "748" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95084 …} -favorites: Doctrine\ORM\PersistentCollection {#95086 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#96910 +product: App\Entity\Product\Product {#95081 #id: 8768 #code: "IEEE00000986" #attributes: Doctrine\ORM\PersistentCollection {#95098 …} #variants: Doctrine\ORM\PersistentCollection {#95100 …} #options: Doctrine\ORM\PersistentCollection {#95104 …} #associations: Doctrine\ORM\PersistentCollection {#95102 …} #createdAt: DateTime @1751037693 {#95075 : 2025-06-27 17:21:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95076 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95088 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96826 #locale: "en_US" #translatable: App\Entity\Product\Product {#95081} #id: 30081 #name: "IEEE 748:1979" #slug: "ieee-748-1979-ieee00000986-240420" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Withdrawn Standard. This standard applies to frequenct scanning spectrum analyzers.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Spectrum Analyzers" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95090 …} #channels: Doctrine\ORM\PersistentCollection {#95096 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95092 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95094 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95082 …} -apiLastModifiedAt: DateTime @1754517600 {#95077 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95078 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @306972000 {#95079 : 1979-09-24 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @660438000 {#95080 : 1990-12-06 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "748" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95084 …} -favorites: Doctrine\ORM\PersistentCollection {#95086 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 220.0 MiB | 6.94 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95111 #id: 10145 #code: "IEEE00003721" #attributes: Doctrine\ORM\PersistentCollection {#95128 …} #variants: Doctrine\ORM\PersistentCollection {#95130 …} #options: Doctrine\ORM\PersistentCollection {#95134 …} #associations: Doctrine\ORM\PersistentCollection {#95132 …} #createdAt: DateTime @1751038852 {#95106 : 2025-06-27 17:40:52.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95107 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95118 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97035 #locale: "en_US" #translatable: App\Entity\Product\Product {#95111} #id: 35589 #name: "IEEE 1671:2006" #slug: "ieee-1671-2006-ieee00003721-241797" #description: """ New IEEE Standard - Superseded.<br />\n This document specifies the framework for the family of ATML standards. ATML defines a standard exchange medium for sharing information between components of an Automatic Test System (ATS), utilizing the eXtensible Markup Language (XML).<br />\n \t\t\t\t<br />\n ATML defines a standard exchange medium for sharing information between components of automatic test systems. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using the eXtensible Markup Language (XML). This document specifies the framework for the family of ATML standards.<br />\n The purpose of ATML is to support test program, test asset, and Unit Under Test (UUT) interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this document is to provide an overview of ATML goals as well as to provide guidance for usage of the ATML family of standards. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95120 …} #channels: Doctrine\ORM\PersistentCollection {#95126 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95122 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95124 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95112 …} -apiLastModifiedAt: DateTime @1754517600 {#95108 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1692136800 {#95109 : 2023-08-16 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1166137200 {#95110 : 2006-12-15 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1671" -bookCollection: "" -pageCount: 89 -documents: Doctrine\ORM\PersistentCollection {#95114 …} -favorites: Doctrine\ORM\PersistentCollection {#95116 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "secondary-lighter" "hoverType" => "border-black" ] |
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| Attributes | [] |
|||
| Component | App\Twig\Components\ProductCard {#97015 +product: App\Entity\Product\Product {#95111 #id: 10145 #code: "IEEE00003721" #attributes: Doctrine\ORM\PersistentCollection {#95128 …} #variants: Doctrine\ORM\PersistentCollection {#95130 …} #options: Doctrine\ORM\PersistentCollection {#95134 …} #associations: Doctrine\ORM\PersistentCollection {#95132 …} #createdAt: DateTime @1751038852 {#95106 : 2025-06-27 17:40:52.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95107 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95118 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97035 #locale: "en_US" #translatable: App\Entity\Product\Product {#95111} #id: 35589 #name: "IEEE 1671:2006" #slug: "ieee-1671-2006-ieee00003721-241797" #description: """ New IEEE Standard - Superseded.<br />\n This document specifies the framework for the family of ATML standards. ATML defines a standard exchange medium for sharing information between components of an Automatic Test System (ATS), utilizing the eXtensible Markup Language (XML).<br />\n \t\t\t\t<br />\n ATML defines a standard exchange medium for sharing information between components of automatic test systems. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using the eXtensible Markup Language (XML). This document specifies the framework for the family of ATML standards.<br />\n The purpose of ATML is to support test program, test asset, and Unit Under Test (UUT) interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this document is to provide an overview of ATML goals as well as to provide guidance for usage of the ATML family of standards. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95120 …} #channels: Doctrine\ORM\PersistentCollection {#95126 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95122 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95124 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95112 …} -apiLastModifiedAt: DateTime @1754517600 {#95108 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1692136800 {#95109 : 2023-08-16 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1166137200 {#95110 : 2006-12-15 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1671" -bookCollection: "" -pageCount: 89 -documents: Doctrine\ORM\PersistentCollection {#95114 …} -favorites: Doctrine\ORM\PersistentCollection {#95116 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "secondary-lighter" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 220.0 MiB | 0.14 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95111 #id: 10145 #code: "IEEE00003721" #attributes: Doctrine\ORM\PersistentCollection {#95128 …} #variants: Doctrine\ORM\PersistentCollection {#95130 …} #options: Doctrine\ORM\PersistentCollection {#95134 …} #associations: Doctrine\ORM\PersistentCollection {#95132 …} #createdAt: DateTime @1751038852 {#95106 : 2025-06-27 17:40:52.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95107 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95118 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97035 #locale: "en_US" #translatable: App\Entity\Product\Product {#95111} #id: 35589 #name: "IEEE 1671:2006" #slug: "ieee-1671-2006-ieee00003721-241797" #description: """ New IEEE Standard - Superseded.<br />\n This document specifies the framework for the family of ATML standards. ATML defines a standard exchange medium for sharing information between components of an Automatic Test System (ATS), utilizing the eXtensible Markup Language (XML).<br />\n \t\t\t\t<br />\n ATML defines a standard exchange medium for sharing information between components of automatic test systems. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using the eXtensible Markup Language (XML). This document specifies the framework for the family of ATML standards.<br />\n The purpose of ATML is to support test program, test asset, and Unit Under Test (UUT) interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this document is to provide an overview of ATML goals as well as to provide guidance for usage of the ATML family of standards. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95120 …} #channels: Doctrine\ORM\PersistentCollection {#95126 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95122 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95124 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95112 …} -apiLastModifiedAt: DateTime @1754517600 {#95108 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1692136800 {#95109 : 2023-08-16 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1166137200 {#95110 : 2006-12-15 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1671" -bookCollection: "" -pageCount: 89 -documents: Doctrine\ORM\PersistentCollection {#95114 …} -favorites: Doctrine\ORM\PersistentCollection {#95116 …} } ] |
|||
| Attributes | [ "showFullLabel" => false ] |
|||
| Component | App\Twig\Components\ProductState {#97042 +product: App\Entity\Product\Product {#95111 #id: 10145 #code: "IEEE00003721" #attributes: Doctrine\ORM\PersistentCollection {#95128 …} #variants: Doctrine\ORM\PersistentCollection {#95130 …} #options: Doctrine\ORM\PersistentCollection {#95134 …} #associations: Doctrine\ORM\PersistentCollection {#95132 …} #createdAt: DateTime @1751038852 {#95106 : 2025-06-27 17:40:52.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95107 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95118 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97035 #locale: "en_US" #translatable: App\Entity\Product\Product {#95111} #id: 35589 #name: "IEEE 1671:2006" #slug: "ieee-1671-2006-ieee00003721-241797" #description: """ New IEEE Standard - Superseded.<br />\n This document specifies the framework for the family of ATML standards. ATML defines a standard exchange medium for sharing information between components of an Automatic Test System (ATS), utilizing the eXtensible Markup Language (XML).<br />\n \t\t\t\t<br />\n ATML defines a standard exchange medium for sharing information between components of automatic test systems. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using the eXtensible Markup Language (XML). This document specifies the framework for the family of ATML standards.<br />\n The purpose of ATML is to support test program, test asset, and Unit Under Test (UUT) interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this document is to provide an overview of ATML goals as well as to provide guidance for usage of the ATML family of standards. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95120 …} #channels: Doctrine\ORM\PersistentCollection {#95126 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95122 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95124 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95112 …} -apiLastModifiedAt: DateTime @1754517600 {#95108 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1692136800 {#95109 : 2023-08-16 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1166137200 {#95110 : 2006-12-15 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1671" -bookCollection: "" -pageCount: 89 -documents: Doctrine\ORM\PersistentCollection {#95114 …} -favorites: Doctrine\ORM\PersistentCollection {#95116 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductMostRecent | App\Twig\Components\ProductMostRecent | 220.0 MiB | 0.53 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95111 #id: 10145 #code: "IEEE00003721" #attributes: Doctrine\ORM\PersistentCollection {#95128 …} #variants: Doctrine\ORM\PersistentCollection {#95130 …} #options: Doctrine\ORM\PersistentCollection {#95134 …} #associations: Doctrine\ORM\PersistentCollection {#95132 …} #createdAt: DateTime @1751038852 {#95106 : 2025-06-27 17:40:52.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95107 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95118 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97035 #locale: "en_US" #translatable: App\Entity\Product\Product {#95111} #id: 35589 #name: "IEEE 1671:2006" #slug: "ieee-1671-2006-ieee00003721-241797" #description: """ New IEEE Standard - Superseded.<br />\n This document specifies the framework for the family of ATML standards. ATML defines a standard exchange medium for sharing information between components of an Automatic Test System (ATS), utilizing the eXtensible Markup Language (XML).<br />\n \t\t\t\t<br />\n ATML defines a standard exchange medium for sharing information between components of automatic test systems. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using the eXtensible Markup Language (XML). This document specifies the framework for the family of ATML standards.<br />\n The purpose of ATML is to support test program, test asset, and Unit Under Test (UUT) interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this document is to provide an overview of ATML goals as well as to provide guidance for usage of the ATML family of standards. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95120 …} #channels: Doctrine\ORM\PersistentCollection {#95126 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95122 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95124 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95112 …} -apiLastModifiedAt: DateTime @1754517600 {#95108 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1692136800 {#95109 : 2023-08-16 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1166137200 {#95110 : 2006-12-15 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1671" -bookCollection: "" -pageCount: 89 -documents: Doctrine\ORM\PersistentCollection {#95114 …} -favorites: Doctrine\ORM\PersistentCollection {#95116 …} } ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductMostRecent {#97119 +product: App\Entity\Product\Product {#95111 #id: 10145 #code: "IEEE00003721" #attributes: Doctrine\ORM\PersistentCollection {#95128 …} #variants: Doctrine\ORM\PersistentCollection {#95130 …} #options: Doctrine\ORM\PersistentCollection {#95134 …} #associations: Doctrine\ORM\PersistentCollection {#95132 …} #createdAt: DateTime @1751038852 {#95106 : 2025-06-27 17:40:52.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95107 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95118 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97035 #locale: "en_US" #translatable: App\Entity\Product\Product {#95111} #id: 35589 #name: "IEEE 1671:2006" #slug: "ieee-1671-2006-ieee00003721-241797" #description: """ New IEEE Standard - Superseded.