Components
6
Twig Components
48
Render Count
112
ms
Render Time
232.0
MiB
Memory Usage
Components
| Name | Metadata | Render Count | Render Time |
|---|---|---|---|
| ProductCard |
"App\Twig\Components\ProductCard"components/ProductCard.html.twig |
15 | 104.42ms |
| ProductState |
"App\Twig\Components\ProductState"components/ProductState.html.twig |
15 | 3.65ms |
| ProductMostRecent |
"App\Twig\Components\ProductMostRecent"components/ProductMostRecent.html.twig |
15 | 10.10ms |
| PageBanner |
"App\Twig\Components\PageBanner"components/PageBanner.html.twig |
1 | 4.83ms |
| BackButton |
"App\Twig\Components\BackButton"components/BackButton.html.twig |
1 | 0.27ms |
| ResponsiveCollapsibleGrid |
"App\Twig\Components\ResponsiveCollapsibleGrid"components/ResponsiveCollapsibleGrid.html.twig |
1 | 2.37ms |
Render calls
| PageBanner | App\Twig\Components\PageBanner | 232.0 MiB | 4.83 ms | |
|---|---|---|---|---|
| Input props | [ "backLabel" => "31 : Electronics" "backUrl" => "/taxons/main/ics-2277/31-electronics-4445" "paddingClasses" => "p-2 px-lg-5 py-lg-0" "searchPlaceholder" => "sylius.ui.search" "showSearch" => "true" "title" => "31.080 : Semiconductor devices" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\PageBanner {#94168 +supTitle: null +title: "31.080 : Semiconductor devices" +subTitle: null +backUrl: "/taxons/main/ics-2277/31-electronics-4445" +backLabel: "31 : Electronics" +customClasses: null +backgroundType: null +centered: true +showSearch: true +searchPlaceholder: "sylius.ui.search" +searchValue: null +paddingClasses: "p-2 px-lg-5 py-lg-0" } |
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| BackButton | App\Twig\Components\BackButton | 232.0 MiB | 0.27 ms | |
|---|---|---|---|---|
| Input props | [ "url" => "/taxons/main/ics-2277/31-electronics-4445" "label" => "31 : Electronics" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\BackButton {#94259 +label: "31 : Electronics" +url: "/taxons/main/ics-2277/31-electronics-4445" } |
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| ResponsiveCollapsibleGrid | App\Twig\Components\ResponsiveCollapsibleGrid | 232.0 MiB | 2.37 ms | |
|---|---|---|---|---|
| Input props | [ "items" => Doctrine\ORM\PersistentCollection {#8719 #collection: Doctrine\Common\Collections\ArrayCollection {#8665 …} #initialized: true -snapshot: [ …5] -owner: App\Entity\Taxonomy\Taxon {#8648 …} -association: [ …16] -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …} -backRefFieldName: "parent" -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#134574 …} -isDirty: false } "responsiveItemsPerRow" => [ "mobile" => 2 "tablet" => 4 "desktop" => 6 ] "responsiveVisibleRows" => [ "mobile" => 50 "tablet" => 25 "desktop" => 17 ] "containerClass" => "taxon-grid-subcategories-listing mb-4 px-4 px-sm-0" "itemTemplate" => "@BitBagSyliusElasticsearchPlugin/Shop/Product/Index/DisplayStyle/_grid_subcategory_item.html.twig" "showMoreText" => "app.ui.collapsible_choices.show_more" "showLessText" => "app.ui.collapsible_choices.show_less" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ResponsiveCollapsibleGrid {#94446 +items: Doctrine\ORM\PersistentCollection {#8719 #collection: Doctrine\Common\Collections\ArrayCollection {#8665 …} #initialized: true -snapshot: [ …5] -owner: App\Entity\Taxonomy\Taxon {#8648 …} -association: [ …16] -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …} -backRefFieldName: "parent" -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#134574 …} -isDirty: false } +responsiveItemsPerRow: [ "mobile" => 2 "tablet" => 4 "desktop" => 6 ] +responsiveVisibleRows: [ "mobile" => 50 "tablet" => 25 "desktop" => 17 ] +containerClass: "taxon-grid-subcategories-listing mb-4 px-4 px-sm-0" +buttonClass: "" +itemTemplate: "@BitBagSyliusElasticsearchPlugin/Shop/Product/Index/DisplayStyle/_grid_subcategory_item.html.twig" +showMoreText: "app.ui.collapsible_choices.show_more" +showLessText: "app.ui.collapsible_choices.show_less" +gridItemsIdentifierClass: "responsive-collapsible-grid-item-362442" } |
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| ProductCard | App\Twig\Components\ProductCard | 232.0 MiB | 17.11 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94890 #id: 8400 #code: "IEEE00000411" #attributes: Doctrine\ORM\PersistentCollection {#94954 …} #variants: Doctrine\ORM\PersistentCollection {#94952 …} #options: Doctrine\ORM\PersistentCollection {#94948 …} #associations: Doctrine\ORM\PersistentCollection {#94950 …} #createdAt: DateTime @1751037385 {#94884 : 2025-06-27 17:16:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94903 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94964 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95494 #locale: "en_US" #translatable: App\Entity\Product\Product {#94890} #id: 28609 #name: "IEEE 216:1960 (R1980)" #slug: "ieee-216-1960-r1980-ieee00000411-240052" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Definitions of Semiconductor Terms<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94962 …} #channels: Doctrine\ORM\PersistentCollection {#94956 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94960 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94958 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94970 …} -apiLastModifiedAt: DateTime @1754517600 {#94908 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94882 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @-289357200 {#94901 : 1960-10-31 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @321750000 {#94907 : 1980-03-13 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @691887600 {#94906 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "216" -bookCollection: "" -pageCount: 4 -documents: Doctrine\ORM\PersistentCollection {#94968 …} -favorites: Doctrine\ORM\PersistentCollection {#94966 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#95378 +product: App\Entity\Product\Product {#94890 #id: 8400 #code: "IEEE00000411" #attributes: Doctrine\ORM\PersistentCollection {#94954 …} #variants: Doctrine\ORM\PersistentCollection {#94952 …} #options: Doctrine\ORM\PersistentCollection {#94948 …} #associations: Doctrine\ORM\PersistentCollection {#94950 …} #createdAt: DateTime @1751037385 {#94884 : 2025-06-27 17:16:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94903 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94964 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95494 #locale: "en_US" #translatable: App\Entity\Product\Product {#94890} #id: 28609 #name: "IEEE 216:1960 (R1980)" #slug: "ieee-216-1960-r1980-ieee00000411-240052" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Definitions of Semiconductor Terms<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94962 …} #channels: Doctrine\ORM\PersistentCollection {#94956 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94960 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94958 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94970 …} -apiLastModifiedAt: DateTime @1754517600 {#94908 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94882 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @-289357200 {#94901 : 1960-10-31 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @321750000 {#94907 : 1980-03-13 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @691887600 {#94906 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "216" -bookCollection: "" -pageCount: 4 -documents: Doctrine\ORM\PersistentCollection {#94968 …} -favorites: Doctrine\ORM\PersistentCollection {#94966 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 232.0 MiB | 1.09 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94890 #id: 8400 #code: "IEEE00000411" #attributes: Doctrine\ORM\PersistentCollection {#94954 …} #variants: Doctrine\ORM\PersistentCollection {#94952 …} #options: Doctrine\ORM\PersistentCollection {#94948 …} #associations: Doctrine\ORM\PersistentCollection {#94950 …} #createdAt: DateTime @1751037385 {#94884 : 2025-06-27 17:16:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94903 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94964 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95494 #locale: "en_US" #translatable: App\Entity\Product\Product {#94890} #id: 28609 #name: "IEEE 216:1960 (R1980)" #slug: "ieee-216-1960-r1980-ieee00000411-240052" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Definitions of Semiconductor Terms<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94962 …} #channels: Doctrine\ORM\PersistentCollection {#94956 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94960 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94958 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94970 …} -apiLastModifiedAt: DateTime @1754517600 {#94908 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94882 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @-289357200 {#94901 : 1960-10-31 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @321750000 {#94907 : 1980-03-13 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @691887600 {#94906 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "216" -bookCollection: "" -pageCount: 4 -documents: Doctrine\ORM\PersistentCollection {#94968 …} -favorites: Doctrine\ORM\PersistentCollection {#94966 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#95501 +product: App\Entity\Product\Product {#94890 #id: 8400 #code: "IEEE00000411" #attributes: Doctrine\ORM\PersistentCollection {#94954 …} #variants: Doctrine\ORM\PersistentCollection {#94952 …} #options: Doctrine\ORM\PersistentCollection {#94948 …} #associations: Doctrine\ORM\PersistentCollection {#94950 …} #createdAt: DateTime @1751037385 {#94884 : 2025-06-27 17:16:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94903 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94964 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95494 #locale: "en_US" #translatable: App\Entity\Product\Product {#94890} #id: 28609 #name: "IEEE 216:1960 (R1980)" #slug: "ieee-216-1960-r1980-ieee00000411-240052" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Definitions of Semiconductor Terms<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94962 …} #channels: Doctrine\ORM\PersistentCollection {#94956 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94960 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94958 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94970 …} -apiLastModifiedAt: DateTime @1754517600 {#94908 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94882 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @-289357200 {#94901 : 1960-10-31 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @321750000 {#94907 : 1980-03-13 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @691887600 {#94906 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "216" -bookCollection: "" -pageCount: 4 -documents: Doctrine\ORM\PersistentCollection {#94968 …} -favorites: Doctrine\ORM\PersistentCollection {#94966 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 232.0 MiB | 1.40 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94890 #id: 8400 #code: "IEEE00000411" #attributes: Doctrine\ORM\PersistentCollection {#94954 …} #variants: Doctrine\ORM\PersistentCollection {#94952 …} #options: Doctrine\ORM\PersistentCollection {#94948 …} #associations: Doctrine\ORM\PersistentCollection {#94950 …} #createdAt: DateTime @1751037385 {#94884 : 2025-06-27 17:16:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94903 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94964 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95494 #locale: "en_US" #translatable: App\Entity\Product\Product {#94890} #id: 28609 #name: "IEEE 216:1960 (R1980)" #slug: "ieee-216-1960-r1980-ieee00000411-240052" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Definitions of Semiconductor Terms<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94962 …} #channels: Doctrine\ORM\PersistentCollection {#94956 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94960 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94958 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94970 …} -apiLastModifiedAt: DateTime @1754517600 {#94908 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94882 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @-289357200 {#94901 : 1960-10-31 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @321750000 {#94907 : 1980-03-13 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @691887600 {#94906 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "216" -bookCollection: "" -pageCount: 4 -documents: Doctrine\ORM\PersistentCollection {#94968 …} -favorites: Doctrine\ORM\PersistentCollection {#94966 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#95595 +product: App\Entity\Product\Product {#94890 #id: 8400 #code: "IEEE00000411" #attributes: Doctrine\ORM\PersistentCollection {#94954 …} #variants: Doctrine\ORM\PersistentCollection {#94952 …} #options: Doctrine\ORM\PersistentCollection {#94948 …} #associations: Doctrine\ORM\PersistentCollection {#94950 …} #createdAt: DateTime @1751037385 {#94884 : 2025-06-27 17:16:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94903 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94964 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95494 #locale: "en_US" #translatable: App\Entity\Product\Product {#94890} #id: 28609 #name: "IEEE 216:1960 (R1980)" #slug: "ieee-216-1960-r1980-ieee00000411-240052" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Definitions of Semiconductor Terms<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94962 …} #channels: Doctrine\ORM\PersistentCollection {#94956 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94960 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94958 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94970 …} -apiLastModifiedAt: DateTime @1754517600 {#94908 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94882 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @-289357200 {#94901 : 1960-10-31 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @321750000 {#94907 : 1980-03-13 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @691887600 {#94906 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "216" -bookCollection: "" -pageCount: 4 -documents: Doctrine\ORM\PersistentCollection {#94968 …} -favorites: Doctrine\ORM\PersistentCollection {#94966 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 232.0 MiB | 5.77 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94885 #id: 8408 #code: "IEEE00000433" #attributes: Doctrine\ORM\PersistentCollection {#94936 …} #variants: Doctrine\ORM\PersistentCollection {#94938 …} #options: Doctrine\ORM\PersistentCollection {#94973 …} #associations: Doctrine\ORM\PersistentCollection {#94940 …} #createdAt: DateTime @1751037392 {#94946 : 2025-06-27 17:16:32.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94945 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94920 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95808 #locale: "en_US" #translatable: App\Entity\Product\Product {#94885} #id: 28641 #name: "IEEE 255:1963" #slug: "ieee-255-1963-ieee00000433-240060" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n No abstract. Withdrawn Standard. Withdrawn Date: Dec 06, 1990.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Letter Symbols for Semiconductor Devices" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94928 …} #channels: Doctrine\ORM\PersistentCollection {#94934 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94930 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94932 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94899 …} -apiLastModifiedAt: DateTime @1754517600 {#94944 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94943 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @-192070800 {#94942 : 1963-12-01 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @660438000 {#94941 : 1990-12-06 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "255" -bookCollection: "" -pageCount: 7 -documents: Doctrine\ORM\PersistentCollection {#94879 …} -favorites: Doctrine\ORM\PersistentCollection {#94895 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "secondary-lighter" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#95786 +product: App\Entity\Product\Product {#94885 #id: 8408 #code: "IEEE00000433" #attributes: Doctrine\ORM\PersistentCollection {#94936 …} #variants: Doctrine\ORM\PersistentCollection {#94938 …} #options: Doctrine\ORM\PersistentCollection {#94973 …} #associations: Doctrine\ORM\PersistentCollection {#94940 …} #createdAt: DateTime @1751037392 {#94946 : 2025-06-27 17:16:32.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94945 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94920 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95808 #locale: "en_US" #translatable: App\Entity\Product\Product {#94885} #id: 28641 #name: "IEEE 255:1963" #slug: "ieee-255-1963-ieee00000433-240060" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n No abstract. Withdrawn Standard. Withdrawn Date: Dec 06, 1990.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Letter Symbols for Semiconductor Devices" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94928 …} #channels: Doctrine\ORM\PersistentCollection {#94934 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94930 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94932 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94899 …} -apiLastModifiedAt: DateTime @1754517600 {#94944 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94943 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @-192070800 {#94942 : 1963-12-01 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @660438000 {#94941 : 1990-12-06 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "255" -bookCollection: "" -pageCount: 7 -documents: Doctrine\ORM\PersistentCollection {#94879 …} -favorites: Doctrine\ORM\PersistentCollection {#94895 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "secondary-lighter" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 232.0 MiB | 0.19 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94885 #id: 8408 #code: "IEEE00000433" #attributes: Doctrine\ORM\PersistentCollection {#94936 …} #variants: Doctrine\ORM\PersistentCollection {#94938 …} #options: Doctrine\ORM\PersistentCollection {#94973 …} #associations: Doctrine\ORM\PersistentCollection {#94940 …} #createdAt: DateTime @1751037392 {#94946 : 2025-06-27 17:16:32.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94945 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94920 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95808 #locale: "en_US" #translatable: App\Entity\Product\Product {#94885} #id: 28641 #name: "IEEE 255:1963" #slug: "ieee-255-1963-ieee00000433-240060" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n No abstract. Withdrawn Standard. Withdrawn Date: Dec 06, 1990.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Letter Symbols for Semiconductor Devices" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94928 …} #channels: Doctrine\ORM\PersistentCollection {#94934 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94930 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94932 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94899 …} -apiLastModifiedAt: DateTime @1754517600 {#94944 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94943 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @-192070800 {#94942 : 1963-12-01 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @660438000 {#94941 : 1990-12-06 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "255" -bookCollection: "" -pageCount: 7 -documents: Doctrine\ORM\PersistentCollection {#94879 …} -favorites: Doctrine\ORM\PersistentCollection {#94895 …} } ] |
|||
| Attributes | [ "showFullLabel" => false ] |
|||
