GET https://dev.normadoc.fr/_partial/cart/add-item?productId=8452&template=%40SyliusShop%2FProduct%2FShow%2F_addToCart.html.twig

Response
200 OK
IP
216.73.217.22
Profiled on
Token
bd6b2e

Components

4 Twig Components
12 Render Count
11 ms Render Time
292.0 MiB Memory Usage

Components

Name Metadata Render Count Render Time
ProductState 
"App\Twig\Components\ProductState"
components/ProductState.html.twig 		5 1.26ms
ProductMostRecent 
"App\Twig\Components\ProductMostRecent"
components/ProductMostRecent.html.twig 		5 4.12ms
ProductType 
"App\Twig\Components\ProductType"
components/ProductType.html.twig 		1 0.23ms
ProductCard 
"App\Twig\Components\ProductCard"
components/ProductCard.html.twig 		1 6.72ms

Render calls

ProductState App\Twig\Components\ProductState 292.0 MiB 0.31 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7309
    #id: 8452
    #code: "IEEE00000494"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751037428 {#7274
      date: 2025-06-27 17:17:08.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 28817
        #name: "IEEE 300:1988 (R2006)"
        #slug: "ieee-300-1988-r2006-ieee00000494-240104"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators) which may not be readily available.<br />\n
          Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1988<br />\n
          The object of this standard is to establish standard test procedures for semiconductor charged particle detectors. These detectors are in widespread use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#7292
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @599353200 {#7318
      date: 1988-12-29 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#7316
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#7315
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#93009
  +product: App\Entity\Product\Product {#7309
    #id: 8452
    #code: "IEEE00000494"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751037428 {#7274
      date: 2025-06-27 17:17:08.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 28817
        #name: "IEEE 300:1988 (R2006)"
        #slug: "ieee-300-1988-r2006-ieee00000494-240104"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators) which may not be readily available.<br />\n
          Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1988<br />\n
          The object of this standard is to establish standard test procedures for semiconductor charged particle detectors. These detectors are in widespread use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#7292
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @599353200 {#7318
      date: 1988-12-29 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#7316
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#7315
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
    "Confirmed"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductType App\Twig\Components\ProductType 292.0 MiB 0.23 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7309
    #id: 8452
    #code: "IEEE00000494"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751037428 {#7274
      date: 2025-06-27 17:17:08.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 28817
        #name: "IEEE 300:1988 (R2006)"
        #slug: "ieee-300-1988-r2006-ieee00000494-240104"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators) which may not be readily available.<br />\n
          Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1988<br />\n
          The object of this standard is to establish standard test procedures for semiconductor charged particle detectors. These detectors are in widespread use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#7292
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @599353200 {#7318
      date: 1988-12-29 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#7316
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#7315
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductType {#93202
  +product: App\Entity\Product\Product {#7309
    #id: 8452
    #code: "IEEE00000494"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751037428 {#7274
      date: 2025-06-27 17:17:08.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 28817
        #name: "IEEE 300:1988 (R2006)"
        #slug: "ieee-300-1988-r2006-ieee00000494-240104"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators) which may not be readily available.<br />\n
          Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1988<br />\n
          The object of this standard is to establish standard test procedures for semiconductor charged particle detectors. These detectors are in widespread use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#7292
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @599353200 {#7318
      date: 1988-12-29 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#7316
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#7315
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
  +label: "Standard"
  -typeAttributeCode: "type"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 292.0 MiB 0.66 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7309
    #id: 8452
    #code: "IEEE00000494"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751037428 {#7274
      date: 2025-06-27 17:17:08.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 28817
        #name: "IEEE 300:1988 (R2006)"
        #slug: "ieee-300-1988-r2006-ieee00000494-240104"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators) which may not be readily available.<br />\n
          Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1988<br />\n
          The object of this standard is to establish standard test procedures for semiconductor charged particle detectors. These detectors are in widespread use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#7292
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @599353200 {#7318
      date: 1988-12-29 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#7316
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#7315
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#93277
  +product: App\Entity\Product\Product {#7309
    #id: 8452
    #code: "IEEE00000494"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751037428 {#7274
      date: 2025-06-27 17:17:08.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 28817
        #name: "IEEE 300:1988 (R2006)"
        #slug: "ieee-300-1988-r2006-ieee00000494-240104"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators) which may not be readily available.<br />\n
          Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1988<br />\n
          The object of this standard is to establish standard test procedures for semiconductor charged particle detectors. These detectors are in widespread use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#7292
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @599353200 {#7318
      date: 1988-12-29 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#7316
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#7315
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 292.0 MiB 0.27 ms
Input props 
[
  "product" => App\Entity\Product\Product {#93699
    #id: 11629
    #code: "IEEE00006388"
    #attributes: Doctrine\ORM\PersistentCollection {#93681 …}
