GET https://dev.normadoc.fr/_fragment?_path=_format%3Dhtml%26_locale%3Den_US%26_controller%3DSylius%255CPayPalPlugin%255CController%255CPayPalButtonsController%253A…

Response
200 OK
IP
216.73.216.149
Profiled on
Token
bcfa6a

Components

3 Twig Components
15 Render Count
10 ms Render Time
506.0 MiB Memory Usage

Components

Name Metadata Render Count Render Time
ProductState 
"App\Twig\Components\ProductState"
components/ProductState.html.twig 		7 2.32ms
ProductMostRecent 
"App\Twig\Components\ProductMostRecent"
components/ProductMostRecent.html.twig 		7 6.72ms
ProductType 
"App\Twig\Components\ProductType"
components/ProductType.html.twig 		1 0.63ms

Render calls

ProductState App\Twig\Components\ProductState 506.0 MiB 1.09 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7310
    #id: 8257
    #code: "IEEE00000161"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751037264 {#7274
      date: 2025-06-27 17:14:24.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 28037
        #name: "IEEE 4:1978"
        #slug: "ieee-4-1978-ieee00000161-239909"
        #description: """
          Revision Standard - Superseded.<br />\n
          Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n
          \t\t\t\t<br />\n
          This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Techniques for High Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#7292
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @249692400 {#7318
      date: 1977-11-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 127
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#92890
  +product: App\Entity\Product\Product {#7310
    #id: 8257
    #code: "IEEE00000161"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751037264 {#7274
      date: 2025-06-27 17:14:24.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 28037
        #name: "IEEE 4:1978"
        #slug: "ieee-4-1978-ieee00000161-239909"
        #description: """
          Revision Standard - Superseded.<br />\n
          Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n
          \t\t\t\t<br />\n
          This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Techniques for High Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#7292
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @249692400 {#7318
      date: 1977-11-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 127
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductType App\Twig\Components\ProductType 506.0 MiB 0.63 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7310
    #id: 8257
    #code: "IEEE00000161"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751037264 {#7274
      date: 2025-06-27 17:14:24.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 28037
        #name: "IEEE 4:1978"
        #slug: "ieee-4-1978-ieee00000161-239909"
        #description: """
          Revision Standard - Superseded.<br />\n
          Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n
          \t\t\t\t<br />\n
          This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Techniques for High Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#7292
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @249692400 {#7318
      date: 1977-11-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 127
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductType {#93070
  +product: App\Entity\Product\Product {#7310
    #id: 8257
    #code: "IEEE00000161"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751037264 {#7274
      date: 2025-06-27 17:14:24.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 28037
        #name: "IEEE 4:1978"
        #slug: "ieee-4-1978-ieee00000161-239909"
        #description: """
          Revision Standard - Superseded.<br />\n
          Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n
          \t\t\t\t<br />\n
          This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Techniques for High Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#7292
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @249692400 {#7318
      date: 1977-11-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 127
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +label: "Standard"
  -typeAttributeCode: "type"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 506.0 MiB 2.06 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7310
    #id: 8257
    #code: "IEEE00000161"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751037264 {#7274
      date: 2025-06-27 17:14:24.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 28037
        #name: "IEEE 4:1978"
        #slug: "ieee-4-1978-ieee00000161-239909"
        #description: """
          Revision Standard - Superseded.<br />\n
          Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n
          \t\t\t\t<br />\n
          This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Techniques for High Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#7292
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @249692400 {#7318
      date: 1977-11-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 127
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#93137
  +product: App\Entity\Product\Product {#7310
    #id: 8257
    #code: "IEEE00000161"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751037264 {#7274
      date: 2025-06-27 17:14:24.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 28037
        #name: "IEEE 4:1978"
        #slug: "ieee-4-1978-ieee00000161-239909"
        #description: """
          Revision Standard - Superseded.<br />\n
          Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n
          \t\t\t\t<br />\n
          This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Techniques for High Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#7292
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @249692400 {#7318
      date: 1977-11-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 127
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 506.0 MiB 0.22 ms
Input props 
[
  "product" => App\Entity\Product\Product {#93547
    #id: 10659
    #code: "IEEE00004777"
    #attributes: Doctrine\ORM\PersistentCollection {#93527 …}
    #variants: Doctrine\ORM\PersistentCollection {#93524 …}
    #options: Doctrine\ORM\PersistentCollection {#93520 …}
    #associations: Doctrine\ORM\PersistentCollection {#93516 …}
    #createdAt: DateTime @1751039202 {#93554
      date: 2025-06-27 17:46:42.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#93533
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93538 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93579
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93547}
        #id: 37645
        #name: "IEEE 4:2013"
        #slug: "ieee-4-2013-ieee00004777-242311"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Standard methods and basic techniques for high-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating voltage, direct voltage, and impulse testing are combined in this revision to organize the technical content for ease of use. In addition, the concept of measurement uncertainty in evaluation of high-voltage and high-current tests is introduced in this version.<br />\n
          \t\t\t\t<br />\n
          This standard is applicable to - Dielectric tests with direct voltages - Dielectric tests with alternating voltages - Dielectric tests with impulse voltages - Tests with impulse currents - Tests with combinations of the above - Capacitance and dielectric loss measurements This standard is applicable only to tests on equipment with a rated voltage above 1000 V. Procedures are given for applying correction factors to convert test data to standard atmospheric conditions. This standard also specifies procedures for testing equipment when external insulation of the test object is to be subjected to dry, wet, or contaminated conditions.<br />\n
          The purpose of this standard is to<br />\n
          - Define terms of general applicability<br />\n
          - Present general requirements regarding test equipment and procedures<br />\n