| Component | App\Twig\Components\ProductState {#95815 +product: App\Entity\Product\Product {#94885 #id: 8408 #code: "IEEE00000433" #attributes: Doctrine\ORM\PersistentCollection {#94936 …} #variants: Doctrine\ORM\PersistentCollection {#94938 …} #options: Doctrine\ORM\PersistentCollection {#94973 …} #associations: Doctrine\ORM\PersistentCollection {#94940 …} #createdAt: DateTime @1751037392 {#94946 : 2025-06-27 17:16:32.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94945 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94920 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95808 #locale: "en_US" #translatable: App\Entity\Product\Product {#94885} #id: 28641 #name: "IEEE 255:1963" #slug: "ieee-255-1963-ieee00000433-240060" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n No abstract. Withdrawn Standard. Withdrawn Date: Dec 06, 1990.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Letter Symbols for Semiconductor Devices" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94928 …} #channels: Doctrine\ORM\PersistentCollection {#94934 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94930 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94932 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94899 …} -apiLastModifiedAt: DateTime @1754517600 {#94944 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94943 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @-192070800 {#94942 : 1963-12-01 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @660438000 {#94941 : 1990-12-06 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "255" -bookCollection: "" -pageCount: 7 -documents: Doctrine\ORM\PersistentCollection {#94879 …} -favorites: Doctrine\ORM\PersistentCollection {#94895 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 232.0 MiB | 0.64 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94885 #id: 8408 #code: "IEEE00000433" #attributes: Doctrine\ORM\PersistentCollection {#94936 …} #variants: Doctrine\ORM\PersistentCollection {#94938 …} #options: Doctrine\ORM\PersistentCollection {#94973 …} #associations: Doctrine\ORM\PersistentCollection {#94940 …} #createdAt: DateTime @1751037392 {#94946 : 2025-06-27 17:16:32.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94945 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94920 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95808 #locale: "en_US" #translatable: App\Entity\Product\Product {#94885} #id: 28641 #name: "IEEE 255:1963" #slug: "ieee-255-1963-ieee00000433-240060" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n No abstract. Withdrawn Standard. Withdrawn Date: Dec 06, 1990.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Letter Symbols for Semiconductor Devices" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94928 …} #channels: Doctrine\ORM\PersistentCollection {#94934 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94930 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94932 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94899 …} -apiLastModifiedAt: DateTime @1754517600 {#94944 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94943 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @-192070800 {#94942 : 1963-12-01 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @660438000 {#94941 : 1990-12-06 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "255" -bookCollection: "" -pageCount: 7 -documents: Doctrine\ORM\PersistentCollection {#94879 …} -favorites: Doctrine\ORM\PersistentCollection {#94895 …} } ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductMostRecent {#95892 +product: App\Entity\Product\Product {#94885 #id: 8408 #code: "IEEE00000433" #attributes: Doctrine\ORM\PersistentCollection {#94936 …} #variants: Doctrine\ORM\PersistentCollection {#94938 …} #options: Doctrine\ORM\PersistentCollection {#94973 …} #associations: Doctrine\ORM\PersistentCollection {#94940 …} #createdAt: DateTime @1751037392 {#94946 : 2025-06-27 17:16:32.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94945 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94920 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95808 #locale: "en_US" #translatable: App\Entity\Product\Product {#94885} #id: 28641 #name: "IEEE 255:1963" #slug: "ieee-255-1963-ieee00000433-240060" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n No abstract. Withdrawn Standard. Withdrawn Date: Dec 06, 1990.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Letter Symbols for Semiconductor Devices" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94928 …} #channels: Doctrine\ORM\PersistentCollection {#94934 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94930 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94932 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94899 …} -apiLastModifiedAt: DateTime @1754517600 {#94944 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94943 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @-192070800 {#94942 : 1963-12-01 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @660438000 {#94941 : 1990-12-06 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "255" -bookCollection: "" -pageCount: 7 -documents: Doctrine\ORM\PersistentCollection {#94879 …} -favorites: Doctrine\ORM\PersistentCollection {#94895 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductCard | App\Twig\Components\ProductCard | 232.0 MiB | 6.40 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94981 #id: 8550 #code: "IEEE00000650" #attributes: Doctrine\ORM\PersistentCollection {#94998 …} #variants: Doctrine\ORM\PersistentCollection {#95000 …} #options: Doctrine\ORM\PersistentCollection {#95004 …} #associations: Doctrine\ORM\PersistentCollection {#95002 …} #createdAt: DateTime @1751037511 {#94975 : 2025-06-27 17:18:31.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94976 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94988 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96017 #locale: "en_US" #translatable: App\Entity\Product\Product {#94981} #id: 29209 #name: "IEEE 428:1981" #slug: "ieee-428-1981-ieee00000650-240202" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n These recommendations apply to thyristor ac power controllers that are low voltage, power electronic, industrial class equipment for the control or switching of ac power. Switching, multicycle control and phase control are included. Cycloconverters are excluded. Examples of application include, but are not limited to, industrial oven controls, static motor starters, static relays, etc. This standard is intended to be used in conjunction with IEC Pub 146 (1973) [2] .l Reference is made to the appropriate section of IEC Pub 146 (1973) [2] where required.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Requirements for Thyristor AC Power Controllers" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94990 …} #channels: Doctrine\ORM\PersistentCollection {#94996 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94992 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94994 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94982 …} -apiLastModifiedAt: DateTime @1754517600 {#94977 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94978 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @371775600 {#94979 : 1981-10-13 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @771544800 {#94980 : 1994-06-14 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "428" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#94984 …} -favorites: Doctrine\ORM\PersistentCollection {#94986 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductCard {#95997 +product: App\Entity\Product\Product {#94981 #id: 8550 #code: "IEEE00000650" #attributes: Doctrine\ORM\PersistentCollection {#94998 …} #variants: Doctrine\ORM\PersistentCollection {#95000 …} #options: Doctrine\ORM\PersistentCollection {#95004 …} #associations: Doctrine\ORM\PersistentCollection {#95002 …} #createdAt: DateTime @1751037511 {#94975 : 2025-06-27 17:18:31.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94976 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94988 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96017 #locale: "en_US" #translatable: App\Entity\Product\Product {#94981} #id: 29209 #name: "IEEE 428:1981" #slug: "ieee-428-1981-ieee00000650-240202" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n These recommendations apply to thyristor ac power controllers that are low voltage, power electronic, industrial class equipment for the control or switching of ac power. Switching, multicycle control and phase control are included. Cycloconverters are excluded. Examples of application include, but are not limited to, industrial oven controls, static motor starters, static relays, etc. This standard is intended to be used in conjunction with IEC Pub 146 (1973) [2] .l Reference is made to the appropriate section of IEC Pub 146 (1973) [2] where required.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Requirements for Thyristor AC Power Controllers" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94990 …} #channels: Doctrine\ORM\PersistentCollection {#94996 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94992 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94994 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94982 …} -apiLastModifiedAt: DateTime @1754517600 {#94977 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94978 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @371775600 {#94979 : 1981-10-13 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @771544800 {#94980 : 1994-06-14 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "428" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#94984 …} -favorites: Doctrine\ORM\PersistentCollection {#94986 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 232.0 MiB | 0.19 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94981 #id: 8550 #code: "IEEE00000650" #attributes: Doctrine\ORM\PersistentCollection {#94998 …} #variants: Doctrine\ORM\PersistentCollection {#95000 …} #options: Doctrine\ORM\PersistentCollection {#95004 …} #associations: Doctrine\ORM\PersistentCollection {#95002 …} #createdAt: DateTime @1751037511 {#94975 : 2025-06-27 17:18:31.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94976 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94988 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96017 #locale: "en_US" #translatable: App\Entity\Product\Product {#94981} #id: 29209 #name: "IEEE 428:1981" #slug: "ieee-428-1981-ieee00000650-240202" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n These recommendations apply to thyristor ac power controllers that are low voltage, power electronic, industrial class equipment for the control or switching of ac power. Switching, multicycle control and phase control are included. Cycloconverters are excluded. Examples of application include, but are not limited to, industrial oven controls, static motor starters, static relays, etc. This standard is intended to be used in conjunction with IEC Pub 146 (1973) [2] .l Reference is made to the appropriate section of IEC Pub 146 (1973) [2] where required.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Requirements for Thyristor AC Power Controllers" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94990 …} #channels: Doctrine\ORM\PersistentCollection {#94996 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94992 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94994 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94982 …} -apiLastModifiedAt: DateTime @1754517600 {#94977 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94978 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @371775600 {#94979 : 1981-10-13 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @771544800 {#94980 : 1994-06-14 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "428" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#94984 …} -favorites: Doctrine\ORM\PersistentCollection {#94986 …} } ] |
|||
| Attributes | [ "showFullLabel" => false ] |
|||
| Component | App\Twig\Components\ProductState {#96024 +product: App\Entity\Product\Product {#94981 #id: 8550 #code: "IEEE00000650" #attributes: Doctrine\ORM\PersistentCollection {#94998 …} #variants: Doctrine\ORM\PersistentCollection {#95000 …} #options: Doctrine\ORM\PersistentCollection {#95004 …} #associations: Doctrine\ORM\PersistentCollection {#95002 …} #createdAt: DateTime @1751037511 {#94975 : 2025-06-27 17:18:31.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94976 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94988 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96017 #locale: "en_US" #translatable: App\Entity\Product\Product {#94981} #id: 29209 #name: "IEEE 428:1981" #slug: "ieee-428-1981-ieee00000650-240202" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n These recommendations apply to thyristor ac power controllers that are low voltage, power electronic, industrial class equipment for the control or switching of ac power. Switching, multicycle control and phase control are included. Cycloconverters are excluded. Examples of application include, but are not limited to, industrial oven controls, static motor starters, static relays, etc. This standard is intended to be used in conjunction with IEC Pub 146 (1973) [2] .l Reference is made to the appropriate section of IEC Pub 146 (1973) [2] where required.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Requirements for Thyristor AC Power Controllers" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94990 …} #channels: Doctrine\ORM\PersistentCollection {#94996 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94992 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94994 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94982 …} -apiLastModifiedAt: DateTime @1754517600 {#94977 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94978 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @371775600 {#94979 : 1981-10-13 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @771544800 {#94980 : 1994-06-14 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "428" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#94984 …} -favorites: Doctrine\ORM\PersistentCollection {#94986 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductMostRecent | App\Twig\Components\ProductMostRecent | 232.0 MiB | 0.64 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94981 #id: 8550 #code: "IEEE00000650" #attributes: Doctrine\ORM\PersistentCollection {#94998 …} #variants: Doctrine\ORM\PersistentCollection {#95000 …} #options: Doctrine\ORM\PersistentCollection {#95004 …} #associations: Doctrine\ORM\PersistentCollection {#95002 …} #createdAt: DateTime @1751037511 {#94975 : 2025-06-27 17:18:31.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94976 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94988 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96017 #locale: "en_US" #translatable: App\Entity\Product\Product {#94981} #id: 29209 #name: "IEEE 428:1981" #slug: "ieee-428-1981-ieee00000650-240202" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n These recommendations apply to thyristor ac power controllers that are low voltage, power electronic, industrial class equipment for the control or switching of ac power. Switching, multicycle control and phase control are included. Cycloconverters are excluded. Examples of application include, but are not limited to, industrial oven controls, static motor starters, static relays, etc. This standard is intended to be used in conjunction with IEC Pub 146 (1973) [2] .l Reference is made to the appropriate section of IEC Pub 146 (1973) [2] where required.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Requirements for Thyristor AC Power Controllers" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94990 …} #channels: Doctrine\ORM\PersistentCollection {#94996 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94992 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94994 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94982 …} -apiLastModifiedAt: DateTime @1754517600 {#94977 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94978 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @371775600 {#94979 : 1981-10-13 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @771544800 {#94980 : 1994-06-14 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "428" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#94984 …} -favorites: Doctrine\ORM\PersistentCollection {#94986 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#96101 +product: App\Entity\Product\Product {#94981 #id: 8550 #code: "IEEE00000650" #attributes: Doctrine\ORM\PersistentCollection {#94998 …} #variants: Doctrine\ORM\PersistentCollection {#95000 …} #options: Doctrine\ORM\PersistentCollection {#95004 …} #associations: Doctrine\ORM\PersistentCollection {#95002 …} #createdAt: DateTime @1751037511 {#94975 : 2025-06-27 17:18:31.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94976 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94988 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96017 #locale: "en_US" #translatable: App\Entity\Product\Product {#94981} #id: 29209 #name: "IEEE 428:1981" #slug: "ieee-428-1981-ieee00000650-240202" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n These recommendations apply to thyristor ac power controllers that are low voltage, power electronic, industrial class equipment for the control or switching of ac power. Switching, multicycle control and phase control are included. Cycloconverters are excluded. Examples of application include, but are not limited to, industrial oven controls, static motor starters, static relays, etc. This standard is intended to be used in conjunction with IEC Pub 146 (1973) [2] .l Reference is made to the appropriate section of IEC Pub 146 (1973) [2] where required.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Requirements for Thyristor AC Power Controllers" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94990 …} #channels: Doctrine\ORM\PersistentCollection {#94996 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94992 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94994 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94982 …} -apiLastModifiedAt: DateTime @1754517600 {#94977 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94978 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @371775600 {#94979 : 1981-10-13 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @771544800 {#94980 : 1994-06-14 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "428" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#94984 …} -favorites: Doctrine\ORM\PersistentCollection {#94986 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 232.0 MiB | 5.66 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95012 #id: 8564 #code: "IEEE00000674" #attributes: Doctrine\ORM\PersistentCollection {#95029 …} #variants: Doctrine\ORM\PersistentCollection {#95031 …} #options: Doctrine\ORM\PersistentCollection {#95035 …} #associations: Doctrine\ORM\PersistentCollection {#95033 …} #createdAt: DateTime @1751037523 {#95006 : 2025-06-27 17:18:43.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95007 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95019 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96226 #locale: "en_US" #translatable: App\Entity\Product\Product {#95012} #id: 29265 #name: "IEEE 449:1990" #slug: "ieee-449-1990-ieee00000674-240216" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n Requirements are provided for ferroresonant voltage regulators that operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage. Requirements for controlled ferroresonant regulators that maintain substantially constant output voltages regardless of variations, within limits, of input voltage, temperature, frequency, and output load are also included. The requirements cover definitions, symbols, and circuit schematics; service conditions; ratings; nameplate and other markings; testing; application; and maintenance. Provision is made for relating the characteristics of ferroresonant regulators to associated rectifiers and circuits.<br />\n \t\t\t\t<br />\n This standard pertains to ferroresonant voltage regulators that operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage, and to controlled ferroresonant regulators that maintain substantially constant output voltages regardless of variations, within limits, of input voltage, temperature, frequency, and output load. Guides to application and test procedures are included. Provision is made for relating the characteristics of ferroresonant regulators to associated rectifiers and circuits.<br />\n Definitions pertaining to ferroresonance and ferroresonant regulators that have not been found elsewhere are included with an appropriate discussion.<br />\n This standard includes, but is not limited to the following types of ferroresonant regulators:<br />\n (1 ) Series ferroresonant regulators<br />\n (2) Series-parallel ferroresonant regulators (electrically connected)<br />\n (3) Ferroresonant transformer regulators (magnetically coupled)<br />\n (4) Controlled ferroresonant regulators<br />\n The purpose of this standard is to provide a common ground of understanding between engineers involved in the design, manufacture, sale, and use of ferroresonant transformers. It pertains to ferroresonant transformers used as regulators in electronic power supplies and in other equipment where the inherent properties of voltage regulation and current limiting are useful. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Ferroresonant Voltage Regulators" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95021 …} #channels: Doctrine\ORM\PersistentCollection {#95027 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95023 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95025 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95013 …} -apiLastModifiedAt: DateTime @1754517600 {#95008 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95009 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @642808800 {#95010 : 1990-05-16 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @881622000 {#95011 : 1997-12-09 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "449" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#95015 …} -favorites: Doctrine\ORM\PersistentCollection {#95017 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "secondary-lighter" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#96206 +product: App\Entity\Product\Product {#95012 #id: 8564 #code: "IEEE00000674" #attributes: Doctrine\ORM\PersistentCollection {#95029 …} #variants: Doctrine\ORM\PersistentCollection {#95031 …} #options: Doctrine\ORM\PersistentCollection {#95035 …} #associations: Doctrine\ORM\PersistentCollection {#95033 …} #createdAt: DateTime @1751037523 {#95006 : 2025-06-27 17:18:43.