Symfony Profiler

[
  "product" => App\Entity\Product\Product {#7311
    #id: 9994
    #code: "IEEE00003407"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038729 {#7274
      date: 2025-06-27 17:38:49.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 34985
        #name: "IEEE C37.26:2003 (R2009)"
        #slug: "ieee-c37-26-2003-r2009-ieee00003407-241646"
        #description: """
          Revision Standard - Superseded.<br />\n
          This guide provides methods for determining the value of power factor for inductive low-voltage (1000 volts ac and below) test circuits. These methods are used in determining power factor during short-circuit current tests in high power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used must have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 volts ac), but may also be used for higher voltages.<br />\n
          \t\t\t\t<br />\n
          This guide describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are 1) ratio method, 2) dc decrement method, 3) phase relationship method. These preferred methods are shown in Table 1.&quot; [New scope of document] &quot;Scope: This guide describes three methods used in the measurement of power factor of inductive low-voltage (1000 volts and below) test circuits. These methods may be used at any frequency; however, the values in the tables are specifically for 60 Hz test circuits. The three methods are: 1) Ratio Method, 2) dc decrement method, 3) Phase relationship method. Table 1 lists the preferred method to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits, the methods discussed are also usable at higher voltages.&quot;<br />\n
          The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits, so that the preferred method giving the greatest accuracy is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1077750000 {#7318
      date: 2004-02-26 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1237417200 {#7316
      date: 2009-03-19 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 16
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  "showFullLabel" => "true"
]

[
  "showFullLabel" => "true"
]

App\Twig\Components\ProductState {#93008
  +product: App\Entity\Product\Product {#7311
    #id: 9994
    #code: "IEEE00003407"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038729 {#7274
      date: 2025-06-27 17:38:49.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 34985
        #name: "IEEE C37.26:2003 (R2009)"
        #slug: "ieee-c37-26-2003-r2009-ieee00003407-241646"
        #description: """
          Revision Standard - Superseded.<br />\n
          This guide provides methods for determining the value of power factor for inductive low-voltage (1000 volts ac and below) test circuits. These methods are used in determining power factor during short-circuit current tests in high power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used must have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 volts ac), but may also be used for higher voltages.<br />\n
          \t\t\t\t<br />\n
          This guide describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are 1) ratio method, 2) dc decrement method, 3) phase relationship method. These preferred methods are shown in Table 1.&quot; [New scope of document] &quot;Scope: This guide describes three methods used in the measurement of power factor of inductive low-voltage (1000 volts and below) test circuits. These methods may be used at any frequency; however, the values in the tables are specifically for 60 Hz test circuits. The three methods are: 1) Ratio Method, 2) dc decrement method, 3) Phase relationship method. Table 1 lists the preferred method to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits, the methods discussed are also usable at higher voltages.&quot;<br />\n
          The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits, so that the preferred method giving the greatest accuracy is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1077750000 {#7318
      date: 2004-02-26 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1237417200 {#7316
      date: 2009-03-19 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 16
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
    "Confirmed"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#7311
    #id: 9994
    #code: "IEEE00003407"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038729 {#7274
      date: 2025-06-27 17:38:49.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 34985
        #name: "IEEE C37.26:2003 (R2009)"
        #slug: "ieee-c37-26-2003-r2009-ieee00003407-241646"
        #description: """
          Revision Standard - Superseded.<br />\n
          This guide provides methods for determining the value of power factor for inductive low-voltage (1000 volts ac and below) test circuits. These methods are used in determining power factor during short-circuit current tests in high power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used must have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 volts ac), but may also be used for higher voltages.<br />\n
          \t\t\t\t<br />\n
          This guide describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are 1) ratio method, 2) dc decrement method, 3) phase relationship method. These preferred methods are shown in Table 1.&quot; [New scope of document] &quot;Scope: This guide describes three methods used in the measurement of power factor of inductive low-voltage (1000 volts and below) test circuits. These methods may be used at any frequency; however, the values in the tables are specifically for 60 Hz test circuits. The three methods are: 1) Ratio Method, 2) dc decrement method, 3) Phase relationship method. Table 1 lists the preferred method to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits, the methods discussed are also usable at higher voltages.&quot;<br />\n
          The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits, so that the preferred method giving the greatest accuracy is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1077750000 {#7318
      date: 2004-02-26 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1237417200 {#7316
      date: 2009-03-19 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 16
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
]

App\Twig\Components\ProductType {#93201
  +product: App\Entity\Product\Product {#7311
    #id: 9994
    #code: "IEEE00003407"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038729 {#7274
      date: 2025-06-27 17:38:49.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 34985
        #name: "IEEE C37.26:2003 (R2009)"
        #slug: "ieee-c37-26-2003-r2009-ieee00003407-241646"
        #description: """
          Revision Standard - Superseded.<br />\n
          This guide provides methods for determining the value of power factor for inductive low-voltage (1000 volts ac and below) test circuits. These methods are used in determining power factor during short-circuit current tests in high power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used must have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 volts ac), but may also be used for higher voltages.<br />\n
          \t\t\t\t<br />\n
          This guide describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are 1) ratio method, 2) dc decrement method, 3) phase relationship method. These preferred methods are shown in Table 1.&quot; [New scope of document] &quot;Scope: This guide describes three methods used in the measurement of power factor of inductive low-voltage (1000 volts and below) test circuits. These methods may be used at any frequency; however, the values in the tables are specifically for 60 Hz test circuits. The three methods are: 1) Ratio Method, 2) dc decrement method, 3) Phase relationship method. Table 1 lists the preferred method to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits, the methods discussed are also usable at higher voltages.&quot;<br />\n
          The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits, so that the preferred method giving the greatest accuracy is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1077750000 {#7318
      date: 2004-02-26 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1237417200 {#7316
      date: 2009-03-19 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 16
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +label: "Standard"
  -typeAttributeCode: "type"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#7311
    #id: 9994
    #code: "IEEE00003407"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038729 {#7274
      date: 2025-06-27 17:38:49.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 34985
        #name: "IEEE C37.26:2003 (R2009)"
        #slug: "ieee-c37-26-2003-r2009-ieee00003407-241646"
        #description: """
          Revision Standard - Superseded.<br />\n
          This guide provides methods for determining the value of power factor for inductive low-voltage (1000 volts ac and below) test circuits. These methods are used in determining power factor during short-circuit current tests in high power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used must have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 volts ac), but may also be used for higher voltages.<br />\n
          \t\t\t\t<br />\n
          This guide describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are 1) ratio method, 2) dc decrement method, 3) phase relationship method. These preferred methods are shown in Table 1.&quot; [New scope of document] &quot;Scope: This guide describes three methods used in the measurement of power factor of inductive low-voltage (1000 volts and below) test circuits. These methods may be used at any frequency; however, the values in the tables are specifically for 60 Hz test circuits. The three methods are: 1) Ratio Method, 2) dc decrement method, 3) Phase relationship method. Table 1 lists the preferred method to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits, the methods discussed are also usable at higher voltages.&quot;<br />\n
          The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits, so that the preferred method giving the greatest accuracy is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1077750000 {#7318
      date: 2004-02-26 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1237417200 {#7316
      date: 2009-03-19 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 16
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
]

