Components
4
Twig Components
8
Render Count
11
ms
Render Time
200.0
MiB
Memory Usage
Components
| Name | Metadata | Render Count | Render Time |
|---|---|---|---|
| ProductState |
"App\Twig\Components\ProductState"components/ProductState.html.twig |
3 | 0.92ms |
| ProductMostRecent |
"App\Twig\Components\ProductMostRecent"components/ProductMostRecent.html.twig |
3 | 2.47ms |
| ProductType |
"App\Twig\Components\ProductType"components/ProductType.html.twig |
1 | 0.33ms |
| ProductCard |
"App\Twig\Components\ProductCard"components/ProductCard.html.twig |
1 | 8.12ms |
Render calls
| ProductState | App\Twig\Components\ProductState | 200.0 MiB | 0.52 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7309 #id: 9165 #code: "IEEE00001764" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038026 {#7274 : 2025-06-27 17:27:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 31669 #name: "IEEE 1160:1993 (R2006)" #slug: "ieee-1160-1993-r2006-ieee00001764-240817" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity center per cm3, usually on the order of 1010 cm-3.<br />\n \t\t\t\t<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3, usually on the order of 1010 cm–3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-19<br />\n The purpose of this standard is to establish uniform procedures for measurements and analyses in the determination and reporting of bulk properties relevant to germanium radiation detector fabrication and performance. These properties are net electrically active impurity concentrations, |NA – ND|, the concentration of isolated defects with deep electronic levels NT, and certain crystallographic properties. The techniques described herein are those that have found general use in the industry, are practical, and provide verifiable and desired information to the detector fabricator.<br />\n As an aid to the reader, an annex is included for background material. Paragraph numbers in the annex are prefixed by the letter “A,” while the numerical parts of the numbers correspond to those in the main body of the text to which they pertain.<br />\n Not all tests described herein are mandatory; however, any tests that are intended to conform to this standard shall be performed according to its provisions.<br />\n Mandatory procedures are designated by the word “shall.” Recommended procedures are designated by the words “should” or “recommended.” Optional procedures are designated by the word “may.” """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1580425200 {#7292 : 2020-01-31 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @738280800 {#7318 : 1993-05-25 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1143669600 {#7316 : 2006-03-30 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#7315 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1160" -bookCollection: "" -pageCount: 36 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#93009 +product: App\Entity\Product\Product {#7309 #id: 9165 #code: "IEEE00001764" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038026 {#7274 : 2025-06-27 17:27:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 31669 #name: "IEEE 1160:1993 (R2006)" #slug: "ieee-1160-1993-r2006-ieee00001764-240817" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity center per cm3, usually on the order of 1010 cm-3.<br />\n \t\t\t\t<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3, usually on the order of 1010 cm–3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-19<br />\n The purpose of this standard is to establish uniform procedures for measurements and analyses in the determination and reporting of bulk properties relevant to germanium radiation detector fabrication and performance. These properties are net electrically active impurity concentrations, |NA – ND|, the concentration of isolated defects with deep electronic levels NT, and certain crystallographic properties. The techniques described herein are those that have found general use in the industry, are practical, and provide verifiable and desired information to the detector fabricator.<br />\n As an aid to the reader, an annex is included for background material. Paragraph numbers in the annex are prefixed by the letter “A,” while the numerical parts of the numbers correspond to those in the main body of the text to which they pertain.<br />\n Not all tests described herein are mandatory; however, any tests that are intended to conform to this standard shall be performed according to its provisions.<br />\n Mandatory procedures are designated by the word “shall.” Recommended procedures are designated by the words “should” or “recommended.” Optional procedures are designated by the word “may.” """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1580425200 {#7292 : 2020-01-31 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @738280800 {#7318 : 1993-05-25 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1143669600 {#7316 : 2006-03-30 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#7315 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1160" -bookCollection: "" -pageCount: 36 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" "Confirmed" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductType | App\Twig\Components\ProductType | 200.0 MiB | 0.33 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7309 #id: 9165 #code: "IEEE00001764" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038026 {#7274 : 2025-06-27 17:27:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 31669 #name: "IEEE 1160:1993 (R2006)" #slug: "ieee-1160-1993-r2006-ieee00001764-240817" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity center per cm3, usually on the order of 1010 cm-3.