    #variants: Doctrine\ORM\PersistentCollection {#93678 …}
    #options: Doctrine\ORM\PersistentCollection {#93674 …}
    #associations: Doctrine\ORM\PersistentCollection {#93676 …}
    #createdAt: DateTime @1751039849 {#93707
      date: 2025-06-27 17:57:29.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753970307 {#93686
      date: 2025-07-31 15:58:27.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93692 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93727
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93699}
        #id: 41525
        #name: "ANSI/IEEE 300:1982"
        #slug: "ansi-ieee-300-1982-ieee00006388-243281"
        #description: """
          Revision Standard - Superseded.<br />\n
          The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.<br />\n
          \t\t\t\t<br />\n
          This standard applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are t o o complex or require equipment (such as particle accelerators) which may not be readily available. Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation, and the equivalent international publication IEC 340.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93690 …}
    #channels: Doctrine\ORM\PersistentCollection {#93683 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93688 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93685 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93700 …}
    -apiLastModifiedAt: DateTime @1743289200 {#93670
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#93706
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @721350000 {#93705
      date: 1992-11-10 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 30
    -documents: Doctrine\ORM\PersistentCollection {#93696 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93694 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#106880
  +product: App\Entity\Product\Product {#93699
    #id: 11629
    #code: "IEEE00006388"
    #attributes: Doctrine\ORM\PersistentCollection {#93681 …}
    #variants: Doctrine\ORM\PersistentCollection {#93678 …}
    #options: Doctrine\ORM\PersistentCollection {#93674 …}
    #associations: Doctrine\ORM\PersistentCollection {#93676 …}
    #createdAt: DateTime @1751039849 {#93707
      date: 2025-06-27 17:57:29.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753970307 {#93686
      date: 2025-07-31 15:58:27.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93692 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93727
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93699}
        #id: 41525
        #name: "ANSI/IEEE 300:1982"
        #slug: "ansi-ieee-300-1982-ieee00006388-243281"
        #description: """
          Revision Standard - Superseded.<br />\n
          The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.<br />\n
          \t\t\t\t<br />\n
          This standard applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are t o o complex or require equipment (such as particle accelerators) which may not be readily available. Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation, and the equivalent international publication IEC 340.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93690 …}
    #channels: Doctrine\ORM\PersistentCollection {#93683 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93688 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93685 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93700 …}
    -apiLastModifiedAt: DateTime @1743289200 {#93670
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#93706
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @721350000 {#93705
      date: 1992-11-10 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 30
    -documents: Doctrine\ORM\PersistentCollection {#93696 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93694 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 292.0 MiB 0.99 ms
Input props 
[
  "product" => App\Entity\Product\Product {#93699
    #id: 11629
    #code: "IEEE00006388"
    #attributes: Doctrine\ORM\PersistentCollection {#93681 …}
    #variants: Doctrine\ORM\PersistentCollection {#93678 …}
    #options: Doctrine\ORM\PersistentCollection {#93674 …}
    #associations: Doctrine\ORM\PersistentCollection {#93676 …}
    #createdAt: DateTime @1751039849 {#93707
      date: 2025-06-27 17:57:29.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753970307 {#93686
      date: 2025-07-31 15:58:27.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93692 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93727
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93699}
        #id: 41525
        #name: "ANSI/IEEE 300:1982"
        #slug: "ansi-ieee-300-1982-ieee00006388-243281"
        #description: """
          Revision Standard - Superseded.<br />\n
          The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.<br />\n
          \t\t\t\t<br />\n
          This standard applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are t o o complex or require equipment (such as particle accelerators) which may not be readily available. Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation, and the equivalent international publication IEC 340.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93690 …}
    #channels: Doctrine\ORM\PersistentCollection {#93683 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93688 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93685 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93700 …}
    -apiLastModifiedAt: DateTime @1743289200 {#93670
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#93706
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @721350000 {#93705
      date: 1992-11-10 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 30
    -documents: Doctrine\ORM\PersistentCollection {#93696 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93694 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#106947
  +product: App\Entity\Product\Product {#93699
    #id: 11629
    #code: "IEEE00006388"
    #attributes: Doctrine\ORM\PersistentCollection {#93681 …}
    #variants: Doctrine\ORM\PersistentCollection {#93678 …}
    #options: Doctrine\ORM\PersistentCollection {#93674 …}
    #associations: Doctrine\ORM\PersistentCollection {#93676 …}
    #createdAt: DateTime @1751039849 {#93707
      date: 2025-06-27 17:57:29.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753970307 {#93686
      date: 2025-07-31 15:58:27.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93692 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93727
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93699}
        #id: 41525
        #name: "ANSI/IEEE 300:1982"
        #slug: "ansi-ieee-300-1982-ieee00006388-243281"
        #description: """
          Revision Standard - Superseded.<br />\n
          The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.<br />\n
          \t\t\t\t<br />\n
          This standard applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are t o o complex or require equipment (such as particle accelerators) which may not be readily available. Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation, and the equivalent international publication IEC 340.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93690 …}