App\Twig\Components\ProductMostRecent {#93276
  +product: App\Entity\Product\Product {#7311
    #id: 9994
    #code: "IEEE00003407"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038729 {#7274
      date: 2025-06-27 17:38:49.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 34985
        #name: "IEEE C37.26:2003 (R2009)"
        #slug: "ieee-c37-26-2003-r2009-ieee00003407-241646"
        #description: """
          Revision Standard - Superseded.<br />\n
          This guide provides methods for determining the value of power factor for inductive low-voltage (1000 volts ac and below) test circuits. These methods are used in determining power factor during short-circuit current tests in high power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used must have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 volts ac), but may also be used for higher voltages.<br />\n
          \t\t\t\t<br />\n
          This guide describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are 1) ratio method, 2) dc decrement method, 3) phase relationship method. These preferred methods are shown in Table 1.&quot; [New scope of document] &quot;Scope: This guide describes three methods used in the measurement of power factor of inductive low-voltage (1000 volts and below) test circuits. These methods may be used at any frequency; however, the values in the tables are specifically for 60 Hz test circuits. The three methods are: 1) Ratio Method, 2) dc decrement method, 3) Phase relationship method. Table 1 lists the preferred method to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits, the methods discussed are also usable at higher voltages.&quot;<br />\n
          The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits, so that the preferred method giving the greatest accuracy is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1077750000 {#7318
      date: 2004-02-26 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1237417200 {#7316
      date: 2009-03-19 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 16
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#106844
    #id: 9530
    #code: "IEEE00002511"
    #attributes: Doctrine\ORM\PersistentCollection {#106825 …}
    #variants: Doctrine\ORM\PersistentCollection {#106822 …}
    #options: Doctrine\ORM\PersistentCollection {#106818 …}
    #associations: Doctrine\ORM\PersistentCollection {#106820 …}
    #createdAt: DateTime @1751038339 {#106851
      date: 2025-06-27 17:32:19.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969444 {#106824
      date: 2025-07-31 15:44:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106835 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106874
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106844}
        #id: 33129
        #name: "IEEE C37.26:1972 (R1996)"
        #slug: "ieee-c37-26-1972-r1996-ieee00002511-241182"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Methods used to measure the power factor in low-voltage test circuits are covered. Since the power factor measurement for high-capacity test circuits is particularly difficult, and different methods may yield different results, the methods that are least likely to yield errors are recommended for particular circuit conditions. The ratio method is recommended for fast clearing devices that may have total interruption times of 0.5 cycle or less. The DC decrement method is recommended for circuits with a 30% power factor or less when the device to be tested interrupts at a point in time more than 0.5 cycle from the initiation of the current. The phase relationship method, using current and voltage waves, is recommended for circuits having power factors over 30%.<br />\n
          \t\t\t\t<br />\n
          This standard describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are:<br />\n
          1) Ratio method;<br />\n
          2) dc decrement method;<br />\n
          3) Phase relationship method;<br />\n
          These preferred methods are shown in Table 1.<br />\n
          The purpose of this standard is to recommend methods of measuring power factor for inductive test circuits by such means as oscillographic records, so that the preferred method, giving the greatest accuracy, is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106833 …}
    #channels: Doctrine\ORM\PersistentCollection {#106827 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106831 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106829 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106842 …}
    -apiLastModifiedAt: DateTime @1743289200 {#106811
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106850
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @77929200 {#106849
      date: 1972-06-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @850172400 {#106843
      date: 1996-12-10 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 12
    -documents: Doctrine\ORM\PersistentCollection {#106840 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106838 …}
  }
  "showFullLabel" => "true"
]

[
  "showFullLabel" => "true"
]

App\Twig\Components\ProductState {#106858
  +product: App\Entity\Product\Product {#106844
    #id: 9530
    #code: "IEEE00002511"
    #attributes: Doctrine\ORM\PersistentCollection {#106825 …}
    #variants: Doctrine\ORM\PersistentCollection {#106822 …}
    #options: Doctrine\ORM\PersistentCollection {#106818 …}
    #associations: Doctrine\ORM\PersistentCollection {#106820 …}
    #createdAt: DateTime @1751038339 {#106851
      date: 2025-06-27 17:32:19.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969444 {#106824
      date: 2025-07-31 15:44:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106835 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106874
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106844}
        #id: 33129
        #name: "IEEE C37.26:1972 (R1996)"
        #slug: "ieee-c37-26-1972-r1996-ieee00002511-241182"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Methods used to measure the power factor in low-voltage test circuits are covered. Since the power factor measurement for high-capacity test circuits is particularly difficult, and different methods may yield different results, the methods that are least likely to yield errors are recommended for particular circuit conditions. The ratio method is recommended for fast clearing devices that may have total interruption times of 0.5 cycle or less. The DC decrement method is recommended for circuits with a 30% power factor or less when the device to be tested interrupts at a point in time more than 0.5 cycle from the initiation of the current. The phase relationship method, using current and voltage waves, is recommended for circuits having power factors over 30%.<br />\n
          \t\t\t\t<br />\n
          This standard describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are:<br />\n
          1) Ratio method;<br />\n
          2) dc decrement method;<br />\n
          3) Phase relationship method;<br />\n
          These preferred methods are shown in Table 1.<br />\n
          The purpose of this standard is to recommend methods of measuring power factor for inductive test circuits by such means as oscillographic records, so that the preferred method, giving the greatest accuracy, is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106833 …}
    #channels: Doctrine\ORM\PersistentCollection {#106827 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106831 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106829 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106842 …}
    -apiLastModifiedAt: DateTime @1743289200 {#106811
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106850
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @77929200 {#106849
      date: 1972-06-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @850172400 {#106843
      date: 1996-12-10 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 12
    -documents: Doctrine\ORM\PersistentCollection {#106840 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106838 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
    "Confirmed"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#106844
    #id: 9530
    #code: "IEEE00002511"
    #attributes: Doctrine\ORM\PersistentCollection {#106825 …}
    #variants: Doctrine\ORM\PersistentCollection {#106822 …}
    #options: Doctrine\ORM\PersistentCollection {#106818 …}
    #associations: Doctrine\ORM\PersistentCollection {#106820 …}
    #createdAt: DateTime @1751038339 {#106851
      date: 2025-06-27 17:32:19.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969444 {#106824
      date: 2025-07-31 15:44:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106835 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106874
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106844}
        #id: 33129
        #name: "IEEE C37.26:1972 (R1996)"
        #slug: "ieee-c37-26-1972-r1996-ieee00002511-241182"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Methods used to measure the power factor in low-voltage test circuits are covered. Since the power factor measurement for high-capacity test circuits is particularly difficult, and different methods may yield different results, the methods that are least likely to yield errors are recommended for particular circuit conditions. The ratio method is recommended for fast clearing devices that may have total interruption times of 0.5 cycle or less. The DC decrement method is recommended for circuits with a 30% power factor or less when the device to be tested interrupts at a point in time more than 0.5 cycle from the initiation of the current. The phase relationship method, using current and voltage waves, is recommended for circuits having power factors over 30%.<br />\n
          \t\t\t\t<br />\n
          This standard describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are:<br />\n
          1) Ratio method;<br />\n
          2) dc decrement method;<br />\n
          3) Phase relationship method;<br />\n
          These preferred methods are shown in Table 1.<br />\n
          The purpose of this standard is to recommend methods of measuring power factor for inductive test circuits by such means as oscillographic records, so that the preferred method, giving the greatest accuracy, is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106833 …}
    #channels: Doctrine\ORM\PersistentCollection {#106827 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106831 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106829 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106842 …}
    -apiLastModifiedAt: DateTime @1743289200 {#106811
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106850
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @77929200 {#106849
      date: 1972-06-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @850172400 {#106843
      date: 1996-12-10 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 12
    -documents: Doctrine\ORM\PersistentCollection {#106840 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106838 …}
  }
]