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95007 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95019 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96226 #locale: "en_US" #translatable: App\Entity\Product\Product {#95012} #id: 29265 #name: "IEEE 449:1990" #slug: "ieee-449-1990-ieee00000674-240216" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n Requirements are provided for ferroresonant voltage regulators that operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage. Requirements for controlled ferroresonant regulators that maintain substantially constant output voltages regardless of variations, within limits, of input voltage, temperature, frequency, and output load are also included. The requirements cover definitions, symbols, and circuit schematics; service conditions; ratings; nameplate and other markings; testing; application; and maintenance. Provision is made for relating the characteristics of ferroresonant regulators to associated rectifiers and circuits.<br />\n \t\t\t\t<br />\n This standard pertains to ferroresonant voltage regulators that operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage, and to controlled ferroresonant regulators that maintain substantially constant output voltages regardless of variations, within limits, of input voltage, temperature, frequency, and output load. Guides to application and test procedures are included. Provision is made for relating the characteristics of ferroresonant regulators to associated rectifiers and circuits.<br />\n Definitions pertaining to ferroresonance and ferroresonant regulators that have not been found elsewhere are included with an appropriate discussion.<br />\n This standard includes, but is not limited to the following types of ferroresonant regulators:<br />\n (1 ) Series ferroresonant regulators<br />\n (2) Series-parallel ferroresonant regulators (electrically connected)<br />\n (3) Ferroresonant transformer regulators (magnetically coupled)<br />\n (4) Controlled ferroresonant regulators<br />\n The purpose of this standard is to provide a common ground of understanding between engineers involved in the design, manufacture, sale, and use of ferroresonant transformers. It pertains to ferroresonant transformers used as regulators in electronic power supplies and in other equipment where the inherent properties of voltage regulation and current limiting are useful. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Ferroresonant Voltage Regulators" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95021 …} #channels: Doctrine\ORM\PersistentCollection {#95027 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95023 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95025 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95013 …} -apiLastModifiedAt: DateTime @1754517600 {#95008 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95009 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @642808800 {#95010 : 1990-05-16 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @881622000 {#95011 : 1997-12-09 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "449" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#95015 …} -favorites: Doctrine\ORM\PersistentCollection {#95017 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "secondary-lighter" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 232.0 MiB | 0.18 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95012 #id: 8564 #code: "IEEE00000674" #attributes: Doctrine\ORM\PersistentCollection {#95029 …} #variants: Doctrine\ORM\PersistentCollection {#95031 …} #options: Doctrine\ORM\PersistentCollection {#95035 …} #associations: Doctrine\ORM\PersistentCollection {#95033 …} #createdAt: DateTime @1751037523 {#95006 : 2025-06-27 17:18:43.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95007 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95019 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96226 #locale: "en_US" #translatable: App\Entity\Product\Product {#95012} #id: 29265 #name: "IEEE 449:1990" #slug: "ieee-449-1990-ieee00000674-240216" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n Requirements are provided for ferroresonant voltage regulators that operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage. Requirements for controlled ferroresonant regulators that maintain substantially constant output voltages regardless of variations, within limits, of input voltage, temperature, frequency, and output load are also included. The requirements cover definitions, symbols, and circuit schematics; service conditions; ratings; nameplate and other markings; testing; application; and maintenance. Provision is made for relating the characteristics of ferroresonant regulators to associated rectifiers and circuits.<br />\n \t\t\t\t<br />\n This standard pertains to ferroresonant voltage regulators that operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage, and to controlled ferroresonant regulators that maintain substantially constant output voltages regardless of variations, within limits, of input voltage, temperature, frequency, and output load. Guides to application and test procedures are included. Provision is made for relating the characteristics of ferroresonant regulators to associated rectifiers and circuits.<br />\n Definitions pertaining to ferroresonance and ferroresonant regulators that have not been found elsewhere are included with an appropriate discussion.<br />\n This standard includes, but is not limited to the following types of ferroresonant regulators:<br />\n (1 ) Series ferroresonant regulators<br />\n (2) Series-parallel ferroresonant regulators (electrically connected)<br />\n (3) Ferroresonant transformer regulators (magnetically coupled)<br />\n (4) Controlled ferroresonant regulators<br />\n The purpose of this standard is to provide a common ground of understanding between engineers involved in the design, manufacture, sale, and use of ferroresonant transformers. It pertains to ferroresonant transformers used as regulators in electronic power supplies and in other equipment where the inherent properties of voltage regulation and current limiting are useful. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Ferroresonant Voltage Regulators" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95021 …} #channels: Doctrine\ORM\PersistentCollection {#95027 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95023 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95025 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95013 …} -apiLastModifiedAt: DateTime @1754517600 {#95008 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95009 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @642808800 {#95010 : 1990-05-16 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @881622000 {#95011 : 1997-12-09 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "449" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#95015 …} -favorites: Doctrine\ORM\PersistentCollection {#95017 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#96233 +product: App\Entity\Product\Product {#95012 #id: 8564 #code: "IEEE00000674" #attributes: Doctrine\ORM\PersistentCollection {#95029 …} #variants: Doctrine\ORM\PersistentCollection {#95031 …} #options: Doctrine\ORM\PersistentCollection {#95035 …} #associations: Doctrine\ORM\PersistentCollection {#95033 …} #createdAt: DateTime @1751037523 {#95006 : 2025-06-27 17:18:43.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95007 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95019 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96226 #locale: "en_US" #translatable: App\Entity\Product\Product {#95012} #id: 29265 #name: "IEEE 449:1990" #slug: "ieee-449-1990-ieee00000674-240216" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n Requirements are provided for ferroresonant voltage regulators that operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage. Requirements for controlled ferroresonant regulators that maintain substantially constant output voltages regardless of variations, within limits, of input voltage, temperature, frequency, and output load are also included. The requirements cover definitions, symbols, and circuit schematics; service conditions; ratings; nameplate and other markings; testing; application; and maintenance. Provision is made for relating the characteristics of ferroresonant regulators to associated rectifiers and circuits.<br />\n \t\t\t\t<br />\n This standard pertains to ferroresonant voltage regulators that operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage, and to controlled ferroresonant regulators that maintain substantially constant output voltages regardless of variations, within limits, of input voltage, temperature, frequency, and output load. Guides to application and test procedures are included. Provision is made for relating the characteristics of ferroresonant regulators to associated rectifiers and circuits.<br />\n Definitions pertaining to ferroresonance and ferroresonant regulators that have not been found elsewhere are included with an appropriate discussion.<br />\n This standard includes, but is not limited to the following types of ferroresonant regulators:<br />\n (1 ) Series ferroresonant regulators<br />\n (2) Series-parallel ferroresonant regulators (electrically connected)<br />\n (3) Ferroresonant transformer regulators (magnetically coupled)<br />\n (4) Controlled ferroresonant regulators<br />\n The purpose of this standard is to provide a common ground of understanding between engineers involved in the design, manufacture, sale, and use of ferroresonant transformers. It pertains to ferroresonant transformers used as regulators in electronic power supplies and in other equipment where the inherent properties of voltage regulation and current limiting are useful. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Ferroresonant Voltage Regulators" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95021 …} #channels: Doctrine\ORM\PersistentCollection {#95027 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95023 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95025 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95013 …} -apiLastModifiedAt: DateTime @1754517600 {#95008 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95009 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @642808800 {#95010 : 1990-05-16 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @881622000 {#95011 : 1997-12-09 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "449" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#95015 …} -favorites: Doctrine\ORM\PersistentCollection {#95017 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 232.0 MiB | 0.72 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95012 #id: 8564 #code: "IEEE00000674" #attributes: Doctrine\ORM\PersistentCollection {#95029 …} #variants: Doctrine\ORM\PersistentCollection {#95031 …} #options: Doctrine\ORM\PersistentCollection {#95035 …} #associations: Doctrine\ORM\PersistentCollection {#95033 …} #createdAt: DateTime @1751037523 {#95006 : 2025-06-27 17:18:43.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95007 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95019 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96226 #locale: "en_US" #translatable: App\Entity\Product\Product {#95012} #id: 29265 #name: "IEEE 449:1990" #slug: "ieee-449-1990-ieee00000674-240216" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n Requirements are provided for ferroresonant voltage regulators that operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage. Requirements for controlled ferroresonant regulators that maintain substantially constant output voltages regardless of variations, within limits, of input voltage, temperature, frequency, and output load are also included. The requirements cover definitions, symbols, and circuit schematics; service conditions; ratings; nameplate and other markings; testing; application; and maintenance. Provision is made for relating the characteristics of ferroresonant regulators to associated rectifiers and circuits.<br />\n \t\t\t\t<br />\n This standard pertains to ferroresonant voltage regulators that operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage, and to controlled ferroresonant regulators that maintain substantially constant output voltages regardless of variations, within limits, of input voltage, temperature, frequency, and output load. Guides to application and test procedures are included. Provision is made for relating the characteristics of ferroresonant regulators to associated rectifiers and circuits.<br />\n Definitions pertaining to ferroresonance and ferroresonant regulators that have not been found elsewhere are included with an appropriate discussion.<br />\n This standard includes, but is not limited to the following types of ferroresonant regulators:<br />\n (1 ) Series ferroresonant regulators<br />\n (2) Series-parallel ferroresonant regulators (electrically connected)<br />\n (3) Ferroresonant transformer regulators (magnetically coupled)<br />\n (4) Controlled ferroresonant regulators<br />\n The purpose of this standard is to provide a common ground of understanding between engineers involved in the design, manufacture, sale, and use of ferroresonant transformers. It pertains to ferroresonant transformers used as regulators in electronic power supplies and in other equipment where the inherent properties of voltage regulation and current limiting are useful. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Ferroresonant Voltage Regulators" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95021 …} #channels: Doctrine\ORM\PersistentCollection {#95027 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95023 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95025 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95013 …} -apiLastModifiedAt: DateTime @1754517600 {#95008 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95009 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @642808800 {#95010 : 1990-05-16 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @881622000 {#95011 : 1997-12-09 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "449" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#95015 …} -favorites: Doctrine\ORM\PersistentCollection {#95017 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#96310 +product: App\Entity\Product\Product {#95012 #id: 8564 #code: "IEEE00000674" #attributes: Doctrine\ORM\PersistentCollection {#95029 …} #variants: Doctrine\ORM\PersistentCollection {#95031 …} #options: Doctrine\ORM\PersistentCollection {#95035 …} #associations: Doctrine\ORM\PersistentCollection {#95033 …} #createdAt: DateTime @1751037523 {#95006 : 2025-06-27 17:18:43.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95007 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95019 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96226 #locale: "en_US" #translatable: App\Entity\Product\Product {#95012} #id: 29265 #name: "IEEE 449:1990" #slug: "ieee-449-1990-ieee00000674-240216" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n Requirements are provided for ferroresonant voltage regulators that operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage. Requirements for controlled ferroresonant regulators that maintain substantially constant output voltages regardless of variations, within limits, of input voltage, temperature, frequency, and output load are also included. The requirements cover definitions, symbols, and circuit schematics; service conditions; ratings; nameplate and other markings; testing; application; and maintenance. Provision is made for relating the characteristics of ferroresonant regulators to associated rectifiers and circuits.<br />\n \t\t\t\t<br />\n This standard pertains to ferroresonant voltage regulators that operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage, and to controlled ferroresonant regulators that maintain substantially constant output voltages regardless of variations, within limits, of input voltage, temperature, frequency, and output load. Guides to application and test procedures are included. Provision is made for relating the characteristics of ferroresonant regulators to associated rectifiers and circuits.<br />\n Definitions pertaining to ferroresonance and ferroresonant regulators that have not been found elsewhere are included with an appropriate discussion.<br />\n This standard includes, but is not limited to the following types of ferroresonant regulators:<br />\n (1 ) Series ferroresonant regulators<br />\n (2) Series-parallel ferroresonant regulators (electrically connected)<br />\n (3) Ferroresonant transformer regulators (magnetically coupled)<br />\n (4) Controlled ferroresonant regulators<br />\n The purpose of this standard is to provide a common ground of understanding between engineers involved in the design, manufacture, sale, and use of ferroresonant transformers. It pertains to ferroresonant transformers used as regulators in electronic power supplies and in other equipment where the inherent properties of voltage regulation and current limiting are useful. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Ferroresonant Voltage Regulators" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95021 …} #channels: Doctrine\ORM\PersistentCollection {#95027 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95023 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95025 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95013 …} -apiLastModifiedAt: DateTime @1754517600 {#95008 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95009 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @642808800 {#95010 : 1990-05-16 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @881622000 {#95011 : 1997-12-09 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "449" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#95015 …} -favorites: Doctrine\ORM\PersistentCollection {#95017 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 232.0 MiB | 5.94 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95044 #id: 8565 #code: "IEEE00000675" #attributes: Doctrine\ORM\PersistentCollection {#95061 …} #variants: Doctrine\ORM\PersistentCollection {#95063 …} #options: Doctrine\ORM\PersistentCollection {#95067 …} #associations: Doctrine\ORM\PersistentCollection {#95065 …} #createdAt: DateTime @1751037524 {#95037 : 2025-06-27 17:18:44.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95038 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95051 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96435 #locale: "en_US" #translatable: App\Entity\Product\Product {#95044} #id: 29269 #name: "IEEE 449:1998 (R2007)" #slug: "ieee-449-1998-r2007-ieee00000675-240217" #description: """ Revision Standard - Inactive-Reserved.<br />\n Ferroresonant transformers used as regulators in electronic power supplies and in other equipment are covered. Guides to application and test procedures are included.<br />\n \t\t\t\t<br />\n This standard pertains to ferroresonant voltage regulators which operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage, and to controlled ferroresonant regulators which maintain substantially constant output voltage regardless of variations, within limits, of input voltage, temperature, frequency and output load. Guides to application and test procedures are included. Provision is made for relating the rectifiers and circuits. Definitions pertaining to ferroresonance and ferroresonant regulators which have not been found elsewhere are included with an appropriate discussion. This standard includes, but is not limited to, the following types of ferroresonant regulators 1) Series ferroresonant regulators 2) Series-parallel ferroresonant regulars(electrically connected) 3) Ferroresonant transformer regulars(magnetically connected) 4) Controlled ferroresonant regulators<br />\n Add new voltage regulator topologies to ferroresonant voltage regulator scheme. New Topology improves overload, stability, size and efficiency over current technology. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Ferroresonant Voltage Regulators" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95053 …} #channels: Doctrine\ORM\PersistentCollection {#95059 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95055 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95057 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95045 …} -apiLastModifiedAt: DateTime @1754517600 {#95039 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1581462000 {#95040 : 2020-02-12 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @928965600 {#95041 : 1999-06-10 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1190844000 {#95042 : 2007-09-27 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#95043 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "449" -bookCollection: "" -pageCount: 38 -documents: Doctrine\ORM\PersistentCollection {#95047 …} -favorites: Doctrine\ORM\PersistentCollection {#95049 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#96415 +product: App\Entity\Product\Product {#95044 #id: 8565 #code: "IEEE00000675" #attributes: Doctrine\ORM\PersistentCollection {#95061 …} #variants: Doctrine\ORM\PersistentCollection {#95063 …} #options: Doctrine\ORM\PersistentCollection {#95067 …} #associations: Doctrine\ORM\PersistentCollection {#95065 …} #createdAt: DateTime @1751037524 {#95037 : 2025-06-27 17:18:44.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95038 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95051 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96435 #locale: "en_US" #translatable: App\Entity\Product\Product {#95044} #id: 29269 #name: "IEEE 449:1998 (R2007)" #slug: "ieee-449-1998-r2007-ieee00000675-240217" #description: """ Revision Standard - Inactive-Reserved.