GET https://dev.normadoc.fr/_partial/products/cross-sell?limit=2&products=%5B8776%5D&template=%40SyliusShop%2FProduct%2FsimilarList.html.twig

Response
200 OK
IP
216.73.216.9
Profiled on
Token
a6a430

Forms

  • sylius_add_to_cart
    • cartItem
    • _token

sylius_add_to_cart

Form type: 
"Sylius\Bundle\CoreBundle\Form\Type\Order\AddToCartType"

Errors

This form has no errors.

Default Data

Property Value
Model Format same as normalized format
Normalized Format 
Sylius\Bundle\OrderBundle\Controller\AddToCartCommand {#106915
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        #associations: Doctrine\ORM\PersistentCollection {#7901 …}
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        }
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        }
        #enabled: true
        #translations: Doctrine\ORM\PersistentCollection {#7923 …}
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            #translatable: App\Entity\Product\Product {#7309}
            #id: 30113
            #name: "IEEE 759:1984 (R1999)"
            #slug: "ieee-759-1984-r1999-ieee00000996-240428"
            #description: """
              New IEEE Standard - Inactive-Withdrawn.<br />\n
              Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.<br />\n
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              This document presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse height analyzer/computer. Test procedures for pulse-height analyzers and computers are not covered in this document. Section is essentially tutorial. This standard is not intended to imply that all tests described herein are mandatory, but only that such tests as are carried out shall be performed in accordance with the procedures described herein. Companion documents to this standard are ANSI/IEEE Std 300-1982 [1], ANSI/IEEE Std 301-1976 [2], and ANSI/IEEE Std 325-1971 [3]. The list of symbols and the glossary were derived from those in the companion documents. Contrary to previous convention in the X-ray spectroscopy field, this document utilizes the characteristic energy E of the X-ray rather than its wavelength λ. This approach is consistent with the fact that the basic quantity measured by this type of spectrometer is the X-ray energy. A convenient conversion is provided by the relationship λ(m) = 12.4 · 10-10 E-1(keV) λ(A0) = 12.4 E-1 (keV)
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            #metaKeywords: null
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            #shortDescription: "IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers"
            -notes: "Inactive-Withdrawn"
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        #currentTranslation: null
        #fallbackLocale: "en_US"
        #variantSelectionMethod: "match"
        #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
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        #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
        #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
        #averageRating: 0.0
        #images: Doctrine\ORM\PersistentCollection {#7646 …}
        -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
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        -apiLastModifiedAt: DateTime @1754517600 {#7317
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        -lastUpdatedAt: DateTime @1578006000 {#7292
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        -author: ""
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        -confirmedAt: DateTime @937432800 {#7316
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        -coreDocument: "759"
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        -documents: Doctrine\ORM\PersistentCollection {#7466 …}
        -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
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      #createdAt: DateTime @1751041128 {#7283
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      }
      #updatedAt: DateTime @1755611955 {#8118
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      }
      #enabled: true
      #translations: Doctrine\ORM\PersistentCollection {#8261 …}
      #translationsCache: [
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          #translatable: App\Entity\Product\ProductVariant {#8101}
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          #name: null
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      #version: 8
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      #depth: null
      #taxCategory: Proxies\__CG__\App\Entity\Taxation\TaxCategory {#8133 …}
      #shippingCategory: null
      #channelPricings: Doctrine\ORM\PersistentCollection {#8295 …}
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View Format same as normalized format