          - Describe methods for evaluation of test results
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for High-Voltage Testing Techniques"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93536 …}
    #channels: Doctrine\ORM\PersistentCollection {#93529 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93534 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93531 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93544 …}
    -apiLastModifiedAt: DateTime @1754517600 {#93517
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712786400 {#93553
      date: 2024-04-11 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1368136800 {#93552
      date: 2013-05-10 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#93546
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 213
    -documents: Doctrine\ORM\PersistentCollection {#93542 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93540 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#106819
  +product: App\Entity\Product\Product {#93547
    #id: 10659
    #code: "IEEE00004777"
    #attributes: Doctrine\ORM\PersistentCollection {#93527 …}
    #variants: Doctrine\ORM\PersistentCollection {#93524 …}
    #options: Doctrine\ORM\PersistentCollection {#93520 …}
    #associations: Doctrine\ORM\PersistentCollection {#93516 …}
    #createdAt: DateTime @1751039202 {#93554
      date: 2025-06-27 17:46:42.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#93533
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93538 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93579
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93547}
        #id: 37645
        #name: "IEEE 4:2013"
        #slug: "ieee-4-2013-ieee00004777-242311"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Standard methods and basic techniques for high-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating voltage, direct voltage, and impulse testing are combined in this revision to organize the technical content for ease of use. In addition, the concept of measurement uncertainty in evaluation of high-voltage and high-current tests is introduced in this version.<br />\n
          \t\t\t\t<br />\n
          This standard is applicable to - Dielectric tests with direct voltages - Dielectric tests with alternating voltages - Dielectric tests with impulse voltages - Tests with impulse currents - Tests with combinations of the above - Capacitance and dielectric loss measurements This standard is applicable only to tests on equipment with a rated voltage above 1000 V. Procedures are given for applying correction factors to convert test data to standard atmospheric conditions. This standard also specifies procedures for testing equipment when external insulation of the test object is to be subjected to dry, wet, or contaminated conditions.<br />\n
          The purpose of this standard is to<br />\n
          - Define terms of general applicability<br />\n
          - Present general requirements regarding test equipment and procedures<br />\n
          - Describe methods for evaluation of test results
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for High-Voltage Testing Techniques"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93536 …}
    #channels: Doctrine\ORM\PersistentCollection {#93529 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93534 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93531 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93544 …}
    -apiLastModifiedAt: DateTime @1754517600 {#93517
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712786400 {#93553
      date: 2024-04-11 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1368136800 {#93552
      date: 2013-05-10 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#93546
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 213
    -documents: Doctrine\ORM\PersistentCollection {#93542 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93540 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 506.0 MiB 0.76 ms
Input props 
[
  "product" => App\Entity\Product\Product {#93547
    #id: 10659
    #code: "IEEE00004777"
    #attributes: Doctrine\ORM\PersistentCollection {#93527 …}
    #variants: Doctrine\ORM\PersistentCollection {#93524 …}
    #options: Doctrine\ORM\PersistentCollection {#93520 …}
    #associations: Doctrine\ORM\PersistentCollection {#93516 …}
    #createdAt: DateTime @1751039202 {#93554
      date: 2025-06-27 17:46:42.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#93533
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93538 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93579
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93547}
        #id: 37645
        #name: "IEEE 4:2013"
        #slug: "ieee-4-2013-ieee00004777-242311"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Standard methods and basic techniques for high-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating voltage, direct voltage, and impulse testing are combined in this revision to organize the technical content for ease of use. In addition, the concept of measurement uncertainty in evaluation of high-voltage and high-current tests is introduced in this version.<br />\n
          \t\t\t\t<br />\n
          This standard is applicable to - Dielectric tests with direct voltages - Dielectric tests with alternating voltages - Dielectric tests with impulse voltages - Tests with impulse currents - Tests with combinations of the above - Capacitance and dielectric loss measurements This standard is applicable only to tests on equipment with a rated voltage above 1000 V. Procedures are given for applying correction factors to convert test data to standard atmospheric conditions. This standard also specifies procedures for testing equipment when external insulation of the test object is to be subjected to dry, wet, or contaminated conditions.<br />\n
          The purpose of this standard is to<br />\n
          - Define terms of general applicability<br />\n
          - Present general requirements regarding test equipment and procedures<br />\n
          - Describe methods for evaluation of test results
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for High-Voltage Testing Techniques"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93536 …}
    #channels: Doctrine\ORM\PersistentCollection {#93529 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93534 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93531 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93544 …}
    -apiLastModifiedAt: DateTime @1754517600 {#93517
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712786400 {#93553
      date: 2024-04-11 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1368136800 {#93552
      date: 2013-05-10 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#93546
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 213
    -documents: Doctrine\ORM\PersistentCollection {#93542 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93540 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#106886
  +product: App\Entity\Product\Product {#93547
    #id: 10659
    #code: "IEEE00004777"
    #attributes: Doctrine\ORM\PersistentCollection {#93527 …}
    #variants: Doctrine\ORM\PersistentCollection {#93524 …}
    #options: Doctrine\ORM\PersistentCollection {#93520 …}
    #associations: Doctrine\ORM\PersistentCollection {#93516 …}
    #createdAt: DateTime @1751039202 {#93554
      date: 2025-06-27 17:46:42.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#93533
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93538 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93579
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93547}
        #id: 37645
        #name: "IEEE 4:2013"
        #slug: "ieee-4-2013-ieee00004777-242311"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Standard methods and basic techniques for high-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating voltage, direct voltage, and impulse testing are combined in this revision to organize the technical content for ease of use. In addition, the concept of measurement uncertainty in evaluation of high-voltage and high-current tests is introduced in this version.<br />\n