<br />\n Ferroresonant transformers used as regulators in electronic power supplies and in other equipment are covered. Guides to application and test procedures are included.<br />\n \t\t\t\t<br />\n This standard pertains to ferroresonant voltage regulators which operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage, and to controlled ferroresonant regulators which maintain substantially constant output voltage regardless of variations, within limits, of input voltage, temperature, frequency and output load. Guides to application and test procedures are included. Provision is made for relating the rectifiers and circuits. Definitions pertaining to ferroresonance and ferroresonant regulators which have not been found elsewhere are included with an appropriate discussion. This standard includes, but is not limited to, the following types of ferroresonant regulators 1) Series ferroresonant regulators 2) Series-parallel ferroresonant regulars(electrically connected) 3) Ferroresonant transformer regulars(magnetically connected) 4) Controlled ferroresonant regulators<br />\n Add new voltage regulator topologies to ferroresonant voltage regulator scheme. New Topology improves overload, stability, size and efficiency over current technology. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Ferroresonant Voltage Regulators" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95053 …} #channels: Doctrine\ORM\PersistentCollection {#95059 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95055 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95057 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95045 …} -apiLastModifiedAt: DateTime @1754517600 {#95039 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1581462000 {#95040 : 2020-02-12 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @928965600 {#95041 : 1999-06-10 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1190844000 {#95042 : 2007-09-27 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#95043 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "449" -bookCollection: "" -pageCount: 38 -documents: Doctrine\ORM\PersistentCollection {#95047 …} -favorites: Doctrine\ORM\PersistentCollection {#95049 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 232.0 MiB | 0.19 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95044 #id: 8565 #code: "IEEE00000675" #attributes: Doctrine\ORM\PersistentCollection {#95061 …} #variants: Doctrine\ORM\PersistentCollection {#95063 …} #options: Doctrine\ORM\PersistentCollection {#95067 …} #associations: Doctrine\ORM\PersistentCollection {#95065 …} #createdAt: DateTime @1751037524 {#95037 : 2025-06-27 17:18:44.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95038 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95051 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96435 #locale: "en_US" #translatable: App\Entity\Product\Product {#95044} #id: 29269 #name: "IEEE 449:1998 (R2007)" #slug: "ieee-449-1998-r2007-ieee00000675-240217" #description: """ Revision Standard - Inactive-Reserved.<br />\n Ferroresonant transformers used as regulators in electronic power supplies and in other equipment are covered. Guides to application and test procedures are included.<br />\n \t\t\t\t<br />\n This standard pertains to ferroresonant voltage regulators which operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage, and to controlled ferroresonant regulators which maintain substantially constant output voltage regardless of variations, within limits, of input voltage, temperature, frequency and output load. Guides to application and test procedures are included. Provision is made for relating the rectifiers and circuits. Definitions pertaining to ferroresonance and ferroresonant regulators which have not been found elsewhere are included with an appropriate discussion. This standard includes, but is not limited to, the following types of ferroresonant regulators 1) Series ferroresonant regulators 2) Series-parallel ferroresonant regulars(electrically connected) 3) Ferroresonant transformer regulars(magnetically connected) 4) Controlled ferroresonant regulators<br />\n Add new voltage regulator topologies to ferroresonant voltage regulator scheme. New Topology improves overload, stability, size and efficiency over current technology. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Ferroresonant Voltage Regulators" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95053 …} #channels: Doctrine\ORM\PersistentCollection {#95059 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95055 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95057 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95045 …} -apiLastModifiedAt: DateTime @1754517600 {#95039 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1581462000 {#95040 : 2020-02-12 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @928965600 {#95041 : 1999-06-10 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1190844000 {#95042 : 2007-09-27 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#95043 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "449" -bookCollection: "" -pageCount: 38 -documents: Doctrine\ORM\PersistentCollection {#95047 …} -favorites: Doctrine\ORM\PersistentCollection {#95049 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#96449 +product: App\Entity\Product\Product {#95044 #id: 8565 #code: "IEEE00000675" #attributes: Doctrine\ORM\PersistentCollection {#95061 …} #variants: Doctrine\ORM\PersistentCollection {#95063 …} #options: Doctrine\ORM\PersistentCollection {#95067 …} #associations: Doctrine\ORM\PersistentCollection {#95065 …} #createdAt: DateTime @1751037524 {#95037 : 2025-06-27 17:18:44.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95038 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95051 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96435 #locale: "en_US" #translatable: App\Entity\Product\Product {#95044} #id: 29269 #name: "IEEE 449:1998 (R2007)" #slug: "ieee-449-1998-r2007-ieee00000675-240217" #description: """ Revision Standard - Inactive-Reserved.<br />\n Ferroresonant transformers used as regulators in electronic power supplies and in other equipment are covered. Guides to application and test procedures are included.<br />\n \t\t\t\t<br />\n This standard pertains to ferroresonant voltage regulators which operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage, and to controlled ferroresonant regulators which maintain substantially constant output voltage regardless of variations, within limits, of input voltage, temperature, frequency and output load. Guides to application and test procedures are included. Provision is made for relating the rectifiers and circuits. Definitions pertaining to ferroresonance and ferroresonant regulators which have not been found elsewhere are included with an appropriate discussion. This standard includes, but is not limited to, the following types of ferroresonant regulators 1) Series ferroresonant regulators 2) Series-parallel ferroresonant regulars(electrically connected) 3) Ferroresonant transformer regulars(magnetically connected) 4) Controlled ferroresonant regulators<br />\n Add new voltage regulator topologies to ferroresonant voltage regulator scheme. New Topology improves overload, stability, size and efficiency over current technology. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Ferroresonant Voltage Regulators" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95053 …} #channels: Doctrine\ORM\PersistentCollection {#95059 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95055 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95057 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95045 …} -apiLastModifiedAt: DateTime @1754517600 {#95039 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1581462000 {#95040 : 2020-02-12 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @928965600 {#95041 : 1999-06-10 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1190844000 {#95042 : 2007-09-27 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#95043 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "449" -bookCollection: "" -pageCount: 38 -documents: Doctrine\ORM\PersistentCollection {#95047 …} -favorites: Doctrine\ORM\PersistentCollection {#95049 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 232.0 MiB | 0.61 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95044 #id: 8565 #code: "IEEE00000675" #attributes: Doctrine\ORM\PersistentCollection {#95061 …} #variants: Doctrine\ORM\PersistentCollection {#95063 …} #options: Doctrine\ORM\PersistentCollection {#95067 …} #associations: Doctrine\ORM\PersistentCollection {#95065 …} #createdAt: DateTime @1751037524 {#95037 : 2025-06-27 17:18:44.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95038 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95051 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96435 #locale: "en_US" #translatable: App\Entity\Product\Product {#95044} #id: 29269 #name: "IEEE 449:1998 (R2007)" #slug: "ieee-449-1998-r2007-ieee00000675-240217" #description: """ Revision Standard - Inactive-Reserved.<br />\n Ferroresonant transformers used as regulators in electronic power supplies and in other equipment are covered. Guides to application and test procedures are included.<br />\n \t\t\t\t<br />\n This standard pertains to ferroresonant voltage regulators which operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage, and to controlled ferroresonant regulators which maintain substantially constant output voltage regardless of variations, within limits, of input voltage, temperature, frequency and output load. Guides to application and test procedures are included. Provision is made for relating the rectifiers and circuits. Definitions pertaining to ferroresonance and ferroresonant regulators which have not been found elsewhere are included with an appropriate discussion. This standard includes, but is not limited to, the following types of ferroresonant regulators 1) Series ferroresonant regulators 2) Series-parallel ferroresonant regulars(electrically connected) 3) Ferroresonant transformer regulars(magnetically connected) 4) Controlled ferroresonant regulators<br />\n Add new voltage regulator topologies to ferroresonant voltage regulator scheme. New Topology improves overload, stability, size and efficiency over current technology. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Ferroresonant Voltage Regulators" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95053 …} #channels: Doctrine\ORM\PersistentCollection {#95059 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95055 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95057 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95045 …} -apiLastModifiedAt: DateTime @1754517600 {#95039 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1581462000 {#95040 : 2020-02-12 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @928965600 {#95041 : 1999-06-10 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1190844000 {#95042 : 2007-09-27 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#95043 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "449" -bookCollection: "" -pageCount: 38 -documents: Doctrine\ORM\PersistentCollection {#95047 …} -favorites: Doctrine\ORM\PersistentCollection {#95049 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#96522 +product: App\Entity\Product\Product {#95044 #id: 8565 #code: "IEEE00000675" #attributes: Doctrine\ORM\PersistentCollection {#95061 …} #variants: Doctrine\ORM\PersistentCollection {#95063 …} #options: Doctrine\ORM\PersistentCollection {#95067 …} #associations: Doctrine\ORM\PersistentCollection {#95065 …} #createdAt: DateTime @1751037524 {#95037 : 2025-06-27 17:18:44.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95038 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95051 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96435 #locale: "en_US" #translatable: App\Entity\Product\Product {#95044} #id: 29269 #name: "IEEE 449:1998 (R2007)" #slug: "ieee-449-1998-r2007-ieee00000675-240217" #description: """ Revision Standard - Inactive-Reserved.<br />\n Ferroresonant transformers used as regulators in electronic power supplies and in other equipment are covered. Guides to application and test procedures are included.<br />\n \t\t\t\t<br />\n This standard pertains to ferroresonant voltage regulators which operate at relatively constant frequencies and provide substantially constant output voltages in spite of relatively large changes of input voltage, and to controlled ferroresonant regulators which maintain substantially constant output voltage regardless of variations, within limits, of input voltage, temperature, frequency and output load. Guides to application and test procedures are included. Provision is made for relating the rectifiers and circuits. Definitions pertaining to ferroresonance and ferroresonant regulators which have not been found elsewhere are included with an appropriate discussion. This standard includes, but is not limited to, the following types of ferroresonant regulators 1) Series ferroresonant regulators 2) Series-parallel ferroresonant regulars(electrically connected) 3) Ferroresonant transformer regulars(magnetically connected) 4) Controlled ferroresonant regulators<br />\n Add new voltage regulator topologies to ferroresonant voltage regulator scheme. New Topology improves overload, stability, size and efficiency over current technology. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Ferroresonant Voltage Regulators" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95053 …} #channels: Doctrine\ORM\PersistentCollection {#95059 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95055 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95057 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95045 …} -apiLastModifiedAt: DateTime @1754517600 {#95039 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1581462000 {#95040 : 2020-02-12 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @928965600 {#95041 : 1999-06-10 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1190844000 {#95042 : 2007-09-27 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#95043 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "449" -bookCollection: "" -pageCount: 38 -documents: Doctrine\ORM\PersistentCollection {#95047 …} -favorites: Doctrine\ORM\PersistentCollection {#95049 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 232.0 MiB | 6.19 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95075 #id: 8656 #code: "IEEE00000814" #attributes: Doctrine\ORM\PersistentCollection {#95092 …} #variants: Doctrine\ORM\PersistentCollection {#95094 …} #options: Doctrine\ORM\PersistentCollection {#95098 …} #associations: Doctrine\ORM\PersistentCollection {#95096 …} #createdAt: DateTime @1751037599 {#95069 : 2025-06-27 17:19:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95070 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95082 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96664 #locale: "en_US" #translatable: App\Entity\Product\Product {#95075} #id: 29633 #name: "IEEE 581:1978" #slug: "ieee-581-1978-ieee00000814-240308" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n no abstract. Withdrawn Standard. Withdrawn Date: Dec 05, 1991.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95084 …} #channels: Doctrine\ORM\PersistentCollection {#95090 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95086 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95088 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95076 …} -apiLastModifiedAt: DateTime @1754517600 {#95071 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95072 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @262562400 {#95073 : 1978-04-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @691887600 {#95074 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "581" -bookCollection: "" -pageCount: 44 -documents: Doctrine\ORM\PersistentCollection {#95078 …} -favorites: Doctrine\ORM\PersistentCollection {#95080 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "secondary-lighter" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#96644 +product: App\Entity\Product\Product {#95075 #id: 8656 #code: "IEEE00000814" #attributes: Doctrine\ORM\PersistentCollection {#95092 …} #variants: Doctrine\ORM\PersistentCollection {#95094 …} #options: Doctrine\ORM\PersistentCollection {#95098 …} #associations: Doctrine\ORM\PersistentCollection {#95096 …} #createdAt: DateTime @1751037599 {#95069 : 2025-06-27 17:19:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95070 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95082 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96664 #locale: "en_US" #translatable: App\Entity\Product\Product {#95075} #id: 29633 #name: "IEEE 581:1978" #slug: "ieee-581-1978-ieee00000814-240308" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n no abstract. Withdrawn Standard. Withdrawn Date: Dec 05, 1991.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95084 …} #channels: Doctrine\ORM\PersistentCollection {#95090 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95086 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95088 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95076 …} -apiLastModifiedAt: DateTime @1754517600 {#95071 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95072 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @262562400 {#95073 : 1978-04-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @691887600 {#95074 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "581" -bookCollection: "" -pageCount: 44 -documents: Doctrine\ORM\PersistentCollection {#95078 …} -favorites: Doctrine\ORM\PersistentCollection {#95080 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "secondary-lighter" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 232.0 MiB | 0.18 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95075 #id: 8656 #code: "IEEE00000814" #attributes: Doctrine\ORM\PersistentCollection {#95092 …} #variants: Doctrine\ORM\PersistentCollection {#95094 …} #options: Doctrine\ORM\PersistentCollection {#95098 …} #associations: Doctrine\ORM\PersistentCollection {#95096 …} #createdAt: DateTime @1751037599 {#95069 : 2025-06-27 17:19:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95070 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95082 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96664 #locale: "en_US" #translatable: App\Entity\Product\Product {#95075} #id: 29633 #name: "IEEE 581:1978" #slug: "ieee-581-1978-ieee00000814-240308" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n no abstract. Withdrawn Standard. Withdrawn Date: Dec 05, 1991.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95084 …} #channels: Doctrine\ORM\PersistentCollection {#95090 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95086 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95088 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95076 …} -apiLastModifiedAt: DateTime @1754517600 {#95071 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95072 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @262562400 {#95073 : 1978-04-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @691887600 {#95074 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "581" -bookCollection: "" -pageCount: 44 -documents: Doctrine\ORM\PersistentCollection {#95078 …} -favorites: Doctrine\ORM\PersistentCollection {#95080 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#96671 +product: App\Entity\Product\Product {#95075 #id: 8656 #code: "IEEE00000814" #attributes: Doctrine\ORM\PersistentCollection {#95092 …} #variants: Doctrine\ORM\PersistentCollection {#95094 …} #options: Doctrine\ORM\PersistentCollection {#95098 …} #associations: Doctrine\ORM\PersistentCollection {#95096 …} #createdAt: DateTime @1751037599 {#95069 : 2025-06-27 17:19:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95070 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95082 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96664 #locale: "en_US" #translatable: App\Entity\Product\Product {#95075} #id: 29633 #name: "IEEE 581:1978" #slug: "ieee-581-1978-ieee00000814-240308" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n no abstract. Withdrawn Standard. Withdrawn Date: Dec 05, 1991.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95084 …} #channels: Doctrine\ORM\PersistentCollection {#95090 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95086 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95088 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95076 …} -apiLastModifiedAt: DateTime @1754517600 {#95071 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95072 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @262562400 {#95073 : 1978-04-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @691887600 {#95074 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "581" -bookCollection: "" -pageCount: 44 -documents: Doctrine\ORM\PersistentCollection {#95078 …} -favorites: Doctrine\ORM\PersistentCollection {#95080 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 232.0 MiB | 0.61 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95075 #id: 8656 #code: "IEEE00000814" #attributes: Doctrine\ORM\PersistentCollection {#95092 …} #variants: Doctrine\ORM\PersistentCollection {#95094 …} #options: Doctrine\ORM\PersistentCollection {#95098 …} #associations: Doctrine\ORM\PersistentCollection {#95096 …} #createdAt: DateTime @1751037599 {#95069 : 2025-06-27 17:19:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95070 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95082 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96664 #locale: "en_US" #translatable: App\Entity\Product\Product {#95075} #id: 29633 #name: "IEEE 581:1978" #slug: "ieee-581-1978-ieee00000814-240308" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n no abstract. Withdrawn Standard. Withdrawn Date: Dec 05, 1991.