GET https://dev.normadoc.fr/_partial/cart/summary?template=%40SyliusShop%2FCart%2F_widget.html.twig

Response
200 OK
IP
216.73.217.119
Profiled on
Token
970d6a

Components

3 Twig Components
7 Render Count
3 ms Render Time
170.0 MiB Memory Usage

Components

Name Metadata Render Count Render Time
ProductState 
"App\Twig\Components\ProductState"
components/ProductState.html.twig 		3 0.79ms
ProductMostRecent 
"App\Twig\Components\ProductMostRecent"
components/ProductMostRecent.html.twig 		3 2.29ms
ProductType 
"App\Twig\Components\ProductType"
components/ProductType.html.twig 		1 0.21ms

Render calls

ProductState App\Twig\Components\ProductState 170.0 MiB 0.33 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7309
    #id: 9361
    #code: "IEEE00002159"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751038200 {#7274
      date: 2025-06-27 17:30:00.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 32453
        #name: "IEEE 1450.1:2005 (R2011)"
        #slug: "ieee-1450-1-2005-r2011-ieee00002159-241013"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n
          \t\t\t\t<br />\n
          Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n
          Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. This effort is to be done in conjunction with IEEE P1500 which is defining standards for the definition and integration of embedded cores. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#7292
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1128031200 {#7318
      date: 2005-09-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1308175200 {#7316
      date: 2011-06-16 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1648076400 {#7315
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1450.1"
    -bookCollection: ""
    -pageCount: 123
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#93001
  +product: App\Entity\Product\Product {#7309
    #id: 9361
    #code: "IEEE00002159"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751038200 {#7274
      date: 2025-06-27 17:30:00.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 32453
        #name: "IEEE 1450.1:2005 (R2011)"
        #slug: "ieee-1450-1-2005-r2011-ieee00002159-241013"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n
          \t\t\t\t<br />\n
          Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n
          Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. This effort is to be done in conjunction with IEEE P1500 which is defining standards for the definition and integration of embedded cores. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#7292
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1128031200 {#7318
      date: 2005-09-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1308175200 {#7316
      date: 2011-06-16 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1648076400 {#7315
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1450.1"
    -bookCollection: ""
    -pageCount: 123
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
    "Confirmed"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductType App\Twig\Components\ProductType 170.0 MiB 0.21 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7309
    #id: 9361
    #code: "IEEE00002159"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751038200 {#7274
      date: 2025-06-27 17:30:00.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 32453
        #name: "IEEE 1450.1:2005 (R2011)"
        #slug: "ieee-1450-1-2005-r2011-ieee00002159-241013"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n
          \t\t\t\t<br />\n
          Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n
          Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. This effort is to be done in conjunction with IEEE P1500 which is defining standards for the definition and integration of embedded cores. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#7292
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1128031200 {#7318
      date: 2005-09-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1308175200 {#7316
      date: 2011-06-16 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1648076400 {#7315
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1450.1"
    -bookCollection: ""
    -pageCount: 123
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductType {#93194
  +product: App\Entity\Product\Product {#7309
    #id: 9361
    #code: "IEEE00002159"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751038200 {#7274
      date: 2025-06-27 17:30:00.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 32453
        #name: "IEEE 1450.1:2005 (R2011)"
        #slug: "ieee-1450-1-2005-r2011-ieee00002159-241013"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n
          \t\t\t\t<br />\n
          Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n
          Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. This effort is to be done in conjunction with IEEE P1500 which is defining standards for the definition and integration of embedded cores. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#7292
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1128031200 {#7318
      date: 2005-09-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1308175200 {#7316
      date: 2011-06-16 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1648076400 {#7315
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1450.1"
    -bookCollection: ""
    -pageCount: 123
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
  +label: "Standard"
  -typeAttributeCode: "type"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 170.0 MiB 0.67 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7309
    #id: 9361
    #code: "IEEE00002159"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751038200 {#7274
      date: 2025-06-27 17:30:00.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 32453
        #name: "IEEE 1450.1:2005 (R2011)"
        #slug: "ieee-1450-1-2005-r2011-ieee00002159-241013"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n
          \t\t\t\t<br />\n
          Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n
          Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. This effort is to be done in conjunction with IEEE P1500 which is defining standards for the definition and integration of embedded cores. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#7292
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1128031200 {#7318
      date: 2005-09-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1308175200 {#7316
      date: 2011-06-16 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1648076400 {#7315
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1450.1"
    -bookCollection: ""
    -pageCount: 123
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#93269
  +product: App\Entity\Product\Product {#7309
    #id: 9361
    #code: "IEEE00002159"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751038200 {#7274
      date: 2025-06-27 17:30:00.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 32453
        #name: "IEEE 1450.1:2005 (R2011)"