    #channels: Doctrine\ORM\PersistentCollection {#93683 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93688 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93685 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93700 …}
    -apiLastModifiedAt: DateTime @1743289200 {#93670
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#93706
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @721350000 {#93705
      date: 1992-11-10 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 30
    -documents: Doctrine\ORM\PersistentCollection {#93696 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93694 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 292.0 MiB 0.30 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7309
    #id: 8452
    #code: "IEEE00000494"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751037428 {#7274
      date: 2025-06-27 17:17:08.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 28817
        #name: "IEEE 300:1988 (R2006)"
        #slug: "ieee-300-1988-r2006-ieee00000494-240104"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators) which may not be readily available.<br />\n
          Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1988<br />\n
          The object of this standard is to establish standard test procedures for semiconductor charged particle detectors. These detectors are in widespread use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#7292
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @599353200 {#7318
      date: 1988-12-29 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#7316
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#7315
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#107012
  +product: App\Entity\Product\Product {#7309
    #id: 8452
    #code: "IEEE00000494"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751037428 {#7274
      date: 2025-06-27 17:17:08.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 28817
        #name: "IEEE 300:1988 (R2006)"
        #slug: "ieee-300-1988-r2006-ieee00000494-240104"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators) which may not be readily available.<br />\n
          Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1988<br />\n
          The object of this standard is to establish standard test procedures for semiconductor charged particle detectors. These detectors are in widespread use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#7292
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @599353200 {#7318
      date: 1988-12-29 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#7316
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#7315
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
    "Confirmed"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 292.0 MiB 0.98 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7309
    #id: 8452
    #code: "IEEE00000494"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751037428 {#7274
      date: 2025-06-27 17:17:08.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 28817
        #name: "IEEE 300:1988 (R2006)"
        #slug: "ieee-300-1988-r2006-ieee00000494-240104"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators) which may not be readily available.<br />\n
          Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1988<br />\n
          The object of this standard is to establish standard test procedures for semiconductor charged particle detectors. These detectors are in widespread use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#7292
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @599353200 {#7318
      date: 1988-12-29 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#7316
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#7315
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#107039
  +product: App\Entity\Product\Product {#7309
    #id: 8452
    #code: "IEEE00000494"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751037428 {#7274
      date: 2025-06-27 17:17:08.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 28817
        #name: "IEEE 300:1988 (R2006)"
        #slug: "ieee-300-1988-r2006-ieee00000494-240104"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators) which may not be readily available.<br />\n
          Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1988<br />\n
          The object of this standard is to establish standard test procedures for semiconductor charged particle detectors. These detectors are in widespread use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#7292
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @599353200 {#7318
      date: 1988-12-29 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#7316
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#7315
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 292.0 MiB 0.20 ms
Input props 
[
  "product" => App\Entity\Product\Product {#106828
    #id: 11628
    #code: "IEEE00006387"
    #attributes: Doctrine\ORM\PersistentCollection {#106804 …}
    #variants: Doctrine\ORM\PersistentCollection {#106801 …}
    #options: Doctrine\ORM\PersistentCollection {#106797 …}
    #associations: Doctrine\ORM\PersistentCollection {#106799 …}
    #createdAt: DateTime @1751039848 {#106787
      date: 2025-06-27 17:57:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608621 {#106833
      date: 2025-08-08 01:17:01.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106815 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107105
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106828}
        #id: 41521
        #name: "IEEE 300:1969"
        #slug: "ieee-300-1969-ieee00006387-243280"
        #description: """
           - Superseded.<br />\n
          Semiconductor radiation detectors have come into widespread use in recent years for detection and high-resolution spectroscopy of ionizing radiation. Both silicon and germanium detectors have been developed, with silicon finding its principal application in the detection and analysis of heavy charged particles. Germanium detectors with their relatively high atomic number (as compared with silicon) and with large sensitive volumes have come into widespread use in the detection and analysis of gamma radiation. The rapid development and utilization of these detectors have made desirable standard test procedures so that measurements may have the same meaning to all manufacturers and users.<br />\n
          This Test Procedure is not intended to imply that all tests described herein are mandatory, but only that such tests as are carried out on completed devices should be performed in accordance with the procedures given.<br />\n
          A companion document is &quot;Test Procedure for Amplifiers and Preamplifiers for Semiconductor Radiation<br />\n
          Detectors,&quot; IEEE Standards Publication No. 301.<br />\n
          \t\t\t\t<br />\n
          The definition of a semiconductor radiation detector herein will be: A semiconductor device that utilizes the production and motion of excess free charge carriers for the detection and measurement of incident radiation. Test procedures for the associated amplifiers and preamplifiers are described in &quot;USA Standard and IEEE Test Procedure for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors&quot; (USAS N42.2 and IEEE 301).