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95084 …} #channels: Doctrine\ORM\PersistentCollection {#95090 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95086 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95088 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95076 …} -apiLastModifiedAt: DateTime @1754517600 {#95071 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95072 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @262562400 {#95073 : 1978-04-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @691887600 {#95074 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "581" -bookCollection: "" -pageCount: 44 -documents: Doctrine\ORM\PersistentCollection {#95078 …} -favorites: Doctrine\ORM\PersistentCollection {#95080 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#96748 +product: App\Entity\Product\Product {#95075 #id: 8656 #code: "IEEE00000814" #attributes: Doctrine\ORM\PersistentCollection {#95092 …} #variants: Doctrine\ORM\PersistentCollection {#95094 …} #options: Doctrine\ORM\PersistentCollection {#95098 …} #associations: Doctrine\ORM\PersistentCollection {#95096 …} #createdAt: DateTime @1751037599 {#95069 : 2025-06-27 17:19:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95070 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95082 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96664 #locale: "en_US" #translatable: App\Entity\Product\Product {#95075} #id: 29633 #name: "IEEE 581:1978" #slug: "ieee-581-1978-ieee00000814-240308" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n no abstract. Withdrawn Standard. Withdrawn Date: Dec 05, 1991.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95084 …} #channels: Doctrine\ORM\PersistentCollection {#95090 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95086 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95088 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95076 …} -apiLastModifiedAt: DateTime @1754517600 {#95071 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95072 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @262562400 {#95073 : 1978-04-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @691887600 {#95074 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "581" -bookCollection: "" -pageCount: 44 -documents: Doctrine\ORM\PersistentCollection {#95078 …} -favorites: Doctrine\ORM\PersistentCollection {#95080 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 232.0 MiB | 5.93 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95106 #id: 8706 #code: "IEEE00000889" #attributes: Doctrine\ORM\PersistentCollection {#95123 …} #variants: Doctrine\ORM\PersistentCollection {#95125 …} #options: Doctrine\ORM\PersistentCollection {#95129 …} #associations: Doctrine\ORM\PersistentCollection {#95127 …} #createdAt: DateTime @1751037642 {#95100 : 2025-06-27 17:20:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95101 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95113 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96873 #locale: "en_US" #translatable: App\Entity\Product\Product {#95106} #id: 29833 #name: "IEEE 641:1987" #slug: "ieee-641-1987-ieee00000889-240358" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95115 …} #channels: Doctrine\ORM\PersistentCollection {#95121 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95117 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95119 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95107 …} -apiLastModifiedAt: DateTime @1754517600 {#95102 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95103 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @592182000 {#95104 : 1988-10-07 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @723337200 {#95105 : 1992-12-03 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "641" -bookCollection: "" -pageCount: 34 -documents: Doctrine\ORM\PersistentCollection {#95109 …} -favorites: Doctrine\ORM\PersistentCollection {#95111 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#96853 +product: App\Entity\Product\Product {#95106 #id: 8706 #code: "IEEE00000889" #attributes: Doctrine\ORM\PersistentCollection {#95123 …} #variants: Doctrine\ORM\PersistentCollection {#95125 …} #options: Doctrine\ORM\PersistentCollection {#95129 …} #associations: Doctrine\ORM\PersistentCollection {#95127 …} #createdAt: DateTime @1751037642 {#95100 : 2025-06-27 17:20:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95101 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95113 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96873 #locale: "en_US" #translatable: App\Entity\Product\Product {#95106} #id: 29833 #name: "IEEE 641:1987" #slug: "ieee-641-1987-ieee00000889-240358" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95115 …} #channels: Doctrine\ORM\PersistentCollection {#95121 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95117 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95119 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95107 …} -apiLastModifiedAt: DateTime @1754517600 {#95102 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95103 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @592182000 {#95104 : 1988-10-07 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @723337200 {#95105 : 1992-12-03 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "641" -bookCollection: "" -pageCount: 34 -documents: Doctrine\ORM\PersistentCollection {#95109 …} -favorites: Doctrine\ORM\PersistentCollection {#95111 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 232.0 MiB | 0.18 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95106 #id: 8706 #code: "IEEE00000889" #attributes: Doctrine\ORM\PersistentCollection {#95123 …} #variants: Doctrine\ORM\PersistentCollection {#95125 …} #options: Doctrine\ORM\PersistentCollection {#95129 …} #associations: Doctrine\ORM\PersistentCollection {#95127 …} #createdAt: DateTime @1751037642 {#95100 : 2025-06-27 17:20:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95101 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95113 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96873 #locale: "en_US" #translatable: App\Entity\Product\Product {#95106} #id: 29833 #name: "IEEE 641:1987" #slug: "ieee-641-1987-ieee00000889-240358" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95115 …} #channels: Doctrine\ORM\PersistentCollection {#95121 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95117 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95119 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95107 …} -apiLastModifiedAt: DateTime @1754517600 {#95102 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95103 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @592182000 {#95104 : 1988-10-07 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @723337200 {#95105 : 1992-12-03 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "641" -bookCollection: "" -pageCount: 34 -documents: Doctrine\ORM\PersistentCollection {#95109 …} -favorites: Doctrine\ORM\PersistentCollection {#95111 …} } ] |
|||
| Attributes | [ "showFullLabel" => false ] |
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| ProductCard | App\Twig\Components\ProductCard | 232.0 MiB | 6.03 ms | |
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| ProductState | App\Twig\Components\ProductState | 232.0 MiB | 0.18 ms | |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 232.0 MiB | 0.60 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95136 #id: 9001 #code: "IEEE00001457" #attributes: Doctrine\ORM\PersistentCollection {#95153 …} #variants: Doctrine\ORM\PersistentCollection {#95155 …} #options: Doctrine\ORM\PersistentCollection {#95159 …} #associations: Doctrine\ORM\PersistentCollection {#95157 …} #createdAt: DateTime @1751037888 {#95131 : 2025-06-27 17:24:48.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95132 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95143 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97082 #locale: "en_US" #translatable: App\Entity\Product\Product {#95136} #id: 31013 #name: "IEEE 1005:1991" #slug: "ieee-1005-1991-ieee00001457-240653" #description: """ New IEEE Standard - Superseded.<br />\n An introduction to the physics unique to this type of memory and an overview of typical<br />\n array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n structure that have been used in commercially available devices are described. The various<br />\n reliability considerations involved in these devices are explored. Retention and endurance<br />\n failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n endurance of the arrays are discussed. The specification and engineering verification of<br />\n endurance are described. The more common features incorporated into the arrays and methods<br />\n for testing these complex products efficiently are addressed. The effects that various forms of<br />\n ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n \t\t\t\t<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95145 …} #channels: Doctrine\ORM\PersistentCollection {#95151 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95147 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95149 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95137 …} -apiLastModifiedAt: DateTime @1754517600 {#95133 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95134 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @687654000 {#95135 : 1991-10-17 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 41 -documents: Doctrine\ORM\PersistentCollection {#95139 …} -favorites: Doctrine\ORM\PersistentCollection {#95141 …} } ] |
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| Component | App\Twig\Components\ProductMostRecent {#97166 +product: App\Entity\Product\Product {#95136 #id: 9001 #code: "IEEE00001457" #attributes: Doctrine\ORM\PersistentCollection {#95153 …} #variants: Doctrine\ORM\PersistentCollection {#95155 …} #options: Doctrine\ORM\PersistentCollection {#95159 …} #associations: Doctrine\ORM\PersistentCollection {#95157 …} #createdAt: DateTime @1751037888 {#95131 : 2025-06-27 17:24:48.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95132 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95143 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97082 #locale: "en_US" #translatable: App\Entity\Product\Product {#95136} #id: 31013 #name: "IEEE 1005:1991" #slug: "ieee-1005-1991-ieee00001457-240653" #description: """ New IEEE Standard - Superseded.<br />\n An introduction to the physics unique to this type of memory and an overview of typical<br />\n array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n structure that have been used in commercially available devices are described. The various<br />\n reliability considerations involved in these devices are explored. Retention and endurance<br />\n failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n endurance of the arrays are discussed. The specification and engineering verification of<br />\n endurance are described. The more common features incorporated into the arrays and methods<br />\n for testing these complex products efficiently are addressed. The effects that various forms of<br />\n ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n \t\t\t\t<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95145 …} #channels: Doctrine\ORM\PersistentCollection {#95151 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95147 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95149 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95137 …} -apiLastModifiedAt: DateTime @1754517600 {#95133 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95134 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @687654000 {#95135 : 1991-10-17 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 41 -documents: Doctrine\ORM\PersistentCollection {#95139 …} -favorites: Doctrine\ORM\PersistentCollection {#95141 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 232.0 MiB | 5.78 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95167 #id: 9002 #code: "IEEE00001458" #attributes: Doctrine\ORM\PersistentCollection {#95184 …} #variants: Doctrine\ORM\PersistentCollection {#95186 …} #options: Doctrine\ORM\PersistentCollection {#95190 …} #associations: Doctrine\ORM\PersistentCollection {#95188 …} #createdAt: DateTime @1751037889 {#95161 : 2025-06-27 17:24:49.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95162 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95174 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97291 #locale: "en_US" #translatable: App\Entity\Product\Product {#95167} #id: 31017 #name: "IEEE 1005:1998" #slug: "ieee-1005-1998-ieee00001458-240654" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n \t\t\t\t<br />\n Modify the present FGA standard to include floating gate "flash" EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95176 …} #channels: Doctrine\ORM\PersistentCollection {#95182 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95178 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95180 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95168 …} -apiLastModifiedAt: DateTime @1754517600 {#95163 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95164 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @918514800 {#95165 : 1999-02-09 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1074207600 {#95166 : 2004-01-16 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 129 -documents: Doctrine\ORM\PersistentCollection {#95170 …} -favorites: Doctrine\ORM\PersistentCollection {#95172 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
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| Component | App\Twig\Components\ProductCard {#97271 +product: App\Entity\Product\Product {#95167 #id: 9002 #code: "IEEE00001458" #attributes: Doctrine\ORM\PersistentCollection {#95184 …} #variants: Doctrine\ORM\PersistentCollection {#95186 …} #options: Doctrine\ORM\PersistentCollection {#95190 …} #associations: Doctrine\ORM\PersistentCollection {#95188 …} #createdAt: DateTime @1751037889 {#95161 : 2025-06-27 17:24:49.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95162 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95174 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97291 #locale: "en_US" #translatable: App\Entity\Product\Product {#95167} #id: 31017 #name: "IEEE 1005:1998" #slug: "ieee-1005-1998-ieee00001458-240654" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n \t\t\t\t<br />\n Modify the present FGA standard to include floating gate "flash" EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95176 …} #channels: Doctrine\ORM\PersistentCollection {#95182 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95178 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95180 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95168 …} -apiLastModifiedAt: DateTime @1754517600 {#95163 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95164 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @918514800 {#95165 : 1999-02-09 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1074207600 {#95166 : 2004-01-16 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 129 -documents: Doctrine\ORM\PersistentCollection {#95170 …} -favorites: Doctrine\ORM\PersistentCollection {#95172 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 232.0 MiB | 0.18 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95167 #id: 9002 #code: "IEEE00001458" #attributes: Doctrine\ORM\PersistentCollection {#95184 …} #variants: Doctrine\ORM\PersistentCollection {#95186 …} #options: Doctrine\ORM\PersistentCollection {#95190 …} #associations: Doctrine\ORM\PersistentCollection {#95188 …} #createdAt: DateTime @1751037889 {#95161 : 2025-06-27 17:24:49.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95162 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95174 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97291 #locale: "en_US" #translatable: App\Entity\Product\Product {#95167} #id: 31017 #name: "IEEE 1005:1998" #slug: "ieee-1005-1998-ieee00001458-240654" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n \t\t\t\t<br />\n Modify the present FGA standard to include floating gate "flash" EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95176 …} #channels: Doctrine\ORM\PersistentCollection {#95182 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95178 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95180 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95168 …} -apiLastModifiedAt: DateTime @1754517600 {#95163 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95164 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @918514800 {#95165 : 1999-02-09 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1074207600 {#95166 : 2004-01-16 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 129 -documents: Doctrine\ORM\PersistentCollection {#95170 …} -favorites: Doctrine\ORM\PersistentCollection {#95172 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#97298 +product: App\Entity\Product\Product {#95167 #id: 9002 #code: "IEEE00001458" #attributes: Doctrine\ORM\PersistentCollection {#95184 …} #variants: Doctrine\ORM\PersistentCollection {#95186 …} #options: Doctrine\ORM\PersistentCollection {#95190 …} #associations: Doctrine\ORM\PersistentCollection {#95188 …} #createdAt: DateTime @1751037889 {#95161 : 2025-06-27 17:24:49.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95162 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95174 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97291 #locale: "en_US" #translatable: App\Entity\Product\Product {#95167} #id: 31017 #name: "IEEE 1005:1998" #slug: "ieee-1005-1998-ieee00001458-240654" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n \t\t\t\t<br />\n Modify the present FGA standard to include floating gate "flash" EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95176 …} #channels: Doctrine\ORM\PersistentCollection {#95182 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95178 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95180 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95168 …} -apiLastModifiedAt: DateTime @1754517600 {#95163 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95164 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @918514800 {#95165 : 1999-02-09 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1074207600 {#95166 : 2004-01-16 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 129 -documents: Doctrine\ORM\PersistentCollection {#95170 …} -favorites: Doctrine\ORM\PersistentCollection {#95172 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 232.0 MiB | 0.63 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95167 #id: 9002 #code: "IEEE00001458" #attributes: Doctrine\ORM\PersistentCollection {#95184 …} #variants: Doctrine\ORM\PersistentCollection {#95186 …} #options: Doctrine\ORM\PersistentCollection {#95190 …} #associations: Doctrine\ORM\PersistentCollection {#95188 …} #createdAt: DateTime @1751037889 {#95161 : 2025-06-27 17:24:49.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95162 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95174 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97291 #locale: "en_US" #translatable: App\Entity\Product\Product {#95167} #id: 31017 #name: "IEEE 1005:1998" #slug: "ieee-1005-1998-ieee00001458-240654" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n \t\t\t\t<br />\n Modify the present FGA standard to include floating gate "flash" EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95176 …} #channels: Doctrine\ORM\PersistentCollection {#95182 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95178 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95180 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95168 …} -apiLastModifiedAt: DateTime @1754517600 {#95163 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95164 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @918514800 {#95165 : 1999-02-09 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1074207600 {#95166 : 2004-01-16 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 129 -documents: Doctrine\ORM\PersistentCollection {#95170 …} -favorites: Doctrine\ORM\PersistentCollection {#95172 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#97375 +product: App\Entity\Product\Product {#95167 #id: 9002 #code: "IEEE00001458" #attributes: Doctrine\ORM\PersistentCollection {#95184 …} #variants: Doctrine\ORM\PersistentCollection {#95186 …} #options: Doctrine\ORM\PersistentCollection {#95190 …} #associations: Doctrine\ORM\PersistentCollection {#95188 …} #createdAt: DateTime @1751037889 {#95161 : 2025-06-27 17:24:49.