          \t\t\t\t<br />\n
          This standard is applicable to - Dielectric tests with direct voltages - Dielectric tests with alternating voltages - Dielectric tests with impulse voltages - Tests with impulse currents - Tests with combinations of the above - Capacitance and dielectric loss measurements This standard is applicable only to tests on equipment with a rated voltage above 1000 V. Procedures are given for applying correction factors to convert test data to standard atmospheric conditions. This standard also specifies procedures for testing equipment when external insulation of the test object is to be subjected to dry, wet, or contaminated conditions.<br />\n
          The purpose of this standard is to<br />\n
          - Define terms of general applicability<br />\n
          - Present general requirements regarding test equipment and procedures<br />\n
          - Describe methods for evaluation of test results
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for High-Voltage Testing Techniques"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93536 …}
    #channels: Doctrine\ORM\PersistentCollection {#93529 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93534 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93531 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93544 …}
    -apiLastModifiedAt: DateTime @1754517600 {#93517
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712786400 {#93553
      date: 2024-04-11 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1368136800 {#93552
      date: 2013-05-10 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#93546
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 213
    -documents: Doctrine\ORM\PersistentCollection {#93542 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93540 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 506.0 MiB 0.19 ms
Input props 
[
  "product" => App\Entity\Product\Product {#106625
    #id: 8259
    #code: "IEEE00000164"
    #attributes: Doctrine\ORM\PersistentCollection {#106642 …}
    #variants: Doctrine\ORM\PersistentCollection {#106639 …}
    #options: Doctrine\ORM\PersistentCollection {#106635 …}
    #associations: Doctrine\ORM\PersistentCollection {#106637 …}
    #createdAt: DateTime @1751037266 {#106666
      date: 2025-06-27 17:14:26.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#106627
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106653 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106953
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106625}
        #id: 28045
        #name: "IEEE 4a:2001"
        #slug: "ieee-4a-2001-ieee00000164-239911"
        #description: """
          Amendment Standard - Superseded.<br />\n
          This amendment sets forth a number of clarifications and corrections to IEEE Standard Techniques for High-Voltage Testing.<br />\n
          \t\t\t\t<br />\n
          This amendment is applicable to dielectric tests with alternating voltages and impulse voltages, when testing an apparatus with air gaps up to 1 meter in length. It specifies correction factors for air density and humidity, which may be applied when the specific apparatus standard allows. This amendment is to be applied in conjunction with IEEE Std 4-1995, IEEE Standard Techniques for High-Voltage Testing. The paragraph numbering beginning at 1.3.5, equations, and figure numbers are as they were in IEEE Std 4-1978. Thus a reference to this amendment for a specific clause, etc., will be the same as in the original standard.<br />\n
          This amendment adds the air density and humidity correction factors of the 1978 version of IEEE Std 4 to be used with the standardized rod-gap data when testing apparatus with air gaps up to 1 meter in length. Dielectric test voltage atmospheric correction factors The atmospheric correction factors listed in 1.3.5 may be applied for gap spacing up to 1 meter in length to the standardized rod-rod gap sparkover data for impulse test voltages found in 17.7, Table 11 of IEEE Std 4-1995.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "Amendment to IEEE Standard Techniques for High-Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106650 …}
    #channels: Doctrine\ORM\PersistentCollection {#106644 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106648 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106660 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106640
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#106667
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @985129200 {#106671
      date: 2001-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 12
    -documents: Doctrine\ORM\PersistentCollection {#106657 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106655 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#106968
  +product: App\Entity\Product\Product {#106625
    #id: 8259
    #code: "IEEE00000164"
    #attributes: Doctrine\ORM\PersistentCollection {#106642 …}
    #variants: Doctrine\ORM\PersistentCollection {#106639 …}
    #options: Doctrine\ORM\PersistentCollection {#106635 …}
    #associations: Doctrine\ORM\PersistentCollection {#106637 …}
    #createdAt: DateTime @1751037266 {#106666
      date: 2025-06-27 17:14:26.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#106627
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106653 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106953
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106625}
        #id: 28045
        #name: "IEEE 4a:2001"
        #slug: "ieee-4a-2001-ieee00000164-239911"
        #description: """
          Amendment Standard - Superseded.<br />\n
          This amendment sets forth a number of clarifications and corrections to IEEE Standard Techniques for High-Voltage Testing.<br />\n
          \t\t\t\t<br />\n
          This amendment is applicable to dielectric tests with alternating voltages and impulse voltages, when testing an apparatus with air gaps up to 1 meter in length. It specifies correction factors for air density and humidity, which may be applied when the specific apparatus standard allows. This amendment is to be applied in conjunction with IEEE Std 4-1995, IEEE Standard Techniques for High-Voltage Testing. The paragraph numbering beginning at 1.3.5, equations, and figure numbers are as they were in IEEE Std 4-1978. Thus a reference to this amendment for a specific clause, etc., will be the same as in the original standard.<br />\n
          This amendment adds the air density and humidity correction factors of the 1978 version of IEEE Std 4 to be used with the standardized rod-gap data when testing apparatus with air gaps up to 1 meter in length. Dielectric test voltage atmospheric correction factors The atmospheric correction factors listed in 1.3.5 may be applied for gap spacing up to 1 meter in length to the standardized rod-rod gap sparkover data for impulse test voltages found in 17.7, Table 11 of IEEE Std 4-1995.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "Amendment to IEEE Standard Techniques for High-Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106650 …}
    #channels: Doctrine\ORM\PersistentCollection {#106644 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106648 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106660 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106640
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#106667
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @985129200 {#106671
      date: 2001-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 12
    -documents: Doctrine\ORM\PersistentCollection {#106657 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106655 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 506.0 MiB 0.80 ms
Input props 
[
  "product" => App\Entity\Product\Product {#106625
    #id: 8259
    #code: "IEEE00000164"