        #slug: "ieee-1450-1-2005-r2011-ieee00002159-241013"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n
          \t\t\t\t<br />\n
          Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n
          Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. This effort is to be done in conjunction with IEEE P1500 which is defining standards for the definition and integration of embedded cores. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#7292
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1128031200 {#7318
      date: 2005-09-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1308175200 {#7316
      date: 2011-06-16 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1648076400 {#7315
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1450.1"
    -bookCollection: ""
    -pageCount: 123
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 170.0 MiB 0.24 ms
Input props 
[
  "product" => App\Entity\Product\Product {#93677
    #id: 13161
    #code: "IEEE00010489"
    #attributes: Doctrine\ORM\PersistentCollection {#93659 …}
    #variants: Doctrine\ORM\PersistentCollection {#93656 …}
    #options: Doctrine\ORM\PersistentCollection {#93652 …}
    #associations: Doctrine\ORM\PersistentCollection {#93654 …}
    #createdAt: DateTime @1751040914 {#93685
      date: 2025-06-27 18:15:14.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#93664
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93670 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93705
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93677}
        #id: 47653
        #name: "IEEE 1450.1:2025"
        #slug: "ieee-p1450-1-ieee00010489-496235"
        #description: """
          Revision Standard - Active - Draft.<br />\n
          Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n
          (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n
          \t\t\t\t<br />\n
          Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and Built-In Self-Test (BIST), and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n
          Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93668 …}
    #channels: Doctrine\ORM\PersistentCollection {#93661 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93666 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93663 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93678 …}
    -apiLastModifiedAt: DateTime @1754517600 {#93648
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1753048800 {#93684
      date: 2025-07-21 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1750888800 {#93683
      date: 2025-06-26 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1450.1"
    -bookCollection: ""
    -pageCount: 141
    -documents: Doctrine\ORM\PersistentCollection {#93674 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93672 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#106839
  +product: App\Entity\Product\Product {#93677
    #id: 13161
    #code: "IEEE00010489"
    #attributes: Doctrine\ORM\PersistentCollection {#93659 …}
    #variants: Doctrine\ORM\PersistentCollection {#93656 …}
    #options: Doctrine\ORM\PersistentCollection {#93652 …}
    #associations: Doctrine\ORM\PersistentCollection {#93654 …}
    #createdAt: DateTime @1751040914 {#93685
      date: 2025-06-27 18:15:14.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#93664
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93670 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93705
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93677}
        #id: 47653
        #name: "IEEE 1450.1:2025"
        #slug: "ieee-p1450-1-ieee00010489-496235"
        #description: """
          Revision Standard - Active - Draft.<br />\n
          Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n
          (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n
          \t\t\t\t<br />\n
          Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and Built-In Self-Test (BIST), and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n
          Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93668 …}
    #channels: Doctrine\ORM\PersistentCollection {#93661 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93666 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93663 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93678 …}
    -apiLastModifiedAt: DateTime @1754517600 {#93648
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1753048800 {#93684
      date: 2025-07-21 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1750888800 {#93683
      date: 2025-06-26 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1450.1"
    -bookCollection: ""
    -pageCount: 141
    -documents: Doctrine\ORM\PersistentCollection {#93674 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93672 …}
  }
  +appearance: "state-active"
  +labels: [
    "Active"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 170.0 MiB 0.89 ms
Input props 
[
  "product" => App\Entity\Product\Product {#93677
    #id: 13161
    #code: "IEEE00010489"
    #attributes: Doctrine\ORM\PersistentCollection {#93659 …}
    #variants: Doctrine\ORM\PersistentCollection {#93656 …}
    #options: Doctrine\ORM\PersistentCollection {#93652 …}
    #associations: Doctrine\ORM\PersistentCollection {#93654 …}
    #createdAt: DateTime @1751040914 {#93685
      date: 2025-06-27 18:15:14.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#93664
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93670 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93705
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93677}
        #id: 47653
        #name: "IEEE 1450.1:2025"
        #slug: "ieee-p1450-1-ieee00010489-496235"
        #description: """
          Revision Standard - Active - Draft.<br />\n
          Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n
          (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n
          \t\t\t\t<br />\n
          Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and Built-In Self-Test (BIST), and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n
          Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93668 …}
    #channels: Doctrine\ORM\PersistentCollection {#93661 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93666 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93663 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93678 …}
    -apiLastModifiedAt: DateTime @1754517600 {#93648
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1753048800 {#93684
      date: 2025-07-21 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1750888800 {#93683
      date: 2025-06-26 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1450.1"
    -bookCollection: ""
    -pageCount: 141
    -documents: Doctrine\ORM\PersistentCollection {#93674 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93672 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#106893
  +product: App\Entity\Product\Product {#93677
    #id: 13161
    #code: "IEEE00010489"
    #attributes: Doctrine\ORM\PersistentCollection {#93659 …}