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#95162 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95174 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97291 #locale: "en_US" #translatable: App\Entity\Product\Product {#95167} #id: 31017 #name: "IEEE 1005:1998" #slug: "ieee-1005-1998-ieee00001458-240654" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n \t\t\t\t<br />\n Modify the present FGA standard to include floating gate "flash" EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95176 …} #channels: Doctrine\ORM\PersistentCollection {#95182 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95178 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95180 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95168 …} -apiLastModifiedAt: DateTime @1754517600 {#95163 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95164 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @918514800 {#95165 : 1999-02-09 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1074207600 {#95166 : 2004-01-16 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 129 -documents: Doctrine\ORM\PersistentCollection {#95170 …} -favorites: Doctrine\ORM\PersistentCollection {#95172 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductCard | App\Twig\Components\ProductCard | 232.0 MiB | 7.64 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95199 #id: 9751 #code: "IEEE00002852" #attributes: Doctrine\ORM\PersistentCollection {#95216 …} #variants: Doctrine\ORM\PersistentCollection {#95218 …} #options: Doctrine\ORM\PersistentCollection {#95222 …} #associations: Doctrine\ORM\PersistentCollection {#95220 …} #createdAt: DateTime @1751038526 {#95192 : 2025-06-27 17:35:26.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#95193 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95206 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97500 #locale: "en_US" #translatable: App\Entity\Product\Product {#95199} #id: 34013 #name: "IEEE C62.37:1996 (R2010)" #slug: "ieee-c62-37-1996-r2010-ieee00002852-241403" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc.<br />\n \t\t\t\t<br />\n This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc. These protective devices are designed to limit voltage surges on communication circuits and on power circuits operating from direct current (dc) to 420 Hz. The thyristor SPD can be manufactured with unidirectional or bidirectional, symmetrical, or asymmetrical V-I characteristics. This standard contains definitions, service conditions, and a series of test criteria for determining the characteristics of a thyristor SPD. If the characteristics differ with the direction of conduction, each polarity shall be separately specified. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95208 …} #channels: Doctrine\ORM\PersistentCollection {#95214 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95210 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95212 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95200 …} -apiLastModifiedAt: DateTime @1743289200 {#95194 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1622671200 {#95195 : 2021-06-03 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @849308400 {#95196 : 1996-11-30 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @1269471600 {#95197 : 2010-03-25 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @1616626800 {#95198 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "C62.37" -bookCollection: "" -pageCount: 60 -documents: Doctrine\ORM\PersistentCollection {#95202 …} -favorites: Doctrine\ORM\PersistentCollection {#95204 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "secondary-lighter" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#97480 +product: App\Entity\Product\Product {#95199 #id: 9751 #code: "IEEE00002852" #attributes: Doctrine\ORM\PersistentCollection {#95216 …} #variants: Doctrine\ORM\PersistentCollection {#95218 …} #options: Doctrine\ORM\PersistentCollection {#95222 …} #associations: Doctrine\ORM\PersistentCollection {#95220 …} #createdAt: DateTime @1751038526 {#95192 : 2025-06-27 17:35:26.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#95193 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95206 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97500 #locale: "en_US" #translatable: App\Entity\Product\Product {#95199} #id: 34013 #name: "IEEE C62.37:1996 (R2010)" #slug: "ieee-c62-37-1996-r2010-ieee00002852-241403" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc.<br />\n \t\t\t\t<br />\n This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc. These protective devices are designed to limit voltage surges on communication circuits and on power circuits operating from direct current (dc) to 420 Hz. The thyristor SPD can be manufactured with unidirectional or bidirectional, symmetrical, or asymmetrical V-I characteristics. This standard contains definitions, service conditions, and a series of test criteria for determining the characteristics of a thyristor SPD. If the characteristics differ with the direction of conduction, each polarity shall be separately specified. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95208 …} #channels: Doctrine\ORM\PersistentCollection {#95214 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95210 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95212 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95200 …} -apiLastModifiedAt: DateTime @1743289200 {#95194 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1622671200 {#95195 : 2021-06-03 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @849308400 {#95196 : 1996-11-30 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @1269471600 {#95197 : 2010-03-25 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @1616626800 {#95198 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "C62.37" -bookCollection: "" -pageCount: 60 -documents: Doctrine\ORM\PersistentCollection {#95202 …} -favorites: Doctrine\ORM\PersistentCollection {#95204 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "secondary-lighter" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 232.0 MiB | 0.18 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95199 #id: 9751 #code: "IEEE00002852" #attributes: Doctrine\ORM\PersistentCollection {#95216 …} #variants: Doctrine\ORM\PersistentCollection {#95218 …} #options: Doctrine\ORM\PersistentCollection {#95222 …} #associations: Doctrine\ORM\PersistentCollection {#95220 …} #createdAt: DateTime @1751038526 {#95192 : 2025-06-27 17:35:26.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#95193 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95206 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97500 #locale: "en_US" #translatable: App\Entity\Product\Product {#95199} #id: 34013 #name: "IEEE C62.37:1996 (R2010)" #slug: "ieee-c62-37-1996-r2010-ieee00002852-241403" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc.<br />\n \t\t\t\t<br />\n This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc. These protective devices are designed to limit voltage surges on communication circuits and on power circuits operating from direct current (dc) to 420 Hz. The thyristor SPD can be manufactured with unidirectional or bidirectional, symmetrical, or asymmetrical V-I characteristics. This standard contains definitions, service conditions, and a series of test criteria for determining the characteristics of a thyristor SPD. If the characteristics differ with the direction of conduction, each polarity shall be separately specified. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95208 …} #channels: Doctrine\ORM\PersistentCollection {#95214 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95210 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95212 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95200 …} -apiLastModifiedAt: DateTime @1743289200 {#95194 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1622671200 {#95195 : 2021-06-03 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @849308400 {#95196 : 1996-11-30 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @1269471600 {#95197 : 2010-03-25 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @1616626800 {#95198 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "C62.37" -bookCollection: "" -pageCount: 60 -documents: Doctrine\ORM\PersistentCollection {#95202 …} -favorites: Doctrine\ORM\PersistentCollection {#95204 …} } ] |
|||
| Attributes | [ "showFullLabel" => false ] |
|||
| Component | App\Twig\Components\ProductState {#97514 +product: App\Entity\Product\Product {#95199 #id: 9751 #code: "IEEE00002852" #attributes: Doctrine\ORM\PersistentCollection {#95216 …} #variants: Doctrine\ORM\PersistentCollection {#95218 …} #options: Doctrine\ORM\PersistentCollection {#95222 …} #associations: Doctrine\ORM\PersistentCollection {#95220 …} #createdAt: DateTime @1751038526 {#95192 : 2025-06-27 17:35:26.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#95193 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95206 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97500 #locale: "en_US" #translatable: App\Entity\Product\Product {#95199} #id: 34013 #name: "IEEE C62.37:1996 (R2010)" #slug: "ieee-c62-37-1996-r2010-ieee00002852-241403" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc.<br />\n \t\t\t\t<br />\n This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc. These protective devices are designed to limit voltage surges on communication circuits and on power circuits operating from direct current (dc) to 420 Hz. The thyristor SPD can be manufactured with unidirectional or bidirectional, symmetrical, or asymmetrical V-I characteristics. This standard contains definitions, service conditions, and a series of test criteria for determining the characteristics of a thyristor SPD. If the characteristics differ with the direction of conduction, each polarity shall be separately specified. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95208 …} #channels: Doctrine\ORM\PersistentCollection {#95214 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95210 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95212 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95200 …} -apiLastModifiedAt: DateTime @1743289200 {#95194 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1622671200 {#95195 : 2021-06-03 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @849308400 {#95196 : 1996-11-30 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @1269471600 {#95197 : 2010-03-25 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @1616626800 {#95198 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "C62.37" -bookCollection: "" -pageCount: 60 -documents: Doctrine\ORM\PersistentCollection {#95202 …} -favorites: Doctrine\ORM\PersistentCollection {#95204 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 232.0 MiB | 0.63 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95199 #id: 9751 #code: "IEEE00002852" #attributes: Doctrine\ORM\PersistentCollection {#95216 …} #variants: Doctrine\ORM\PersistentCollection {#95218 …} #options: Doctrine\ORM\PersistentCollection {#95222 …} #associations: Doctrine\ORM\PersistentCollection {#95220 …} #createdAt: DateTime @1751038526 {#95192 : 2025-06-27 17:35:26.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#95193 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95206 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97500 #locale: "en_US" #translatable: App\Entity\Product\Product {#95199} #id: 34013 #name: "IEEE C62.37:1996 (R2010)" #slug: "ieee-c62-37-1996-r2010-ieee00002852-241403" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc.<br />\n \t\t\t\t<br />\n This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc. These protective devices are designed to limit voltage surges on communication circuits and on power circuits operating from direct current (dc) to 420 Hz. The thyristor SPD can be manufactured with unidirectional or bidirectional, symmetrical, or asymmetrical V-I characteristics. This standard contains definitions, service conditions, and a series of test criteria for determining the characteristics of a thyristor SPD. If the characteristics differ with the direction of conduction, each polarity shall be separately specified. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95208 …} #channels: Doctrine\ORM\PersistentCollection {#95214 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95210 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95212 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95200 …} -apiLastModifiedAt: DateTime @1743289200 {#95194 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1622671200 {#95195 : 2021-06-03 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @849308400 {#95196 : 1996-11-30 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @1269471600 {#95197 : 2010-03-25 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @1616626800 {#95198 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "C62.37" -bookCollection: "" -pageCount: 60 -documents: Doctrine\ORM\PersistentCollection {#95202 …} -favorites: Doctrine\ORM\PersistentCollection {#95204 …} } ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductMostRecent {#97587 +product: App\Entity\Product\Product {#95199 #id: 9751 #code: "IEEE00002852" #attributes: Doctrine\ORM\PersistentCollection {#95216 …} #variants: Doctrine\ORM\PersistentCollection {#95218 …} #options: Doctrine\ORM\PersistentCollection {#95222 …} #associations: Doctrine\ORM\PersistentCollection {#95220 …} #createdAt: DateTime @1751038526 {#95192 : 2025-06-27 17:35:26.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#95193 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95206 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97500 #locale: "en_US" #translatable: App\Entity\Product\Product {#95199} #id: 34013 #name: "IEEE C62.37:1996 (R2010)" #slug: "ieee-c62-37-1996-r2010-ieee00002852-241403" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc.<br />\n \t\t\t\t<br />\n This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc. These protective devices are designed to limit voltage surges on communication circuits and on power circuits operating from direct current (dc) to 420 Hz. The thyristor SPD can be manufactured with unidirectional or bidirectional, symmetrical, or asymmetrical V-I characteristics. This standard contains definitions, service conditions, and a series of test criteria for determining the characteristics of a thyristor SPD. If the characteristics differ with the direction of conduction, each polarity shall be separately specified. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95208 …} #channels: Doctrine\ORM\PersistentCollection {#95214 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95210 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95212 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95200 …} -apiLastModifiedAt: DateTime @1743289200 {#95194 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1622671200 {#95195 : 2021-06-03 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @849308400 {#95196 : 1996-11-30 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @1269471600 {#95197 : 2010-03-25 00:00:00.0 Europe/Paris (+01:00) } -canceledAt: DateTime @1616626800 {#95198 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "C62.37" -bookCollection: "" -pageCount: 60 -documents: Doctrine\ORM\PersistentCollection {#95202 …} -favorites: Doctrine\ORM\PersistentCollection {#95204 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductCard | App\Twig\Components\ProductCard | 232.0 MiB | 5.86 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95229 #id: 9752 #code: "IEEE00002853" #attributes: Doctrine\ORM\PersistentCollection {#95246 …} #variants: Doctrine\ORM\PersistentCollection {#95248 …} #options: Doctrine\ORM\PersistentCollection {#95252 …} #associations: Doctrine\ORM\PersistentCollection {#95250 …} #createdAt: DateTime @1751038527 {#95224 : 2025-06-27 17:35:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95225 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95236 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97729 #locale: "en_US" #translatable: App\Entity\Product\Product {#95229} #id: 34017 #name: "IEEE C62.37.1:2000" #slug: "ieee-c62-37-1-2000-ieee00002853-241404" #description: """ New IEEE Standard - Superseded.<br />\n Applications information on fixed voltage and gated thyristor surge protective devices(SPDs) are provided. Key device parameters and their sensitivities are explained. Several workedtelecommunication circuit design examples are given.<br />\n \t\t\t\t<br />\n This Guide is intended to complement the IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices (ANSI/IEEE C62.37-1996) The definitions used are the same. This publication contains information on basic function and component description, general terms and definitions, electrical environment, comparative SPD technologies, parameter interpretation and application, example designs.<br />\n This application guide applies to Thyristor Surge Protective Devices components used in systems with voltages up to 1000Vrms or 1200Vdc. These components are designed to limit overvoltages and divert surge currents by limiting the voltage and switching to a low impedance actions. Although telecommunication circuits are the main application of Thyristor SPDs, this guide will also provide useful information for other protection applications. When properly applied it protects telecommunication circuits from failure and damage. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Guide for the Application of Thyristor Surge Protective Devices" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95238 …} #channels: Doctrine\ORM\PersistentCollection {#95244 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95240 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95242 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95230 …} -apiLastModifiedAt: DateTime @1754517600 {#95226 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95227 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @987544800 {#95228 : 2001-04-18 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "C62.37.1" -bookCollection: "" -pageCount: 68 -documents: Doctrine\ORM\PersistentCollection {#95232 …} -favorites: Doctrine\ORM\PersistentCollection {#95234 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
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| ProductState | App\Twig\Components\ProductState | 232.0 MiB | 0.18 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95229 #id: 9752 #code: "IEEE00002853" #attributes: Doctrine\ORM\PersistentCollection {#95246 …} #variants: Doctrine\ORM\PersistentCollection {#95248 …} #options: Doctrine\ORM\PersistentCollection {#95252 …} #associations: Doctrine\ORM\PersistentCollection {#95250 …} #createdAt: DateTime @1751038527 {#95224 : 2025-06-27 17:35:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95225 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95236 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97729 #locale: "en_US" #translatable: App\Entity\Product\Product {#95229} #id: 34017 #name: "IEEE C62.37.1:2000" #slug: "ieee-c62-37-1-2000-ieee00002853-241404" #description: """ New IEEE Standard - Superseded.<br />\n Applications information on fixed voltage and gated thyristor surge protective devices(SPDs) are provided. Key device parameters and their sensitivities are explained. Several workedtelecommunication circuit design examples are given.<br />\n \t\t\t\t<br />\n This Guide is intended to complement the IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices (ANSI/IEEE C62.37-1996) The definitions used are the same. This publication contains information on basic function and component description, general terms and definitions, electrical environment, comparative SPD technologies, parameter interpretation and application, example designs.<br />\n This application guide applies to Thyristor Surge Protective Devices components used in systems with voltages up to 1000Vrms or 1200Vdc. These components are designed to limit overvoltages and divert surge currents by limiting the voltage and switching to a low impedance actions. Although telecommunication circuits are the main application of Thyristor SPDs, this guide will also provide useful information for other protection applications. When properly applied it protects telecommunication circuits from failure and damage. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Guide for the Application of Thyristor Surge Protective Devices" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95238 …} #channels: Doctrine\ORM\PersistentCollection {#95244 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95240 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95242 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95230 …} -apiLastModifiedAt: DateTime @1754517600 {#95226 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95227 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @987544800 {#95228 : 2001-04-18 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "C62.37.1" -bookCollection: "" -pageCount: 68 -documents: Doctrine\ORM\PersistentCollection {#95232 …} -favorites: Doctrine\ORM\PersistentCollection {#95234 …} } ] |