<br />\n This document specifies the framework for the family of ATML standards. ATML defines a standard exchange medium for sharing information between components of an Automatic Test System (ATS), utilizing the eXtensible Markup Language (XML).<br />\n \t\t\t\t<br />\n ATML defines a standard exchange medium for sharing information between components of automatic test systems. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using the eXtensible Markup Language (XML). This document specifies the framework for the family of ATML standards.<br />\n The purpose of ATML is to support test program, test asset, and Unit Under Test (UUT) interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this document is to provide an overview of ATML goals as well as to provide guidance for usage of the ATML family of standards. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95120 …} #channels: Doctrine\ORM\PersistentCollection {#95126 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95122 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95124 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95112 …} -apiLastModifiedAt: DateTime @1754517600 {#95108 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1692136800 {#95109 : 2023-08-16 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1166137200 {#95110 : 2006-12-15 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1671" -bookCollection: "" -pageCount: 89 -documents: Doctrine\ORM\PersistentCollection {#95114 …} -favorites: Doctrine\ORM\PersistentCollection {#95116 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductCard | App\Twig\Components\ProductCard | 220.0 MiB | 7.52 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95142 #id: 10510 #code: "IEEE00004514" #attributes: Doctrine\ORM\PersistentCollection {#95159 …} #variants: Doctrine\ORM\PersistentCollection {#95161 …} #options: Doctrine\ORM\PersistentCollection {#95165 …} #associations: Doctrine\ORM\PersistentCollection {#95163 …} #createdAt: DateTime @1751039106 {#95136 : 2025-06-27 17:45:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95137 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95149 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97244 #locale: "en_US" #translatable: App\Entity\Product\Product {#95142} #id: 37049 #name: "IEEE 1671:2010" #slug: "ieee-1671-2010-ieee00004514-242162" #description: """ Revision Standard - Inactive-Reserved.<br />\n This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.<br />\n \t\t\t\t<br />\n ATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards.<br />\n The purpose of ATML is to support TP, test asset, and UUT interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this standard is to provide an overview of ATML goals, define the ATML family of standards, and specify common data elements for the ATML family of standards. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95151 …} #channels: Doctrine\ORM\PersistentCollection {#95157 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95153 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95155 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95143 …} -apiLastModifiedAt: DateTime @1754517600 {#95138 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1641250800 {#95139 : 2022-01-04 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1295478000 {#95140 : 2011-01-20 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#95141 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1671" -bookCollection: "" -pageCount: 388 -documents: Doctrine\ORM\PersistentCollection {#95145 …} -favorites: Doctrine\ORM\PersistentCollection {#95147 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
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| Attributes | [] |
|||
| Component | App\Twig\Components\ProductCard {#97224 +product: App\Entity\Product\Product {#95142 #id: 10510 #code: "IEEE00004514" #attributes: Doctrine\ORM\PersistentCollection {#95159 …} #variants: Doctrine\ORM\PersistentCollection {#95161 …} #options: Doctrine\ORM\PersistentCollection {#95165 …} #associations: Doctrine\ORM\PersistentCollection {#95163 …} #createdAt: DateTime @1751039106 {#95136 : 2025-06-27 17:45:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95137 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95149 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97244 #locale: "en_US" #translatable: App\Entity\Product\Product {#95142} #id: 37049 #name: "IEEE 1671:2010" #slug: "ieee-1671-2010-ieee00004514-242162" #description: """ Revision Standard - Inactive-Reserved.<br />\n This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.<br />\n \t\t\t\t<br />\n ATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards.<br />\n The purpose of ATML is to support TP, test asset, and UUT interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this standard is to provide an overview of ATML goals, define the ATML family of standards, and specify common data elements for the ATML family of standards. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95151 …} #channels: Doctrine\ORM\PersistentCollection {#95157 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95153 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95155 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95143 …} -apiLastModifiedAt: DateTime @1754517600 {#95138 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1641250800 {#95139 : 2022-01-04 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1295478000 {#95140 : 2011-01-20 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#95141 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1671" -bookCollection: "" -pageCount: 388 -documents: Doctrine\ORM\PersistentCollection {#95145 …} -favorites: Doctrine\ORM\PersistentCollection {#95147 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 220.0 MiB | 0.14 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95142 #id: 10510 #code: "IEEE00004514" #attributes: Doctrine\ORM\PersistentCollection {#95159 …} #variants: Doctrine\ORM\PersistentCollection {#95161 …} #options: Doctrine\ORM\PersistentCollection {#95165 …} #associations: Doctrine\ORM\PersistentCollection {#95163 …} #createdAt: DateTime @1751039106 {#95136 : 2025-06-27 17:45:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95137 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95149 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97244 #locale: "en_US" #translatable: App\Entity\Product\Product {#95142} #id: 37049 #name: "IEEE 1671:2010" #slug: "ieee-1671-2010-ieee00004514-242162" #description: """ Revision Standard - Inactive-Reserved.<br />\n This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.<br />\n \t\t\t\t<br />\n ATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards.<br />\n The purpose of ATML is to support TP, test asset, and UUT interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this standard is to provide an overview of ATML goals, define the ATML family of standards, and specify common data elements for the ATML family of standards. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95151 …} #channels: Doctrine\ORM\PersistentCollection {#95157 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95153 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95155 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95143 …} -apiLastModifiedAt: DateTime @1754517600 {#95138 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1641250800 {#95139 : 2022-01-04 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1295478000 {#95140 : 2011-01-20 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#95141 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1671" -bookCollection: "" -pageCount: 388 -documents: Doctrine\ORM\PersistentCollection {#95145 …} -favorites: Doctrine\ORM\PersistentCollection {#95147 …} } ] |
|||
| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#97251 +product: App\Entity\Product\Product {#95142 #id: 10510 #code: "IEEE00004514" #attributes: Doctrine\ORM\PersistentCollection {#95159 …} #variants: Doctrine\ORM\PersistentCollection {#95161 …} #options: Doctrine\ORM\PersistentCollection {#95165 …} #associations: Doctrine\ORM\PersistentCollection {#95163 …} #createdAt: DateTime @1751039106 {#95136 : 2025-06-27 17:45:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95137 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95149 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97244 #locale: "en_US" #translatable: App\Entity\Product\Product {#95142} #id: 37049 #name: "IEEE 1671:2010" #slug: "ieee-1671-2010-ieee00004514-242162" #description: """ Revision Standard - Inactive-Reserved.<br />\n This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.<br />\n \t\t\t\t<br />\n ATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards.<br />\n The purpose of ATML is to support TP, test asset, and UUT interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this standard is to provide an overview of ATML goals, define the ATML family of standards, and specify common data elements for the ATML family of standards. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95151 …} #channels: Doctrine\ORM\PersistentCollection {#95157 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95153 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95155 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95143 …} -apiLastModifiedAt: DateTime @1754517600 {#95138 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1641250800 {#95139 : 2022-01-04 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1295478000 {#95140 : 2011-01-20 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#95141 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1671" -bookCollection: "" -pageCount: 388 -documents: Doctrine\ORM\PersistentCollection {#95145 …} -favorites: Doctrine\ORM\PersistentCollection {#95147 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 220.0 MiB | 0.53 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95142 #id: 10510 #code: "IEEE00004514" #attributes: Doctrine\ORM\PersistentCollection {#95159 …} #variants: Doctrine\ORM\PersistentCollection {#95161 …} #options: Doctrine\ORM\PersistentCollection {#95165 …} #associations: Doctrine\ORM\PersistentCollection {#95163 …} #createdAt: DateTime @1751039106 {#95136 : 2025-06-27 17:45:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95137 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95149 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97244 #locale: "en_US" #translatable: App\Entity\Product\Product {#95142} #id: 37049 #name: "IEEE 1671:2010" #slug: "ieee-1671-2010-ieee00004514-242162" #description: """ Revision Standard - Inactive-Reserved.<br />\n This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.<br />\n \t\t\t\t<br />\n ATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards.<br />\n The purpose of ATML is to support TP, test asset, and UUT interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this standard is to provide an overview of ATML goals, define the ATML family of standards, and specify common data elements for the ATML family of standards. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95151 …} #channels: Doctrine\ORM\PersistentCollection {#95157 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95153 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95155 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95143 …} -apiLastModifiedAt: DateTime @1754517600 {#95138 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1641250800 {#95139 : 2022-01-04 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1295478000 {#95140 : 2011-01-20 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#95141 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1671" -bookCollection: "" -pageCount: 388 -documents: Doctrine\ORM\PersistentCollection {#95145 …} -favorites: Doctrine\ORM\PersistentCollection {#95147 …} } ] |
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| Component | App\Twig\Components\ProductMostRecent {#97328 +product: App\Entity\Product\Product {#95142 #id: 10510 #code: "IEEE00004514" #attributes: Doctrine\ORM\PersistentCollection {#95159 …} #variants: Doctrine\ORM\PersistentCollection {#95161 …} #options: Doctrine\ORM\PersistentCollection {#95165 …} #associations: Doctrine\ORM\PersistentCollection {#95163 …} #createdAt: DateTime @1751039106 {#95136 : 2025-06-27 17:45:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95137 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95149 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97244 #locale: "en_US" #translatable: App\Entity\Product\Product {#95142} #id: 37049 #name: "IEEE 1671:2010" #slug: "ieee-1671-2010-ieee00004514-242162" #description: """ Revision Standard - Inactive-Reserved.<br />\n This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.<br />\n \t\t\t\t<br />\n ATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards.<br />\n The purpose of ATML is to support TP, test asset, and UUT interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this standard is to provide an overview of ATML goals, define the ATML family of standards, and specify common data elements for the ATML family of standards. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95151 …} #channels: Doctrine\ORM\PersistentCollection {#95157 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95153 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95155 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95143 …} -apiLastModifiedAt: DateTime @1754517600 {#95138 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1641250800 {#95139 : 2022-01-04 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1295478000 {#95140 : 2011-01-20 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#95141 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1671" -bookCollection: "" -pageCount: 388 -documents: Doctrine\ORM\PersistentCollection {#95145 …} -favorites: Doctrine\ORM\PersistentCollection {#95147 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 220.0 MiB | 7.19 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95173 #id: 10644 #code: "IEEE00004756" #attributes: Doctrine\ORM\PersistentCollection {#95190 …} #variants: Doctrine\ORM\PersistentCollection {#95192 …} #options: Doctrine\ORM\PersistentCollection {#95196 …} #associations: Doctrine\ORM\PersistentCollection {#95194 …} #createdAt: DateTime @1751039193 {#95167 : 2025-06-27 17:46:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95168 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95180 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97461 #locale: "en_US" #translatable: App\Entity\Product\Product {#95173} #id: 37585 #name: "IEEE 1812:2014" #slug: "ieee-1812-2014-ieee00004756-242296" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Contained in this trial-use guide are instructions for conducting tests to determine the performance characteristics and machine parameters of permanent magnet (PM) machines. The tests described may be applied to motors and generators, as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that this guide shall cover all possible tests, or tests of a research nature, but only those general methods that may be used to obtain the performance data and machine parameters. The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions.<br />\n The term specified conditions for tests as used in this guide will be considered as rated conditions unless otherwise agreed upon. Rated conditions apply usually to the quantities listed on the machine nameplate.<br />\n \t\t\t\t<br />\n This trial-use guide contains instructions for conducting tests to determine the performance characteristics and machine parameters of permanent magnet (PM) machines. The tests described may be applied to motors and generators as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that this guide shall cover all possible tests, or tests of a research nature, but only those general methods that may be used to obtain the performance data and machine parameters.<br />\n The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions. The term specified conditions for tests as used in this guide will be considered as rated conditions unless otherwise agreed upon. Rated conditions apply usually to the quantities listed on the machine nameplate<br />\n Instructions for conducting tests to determine the performance characteristics and machine parameters of PM machines are covered in this guide. Additional tests can be required by the customers and operators to satisfy specific performance indices. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Trial-Use Guide for Testing Permanent Magnet Machines" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95182 …} #channels: Doctrine\ORM\PersistentCollection {#95188 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95184 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95186 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95174 …} -apiLastModifiedAt: DateTime @1754517600 {#95169 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618783200 {#95170 : 2021-04-19 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1424732400 {#95171 : 2015-02-24 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#95172 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1812" -bookCollection: "" -pageCount: 56 -documents: Doctrine\ORM\PersistentCollection {#95176 …} -favorites: Doctrine\ORM\PersistentCollection {#95178 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "secondary-lighter" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#97441 +product: App\Entity\Product\Product {#95173 #id: 10644 #code: "IEEE00004756" #attributes: Doctrine\ORM\PersistentCollection {#95190 …} #variants: Doctrine\ORM\PersistentCollection {#95192 …} #options: Doctrine\ORM\PersistentCollection {#95196 …} #associations: Doctrine\ORM\PersistentCollection {#95194 …} #createdAt: DateTime @1751039193 {#95167 : 2025-06-27 17:46:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95168 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95180 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97461 #locale: "en_US" #translatable: App\Entity\Product\Product {#95173} #id: 37585 #name: "IEEE 1812:2014" #slug: "ieee-1812-2014-ieee00004756-242296" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Contained in this trial-use guide are instructions for conducting tests to determine the performance characteristics and machine parameters of permanent magnet (PM) machines. The tests described may be applied to motors and generators, as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that this guide shall cover all possible tests, or tests of a research nature, but only those general methods that may be used to obtain the performance data and machine parameters. The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions.<br />\n The term specified conditions for tests as used in this guide will be considered as rated conditions unless otherwise agreed upon. Rated conditions apply usually to the quantities listed on the machine nameplate.<br />\n \t\t\t\t<br />\n This trial-use guide contains instructions for conducting tests to determine the performance characteristics and machine parameters of permanent magnet (PM) machines. The tests described may be applied to motors and generators as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that this guide shall cover all possible tests, or tests of a research nature, but only those general methods that may be used to obtain the performance data and machine parameters.<br />\n The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions. The term specified conditions for tests as used in this guide will be considered as rated conditions unless otherwise agreed upon. Rated conditions apply usually to the quantities listed on the machine nameplate<br />\n Instructions for conducting tests to determine the performance characteristics and machine parameters of PM machines are covered in this guide. Additional tests can be required by the customers and operators to satisfy specific performance indices. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Trial-Use Guide for Testing Permanent Magnet Machines" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95182 …} #channels: Doctrine\ORM\PersistentCollection {#95188 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95184 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95186 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95174 …} -apiLastModifiedAt: DateTime @1754517600 {#95169 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618783200 {#95170 : 2021-04-19 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1424732400 {#95171 : 2015-02-24 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#95172 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1812" -bookCollection: "" -pageCount: 56 -documents: Doctrine\ORM\PersistentCollection {#95176 …} -favorites: Doctrine\ORM\PersistentCollection {#95178 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "secondary-lighter" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 220.0 MiB | 0.15 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95173 #id: 10644 #code: "IEEE00004756" #attributes: Doctrine\ORM\PersistentCollection {#95190 …} #variants: Doctrine\ORM\PersistentCollection {#95192 …} #options: Doctrine\ORM\PersistentCollection {#95196 …} #associations: Doctrine\ORM\PersistentCollection {#95194 …} #createdAt: DateTime @1751039193 {#95167 : 2025-06-27 17:46:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95168 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95180 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97461 #locale: "en_US" #translatable: App\Entity\Product\Product {#95173} #id: 37585 #name: "IEEE 1812:2014" #slug: "ieee-1812-2014-ieee00004756-242296" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Contained in this trial-use guide are instructions for conducting tests to determine the performance characteristics and machine parameters of permanent magnet (PM) machines. The tests described may be applied to motors and generators, as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that this guide shall cover all possible tests, or tests of a research nature, but only those general methods that may be used to obtain the performance data and machine parameters. The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions.<br />\n The term specified conditions for tests as used in this guide will be considered as rated conditions unless otherwise agreed upon. Rated conditions apply usually to the quantities listed on the machine nameplate.<br />\n \t\t\t\t<br />\n This trial-use guide contains instructions for conducting tests to determine the performance characteristics and machine parameters of permanent magnet (PM) machines. The tests described may be applied to motors and generators as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that this guide shall cover all possible tests, or tests of a research nature, but only those general methods that may be used to obtain the performance data and machine parameters.<br />\n The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions. The term specified conditions for tests as used in this guide will be considered as rated conditions unless otherwise agreed upon. Rated conditions apply usually to the quantities listed on the machine nameplate<br />\n Instructions for conducting tests to determine the performance characteristics and machine parameters of PM machines are covered in this guide. Additional tests can be required by the customers and operators to satisfy specific performance indices. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Trial-Use Guide for Testing Permanent Magnet Machines" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95182 …} #channels: Doctrine\ORM\PersistentCollection {#95188 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95184 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95186 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95174 …} -apiLastModifiedAt: DateTime @1754517600 {#95169 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618783200 {#95170 : 2021-04-19 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1424732400 {#95171 : 2015-02-24 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#95172 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1812" -bookCollection: "" -pageCount: 56 -documents: Doctrine\ORM\PersistentCollection {#95176 …} -favorites: Doctrine\ORM\PersistentCollection {#95178 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#97475 +product: App\Entity\Product\Product {#95173 #id: 10644 #code: "IEEE00004756" #attributes: Doctrine\ORM\PersistentCollection {#95190 …} #variants: Doctrine\ORM\PersistentCollection {#95192 …} #options: Doctrine\ORM\PersistentCollection {#95196 …} #associations: Doctrine\ORM\PersistentCollection {#95194 …} #createdAt: DateTime @1751039193 {#95167 : 2025-06-27 17:46:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95168 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95180 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97461 #locale: "en_US" #translatable: App\Entity\Product\Product {#95173} #id: 37585 #name: "IEEE 1812:2014" #slug: "ieee-1812-2014-ieee00004756-242296" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Contained in this trial-use guide are instructions for conducting tests to determine the performance characteristics and machine parameters of permanent magnet (PM) machines. The tests described may be applied to motors and generators, as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that this guide shall cover all possible tests, or tests of a research nature, but only those general methods that may be used to obtain the performance data and machine parameters. The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions.<br />\n The term specified conditions for tests as used in this guide will be considered as rated conditions unless otherwise agreed upon. Rated conditions apply usually to the quantities listed on the machine nameplate.<br />\n \t\t\t\t<br />\n This trial-use guide contains instructions for conducting tests to determine the performance characteristics and machine parameters of permanent magnet (PM) machines. The tests described may be applied to motors and generators as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that this guide shall cover all possible tests, or tests of a research nature, but only those general methods that may be used to obtain the performance data and machine parameters.<br />\n The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions. The term specified conditions for tests as used in this guide will be considered as rated conditions unless otherwise agreed upon. Rated conditions apply usually to the quantities listed on the machine nameplate<br />\n Instructions for conducting tests to determine the performance characteristics and machine parameters of PM machines are covered in this guide. Additional tests can be required by the customers and operators to satisfy specific performance indices. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Trial-Use Guide for Testing Permanent Magnet Machines" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95182 …} #channels: Doctrine\ORM\PersistentCollection {#95188 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95184 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95186 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95174 …} -apiLastModifiedAt: DateTime @1754517600 {#95169 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618783200 {#95170 : 2021-04-19 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1424732400 {#95171 : 2015-02-24 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#95172 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1812" -bookCollection: "" -pageCount: 56 -documents: Doctrine\ORM\PersistentCollection {#95176 …} -favorites: Doctrine\ORM\PersistentCollection {#95178 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 220.0 MiB | 0.56 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95173 #id: 10644 #code: "IEEE00004756" #attributes: Doctrine\ORM\PersistentCollection {#95190 …} #variants: Doctrine\ORM\PersistentCollection {#95192 …} #options: Doctrine\ORM\PersistentCollection {#95196 …} #associations: Doctrine\ORM\PersistentCollection {#95194 …} #createdAt: DateTime @1751039193 {#95167 : 2025-06-27 17:46:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95168 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95180 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97461 #locale: "en_US" #translatable: App\Entity\Product\Product {#95173} #id: 37585 #name: "IEEE 1812:2014" #slug: "ieee-1812-2014-ieee00004756-242296" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Contained in this trial-use guide are instructions for conducting tests to determine the performance characteristics and machine parameters of permanent magnet (PM) machines. The tests described may be applied to motors and generators, as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that this guide shall cover all possible tests, or tests of a research nature, but only those general methods that may be used to obtain the performance data and machine parameters. The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions.<br />\n The term specified conditions for tests as used in this guide will be considered as rated conditions unless otherwise agreed upon. Rated conditions apply usually to the quantities listed on the machine nameplate.<br />\n \t\t\t\t<br />\n This trial-use guide contains instructions for conducting tests to determine the performance characteristics and machine parameters of permanent magnet (PM) machines. The tests described may be applied to motors and generators as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that this guide shall cover all possible tests, or tests of a research nature, but only those general methods that may be used to obtain the performance data and machine parameters.<br />\n The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions. The term specified conditions for tests as used in this guide will be considered as rated conditions unless otherwise agreed upon. Rated conditions apply usually to the quantities listed on the machine nameplate<br />\n Instructions for conducting tests to determine the performance characteristics and machine parameters of PM machines are covered in this guide. Additional tests can be required by the customers and operators to satisfy specific performance indices. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Trial-Use Guide for Testing Permanent Magnet Machines" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95182 …} #channels: Doctrine\ORM\PersistentCollection {#95188 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95184 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95186 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95174 …} -apiLastModifiedAt: DateTime @1754517600 {#95169 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618783200 {#95170 : 2021-04-19 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1424732400 {#95171 : 2015-02-24 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#95172 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1812" -bookCollection: "" -pageCount: 56 -documents: Doctrine\ORM\PersistentCollection {#95176 …} -favorites: Doctrine\ORM\PersistentCollection {#95178 …} } ] |