App\Twig\Components\ProductMostRecent {#106959
  +product: App\Entity\Product\Product {#106844
    #id: 9530
    #code: "IEEE00002511"
    #attributes: Doctrine\ORM\PersistentCollection {#106825 …}
    #variants: Doctrine\ORM\PersistentCollection {#106822 …}
    #options: Doctrine\ORM\PersistentCollection {#106818 …}
    #associations: Doctrine\ORM\PersistentCollection {#106820 …}
    #createdAt: DateTime @1751038339 {#106851
      date: 2025-06-27 17:32:19.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969444 {#106824
      date: 2025-07-31 15:44:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106835 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106874
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106844}
        #id: 33129
        #name: "IEEE C37.26:1972 (R1996)"
        #slug: "ieee-c37-26-1972-r1996-ieee00002511-241182"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Methods used to measure the power factor in low-voltage test circuits are covered. Since the power factor measurement for high-capacity test circuits is particularly difficult, and different methods may yield different results, the methods that are least likely to yield errors are recommended for particular circuit conditions. The ratio method is recommended for fast clearing devices that may have total interruption times of 0.5 cycle or less. The DC decrement method is recommended for circuits with a 30% power factor or less when the device to be tested interrupts at a point in time more than 0.5 cycle from the initiation of the current. The phase relationship method, using current and voltage waves, is recommended for circuits having power factors over 30%.<br />\n
          \t\t\t\t<br />\n
          This standard describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are:<br />\n
          1) Ratio method;<br />\n
          2) dc decrement method;<br />\n
          3) Phase relationship method;<br />\n
          These preferred methods are shown in Table 1.<br />\n
          The purpose of this standard is to recommend methods of measuring power factor for inductive test circuits by such means as oscillographic records, so that the preferred method, giving the greatest accuracy, is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106833 …}
    #channels: Doctrine\ORM\PersistentCollection {#106827 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106831 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106829 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106842 …}
    -apiLastModifiedAt: DateTime @1743289200 {#106811
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106850
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @77929200 {#106849
      date: 1972-06-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @850172400 {#106843
      date: 1996-12-10 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 12
    -documents: Doctrine\ORM\PersistentCollection {#106840 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106838 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#93713
    #id: 11317
    #code: "IEEE00005910"
    #attributes: Doctrine\ORM\PersistentCollection {#93693 …}
    #variants: Doctrine\ORM\PersistentCollection {#93690 …}
    #options: Doctrine\ORM\PersistentCollection {#93686 …}
    #associations: Doctrine\ORM\PersistentCollection {#93682 …}
    #createdAt: DateTime @1751039628 {#93720
      date: 2025-06-27 17:53:48.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753970307 {#93699
      date: 2025-07-31 15:58:27.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93704 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93745
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93713}
        #id: 40277
        #name: "IEEE C37.26:2014"
        #slug: "ieee-c37-26-2014-ieee00005910-242969"
        #description: """
          Revision Standard - Active.<br />\n
          Methods for determining the value of the power factor for inductive low-voltage (1000 V ac and lower) test circuits are provided. These methods are used in determining the power factor during short-circuit current tests in high-power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used shall have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 V ac) but may also be used for higher voltages.<br />\n
          \t\t\t\t<br />\n
          This guide describes three methods used in the measurement of the power factor of inductive low-voltage (1000 V and lower) test circuits. These methods may be used at any frequency; however, the values in the tables are specifically for 60-Hz test circuits. These methods are as follows: a) Ratio method; b) DC decrement method; c) Phase relationship method.<br />\n
          Table 1 lists the preferred methods to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits, the methods discussed are also usable at higher voltages.<br />\n
          The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits, so that the preferred method giving the greatest accuracy is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93702 …}
    #channels: Doctrine\ORM\PersistentCollection {#93695 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93700 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93697 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93710 …}
    -apiLastModifiedAt: DateTime @1748383200 {#93683
      date: 2025-05-28 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1747864800 {#93719
      date: 2025-05-22 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1412287200 {#93718
      date: 2014-10-03 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1743030000 {#93712
      date: 2025-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 24
    -documents: Doctrine\ORM\PersistentCollection {#93708 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93706 …}
  }
  "showFullLabel" => "true"
]

[
  "showFullLabel" => "true"
]

