Components
3
Twig Components
13
Render Count
8
ms
Render Time
360.0
MiB
Memory Usage
Components
| Name | Metadata | Render Count | Render Time |
|---|---|---|---|
| ProductState |
"App\Twig\Components\ProductState"components/ProductState.html.twig |
6 | 1.77ms |
| ProductMostRecent |
"App\Twig\Components\ProductMostRecent"components/ProductMostRecent.html.twig |
6 | 5.84ms |
| ProductType |
"App\Twig\Components\ProductType"components/ProductType.html.twig |
1 | 0.29ms |
Render calls
| ProductState | App\Twig\Components\ProductState | 360.0 MiB | 0.46 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7309 #id: 8661 #code: "IEEE00000823" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751037603 {#7274 : 2025-06-27 17:20:03.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 29653 #name: "IEEE 592:1990 (R1996)" #slug: "ieee-592-1990-r1996-ieee00000823-240313" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @665708400 {#7318 : 1991-02-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @843084000 {#7316 : 1996-09-19 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1044572400 {#7315 : 2003-02-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#93009 +product: App\Entity\Product\Product {#7309 #id: 8661 #code: "IEEE00000823" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751037603 {#7274 : 2025-06-27 17:20:03.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 29653 #name: "IEEE 592:1990 (R1996)" #slug: "ieee-592-1990-r1996-ieee00000823-240313" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @665708400 {#7318 : 1991-02-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @843084000 {#7316 : 1996-09-19 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1044572400 {#7315 : 2003-02-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } +appearance: "state-suspended" +labels: [ "Superseded" "Confirmed" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductType | App\Twig\Components\ProductType | 360.0 MiB | 0.29 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7309 #id: 8661 #code: "IEEE00000823" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751037603 {#7274 : 2025-06-27 17:20:03.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 29653 #name: "IEEE 592:1990 (R1996)" #slug: "ieee-592-1990-r1996-ieee00000823-240313" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @665708400 {#7318 : 1991-02-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @843084000 {#7316 : 1996-09-19 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1044572400 {#7315 : 2003-02-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductType {#93202 +product: App\Entity\Product\Product {#7309 #id: 8661 #code: "IEEE00000823" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751037603 {#7274 : 2025-06-27 17:20:03.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 29653 #name: "IEEE 592:1990 (R1996)" #slug: "ieee-592-1990-r1996-ieee00000823-240313" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @665708400 {#7318 : 1991-02-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @843084000 {#7316 : 1996-09-19 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1044572400 {#7315 : 2003-02-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } +label: "Standard" -typeAttributeCode: "type" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 360.0 MiB | 0.99 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7309 #id: 8661 #code: "IEEE00000823" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751037603 {#7274 : 2025-06-27 17:20:03.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 29653 #name: "IEEE 592:1990 (R1996)" #slug: "ieee-592-1990-r1996-ieee00000823-240313" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @665708400 {#7318 : 1991-02-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @843084000 {#7316 : 1996-09-19 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1044572400 {#7315 : 2003-02-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#93277 +product: App\Entity\Product\Product {#7309 #id: 8661 #code: "IEEE00000823" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751037603 {#7274 : 2025-06-27 17:20:03.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 29653 #name: "IEEE 592:1990 (R1996)" #slug: "ieee-592-1990-r1996-ieee00000823-240313" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @665708400 {#7318 : 1991-02-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @843084000 {#7316 : 1996-09-19 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1044572400 {#7315 : 2003-02-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductState | App\Twig\Components\ProductState | 360.0 MiB | 0.25 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#106828 #id: 8660 #code: "IEEE00000822" #attributes: Doctrine\ORM\PersistentCollection {#106811 …} #variants: Doctrine\ORM\PersistentCollection {#106808 …} #options: Doctrine\ORM\PersistentCollection {#106804 …} #associations: Doctrine\ORM\PersistentCollection {#106806 …} #createdAt: DateTime @1751037602 {#106836 : 2025-06-27 17:20:02.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106809 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106822 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106861 #locale: "en_US" #translatable: App\Entity\Product\Product {#106828} #id: 29649 #name: "IEEE 592:1977" #slug: "ieee-592-1977-ieee00000822-240312" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers electrical tests and performance requirements for exposed semiconducting shields on premolded cable accessories, specifically joints and separable insulated connectors, rated 5 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on Premolded High Voltage Cable Joints and Separable Insulated Connectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106819 …} #channels: Doctrine\ORM\PersistentCollection {#106813 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#106817 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106815 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106829 …} -apiLastModifiedAt: DateTime @1754517600 {#106796 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106835 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @249606000 {#106834 : 1977-11-29 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#106826 …} -favorites: Doctrine\ORM\PersistentCollection {#106824 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#106844 +product: App\Entity\Product\Product {#106828 #id: 8660 #code: "IEEE00000822" #attributes: Doctrine\ORM\PersistentCollection {#106811 …} #variants: Doctrine\ORM\PersistentCollection {#106808 …} #options: Doctrine\ORM\PersistentCollection {#106804 …} #associations: Doctrine\ORM\PersistentCollection {#106806 …} #createdAt: DateTime @1751037602 {#106836 : 2025-06-27 17:20:02.