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106812 …}
    #channels: Doctrine\ORM\PersistentCollection {#106806 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106810 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106808 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106827 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106829
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106802
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @-34304400 {#106789
      date: 1968-11-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 14
    -documents: Doctrine\ORM\PersistentCollection {#106819 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106817 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#107120
  +product: App\Entity\Product\Product {#106828
    #id: 11628
    #code: "IEEE00006387"
    #attributes: Doctrine\ORM\PersistentCollection {#106804 …}
    #variants: Doctrine\ORM\PersistentCollection {#106801 …}
    #options: Doctrine\ORM\PersistentCollection {#106797 …}
    #associations: Doctrine\ORM\PersistentCollection {#106799 …}
    #createdAt: DateTime @1751039848 {#106787
      date: 2025-06-27 17:57:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608621 {#106833
      date: 2025-08-08 01:17:01.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106815 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107105
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106828}
        #id: 41521
        #name: "IEEE 300:1969"
        #slug: "ieee-300-1969-ieee00006387-243280"
        #description: """
           - Superseded.<br />\n
          Semiconductor radiation detectors have come into widespread use in recent years for detection and high-resolution spectroscopy of ionizing radiation. Both silicon and germanium detectors have been developed, with silicon finding its principal application in the detection and analysis of heavy charged particles. Germanium detectors with their relatively high atomic number (as compared with silicon) and with large sensitive volumes have come into widespread use in the detection and analysis of gamma radiation. The rapid development and utilization of these detectors have made desirable standard test procedures so that measurements may have the same meaning to all manufacturers and users.<br />\n
          This Test Procedure is not intended to imply that all tests described herein are mandatory, but only that such tests as are carried out on completed devices should be performed in accordance with the procedures given.<br />\n
          A companion document is &quot;Test Procedure for Amplifiers and Preamplifiers for Semiconductor Radiation<br />\n
          Detectors,&quot; IEEE Standards Publication No. 301.<br />\n
          \t\t\t\t<br />\n
          The definition of a semiconductor radiation detector herein will be: A semiconductor device that utilizes the production and motion of excess free charge carriers for the detection and measurement of incident radiation. Test procedures for the associated amplifiers and preamplifiers are described in &quot;USA Standard and IEEE Test Procedure for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors&quot; (USAS N42.2 and IEEE 301).
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106812 …}
    #channels: Doctrine\ORM\PersistentCollection {#106806 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106810 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106808 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106827 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106829
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106802
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @-34304400 {#106789
      date: 1968-11-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 14
    -documents: Doctrine\ORM\PersistentCollection {#106819 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106817 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 292.0 MiB 0.80 ms
Input props 
[
  "product" => App\Entity\Product\Product {#106828
    #id: 11628
    #code: "IEEE00006387"
    #attributes: Doctrine\ORM\PersistentCollection {#106804 …}
    #variants: Doctrine\ORM\PersistentCollection {#106801 …}
    #options: Doctrine\ORM\PersistentCollection {#106797 …}
    #associations: Doctrine\ORM\PersistentCollection {#106799 …}
    #createdAt: DateTime @1751039848 {#106787
      date: 2025-06-27 17:57:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608621 {#106833
      date: 2025-08-08 01:17:01.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106815 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107105
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106828}
        #id: 41521
        #name: "IEEE 300:1969"
        #slug: "ieee-300-1969-ieee00006387-243280"
        #description: """
           - Superseded.<br />\n
          Semiconductor radiation detectors have come into widespread use in recent years for detection and high-resolution spectroscopy of ionizing radiation. Both silicon and germanium detectors have been developed, with silicon finding its principal application in the detection and analysis of heavy charged particles. Germanium detectors with their relatively high atomic number (as compared with silicon) and with large sensitive volumes have come into widespread use in the detection and analysis of gamma radiation. The rapid development and utilization of these detectors have made desirable standard test procedures so that measurements may have the same meaning to all manufacturers and users.<br />\n
          This Test Procedure is not intended to imply that all tests described herein are mandatory, but only that such tests as are carried out on completed devices should be performed in accordance with the procedures given.<br />\n
          A companion document is &quot;Test Procedure for Amplifiers and Preamplifiers for Semiconductor Radiation<br />\n
          Detectors,&quot; IEEE Standards Publication No. 301.<br />\n
          \t\t\t\t<br />\n
          The definition of a semiconductor radiation detector herein will be: A semiconductor device that utilizes the production and motion of excess free charge carriers for the detection and measurement of incident radiation. Test procedures for the associated amplifiers and preamplifiers are described in &quot;USA Standard and IEEE Test Procedure for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors&quot; (USAS N42.2 and IEEE 301).
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106812 …}
    #channels: Doctrine\ORM\PersistentCollection {#106806 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106810 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106808 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106827 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106829
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106802
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @-34304400 {#106789
      date: 1968-11-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 14
    -documents: Doctrine\ORM\PersistentCollection {#106819 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106817 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#107172
  +product: App\Entity\Product\Product {#106828
    #id: 11628
    #code: "IEEE00006387"
    #attributes: Doctrine\ORM\PersistentCollection {#106804 …}
    #variants: Doctrine\ORM\PersistentCollection {#106801 …}
    #options: Doctrine\ORM\PersistentCollection {#106797 …}
    #associations: Doctrine\ORM\PersistentCollection {#106799 …}
    #createdAt: DateTime @1751039848 {#106787
      date: 2025-06-27 17:57:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608621 {#106833
      date: 2025-08-08 01:17:01.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106815 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107105
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106828}
        #id: 41521
        #name: "IEEE 300:1969"
        #slug: "ieee-300-1969-ieee00006387-243280"
        #description: """
           - Superseded.<br />\n
          Semiconductor radiation detectors have come into widespread use in recent years for detection and high-resolution spectroscopy of ionizing radiation. Both silicon and germanium detectors have been developed, with silicon finding its principal application in the detection and analysis of heavy charged particles. Germanium detectors with their relatively high atomic number (as compared with silicon) and with large sensitive volumes have come into widespread use in the detection and analysis of gamma radiation. The rapid development and utilization of these detectors have made desirable standard test procedures so that measurements may have the same meaning to all manufacturers and users.<br />\n
          This Test Procedure is not intended to imply that all tests described herein are mandatory, but only that such tests as are carried out on completed devices should be performed in accordance with the procedures given.<br />\n
          A companion document is &quot;Test Procedure for Amplifiers and Preamplifiers for Semiconductor Radiation<br />\n
          Detectors,&quot; IEEE Standards Publication No. 301.<br />\n
          \t\t\t\t<br />\n
          The definition of a semiconductor radiation detector herein will be: A semiconductor device that utilizes the production and motion of excess free charge carriers for the detection and measurement of incident radiation. Test procedures for the associated amplifiers and preamplifiers are described in &quot;USA Standard and IEEE Test Procedure for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors&quot; (USAS N42.2 and IEEE 301).