Submitted Data

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Sylius\Bundle\OrderBundle\Controller\AddToCartCommand {#106915
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    #version: 1
    #variant: App\Entity\Product\ProductVariant {#8101
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      #product: App\Entity\Product\Product {#7309
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        #code: "IEEE00000996"
        #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
        #variants: Doctrine\ORM\PersistentCollection {#7745 …}
        #options: Doctrine\ORM\PersistentCollection {#7917
          #collection: Doctrine\Common\Collections\ArrayCollection {#7919 …}
          #initialized: true
          -snapshot: [ …4]
          -owner: App\Entity\Product\Product {#7309}
          -association: [ …21]
          -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …}
          -backRefFieldName: null
          -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#208504 …}
          -isDirty: false
        }
        #associations: Doctrine\ORM\PersistentCollection {#7901 …}
        #createdAt: DateTime @1751037700 {#7274
          date: 2025-06-27 17:21:40.0 Europe/Paris (+02:00)
        }
        #updatedAt: DateTime @1754606304 {#7322
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        }
        #enabled: true
        #translations: Doctrine\ORM\PersistentCollection {#7923 …}
        #translationsCache: [
          "en_US" => App\Entity\Product\ProductTranslation {#7922
            #locale: "en_US"
            #translatable: App\Entity\Product\Product {#7309}
            #id: 30113
            #name: "IEEE 759:1984 (R1999)"
            #slug: "ieee-759-1984-r1999-ieee00000996-240428"
            #description: """
              New IEEE Standard - Inactive-Withdrawn.<br />\n
              Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.<br />\n
              \t\t\t\t<br />\n
              This document presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse height analyzer/computer. Test procedures for pulse-height analyzers and computers are not covered in this document. Section is essentially tutorial. This standard is not intended to imply that all tests described herein are mandatory, but only that such tests as are carried out shall be performed in accordance with the procedures described herein. Companion documents to this standard are ANSI/IEEE Std 300-1982 [1], ANSI/IEEE Std 301-1976 [2], and ANSI/IEEE Std 325-1971 [3]. The list of symbols and the glossary were derived from those in the companion documents. Contrary to previous convention in the X-ray spectroscopy field, this document utilizes the characteristic energy E of the X-ray rather than its wavelength λ. This approach is consistent with the fact that the basic quantity measured by this type of spectrometer is the X-ray energy. A convenient conversion is provided by the relationship λ(m) = 12.4 · 10-10 E-1(keV) λ(A0) = 12.4 E-1 (keV)
              """
            #metaKeywords: null
            #metaDescription: null
            #shortDescription: "IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers"
            -notes: "Inactive-Withdrawn"
          }
        ]
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        #currentTranslation: null
        #fallbackLocale: "en_US"
        #variantSelectionMethod: "match"
        #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
        #channels: Doctrine\ORM\PersistentCollection {#7629 …}
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        #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
        #averageRating: 0.0
        #images: Doctrine\ORM\PersistentCollection {#7646 …}
        -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
        -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
        -apiLastModifiedAt: DateTime @1754517600 {#7317
          date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
        }
        -lastUpdatedAt: DateTime @1578006000 {#7292
          date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
        }
        -author: ""
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          date: 1984-12-15 00:00:00.0 Europe/Paris (+01:00)
        }
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        }
        -edition: null
        -coreDocument: "759"
        -bookCollection: ""
        -pageCount: 52
        -documents: Doctrine\ORM\PersistentCollection {#7466 …}
        -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
      }
      #optionValues: Doctrine\ORM\PersistentCollection {#8317 …}
      #position: 0
      #createdAt: DateTime @1751041128 {#7283
        date: 2025-06-27 18:18:48.0 Europe/Paris (+02:00)
      }
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        date: 2025-08-19 15:59:15.0 Europe/Paris (+02:00)
      }
      #enabled: true
      #translations: Doctrine\ORM\PersistentCollection {#8261 …}