    #attributes: Doctrine\ORM\PersistentCollection {#106642 …}
    #variants: Doctrine\ORM\PersistentCollection {#106639 …}
    #options: Doctrine\ORM\PersistentCollection {#106635 …}
    #associations: Doctrine\ORM\PersistentCollection {#106637 …}
    #createdAt: DateTime @1751037266 {#106666
      date: 2025-06-27 17:14:26.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#106627
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106653 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106953
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106625}
        #id: 28045
        #name: "IEEE 4a:2001"
        #slug: "ieee-4a-2001-ieee00000164-239911"
        #description: """
          Amendment Standard - Superseded.<br />\n
          This amendment sets forth a number of clarifications and corrections to IEEE Standard Techniques for High-Voltage Testing.<br />\n
          \t\t\t\t<br />\n
          This amendment is applicable to dielectric tests with alternating voltages and impulse voltages, when testing an apparatus with air gaps up to 1 meter in length. It specifies correction factors for air density and humidity, which may be applied when the specific apparatus standard allows. This amendment is to be applied in conjunction with IEEE Std 4-1995, IEEE Standard Techniques for High-Voltage Testing. The paragraph numbering beginning at 1.3.5, equations, and figure numbers are as they were in IEEE Std 4-1978. Thus a reference to this amendment for a specific clause, etc., will be the same as in the original standard.<br />\n
          This amendment adds the air density and humidity correction factors of the 1978 version of IEEE Std 4 to be used with the standardized rod-gap data when testing apparatus with air gaps up to 1 meter in length. Dielectric test voltage atmospheric correction factors The atmospheric correction factors listed in 1.3.5 may be applied for gap spacing up to 1 meter in length to the standardized rod-rod gap sparkover data for impulse test voltages found in 17.7, Table 11 of IEEE Std 4-1995.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "Amendment to IEEE Standard Techniques for High-Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106650 …}
    #channels: Doctrine\ORM\PersistentCollection {#106644 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106648 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106660 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106640
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#106667
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @985129200 {#106671
      date: 2001-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 12
    -documents: Doctrine\ORM\PersistentCollection {#106657 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106655 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#107019
  +product: App\Entity\Product\Product {#106625
    #id: 8259
    #code: "IEEE00000164"
    #attributes: Doctrine\ORM\PersistentCollection {#106642 …}
    #variants: Doctrine\ORM\PersistentCollection {#106639 …}
    #options: Doctrine\ORM\PersistentCollection {#106635 …}
    #associations: Doctrine\ORM\PersistentCollection {#106637 …}
    #createdAt: DateTime @1751037266 {#106666
      date: 2025-06-27 17:14:26.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#106627
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106653 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106953
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106625}
        #id: 28045
        #name: "IEEE 4a:2001"
        #slug: "ieee-4a-2001-ieee00000164-239911"
        #description: """
          Amendment Standard - Superseded.<br />\n
          This amendment sets forth a number of clarifications and corrections to IEEE Standard Techniques for High-Voltage Testing.<br />\n
          \t\t\t\t<br />\n
          This amendment is applicable to dielectric tests with alternating voltages and impulse voltages, when testing an apparatus with air gaps up to 1 meter in length. It specifies correction factors for air density and humidity, which may be applied when the specific apparatus standard allows. This amendment is to be applied in conjunction with IEEE Std 4-1995, IEEE Standard Techniques for High-Voltage Testing. The paragraph numbering beginning at 1.3.5, equations, and figure numbers are as they were in IEEE Std 4-1978. Thus a reference to this amendment for a specific clause, etc., will be the same as in the original standard.<br />\n
          This amendment adds the air density and humidity correction factors of the 1978 version of IEEE Std 4 to be used with the standardized rod-gap data when testing apparatus with air gaps up to 1 meter in length. Dielectric test voltage atmospheric correction factors The atmospheric correction factors listed in 1.3.5 may be applied for gap spacing up to 1 meter in length to the standardized rod-rod gap sparkover data for impulse test voltages found in 17.7, Table 11 of IEEE Std 4-1995.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "Amendment to IEEE Standard Techniques for High-Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106650 …}
    #channels: Doctrine\ORM\PersistentCollection {#106644 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106648 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106660 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106640
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#106667
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @985129200 {#106671
      date: 2001-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 12
    -documents: Doctrine\ORM\PersistentCollection {#106657 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106655 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 506.0 MiB 0.21 ms
Input props 
[
  "product" => App\Entity\Product\Product {#106628
    #id: 8258
    #code: "IEEE00000162"
    #attributes: Doctrine\ORM\PersistentCollection {#106694 …}
    #variants: Doctrine\ORM\PersistentCollection {#106686 …}
    #options: Doctrine\ORM\PersistentCollection {#106691 …}
    #associations: Doctrine\ORM\PersistentCollection {#106692 …}
    #createdAt: DateTime @1751037265 {#106632
      date: 2025-06-27 17:14:25.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#106631
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106709 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107085
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106628}
        #id: 28041
        #name: "IEEE 4:1995"
        #slug: "ieee-4-1995-ieee00000162-239910"
        #description: """
          Revision Standard - Superseded.<br />\n
          This standard establishes standard methods to measure high-voltage and basic testing techniques, so far as they are generally applicable, to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltags, switching impulse voltages, and impulse currents. This revision implements many new procedures to improve accuracy, provide greater flexibility, and address practical problems associated with high-voltage measurements.<br />\n
          \t\t\t\t<br />\n
          Defines test procedures, equipment requirements and analysis aids for testing hardware and apparatus used for electric power distribution, by all electric utilities.<br />\n
          To define terms of general applicability; to present general requirements regarding test objects and test procedure.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Techniques for High-Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106704 …}
    #channels: Doctrine\ORM\PersistentCollection {#106700 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106695 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106701 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106702 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106630
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#106629
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @813452400 {#106623
      date: 1995-10-12 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 135