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| Component | App\Twig\Components\ProductState {#97736 +product: App\Entity\Product\Product {#95229 #id: 9752 #code: "IEEE00002853" #attributes: Doctrine\ORM\PersistentCollection {#95246 …} #variants: Doctrine\ORM\PersistentCollection {#95248 …} #options: Doctrine\ORM\PersistentCollection {#95252 …} #associations: Doctrine\ORM\PersistentCollection {#95250 …} #createdAt: DateTime @1751038527 {#95224 : 2025-06-27 17:35:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95225 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95236 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97729 #locale: "en_US" #translatable: App\Entity\Product\Product {#95229} #id: 34017 #name: "IEEE C62.37.1:2000" #slug: "ieee-c62-37-1-2000-ieee00002853-241404" #description: """ New IEEE Standard - Superseded.<br />\n Applications information on fixed voltage and gated thyristor surge protective devices(SPDs) are provided. Key device parameters and their sensitivities are explained. Several workedtelecommunication circuit design examples are given.<br />\n \t\t\t\t<br />\n This Guide is intended to complement the IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices (ANSI/IEEE C62.37-1996) The definitions used are the same. This publication contains information on basic function and component description, general terms and definitions, electrical environment, comparative SPD technologies, parameter interpretation and application, example designs.<br />\n This application guide applies to Thyristor Surge Protective Devices components used in systems with voltages up to 1000Vrms or 1200Vdc. These components are designed to limit overvoltages and divert surge currents by limiting the voltage and switching to a low impedance actions. Although telecommunication circuits are the main application of Thyristor SPDs, this guide will also provide useful information for other protection applications. When properly applied it protects telecommunication circuits from failure and damage. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Guide for the Application of Thyristor Surge Protective Devices" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95238 …} #channels: Doctrine\ORM\PersistentCollection {#95244 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95240 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95242 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95230 …} -apiLastModifiedAt: DateTime @1754517600 {#95226 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95227 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @987544800 {#95228 : 2001-04-18 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "C62.37.1" -bookCollection: "" -pageCount: 68 -documents: Doctrine\ORM\PersistentCollection {#95232 …} -favorites: Doctrine\ORM\PersistentCollection {#95234 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 232.0 MiB | 0.62 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95229 #id: 9752 #code: "IEEE00002853" #attributes: Doctrine\ORM\PersistentCollection {#95246 …} #variants: Doctrine\ORM\PersistentCollection {#95248 …} #options: Doctrine\ORM\PersistentCollection {#95252 …} #associations: Doctrine\ORM\PersistentCollection {#95250 …} #createdAt: DateTime @1751038527 {#95224 : 2025-06-27 17:35:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95225 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95236 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97729 #locale: "en_US" #translatable: App\Entity\Product\Product {#95229} #id: 34017 #name: "IEEE C62.37.1:2000" #slug: "ieee-c62-37-1-2000-ieee00002853-241404" #description: """ New IEEE Standard - Superseded.<br />\n Applications information on fixed voltage and gated thyristor surge protective devices(SPDs) are provided. Key device parameters and their sensitivities are explained. Several workedtelecommunication circuit design examples are given.<br />\n \t\t\t\t<br />\n This Guide is intended to complement the IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices (ANSI/IEEE C62.37-1996) The definitions used are the same. This publication contains information on basic function and component description, general terms and definitions, electrical environment, comparative SPD technologies, parameter interpretation and application, example designs.<br />\n This application guide applies to Thyristor Surge Protective Devices components used in systems with voltages up to 1000Vrms or 1200Vdc. These components are designed to limit overvoltages and divert surge currents by limiting the voltage and switching to a low impedance actions. Although telecommunication circuits are the main application of Thyristor SPDs, this guide will also provide useful information for other protection applications. When properly applied it protects telecommunication circuits from failure and damage. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Guide for the Application of Thyristor Surge Protective Devices" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95238 …} #channels: Doctrine\ORM\PersistentCollection {#95244 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95240 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95242 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95230 …} -apiLastModifiedAt: DateTime @1754517600 {#95226 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95227 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @987544800 {#95228 : 2001-04-18 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "C62.37.1" -bookCollection: "" -pageCount: 68 -documents: Doctrine\ORM\PersistentCollection {#95232 …} -favorites: Doctrine\ORM\PersistentCollection {#95234 …} } ] |
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| Component | App\Twig\Components\ProductMostRecent {#97813 +product: App\Entity\Product\Product {#95229 #id: 9752 #code: "IEEE00002853" #attributes: Doctrine\ORM\PersistentCollection {#95246 …} #variants: Doctrine\ORM\PersistentCollection {#95248 …} #options: Doctrine\ORM\PersistentCollection {#95252 …} #associations: Doctrine\ORM\PersistentCollection {#95250 …} #createdAt: DateTime @1751038527 {#95224 : 2025-06-27 17:35:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95225 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95236 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97729 #locale: "en_US" #translatable: App\Entity\Product\Product {#95229} #id: 34017 #name: "IEEE C62.37.1:2000" #slug: "ieee-c62-37-1-2000-ieee00002853-241404" #description: """ New IEEE Standard - Superseded.<br />\n Applications information on fixed voltage and gated thyristor surge protective devices(SPDs) are provided. Key device parameters and their sensitivities are explained. Several workedtelecommunication circuit design examples are given.<br />\n \t\t\t\t<br />\n This Guide is intended to complement the IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices (ANSI/IEEE C62.37-1996) The definitions used are the same. This publication contains information on basic function and component description, general terms and definitions, electrical environment, comparative SPD technologies, parameter interpretation and application, example designs.<br />\n This application guide applies to Thyristor Surge Protective Devices components used in systems with voltages up to 1000Vrms or 1200Vdc. These components are designed to limit overvoltages and divert surge currents by limiting the voltage and switching to a low impedance actions. Although telecommunication circuits are the main application of Thyristor SPDs, this guide will also provide useful information for other protection applications. When properly applied it protects telecommunication circuits from failure and damage. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Guide for the Application of Thyristor Surge Protective Devices" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95238 …} #channels: Doctrine\ORM\PersistentCollection {#95244 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95240 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95242 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95230 …} -apiLastModifiedAt: DateTime @1754517600 {#95226 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95227 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @987544800 {#95228 : 2001-04-18 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "C62.37.1" -bookCollection: "" -pageCount: 68 -documents: Doctrine\ORM\PersistentCollection {#95232 …} -favorites: Doctrine\ORM\PersistentCollection {#95234 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 232.0 MiB | 7.35 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95260 #id: 10018 #code: "IEEE00003457" #attributes: Doctrine\ORM\PersistentCollection {#95277 …} #variants: Doctrine\ORM\PersistentCollection {#95279 …} #options: Doctrine\ORM\PersistentCollection {#95283 …} #associations: Doctrine\ORM\PersistentCollection {#95281 …} #createdAt: DateTime @1751038750 {#95254 : 2025-06-27 17:39:10.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#95255 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95267 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97938 #locale: "en_US" #translatable: App\Entity\Product\Product {#95260} #id: 35081 #name: "IEEE/ANSI N42.31:2003" #slug: "ieee-ansi-n42-31-2003-ieee00003457-241670" #description: """ New IEEE Standard - Active.<br />\n Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements.<br />\n \t\t\t\t<br />\n This standard applies to wide-bandgap semiconductor radiation detectors, such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe, referred to herein as CZT), and mercuric iodide (HgI2) used in the detection and measurement of ionizing radiation at room temperature; gamma rays, X-rays, and charged particles are covered. The measurement procedures described herein apply primarily to detector elements having planar, hemispherical, or other geometries in which charge carriers of both polarities contribute to the output signal. When the devices are an integral part of a system, it may not be possible for a user to make tests on the detector alone. In this instance, tests on the detector element must be established by mutual agreement between the manufacturer and the user.<br />\n The purpose of this standard is to establish terminology and test procedures that have the same meaning to both manufacturers and users. Not all tests described in this standard are mandatory, but those used to specify performance shall be made in accordance with the procedures described herein. (Use of the word "shall" indicates a mandatory requirement, "must" a physical one, and "should" means "recommended.") """ #metaKeywords: null #metaDescription: null #shortDescription: "American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95269 …} #channels: Doctrine\ORM\PersistentCollection {#95275 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95271 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95273 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95261 …} -apiLastModifiedAt: DateTime @1743289200 {#95256 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1578006000 {#95257 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1061330400 {#95258 : 2003-08-20 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1061330400 {#95259 : 2003-08-20 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "N42.31" -bookCollection: "" -pageCount: 40 -documents: Doctrine\ORM\PersistentCollection {#95263 …} -favorites: Doctrine\ORM\PersistentCollection {#95265 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "secondary-lighter" "hoverType" => "border-black" ] |
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| Component | App\Twig\Components\ProductCard {#97918 +product: App\Entity\Product\Product {#95260 #id: 10018 #code: "IEEE00003457" #attributes: Doctrine\ORM\PersistentCollection {#95277 …} #variants: Doctrine\ORM\PersistentCollection {#95279 …} #options: Doctrine\ORM\PersistentCollection {#95283 …} #associations: Doctrine\ORM\PersistentCollection {#95281 …} #createdAt: DateTime @1751038750 {#95254 : 2025-06-27 17:39:10.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#95255 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95267 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97938 #locale: "en_US" #translatable: App\Entity\Product\Product {#95260} #id: 35081 #name: "IEEE/ANSI N42.31:2003" #slug: "ieee-ansi-n42-31-2003-ieee00003457-241670" #description: """ New IEEE Standard - Active.<br />\n Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements.<br />\n \t\t\t\t<br />\n This standard applies to wide-bandgap semiconductor radiation detectors, such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe, referred to herein as CZT), and mercuric iodide (HgI2) used in the detection and measurement of ionizing radiation at room temperature; gamma rays, X-rays, and charged particles are covered. The measurement procedures described herein apply primarily to detector elements having planar, hemispherical, or other geometries in which charge carriers of both polarities contribute to the output signal. When the devices are an integral part of a system, it may not be possible for a user to make tests on the detector alone. In this instance, tests on the detector element must be established by mutual agreement between the manufacturer and the user.<br />\n The purpose of this standard is to establish terminology and test procedures that have the same meaning to both manufacturers and users. Not all tests described in this standard are mandatory, but those used to specify performance shall be made in accordance with the procedures described herein. (Use of the word "shall" indicates a mandatory requirement, "must" a physical one, and "should" means "recommended.") """ #metaKeywords: null #metaDescription: null #shortDescription: "American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95269 …} #channels: Doctrine\ORM\PersistentCollection {#95275 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95271 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95273 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95261 …} -apiLastModifiedAt: DateTime @1743289200 {#95256 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1578006000 {#95257 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1061330400 {#95258 : 2003-08-20 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1061330400 {#95259 : 2003-08-20 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "N42.31" -bookCollection: "" -pageCount: 40 -documents: Doctrine\ORM\PersistentCollection {#95263 …} -favorites: Doctrine\ORM\PersistentCollection {#95265 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "secondary-lighter" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 232.0 MiB | 0.18 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95260 #id: 10018 #code: "IEEE00003457" #attributes: Doctrine\ORM\PersistentCollection {#95277 …} #variants: Doctrine\ORM\PersistentCollection {#95279 …} #options: Doctrine\ORM\PersistentCollection {#95283 …} #associations: Doctrine\ORM\PersistentCollection {#95281 …} #createdAt: DateTime @1751038750 {#95254 : 2025-06-27 17:39:10.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#95255 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95267 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97938 #locale: "en_US" #translatable: App\Entity\Product\Product {#95260} #id: 35081 #name: "IEEE/ANSI N42.31:2003" #slug: "ieee-ansi-n42-31-2003-ieee00003457-241670" #description: """ New IEEE Standard - Active.<br />\n Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements.<br />\n \t\t\t\t<br />\n This standard applies to wide-bandgap semiconductor radiation detectors, such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe, referred to herein as CZT), and mercuric iodide (HgI2) used in the detection and measurement of ionizing radiation at room temperature; gamma rays, X-rays, and charged particles are covered. The measurement procedures described herein apply primarily to detector elements having planar, hemispherical, or other geometries in which charge carriers of both polarities contribute to the output signal. When the devices are an integral part of a system, it may not be possible for a user to make tests on the detector alone. In this instance, tests on the detector element must be established by mutual agreement between the manufacturer and the user.<br />\n The purpose of this standard is to establish terminology and test procedures that have the same meaning to both manufacturers and users. Not all tests described in this standard are mandatory, but those used to specify performance shall be made in accordance with the procedures described herein. (Use of the word "shall" indicates a mandatory requirement, "must" a physical one, and "should" means "recommended.") """ #metaKeywords: null #metaDescription: null #shortDescription: "American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95269 …} #channels: Doctrine\ORM\PersistentCollection {#95275 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95271 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95273 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95261 …} -apiLastModifiedAt: DateTime @1743289200 {#95256 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1578006000 {#95257 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1061330400 {#95258 : 2003-08-20 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1061330400 {#95259 : 2003-08-20 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "N42.31" -bookCollection: "" -pageCount: 40 -documents: Doctrine\ORM\PersistentCollection {#95263 …} -favorites: Doctrine\ORM\PersistentCollection {#95265 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#97952 +product: App\Entity\Product\Product {#95260 #id: 10018 #code: "IEEE00003457" #attributes: Doctrine\ORM\PersistentCollection {#95277 …} #variants: Doctrine\ORM\PersistentCollection {#95279 …} #options: Doctrine\ORM\PersistentCollection {#95283 …} #associations: Doctrine\ORM\PersistentCollection {#95281 …} #createdAt: DateTime @1751038750 {#95254 : 2025-06-27 17:39:10.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#95255 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95267 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97938 #locale: "en_US" #translatable: App\Entity\Product\Product {#95260} #id: 35081 #name: "IEEE/ANSI N42.31:2003" #slug: "ieee-ansi-n42-31-2003-ieee00003457-241670" #description: """ New IEEE Standard - Active.<br />\n Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements.<br />\n \t\t\t\t<br />\n This standard applies to wide-bandgap semiconductor radiation detectors, such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe, referred to herein as CZT), and mercuric iodide (HgI2) used in the detection and measurement of ionizing radiation at room temperature; gamma rays, X-rays, and charged particles are covered. The measurement procedures described herein apply primarily to detector elements having planar, hemispherical, or other geometries in which charge carriers of both polarities contribute to the output signal. When the devices are an integral part of a system, it may not be possible for a user to make tests on the detector alone. In this instance, tests on the detector element must be established by mutual agreement between the manufacturer and the user.<br />\n The purpose of this standard is to establish terminology and test procedures that have the same meaning to both manufacturers and users. Not all tests described in this standard are mandatory, but those used to specify performance shall be made in accordance with the procedures described herein. (Use of the word "shall" indicates a mandatory requirement, "must" a physical one, and "should" means "recommended.") """ #metaKeywords: null #metaDescription: null #shortDescription: "American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95269 …} #channels: Doctrine\ORM\PersistentCollection {#95275 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95271 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95273 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95261 …} -apiLastModifiedAt: DateTime @1743289200 {#95256 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1578006000 {#95257 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1061330400 {#95258 : 2003-08-20 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1061330400 {#95259 : 2003-08-20 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "N42.31" -bookCollection: "" -pageCount: 40 -documents: Doctrine\ORM\PersistentCollection {#95263 …} -favorites: Doctrine\ORM\PersistentCollection {#95265 …} } +appearance: "state-active" +labels: [ "Active" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 232.0 MiB | 0.60 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95260 #id: 10018 #code: "IEEE00003457" #attributes: Doctrine\ORM\PersistentCollection {#95277 …} #variants: Doctrine\ORM\PersistentCollection {#95279 …} #options: Doctrine\ORM\PersistentCollection {#95283 …} #associations: Doctrine\ORM\PersistentCollection {#95281 …} #createdAt: DateTime @1751038750 {#95254 : 2025-06-27 17:39:10.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#95255 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95267 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97938 #locale: "en_US" #translatable: App\Entity\Product\Product {#95260} #id: 35081 #name: "IEEE/ANSI N42.31:2003" #slug: "ieee-ansi-n42-31-2003-ieee00003457-241670" #description: """ New IEEE Standard - Active.<br />\n Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements.<br />\n \t\t\t\t<br />\n This standard applies to wide-bandgap semiconductor radiation detectors, such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe, referred to herein as CZT), and mercuric iodide (HgI2) used in the detection and measurement of ionizing radiation at room temperature; gamma rays, X-rays, and charged particles are covered. The measurement procedures described herein apply primarily to detector elements having planar, hemispherical, or other geometries in which charge carriers of both polarities contribute to the output signal. When the devices are an integral part of a system, it may not be possible for a user to make tests on the detector alone. In this instance, tests on the detector element must be established by mutual agreement between the manufacturer and the user.<br />\n The purpose of this standard is to establish terminology and test procedures that have the same meaning to both manufacturers and users. Not all tests described in this standard are mandatory, but those used to specify performance shall be made in accordance with the procedures described herein. (Use of the word "shall" indicates a mandatory requirement, "must" a physical one, and "should" means "recommended.") """ #metaKeywords: null #metaDescription: null #shortDescription: "American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95269 …} #channels: Doctrine\ORM\PersistentCollection {#95275 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95271 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95273 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95261 …} -apiLastModifiedAt: DateTime @1743289200 {#95256 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1578006000 {#95257 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1061330400 {#95258 : 2003-08-20 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1061330400 {#95259 : 2003-08-20 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "N42.31" -bookCollection: "" -pageCount: 40 -documents: Doctrine\ORM\PersistentCollection {#95263 …} -favorites: Doctrine\ORM\PersistentCollection {#95265 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#98025 +product: App\Entity\Product\Product {#95260 #id: 10018 #code: "IEEE00003457" #attributes: Doctrine\ORM\PersistentCollection {#95277 …} #variants: Doctrine\ORM\PersistentCollection {#95279 …} #options: Doctrine\ORM\PersistentCollection {#95283 …} #associations: Doctrine\ORM\PersistentCollection {#95281 …} #createdAt: DateTime @1751038750 {#95254 : 2025-06-27 17:39:10.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969444 {#95255 : 2025-07-31 15:44:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95267 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#97938 #locale: "en_US" #translatable: App\Entity\Product\Product {#95260} #id: 35081 #name: "IEEE/ANSI N42.31:2003" #slug: "ieee-ansi-n42-31-2003-ieee00003457-241670" #description: """ New IEEE Standard - Active.<br />\n Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements.<br />\n \t\t\t\t<br />\n This standard applies to wide-bandgap semiconductor radiation detectors, such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe, referred to herein as CZT), and mercuric iodide (HgI2) used in the detection and measurement of ionizing radiation at room temperature; gamma rays, X-rays, and charged particles are covered. The measurement procedures described herein apply primarily to detector elements having planar, hemispherical, or other geometries in which charge carriers of both polarities contribute to the output signal. When the devices are an integral part of a system, it may not be possible for a user to make tests on the detector alone. In this instance, tests on the detector element must be established by mutual agreement between the manufacturer and the user.<br />\n The purpose of this standard is to establish terminology and test procedures that have the same meaning to both manufacturers and users. Not all tests described in this standard are mandatory, but those used to specify performance shall be made in accordance with the procedures described herein. (Use of the word "shall" indicates a mandatory requirement, "must" a physical one, and "should" means "recommended.") """ #metaKeywords: null #metaDescription: null #shortDescription: "American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95269 …} #channels: Doctrine\ORM\PersistentCollection {#95275 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95271 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95273 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95261 …} -apiLastModifiedAt: DateTime @1743289200 {#95256 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1578006000 {#95257 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1061330400 {#95258 : 2003-08-20 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1061330400 {#95259 : 2003-08-20 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "N42.31" -bookCollection: "" -pageCount: 40 -documents: Doctrine\ORM\PersistentCollection {#95263 …} -favorites: Doctrine\ORM\PersistentCollection {#95265 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 232.0 MiB | 5.94 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95290 #id: 10029 #code: "IEEE00003476" #attributes: Doctrine\ORM\PersistentCollection {#95307 …} #variants: Doctrine\ORM\PersistentCollection {#95309 …} #options: Doctrine\ORM\PersistentCollection {#95313 …} #associations: Doctrine\ORM\PersistentCollection {#95311 …} #createdAt: DateTime @1751038758 {#95285 : 2025-06-27 17:39:18.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95286 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95297 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98167 #locale: "en_US" #translatable: App\Entity\Product\Product {#95290} #id: 35125 #name: "IEEE 1620:2004" #slug: "ieee-1620-2004-ieee00003476-241681" #description: """ New IEEE Standard - Superseded.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n \t\t\t\t<br />\n This project will develop standard methods for the characterization of organic transistors and materials. The methods will be independent of processing routes used to fabricate the transistors. The characterization methods will be usable for all transistors comprised of organic semiconductor materials.<br />\n There is currently no defined standard for characterizing organic transistors and materials and means of reporting performance and other data. This is intended to replace the diverse sets of procedures and measurements currently being used. However, without openly defined standard test methods the acceptance and diffusion of organic semiconductor technology will be severely impeded. These methods will enable the creation of a testing and reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will provide the necessary tools and procedures for validation. """ #metaKeywords: null #metaDescription: null #shortDescription: "Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95299 …} #channels: Doctrine\ORM\PersistentCollection {#95305 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95301 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95303 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95291 …} -apiLastModifiedAt: DateTime @1754517600 {#95287 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95288 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1083189600 {#95289 : 2004-04-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95293 …} -favorites: Doctrine\ORM\PersistentCollection {#95295 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#98147 +product: App\Entity\Product\Product {#95290 #id: 10029 #code: "IEEE00003476" #attributes: Doctrine\ORM\PersistentCollection {#95307 …} #variants: Doctrine\ORM\PersistentCollection {#95309 …} #options: Doctrine\ORM\PersistentCollection {#95313 …} #associations: Doctrine\ORM\PersistentCollection {#95311 …} #createdAt: DateTime @1751038758 {#95285 : 2025-06-27 17:39:18.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95286 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95297 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98167 #locale: "en_US" #translatable: App\Entity\Product\Product {#95290} #id: 35125 #name: "IEEE 1620:2004" #slug: "ieee-1620-2004-ieee00003476-241681" #description: """ New IEEE Standard - Superseded.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n \t\t\t\t<br />\n This project will develop standard methods for the characterization of organic transistors and materials. The methods will be independent of processing routes used to fabricate the transistors. The characterization methods will be usable for all transistors comprised of organic semiconductor materials.<br />\n There is currently no defined standard for characterizing organic transistors and materials and means of reporting performance and other data. This is intended to replace the diverse sets of procedures and measurements currently being used. However, without openly defined standard test methods the acceptance and diffusion of organic semiconductor technology will be severely impeded. These methods will enable the creation of a testing and reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will provide the necessary tools and procedures for validation. """ #metaKeywords: null #metaDescription: null #shortDescription: "Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95299 …} #channels: Doctrine\ORM\PersistentCollection {#95305 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95301 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95303 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95291 …} -apiLastModifiedAt: DateTime @1754517600 {#95287 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95288 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1083189600 {#95289 : 2004-04-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95293 …} -favorites: Doctrine\ORM\PersistentCollection {#95295 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 232.0 MiB | 0.59 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95322 #id: 10197 #code: "IEEE00003863" #attributes: Doctrine\ORM\PersistentCollection {#95339 …} #variants: Doctrine\ORM\PersistentCollection {#95341 …} #options: Doctrine\ORM\PersistentCollection {#95345 …} #associations: Doctrine\ORM\PersistentCollection {#95343 …} #createdAt: DateTime @1751038889 {#95315 : 2025-06-27 17:41:29.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95316 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95329 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98376 #locale: "en_US" #translatable: App\Entity\Product\Product {#95322} #id: 35797 #name: "IEEE 1620.1:2006 (R2012)" #slug: "ieee-1620-1-2006-r2012-ieee00003863-241849" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.<br />\n \t\t\t\t<br />\n This is a full-use standard that specifies methods for the characterization of organic transistor-based ring oscillators. The methods are applicable to all ring oscillators fabricated from organic semiconductor materials and are independent of the fabrication process.<br />\n The purpose of this project is to develop a standard methodology to characterize organic transistor based-ring oscillators and to allow reporting of their performance and associated data. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95331 …} #channels: Doctrine\ORM\PersistentCollection {#95337 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95333 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95335 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95323 …} -apiLastModifiedAt: DateTime @1754517600 {#95317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1683151200 {#95318 : 2023-05-04 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1162940400 {#95319 : 2006-11-08 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @1339106400 {#95320 : 2012-06-08 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1680127200 {#95321 : 2023-03-30 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "1620.1" -bookCollection: "" -pageCount: 16 -documents: Doctrine\ORM\PersistentCollection {#95325 …} -favorites: Doctrine\ORM\PersistentCollection {#95327 …} } ] |
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| ProductCard | App\Twig\Components\ProductCard | 232.0 MiB | 6.10 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95353 #id: 10247 #code: "IEEE00003981" #attributes: Doctrine\ORM\PersistentCollection {#95370 …} #variants: Doctrine\ORM\PersistentCollection {#95372 …} #options: Doctrine\ORM\PersistentCollection {#95376 …} #associations: Doctrine\ORM\PersistentCollection {#95374 …} #createdAt: DateTime @1751038925 {#95347 : 2025-06-27 17:42:05.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95348 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95360 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98614 #locale: "en_US" #translatable: App\Entity\Product\Product {#95353} #id: 35997 #name: "IEEE 1620:2008" #slug: "ieee-1620-2008-ieee00003981-241899" #description: """ Revision Standard - Inactive-Reserved.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95362 …} #channels: Doctrine\ORM\PersistentCollection {#95368 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95364 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95366 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95354 …} -apiLastModifiedAt: DateTime @1754517600 {#95349 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1627596000 {#95350 : 2021-07-30 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1228431600 {#95351 : 2008-12-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1573081200 {#95352 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95356 …} -favorites: Doctrine\ORM\PersistentCollection {#95358 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
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| Component | App\Twig\Components\ProductCard {#98594 +product: App\Entity\Product\Product {#95353 #id: 10247 #code: "IEEE00003981" #attributes: Doctrine\ORM\PersistentCollection {#95370 …} #variants: Doctrine\ORM\PersistentCollection {#95372 …} #options: Doctrine\ORM\PersistentCollection {#95376 …} #associations: Doctrine\ORM\PersistentCollection {#95374 …} #createdAt: DateTime @1751038925 {#95347 : 2025-06-27 17:42:05.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95348 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95360 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98614 #locale: "en_US" #translatable: App\Entity\Product\Product {#95353} #id: 35997 #name: "IEEE 1620:2008" #slug: "ieee-1620-2008-ieee00003981-241899" #description: """ Revision Standard - Inactive-Reserved.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95362 …} #channels: Doctrine\ORM\PersistentCollection {#95368 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95364 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95366 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95354 …} -apiLastModifiedAt: DateTime @1754517600 {#95349 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1627596000 {#95350 : 2021-07-30 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1228431600 {#95351 : 2008-12-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1573081200 {#95352 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95356 …} -favorites: Doctrine\ORM\PersistentCollection {#95358 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
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| ProductState | App\Twig\Components\ProductState | 232.0 MiB | 0.19 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95353 #id: 10247 #code: "IEEE00003981" #attributes: Doctrine\ORM\PersistentCollection {#95370 …} #variants: Doctrine\ORM\PersistentCollection {#95372 …} #options: Doctrine\ORM\PersistentCollection {#95376 …} #associations: Doctrine\ORM\PersistentCollection {#95374 …} #createdAt: DateTime @1751038925 {#95347 : 2025-06-27 17:42:05.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95348 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95360 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98614 #locale: "en_US" #translatable: App\Entity\Product\Product {#95353} #id: 35997 #name: "IEEE 1620:2008" #slug: "ieee-1620-2008-ieee00003981-241899" #description: """ Revision Standard - Inactive-Reserved.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95362 …} #channels: Doctrine\ORM\PersistentCollection {#95368 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95364 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95366 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95354 …} -apiLastModifiedAt: DateTime @1754517600 {#95349 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1627596000 {#95350 : 2021-07-30 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1228431600 {#95351 : 2008-12-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1573081200 {#95352 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95356 …} -favorites: Doctrine\ORM\PersistentCollection {#95358 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#98628 +product: App\Entity\Product\Product {#95353 #id: 10247 #code: "IEEE00003981" #attributes: Doctrine\ORM\PersistentCollection {#95370 …} #variants: Doctrine\ORM\PersistentCollection {#95372 …} #options: Doctrine\ORM\PersistentCollection {#95376 …} #associations: Doctrine\ORM\PersistentCollection {#95374 …} #createdAt: DateTime @1751038925 {#95347 : 2025-06-27 17:42:05.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95348 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95360 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98614 #locale: "en_US" #translatable: App\Entity\Product\Product {#95353} #id: 35997 #name: "IEEE 1620:2008" #slug: "ieee-1620-2008-ieee00003981-241899" #description: """ Revision Standard - Inactive-Reserved.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95362 …} #channels: Doctrine\ORM\PersistentCollection {#95368 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95364 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95366 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95354 …} -apiLastModifiedAt: DateTime @1754517600 {#95349 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1627596000 {#95350 : 2021-07-30 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1228431600 {#95351 : 2008-12-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1573081200 {#95352 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95356 …} -favorites: Doctrine\ORM\PersistentCollection {#95358 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 232.0 MiB | 0.59 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#95353 #id: 10247 #code: "IEEE00003981" #attributes: Doctrine\ORM\PersistentCollection {#95370 …} #variants: Doctrine\ORM\PersistentCollection {#95372 …} #options: Doctrine\ORM\PersistentCollection {#95376 …} #associations: Doctrine\ORM\PersistentCollection {#95374 …} #createdAt: DateTime @1751038925 {#95347 : 2025-06-27 17:42:05.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95348 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95360 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98614 #locale: "en_US" #translatable: App\Entity\Product\Product {#95353} #id: 35997 #name: "IEEE 1620:2008" #slug: "ieee-1620-2008-ieee00003981-241899" #description: """ Revision Standard - Inactive-Reserved.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95362 …} #channels: Doctrine\ORM\PersistentCollection {#95368 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95364 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95366 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95354 …} -apiLastModifiedAt: DateTime @1754517600 {#95349 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1627596000 {#95350 : 2021-07-30 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1228431600 {#95351 : 2008-12-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1573081200 {#95352 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95356 …} -favorites: Doctrine\ORM\PersistentCollection {#95358 …} } ] |
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| Component | App\Twig\Components\ProductMostRecent {#98702 +product: App\Entity\Product\Product {#95353 #id: 10247 #code: "IEEE00003981" #attributes: Doctrine\ORM\PersistentCollection {#95370 …} #variants: Doctrine\ORM\PersistentCollection {#95372 …} #options: Doctrine\ORM\PersistentCollection {#95376 …} #associations: Doctrine\ORM\PersistentCollection {#95374 …} #createdAt: DateTime @1751038925 {#95347 : 2025-06-27 17:42:05.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95348 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95360 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#98614 #locale: "en_US" #translatable: App\Entity\Product\Product {#95353} #id: 35997 #name: "IEEE 1620:2008" #slug: "ieee-1620-2008-ieee00003981-241899" #description: """ Revision Standard - Inactive-Reserved.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95362 …} #channels: Doctrine\ORM\PersistentCollection {#95368 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95364 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95366 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94971 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95354 …} -apiLastModifiedAt: DateTime @1754517600 {#95349 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1627596000 {#95350 : 2021-07-30 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1228431600 {#95351 : 2008-12-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1573081200 {#95352 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95356 …} -favorites: Doctrine\ORM\PersistentCollection {#95358 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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