<br />\n \t\t\t\t<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3, usually on the order of 1010 cm–3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-19<br />\n The purpose of this standard is to establish uniform procedures for measurements and analyses in the determination and reporting of bulk properties relevant to germanium radiation detector fabrication and performance. These properties are net electrically active impurity concentrations, |NA – ND|, the concentration of isolated defects with deep electronic levels NT, and certain crystallographic properties. The techniques described herein are those that have found general use in the industry, are practical, and provide verifiable and desired information to the detector fabricator.<br />\n As an aid to the reader, an annex is included for background material. Paragraph numbers in the annex are prefixed by the letter “A,” while the numerical parts of the numbers correspond to those in the main body of the text to which they pertain.<br />\n Not all tests described herein are mandatory; however, any tests that are intended to conform to this standard shall be performed according to its provisions.<br />\n Mandatory procedures are designated by the word “shall.” Recommended procedures are designated by the words “should” or “recommended.” Optional procedures are designated by the word “may.” """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1580425200 {#7292 : 2020-01-31 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @738280800 {#7318 : 1993-05-25 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1143669600 {#7316 : 2006-03-30 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#7315 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1160" -bookCollection: "" -pageCount: 36 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } ] |
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| Component | App\Twig\Components\ProductType {#93202 +product: App\Entity\Product\Product {#7309 #id: 9165 #code: "IEEE00001764" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038026 {#7274 : 2025-06-27 17:27:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 31669 #name: "IEEE 1160:1993 (R2006)" #slug: "ieee-1160-1993-r2006-ieee00001764-240817" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity center per cm3, usually on the order of 1010 cm-3.<br />\n \t\t\t\t<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3, usually on the order of 1010 cm–3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-19<br />\n The purpose of this standard is to establish uniform procedures for measurements and analyses in the determination and reporting of bulk properties relevant to germanium radiation detector fabrication and performance. These properties are net electrically active impurity concentrations, |NA – ND|, the concentration of isolated defects with deep electronic levels NT, and certain crystallographic properties. The techniques described herein are those that have found general use in the industry, are practical, and provide verifiable and desired information to the detector fabricator.<br />\n As an aid to the reader, an annex is included for background material. Paragraph numbers in the annex are prefixed by the letter “A,” while the numerical parts of the numbers correspond to those in the main body of the text to which they pertain.<br />\n Not all tests described herein are mandatory; however, any tests that are intended to conform to this standard shall be performed according to its provisions.<br />\n Mandatory procedures are designated by the word “shall.” Recommended procedures are designated by the words “should” or “recommended.” Optional procedures are designated by the word “may.” """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1580425200 {#7292 : 2020-01-31 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @738280800 {#7318 : 1993-05-25 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1143669600 {#7316 : 2006-03-30 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#7315 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1160" -bookCollection: "" -pageCount: 36 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } +label: "Standard" -typeAttributeCode: "type" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 200.0 MiB | 1.03 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7309 #id: 9165 #code: "IEEE00001764" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038026 {#7274 : 2025-06-27 17:27:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 31669 #name: "IEEE 1160:1993 (R2006)" #slug: "ieee-1160-1993-r2006-ieee00001764-240817" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity center per cm3, usually on the order of 1010 cm-3.<br />\n \t\t\t\t<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3, usually on the order of 1010 cm–3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-19<br />\n The purpose of this standard is to establish uniform procedures for measurements and analyses in the determination and reporting of bulk properties relevant to germanium radiation detector fabrication and performance. These properties are net electrically active impurity concentrations, |NA – ND|, the concentration of isolated defects with deep electronic levels NT, and certain crystallographic properties. The techniques described herein are those that have found general use in the industry, are practical, and provide verifiable and desired information to the detector fabricator.