    -documents: Doctrine\ORM\PersistentCollection {#106689 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106670 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#107100
  +product: App\Entity\Product\Product {#106628
    #id: 8258
    #code: "IEEE00000162"
    #attributes: Doctrine\ORM\PersistentCollection {#106694 …}
    #variants: Doctrine\ORM\PersistentCollection {#106686 …}
    #options: Doctrine\ORM\PersistentCollection {#106691 …}
    #associations: Doctrine\ORM\PersistentCollection {#106692 …}
    #createdAt: DateTime @1751037265 {#106632
      date: 2025-06-27 17:14:25.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#106631
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106709 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107085
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106628}
        #id: 28041
        #name: "IEEE 4:1995"
        #slug: "ieee-4-1995-ieee00000162-239910"
        #description: """
          Revision Standard - Superseded.<br />\n
          This standard establishes standard methods to measure high-voltage and basic testing techniques, so far as they are generally applicable, to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltags, switching impulse voltages, and impulse currents. This revision implements many new procedures to improve accuracy, provide greater flexibility, and address practical problems associated with high-voltage measurements.<br />\n
          \t\t\t\t<br />\n
          Defines test procedures, equipment requirements and analysis aids for testing hardware and apparatus used for electric power distribution, by all electric utilities.<br />\n
          To define terms of general applicability; to present general requirements regarding test objects and test procedure.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Techniques for High-Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106704 …}
    #channels: Doctrine\ORM\PersistentCollection {#106700 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106695 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106701 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106702 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106630
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#106629
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @813452400 {#106623
      date: 1995-10-12 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 135
    -documents: Doctrine\ORM\PersistentCollection {#106689 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106670 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 506.0 MiB 0.78 ms
Input props 
[
  "product" => App\Entity\Product\Product {#106628
    #id: 8258
    #code: "IEEE00000162"
    #attributes: Doctrine\ORM\PersistentCollection {#106694 …}
    #variants: Doctrine\ORM\PersistentCollection {#106686 …}
    #options: Doctrine\ORM\PersistentCollection {#106691 …}
    #associations: Doctrine\ORM\PersistentCollection {#106692 …}
    #createdAt: DateTime @1751037265 {#106632
      date: 2025-06-27 17:14:25.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#106631
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106709 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107085
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106628}
        #id: 28041
        #name: "IEEE 4:1995"
        #slug: "ieee-4-1995-ieee00000162-239910"
        #description: """
          Revision Standard - Superseded.<br />\n
          This standard establishes standard methods to measure high-voltage and basic testing techniques, so far as they are generally applicable, to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltags, switching impulse voltages, and impulse currents. This revision implements many new procedures to improve accuracy, provide greater flexibility, and address practical problems associated with high-voltage measurements.<br />\n
          \t\t\t\t<br />\n
          Defines test procedures, equipment requirements and analysis aids for testing hardware and apparatus used for electric power distribution, by all electric utilities.<br />\n
          To define terms of general applicability; to present general requirements regarding test objects and test procedure.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Techniques for High-Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106704 …}
    #channels: Doctrine\ORM\PersistentCollection {#106700 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106695 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106701 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106702 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106630
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#106629
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @813452400 {#106623
      date: 1995-10-12 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 135
    -documents: Doctrine\ORM\PersistentCollection {#106689 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106670 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#107152
  +product: App\Entity\Product\Product {#106628
    #id: 8258
    #code: "IEEE00000162"
    #attributes: Doctrine\ORM\PersistentCollection {#106694 …}
    #variants: Doctrine\ORM\PersistentCollection {#106686 …}
    #options: Doctrine\ORM\PersistentCollection {#106691 …}
    #associations: Doctrine\ORM\PersistentCollection {#106692 …}
    #createdAt: DateTime @1751037265 {#106632
      date: 2025-06-27 17:14:25.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#106631
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106709 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107085
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106628}
        #id: 28041
        #name: "IEEE 4:1995"
        #slug: "ieee-4-1995-ieee00000162-239910"
        #description: """
          Revision Standard - Superseded.<br />\n
          This standard establishes standard methods to measure high-voltage and basic testing techniques, so far as they are generally applicable, to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltags, switching impulse voltages, and impulse currents. This revision implements many new procedures to improve accuracy, provide greater flexibility, and address practical problems associated with high-voltage measurements.<br />\n
          \t\t\t\t<br />\n
          Defines test procedures, equipment requirements and analysis aids for testing hardware and apparatus used for electric power distribution, by all electric utilities.<br />\n
          To define terms of general applicability; to present general requirements regarding test objects and test procedure.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Techniques for High-Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106704 …}
    #channels: Doctrine\ORM\PersistentCollection {#106700 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106695 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106701 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106702 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106630
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#106629
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @813452400 {#106623
      date: 1995-10-12 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 135
    -documents: Doctrine\ORM\PersistentCollection {#106689 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106670 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 506.0 MiB 0.20 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7310
    #id: 8257
    #code: "IEEE00000161"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751037264 {#7274
      date: 2025-06-27 17:14:24.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 28037
        #name: "IEEE 4:1978"
        #slug: "ieee-4-1978-ieee00000161-239909"
        #description: """
          Revision Standard - Superseded.<br />\n
          Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n
          \t\t\t\t<br />\n
          This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Techniques for High Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#7292