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| Component | App\Twig\Components\ProductMostRecent {#97549 +product: App\Entity\Product\Product {#95173 #id: 10644 #code: "IEEE00004756" #attributes: Doctrine\ORM\PersistentCollection {#95190 …} #variants: Doctrine\ORM\PersistentCollection {#95192 …} #options: Doctrine\ORM\PersistentCollection {#95196 …} #associations: Doctrine\ORM\PersistentCollection {#95194 …} #createdAt: DateTime @1751039193 {#95167 : 2025-06-27 17:46:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95168 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95180 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97461 #locale: "en_US" #translatable: App\Entity\Product\Product {#95173} #id: 37585 #name: "IEEE 1812:2014" #slug: "ieee-1812-2014-ieee00004756-242296" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Contained in this trial-use guide are instructions for conducting tests to determine the performance characteristics and machine parameters of permanent magnet (PM) machines. The tests described may be applied to motors and generators, as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that this guide shall cover all possible tests, or tests of a research nature, but only those general methods that may be used to obtain the performance data and machine parameters. The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions.<br />\n The term specified conditions for tests as used in this guide will be considered as rated conditions unless otherwise agreed upon. Rated conditions apply usually to the quantities listed on the machine nameplate.<br />\n \t\t\t\t<br />\n This trial-use guide contains instructions for conducting tests to determine the performance characteristics and machine parameters of permanent magnet (PM) machines. The tests described may be applied to motors and generators as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that this guide shall cover all possible tests, or tests of a research nature, but only those general methods that may be used to obtain the performance data and machine parameters.<br />\n The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions. The term specified conditions for tests as used in this guide will be considered as rated conditions unless otherwise agreed upon. Rated conditions apply usually to the quantities listed on the machine nameplate<br />\n Instructions for conducting tests to determine the performance characteristics and machine parameters of PM machines are covered in this guide. Additional tests can be required by the customers and operators to satisfy specific performance indices. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Trial-Use Guide for Testing Permanent Magnet Machines" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95182 …} #channels: Doctrine\ORM\PersistentCollection {#95188 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95184 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95186 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95174 …} -apiLastModifiedAt: DateTime @1754517600 {#95169 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618783200 {#95170 : 2021-04-19 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1424732400 {#95171 : 2015-02-24 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#95172 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1812" -bookCollection: "" -pageCount: 56 -documents: Doctrine\ORM\PersistentCollection {#95176 …} -favorites: Doctrine\ORM\PersistentCollection {#95178 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 220.0 MiB | 6.89 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95204 #id: 10659 #code: "IEEE00004777" #attributes: Doctrine\ORM\PersistentCollection {#95221 …} #variants: Doctrine\ORM\PersistentCollection {#95223 …} #options: Doctrine\ORM\PersistentCollection {#95227 …} #associations: Doctrine\ORM\PersistentCollection {#95225 …} #createdAt: DateTime @1751039202 {#95198 : 2025-06-27 17:46:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95199 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95211 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97691 #locale: "en_US" #translatable: App\Entity\Product\Product {#95204} #id: 37645 #name: "IEEE 4:2013" #slug: "ieee-4-2013-ieee00004777-242311" #description: """ Revision Standard - Inactive-Reserved.<br />\n Standard methods and basic techniques for high-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating voltage, direct voltage, and impulse testing are combined in this revision to organize the technical content for ease of use. In addition, the concept of measurement uncertainty in evaluation of high-voltage and high-current tests is introduced in this version.<br />\n \t\t\t\t<br />\n This standard is applicable to - Dielectric tests with direct voltages - Dielectric tests with alternating voltages - Dielectric tests with impulse voltages - Tests with impulse currents - Tests with combinations of the above - Capacitance and dielectric loss measurements This standard is applicable only to tests on equipment with a rated voltage above 1000 V. Procedures are given for applying correction factors to convert test data to standard atmospheric conditions. This standard also specifies procedures for testing equipment when external insulation of the test object is to be subjected to dry, wet, or contaminated conditions.<br />\n The purpose of this standard is to<br />\n - Define terms of general applicability<br />\n - Present general requirements regarding test equipment and procedures<br />\n - Describe methods for evaluation of test results """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Voltage Testing Techniques" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95213 …} #channels: Doctrine\ORM\PersistentCollection {#95219 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95215 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95217 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95205 …} -apiLastModifiedAt: DateTime @1754517600 {#95200 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1712786400 {#95201 : 2024-04-11 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1368136800 {#95202 : 2013-05-10 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1710975600 {#95203 : 2024-03-21 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 213 -documents: Doctrine\ORM\PersistentCollection {#95207 …} -favorites: Doctrine\ORM\PersistentCollection {#95209 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
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| Component | App\Twig\Components\ProductCard {#97671 +product: App\Entity\Product\Product {#95204 #id: 10659 #code: "IEEE00004777" #attributes: Doctrine\ORM\PersistentCollection {#95221 …} #variants: Doctrine\ORM\PersistentCollection {#95223 …} #options: Doctrine\ORM\PersistentCollection {#95227 …} #associations: Doctrine\ORM\PersistentCollection {#95225 …} #createdAt: DateTime @1751039202 {#95198 : 2025-06-27 17:46:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95199 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95211 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97691 #locale: "en_US" #translatable: App\Entity\Product\Product {#95204} #id: 37645 #name: "IEEE 4:2013" #slug: "ieee-4-2013-ieee00004777-242311" #description: """ Revision Standard - Inactive-Reserved.<br />\n Standard methods and basic techniques for high-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating voltage, direct voltage, and impulse testing are combined in this revision to organize the technical content for ease of use. In addition, the concept of measurement uncertainty in evaluation of high-voltage and high-current tests is introduced in this version.<br />\n \t\t\t\t<br />\n This standard is applicable to - Dielectric tests with direct voltages - Dielectric tests with alternating voltages - Dielectric tests with impulse voltages - Tests with impulse currents - Tests with combinations of the above - Capacitance and dielectric loss measurements This standard is applicable only to tests on equipment with a rated voltage above 1000 V. Procedures are given for applying correction factors to convert test data to standard atmospheric conditions. This standard also specifies procedures for testing equipment when external insulation of the test object is to be subjected to dry, wet, or contaminated conditions.<br />\n The purpose of this standard is to<br />\n - Define terms of general applicability<br />\n - Present general requirements regarding test equipment and procedures<br />\n - Describe methods for evaluation of test results """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Voltage Testing Techniques" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95213 …} #channels: Doctrine\ORM\PersistentCollection {#95219 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95215 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95217 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95205 …} -apiLastModifiedAt: DateTime @1754517600 {#95200 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1712786400 {#95201 : 2024-04-11 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1368136800 {#95202 : 2013-05-10 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1710975600 {#95203 : 2024-03-21 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 213 -documents: Doctrine\ORM\PersistentCollection {#95207 …} -favorites: Doctrine\ORM\PersistentCollection {#95209 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 220.0 MiB | 0.16 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95204 #id: 10659 #code: "IEEE00004777" #attributes: Doctrine\ORM\PersistentCollection {#95221 …} #variants: Doctrine\ORM\PersistentCollection {#95223 …} #options: Doctrine\ORM\PersistentCollection {#95227 …} #associations: Doctrine\ORM\PersistentCollection {#95225 …} #createdAt: DateTime @1751039202 {#95198 : 2025-06-27 17:46:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95199 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95211 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97691 #locale: "en_US" #translatable: App\Entity\Product\Product {#95204} #id: 37645 #name: "IEEE 4:2013" #slug: "ieee-4-2013-ieee00004777-242311" #description: """ Revision Standard - Inactive-Reserved.<br />\n Standard methods and basic techniques for high-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating voltage, direct voltage, and impulse testing are combined in this revision to organize the technical content for ease of use. In addition, the concept of measurement uncertainty in evaluation of high-voltage and high-current tests is introduced in this version.<br />\n \t\t\t\t<br />\n This standard is applicable to - Dielectric tests with direct voltages - Dielectric tests with alternating voltages - Dielectric tests with impulse voltages - Tests with impulse currents - Tests with combinations of the above - Capacitance and dielectric loss measurements This standard is applicable only to tests on equipment with a rated voltage above 1000 V. Procedures are given for applying correction factors to convert test data to standard atmospheric conditions. This standard also specifies procedures for testing equipment when external insulation of the test object is to be subjected to dry, wet, or contaminated conditions.<br />\n The purpose of this standard is to<br />\n - Define terms of general applicability<br />\n - Present general requirements regarding test equipment and procedures<br />\n - Describe methods for evaluation of test results """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Voltage Testing Techniques" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95213 …} #channels: Doctrine\ORM\PersistentCollection {#95219 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95215 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95217 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95205 …} -apiLastModifiedAt: DateTime @1754517600 {#95200 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1712786400 {#95201 : 2024-04-11 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1368136800 {#95202 : 2013-05-10 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1710975600 {#95203 : 2024-03-21 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 213 -documents: Doctrine\ORM\PersistentCollection {#95207 …} -favorites: Doctrine\ORM\PersistentCollection {#95209 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#97709 +product: App\Entity\Product\Product {#95204 #id: 10659 #code: "IEEE00004777" #attributes: Doctrine\ORM\PersistentCollection {#95221 …} #variants: Doctrine\ORM\PersistentCollection {#95223 …} #options: Doctrine\ORM\PersistentCollection {#95227 …} #associations: Doctrine\ORM\PersistentCollection {#95225 …} #createdAt: DateTime @1751039202 {#95198 : 2025-06-27 17:46:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95199 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95211 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97691 #locale: "en_US" #translatable: App\Entity\Product\Product {#95204} #id: 37645 #name: "IEEE 4:2013" #slug: "ieee-4-2013-ieee00004777-242311" #description: """ Revision Standard - Inactive-Reserved.