App\Twig\Components\ProductState {#113433
  +product: App\Entity\Product\Product {#93713
    #id: 11317
    #code: "IEEE00005910"
    #attributes: Doctrine\ORM\PersistentCollection {#93693 …}
    #variants: Doctrine\ORM\PersistentCollection {#93690 …}
    #options: Doctrine\ORM\PersistentCollection {#93686 …}
    #associations: Doctrine\ORM\PersistentCollection {#93682 …}
    #createdAt: DateTime @1751039628 {#93720
      date: 2025-06-27 17:53:48.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753970307 {#93699
      date: 2025-07-31 15:58:27.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93704 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93745
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93713}
        #id: 40277
        #name: "IEEE C37.26:2014"
        #slug: "ieee-c37-26-2014-ieee00005910-242969"
        #description: """
          Revision Standard - Active.<br />\n
          Methods for determining the value of the power factor for inductive low-voltage (1000 V ac and lower) test circuits are provided. These methods are used in determining the power factor during short-circuit current tests in high-power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used shall have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 V ac) but may also be used for higher voltages.<br />\n
          \t\t\t\t<br />\n
          This guide describes three methods used in the measurement of the power factor of inductive low-voltage (1000 V and lower) test circuits. These methods may be used at any frequency; however, the values in the tables are specifically for 60-Hz test circuits. These methods are as follows: a) Ratio method; b) DC decrement method; c) Phase relationship method.<br />\n
          Table 1 lists the preferred methods to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits, the methods discussed are also usable at higher voltages.<br />\n
          The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits, so that the preferred method giving the greatest accuracy is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93702 …}
    #channels: Doctrine\ORM\PersistentCollection {#93695 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93700 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93697 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93710 …}
    -apiLastModifiedAt: DateTime @1748383200 {#93683
      date: 2025-05-28 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1747864800 {#93719
      date: 2025-05-22 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1412287200 {#93718
      date: 2014-10-03 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1743030000 {#93712
      date: 2025-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 24
    -documents: Doctrine\ORM\PersistentCollection {#93708 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93706 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#93713
    #id: 11317
    #code: "IEEE00005910"
    #attributes: Doctrine\ORM\PersistentCollection {#93693 …}
    #variants: Doctrine\ORM\PersistentCollection {#93690 …}
    #options: Doctrine\ORM\PersistentCollection {#93686 …}
    #associations: Doctrine\ORM\PersistentCollection {#93682 …}
    #createdAt: DateTime @1751039628 {#93720
      date: 2025-06-27 17:53:48.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753970307 {#93699
      date: 2025-07-31 15:58:27.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93704 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93745
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93713}
        #id: 40277
        #name: "IEEE C37.26:2014"
        #slug: "ieee-c37-26-2014-ieee00005910-242969"
        #description: """
          Revision Standard - Active.<br />\n
          Methods for determining the value of the power factor for inductive low-voltage (1000 V ac and lower) test circuits are provided. These methods are used in determining the power factor during short-circuit current tests in high-power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used shall have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 V ac) but may also be used for higher voltages.<br />\n
          \t\t\t\t<br />\n
          This guide describes three methods used in the measurement of the power factor of inductive low-voltage (1000 V and lower) test circuits. These methods may be used at any frequency; however, the values in the tables are specifically for 60-Hz test circuits. These methods are as follows: a) Ratio method; b) DC decrement method; c) Phase relationship method.<br />\n
          Table 1 lists the preferred methods to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits, the methods discussed are also usable at higher voltages.<br />\n
          The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits, so that the preferred method giving the greatest accuracy is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93702 …}
    #channels: Doctrine\ORM\PersistentCollection {#93695 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93700 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93697 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93710 …}
    -apiLastModifiedAt: DateTime @1748383200 {#93683
      date: 2025-05-28 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1747864800 {#93719
      date: 2025-05-22 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1412287200 {#93718
      date: 2014-10-03 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1743030000 {#93712
      date: 2025-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 24
    -documents: Doctrine\ORM\PersistentCollection {#93708 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93706 …}
  }
]

App\Twig\Components\ProductMostRecent {#113500
  +product: App\Entity\Product\Product {#93713
    #id: 11317
    #code: "IEEE00005910"
    #attributes: Doctrine\ORM\PersistentCollection {#93693 …}
    #variants: Doctrine\ORM\PersistentCollection {#93690 …}
    #options: Doctrine\ORM\PersistentCollection {#93686 …}
    #associations: Doctrine\ORM\PersistentCollection {#93682 …}
    #createdAt: DateTime @1751039628 {#93720
      date: 2025-06-27 17:53:48.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753970307 {#93699
      date: 2025-07-31 15:58:27.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93704 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93745
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93713}
        #id: 40277
        #name: "IEEE C37.26:2014"
        #slug: "ieee-c37-26-2014-ieee00005910-242969"
        #description: """
          Revision Standard - Active.<br />\n
          Methods for determining the value of the power factor for inductive low-voltage (1000 V ac and lower) test circuits are provided. These methods are used in determining the power factor during short-circuit current tests in high-power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used shall have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 V ac) but may also be used for higher voltages.<br />\n
          \t\t\t\t<br />\n
          This guide describes three methods used in the measurement of the power factor of inductive low-voltage (1000 V and lower) test circuits. These methods may be used at any frequency; however, the values in the tables are specifically for 60-Hz test circuits. These methods are as follows: a) Ratio method; b) DC decrement method; c) Phase relationship method.<br />\n
          Table 1 lists the preferred methods to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits, the methods discussed are also usable at higher voltages.<br />\n
          The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits, so that the preferred method giving the greatest accuracy is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93702 …}
    #channels: Doctrine\ORM\PersistentCollection {#93695 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93700 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93697 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93710 …}
    -apiLastModifiedAt: DateTime @1748383200 {#93683
      date: 2025-05-28 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1747864800 {#93719
      date: 2025-05-22 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1412287200 {#93718
      date: 2014-10-03 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1743030000 {#93712
      date: 2025-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 24
    -documents: Doctrine\ORM\PersistentCollection {#93708 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93706 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#7311
    #id: 9994
    #code: "IEEE00003407"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038729 {#7274
      date: 2025-06-27 17:38:49.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 34985
        #name: "IEEE C37.26:2003 (R2009)"
        #slug: "ieee-c37-26-2003-r2009-ieee00003407-241646"
        #description: """
          Revision Standard - Superseded.<br />\n
          This guide provides methods for determining the value of power factor for inductive low-voltage (1000 volts ac and below) test circuits. These methods are used in determining power factor during short-circuit current tests in high power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used must have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 volts ac), but may also be used for higher voltages.<br />\n
          \t\t\t\t<br />\n
          This guide describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are 1) ratio method, 2) dc decrement method, 3) phase relationship method. These preferred methods are shown in Table 1.&quot; [New scope of document] &quot;Scope: This guide describes three methods used in the measurement of power factor of inductive low-voltage (1000 volts and below) test circuits. These methods may be used at any frequency; however, the values in the tables are specifically for 60 Hz test circuits. The three methods are: 1) Ratio Method, 2) dc decrement method, 3) Phase relationship method. Table 1 lists the preferred method to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits, the methods discussed are also usable at higher voltages.&quot;<br />\n
          The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits, so that the preferred method giving the greatest accuracy is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1077750000 {#7318
      date: 2004-02-26 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1237417200 {#7316
      date: 2009-03-19 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 16
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  "showFullLabel" => "true"
]

[
  "showFullLabel" => "true"
]