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          #translatable: App\Entity\Product\ProductVariant {#8101}
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      #taxCategory: Proxies\__CG__\App\Entity\Taxation\TaxCategory {#8133 …}
      #shippingCategory: null
      #channelPricings: Doctrine\ORM\PersistentCollection {#8295 …}
      #shippingRequired: true
      #images: Doctrine\ORM\PersistentCollection {#8292 …}
      -apiLastModifiedAt: DateTime @1753740000 {#8100
        date: 2025-07-29 00:00:00.0 Europe/Paris (+02:00)
      }
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      -sellable: true
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      -enabledForSubscribers: true
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    #productName: null
    #variantName: null
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}
 same as passed value
product 
App\Entity\Product\Product {#7309
  #id: 8776
  #code: "IEEE00000996"
  #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
  #variants: Doctrine\ORM\PersistentCollection {#7745 …}
  #options: Doctrine\ORM\PersistentCollection {#7917
    #collection: Doctrine\Common\Collections\ArrayCollection {#7919 …}
    #initialized: true
    -snapshot: [ …4]
    -owner: App\Entity\Product\Product {#7309}
    -association: [ …21]
    -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …}
    -backRefFieldName: null
    -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#208504 …}
    -isDirty: false
  }
  #associations: Doctrine\ORM\PersistentCollection {#7901 …}
  #createdAt: DateTime @1751037700 {#7274
    date: 2025-06-27 17:21:40.0 Europe/Paris (+02:00)
  }
  #updatedAt: DateTime @1754606304 {#7322
    date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
  }
  #enabled: true
  #translations: Doctrine\ORM\PersistentCollection {#7923 …}
  #translationsCache: [
    "en_US" => App\Entity\Product\ProductTranslation {#7922
      #locale: "en_US"
      #translatable: App\Entity\Product\Product {#7309}
      #id: 30113
      #name: "IEEE 759:1984 (R1999)"
      #slug: "ieee-759-1984-r1999-ieee00000996-240428"
      #description: """
        New IEEE Standard - Inactive-Withdrawn.<br />\n
        Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.<br />\n
        \t\t\t\t<br />\n
        This document presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse height analyzer/computer. Test procedures for pulse-height analyzers and computers are not covered in this document. Section is essentially tutorial. This standard is not intended to imply that all tests described herein are mandatory, but only that such tests as are carried out shall be performed in accordance with the procedures described herein. Companion documents to this standard are ANSI/IEEE Std 300-1982 [1], ANSI/IEEE Std 301-1976 [2], and ANSI/IEEE Std 325-1971 [3]. The list of symbols and the glossary were derived from those in the companion documents. Contrary to previous convention in the X-ray spectroscopy field, this document utilizes the characteristic energy E of the X-ray rather than its wavelength λ. This approach is consistent with the fact that the basic quantity measured by this type of spectrometer is the X-ray energy. A convenient conversion is provided by the relationship λ(m) = 12.4 · 10-10 E-1(keV) λ(A0) = 12.4 E-1 (keV)
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      #metaKeywords: null
      #metaDescription: null
      #shortDescription: "IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers"
      -notes: "Inactive-Withdrawn"
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  #currentTranslation: null
  #fallbackLocale: "en_US"
  #variantSelectionMethod: "match"
  #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
  #channels: Doctrine\ORM\PersistentCollection {#7629 …}
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  #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
  #averageRating: 0.0
  #images: Doctrine\ORM\PersistentCollection {#7646 …}
  -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
  -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
  -apiLastModifiedAt: DateTime @1754517600 {#7317
    date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
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  -lastUpdatedAt: DateTime @1578006000 {#7292
    date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
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  -author: ""
  -publishedAt: DateTime @471913200 {#7318
    date: 1984-12-15 00:00:00.0 Europe/Paris (+01:00)
  }
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  -confirmedAt: DateTime @937432800 {#7316
    date: 1999-09-16 00:00:00.0 Europe/Paris (+02:00)
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    date: 2007-01-18 00:00:00.0 Europe/Paris (+01:00)
  }
  -edition: null
  -coreDocument: "759"
  -bookCollection: ""
  -pageCount: 52
  -documents: Doctrine\ORM\PersistentCollection {#7466 …}
  -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
}
 same as passed value