<br />\n As an aid to the reader, an annex is included for background material. Paragraph numbers in the annex are prefixed by the letter “A,” while the numerical parts of the numbers correspond to those in the main body of the text to which they pertain.<br />\n Not all tests described herein are mandatory; however, any tests that are intended to conform to this standard shall be performed according to its provisions.<br />\n Mandatory procedures are designated by the word “shall.” Recommended procedures are designated by the words “should” or “recommended.” Optional procedures are designated by the word “may.” """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1580425200 {#7292 : 2020-01-31 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @738280800 {#7318 : 1993-05-25 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1143669600 {#7316 : 2006-03-30 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#7315 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1160" -bookCollection: "" -pageCount: 36 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#93277 +product: App\Entity\Product\Product {#7309 #id: 9165 #code: "IEEE00001764" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038026 {#7274 : 2025-06-27 17:27:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 31669 #name: "IEEE 1160:1993 (R2006)" #slug: "ieee-1160-1993-r2006-ieee00001764-240817" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity center per cm3, usually on the order of 1010 cm-3.<br />\n \t\t\t\t<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3, usually on the order of 1010 cm–3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-19<br />\n The purpose of this standard is to establish uniform procedures for measurements and analyses in the determination and reporting of bulk properties relevant to germanium radiation detector fabrication and performance. These properties are net electrically active impurity concentrations, |NA – ND|, the concentration of isolated defects with deep electronic levels NT, and certain crystallographic properties. The techniques described herein are those that have found general use in the industry, are practical, and provide verifiable and desired information to the detector fabricator.<br />\n As an aid to the reader, an annex is included for background material. Paragraph numbers in the annex are prefixed by the letter “A,” while the numerical parts of the numbers correspond to those in the main body of the text to which they pertain.<br />\n Not all tests described herein are mandatory; however, any tests that are intended to conform to this standard shall be performed according to its provisions.<br />\n Mandatory procedures are designated by the word “shall.” Recommended procedures are designated by the words “should” or “recommended.” Optional procedures are designated by the word “may.” """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1580425200 {#7292 : 2020-01-31 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @738280800 {#7318 : 1993-05-25 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1143669600 {#7316 : 2006-03-30 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#7315 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1160" -bookCollection: "" -pageCount: 36 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductState | App\Twig\Components\ProductState | 200.0 MiB | 0.21 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#7309 #id: 9165 #code: "IEEE00001764" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038026 {#7274 : 2025-06-27 17:27:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 31669 #name: "IEEE 1160:1993 (R2006)" #slug: "ieee-1160-1993-r2006-ieee00001764-240817" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity center per cm3, usually on the order of 1010 cm-3.<br />\n \t\t\t\t<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3, usually on the order of 1010 cm–3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-19<br />\n The purpose of this standard is to establish uniform procedures for measurements and analyses in the determination and reporting of bulk properties relevant to germanium radiation detector fabrication and performance. These properties are net electrically active impurity concentrations, |NA – ND|, the concentration of isolated defects with deep electronic levels NT, and certain crystallographic properties. The techniques described herein are those that have found general use in the industry, are practical, and provide verifiable and desired information to the detector fabricator.<br />\n As an aid to the reader, an annex is included for background material. Paragraph numbers in the annex are prefixed by the letter “A,” while the numerical parts of the numbers correspond to those in the main body of the text to which they pertain.<br />\n Not all tests described herein are mandatory; however, any tests that are intended to conform to this standard shall be performed according to its provisions.