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @249692400 {#7318
      date: 1977-11-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 127
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#107216
  +product: App\Entity\Product\Product {#7310
    #id: 8257
    #code: "IEEE00000161"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751037264 {#7274
      date: 2025-06-27 17:14:24.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 28037
        #name: "IEEE 4:1978"
        #slug: "ieee-4-1978-ieee00000161-239909"
        #description: """
          Revision Standard - Superseded.<br />\n
          Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n
          \t\t\t\t<br />\n
          This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Techniques for High Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#7292
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @249692400 {#7318
      date: 1977-11-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 127
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 506.0 MiB 0.76 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7310
    #id: 8257
    #code: "IEEE00000161"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751037264 {#7274
      date: 2025-06-27 17:14:24.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 28037
        #name: "IEEE 4:1978"
        #slug: "ieee-4-1978-ieee00000161-239909"
        #description: """
          Revision Standard - Superseded.<br />\n
          Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n
          \t\t\t\t<br />\n
          This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Techniques for High Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#7292
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @249692400 {#7318
      date: 1977-11-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 127
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#107243
  +product: App\Entity\Product\Product {#7310
    #id: 8257
    #code: "IEEE00000161"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751037264 {#7274
      date: 2025-06-27 17:14:24.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7322
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 28037
        #name: "IEEE 4:1978"
        #slug: "ieee-4-1978-ieee00000161-239909"
        #description: """
          Revision Standard - Superseded.<br />\n
          Standard methods of measurement of high voltage and basic techniques for dielectrics, so far as they are generally applicable to all types of apparatus, for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established. General definitions and test requirements are provided, and test procedures and measuring devices are described. A measuring devices application guide and recommendations for voltage measurements by means of sphere gaps are included. The contents are based on and adhere very closely to IEC high- voltage test techniques documents.<br />\n
          \t\t\t\t<br />\n
          This standard is applicable to : (1) dielectric tests with direct voltage; (2) dielectic tests with alternating voltage; (3) dielectric tests with lightning and switching impulse voltages; (4) tests with impulse current. The objectives of this standard are: (1)to define terms of general applicability; (2) to present general requirements regarding test objects and test procedures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Techniques for High Voltage Testing"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1704927600 {#7292
      date: 2024-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @249692400 {#7318
      date: 1977-11-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 127
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 506.0 MiB 0.21 ms
Input props 
[
  "product" => App\Entity\Product\Product {#106681
    #id: 11678
    #code: "IEEE00006438"
    #attributes: Doctrine\ORM\PersistentCollection {#106720 …}
    #variants: Doctrine\ORM\PersistentCollection {#106722 …}
    #options: Doctrine\ORM\PersistentCollection {#106726 …}
    #associations: Doctrine\ORM\PersistentCollection {#106724 …}
    #createdAt: DateTime @1751039890 {#106677
      date: 2025-06-27 17:58:10.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608621 {#106684
      date: 2025-08-08 01:17:01.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106706 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107309
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106681}
        #id: 41721
        #name: "IEEE/AIEE 4:1942"
        #slug: "ieee-aiee-4-1942-ieee00006438-243330"
        #description: """
          Revision Standard - Superseded.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          In this standard are set forth methods for the measurement of test voltages and wave shapes used in dielectric tests of electrical apparatus or insulating material. These tests are in three classes: 1. Puncture tests. 2. Flashover tests. 3. Voltage proof tests. The tests may involve the use of alternating current, direct current, or surges from surge generators. Different pieces of apparatus may require different dielectric tests, some requiring power frequency or directcurrent tests only; other apparatus may require surge tests in addition. The specific requirements for any particular type of apparatus will be found in the standard dealing with that type of apparatus. This standard deals with the measurements themselves
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "AIEE American Standards for Measurement of Test Voltage in Dielectric Tests"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106712 …}
    #channels: Doctrine\ORM\PersistentCollection {#106718 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106714 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106716 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106682 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106685
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106665
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @-886384800 {#106659
      date: 1941-11-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 24
    -documents: Doctrine\ORM\PersistentCollection {#106676 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106674 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#107324
  +product: App\Entity\Product\Product {#106681
    #id: 11678
    #code: "IEEE00006438"
    #attributes: Doctrine\ORM\PersistentCollection {#106720 …}
    #variants: Doctrine\ORM\PersistentCollection {#106722 …}
    #options: Doctrine\ORM\PersistentCollection {#106726 …}
    #associations: Doctrine\ORM\PersistentCollection {#106724 …}
    #createdAt: DateTime @1751039890 {#106677
      date: 2025-06-27 17:58:10.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608621 {#106684
      date: 2025-08-08 01:17:01.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106706 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107309
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106681}
        #id: 41721
        #name: "IEEE/AIEE 4:1942"
        #slug: "ieee-aiee-4-1942-ieee00006438-243330"
        #description: """
          Revision Standard - Superseded.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          In this standard are set forth methods for the measurement of test voltages and wave shapes used in dielectric tests of electrical apparatus or insulating material. These tests are in three classes: 1. Puncture tests. 2. Flashover tests. 3. Voltage proof tests. The tests may involve the use of alternating current, direct current, or surges from surge generators. Different pieces of apparatus may require different dielectric tests, some requiring power frequency or directcurrent tests only; other apparatus may require surge tests in addition. The specific requirements for any particular type of apparatus will be found in the standard dealing with that type of apparatus. This standard deals with the measurements themselves