Resolved Options

Option Value
action 
""
allow_extra_fields 
false
allow_file_upload 
false
attr 
[]
attr_translation_parameters 
[]
auto_initialize 
true
block_name 
null
block_prefix 
null
by_reference 
true
compound 
true
constraints 
[]
csrf_field_name 
"_token"
csrf_message 
"The CSRF token is invalid. Please try to resubmit the form."
csrf_protection 
true
csrf_token_id 
null
csrf_token_manager 
Symfony\Component\Security\Csrf\CsrfTokenManager {#106935
  -generator: Symfony\Component\Security\Csrf\TokenGenerator\UriSafeTokenGenerator {#106936 …}
  -storage: Symfony\Component\Security\Csrf\TokenStorage\SessionTokenStorage {#106937 …}
  -namespace: Closure() {#106939 …}
}
data 
Sylius\Bundle\OrderBundle\Controller\AddToCartCommand {#106915
  -cart: App\Entity\Order\Order {#13332 …}
  -cartItem: App\Entity\Order\OrderItem {#106903
    #id: null
    #order: null
    #quantity: 1
    #unitPrice: 0
    #originalUnitPrice: 0
    #total: 0
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    #units: Doctrine\Common\Collections\ArrayCollection {#106927 …}
    #unitsTotal: 0
    #adjustments: Doctrine\Common\Collections\ArrayCollection {#106928 …}
    #adjustmentsTotal: 0
    #version: 1
    #variant: App\Entity\Product\ProductVariant {#8101
      #id: 2601
      #code: "IEEE00000996PDF"
      #product: App\Entity\Product\Product {#7309
        #id: 8776
        #code: "IEEE00000996"
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        #variants: Doctrine\ORM\PersistentCollection {#7745 …}
        #options: Doctrine\ORM\PersistentCollection {#7917
          #collection: Doctrine\Common\Collections\ArrayCollection {#7919 …}
          #initialized: true
          -snapshot: [ …4]
          -owner: App\Entity\Product\Product {#7309}
          -association: [ …21]
          -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …}
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        #associations: Doctrine\ORM\PersistentCollection {#7901 …}
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        #translationsCache: [
          "en_US" => App\Entity\Product\ProductTranslation {#7922
            #locale: "en_US"
            #translatable: App\Entity\Product\Product {#7309}
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            #name: "IEEE 759:1984 (R1999)"
            #slug: "ieee-759-1984-r1999-ieee00000996-240428"
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              New IEEE Standard - Inactive-Withdrawn.<br />\n
              Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.<br />\n
              \t\t\t\t<br />\n
              This document presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse height analyzer/computer. Test procedures for pulse-height analyzers and computers are not covered in this document. Section is essentially tutorial. This standard is not intended to imply that all tests described herein are mandatory, but only that such tests as are carried out shall be performed in accordance with the procedures described herein. Companion documents to this standard are ANSI/IEEE Std 300-1982 [1], ANSI/IEEE Std 301-1976 [2], and ANSI/IEEE Std 325-1971 [3]. The list of symbols and the glossary were derived from those in the companion documents. Contrary to previous convention in the X-ray spectroscopy field, this document utilizes the characteristic energy E of the X-ray rather than its wavelength λ. This approach is consistent with the fact that the basic quantity measured by this type of spectrometer is the X-ray energy. A convenient conversion is provided by the relationship λ(m) = 12.4 · 10-10 E-1(keV) λ(A0) = 12.4 E-1 (keV)
              """
            #metaKeywords: null
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        ]
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        #currentTranslation: null
        #fallbackLocale: "en_US"
        #variantSelectionMethod: "match"
        #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
        #channels: Doctrine\ORM\PersistentCollection {#7629 …}
        #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
        #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
        #averageRating: 0.0
        #images: Doctrine\ORM\PersistentCollection {#7646 …}
        -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
        -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
        -apiLastModifiedAt: DateTime @1754517600 {#7317
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        -lastUpdatedAt: DateTime @1578006000 {#7292
          date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
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