<br />\n Mandatory procedures are designated by the word “shall.” Recommended procedures are designated by the words “should” or “recommended.” Optional procedures are designated by the word “may.” """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1580425200 {#7292 : 2020-01-31 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @738280800 {#7318 : 1993-05-25 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1143669600 {#7316 : 2006-03-30 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#7315 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1160" -bookCollection: "" -pageCount: 36 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#100220 +product: App\Entity\Product\Product {#7309 #id: 9165 #code: "IEEE00001764" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038026 {#7274 : 2025-06-27 17:27:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 31669 #name: "IEEE 1160:1993 (R2006)" #slug: "ieee-1160-1993-r2006-ieee00001764-240817" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity center per cm3, usually on the order of 1010 cm-3.<br />\n \t\t\t\t<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3, usually on the order of 1010 cm–3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-19<br />\n The purpose of this standard is to establish uniform procedures for measurements and analyses in the determination and reporting of bulk properties relevant to germanium radiation detector fabrication and performance. These properties are net electrically active impurity concentrations, |NA – ND|, the concentration of isolated defects with deep electronic levels NT, and certain crystallographic properties. The techniques described herein are those that have found general use in the industry, are practical, and provide verifiable and desired information to the detector fabricator.<br />\n As an aid to the reader, an annex is included for background material. Paragraph numbers in the annex are prefixed by the letter “A,” while the numerical parts of the numbers correspond to those in the main body of the text to which they pertain.<br />\n Not all tests described herein are mandatory; however, any tests that are intended to conform to this standard shall be performed according to its provisions.<br />\n Mandatory procedures are designated by the word “shall.” Recommended procedures are designated by the words “should” or “recommended.” Optional procedures are designated by the word “may.” """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1580425200 {#7292 : 2020-01-31 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @738280800 {#7318 : 1993-05-25 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1143669600 {#7316 : 2006-03-30 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#7315 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1160" -bookCollection: "" -pageCount: 36 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" "Confirmed" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 200.0 MiB | 0.75 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7309 #id: 9165 #code: "IEEE00001764" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038026 {#7274 : 2025-06-27 17:27:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 31669 #name: "IEEE 1160:1993 (R2006)" #slug: "ieee-1160-1993-r2006-ieee00001764-240817" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity center per cm3, usually on the order of 1010 cm-3.<br />\n \t\t\t\t<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3, usually on the order of 1010 cm–3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-19<br />\n The purpose of this standard is to establish uniform procedures for measurements and analyses in the determination and reporting of bulk properties relevant to germanium radiation detector fabrication and performance. These properties are net electrically active impurity concentrations, |NA – ND|, the concentration of isolated defects with deep electronic levels NT, and certain crystallographic properties. The techniques described herein are those that have found general use in the industry, are practical, and provide verifiable and desired information to the detector fabricator.<br />\n As an aid to the reader, an annex is included for background material. Paragraph numbers in the annex are prefixed by the letter “A,” while the numerical parts of the numbers correspond to those in the main body of the text to which they pertain.<br />\n Not all tests described herein are mandatory; however, any tests that are intended to conform to this standard shall be performed according to its provisions.<br />\n Mandatory procedures are designated by the word “shall.” Recommended procedures are designated by the words “should” or “recommended.” Optional procedures are designated by the word “may.” """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1580425200 {#7292 : 2020-01-31 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @738280800 {#7318 : 1993-05-25 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1143669600 {#7316 : 2006-03-30 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#7315 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1160" -bookCollection: "" -pageCount: 36 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#100304 +product: App\Entity\Product\Product {#7309 #id: 9165 #code: "IEEE00001764" #attributes: Doctrine\ORM\PersistentCollection {#7702 …} #variants: Doctrine\ORM\PersistentCollection {#7745 …} #options: Doctrine\ORM\PersistentCollection {#7917 …} #associations: Doctrine\ORM\PersistentCollection {#7901 …} #createdAt: DateTime @1751038026 {#7274 : 2025-06-27 17:27:06.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#7322 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7923 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7922 #locale: "en_US" #translatable: App\Entity\Product\Product {#7309} #id: 31669 #name: "IEEE 1160:1993 (R2006)" #slug: "ieee-1160-1993-r2006-ieee00001764-240817" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity center per cm3, usually on the order of 1010 cm-3.