Components
3
Twig Components
5
Render Count
3
ms
Render Time
74.0
MiB
Memory Usage
Components
| Name | Metadata | Render Count | Render Time |
|---|---|---|---|
| ProductState |
"App\Twig\Components\ProductState"components/ProductState.html.twig |
2 | 0.76ms |
| ProductMostRecent |
"App\Twig\Components\ProductMostRecent"components/ProductMostRecent.html.twig |
2 | 2.33ms |
| ProductType |
"App\Twig\Components\ProductType"components/ProductType.html.twig |
1 | 0.29ms |
Render calls
| ProductState | App\Twig\Components\ProductState | 70.0 MiB | 0.45 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7311 #id: 8706 #code: "IEEE00000889" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751037642 {#7274 : 2025-06-27 17:20:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 29833 #name: "IEEE 641:1987" #slug: "ieee-641-1987-ieee00000889-240358" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @592182000 {#7318 : 1988-10-07 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @723337200 {#7316 : 1992-12-03 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "641" -bookCollection: "" -pageCount: 34 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#93008 +product: App\Entity\Product\Product {#7311 #id: 8706 #code: "IEEE00000889" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751037642 {#7274 : 2025-06-27 17:20:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 29833 #name: "IEEE 641:1987" #slug: "ieee-641-1987-ieee00000889-240358" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @592182000 {#7318 : 1988-10-07 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @723337200 {#7316 : 1992-12-03 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "641" -bookCollection: "" -pageCount: 34 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductType | App\Twig\Components\ProductType | 70.0 MiB | 0.29 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7311 #id: 8706 #code: "IEEE00000889" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751037642 {#7274 : 2025-06-27 17:20:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 29833 #name: "IEEE 641:1987" #slug: "ieee-641-1987-ieee00000889-240358" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @592182000 {#7318 : 1988-10-07 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @723337200 {#7316 : 1992-12-03 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "641" -bookCollection: "" -pageCount: 34 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductType {#93188 +product: App\Entity\Product\Product {#7311 #id: 8706 #code: "IEEE00000889" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751037642 {#7274 : 2025-06-27 17:20:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 29833 #name: "IEEE 641:1987" #slug: "ieee-641-1987-ieee00000889-240358" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @592182000 {#7318 : 1988-10-07 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @723337200 {#7316 : 1992-12-03 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "641" -bookCollection: "" -pageCount: 34 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } +label: "Standard" -typeAttributeCode: "type" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 70.0 MiB | 1.00 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7311 #id: 8706 #code: "IEEE00000889" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751037642 {#7274 : 2025-06-27 17:20:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 29833 #name: "IEEE 641:1987" #slug: "ieee-641-1987-ieee00000889-240358" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @592182000 {#7318 : 1988-10-07 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @723337200 {#7316 : 1992-12-03 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "641" -bookCollection: "" -pageCount: 34 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#93263 +product: App\Entity\Product\Product {#7311 #id: 8706 #code: "IEEE00000889" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751037642 {#7274 : 2025-06-27 17:20:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 29833 #name: "IEEE 641:1987" #slug: "ieee-641-1987-ieee00000889-240358" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @592182000 {#7318 : 1988-10-07 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @723337200 {#7316 : 1992-12-03 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "641" -bookCollection: "" -pageCount: 34 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductState | App\Twig\Components\ProductState | 74.0 MiB | 0.31 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7311 #id: 8706 #code: "IEEE00000889" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751037642 {#7274 : 2025-06-27 17:20:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 29833 #name: "IEEE 641:1987" #slug: "ieee-641-1987-ieee00000889-240358" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @592182000 {#7318 : 1988-10-07 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @723337200 {#7316 : 1992-12-03 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "641" -bookCollection: "" -pageCount: 34 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#100202 +product: App\Entity\Product\Product {#7311 #id: 8706 #code: "IEEE00000889" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751037642 {#7274 : 2025-06-27 17:20:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 29833 #name: "IEEE 641:1987" #slug: "ieee-641-1987-ieee00000889-240358" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @592182000 {#7318 : 1988-10-07 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @723337200 {#7316 : 1992-12-03 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "641" -bookCollection: "" -pageCount: 34 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 74.0 MiB | 1.33 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#7311 #id: 8706 #code: "IEEE00000889" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751037642 {#7274 : 2025-06-27 17:20:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 29833 #name: "IEEE 641:1987" #slug: "ieee-641-1987-ieee00000889-240358" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @592182000 {#7318 : 1988-10-07 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @723337200 {#7316 : 1992-12-03 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "641" -bookCollection: "" -pageCount: 34 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#100286 +product: App\Entity\Product\Product {#7311 #id: 8706 #code: "IEEE00000889" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751037642 {#7274 : 2025-06-27 17:20:42.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 29833 #name: "IEEE 641:1987" #slug: "ieee-641-1987-ieee00000889-240358" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @592182000 {#7318 : 1988-10-07 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @723337200 {#7316 : 1992-12-03 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "641" -bookCollection: "" -pageCount: 34 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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