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "AIEE American Standards for Measurement of Test Voltage in Dielectric Tests"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106712 …}
    #channels: Doctrine\ORM\PersistentCollection {#106718 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106714 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106716 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106682 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106685
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106665
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @-886384800 {#106659
      date: 1941-11-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 24
    -documents: Doctrine\ORM\PersistentCollection {#106676 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106674 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 506.0 MiB 0.78 ms
Input props 
[
  "product" => App\Entity\Product\Product {#106681
    #id: 11678
    #code: "IEEE00006438"
    #attributes: Doctrine\ORM\PersistentCollection {#106720 …}
    #variants: Doctrine\ORM\PersistentCollection {#106722 …}
    #options: Doctrine\ORM\PersistentCollection {#106726 …}
    #associations: Doctrine\ORM\PersistentCollection {#106724 …}
    #createdAt: DateTime @1751039890 {#106677
      date: 2025-06-27 17:58:10.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608621 {#106684
      date: 2025-08-08 01:17:01.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106706 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107309
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106681}
        #id: 41721
        #name: "IEEE/AIEE 4:1942"
        #slug: "ieee-aiee-4-1942-ieee00006438-243330"
        #description: """
          Revision Standard - Superseded.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          In this standard are set forth methods for the measurement of test voltages and wave shapes used in dielectric tests of electrical apparatus or insulating material. These tests are in three classes: 1. Puncture tests. 2. Flashover tests. 3. Voltage proof tests. The tests may involve the use of alternating current, direct current, or surges from surge generators. Different pieces of apparatus may require different dielectric tests, some requiring power frequency or directcurrent tests only; other apparatus may require surge tests in addition. The specific requirements for any particular type of apparatus will be found in the standard dealing with that type of apparatus. This standard deals with the measurements themselves
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "AIEE American Standards for Measurement of Test Voltage in Dielectric Tests"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106712 …}
    #channels: Doctrine\ORM\PersistentCollection {#106718 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106714 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106716 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106682 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106685
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106665
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @-886384800 {#106659
      date: 1941-11-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 24
    -documents: Doctrine\ORM\PersistentCollection {#106676 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106674 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#107376
  +product: App\Entity\Product\Product {#106681
    #id: 11678
    #code: "IEEE00006438"
    #attributes: Doctrine\ORM\PersistentCollection {#106720 …}
    #variants: Doctrine\ORM\PersistentCollection {#106722 …}
    #options: Doctrine\ORM\PersistentCollection {#106726 …}
    #associations: Doctrine\ORM\PersistentCollection {#106724 …}
    #createdAt: DateTime @1751039890 {#106677
      date: 2025-06-27 17:58:10.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608621 {#106684
      date: 2025-08-08 01:17:01.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106706 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107309
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106681}
        #id: 41721
        #name: "IEEE/AIEE 4:1942"
        #slug: "ieee-aiee-4-1942-ieee00006438-243330"
        #description: """
          Revision Standard - Superseded.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          In this standard are set forth methods for the measurement of test voltages and wave shapes used in dielectric tests of electrical apparatus or insulating material. These tests are in three classes: 1. Puncture tests. 2. Flashover tests. 3. Voltage proof tests. The tests may involve the use of alternating current, direct current, or surges from surge generators. Different pieces of apparatus may require different dielectric tests, some requiring power frequency or directcurrent tests only; other apparatus may require surge tests in addition. The specific requirements for any particular type of apparatus will be found in the standard dealing with that type of apparatus. This standard deals with the measurements themselves
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "AIEE American Standards for Measurement of Test Voltage in Dielectric Tests"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106712 …}
    #channels: Doctrine\ORM\PersistentCollection {#106718 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106714 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106716 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106682 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106685
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106665
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @-886384800 {#106659
      date: 1941-11-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 24
    -documents: Doctrine\ORM\PersistentCollection {#106676 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106674 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 506.0 MiB 0.21 ms
Input props 
[
  "product" => App\Entity\Product\Product {#106733
    #id: 11677
    #code: "IEEE00006437"
    #attributes: Doctrine\ORM\PersistentCollection {#106750 …}
    #variants: Doctrine\ORM\PersistentCollection {#106752 …}
    #options: Doctrine\ORM\PersistentCollection {#106756 …}
    #associations: Doctrine\ORM\PersistentCollection {#106754 …}
    #createdAt: DateTime @1751039889 {#106728
      date: 2025-06-27 17:58:09.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753970307 {#106729
      date: 2025-07-31 15:58:27.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106740 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107442
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106733}
        #id: 41717
        #name: "IEEE/AIEE 4:1940"
        #slug: "ieee-aiee-4-1940-ieee00006437-243329"
        #description: """
           - Superseded.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          In this standard are set forth methods for the measurement of test voltages and wave shapes used in dielectric tests of electrical apparatus or insulating material. These tests are in three classes: 1. Puncture tests. 2. Flashover tests. 3. Voltage proof tests. The tests may involve the use of alternating current, direct current, or surges from surge generators. Different pieces of apparatus may require different dielectric tests, some requiring power frequency or direct current tests only; other apparatus may require surge tests in addition. The specific requirements for any particular type of apparatus will be found in the standard dealing with that type of apparatus. This standard deals with the measurements themselves
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "AIEE Standards for Measurement of Test Voltage in Dielectric tests"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106742 …}
    #channels: Doctrine\ORM\PersistentCollection {#106748 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106744 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106746 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106734 …}