App\Twig\Components\ProductState {#113565
  +product: App\Entity\Product\Product {#7311
    #id: 9994
    #code: "IEEE00003407"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038729 {#7274
      date: 2025-06-27 17:38:49.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 34985
        #name: "IEEE C37.26:2003 (R2009)"
        #slug: "ieee-c37-26-2003-r2009-ieee00003407-241646"
        #description: """
          Revision Standard - Superseded.<br />\n
          This guide provides methods for determining the value of power factor for inductive low-voltage (1000 volts ac and below) test circuits. These methods are used in determining power factor during short-circuit current tests in high power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used must have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 volts ac), but may also be used for higher voltages.<br />\n
          \t\t\t\t<br />\n
          This guide describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are 1) ratio method, 2) dc decrement method, 3) phase relationship method. These preferred methods are shown in Table 1.&quot; [New scope of document] &quot;Scope: This guide describes three methods used in the measurement of power factor of inductive low-voltage (1000 volts and below) test circuits. These methods may be used at any frequency; however, the values in the tables are specifically for 60 Hz test circuits. The three methods are: 1) Ratio Method, 2) dc decrement method, 3) Phase relationship method. Table 1 lists the preferred method to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits, the methods discussed are also usable at higher voltages.&quot;<br />\n
          The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits, so that the preferred method giving the greatest accuracy is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1077750000 {#7318
      date: 2004-02-26 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1237417200 {#7316
      date: 2009-03-19 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 16
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
    "Confirmed"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#7311
    #id: 9994
    #code: "IEEE00003407"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038729 {#7274
      date: 2025-06-27 17:38:49.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 34985
        #name: "IEEE C37.26:2003 (R2009)"
        #slug: "ieee-c37-26-2003-r2009-ieee00003407-241646"
        #description: """
          Revision Standard - Superseded.<br />\n
          This guide provides methods for determining the value of power factor for inductive low-voltage (1000 volts ac and below) test circuits. These methods are used in determining power factor during short-circuit current tests in high power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used must have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 volts ac), but may also be used for higher voltages.<br />\n
          \t\t\t\t<br />\n
          This guide describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are 1) ratio method, 2) dc decrement method, 3) phase relationship method. These preferred methods are shown in Table 1.&quot; [New scope of document] &quot;Scope: This guide describes three methods used in the measurement of power factor of inductive low-voltage (1000 volts and below) test circuits. These methods may be used at any frequency; however, the values in the tables are specifically for 60 Hz test circuits. The three methods are: 1) Ratio Method, 2) dc decrement method, 3) Phase relationship method. Table 1 lists the preferred method to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits, the methods discussed are also usable at higher voltages.&quot;<br />\n
          The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits, so that the preferred method giving the greatest accuracy is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1077750000 {#7318
      date: 2004-02-26 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1237417200 {#7316
      date: 2009-03-19 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 16
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
]

App\Twig\Components\ProductMostRecent {#113592
  +product: App\Entity\Product\Product {#7311
    #id: 9994
    #code: "IEEE00003407"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038729 {#7274
      date: 2025-06-27 17:38:49.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 34985
        #name: "IEEE C37.26:2003 (R2009)"
        #slug: "ieee-c37-26-2003-r2009-ieee00003407-241646"
        #description: """
          Revision Standard - Superseded.<br />\n
          This guide provides methods for determining the value of power factor for inductive low-voltage (1000 volts ac and below) test circuits. These methods are used in determining power factor during short-circuit current tests in high power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used must have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 volts ac), but may also be used for higher voltages.<br />\n
          \t\t\t\t<br />\n
          This guide describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are 1) ratio method, 2) dc decrement method, 3) phase relationship method. These preferred methods are shown in Table 1.&quot; [New scope of document] &quot;Scope: This guide describes three methods used in the measurement of power factor of inductive low-voltage (1000 volts and below) test circuits. These methods may be used at any frequency; however, the values in the tables are specifically for 60 Hz test circuits. The three methods are: 1) Ratio Method, 2) dc decrement method, 3) Phase relationship method. Table 1 lists the preferred method to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits, the methods discussed are also usable at higher voltages.&quot;<br />\n
          The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits, so that the preferred method giving the greatest accuracy is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1077750000 {#7318
      date: 2004-02-26 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1237417200 {#7316
      date: 2009-03-19 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 16
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#106844
    #id: 9530
    #code: "IEEE00002511"
    #attributes: Doctrine\ORM\PersistentCollection {#106825 …}
    #variants: Doctrine\ORM\PersistentCollection {#106822 …}
    #options: Doctrine\ORM\PersistentCollection {#106818 …}
    #associations: Doctrine\ORM\PersistentCollection {#106820 …}
    #createdAt: DateTime @1751038339 {#106851
      date: 2025-06-27 17:32:19.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969444 {#106824
      date: 2025-07-31 15:44:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106835 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106874
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106844}
        #id: 33129
        #name: "IEEE C37.26:1972 (R1996)"
        #slug: "ieee-c37-26-1972-r1996-ieee00002511-241182"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Methods used to measure the power factor in low-voltage test circuits are covered. Since the power factor measurement for high-capacity test circuits is particularly difficult, and different methods may yield different results, the methods that are least likely to yield errors are recommended for particular circuit conditions. The ratio method is recommended for fast clearing devices that may have total interruption times of 0.5 cycle or less. The DC decrement method is recommended for circuits with a 30% power factor or less when the device to be tested interrupts at a point in time more than 0.5 cycle from the initiation of the current. The phase relationship method, using current and voltage waves, is recommended for circuits having power factors over 30%.<br />\n
          \t\t\t\t<br />\n
          This standard describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are:<br />\n
          1) Ratio method;<br />\n
          2) dc decrement method;<br />\n
          3) Phase relationship method;<br />\n
          These preferred methods are shown in Table 1.<br />\n
          The purpose of this standard is to recommend methods of measuring power factor for inductive test circuits by such means as oscillographic records, so that the preferred method, giving the greatest accuracy, is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106833 …}
    #channels: Doctrine\ORM\PersistentCollection {#106827 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106831 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106829 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106842 …}
    -apiLastModifiedAt: DateTime @1743289200 {#106811
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106850
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @77929200 {#106849
      date: 1972-06-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @850172400 {#106843
      date: 1996-12-10 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 12
    -documents: Doctrine\ORM\PersistentCollection {#106840 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106838 …}
  }
  "showFullLabel" => "true"
]

[
  "showFullLabel" => "true"
]