<br />\n Standard methods and basic techniques for high-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating voltage, direct voltage, and impulse testing are combined in this revision to organize the technical content for ease of use. In addition, the concept of measurement uncertainty in evaluation of high-voltage and high-current tests is introduced in this version.<br />\n \t\t\t\t<br />\n This standard is applicable to - Dielectric tests with direct voltages - Dielectric tests with alternating voltages - Dielectric tests with impulse voltages - Tests with impulse currents - Tests with combinations of the above - Capacitance and dielectric loss measurements This standard is applicable only to tests on equipment with a rated voltage above 1000 V. Procedures are given for applying correction factors to convert test data to standard atmospheric conditions. This standard also specifies procedures for testing equipment when external insulation of the test object is to be subjected to dry, wet, or contaminated conditions.<br />\n The purpose of this standard is to<br />\n - Define terms of general applicability<br />\n - Present general requirements regarding test equipment and procedures<br />\n - Describe methods for evaluation of test results """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Voltage Testing Techniques" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95213 …} #channels: Doctrine\ORM\PersistentCollection {#95219 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95215 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95217 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95205 …} -apiLastModifiedAt: DateTime @1754517600 {#95200 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1712786400 {#95201 : 2024-04-11 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1368136800 {#95202 : 2013-05-10 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1710975600 {#95203 : 2024-03-21 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 213 -documents: Doctrine\ORM\PersistentCollection {#95207 …} -favorites: Doctrine\ORM\PersistentCollection {#95209 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 220.0 MiB | 0.58 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95204 #id: 10659 #code: "IEEE00004777" #attributes: Doctrine\ORM\PersistentCollection {#95221 …} #variants: Doctrine\ORM\PersistentCollection {#95223 …} #options: Doctrine\ORM\PersistentCollection {#95227 …} #associations: Doctrine\ORM\PersistentCollection {#95225 …} #createdAt: DateTime @1751039202 {#95198 : 2025-06-27 17:46:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95199 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95211 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97691 #locale: "en_US" #translatable: App\Entity\Product\Product {#95204} #id: 37645 #name: "IEEE 4:2013" #slug: "ieee-4-2013-ieee00004777-242311" #description: """ Revision Standard - Inactive-Reserved.<br />\n Standard methods and basic techniques for high-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating voltage, direct voltage, and impulse testing are combined in this revision to organize the technical content for ease of use. In addition, the concept of measurement uncertainty in evaluation of high-voltage and high-current tests is introduced in this version.<br />\n \t\t\t\t<br />\n This standard is applicable to - Dielectric tests with direct voltages - Dielectric tests with alternating voltages - Dielectric tests with impulse voltages - Tests with impulse currents - Tests with combinations of the above - Capacitance and dielectric loss measurements This standard is applicable only to tests on equipment with a rated voltage above 1000 V. Procedures are given for applying correction factors to convert test data to standard atmospheric conditions. This standard also specifies procedures for testing equipment when external insulation of the test object is to be subjected to dry, wet, or contaminated conditions.<br />\n The purpose of this standard is to<br />\n - Define terms of general applicability<br />\n - Present general requirements regarding test equipment and procedures<br />\n - Describe methods for evaluation of test results """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Voltage Testing Techniques" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95213 …} #channels: Doctrine\ORM\PersistentCollection {#95219 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95215 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95217 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95205 …} -apiLastModifiedAt: DateTime @1754517600 {#95200 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1712786400 {#95201 : 2024-04-11 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1368136800 {#95202 : 2013-05-10 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1710975600 {#95203 : 2024-03-21 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 213 -documents: Doctrine\ORM\PersistentCollection {#95207 …} -favorites: Doctrine\ORM\PersistentCollection {#95209 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#97783 +product: App\Entity\Product\Product {#95204 #id: 10659 #code: "IEEE00004777" #attributes: Doctrine\ORM\PersistentCollection {#95221 …} #variants: Doctrine\ORM\PersistentCollection {#95223 …} #options: Doctrine\ORM\PersistentCollection {#95227 …} #associations: Doctrine\ORM\PersistentCollection {#95225 …} #createdAt: DateTime @1751039202 {#95198 : 2025-06-27 17:46:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95199 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95211 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97691 #locale: "en_US" #translatable: App\Entity\Product\Product {#95204} #id: 37645 #name: "IEEE 4:2013" #slug: "ieee-4-2013-ieee00004777-242311" #description: """ Revision Standard - Inactive-Reserved.<br />\n Standard methods and basic techniques for high-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating voltage, direct voltage, and impulse testing are combined in this revision to organize the technical content for ease of use. In addition, the concept of measurement uncertainty in evaluation of high-voltage and high-current tests is introduced in this version.<br />\n \t\t\t\t<br />\n This standard is applicable to - Dielectric tests with direct voltages - Dielectric tests with alternating voltages - Dielectric tests with impulse voltages - Tests with impulse currents - Tests with combinations of the above - Capacitance and dielectric loss measurements This standard is applicable only to tests on equipment with a rated voltage above 1000 V. Procedures are given for applying correction factors to convert test data to standard atmospheric conditions. This standard also specifies procedures for testing equipment when external insulation of the test object is to be subjected to dry, wet, or contaminated conditions.<br />\n The purpose of this standard is to<br />\n - Define terms of general applicability<br />\n - Present general requirements regarding test equipment and procedures<br />\n - Describe methods for evaluation of test results """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Voltage Testing Techniques" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95213 …} #channels: Doctrine\ORM\PersistentCollection {#95219 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95215 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95217 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95205 …} -apiLastModifiedAt: DateTime @1754517600 {#95200 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1712786400 {#95201 : 2024-04-11 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1368136800 {#95202 : 2013-05-10 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1710975600 {#95203 : 2024-03-21 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "4" -bookCollection: "" -pageCount: 213 -documents: Doctrine\ORM\PersistentCollection {#95207 …} -favorites: Doctrine\ORM\PersistentCollection {#95209 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductCard | App\Twig\Components\ProductCard | 220.0 MiB | 7.20 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95235 #id: 10902 #code: "IEEE00005261" #attributes: Doctrine\ORM\PersistentCollection {#95252 …} #variants: Doctrine\ORM\PersistentCollection {#95254 …} #options: Doctrine\ORM\PersistentCollection {#95258 …} #associations: Doctrine\ORM\PersistentCollection {#95256 …} #createdAt: DateTime @1751039355 {#95229 : 2025-06-27 17:49:15.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#95230 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95242 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97942 #locale: "en_US" #translatable: App\Entity\Product\Product {#95235} #id: 38617 #name: "IEEE 1871.1:2014" #slug: "ieee-1871-1-2014-ieee00005261-242554" #description: """ New IEEE Standard - Active.<br />\n Instrument Description templates, compliant with IEEE Std 1671.2-2012, that providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converters are provided in this recommended practice. These synthetic instruments may be integrated in an automatic test system (ATS) that is to be used to<br />\n test and diagnose a unit under test (UUT).<br />\n \t\t\t\t<br />\n This recommended practice provides Instrument Description templates, compliant with IEEE 1671.2, that<br />\n providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converter.<br />\n The purpose of this recommended practice is to provide the definition of synthetic instruments as well as identify the following requirements for each of the synthetic instruments: a) Input, b) Output. c) Time base, d) Power, e) Physical, f) Communications and control, g) Memory parameter, h) High-speed data port, i) Validation """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95244 …} #channels: Doctrine\ORM\PersistentCollection {#95250 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95246 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95248 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95236 …} -apiLastModifiedAt: DateTime @1745359200 {#95231 : 2025-04-23 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1745272800 {#95232 : 2025-04-22 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1423522800 {#95233 : 2015-02-10 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1743030000 {#95234 : 2025-03-27 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1871.1" -bookCollection: "" -pageCount: 177 -documents: Doctrine\ORM\PersistentCollection {#95238 …} -favorites: Doctrine\ORM\PersistentCollection {#95240 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "secondary-lighter" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#97922 +product: App\Entity\Product\Product {#95235 #id: 10902 #code: "IEEE00005261" #attributes: Doctrine\ORM\PersistentCollection {#95252 …} #variants: Doctrine\ORM\PersistentCollection {#95254 …} #options: Doctrine\ORM\PersistentCollection {#95258 …} #associations: Doctrine\ORM\PersistentCollection {#95256 …} #createdAt: DateTime @1751039355 {#95229 : 2025-06-27 17:49:15.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#95230 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95242 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97942 #locale: "en_US" #translatable: App\Entity\Product\Product {#95235} #id: 38617 #name: "IEEE 1871.1:2014" #slug: "ieee-1871-1-2014-ieee00005261-242554" #description: """ New IEEE Standard - Active.<br />\n Instrument Description templates, compliant with IEEE Std 1671.2-2012, that providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converters are provided in this recommended practice. These synthetic instruments may be integrated in an automatic test system (ATS) that is to be used to<br />\n test and diagnose a unit under test (UUT).<br />\n \t\t\t\t<br />\n This recommended practice provides Instrument Description templates, compliant with IEEE 1671.2, that<br />\n providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converter.<br />\n The purpose of this recommended practice is to provide the definition of synthetic instruments as well as identify the following requirements for each of the synthetic instruments: a) Input, b) Output. c) Time base, d) Power, e) Physical, f) Communications and control, g) Memory parameter, h) High-speed data port, i) Validation """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95244 …} #channels: Doctrine\ORM\PersistentCollection {#95250 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95246 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95248 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95236 …} -apiLastModifiedAt: DateTime @1745359200 {#95231 : 2025-04-23 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1745272800 {#95232 : 2025-04-22 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1423522800 {#95233 : 2015-02-10 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1743030000 {#95234 : 2025-03-27 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1871.1" -bookCollection: "" -pageCount: 177 -documents: Doctrine\ORM\PersistentCollection {#95238 …} -favorites: Doctrine\ORM\PersistentCollection {#95240 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "secondary-lighter" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 220.0 MiB | 0.15 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95235 #id: 10902 #code: "IEEE00005261" #attributes: Doctrine\ORM\PersistentCollection {#95252 …} #variants: Doctrine\ORM\PersistentCollection {#95254 …} #options: Doctrine\ORM\PersistentCollection {#95258 …} #associations: Doctrine\ORM\PersistentCollection {#95256 …} #createdAt: DateTime @1751039355 {#95229 : 2025-06-27 17:49:15.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#95230 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95242 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97942 #locale: "en_US" #translatable: App\Entity\Product\Product {#95235} #id: 38617 #name: "IEEE 1871.1:2014" #slug: "ieee-1871-1-2014-ieee00005261-242554" #description: """ New IEEE Standard - Active.<br />\n Instrument Description templates, compliant with IEEE Std 1671.2-2012, that providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converters are provided in this recommended practice. These synthetic instruments may be integrated in an automatic test system (ATS) that is to be used to<br />\n test and diagnose a unit under test (UUT).<br />\n \t\t\t\t<br />\n This recommended practice provides Instrument Description templates, compliant with IEEE 1671.2, that<br />\n providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converter.<br />\n The purpose of this recommended practice is to provide the definition of synthetic instruments as well as identify the following requirements for each of the synthetic instruments: a) Input, b) Output. c) Time base, d) Power, e) Physical, f) Communications and control, g) Memory parameter, h) High-speed data port, i) Validation """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95244 …} #channels: Doctrine\ORM\PersistentCollection {#95250 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95246 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95248 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95236 …} -apiLastModifiedAt: DateTime @1745359200 {#95231 : 2025-04-23 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1745272800 {#95232 : 2025-04-22 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1423522800 {#95233 : 2015-02-10 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1743030000 {#95234 : 2025-03-27 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1871.1" -bookCollection: "" -pageCount: 177 -documents: Doctrine\ORM\PersistentCollection {#95238 …} -favorites: Doctrine\ORM\PersistentCollection {#95240 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