    #variants: Doctrine\ORM\PersistentCollection {#93656 …}
    #options: Doctrine\ORM\PersistentCollection {#93652 …}
    #associations: Doctrine\ORM\PersistentCollection {#93654 …}
    #createdAt: DateTime @1751040914 {#93685
      date: 2025-06-27 18:15:14.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#93664
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93670 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93705
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93677}
        #id: 47653
        #name: "IEEE 1450.1:2025"
        #slug: "ieee-p1450-1-ieee00010489-496235"
        #description: """
          Revision Standard - Active - Draft.<br />\n
          Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n
          (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n
          \t\t\t\t<br />\n
          Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and Built-In Self-Test (BIST), and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n
          Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93668 …}
    #channels: Doctrine\ORM\PersistentCollection {#93661 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93666 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93663 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93678 …}
    -apiLastModifiedAt: DateTime @1754517600 {#93648
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1753048800 {#93684
      date: 2025-07-21 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1750888800 {#93683
      date: 2025-06-26 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1450.1"
    -bookCollection: ""
    -pageCount: 141
    -documents: Doctrine\ORM\PersistentCollection {#93674 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93672 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 170.0 MiB 0.22 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7309
    #id: 9361
    #code: "IEEE00002159"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751038200 {#7274
      date: 2025-06-27 17:30:00.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 32453
        #name: "IEEE 1450.1:2005 (R2011)"
        #slug: "ieee-1450-1-2005-r2011-ieee00002159-241013"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n
          \t\t\t\t<br />\n
          Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n
          Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. This effort is to be done in conjunction with IEEE P1500 which is defining standards for the definition and integration of embedded cores. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#7292
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1128031200 {#7318
      date: 2005-09-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1308175200 {#7316
      date: 2011-06-16 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1648076400 {#7315
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1450.1"
    -bookCollection: ""
    -pageCount: 123
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#106958
  +product: App\Entity\Product\Product {#7309
    #id: 9361
    #code: "IEEE00002159"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751038200 {#7274
      date: 2025-06-27 17:30:00.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 32453
        #name: "IEEE 1450.1:2005 (R2011)"
        #slug: "ieee-1450-1-2005-r2011-ieee00002159-241013"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n
          \t\t\t\t<br />\n
          Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n
          Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. This effort is to be done in conjunction with IEEE P1500 which is defining standards for the definition and integration of embedded cores. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#7292
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1128031200 {#7318
      date: 2005-09-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1308175200 {#7316
      date: 2011-06-16 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1648076400 {#7315
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1450.1"
    -bookCollection: ""
    -pageCount: 123
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
    "Confirmed"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 170.0 MiB 0.73 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7309
    #id: 9361
    #code: "IEEE00002159"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751038200 {#7274
      date: 2025-06-27 17:30:00.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 32453
        #name: "IEEE 1450.1:2005 (R2011)"
        #slug: "ieee-1450-1-2005-r2011-ieee00002159-241013"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n
          \t\t\t\t<br />\n
          Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n
          Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. This effort is to be done in conjunction with IEEE P1500 which is defining standards for the definition and integration of embedded cores. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#7292
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1128031200 {#7318
      date: 2005-09-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1308175200 {#7316
      date: 2011-06-16 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1648076400 {#7315
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1450.1"
    -bookCollection: ""
    -pageCount: 123
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#106985
  +product: App\Entity\Product\Product {#7309
    #id: 9361
    #code: "IEEE00002159"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
    #variants: Doctrine\ORM\PersistentCollection {#7745 …}
    #options: Doctrine\ORM\PersistentCollection {#7917 …}
    #associations: Doctrine\ORM\PersistentCollection {#7901 …}
    #createdAt: DateTime @1751038200 {#7274
      date: 2025-06-27 17:30:00.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7923 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7922
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7309}
        #id: 32453
        #name: "IEEE 1450.1:2005 (R2011)"
        #slug: "ieee-1450-1-2005-r2011-ieee00002159-241013"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n
          \t\t\t\t<br />\n
          Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n
          Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. This effort is to be done in conjunction with IEEE P1500 which is defining standards for the definition and integration of embedded cores. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
    #channels: Doctrine\ORM\PersistentCollection {#7629 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#7292
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1128031200 {#7318
      date: 2005-09-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1308175200 {#7316
      date: 2011-06-16 00:00:00.0 Europe/Paris (+02:00)
    }
    -canceledAt: DateTime @1648076400 {#7315
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1450.1"
    -bookCollection: ""
    -pageCount: 123
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}