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106809 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106822 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106861 #locale: "en_US" #translatable: App\Entity\Product\Product {#106828} #id: 29649 #name: "IEEE 592:1977" #slug: "ieee-592-1977-ieee00000822-240312" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers electrical tests and performance requirements for exposed semiconducting shields on premolded cable accessories, specifically joints and separable insulated connectors, rated 5 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on Premolded High Voltage Cable Joints and Separable Insulated Connectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106819 …} #channels: Doctrine\ORM\PersistentCollection {#106813 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#106817 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106815 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106829 …} -apiLastModifiedAt: DateTime @1754517600 {#106796 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106835 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @249606000 {#106834 : 1977-11-29 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#106826 …} -favorites: Doctrine\ORM\PersistentCollection {#106824 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 360.0 MiB | 0.96 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#106828 #id: 8660 #code: "IEEE00000822" #attributes: Doctrine\ORM\PersistentCollection {#106811 …} #variants: Doctrine\ORM\PersistentCollection {#106808 …} #options: Doctrine\ORM\PersistentCollection {#106804 …} #associations: Doctrine\ORM\PersistentCollection {#106806 …} #createdAt: DateTime @1751037602 {#106836 : 2025-06-27 17:20:02.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106809 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106822 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106861 #locale: "en_US" #translatable: App\Entity\Product\Product {#106828} #id: 29649 #name: "IEEE 592:1977" #slug: "ieee-592-1977-ieee00000822-240312" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers electrical tests and performance requirements for exposed semiconducting shields on premolded cable accessories, specifically joints and separable insulated connectors, rated 5 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on Premolded High Voltage Cable Joints and Separable Insulated Connectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106819 …} #channels: Doctrine\ORM\PersistentCollection {#106813 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#106817 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106815 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106829 …} -apiLastModifiedAt: DateTime @1754517600 {#106796 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106835 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @249606000 {#106834 : 1977-11-29 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#106826 …} -favorites: Doctrine\ORM\PersistentCollection {#106824 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#106943 +product: App\Entity\Product\Product {#106828 #id: 8660 #code: "IEEE00000822" #attributes: Doctrine\ORM\PersistentCollection {#106811 …} #variants: Doctrine\ORM\PersistentCollection {#106808 …} #options: Doctrine\ORM\PersistentCollection {#106804 …} #associations: Doctrine\ORM\PersistentCollection {#106806 …} #createdAt: DateTime @1751037602 {#106836 : 2025-06-27 17:20:02.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106809 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106822 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106861 #locale: "en_US" #translatable: App\Entity\Product\Product {#106828} #id: 29649 #name: "IEEE 592:1977" #slug: "ieee-592-1977-ieee00000822-240312" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers electrical tests and performance requirements for exposed semiconducting shields on premolded cable accessories, specifically joints and separable insulated connectors, rated 5 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on Premolded High Voltage Cable Joints and Separable Insulated Connectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106819 …} #channels: Doctrine\ORM\PersistentCollection {#106813 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#106817 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106815 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106829 …} -apiLastModifiedAt: DateTime @1754517600 {#106796 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106835 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @249606000 {#106834 : 1977-11-29 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#106826 …} -favorites: Doctrine\ORM\PersistentCollection {#106824 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductState | App\Twig\Components\ProductState | 360.0 MiB | 0.28 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#93700 #id: 12123 #code: "IEEE00007127" #attributes: Doctrine\ORM\PersistentCollection {#93680 …} #variants: Doctrine\ORM\PersistentCollection {#93677 …} #options: Doctrine\ORM\PersistentCollection {#93673 …} #associations: Doctrine\ORM\PersistentCollection {#93669 …} #createdAt: DateTime @1751040213 {#93707 : 2025-06-27 18:03:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753970307 {#93686 : 2025-07-31 15:58:27.