<br />\n \t\t\t\t<br />\n This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3, usually on the order of 1010 cm–3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-19<br />\n The purpose of this standard is to establish uniform procedures for measurements and analyses in the determination and reporting of bulk properties relevant to germanium radiation detector fabrication and performance. These properties are net electrically active impurity concentrations, |NA – ND|, the concentration of isolated defects with deep electronic levels NT, and certain crystallographic properties. The techniques described herein are those that have found general use in the industry, are practical, and provide verifiable and desired information to the detector fabricator.<br />\n As an aid to the reader, an annex is included for background material. Paragraph numbers in the annex are prefixed by the letter “A,” while the numerical parts of the numbers correspond to those in the main body of the text to which they pertain.<br />\n Not all tests described herein are mandatory; however, any tests that are intended to conform to this standard shall be performed according to its provisions.<br />\n Mandatory procedures are designated by the word “shall.” Recommended procedures are designated by the words “should” or “recommended.” Optional procedures are designated by the word “may.” """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …} #channels: Doctrine\ORM\PersistentCollection {#7629 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#7614 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7646 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7420 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1580425200 {#7292 : 2020-01-31 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @738280800 {#7318 : 1993-05-25 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1143669600 {#7316 : 2006-03-30 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1573081200 {#7315 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1160" -bookCollection: "" -pageCount: 36 -documents: Doctrine\ORM\PersistentCollection {#7466 …} -favorites: Doctrine\ORM\PersistentCollection {#7501 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 200.0 MiB | 8.12 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#121671 #id: 8776 #code: "IEEE00000996" #attributes: Doctrine\ORM\PersistentCollection {#121695 …} #variants: Doctrine\ORM\PersistentCollection {#121693 …} #options: Doctrine\ORM\PersistentCollection {#121688 …} #associations: Doctrine\ORM\PersistentCollection {#121690 …} #createdAt: DateTime @1751037700 {#121686 : 2025-06-27 17:21:40.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#121720 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#121706 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#121808 #locale: "en_US" #translatable: App\Entity\Product\Product {#121671} #id: 30113 #name: "IEEE 759:1984 (R1999)" #slug: "ieee-759-1984-r1999-ieee00000996-240428" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.<br />\n \t\t\t\t<br />\n This document presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse height analyzer/computer. Test procedures for pulse-height analyzers and computers are not covered in this document. Section is essentially tutorial. This standard is not intended to imply that all tests described herein are mandatory, but only that such tests as are carried out shall be performed in accordance with the procedures described herein. Companion documents to this standard are ANSI/IEEE Std 300-1982 [1], ANSI/IEEE Std 301-1976 [2], and ANSI/IEEE Std 325-1971 [3]. The list of symbols and the glossary were derived from those in the companion documents. Contrary to previous convention in the X-ray spectroscopy field, this document utilizes the characteristic energy E of the X-ray rather than its wavelength λ. This approach is consistent with the fact that the basic quantity measured by this type of spectrometer is the X-ray energy. A convenient conversion is provided by the relationship λ(m) = 12.4 · 10-10 E-1(keV) λ(A0) = 12.4 E-1 (keV) """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#121703 …} #channels: Doctrine\ORM\PersistentCollection {#121697 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#121701 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#121699 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#121712 …} -apiLastModifiedAt: DateTime @1754517600 {#121672 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#121714 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @471913200 {#121721 : 1984-12-15 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @937432800 {#121679 : 1999-09-16 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1169074800 {#121713 : 2007-01-18 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "759" -bookCollection: "" -pageCount: 52 -documents: Doctrine\ORM\PersistentCollection {#121710 …} -favorites: Doctrine\ORM\PersistentCollection {#121708 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "additionalClasses" => "product__teaser--with-grey-border" "hasStretchedLink" => true "hoverType" => "shadow" "linkLabel" => "See more" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#121752 +product: App\Entity\Product\Product {#121671 #id: 8776 #code: "IEEE00000996" #attributes: Doctrine\ORM\PersistentCollection {#121695 …} #variants: Doctrine\ORM\PersistentCollection {#121693 …} #options: Doctrine\ORM\PersistentCollection {#121688 …} #associations: Doctrine\ORM\PersistentCollection {#121690 …} #createdAt: DateTime @1751037700 {#121686 : 2025-06-27 17:21:40.