Components

4 Twig Components
18 Render Count
21 ms Render Time
364.0 MiB Memory Usage

Components

Name Metadata Render Count Render Time
ProductState
"App\Twig\Components\ProductState"
components/ProductState.html.twig
8 3.60ms
ProductMostRecent
"App\Twig\Components\ProductMostRecent"
components/ProductMostRecent.html.twig
8 9.79ms
ProductType
"App\Twig\Components\ProductType"
components/ProductType.html.twig
1 0.31ms
ProductCard
"App\Twig\Components\ProductCard"
components/ProductCard.html.twig
1 9.31ms

Render calls

ProductState App\Twig\Components\ProductState 362.0 MiB 1.65 ms
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          Revision Standard - Superseded.<br />\n
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Attributes
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Component
App\Twig\Components\ProductState {#93008
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          Revision Standard - Superseded.<br />\n
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ProductType App\Twig\Components\ProductType 362.0 MiB 0.31 ms
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          Revision Standard - Superseded.<br />\n
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Component
App\Twig\Components\ProductType {#93201
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ProductMostRecent App\Twig\Components\ProductMostRecent 362.0 MiB 1.05 ms
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[
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          Revision Standard - Superseded.<br />\n
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          \t\t\t\t<br />\n
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          The test criteria and definitions of this standard provide a common engineering language beneficial to users and manufacturers of multiple-component surge protectors.<br />\n
          Revisions to C62.36-1994 are needed to more fully cover protectors addressing the fast-paced introduction of broadband circuits in the wire-line communications industry. In addition, there is growing recognition that multiport protectors can help avoid surge damage to electronic components that increasingly interrface with more than one type of wire-line circuit. The proposed changes and additions address the test methods for these emerging products.
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          Revisions to C62.36-1994 are needed to more fully cover protectors addressing the fast-paced introduction of broadband circuits in the wire-line communications industry. In addition, there is growing recognition that multiport protectors can help avoid surge damage to electronic components that increasingly interrface with more than one type of wire-line circuit. The proposed changes and additions address the test methods for these emerging products.
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