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#93691 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#93732 #locale: "en_US" #translatable: App\Entity\Product\Product {#93700} #id: 43501 #name: "IEEE 592:2018" #slug: "ieee-592-2018-ieee00007127-243776" #description: """ Revision Standard - Active.<br />\n Design tests for shield resistance, simulated touch current, and a simulated fault-current initiation for insulation shields used on cable accessories, specifically 15 kV through 35 kV class joints, and separable insulated connectors are covered in this standard.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance, simulated touch current and a simulated fault-current initiation for insulation shields used on cable accessories, specifically 15 kV through 35 kV class joints and separable insulated connectors. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Insulation Shields on Medium-Voltage (15 kV - 35 kV) Cable Joints and Separable Connectors" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#93689 …} #channels: Doctrine\ORM\PersistentCollection {#93682 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#93687 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#93684 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93697 …} -apiLastModifiedAt: DateTime @1743289200 {#93670 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1578006000 {#93706 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1530223200 {#93705 : 2018-06-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1530223200 {#93699 : 2018-06-29 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 21 -documents: Doctrine\ORM\PersistentCollection {#93695 …} -favorites: Doctrine\ORM\PersistentCollection {#93693 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#113446 +product: App\Entity\Product\Product {#93700 #id: 12123 #code: "IEEE00007127" #attributes: Doctrine\ORM\PersistentCollection {#93680 …} #variants: Doctrine\ORM\PersistentCollection {#93677 …} #options: Doctrine\ORM\PersistentCollection {#93673 …} #associations: Doctrine\ORM\PersistentCollection {#93669 …} #createdAt: DateTime @1751040213 {#93707 : 2025-06-27 18:03:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753970307 {#93686 : 2025-07-31 15:58:27.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#93691 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#93732 #locale: "en_US" #translatable: App\Entity\Product\Product {#93700} #id: 43501 #name: "IEEE 592:2018" #slug: "ieee-592-2018-ieee00007127-243776" #description: """ Revision Standard - Active.<br />\n Design tests for shield resistance, simulated touch current, and a simulated fault-current initiation for insulation shields used on cable accessories, specifically 15 kV through 35 kV class joints, and separable insulated connectors are covered in this standard.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance, simulated touch current and a simulated fault-current initiation for insulation shields used on cable accessories, specifically 15 kV through 35 kV class joints and separable insulated connectors. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Insulation Shields on Medium-Voltage (15 kV - 35 kV) Cable Joints and Separable Connectors" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#93689 …} #channels: Doctrine\ORM\PersistentCollection {#93682 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#93687 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#93684 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93697 …} -apiLastModifiedAt: DateTime @1743289200 {#93670 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1578006000 {#93706 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1530223200 {#93705 : 2018-06-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1530223200 {#93699 : 2018-06-29 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 21 -documents: Doctrine\ORM\PersistentCollection {#93695 …} -favorites: Doctrine\ORM\PersistentCollection {#93693 …} } +appearance: "state-active" +labels: [ "Active" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 360.0 MiB | 1.05 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#93700 #id: 12123 #code: "IEEE00007127" #attributes: Doctrine\ORM\PersistentCollection {#93680 …} #variants: Doctrine\ORM\PersistentCollection {#93677 …} #options: Doctrine\ORM\PersistentCollection {#93673 …} #associations: Doctrine\ORM\PersistentCollection {#93669 …} #createdAt: DateTime @1751040213 {#93707 : 2025-06-27 18:03:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753970307 {#93686 : 2025-07-31 15:58:27.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#93691 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#93732 #locale: "en_US" #translatable: App\Entity\Product\Product {#93700} #id: 43501 #name: "IEEE 592:2018" #slug: "ieee-592-2018-ieee00007127-243776" #description: """ Revision Standard - Active.<br />\n Design tests for shield resistance, simulated touch current, and a simulated fault-current initiation for insulation shields used on cable accessories, specifically 15 kV through 35 kV class joints, and separable insulated connectors are covered in this standard.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance, simulated touch current and a simulated fault-current initiation for insulation shields used on cable accessories, specifically 15 kV through 35 kV class joints and separable insulated connectors. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Insulation Shields on Medium-Voltage (15 kV - 35 kV) Cable Joints and Separable Connectors" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#93689 …} #channels: Doctrine\ORM\PersistentCollection {#93682 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#93687 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#93684 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93697 …} -apiLastModifiedAt: DateTime @1743289200 {#93670 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1578006000 {#93706 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1530223200 {#93705 : 2018-06-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1530223200 {#93699 : 2018-06-29 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 21 -documents: Doctrine\ORM\PersistentCollection {#93695 …} -favorites: Doctrine\ORM\PersistentCollection {#93693 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#113513 +product: App\Entity\Product\Product {#93700 #id: 12123 #code: "IEEE00007127" #attributes: Doctrine\ORM\PersistentCollection {#93680 …} #variants: Doctrine\ORM\PersistentCollection {#93677 …} #options: Doctrine\ORM\PersistentCollection {#93673 …} #associations: Doctrine\ORM\PersistentCollection {#93669 …} #createdAt: DateTime @1751040213 {#93707 : 2025-06-27 18:03:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753970307 {#93686 : 2025-07-31 15:58:27.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#93691 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#93732 #locale: "en_US" #translatable: App\Entity\Product\Product {#93700} #id: 43501 #name: "IEEE 592:2018" #slug: "ieee-592-2018-ieee00007127-243776" #description: """ Revision Standard - Active.<br />\n Design tests for shield resistance, simulated touch current, and a simulated fault-current initiation for insulation shields used on cable accessories, specifically 15 kV through 35 kV class joints, and separable insulated connectors are covered in this standard.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance, simulated touch current and a simulated fault-current initiation for insulation shields used on cable accessories, specifically 15 kV through 35 kV class joints and separable insulated connectors. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Insulation Shields on Medium-Voltage (15 kV - 35 kV) Cable Joints and Separable Connectors" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#93689 …} #channels: Doctrine\ORM\PersistentCollection {#93682 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#93687 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#93684 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93697 …} -apiLastModifiedAt: DateTime @1743289200 {#93670 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1578006000 {#93706 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1530223200 {#93705 : 2018-06-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1530223200 {#93699 : 2018-06-29 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 21 -documents: Doctrine\ORM\PersistentCollection {#93695 …} -favorites: Doctrine\ORM\PersistentCollection {#93693 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductState | App\Twig\Components\ProductState | 360.0 MiB | 0.29 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#113357 #id: 10148 #code: "IEEE00003731" #attributes: Doctrine\ORM\PersistentCollection {#113391 …} #variants: Doctrine\ORM\PersistentCollection {#113393 …} #options: Doctrine\ORM\PersistentCollection {#113397 …} #associations: Doctrine\ORM\PersistentCollection {#113395 …} #createdAt: DateTime @1751038854 {#113368 : 2025-06-27 17:40:54.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#113366 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#113381 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#113584 #locale: "en_US" #translatable: App\Entity\Product\Product {#113357} #id: 35601 #name: "IEEE 592:2007" #slug: "ieee-592-2007-ieee00003731-241800" #description: """ Revision Standard - Superseded.<br />\n Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#113383 …} #channels: Doctrine\ORM\PersistentCollection {#113389 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#113385 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#113387 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#113374 …} -apiLastModifiedAt: DateTime @1754517600 {#113364 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#113367 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1210197600 {#113360 : 2008-05-08 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#113377 …} -favorites: Doctrine\ORM\PersistentCollection {#113379 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#113599 +product: App\Entity\Product\Product {#113357 #id: 10148 #code: "IEEE00003731" #attributes: Doctrine\ORM\PersistentCollection {#113391 …} #variants: Doctrine\ORM\PersistentCollection {#113393 …} #options: Doctrine\ORM\PersistentCollection {#113397 …} #associations: Doctrine\ORM\PersistentCollection {#113395 …} #createdAt: DateTime @1751038854 {#113368 : 2025-06-27 17:40:54.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#113366 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#113381 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#113584 #locale: "en_US" #translatable: App\Entity\Product\Product {#113357} #id: 35601 #name: "IEEE 592:2007" #slug: "ieee-592-2007-ieee00003731-241800" #description: """ Revision Standard - Superseded.<br />\n Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#113383 …} #channels: Doctrine\ORM\PersistentCollection {#113389 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#113385 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#113387 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#113374 …} -apiLastModifiedAt: DateTime @1754517600 {#113364 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#113367 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1210197600 {#113360 : 2008-05-08 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#113377 …} -favorites: Doctrine\ORM\PersistentCollection {#113379 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 360.0 MiB | 1.07 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#113357 #id: 10148 #code: "IEEE00003731" #attributes: Doctrine\ORM\PersistentCollection {#113391 …} #variants: Doctrine\ORM\PersistentCollection {#113393 …} #options: Doctrine\ORM\PersistentCollection {#113397 …} #associations: Doctrine\ORM\PersistentCollection {#113395 …} #createdAt: DateTime @1751038854 {#113368 : 2025-06-27 17:40:54.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#113366 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#113381 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#113584 #locale: "en_US" #translatable: App\Entity\Product\Product {#113357} #id: 35601 #name: "IEEE 592:2007" #slug: "ieee-592-2007-ieee00003731-241800" #description: """ Revision Standard - Superseded.