GET https://dev.normadoc.fr/products/ieee-1149-10-2017-ieee00005786-242889

Response
200 OK
IP
216.73.216.9
Profiled on
Token
8a3120

Components

3 Twig Components
5 Render Count
2 ms Render Time
74.0 MiB Memory Usage

Components

Name Metadata Render Count Render Time
ProductState 
"App\Twig\Components\ProductState"
components/ProductState.html.twig 		2 0.60ms
ProductMostRecent 
"App\Twig\Components\ProductMostRecent"
components/ProductMostRecent.html.twig 		2 1.54ms
ProductType 
"App\Twig\Components\ProductType"
components/ProductType.html.twig 		1 0.26ms

Render calls

ProductState App\Twig\Components\ProductState 66.0 MiB 0.39 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7310
    #id: 11237
    #code: "IEEE00005786"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039566 {#7274
      date: 2025-06-27 17:52:46.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969918 {#7322
      date: 2025-07-31 15:51:58.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 39957
        #name: "IEEE 1149.10:2017"
        #slug: "ieee-1149-10-2017-ieee00005786-242889"
        #description: """
          New IEEE Standard - Active.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n
          \t\t\t\t<br />\n
          This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n
          The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n
          The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1743289200 {#7317
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1630360800 {#7292
      date: 2021-08-31 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1501192800 {#7318
      date: 2017-07-28 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.10"
    -bookCollection: ""
    -pageCount: 96
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#93066
  +product: App\Entity\Product\Product {#7310
    #id: 11237
    #code: "IEEE00005786"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039566 {#7274
      date: 2025-06-27 17:52:46.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969918 {#7322
      date: 2025-07-31 15:51:58.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 39957
        #name: "IEEE 1149.10:2017"
        #slug: "ieee-1149-10-2017-ieee00005786-242889"
        #description: """
          New IEEE Standard - Active.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n
          \t\t\t\t<br />\n
          This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n
          The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n
          The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1743289200 {#7317
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1630360800 {#7292
      date: 2021-08-31 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1501192800 {#7318
      date: 2017-07-28 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.10"
    -bookCollection: ""
    -pageCount: 96
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +appearance: "state-active"
  +labels: [
    "Active"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductType App\Twig\Components\ProductType 68.0 MiB 0.26 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7310
    #id: 11237
    #code: "IEEE00005786"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039566 {#7274
      date: 2025-06-27 17:52:46.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969918 {#7322
      date: 2025-07-31 15:51:58.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 39957
        #name: "IEEE 1149.10:2017"
        #slug: "ieee-1149-10-2017-ieee00005786-242889"
        #description: """
          New IEEE Standard - Active.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n
          \t\t\t\t<br />\n
          This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n
          The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n
          The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1743289200 {#7317
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1630360800 {#7292
      date: 2021-08-31 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1501192800 {#7318
      date: 2017-07-28 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.10"
    -bookCollection: ""
    -pageCount: 96
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductType {#93246
  +product: App\Entity\Product\Product {#7310
    #id: 11237
    #code: "IEEE00005786"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039566 {#7274
      date: 2025-06-27 17:52:46.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969918 {#7322
      date: 2025-07-31 15:51:58.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 39957
        #name: "IEEE 1149.10:2017"
        #slug: "ieee-1149-10-2017-ieee00005786-242889"
        #description: """
          New IEEE Standard - Active.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n
          \t\t\t\t<br />\n
          This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n
          The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n
          The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1743289200 {#7317
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1630360800 {#7292
      date: 2021-08-31 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1501192800 {#7318
      date: 2017-07-28 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.10"
    -bookCollection: ""
    -pageCount: 96
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +label: "Standard"
  -typeAttributeCode: "type"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 68.0 MiB 0.78 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7310
    #id: 11237
    #code: "IEEE00005786"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039566 {#7274
      date: 2025-06-27 17:52:46.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969918 {#7322
      date: 2025-07-31 15:51:58.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 39957
        #name: "IEEE 1149.10:2017"
        #slug: "ieee-1149-10-2017-ieee00005786-242889"
        #description: """
          New IEEE Standard - Active.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n
          \t\t\t\t<br />\n
          This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n
          The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n
          The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1743289200 {#7317