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106812 …}
    #channels: Doctrine\ORM\PersistentCollection {#106806 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106810 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106808 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106827 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106829
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106802
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @-34304400 {#106789
      date: 1968-11-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "300"
    -bookCollection: ""
    -pageCount: 14
    -documents: Doctrine\ORM\PersistentCollection {#106819 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106817 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductCard App\Twig\Components\ProductCard 292.0 MiB 6.72 ms
Input props 
[
  "product" => App\Entity\Product\Product {#128603
    #id: 8454
    #code: "IEEE00000496"
    #attributes: Doctrine\ORM\PersistentCollection {#128627 …}
    #variants: Doctrine\ORM\PersistentCollection {#128625 …}
    #options: Doctrine\ORM\PersistentCollection {#128620 …}
    #associations: Doctrine\ORM\PersistentCollection {#128622 …}
    #createdAt: DateTime @1751037429 {#128618
      date: 2025-06-27 17:17:09.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#128652
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128638 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128731
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128603}
        #id: 28825
        #name: "IEEE 301:1988 (R2006)"
        #slug: "ieee-301-1988-r2006-ieee00000496-240106"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Procedures are given for testing amplifier and preamplifier systems with linear pulse-shaping networks for use with semiconductor, scintillation, and proportional detectors in the spectroscopy of ionizing radiation. The object is to provide a common language and methodology for users and manufacturers of pulse-amplifier systems. The emphasis in the methods of measurement is to enhance sensitivity and improve accuracy by working around the limitations of the test instruments, particularly oscilloscopes that have only a visual display for readout. A technique is used where possible, thereby reducing basic errors to the inaccuracy of precision resistors.<br />\n
          \t\t\t\t<br />\n
          These test procedures cover amplifier and preamplifier systems with linear pulse-shaping networks for use with semiconductor, scintillation, and proportional detectors in the spectroscopy of ionizing radiation. The object is to provide a common language and methodology for users and manufacturers of pulse-amplifier systems.<br />\n
          This standard supersedes IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation. Test procedures for associated detectors are described in ANSI/IEEE Std 300-1988 and ANSI/IEEE Std 325-1986. IEEE Std 194-1977 is a companion document for pulse-shape terminology.<br />\n
          Not all of the tests described herein are mandatory, but those that are performed to determine preamplifier and amplifier specifications shall conform to this standard.<br />\n
          The emphasis on the methods of measurement is to enhance sensitivity and improve accuracy by working around the limitations of the test instruments, particularly oscilloscopes that have only a visual display for readout. A null technique is used where possible, thereby reducing basic errors to the inaccuracy of a pair of precision resistors. When use of a bridge is inappropriate, such as in measurements of pulse height with an oscilloscope, the pulse is made to occupy a fixed amplitude and vertical position on the face of the cathode-ray tube (CRT). Some measurements require test instruments or fixtures not commercially available at this writing; circuit diagrams for their construction are given in the Appendix. It is not acceptable to make use of a standard nuclear instrument module to test the performance of an amplifier unless the errors introduced by that module can be corrected for or shown to be less than the error caused by the amplifier. Examples are the use of a crossover-pickoff module to measure crossover walk in a bipolar amplifier, and an MCA to measure nonlinearity and noise.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Amplifiers and Preamplifiers used with Detectors of Ionizing Radiation"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128635 …}
    #channels: Doctrine\ORM\PersistentCollection {#128629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128633 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128631 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128644 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128604
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#128646
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @610754400 {#128653
      date: 1989-05-10 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#128611
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#128645
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "301"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#128642 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128640 …}
  }
  "layout" => "vertical"
  "showPrice" => true
  "showStatusBadges" => true
  "additionalClasses" => "product__teaser--with-grey-border"
  "hasStretchedLink" => true
  "hoverType" => "shadow"
  "linkLabel" => "See more"
]
Attributes 
[]
Component 
App\Twig\Components\ProductCard {#128684
  +product: App\Entity\Product\Product {#128603
    #id: 8454
    #code: "IEEE00000496"
    #attributes: Doctrine\ORM\PersistentCollection {#128627 …}
    #variants: Doctrine\ORM\PersistentCollection {#128625 …}
    #options: Doctrine\ORM\PersistentCollection {#128620 …}
    #associations: Doctrine\ORM\PersistentCollection {#128622 …}
    #createdAt: DateTime @1751037429 {#128618
      date: 2025-06-27 17:17:09.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#128652
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128638 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128731
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128603}
        #id: 28825
        #name: "IEEE 301:1988 (R2006)"
        #slug: "ieee-301-1988-r2006-ieee00000496-240106"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Procedures are given for testing amplifier and preamplifier systems with linear pulse-shaping networks for use with semiconductor, scintillation, and proportional detectors in the spectroscopy of ionizing radiation. The object is to provide a common language and methodology for users and manufacturers of pulse-amplifier systems. The emphasis in the methods of measurement is to enhance sensitivity and improve accuracy by working around the limitations of the test instruments, particularly oscilloscopes that have only a visual display for readout. A technique is used where possible, thereby reducing basic errors to the inaccuracy of precision resistors.<br />\n
          \t\t\t\t<br />\n