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#121720 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#121706 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#121808 #locale: "en_US" #translatable: App\Entity\Product\Product {#121671} #id: 30113 #name: "IEEE 759:1984 (R1999)" #slug: "ieee-759-1984-r1999-ieee00000996-240428" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.<br />\n \t\t\t\t<br />\n This document presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse height analyzer/computer. Test procedures for pulse-height analyzers and computers are not covered in this document. Section is essentially tutorial. This standard is not intended to imply that all tests described herein are mandatory, but only that such tests as are carried out shall be performed in accordance with the procedures described herein. Companion documents to this standard are ANSI/IEEE Std 300-1982 [1], ANSI/IEEE Std 301-1976 [2], and ANSI/IEEE Std 325-1971 [3]. The list of symbols and the glossary were derived from those in the companion documents. Contrary to previous convention in the X-ray spectroscopy field, this document utilizes the characteristic energy E of the X-ray rather than its wavelength λ. This approach is consistent with the fact that the basic quantity measured by this type of spectrometer is the X-ray energy. A convenient conversion is provided by the relationship λ(m) = 12.4 · 10-10 E-1(keV) λ(A0) = 12.4 E-1 (keV) """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#121703 …} #channels: Doctrine\ORM\PersistentCollection {#121697 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#121701 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#121699 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#121712 …} -apiLastModifiedAt: DateTime @1754517600 {#121672 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#121714 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @471913200 {#121721 : 1984-12-15 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @937432800 {#121679 : 1999-09-16 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1169074800 {#121713 : 2007-01-18 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "759" -bookCollection: "" -pageCount: 52 -documents: Doctrine\ORM\PersistentCollection {#121710 …} -favorites: Doctrine\ORM\PersistentCollection {#121708 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "product__teaser--with-grey-border" +linkLabel: "See more" +imageFilter: "product_thumbnail_teaser" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "shadow" } |
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| ProductState | App\Twig\Components\ProductState | 200.0 MiB | 0.19 ms | |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 200.0 MiB | 0.69 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#121671 #id: 8776 #code: "IEEE00000996" #attributes: Doctrine\ORM\PersistentCollection {#121695 …} #variants: Doctrine\ORM\PersistentCollection {#121693 …} #options: Doctrine\ORM\PersistentCollection {#121688 …} #associations: Doctrine\ORM\PersistentCollection {#121690 …} #createdAt: DateTime @1751037700 {#121686 : 2025-06-27 17:21:40.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#121720 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#121706 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#121808 #locale: "en_US" #translatable: App\Entity\Product\Product {#121671} #id: 30113 #name: "IEEE 759:1984 (R1999)" #slug: "ieee-759-1984-r1999-ieee00000996-240428" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.<br />\n \t\t\t\t<br />\n This document presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse height analyzer/computer. Test procedures for pulse-height analyzers and computers are not covered in this document. Section is essentially tutorial. This standard is not intended to imply that all tests described herein are mandatory, but only that such tests as are carried out shall be performed in accordance with the procedures described herein. Companion documents to this standard are ANSI/IEEE Std 300-1982 [1], ANSI/IEEE Std 301-1976 [2], and ANSI/IEEE Std 325-1971 [3]. The list of symbols and the glossary were derived from those in the companion documents. Contrary to previous convention in the X-ray spectroscopy field, this document utilizes the characteristic energy E of the X-ray rather than its wavelength λ. This approach is consistent with the fact that the basic quantity measured by this type of spectrometer is the X-ray energy. A convenient conversion is provided by the relationship λ(m) = 12.4 · 10-10 E-1(keV) λ(A0) = 12.4 E-1 (keV) """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#121703 …} #channels: Doctrine\ORM\PersistentCollection {#121697 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …} #reviews: Doctrine\ORM\PersistentCollection {#121701 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#121699 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#121712 …} -apiLastModifiedAt: DateTime @1754517600 {#121672 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#121714 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @471913200 {#121721 : 1984-12-15 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @937432800 {#121679 : 1999-09-16 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1169074800 {#121713 : 2007-01-18 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "759" -bookCollection: "" -pageCount: 52 -documents: Doctrine\ORM\PersistentCollection {#121710 …} -favorites: Doctrine\ORM\PersistentCollection {#121708 …} } ] |
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