    -apiLastModifiedAt: DateTime @1743289200 {#106730
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106731
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @-933728400 {#106732
      date: 1940-05-31 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 24
    -documents: Doctrine\ORM\PersistentCollection {#106736 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106738 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#107457
  +product: App\Entity\Product\Product {#106733
    #id: 11677
    #code: "IEEE00006437"
    #attributes: Doctrine\ORM\PersistentCollection {#106750 …}
    #variants: Doctrine\ORM\PersistentCollection {#106752 …}
    #options: Doctrine\ORM\PersistentCollection {#106756 …}
    #associations: Doctrine\ORM\PersistentCollection {#106754 …}
    #createdAt: DateTime @1751039889 {#106728
      date: 2025-06-27 17:58:09.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753970307 {#106729
      date: 2025-07-31 15:58:27.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106740 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107442
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106733}
        #id: 41717
        #name: "IEEE/AIEE 4:1940"
        #slug: "ieee-aiee-4-1940-ieee00006437-243329"
        #description: """
           - Superseded.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          In this standard are set forth methods for the measurement of test voltages and wave shapes used in dielectric tests of electrical apparatus or insulating material. These tests are in three classes: 1. Puncture tests. 2. Flashover tests. 3. Voltage proof tests. The tests may involve the use of alternating current, direct current, or surges from surge generators. Different pieces of apparatus may require different dielectric tests, some requiring power frequency or direct current tests only; other apparatus may require surge tests in addition. The specific requirements for any particular type of apparatus will be found in the standard dealing with that type of apparatus. This standard deals with the measurements themselves
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "AIEE Standards for Measurement of Test Voltage in Dielectric tests"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106742 …}
    #channels: Doctrine\ORM\PersistentCollection {#106748 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106744 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106746 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106734 …}
    -apiLastModifiedAt: DateTime @1743289200 {#106730
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106731
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @-933728400 {#106732
      date: 1940-05-31 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 24
    -documents: Doctrine\ORM\PersistentCollection {#106736 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106738 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 506.0 MiB 0.79 ms
Input props 
[
  "product" => App\Entity\Product\Product {#106733
    #id: 11677
    #code: "IEEE00006437"
    #attributes: Doctrine\ORM\PersistentCollection {#106750 …}
    #variants: Doctrine\ORM\PersistentCollection {#106752 …}
    #options: Doctrine\ORM\PersistentCollection {#106756 …}
    #associations: Doctrine\ORM\PersistentCollection {#106754 …}
    #createdAt: DateTime @1751039889 {#106728
      date: 2025-06-27 17:58:09.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753970307 {#106729
      date: 2025-07-31 15:58:27.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106740 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107442
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106733}
        #id: 41717
        #name: "IEEE/AIEE 4:1940"
        #slug: "ieee-aiee-4-1940-ieee00006437-243329"
        #description: """
           - Superseded.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          In this standard are set forth methods for the measurement of test voltages and wave shapes used in dielectric tests of electrical apparatus or insulating material. These tests are in three classes: 1. Puncture tests. 2. Flashover tests. 3. Voltage proof tests. The tests may involve the use of alternating current, direct current, or surges from surge generators. Different pieces of apparatus may require different dielectric tests, some requiring power frequency or direct current tests only; other apparatus may require surge tests in addition. The specific requirements for any particular type of apparatus will be found in the standard dealing with that type of apparatus. This standard deals with the measurements themselves
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "AIEE Standards for Measurement of Test Voltage in Dielectric tests"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106742 …}
    #channels: Doctrine\ORM\PersistentCollection {#106748 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106744 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106746 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106734 …}
    -apiLastModifiedAt: DateTime @1743289200 {#106730
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106731
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @-933728400 {#106732
      date: 1940-05-31 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 24
    -documents: Doctrine\ORM\PersistentCollection {#106736 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106738 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#107509
  +product: App\Entity\Product\Product {#106733
    #id: 11677
    #code: "IEEE00006437"
    #attributes: Doctrine\ORM\PersistentCollection {#106750 …}
    #variants: Doctrine\ORM\PersistentCollection {#106752 …}
    #options: Doctrine\ORM\PersistentCollection {#106756 …}
    #associations: Doctrine\ORM\PersistentCollection {#106754 …}
    #createdAt: DateTime @1751039889 {#106728
      date: 2025-06-27 17:58:09.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753970307 {#106729
      date: 2025-07-31 15:58:27.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106740 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107442
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106733}
        #id: 41717
        #name: "IEEE/AIEE 4:1940"
        #slug: "ieee-aiee-4-1940-ieee00006437-243329"
        #description: """
           - Superseded.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          In this standard are set forth methods for the measurement of test voltages and wave shapes used in dielectric tests of electrical apparatus or insulating material. These tests are in three classes: 1. Puncture tests. 2. Flashover tests. 3. Voltage proof tests. The tests may involve the use of alternating current, direct current, or surges from surge generators. Different pieces of apparatus may require different dielectric tests, some requiring power frequency or direct current tests only; other apparatus may require surge tests in addition. The specific requirements for any particular type of apparatus will be found in the standard dealing with that type of apparatus. This standard deals with the measurements themselves
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "AIEE Standards for Measurement of Test Voltage in Dielectric tests"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106742 …}
    #channels: Doctrine\ORM\PersistentCollection {#106748 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106744 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106746 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106734 …}
    -apiLastModifiedAt: DateTime @1743289200 {#106730
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106731
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @-933728400 {#106732
      date: 1940-05-31 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "4"
    -bookCollection: ""
    -pageCount: 24
    -documents: Doctrine\ORM\PersistentCollection {#106736 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106738 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}