          These test procedures cover amplifier and preamplifier systems with linear pulse-shaping networks for use with semiconductor, scintillation, and proportional detectors in the spectroscopy of ionizing radiation. The object is to provide a common language and methodology for users and manufacturers of pulse-amplifier systems.<br />\n
          This standard supersedes IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation. Test procedures for associated detectors are described in ANSI/IEEE Std 300-1988 and ANSI/IEEE Std 325-1986. IEEE Std 194-1977 is a companion document for pulse-shape terminology.<br />\n
          Not all of the tests described herein are mandatory, but those that are performed to determine preamplifier and amplifier specifications shall conform to this standard.<br />\n
          The emphasis on the methods of measurement is to enhance sensitivity and improve accuracy by working around the limitations of the test instruments, particularly oscilloscopes that have only a visual display for readout. A null technique is used where possible, thereby reducing basic errors to the inaccuracy of a pair of precision resistors. When use of a bridge is inappropriate, such as in measurements of pulse height with an oscilloscope, the pulse is made to occupy a fixed amplitude and vertical position on the face of the cathode-ray tube (CRT). Some measurements require test instruments or fixtures not commercially available at this writing; circuit diagrams for their construction are given in the Appendix. It is not acceptable to make use of a standard nuclear instrument module to test the performance of an amplifier unless the errors introduced by that module can be corrected for or shown to be less than the error caused by the amplifier. Examples are the use of a crossover-pickoff module to measure crossover walk in a bipolar amplifier, and an MCA to measure nonlinearity and noise.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Amplifiers and Preamplifiers used with Detectors of Ionizing Radiation"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128635 …}
    #channels: Doctrine\ORM\PersistentCollection {#128629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128633 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128631 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128644 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128604
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#128646
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @610754400 {#128653
      date: 1989-05-10 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#128611
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#128645
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "301"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#128642 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128640 …}
  }
  +layout: "vertical"
  +showPrice: true
  +showStatusBadges: true
  +additionalClasses: "product__teaser--with-grey-border"
  +linkLabel: "See more"
  +imageFilter: "product_thumbnail_teaser"
  +hasStretchedLink: true
  +backgroundColor: "white"
  +hoverType: "shadow"
}
ProductState App\Twig\Components\ProductState 292.0 MiB 0.19 ms
Input props 
[
  "product" => App\Entity\Product\Product {#128603
    #id: 8454
    #code: "IEEE00000496"
    #attributes: Doctrine\ORM\PersistentCollection {#128627 …}
    #variants: Doctrine\ORM\PersistentCollection {#128625 …}
    #options: Doctrine\ORM\PersistentCollection {#128620 …}
    #associations: Doctrine\ORM\PersistentCollection {#128622 …}
    #createdAt: DateTime @1751037429 {#128618
      date: 2025-06-27 17:17:09.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#128652
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128638 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128731
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128603}
        #id: 28825
        #name: "IEEE 301:1988 (R2006)"
        #slug: "ieee-301-1988-r2006-ieee00000496-240106"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Procedures are given for testing amplifier and preamplifier systems with linear pulse-shaping networks for use with semiconductor, scintillation, and proportional detectors in the spectroscopy of ionizing radiation. The object is to provide a common language and methodology for users and manufacturers of pulse-amplifier systems. The emphasis in the methods of measurement is to enhance sensitivity and improve accuracy by working around the limitations of the test instruments, particularly oscilloscopes that have only a visual display for readout. A technique is used where possible, thereby reducing basic errors to the inaccuracy of precision resistors.<br />\n
          \t\t\t\t<br />\n
          These test procedures cover amplifier and preamplifier systems with linear pulse-shaping networks for use with semiconductor, scintillation, and proportional detectors in the spectroscopy of ionizing radiation. The object is to provide a common language and methodology for users and manufacturers of pulse-amplifier systems.<br />\n
          This standard supersedes IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation. Test procedures for associated detectors are described in ANSI/IEEE Std 300-1988 and ANSI/IEEE Std 325-1986. IEEE Std 194-1977 is a companion document for pulse-shape terminology.<br />\n
          Not all of the tests described herein are mandatory, but those that are performed to determine preamplifier and amplifier specifications shall conform to this standard.<br />\n
          The emphasis on the methods of measurement is to enhance sensitivity and improve accuracy by working around the limitations of the test instruments, particularly oscilloscopes that have only a visual display for readout. A null technique is used where possible, thereby reducing basic errors to the inaccuracy of a pair of precision resistors. When use of a bridge is inappropriate, such as in measurements of pulse height with an oscilloscope, the pulse is made to occupy a fixed amplitude and vertical position on the face of the cathode-ray tube (CRT). Some measurements require test instruments or fixtures not commercially available at this writing; circuit diagrams for their construction are given in the Appendix. It is not acceptable to make use of a standard nuclear instrument module to test the performance of an amplifier unless the errors introduced by that module can be corrected for or shown to be less than the error caused by the amplifier. Examples are the use of a crossover-pickoff module to measure crossover walk in a bipolar amplifier, and an MCA to measure nonlinearity and noise.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Amplifiers and Preamplifiers used with Detectors of Ionizing Radiation"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128635 …}
    #channels: Doctrine\ORM\PersistentCollection {#128629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128633 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128631 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128644 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128604