<br />\n Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#113383 …} #channels: Doctrine\ORM\PersistentCollection {#113389 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#113385 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#113387 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#113374 …} -apiLastModifiedAt: DateTime @1754517600 {#113364 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#113367 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1210197600 {#113360 : 2008-05-08 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#113377 …} -favorites: Doctrine\ORM\PersistentCollection {#113379 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#113651 +product: App\Entity\Product\Product {#113357 #id: 10148 #code: "IEEE00003731" #attributes: Doctrine\ORM\PersistentCollection {#113391 …} #variants: Doctrine\ORM\PersistentCollection {#113393 …} #options: Doctrine\ORM\PersistentCollection {#113397 …} #associations: Doctrine\ORM\PersistentCollection {#113395 …} #createdAt: DateTime @1751038854 {#113368 : 2025-06-27 17:40:54.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#113366 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#113381 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#113584 #locale: "en_US" #translatable: App\Entity\Product\Product {#113357} #id: 35601 #name: "IEEE 592:2007" #slug: "ieee-592-2007-ieee00003731-241800" #description: """ Revision Standard - Superseded.<br />\n Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#113383 …} #channels: Doctrine\ORM\PersistentCollection {#113389 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#113385 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#113387 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#113374 …} -apiLastModifiedAt: DateTime @1754517600 {#113364 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#113367 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1210197600 {#113360 : 2008-05-08 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#113377 …} -favorites: Doctrine\ORM\PersistentCollection {#113379 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductState | App\Twig\Components\ProductState | 360.0 MiB | 0.25 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7309 #id: 8661 #code: "IEEE00000823" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751037603 {#7274 : 2025-06-27 17:20:03.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 29653 #name: "IEEE 592:1990 (R1996)" #slug: "ieee-592-1990-r1996-ieee00000823-240313" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @665708400 {#7318 : 1991-02-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @843084000 {#7316 : 1996-09-19 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1044572400 {#7315 : 2003-02-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#113715 +product: App\Entity\Product\Product {#7309 #id: 8661 #code: "IEEE00000823" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751037603 {#7274 : 2025-06-27 17:20:03.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 29653 #name: "IEEE 592:1990 (R1996)" #slug: "ieee-592-1990-r1996-ieee00000823-240313" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @665708400 {#7318 : 1991-02-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @843084000 {#7316 : 1996-09-19 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1044572400 {#7315 : 2003-02-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } +appearance: "state-suspended" +labels: [ "Superseded" "Confirmed" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 360.0 MiB | 0.88 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7309 #id: 8661 #code: "IEEE00000823" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751037603 {#7274 : 2025-06-27 17:20:03.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 29653 #name: "IEEE 592:1990 (R1996)" #slug: "ieee-592-1990-r1996-ieee00000823-240313" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @665708400 {#7318 : 1991-02-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @843084000 {#7316 : 1996-09-19 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1044572400 {#7315 : 2003-02-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#113742 +product: App\Entity\Product\Product {#7309 #id: 8661 #code: "IEEE00000823" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751037603 {#7274 : 2025-06-27 17:20:03.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 29653 #name: "IEEE 592:1990 (R1996)" #slug: "ieee-592-1990-r1996-ieee00000823-240313" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @665708400 {#7318 : 1991-02-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @843084000 {#7316 : 1996-09-19 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1044572400 {#7315 : 2003-02-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductState | App\Twig\Components\ProductState | 360.0 MiB | 0.25 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#106828 #id: 8660 #code: "IEEE00000822" #attributes: Doctrine\ORM\PersistentCollection {#106811 …} #variants: Doctrine\ORM\PersistentCollection {#106808 …} #options: Doctrine\ORM\PersistentCollection {#106804 …} #associations: Doctrine\ORM\PersistentCollection {#106806 …} #createdAt: DateTime @1751037602 {#106836 : 2025-06-27 17:20:02.