|||
| Component | App\Twig\Components\ProductState {#97956 +product: App\Entity\Product\Product {#95235 #id: 10902 #code: "IEEE00005261" #attributes: Doctrine\ORM\PersistentCollection {#95252 …} #variants: Doctrine\ORM\PersistentCollection {#95254 …} #options: Doctrine\ORM\PersistentCollection {#95258 …} #associations: Doctrine\ORM\PersistentCollection {#95256 …} #createdAt: DateTime @1751039355 {#95229 : 2025-06-27 17:49:15.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#95230 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95242 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97942 #locale: "en_US" #translatable: App\Entity\Product\Product {#95235} #id: 38617 #name: "IEEE 1871.1:2014" #slug: "ieee-1871-1-2014-ieee00005261-242554" #description: """ New IEEE Standard - Active.<br />\n Instrument Description templates, compliant with IEEE Std 1671.2-2012, that providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converters are provided in this recommended practice. These synthetic instruments may be integrated in an automatic test system (ATS) that is to be used to<br />\n test and diagnose a unit under test (UUT).<br />\n \t\t\t\t<br />\n This recommended practice provides Instrument Description templates, compliant with IEEE 1671.2, that<br />\n providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converter.<br />\n The purpose of this recommended practice is to provide the definition of synthetic instruments as well as identify the following requirements for each of the synthetic instruments: a) Input, b) Output. c) Time base, d) Power, e) Physical, f) Communications and control, g) Memory parameter, h) High-speed data port, i) Validation """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95244 …} #channels: Doctrine\ORM\PersistentCollection {#95250 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95246 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95248 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95236 …} -apiLastModifiedAt: DateTime @1745359200 {#95231 : 2025-04-23 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1745272800 {#95232 : 2025-04-22 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1423522800 {#95233 : 2015-02-10 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1743030000 {#95234 : 2025-03-27 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1871.1" -bookCollection: "" -pageCount: 177 -documents: Doctrine\ORM\PersistentCollection {#95238 …} -favorites: Doctrine\ORM\PersistentCollection {#95240 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 220.0 MiB | 0.57 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95235 #id: 10902 #code: "IEEE00005261" #attributes: Doctrine\ORM\PersistentCollection {#95252 …} #variants: Doctrine\ORM\PersistentCollection {#95254 …} #options: Doctrine\ORM\PersistentCollection {#95258 …} #associations: Doctrine\ORM\PersistentCollection {#95256 …} #createdAt: DateTime @1751039355 {#95229 : 2025-06-27 17:49:15.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#95230 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95242 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97942 #locale: "en_US" #translatable: App\Entity\Product\Product {#95235} #id: 38617 #name: "IEEE 1871.1:2014" #slug: "ieee-1871-1-2014-ieee00005261-242554" #description: """ New IEEE Standard - Active.<br />\n Instrument Description templates, compliant with IEEE Std 1671.2-2012, that providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converters are provided in this recommended practice. These synthetic instruments may be integrated in an automatic test system (ATS) that is to be used to<br />\n test and diagnose a unit under test (UUT).<br />\n \t\t\t\t<br />\n This recommended practice provides Instrument Description templates, compliant with IEEE 1671.2, that<br />\n providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converter.<br />\n The purpose of this recommended practice is to provide the definition of synthetic instruments as well as identify the following requirements for each of the synthetic instruments: a) Input, b) Output. c) Time base, d) Power, e) Physical, f) Communications and control, g) Memory parameter, h) High-speed data port, i) Validation """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95244 …} #channels: Doctrine\ORM\PersistentCollection {#95250 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95246 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95248 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95236 …} -apiLastModifiedAt: DateTime @1745359200 {#95231 : 2025-04-23 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1745272800 {#95232 : 2025-04-22 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1423522800 {#95233 : 2015-02-10 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1743030000 {#95234 : 2025-03-27 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1871.1" -bookCollection: "" -pageCount: 177 -documents: Doctrine\ORM\PersistentCollection {#95238 …} -favorites: Doctrine\ORM\PersistentCollection {#95240 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#98030 +product: App\Entity\Product\Product {#95235 #id: 10902 #code: "IEEE00005261" #attributes: Doctrine\ORM\PersistentCollection {#95252 …} #variants: Doctrine\ORM\PersistentCollection {#95254 …} #options: Doctrine\ORM\PersistentCollection {#95258 …} #associations: Doctrine\ORM\PersistentCollection {#95256 …} #createdAt: DateTime @1751039355 {#95229 : 2025-06-27 17:49:15.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#95230 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95242 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97942 #locale: "en_US" #translatable: App\Entity\Product\Product {#95235} #id: 38617 #name: "IEEE 1871.1:2014" #slug: "ieee-1871-1-2014-ieee00005261-242554" #description: """ New IEEE Standard - Active.<br />\n Instrument Description templates, compliant with IEEE Std 1671.2-2012, that providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converters are provided in this recommended practice. These synthetic instruments may be integrated in an automatic test system (ATS) that is to be used to<br />\n test and diagnose a unit under test (UUT).<br />\n \t\t\t\t<br />\n This recommended practice provides Instrument Description templates, compliant with IEEE 1671.2, that<br />\n providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converter.<br />\n The purpose of this recommended practice is to provide the definition of synthetic instruments as well as identify the following requirements for each of the synthetic instruments: a) Input, b) Output. c) Time base, d) Power, e) Physical, f) Communications and control, g) Memory parameter, h) High-speed data port, i) Validation """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95244 …} #channels: Doctrine\ORM\PersistentCollection {#95250 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95246 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95248 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95236 …} -apiLastModifiedAt: DateTime @1745359200 {#95231 : 2025-04-23 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1745272800 {#95232 : 2025-04-22 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1423522800 {#95233 : 2015-02-10 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1743030000 {#95234 : 2025-03-27 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1871.1" -bookCollection: "" -pageCount: 177 -documents: Doctrine\ORM\PersistentCollection {#95238 …} -favorites: Doctrine\ORM\PersistentCollection {#95240 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 220.0 MiB | 6.40 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95266 #id: 10903 #code: "IEEE00005262" #attributes: Doctrine\ORM\PersistentCollection {#95283 …} #variants: Doctrine\ORM\PersistentCollection {#95285 …} #options: Doctrine\ORM\PersistentCollection {#95289 …} #associations: Doctrine\ORM\PersistentCollection {#95287 …} #createdAt: DateTime @1751039355 {#95260 : 2025-06-27 17:49:15.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95261 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95273 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98172 #locale: "en_US" #translatable: App\Entity\Product\Product {#95266} #id: 38621 #name: "IEEE 1871.2:2017" #slug: "ieee-1871-2-2017-ieee00005262-242555" #description: """ New IEEE Standard - Active.<br />\n This document is a recommended practice to extending the ATML exchange formats to for the purposes describing intrinsic paths. The recommended practice presents an XML schema an ATML instance document, and use cases related to intrinsic path characterizations. (NOTE: Additional files for this standard are available at http://standards.ieee.org/downloads/1871/1871.2-2017/)<br />\n \t\t\t\t<br />\n This document provides a recommended practice for using IEEE 16712 compliant test equipment templates for applications employing intrinsic path information for cables, interface adapters, and test equipment for the purpose of documenting and enabling programmatic access to the intrinsic characteristics of path related resources found in automated test systems.<br />\n The purpose of this recommended practice is to sufficiently describe the electrical properties and other intrinsic path characteristics of hardware components via ATML extensions. Various applications that use ATML schemas expose the need for detailed component information that is more specific to individual hardware instantiations than ATML was intended to describe. This recommended practice has been produced to show best practices in how to extend ATML in order to gain access to more detailed intrinsic path characteristics that applications often require. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95275 …} #channels: Doctrine\ORM\PersistentCollection {#95281 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95277 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95279 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95267 …} -apiLastModifiedAt: DateTime @1754517600 {#95262 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95263 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1520982000 {#95264 : 2018-03-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1520982000 {#95265 : 2018-03-14 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1871.2" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95269 …} -favorites: Doctrine\ORM\PersistentCollection {#95271 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#98152 +product: App\Entity\Product\Product {#95266 #id: 10903 #code: "IEEE00005262" #attributes: Doctrine\ORM\PersistentCollection {#95283 …} #variants: Doctrine\ORM\PersistentCollection {#95285 …} #options: Doctrine\ORM\PersistentCollection {#95289 …} #associations: Doctrine\ORM\PersistentCollection {#95287 …} #createdAt: DateTime @1751039355 {#95260 : 2025-06-27 17:49:15.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95261 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95273 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98172 #locale: "en_US" #translatable: App\Entity\Product\Product {#95266} #id: 38621 #name: "IEEE 1871.2:2017" #slug: "ieee-1871-2-2017-ieee00005262-242555" #description: """ New IEEE Standard - Active.<br />\n This document is a recommended practice to extending the ATML exchange formats to for the purposes describing intrinsic paths. The recommended practice presents an XML schema an ATML instance document, and use cases related to intrinsic path characterizations. (NOTE: Additional files for this standard are available at http://standards.ieee.org/downloads/1871/1871.2-2017/)<br />\n \t\t\t\t<br />\n This document provides a recommended practice for using IEEE 16712 compliant test equipment templates for applications employing intrinsic path information for cables, interface adapters, and test equipment for the purpose of documenting and enabling programmatic access to the intrinsic characteristics of path related resources found in automated test systems.<br />\n The purpose of this recommended practice is to sufficiently describe the electrical properties and other intrinsic path characteristics of hardware components via ATML extensions. Various applications that use ATML schemas expose the need for detailed component information that is more specific to individual hardware instantiations than ATML was intended to describe. This recommended practice has been produced to show best practices in how to extend ATML in order to gain access to more detailed intrinsic path characteristics that applications often require. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95275 …} #channels: Doctrine\ORM\PersistentCollection {#95281 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95277 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95279 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95267 …} -apiLastModifiedAt: DateTime @1754517600 {#95262 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95263 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1520982000 {#95264 : 2018-03-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1520982000 {#95265 : 2018-03-14 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1871.2" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95269 …} -favorites: Doctrine\ORM\PersistentCollection {#95271 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 220.0 MiB | 0.15 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95266 #id: 10903 #code: "IEEE00005262" #attributes: Doctrine\ORM\PersistentCollection {#95283 …} #variants: Doctrine\ORM\PersistentCollection {#95285 …} #options: Doctrine\ORM\PersistentCollection {#95289 …} #associations: Doctrine\ORM\PersistentCollection {#95287 …} #createdAt: DateTime @1751039355 {#95260 : 2025-06-27 17:49:15.