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1630360800 {#7292
      date: 2021-08-31 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1501192800 {#7318
      date: 2017-07-28 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.10"
    -bookCollection: ""
    -pageCount: 96
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#93321
  +product: App\Entity\Product\Product {#7310
    #id: 11237
    #code: "IEEE00005786"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039566 {#7274
      date: 2025-06-27 17:52:46.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969918 {#7322
      date: 2025-07-31 15:51:58.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 39957
        #name: "IEEE 1149.10:2017"
        #slug: "ieee-1149-10-2017-ieee00005786-242889"
        #description: """
          New IEEE Standard - Active.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n
          \t\t\t\t<br />\n
          This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n
          The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n
          The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1743289200 {#7317
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1630360800 {#7292
      date: 2021-08-31 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1501192800 {#7318
      date: 2017-07-28 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.10"
    -bookCollection: ""
    -pageCount: 96
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 74.0 MiB 0.21 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7310
    #id: 11237
    #code: "IEEE00005786"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039566 {#7274
      date: 2025-06-27 17:52:46.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969918 {#7322
      date: 2025-07-31 15:51:58.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 39957
        #name: "IEEE 1149.10:2017"
        #slug: "ieee-1149-10-2017-ieee00005786-242889"
        #description: """
          New IEEE Standard - Active.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n
          \t\t\t\t<br />\n
          This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n
          The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n
          The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1743289200 {#7317
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1630360800 {#7292
      date: 2021-08-31 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1501192800 {#7318
      date: 2017-07-28 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.10"
    -bookCollection: ""
    -pageCount: 96
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#100264
  +product: App\Entity\Product\Product {#7310
    #id: 11237
    #code: "IEEE00005786"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039566 {#7274
      date: 2025-06-27 17:52:46.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969918 {#7322
      date: 2025-07-31 15:51:58.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 39957
        #name: "IEEE 1149.10:2017"
        #slug: "ieee-1149-10-2017-ieee00005786-242889"
        #description: """
          New IEEE Standard - Active.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n
          \t\t\t\t<br />\n
          This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n
          The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n
          The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1743289200 {#7317
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1630360800 {#7292
      date: 2021-08-31 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1501192800 {#7318
      date: 2017-07-28 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.10"
    -bookCollection: ""
    -pageCount: 96
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +appearance: "state-active"
  +labels: [
    "Active"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 74.0 MiB 0.77 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7310
    #id: 11237
    #code: "IEEE00005786"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039566 {#7274
      date: 2025-06-27 17:52:46.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969918 {#7322
      date: 2025-07-31 15:51:58.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 39957
        #name: "IEEE 1149.10:2017"
        #slug: "ieee-1149-10-2017-ieee00005786-242889"
        #description: """
          New IEEE Standard - Active.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n
          \t\t\t\t<br />\n
          This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n
          The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n
          The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1743289200 {#7317
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1630360800 {#7292
      date: 2021-08-31 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1501192800 {#7318
      date: 2017-07-28 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.10"
    -bookCollection: ""
    -pageCount: 96
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#100348
  +product: App\Entity\Product\Product {#7310
    #id: 11237
    #code: "IEEE00005786"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039566 {#7274
      date: 2025-06-27 17:52:46.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1753969918 {#7322
      date: 2025-07-31 15:51:58.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 39957
        #name: "IEEE 1149.10:2017"
        #slug: "ieee-1149-10-2017-ieee00005786-242889"
        #description: """
          New IEEE Standard - Active.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n
          \t\t\t\t<br />\n
          This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n
          The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n
          The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1743289200 {#7317
      date: 2025-03-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -lastUpdatedAt: DateTime @1630360800 {#7292
      date: 2021-08-31 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1501192800 {#7318
      date: 2017-07-28 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.10"
    -bookCollection: ""
    -pageCount: 96
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}