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#128646
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @610754400 {#128653
      date: 1989-05-10 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#128611
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#128645
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "301"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#128642 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128640 …}
  }
]
Attributes 
[
  "showFullLabel" => false
]
Component 
App\Twig\Components\ProductState {#128735
  +product: App\Entity\Product\Product {#128603
    #id: 8454
    #code: "IEEE00000496"
    #attributes: Doctrine\ORM\PersistentCollection {#128627 …}
    #variants: Doctrine\ORM\PersistentCollection {#128625 …}
    #options: Doctrine\ORM\PersistentCollection {#128620 …}
    #associations: Doctrine\ORM\PersistentCollection {#128622 …}
    #createdAt: DateTime @1751037429 {#128618
      date: 2025-06-27 17:17:09.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#128652
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128638 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128731
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128603}
        #id: 28825
        #name: "IEEE 301:1988 (R2006)"
        #slug: "ieee-301-1988-r2006-ieee00000496-240106"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Procedures are given for testing amplifier and preamplifier systems with linear pulse-shaping networks for use with semiconductor, scintillation, and proportional detectors in the spectroscopy of ionizing radiation. The object is to provide a common language and methodology for users and manufacturers of pulse-amplifier systems. The emphasis in the methods of measurement is to enhance sensitivity and improve accuracy by working around the limitations of the test instruments, particularly oscilloscopes that have only a visual display for readout. A technique is used where possible, thereby reducing basic errors to the inaccuracy of precision resistors.<br />\n
          \t\t\t\t<br />\n
          These test procedures cover amplifier and preamplifier systems with linear pulse-shaping networks for use with semiconductor, scintillation, and proportional detectors in the spectroscopy of ionizing radiation. The object is to provide a common language and methodology for users and manufacturers of pulse-amplifier systems.<br />\n
          This standard supersedes IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation. Test procedures for associated detectors are described in ANSI/IEEE Std 300-1988 and ANSI/IEEE Std 325-1986. IEEE Std 194-1977 is a companion document for pulse-shape terminology.<br />\n
          Not all of the tests described herein are mandatory, but those that are performed to determine preamplifier and amplifier specifications shall conform to this standard.<br />\n
          The emphasis on the methods of measurement is to enhance sensitivity and improve accuracy by working around the limitations of the test instruments, particularly oscilloscopes that have only a visual display for readout. A null technique is used where possible, thereby reducing basic errors to the inaccuracy of a pair of precision resistors. When use of a bridge is inappropriate, such as in measurements of pulse height with an oscilloscope, the pulse is made to occupy a fixed amplitude and vertical position on the face of the cathode-ray tube (CRT). Some measurements require test instruments or fixtures not commercially available at this writing; circuit diagrams for their construction are given in the Appendix. It is not acceptable to make use of a standard nuclear instrument module to test the performance of an amplifier unless the errors introduced by that module can be corrected for or shown to be less than the error caused by the amplifier. Examples are the use of a crossover-pickoff module to measure crossover walk in a bipolar amplifier, and an MCA to measure nonlinearity and noise.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Amplifiers and Preamplifiers used with Detectors of Ionizing Radiation"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128635 …}
    #channels: Doctrine\ORM\PersistentCollection {#128629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128633 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128631 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128644 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128604
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#128646
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @610754400 {#128653
      date: 1989-05-10 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#128611
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#128645
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "301"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#128642 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128640 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 292.0 MiB 0.68 ms
Input props 
[
  "product" => App\Entity\Product\Product {#128603
    #id: 8454
    #code: "IEEE00000496"
    #attributes: Doctrine\ORM\PersistentCollection {#128627 …}
    #variants: Doctrine\ORM\PersistentCollection {#128625 …}
    #options: Doctrine\ORM\PersistentCollection {#128620 …}
    #associations: Doctrine\ORM\PersistentCollection {#128622 …}
    #createdAt: DateTime @1751037429 {#128618
      date: 2025-06-27 17:17:09.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#128652
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128638 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128731
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128603}
        #id: 28825
        #name: "IEEE 301:1988 (R2006)"
        #slug: "ieee-301-1988-r2006-ieee00000496-240106"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Procedures are given for testing amplifier and preamplifier systems with linear pulse-shaping networks for use with semiconductor, scintillation, and proportional detectors in the spectroscopy of ionizing radiation. The object is to provide a common language and methodology for users and manufacturers of pulse-amplifier systems. The emphasis in the methods of measurement is to enhance sensitivity and improve accuracy by working around the limitations of the test instruments, particularly oscilloscopes that have only a visual display for readout. A technique is used where possible, thereby reducing basic errors to the inaccuracy of precision resistors.<br />\n
          \t\t\t\t<br />\n
          These test procedures cover amplifier and preamplifier systems with linear pulse-shaping networks for use with semiconductor, scintillation, and proportional detectors in the spectroscopy of ionizing radiation. The object is to provide a common language and methodology for users and manufacturers of pulse-amplifier systems.<br />\n
