GET https://dev.normadoc.fr/_partial/cart/summary?template=%40SyliusShop%2FCart%2F_widget.html.twig

Components

3 Twig Components
9 Render Count
5 ms Render Time
164.0 MiB Memory Usage

Components

Name Metadata Render Count Render Time
ProductState
"App\Twig\Components\ProductState"
components/ProductState.html.twig
4 1.24ms
ProductMostRecent
"App\Twig\Components\ProductMostRecent"
components/ProductMostRecent.html.twig
4 3.95ms
ProductType
"App\Twig\Components\ProductType"
components/ProductType.html.twig
1 0.30ms

Render calls

ProductState App\Twig\Components\ProductState 164.0 MiB 0.45 ms
Input props
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          New IEEE Standard - Superseded.<br />\n
          IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n
          \t\t\t\t<br />\n
          Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n
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Component
App\Twig\Components\ProductState {#93007
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    #code: "IEEE00001889"
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          New IEEE Standard - Superseded.<br />\n
          IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n
          \t\t\t\t<br />\n
          Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n
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ProductType App\Twig\Components\ProductType 164.0 MiB 0.30 ms
Input props
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          New IEEE Standard - Superseded.<br />\n
          IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n
          \t\t\t\t<br />\n
          Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n
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          New IEEE Standard - Superseded.<br />\n
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ProductMostRecent App\Twig\Components\ProductMostRecent 164.0 MiB 1.03 ms
Input props
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ProductState App\Twig\Components\ProductState 164.0 MiB 0.28 ms
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