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95261 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95273 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98172 #locale: "en_US" #translatable: App\Entity\Product\Product {#95266} #id: 38621 #name: "IEEE 1871.2:2017" #slug: "ieee-1871-2-2017-ieee00005262-242555" #description: """ New IEEE Standard - Active.<br />\n This document is a recommended practice to extending the ATML exchange formats to for the purposes describing intrinsic paths. The recommended practice presents an XML schema an ATML instance document, and use cases related to intrinsic path characterizations. (NOTE: Additional files for this standard are available at http://standards.ieee.org/downloads/1871/1871.2-2017/)<br />\n \t\t\t\t<br />\n This document provides a recommended practice for using IEEE 16712 compliant test equipment templates for applications employing intrinsic path information for cables, interface adapters, and test equipment for the purpose of documenting and enabling programmatic access to the intrinsic characteristics of path related resources found in automated test systems.<br />\n The purpose of this recommended practice is to sufficiently describe the electrical properties and other intrinsic path characteristics of hardware components via ATML extensions. Various applications that use ATML schemas expose the need for detailed component information that is more specific to individual hardware instantiations than ATML was intended to describe. This recommended practice has been produced to show best practices in how to extend ATML in order to gain access to more detailed intrinsic path characteristics that applications often require. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95275 …} #channels: Doctrine\ORM\PersistentCollection {#95281 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95277 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95279 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95267 …} -apiLastModifiedAt: DateTime @1754517600 {#95262 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95263 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1520982000 {#95264 : 2018-03-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1520982000 {#95265 : 2018-03-14 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1871.2" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95269 …} -favorites: Doctrine\ORM\PersistentCollection {#95271 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#98186 +product: App\Entity\Product\Product {#95266 #id: 10903 #code: "IEEE00005262" #attributes: Doctrine\ORM\PersistentCollection {#95283 …} #variants: Doctrine\ORM\PersistentCollection {#95285 …} #options: Doctrine\ORM\PersistentCollection {#95289 …} #associations: Doctrine\ORM\PersistentCollection {#95287 …} #createdAt: DateTime @1751039355 {#95260 : 2025-06-27 17:49:15.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95261 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95273 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98172 #locale: "en_US" #translatable: App\Entity\Product\Product {#95266} #id: 38621 #name: "IEEE 1871.2:2017" #slug: "ieee-1871-2-2017-ieee00005262-242555" #description: """ New IEEE Standard - Active.<br />\n This document is a recommended practice to extending the ATML exchange formats to for the purposes describing intrinsic paths. The recommended practice presents an XML schema an ATML instance document, and use cases related to intrinsic path characterizations. (NOTE: Additional files for this standard are available at http://standards.ieee.org/downloads/1871/1871.2-2017/)<br />\n \t\t\t\t<br />\n This document provides a recommended practice for using IEEE 16712 compliant test equipment templates for applications employing intrinsic path information for cables, interface adapters, and test equipment for the purpose of documenting and enabling programmatic access to the intrinsic characteristics of path related resources found in automated test systems.<br />\n The purpose of this recommended practice is to sufficiently describe the electrical properties and other intrinsic path characteristics of hardware components via ATML extensions. Various applications that use ATML schemas expose the need for detailed component information that is more specific to individual hardware instantiations than ATML was intended to describe. This recommended practice has been produced to show best practices in how to extend ATML in order to gain access to more detailed intrinsic path characteristics that applications often require. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95275 …} #channels: Doctrine\ORM\PersistentCollection {#95281 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95277 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95279 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95267 …} -apiLastModifiedAt: DateTime @1754517600 {#95262 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95263 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1520982000 {#95264 : 2018-03-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1520982000 {#95265 : 2018-03-14 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1871.2" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95269 …} -favorites: Doctrine\ORM\PersistentCollection {#95271 …} } +appearance: "state-active" +labels: [ "Active" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 220.0 MiB | 0.53 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95266 #id: 10903 #code: "IEEE00005262" #attributes: Doctrine\ORM\PersistentCollection {#95283 …} #variants: Doctrine\ORM\PersistentCollection {#95285 …} #options: Doctrine\ORM\PersistentCollection {#95289 …} #associations: Doctrine\ORM\PersistentCollection {#95287 …} #createdAt: DateTime @1751039355 {#95260 : 2025-06-27 17:49:15.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95261 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95273 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98172 #locale: "en_US" #translatable: App\Entity\Product\Product {#95266} #id: 38621 #name: "IEEE 1871.2:2017" #slug: "ieee-1871-2-2017-ieee00005262-242555" #description: """ New IEEE Standard - Active.<br />\n This document is a recommended practice to extending the ATML exchange formats to for the purposes describing intrinsic paths. The recommended practice presents an XML schema an ATML instance document, and use cases related to intrinsic path characterizations. (NOTE: Additional files for this standard are available at http://standards.ieee.org/downloads/1871/1871.2-2017/)<br />\n \t\t\t\t<br />\n This document provides a recommended practice for using IEEE 16712 compliant test equipment templates for applications employing intrinsic path information for cables, interface adapters, and test equipment for the purpose of documenting and enabling programmatic access to the intrinsic characteristics of path related resources found in automated test systems.<br />\n The purpose of this recommended practice is to sufficiently describe the electrical properties and other intrinsic path characteristics of hardware components via ATML extensions. Various applications that use ATML schemas expose the need for detailed component information that is more specific to individual hardware instantiations than ATML was intended to describe. This recommended practice has been produced to show best practices in how to extend ATML in order to gain access to more detailed intrinsic path characteristics that applications often require. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95275 …} #channels: Doctrine\ORM\PersistentCollection {#95281 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95277 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95279 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95267 …} -apiLastModifiedAt: DateTime @1754517600 {#95262 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95263 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1520982000 {#95264 : 2018-03-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1520982000 {#95265 : 2018-03-14 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1871.2" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95269 …} -favorites: Doctrine\ORM\PersistentCollection {#95271 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#98260 +product: App\Entity\Product\Product {#95266 #id: 10903 #code: "IEEE00005262" #attributes: Doctrine\ORM\PersistentCollection {#95283 …} #variants: Doctrine\ORM\PersistentCollection {#95285 …} #options: Doctrine\ORM\PersistentCollection {#95289 …} #associations: Doctrine\ORM\PersistentCollection {#95287 …} #createdAt: DateTime @1751039355 {#95260 : 2025-06-27 17:49:15.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95261 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95273 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98172 #locale: "en_US" #translatable: App\Entity\Product\Product {#95266} #id: 38621 #name: "IEEE 1871.2:2017" #slug: "ieee-1871-2-2017-ieee00005262-242555" #description: """ New IEEE Standard - Active.<br />\n This document is a recommended practice to extending the ATML exchange formats to for the purposes describing intrinsic paths. The recommended practice presents an XML schema an ATML instance document, and use cases related to intrinsic path characterizations. (NOTE: Additional files for this standard are available at http://standards.ieee.org/downloads/1871/1871.2-2017/)<br />\n \t\t\t\t<br />\n This document provides a recommended practice for using IEEE 16712 compliant test equipment templates for applications employing intrinsic path information for cables, interface adapters, and test equipment for the purpose of documenting and enabling programmatic access to the intrinsic characteristics of path related resources found in automated test systems.<br />\n The purpose of this recommended practice is to sufficiently describe the electrical properties and other intrinsic path characteristics of hardware components via ATML extensions. Various applications that use ATML schemas expose the need for detailed component information that is more specific to individual hardware instantiations than ATML was intended to describe. This recommended practice has been produced to show best practices in how to extend ATML in order to gain access to more detailed intrinsic path characteristics that applications often require. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95275 …} #channels: Doctrine\ORM\PersistentCollection {#95281 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95277 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95279 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95267 …} -apiLastModifiedAt: DateTime @1754517600 {#95262 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95263 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1520982000 {#95264 : 2018-03-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1520982000 {#95265 : 2018-03-14 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1871.2" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95269 …} -favorites: Doctrine\ORM\PersistentCollection {#95271 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 220.0 MiB | 6.80 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95297 #id: 11056 #code: "IEEE00005506" #attributes: Doctrine\ORM\PersistentCollection {#95314 …} #variants: Doctrine\ORM\PersistentCollection {#95316 …} #options: Doctrine\ORM\PersistentCollection {#95320 …} #associations: Doctrine\ORM\PersistentCollection {#95318 …} #createdAt: DateTime @1751039452 {#95291 : 2025-06-27 17:50:52.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95292 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95304 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98410 #locale: "en_US" #translatable: App\Entity\Product\Product {#95297} #id: 39233 #name: "IEEE/IEC 61671:2012" #slug: "ieee-iec-61671-2012-ieee00005506-242708" #description: """ Revision Standard - Active.<br />\n This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95306 …} #channels: Doctrine\ORM\PersistentCollection {#95312 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95308 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95310 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95298 …} -apiLastModifiedAt: DateTime @1754517600 {#95293 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95294 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1342389600 {#95295 : 2012-07-16 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1342389600 {#95296 : 2012-07-16 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "61671" -bookCollection: "" -pageCount: 391 -documents: Doctrine\ORM\PersistentCollection {#95300 …} -favorites: Doctrine\ORM\PersistentCollection {#95302 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "secondary-lighter" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#98390 +product: App\Entity\Product\Product {#95297 #id: 11056 #code: "IEEE00005506" #attributes: Doctrine\ORM\PersistentCollection {#95314 …} #variants: Doctrine\ORM\PersistentCollection {#95316 …} #options: Doctrine\ORM\PersistentCollection {#95320 …} #associations: Doctrine\ORM\PersistentCollection {#95318 …} #createdAt: DateTime @1751039452 {#95291 : 2025-06-27 17:50:52.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95292 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95304 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98410 #locale: "en_US" #translatable: App\Entity\Product\Product {#95297} #id: 39233 #name: "IEEE/IEC 61671:2012" #slug: "ieee-iec-61671-2012-ieee00005506-242708" #description: """ Revision Standard - Active.