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106809 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106822 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106861 #locale: "en_US" #translatable: App\Entity\Product\Product {#106828} #id: 29649 #name: "IEEE 592:1977" #slug: "ieee-592-1977-ieee00000822-240312" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers electrical tests and performance requirements for exposed semiconducting shields on premolded cable accessories, specifically joints and separable insulated connectors, rated 5 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on Premolded High Voltage Cable Joints and Separable Insulated Connectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106819 …} #channels: Doctrine\ORM\PersistentCollection {#106813 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#106817 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106815 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106829 …} -apiLastModifiedAt: DateTime @1754517600 {#106796 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106835 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @249606000 {#106834 : 1977-11-29 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#106826 …} -favorites: Doctrine\ORM\PersistentCollection {#106824 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#113806 +product: App\Entity\Product\Product {#106828 #id: 8660 #code: "IEEE00000822" #attributes: Doctrine\ORM\PersistentCollection {#106811 …} #variants: Doctrine\ORM\PersistentCollection {#106808 …} #options: Doctrine\ORM\PersistentCollection {#106804 …} #associations: Doctrine\ORM\PersistentCollection {#106806 …} #createdAt: DateTime @1751037602 {#106836 : 2025-06-27 17:20:02.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106809 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106822 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106861 #locale: "en_US" #translatable: App\Entity\Product\Product {#106828} #id: 29649 #name: "IEEE 592:1977" #slug: "ieee-592-1977-ieee00000822-240312" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers electrical tests and performance requirements for exposed semiconducting shields on premolded cable accessories, specifically joints and separable insulated connectors, rated 5 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on Premolded High Voltage Cable Joints and Separable Insulated Connectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106819 …} #channels: Doctrine\ORM\PersistentCollection {#106813 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#106817 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106815 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106829 …} -apiLastModifiedAt: DateTime @1754517600 {#106796 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106835 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @249606000 {#106834 : 1977-11-29 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#106826 …} -favorites: Doctrine\ORM\PersistentCollection {#106824 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 360.0 MiB | 0.89 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#106828 #id: 8660 #code: "IEEE00000822" #attributes: Doctrine\ORM\PersistentCollection {#106811 …} #variants: Doctrine\ORM\PersistentCollection {#106808 …} #options: Doctrine\ORM\PersistentCollection {#106804 …} #associations: Doctrine\ORM\PersistentCollection {#106806 …} #createdAt: DateTime @1751037602 {#106836 : 2025-06-27 17:20:02.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106809 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106822 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106861 #locale: "en_US" #translatable: App\Entity\Product\Product {#106828} #id: 29649 #name: "IEEE 592:1977" #slug: "ieee-592-1977-ieee00000822-240312" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers electrical tests and performance requirements for exposed semiconducting shields on premolded cable accessories, specifically joints and separable insulated connectors, rated 5 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on Premolded High Voltage Cable Joints and Separable Insulated Connectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106819 …} #channels: Doctrine\ORM\PersistentCollection {#106813 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#106817 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106815 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106829 …} -apiLastModifiedAt: DateTime @1754517600 {#106796 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106835 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @249606000 {#106834 : 1977-11-29 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#106826 …} -favorites: Doctrine\ORM\PersistentCollection {#106824 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#113833 +product: App\Entity\Product\Product {#106828 #id: 8660 #code: "IEEE00000822" #attributes: Doctrine\ORM\PersistentCollection {#106811 …} #variants: Doctrine\ORM\PersistentCollection {#106808 …} #options: Doctrine\ORM\PersistentCollection {#106804 …} #associations: Doctrine\ORM\PersistentCollection {#106806 …} #createdAt: DateTime @1751037602 {#106836 : 2025-06-27 17:20:02.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106809 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106822 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106861 #locale: "en_US" #translatable: App\Entity\Product\Product {#106828} #id: 29649 #name: "IEEE 592:1977" #slug: "ieee-592-1977-ieee00000822-240312" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n \t\t\t\t<br />\n This standard covers electrical tests and performance requirements for exposed semiconducting shields on premolded cable accessories, specifically joints and separable insulated connectors, rated 5 kV through 35 kV. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on Premolded High Voltage Cable Joints and Separable Insulated Connectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106819 …} #channels: Doctrine\ORM\PersistentCollection {#106813 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#106817 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106815 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106829 …} -apiLastModifiedAt: DateTime @1754517600 {#106796 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106835 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @249606000 {#106834 : 1977-11-29 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "592" -bookCollection: "" -pageCount: 10 -documents: Doctrine\ORM\PersistentCollection {#106826 …} -favorites: Doctrine\ORM\PersistentCollection {#106824 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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