App\Twig\Components\ProductState {#113656
  +product: App\Entity\Product\Product {#106844
    #id: 9530
    #code: "IEEE00002511"
    #attributes: Doctrine\ORM\PersistentCollection {#106825 …}
    #variants: Doctrine\ORM\PersistentCollection {#106822 …}
    #options: Doctrine\ORM\PersistentCollection {#106818 …}
    #associations: Doctrine\ORM\PersistentCollection {#106820 …}
    #createdAt: DateTime @1751038339 {#106851
      date: 2025-06-27 17:32:19.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969444 {#106824
      date: 2025-07-31 15:44:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106835 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106874
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106844}
        #id: 33129
        #name: "IEEE C37.26:1972 (R1996)"
        #slug: "ieee-c37-26-1972-r1996-ieee00002511-241182"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Methods used to measure the power factor in low-voltage test circuits are covered. Since the power factor measurement for high-capacity test circuits is particularly difficult, and different methods may yield different results, the methods that are least likely to yield errors are recommended for particular circuit conditions. The ratio method is recommended for fast clearing devices that may have total interruption times of 0.5 cycle or less. The DC decrement method is recommended for circuits with a 30% power factor or less when the device to be tested interrupts at a point in time more than 0.5 cycle from the initiation of the current. The phase relationship method, using current and voltage waves, is recommended for circuits having power factors over 30%.<br />\n
          \t\t\t\t<br />\n
          This standard describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are:<br />\n
          1) Ratio method;<br />\n
          2) dc decrement method;<br />\n
          3) Phase relationship method;<br />\n
          These preferred methods are shown in Table 1.<br />\n
          The purpose of this standard is to recommend methods of measuring power factor for inductive test circuits by such means as oscillographic records, so that the preferred method, giving the greatest accuracy, is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106833 …}
    #channels: Doctrine\ORM\PersistentCollection {#106827 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106831 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106829 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106842 …}
    -apiLastModifiedAt: DateTime @1743289200 {#106811
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106850
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @77929200 {#106849
      date: 1972-06-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @850172400 {#106843
      date: 1996-12-10 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 12
    -documents: Doctrine\ORM\PersistentCollection {#106840 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106838 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
    "Confirmed"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#106844
    #id: 9530
    #code: "IEEE00002511"
    #attributes: Doctrine\ORM\PersistentCollection {#106825 …}
    #variants: Doctrine\ORM\PersistentCollection {#106822 …}
    #options: Doctrine\ORM\PersistentCollection {#106818 …}
    #associations: Doctrine\ORM\PersistentCollection {#106820 …}
    #createdAt: DateTime @1751038339 {#106851
      date: 2025-06-27 17:32:19.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969444 {#106824
      date: 2025-07-31 15:44:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106835 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106874
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106844}
        #id: 33129
        #name: "IEEE C37.26:1972 (R1996)"
        #slug: "ieee-c37-26-1972-r1996-ieee00002511-241182"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Methods used to measure the power factor in low-voltage test circuits are covered. Since the power factor measurement for high-capacity test circuits is particularly difficult, and different methods may yield different results, the methods that are least likely to yield errors are recommended for particular circuit conditions. The ratio method is recommended for fast clearing devices that may have total interruption times of 0.5 cycle or less. The DC decrement method is recommended for circuits with a 30% power factor or less when the device to be tested interrupts at a point in time more than 0.5 cycle from the initiation of the current. The phase relationship method, using current and voltage waves, is recommended for circuits having power factors over 30%.<br />\n
          \t\t\t\t<br />\n
          This standard describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are:<br />\n
          1) Ratio method;<br />\n
          2) dc decrement method;<br />\n
          3) Phase relationship method;<br />\n
          These preferred methods are shown in Table 1.<br />\n
          The purpose of this standard is to recommend methods of measuring power factor for inductive test circuits by such means as oscillographic records, so that the preferred method, giving the greatest accuracy, is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106833 …}
    #channels: Doctrine\ORM\PersistentCollection {#106827 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106831 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106829 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106842 …}
    -apiLastModifiedAt: DateTime @1743289200 {#106811
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106850
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @77929200 {#106849
      date: 1972-06-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @850172400 {#106843
      date: 1996-12-10 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 12
    -documents: Doctrine\ORM\PersistentCollection {#106840 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106838 …}
  }
]

App\Twig\Components\ProductMostRecent {#113683
  +product: App\Entity\Product\Product {#106844
    #id: 9530
    #code: "IEEE00002511"
    #attributes: Doctrine\ORM\PersistentCollection {#106825 …}
    #variants: Doctrine\ORM\PersistentCollection {#106822 …}
    #options: Doctrine\ORM\PersistentCollection {#106818 …}
    #associations: Doctrine\ORM\PersistentCollection {#106820 …}
    #createdAt: DateTime @1751038339 {#106851
      date: 2025-06-27 17:32:19.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969444 {#106824
      date: 2025-07-31 15:44:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106835 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106874
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106844}
        #id: 33129
        #name: "IEEE C37.26:1972 (R1996)"
        #slug: "ieee-c37-26-1972-r1996-ieee00002511-241182"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Methods used to measure the power factor in low-voltage test circuits are covered. Since the power factor measurement for high-capacity test circuits is particularly difficult, and different methods may yield different results, the methods that are least likely to yield errors are recommended for particular circuit conditions. The ratio method is recommended for fast clearing devices that may have total interruption times of 0.5 cycle or less. The DC decrement method is recommended for circuits with a 30% power factor or less when the device to be tested interrupts at a point in time more than 0.5 cycle from the initiation of the current. The phase relationship method, using current and voltage waves, is recommended for circuits having power factors over 30%.<br />\n
          \t\t\t\t<br />\n
          This standard describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts and below) test circuits. Similar methods may apply at other frequencies. These methods are:<br />\n
          1) Ratio method;<br />\n
          2) dc decrement method;<br />\n
          3) Phase relationship method;<br />\n
          These preferred methods are shown in Table 1.<br />\n
          The purpose of this standard is to recommend methods of measuring power factor for inductive test circuits by such means as oscillographic records, so that the preferred method, giving the greatest accuracy, is recommended for any particular circuit.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106833 …}
    #channels: Doctrine\ORM\PersistentCollection {#106827 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106831 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106829 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106842 …}
    -apiLastModifiedAt: DateTime @1743289200 {#106811
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106850
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @77929200 {#106849
      date: 1972-06-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @850172400 {#106843
      date: 1996-12-10 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "C37.26"
    -bookCollection: ""
    -pageCount: 12
    -documents: Doctrine\ORM\PersistentCollection {#106840 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106838 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#135203
    #id: 9599
    #code: "IEEE00002619"
    #attributes: Doctrine\ORM\PersistentCollection {#135183 …}
    #variants: Doctrine\ORM\PersistentCollection {#135181 …}
    #options: Doctrine\ORM\PersistentCollection {#135176 …}
    #associations: Doctrine\ORM\PersistentCollection {#135178 …}
    #createdAt: DateTime @1751038397 {#135174
      date: 2025-06-27 17:33:17.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#135209
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#135194 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#135287
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#135203}
        #id: 33405
        #name: "IEEE C37.100:1992 (R2001)"
        #slug: "ieee-c37-100-1992-r2001-ieee00002619-241251"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Terms that encompass the products within the scope of the C37 project are defined. These include power switchgear for switching, interrupting, metering, protection, and regulating purposes as used primarily in connection with generation, transmission, distribution, and conversion of electric power. The definitions do not purport to embrace other meanings that the terms may properly have when used in connection with other subjects.<br />\n
          \t\t\t\t<br />\n
          The terms and definitions in the standard are intended to encompass the products within the scope of the C37 project that include power switchgear for switching, interrupting, metering, protection, and regulating purposes as used primarily in connection with generation, transmission, distribution, and conversion of electric power.<br />\n
          The definitions of terms and explanatory notes relating there to contained in this standard are not intended to embrace all possible meanings of the terms. They are intended for the sole purpose of establishing only those meanings of terms used in switchgear standards. They do not purport to embrace other meanings that the terms may properly have when used in connection with other subjects.<br />\n
          In some instances, terms and definitions that are not identical to those in this standard have been developed by other branches of industry. Where this situation exists, the definitions in this standard shall be used for power switchgear within the C37 product scope.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions for Power Switchgear"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#135191 …}
    #channels: Doctrine\ORM\PersistentCollection {#135185 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#135189 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#135187 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135200 …}
    -apiLastModifiedAt: DateTime @1754517600 {#135160
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1581462000 {#135208
      date: 2020-02-12 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @717980400 {#135167
      date: 1992-10-02 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @992469600 {#135180
      date: 2001-06-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#135201
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "C37.100"
    -bookCollection: ""
    -pageCount: 82
    -documents: Doctrine\ORM\PersistentCollection {#135198 …}
    -favorites: Doctrine\ORM\PersistentCollection {#135196 …}
  }
  "layout" => "vertical"
  "showPrice" => true
  "showStatusBadges" => true
  "additionalClasses" => "product__teaser--with-grey-border"
  "hasStretchedLink" => true
  "hoverType" => "shadow"
  "linkLabel" => "See more"
]