<br />\n This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95306 …} #channels: Doctrine\ORM\PersistentCollection {#95312 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95308 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95310 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95298 …} -apiLastModifiedAt: DateTime @1754517600 {#95293 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95294 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1342389600 {#95295 : 2012-07-16 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1342389600 {#95296 : 2012-07-16 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "61671" -bookCollection: "" -pageCount: 391 -documents: Doctrine\ORM\PersistentCollection {#95300 …} -favorites: Doctrine\ORM\PersistentCollection {#95302 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "secondary-lighter" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 220.0 MiB | 0.14 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95297 #id: 11056 #code: "IEEE00005506" #attributes: Doctrine\ORM\PersistentCollection {#95314 …} #variants: Doctrine\ORM\PersistentCollection {#95316 …} #options: Doctrine\ORM\PersistentCollection {#95320 …} #associations: Doctrine\ORM\PersistentCollection {#95318 …} #createdAt: DateTime @1751039452 {#95291 : 2025-06-27 17:50:52.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95292 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95304 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98410 #locale: "en_US" #translatable: App\Entity\Product\Product {#95297} #id: 39233 #name: "IEEE/IEC 61671:2012" #slug: "ieee-iec-61671-2012-ieee00005506-242708" #description: """ Revision Standard - Active.<br />\n This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95306 …} #channels: Doctrine\ORM\PersistentCollection {#95312 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95308 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95310 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95298 …} -apiLastModifiedAt: DateTime @1754517600 {#95293 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95294 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1342389600 {#95295 : 2012-07-16 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1342389600 {#95296 : 2012-07-16 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "61671" -bookCollection: "" -pageCount: 391 -documents: Doctrine\ORM\PersistentCollection {#95300 …} -favorites: Doctrine\ORM\PersistentCollection {#95302 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#98424 +product: App\Entity\Product\Product {#95297 #id: 11056 #code: "IEEE00005506" #attributes: Doctrine\ORM\PersistentCollection {#95314 …} #variants: Doctrine\ORM\PersistentCollection {#95316 …} #options: Doctrine\ORM\PersistentCollection {#95320 …} #associations: Doctrine\ORM\PersistentCollection {#95318 …} #createdAt: DateTime @1751039452 {#95291 : 2025-06-27 17:50:52.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95292 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95304 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98410 #locale: "en_US" #translatable: App\Entity\Product\Product {#95297} #id: 39233 #name: "IEEE/IEC 61671:2012" #slug: "ieee-iec-61671-2012-ieee00005506-242708" #description: """ Revision Standard - Active.<br />\n This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95306 …} #channels: Doctrine\ORM\PersistentCollection {#95312 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95308 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95310 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95298 …} -apiLastModifiedAt: DateTime @1754517600 {#95293 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95294 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1342389600 {#95295 : 2012-07-16 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1342389600 {#95296 : 2012-07-16 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "61671" -bookCollection: "" -pageCount: 391 -documents: Doctrine\ORM\PersistentCollection {#95300 …} -favorites: Doctrine\ORM\PersistentCollection {#95302 …} } +appearance: "state-active" +labels: [ "Active" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 220.0 MiB | 0.53 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95297 #id: 11056 #code: "IEEE00005506" #attributes: Doctrine\ORM\PersistentCollection {#95314 …} #variants: Doctrine\ORM\PersistentCollection {#95316 …} #options: Doctrine\ORM\PersistentCollection {#95320 …} #associations: Doctrine\ORM\PersistentCollection {#95318 …} #createdAt: DateTime @1751039452 {#95291 : 2025-06-27 17:50:52.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95292 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95304 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98410 #locale: "en_US" #translatable: App\Entity\Product\Product {#95297} #id: 39233 #name: "IEEE/IEC 61671:2012" #slug: "ieee-iec-61671-2012-ieee00005506-242708" #description: """ Revision Standard - Active.<br />\n This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95306 …} #channels: Doctrine\ORM\PersistentCollection {#95312 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95308 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95310 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95298 …} -apiLastModifiedAt: DateTime @1754517600 {#95293 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95294 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1342389600 {#95295 : 2012-07-16 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1342389600 {#95296 : 2012-07-16 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "61671" -bookCollection: "" -pageCount: 391 -documents: Doctrine\ORM\PersistentCollection {#95300 …} -favorites: Doctrine\ORM\PersistentCollection {#95302 …} } ] |
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| Attributes | [] |
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|||
| ProductCard | App\Twig\Components\ProductCard | 220.0 MiB | 7.43 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95327 #id: 11979 #code: "IEEE00006854" #attributes: Doctrine\ORM\PersistentCollection {#95344 …} #variants: Doctrine\ORM\PersistentCollection {#95346 …} #options: Doctrine\ORM\PersistentCollection {#95350 …} #associations: Doctrine\ORM\PersistentCollection {#95348 …} #createdAt: DateTime @1751040116 {#95322 : 2025-06-27 18:01:56.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608621 {#95323 : 2025-08-08 01:17:01.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95334 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98640 #locale: "en_US" #translatable: App\Entity\Product\Product {#95327} #id: 42925 #name: "IEEE 1812:2023" #slug: "ieee-1812-2023-ieee00006854-243631" #description: """ Revision Standard - Active.<br />\n Instructions for conducting tests to determine the performance characteristics of permanent magnet (PM) machines are contained in this guide. Motors and generators may have the described tests applied as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that all possible tests, or tests of a research nature, shall be covered by this guide but only those general methods that may be used to obtain the performance data. The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions.<br />\n \t\t\t\t<br />\n This guide contains instructions for conducting tests to determine the performance characteristics of permanent magnet (PM) machines. The tests described may be applied to motors and generators, as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that this guide shall cover all possible tests, or tests of a research nature, but only those general methods that may be used to obtain the performance data. The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions. The term specified conditions for tests as used in this guide refers to rated conditions unless otherwise agreed upon. Rated conditions apply usually to the quantities listed on the machine nameplate.<br />\n Instructions for conducting tests to determine the performance characteristics of PM machines are covered in this guide. Additional tests may be required by the owners and operators to satisfy specific performance indices. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Guide for Testing Permanent Magnet Machines" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95336 …} #channels: Doctrine\ORM\PersistentCollection {#95342 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95338 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95340 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95328 …} -apiLastModifiedAt: DateTime @1754517600 {#95324 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1713304800 {#95325 : 2024-04-17 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1702249200 {#95326 : 2023-12-11 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1812" -bookCollection: "" -pageCount: 88 -documents: Doctrine\ORM\PersistentCollection {#95330 …} -favorites: Doctrine\ORM\PersistentCollection {#95332 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#98620 +product: App\Entity\Product\Product {#95327 #id: 11979 #code: "IEEE00006854" #attributes: Doctrine\ORM\PersistentCollection {#95344 …} #variants: Doctrine\ORM\PersistentCollection {#95346 …} #options: Doctrine\ORM\PersistentCollection {#95350 …} #associations: Doctrine\ORM\PersistentCollection {#95348 …} #createdAt: DateTime @1751040116 {#95322 : 2025-06-27 18:01:56.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608621 {#95323 : 2025-08-08 01:17:01.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95334 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98640 #locale: "en_US" #translatable: App\Entity\Product\Product {#95327} #id: 42925 #name: "IEEE 1812:2023" #slug: "ieee-1812-2023-ieee00006854-243631" #description: """ Revision Standard - Active.<br />\n Instructions for conducting tests to determine the performance characteristics of permanent magnet (PM) machines are contained in this guide. Motors and generators may have the described tests applied as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that all possible tests, or tests of a research nature, shall be covered by this guide but only those general methods that may be used to obtain the performance data. The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions.<br />\n \t\t\t\t<br />\n This guide contains instructions for conducting tests to determine the performance characteristics of permanent magnet (PM) machines. The tests described may be applied to motors and generators, as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that this guide shall cover all possible tests, or tests of a research nature, but only those general methods that may be used to obtain the performance data. The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions. The term specified conditions for tests as used in this guide refers to rated conditions unless otherwise agreed upon. Rated conditions apply usually to the quantities listed on the machine nameplate.<br />\n Instructions for conducting tests to determine the performance characteristics of PM machines are covered in this guide. Additional tests may be required by the owners and operators to satisfy specific performance indices. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Guide for Testing Permanent Magnet Machines" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95336 …} #channels: Doctrine\ORM\PersistentCollection {#95342 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95338 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95340 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95328 …} -apiLastModifiedAt: DateTime @1754517600 {#95324 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1713304800 {#95325 : 2024-04-17 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1702249200 {#95326 : 2023-12-11 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1812" -bookCollection: "" -pageCount: 88 -documents: Doctrine\ORM\PersistentCollection {#95330 …} -favorites: Doctrine\ORM\PersistentCollection {#95332 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 220.0 MiB | 0.14 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95327 #id: 11979 #code: "IEEE00006854" #attributes: Doctrine\ORM\PersistentCollection {#95344 …} #variants: Doctrine\ORM\PersistentCollection {#95346 …} #options: Doctrine\ORM\PersistentCollection {#95350 …} #associations: Doctrine\ORM\PersistentCollection {#95348 …} #createdAt: DateTime @1751040116 {#95322 : 2025-06-27 18:01:56.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608621 {#95323 : 2025-08-08 01:17:01.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95334 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98640 #locale: "en_US" #translatable: App\Entity\Product\Product {#95327} #id: 42925 #name: "IEEE 1812:2023" #slug: "ieee-1812-2023-ieee00006854-243631" #description: """ Revision Standard - Active.<br />\n Instructions for conducting tests to determine the performance characteristics of permanent magnet (PM) machines are contained in this guide. Motors and generators may have the described tests applied as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that all possible tests, or tests of a research nature, shall be covered by this guide but only those general methods that may be used to obtain the performance data. The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions.<br />\n \t\t\t\t<br />\n This guide contains instructions for conducting tests to determine the performance characteristics of permanent magnet (PM) machines. The tests described may be applied to motors and generators, as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses applying to generators. It is not intended that this guide shall cover all possible tests, or tests of a research nature, but only those general methods that may be used to obtain the performance data. The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee as to specific performance indices or operating conditions. The term specified conditions for tests as used in this guide refers to rated conditions unless otherwise agreed upon. Rated conditions apply usually to the quantities listed on the machine nameplate.<br />\n Instructions for conducting tests to determine the performance characteristics of PM machines are covered in this guide. Additional tests may be required by the owners and operators to satisfy specific performance indices. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Guide for Testing Permanent Magnet Machines" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95336 …} #channels: Doctrine\ORM\PersistentCollection {#95342 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95338 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95340 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94950 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95328 …} -apiLastModifiedAt: DateTime @1754517600 {#95324 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1713304800 {#95325 : 2024-04-17 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1702249200 {#95326 : 2023-12-11 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1812" -bookCollection: "" -pageCount: 88 -documents: Doctrine\ORM\PersistentCollection {#95330 …} -favorites: Doctrine\ORM\PersistentCollection {#95332 …} } ] |
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