GET https://dev.normadoc.fr/_partial/products/cross-sell?limit=2&products=%5B11227%5D&template=%40SyliusShop%2FProduct%2FsimilarList.html.twig

Response
200 OK
IP
216.73.216.149
Profiled on
Token
b094a6

Forms

  • sylius_add_to_cart
    • cartItem
    • _token

sylius_add_to_cart

Form type: 
"Sylius\Bundle\CoreBundle\Form\Type\Order\AddToCartType"

Errors

This form has no errors.

Default Data

Property Value
Model Format same as normalized format
Normalized Format 
Sylius\Bundle\OrderBundle\Controller\AddToCartCommand {#106828
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          -snapshot: [ …4]
          -owner: App\Entity\Product\Product {#7310}
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        #translations: Doctrine\ORM\PersistentCollection {#7921 …}
        #translationsCache: [
          "en_US" => App\Entity\Product\ProductTranslation {#7920
            #locale: "en_US"
            #translatable: App\Entity\Product\Product {#7310}
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              \t\t\t\t<br />\n
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              """
            #metaKeywords: null
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        #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
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        -author: ""
        -publishedAt: DateTime @1375135200 {#7318
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      }
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      #translations: Doctrine\ORM\PersistentCollection {#8263 …}
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          #translatable: App\Entity\Product\ProductVariant {#8103}
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View Format same as normalized format

Submitted Data

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Passed Options

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data 
Sylius\Bundle\OrderBundle\Controller\AddToCartCommand {#106828
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    #version: 1
    #variant: App\Entity\Product\ProductVariant {#8103
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      #product: App\Entity\Product\Product {#7310
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        #options: Doctrine\ORM\PersistentCollection {#7915
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          -snapshot: [ …4]
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          -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#207990 …}
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        #createdAt: DateTime @1751039559 {#7274
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        }
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        #translations: Doctrine\ORM\PersistentCollection {#7921 …}
        #translationsCache: [
          "en_US" => App\Entity\Product\ProductTranslation {#7920
            #locale: "en_US"
            #translatable: App\Entity\Product\Product {#7310}
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              Adoption Standard - Active.<br />\n
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        -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
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        -apiLastModifiedAt: DateTime @1754517600 {#7317
          date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
        }
        -lastUpdatedAt: DateTime @1632348000 {#7292
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        -author: ""
        -publishedAt: DateTime @1375135200 {#7318
          date: 2013-07-30 00:00:00.0 Europe/Paris (+02:00)
        }
        -releasedAt: null
        -confirmedAt: null
        -canceledAt: null
        -edition: null
        -coreDocument: "62860"
        -bookCollection: ""
        -pageCount: 28
        -documents: Doctrine\ORM\PersistentCollection {#7464 …}
        -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
      }
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      #position: 0
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        date: 2025-06-27 18:21:06.0 Europe/Paris (+02:00)
      }
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      }
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    #productName: null
    #variantName: null
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}
 same as passed value
product 
App\Entity\Product\Product {#7310
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  #code: "IEEE00005771"
  #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
  #variants: Doctrine\ORM\PersistentCollection {#7743 …}
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    -association: [ …21]
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  }
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  #translationsCache: [
    "en_US" => App\Entity\Product\ProductTranslation {#7920
      #locale: "en_US"
      #translatable: App\Entity\Product\Product {#7310}
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        Adoption Standard - Active.<br />\n
        Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.<br />\n
        \t\t\t\t<br />\n
        This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n
        The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.
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      -notes: "Active"
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  #currentTranslation: null
  #fallbackLocale: "en_US"
  #variantSelectionMethod: "match"
  #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
  #channels: Doctrine\ORM\PersistentCollection {#7627 …}
  #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
  #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
  #averageRating: 0.0
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  -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
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  -apiLastModifiedAt: DateTime @1754517600 {#7317
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  }
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  -documents: Doctrine\ORM\PersistentCollection {#7464 …}
  -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
}
 same as passed value

Resolved Options

Option Value
action 
""
allow_extra_fields 
false
allow_file_upload 
false
attr 
[]
attr_translation_parameters 
[]
auto_initialize 
true
block_name 
null
block_prefix 
null
by_reference 
true
compound 
true
constraints 
[]
csrf_field_name 
"_token"
csrf_message 
"The CSRF token is invalid. Please try to resubmit the form."
csrf_protection 
true
csrf_token_id 
null
csrf_token_manager 
Symfony\Component\Security\Csrf\CsrfTokenManager {#106848
  -generator: Symfony\Component\Security\Csrf\TokenGenerator\UriSafeTokenGenerator {#106849 …}
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  -namespace: Closure() {#106852 …}
}
data 
Sylius\Bundle\OrderBundle\Controller\AddToCartCommand {#106828
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  -cartItem: App\Entity\Order\OrderItem {#106816
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    #total: 0
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    #units: Doctrine\Common\Collections\ArrayCollection {#106840 …}
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    #adjustments: Doctrine\Common\Collections\ArrayCollection {#106841 …}
    #adjustmentsTotal: 0
    #version: 1
    #variant: App\Entity\Product\ProductVariant {#8103
      #id: 6165
      #code: "IEEE00005771PDF"
      #product: App\Entity\Product\Product {#7310
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        #code: "IEEE00005771"
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        #options: Doctrine\ORM\PersistentCollection {#7915
          #collection: Doctrine\Common\Collections\ArrayCollection {#7917 …}
          #initialized: true
          -snapshot: [ …4]
          -owner: App\Entity\Product\Product {#7310}
          -association: [ …21]
          -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …}
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          -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#207990 …}
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        }
        #enabled: true
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        #translationsCache: [
          "en_US" => App\Entity\Product\ProductTranslation {#7920
            #locale: "en_US"
            #translatable: App\Entity\Product\Product {#7310}
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              Adoption Standard - Active.<br />\n
              Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.<br />\n
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              This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n
              The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.
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            #metaKeywords: null
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        -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
        -apiLastModifiedAt: DateTime @1754517600 {#7317
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        -lastUpdatedAt: DateTime @1632348000 {#7292
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        -author: ""
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        -documents: Doctrine\ORM\PersistentCollection {#7464 …}
        -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
      }
      #optionValues: Doctrine\ORM\PersistentCollection {#8319 …}
      #position: 0
      #createdAt: DateTime @1751041266 {#7283
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      }
      #updatedAt: DateTime @1755612011 {#8120
        date: 2025-08-19 16:00:11.0 Europe/Paris (+02:00)
      }
      #enabled: true
      #translations: Doctrine\ORM\PersistentCollection {#8263 …}
      #translationsCache: [
        "en_US" => App\Entity\Product\ProductVariantTranslation {#93380
          #locale: "en_US"
          #translatable: App\Entity\Product\ProductVariant {#8103}
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      #currentLocale: "en_US"
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