App\Twig\Components\ProductCard {#135240
  +product: App\Entity\Product\Product {#135203
    #id: 9599
    #code: "IEEE00002619"
    #attributes: Doctrine\ORM\PersistentCollection {#135183 …}
    #variants: Doctrine\ORM\PersistentCollection {#135181 …}
    #options: Doctrine\ORM\PersistentCollection {#135176 …}
    #associations: Doctrine\ORM\PersistentCollection {#135178 …}
    #createdAt: DateTime @1751038397 {#135174
      date: 2025-06-27 17:33:17.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#135209
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#135194 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#135287
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#135203}
        #id: 33405
        #name: "IEEE C37.100:1992 (R2001)"
        #slug: "ieee-c37-100-1992-r2001-ieee00002619-241251"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Terms that encompass the products within the scope of the C37 project are defined. These include power switchgear for switching, interrupting, metering, protection, and regulating purposes as used primarily in connection with generation, transmission, distribution, and conversion of electric power. The definitions do not purport to embrace other meanings that the terms may properly have when used in connection with other subjects.<br />\n
          \t\t\t\t<br />\n
          The terms and definitions in the standard are intended to encompass the products within the scope of the C37 project that include power switchgear for switching, interrupting, metering, protection, and regulating purposes as used primarily in connection with generation, transmission, distribution, and conversion of electric power.<br />\n
          The definitions of terms and explanatory notes relating there to contained in this standard are not intended to embrace all possible meanings of the terms. They are intended for the sole purpose of establishing only those meanings of terms used in switchgear standards. They do not purport to embrace other meanings that the terms may properly have when used in connection with other subjects.<br />\n
          In some instances, terms and definitions that are not identical to those in this standard have been developed by other branches of industry. Where this situation exists, the definitions in this standard shall be used for power switchgear within the C37 product scope.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions for Power Switchgear"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#135191 …}
    #channels: Doctrine\ORM\PersistentCollection {#135185 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#135189 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#135187 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135200 …}
    -apiLastModifiedAt: DateTime @1754517600 {#135160
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1581462000 {#135208
      date: 2020-02-12 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @717980400 {#135167
      date: 1992-10-02 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @992469600 {#135180
      date: 2001-06-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#135201
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "C37.100"
    -bookCollection: ""
    -pageCount: 82
    -documents: Doctrine\ORM\PersistentCollection {#135198 …}
    -favorites: Doctrine\ORM\PersistentCollection {#135196 …}
  }
  +layout: "vertical"
  +showPrice: true
  +showStatusBadges: true
  +additionalClasses: "product__teaser--with-grey-border"
  +linkLabel: "See more"
  +imageFilter: "product_thumbnail_teaser"
  +hasStretchedLink: true
  +backgroundColor: "white"
  +hoverType: "shadow"
}

[
  "product" => App\Entity\Product\Product {#135203
    #id: 9599
    #code: "IEEE00002619"
    #attributes: Doctrine\ORM\PersistentCollection {#135183 …}
    #variants: Doctrine\ORM\PersistentCollection {#135181 …}
    #options: Doctrine\ORM\PersistentCollection {#135176 …}
    #associations: Doctrine\ORM\PersistentCollection {#135178 …}
    #createdAt: DateTime @1751038397 {#135174
      date: 2025-06-27 17:33:17.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#135209
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#135194 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#135287
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#135203}
        #id: 33405
        #name: "IEEE C37.100:1992 (R2001)"
        #slug: "ieee-c37-100-1992-r2001-ieee00002619-241251"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Terms that encompass the products within the scope of the C37 project are defined. These include power switchgear for switching, interrupting, metering, protection, and regulating purposes as used primarily in connection with generation, transmission, distribution, and conversion of electric power. The definitions do not purport to embrace other meanings that the terms may properly have when used in connection with other subjects.<br />\n
          \t\t\t\t<br />\n
          The terms and definitions in the standard are intended to encompass the products within the scope of the C37 project that include power switchgear for switching, interrupting, metering, protection, and regulating purposes as used primarily in connection with generation, transmission, distribution, and conversion of electric power.<br />\n
          The definitions of terms and explanatory notes relating there to contained in this standard are not intended to embrace all possible meanings of the terms. They are intended for the sole purpose of establishing only those meanings of terms used in switchgear standards. They do not purport to embrace other meanings that the terms may properly have when used in connection with other subjects.<br />\n
          In some instances, terms and definitions that are not identical to those in this standard have been developed by other branches of industry. Where this situation exists, the definitions in this standard shall be used for power switchgear within the C37 product scope.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions for Power Switchgear"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#135191 …}
    #channels: Doctrine\ORM\PersistentCollection {#135185 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#135189 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#135187 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135200 …}
    -apiLastModifiedAt: DateTime @1754517600 {#135160
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1581462000 {#135208
      date: 2020-02-12 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @717980400 {#135167
      date: 1992-10-02 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @992469600 {#135180
      date: 2001-06-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#135201
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "C37.100"
    -bookCollection: ""
    -pageCount: 82
    -documents: Doctrine\ORM\PersistentCollection {#135198 …}
    -favorites: Doctrine\ORM\PersistentCollection {#135196 …}
  }
]

[
  "showFullLabel" => false
]