          This standard supersedes IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation. Test procedures for associated detectors are described in ANSI/IEEE Std 300-1988 and ANSI/IEEE Std 325-1986. IEEE Std 194-1977 is a companion document for pulse-shape terminology.<br />\n
          Not all of the tests described herein are mandatory, but those that are performed to determine preamplifier and amplifier specifications shall conform to this standard.<br />\n
          The emphasis on the methods of measurement is to enhance sensitivity and improve accuracy by working around the limitations of the test instruments, particularly oscilloscopes that have only a visual display for readout. A null technique is used where possible, thereby reducing basic errors to the inaccuracy of a pair of precision resistors. When use of a bridge is inappropriate, such as in measurements of pulse height with an oscilloscope, the pulse is made to occupy a fixed amplitude and vertical position on the face of the cathode-ray tube (CRT). Some measurements require test instruments or fixtures not commercially available at this writing; circuit diagrams for their construction are given in the Appendix. It is not acceptable to make use of a standard nuclear instrument module to test the performance of an amplifier unless the errors introduced by that module can be corrected for or shown to be less than the error caused by the amplifier. Examples are the use of a crossover-pickoff module to measure crossover walk in a bipolar amplifier, and an MCA to measure nonlinearity and noise.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Amplifiers and Preamplifiers used with Detectors of Ionizing Radiation"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128635 …}
    #channels: Doctrine\ORM\PersistentCollection {#128629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128633 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128631 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128644 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128604
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#128646
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @610754400 {#128653
      date: 1989-05-10 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#128611
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#128645
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "301"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#128642 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128640 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#128813
  +product: App\Entity\Product\Product {#128603
    #id: 8454
    #code: "IEEE00000496"
    #attributes: Doctrine\ORM\PersistentCollection {#128627 …}
    #variants: Doctrine\ORM\PersistentCollection {#128625 …}
    #options: Doctrine\ORM\PersistentCollection {#128620 …}
    #associations: Doctrine\ORM\PersistentCollection {#128622 …}
    #createdAt: DateTime @1751037429 {#128618
      date: 2025-06-27 17:17:09.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#128652
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128638 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128731
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128603}
        #id: 28825
        #name: "IEEE 301:1988 (R2006)"
        #slug: "ieee-301-1988-r2006-ieee00000496-240106"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Procedures are given for testing amplifier and preamplifier systems with linear pulse-shaping networks for use with semiconductor, scintillation, and proportional detectors in the spectroscopy of ionizing radiation. The object is to provide a common language and methodology for users and manufacturers of pulse-amplifier systems. The emphasis in the methods of measurement is to enhance sensitivity and improve accuracy by working around the limitations of the test instruments, particularly oscilloscopes that have only a visual display for readout. A technique is used where possible, thereby reducing basic errors to the inaccuracy of precision resistors.<br />\n
          \t\t\t\t<br />\n
          These test procedures cover amplifier and preamplifier systems with linear pulse-shaping networks for use with semiconductor, scintillation, and proportional detectors in the spectroscopy of ionizing radiation. The object is to provide a common language and methodology for users and manufacturers of pulse-amplifier systems.<br />\n
          This standard supersedes IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation. Test procedures for associated detectors are described in ANSI/IEEE Std 300-1988 and ANSI/IEEE Std 325-1986. IEEE Std 194-1977 is a companion document for pulse-shape terminology.<br />\n
          Not all of the tests described herein are mandatory, but those that are performed to determine preamplifier and amplifier specifications shall conform to this standard.<br />\n
          The emphasis on the methods of measurement is to enhance sensitivity and improve accuracy by working around the limitations of the test instruments, particularly oscilloscopes that have only a visual display for readout. A null technique is used where possible, thereby reducing basic errors to the inaccuracy of a pair of precision resistors. When use of a bridge is inappropriate, such as in measurements of pulse height with an oscilloscope, the pulse is made to occupy a fixed amplitude and vertical position on the face of the cathode-ray tube (CRT). Some measurements require test instruments or fixtures not commercially available at this writing; circuit diagrams for their construction are given in the Appendix. It is not acceptable to make use of a standard nuclear instrument module to test the performance of an amplifier unless the errors introduced by that module can be corrected for or shown to be less than the error caused by the amplifier. Examples are the use of a crossover-pickoff module to measure crossover walk in a bipolar amplifier, and an MCA to measure nonlinearity and noise.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Procedures for Amplifiers and Preamplifiers used with Detectors of Ionizing Radiation"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128635 …}
    #channels: Doctrine\ORM\PersistentCollection {#128629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128633 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128631 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128644 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128604
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#128646
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @610754400 {#128653
      date: 1989-05-10 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1143669600 {#128611
      date: 2006-03-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1573081200 {#128645
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "301"
    -bookCollection: ""
    -pageCount: 125
    -documents: Doctrine\ORM\PersistentCollection {#128642 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128640 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}