App\Twig\Components\ProductState {#135291
  +product: App\Entity\Product\Product {#135203
    #id: 9599
    #code: "IEEE00002619"
    #attributes: Doctrine\ORM\PersistentCollection {#135183 …}
    #variants: Doctrine\ORM\PersistentCollection {#135181 …}
    #options: Doctrine\ORM\PersistentCollection {#135176 …}
    #associations: Doctrine\ORM\PersistentCollection {#135178 …}
    #createdAt: DateTime @1751038397 {#135174
      date: 2025-06-27 17:33:17.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#135209
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#135194 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#135287
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#135203}
        #id: 33405
        #name: "IEEE C37.100:1992 (R2001)"
        #slug: "ieee-c37-100-1992-r2001-ieee00002619-241251"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Terms that encompass the products within the scope of the C37 project are defined. These include power switchgear for switching, interrupting, metering, protection, and regulating purposes as used primarily in connection with generation, transmission, distribution, and conversion of electric power. The definitions do not purport to embrace other meanings that the terms may properly have when used in connection with other subjects.<br />\n
          \t\t\t\t<br />\n
          The terms and definitions in the standard are intended to encompass the products within the scope of the C37 project that include power switchgear for switching, interrupting, metering, protection, and regulating purposes as used primarily in connection with generation, transmission, distribution, and conversion of electric power.<br />\n
          The definitions of terms and explanatory notes relating there to contained in this standard are not intended to embrace all possible meanings of the terms. They are intended for the sole purpose of establishing only those meanings of terms used in switchgear standards. They do not purport to embrace other meanings that the terms may properly have when used in connection with other subjects.<br />\n
          In some instances, terms and definitions that are not identical to those in this standard have been developed by other branches of industry. Where this situation exists, the definitions in this standard shall be used for power switchgear within the C37 product scope.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions for Power Switchgear"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#135191 …}
    #channels: Doctrine\ORM\PersistentCollection {#135185 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#135189 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#135187 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135200 …}
    -apiLastModifiedAt: DateTime @1754517600 {#135160
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1581462000 {#135208
      date: 2020-02-12 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @717980400 {#135167
      date: 1992-10-02 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @992469600 {#135180
      date: 2001-06-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#135201
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "C37.100"
    -bookCollection: ""
    -pageCount: 82
    -documents: Doctrine\ORM\PersistentCollection {#135198 …}
    -favorites: Doctrine\ORM\PersistentCollection {#135196 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#135203
    #id: 9599
    #code: "IEEE00002619"
    #attributes: Doctrine\ORM\PersistentCollection {#135183 …}
    #variants: Doctrine\ORM\PersistentCollection {#135181 …}
    #options: Doctrine\ORM\PersistentCollection {#135176 …}
    #associations: Doctrine\ORM\PersistentCollection {#135178 …}
    #createdAt: DateTime @1751038397 {#135174
      date: 2025-06-27 17:33:17.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#135209
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#135194 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#135287
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#135203}
        #id: 33405
        #name: "IEEE C37.100:1992 (R2001)"
        #slug: "ieee-c37-100-1992-r2001-ieee00002619-241251"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Terms that encompass the products within the scope of the C37 project are defined. These include power switchgear for switching, interrupting, metering, protection, and regulating purposes as used primarily in connection with generation, transmission, distribution, and conversion of electric power. The definitions do not purport to embrace other meanings that the terms may properly have when used in connection with other subjects.<br />\n
          \t\t\t\t<br />\n
          The terms and definitions in the standard are intended to encompass the products within the scope of the C37 project that include power switchgear for switching, interrupting, metering, protection, and regulating purposes as used primarily in connection with generation, transmission, distribution, and conversion of electric power.<br />\n
          The definitions of terms and explanatory notes relating there to contained in this standard are not intended to embrace all possible meanings of the terms. They are intended for the sole purpose of establishing only those meanings of terms used in switchgear standards. They do not purport to embrace other meanings that the terms may properly have when used in connection with other subjects.<br />\n
          In some instances, terms and definitions that are not identical to those in this standard have been developed by other branches of industry. Where this situation exists, the definitions in this standard shall be used for power switchgear within the C37 product scope.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions for Power Switchgear"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#135191 …}
    #channels: Doctrine\ORM\PersistentCollection {#135185 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#135189 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#135187 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135200 …}
    -apiLastModifiedAt: DateTime @1754517600 {#135160
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1581462000 {#135208
      date: 2020-02-12 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @717980400 {#135167
      date: 1992-10-02 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @992469600 {#135180
      date: 2001-06-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#135201
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "C37.100"
    -bookCollection: ""
    -pageCount: 82
    -documents: Doctrine\ORM\PersistentCollection {#135198 …}
    -favorites: Doctrine\ORM\PersistentCollection {#135196 …}
  }
]

App\Twig\Components\ProductMostRecent {#135369
  +product: App\Entity\Product\Product {#135203
    #id: 9599
    #code: "IEEE00002619"
    #attributes: Doctrine\ORM\PersistentCollection {#135183 …}
    #variants: Doctrine\ORM\PersistentCollection {#135181 …}
    #options: Doctrine\ORM\PersistentCollection {#135176 …}
    #associations: Doctrine\ORM\PersistentCollection {#135178 …}
    #createdAt: DateTime @1751038397 {#135174
      date: 2025-06-27 17:33:17.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#135209
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#135194 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#135287
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#135203}
        #id: 33405
        #name: "IEEE C37.100:1992 (R2001)"
        #slug: "ieee-c37-100-1992-r2001-ieee00002619-241251"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Terms that encompass the products within the scope of the C37 project are defined. These include power switchgear for switching, interrupting, metering, protection, and regulating purposes as used primarily in connection with generation, transmission, distribution, and conversion of electric power. The definitions do not purport to embrace other meanings that the terms may properly have when used in connection with other subjects.<br />\n
          \t\t\t\t<br />\n
          The terms and definitions in the standard are intended to encompass the products within the scope of the C37 project that include power switchgear for switching, interrupting, metering, protection, and regulating purposes as used primarily in connection with generation, transmission, distribution, and conversion of electric power.<br />\n
          The definitions of terms and explanatory notes relating there to contained in this standard are not intended to embrace all possible meanings of the terms. They are intended for the sole purpose of establishing only those meanings of terms used in switchgear standards. They do not purport to embrace other meanings that the terms may properly have when used in connection with other subjects.<br />\n
          In some instances, terms and definitions that are not identical to those in this standard have been developed by other branches of industry. Where this situation exists, the definitions in this standard shall be used for power switchgear within the C37 product scope.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions for Power Switchgear"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#135191 …}
    #channels: Doctrine\ORM\PersistentCollection {#135185 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#135189 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#135187 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135200 …}
    -apiLastModifiedAt: DateTime @1754517600 {#135160
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1581462000 {#135208
      date: 2020-02-12 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @717980400 {#135167
      date: 1992-10-02 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @992469600 {#135180
      date: 2001-06-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#135201
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "C37.100"
    -bookCollection: ""
    -pageCount: 82
    -documents: Doctrine\ORM\PersistentCollection {#135198 …}
    -favorites: Doctrine\ORM\PersistentCollection {#135196 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}