GET https://dev.normadoc.fr/_fragment?_path=_format%3Dhtml%26_locale%3Den_US%26_controller%3DSylius%255CPayPalPlugin%255CController%255CPayPalButtonsController%253A…

Response
200 OK
IP
216.73.217.103
Profiled on
Token
83ef2a

Components

3 Twig Components
7 Render Count
6 ms Render Time
186.0 MiB Memory Usage

Components

Name Metadata Render Count Render Time
ProductState 
"App\Twig\Components\ProductState"
components/ProductState.html.twig 		3 2.38ms
ProductMostRecent 
"App\Twig\Components\ProductMostRecent"
components/ProductMostRecent.html.twig 		3 2.90ms
ProductType 
"App\Twig\Components\ProductType"
components/ProductType.html.twig 		1 0.49ms

Render calls

ProductState App\Twig\Components\ProductState 186.0 MiB 1.91 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7520
    #id: 9001
    #code: "IEEE00001457"
    #attributes: Doctrine\ORM\PersistentCollection {#8207 …}
    #variants: Doctrine\ORM\PersistentCollection {#8289 …}
    #options: Doctrine\ORM\PersistentCollection {#8628 …}
    #associations: Doctrine\ORM\PersistentCollection {#8585 …}
    #createdAt: DateTime @1751037888 {#7536
      date: 2025-06-27 17:24:48.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7535
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#8627 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#8612
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7520}
        #id: 31013
        #name: "IEEE 1005:1991"
        #slug: "ieee-1005-1991-ieee00001457-240653"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          An introduction to the physics unique to this type of memory and an overview of typical<br />\n
          array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n
          structure that have been used in commercially available devices are described. The various<br />\n
          reliability considerations involved in these devices are explored. Retention and endurance<br />\n
          failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n
          mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n
          engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n
          endurance of the arrays are discussed. The specification and engineering verification of<br />\n
          endurance are described. The more common features incorporated into the arrays and methods<br />\n
          for testing these complex products efficiently are addressed. The effects that various forms of<br />\n
          ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n
          covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n
          \t\t\t\t<br />\n
          This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7943 …}
    #channels: Doctrine\ORM\PersistentCollection {#8104 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7519 …}
    #reviews: Doctrine\ORM\PersistentCollection {#8066 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#8118 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7681 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7746 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7530
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7496
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @687654000 {#7531
      date: 1991-10-17 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1005"
    -bookCollection: ""
    -pageCount: 41
    -documents: Doctrine\ORM\PersistentCollection {#7786 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7928 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#94883
  +product: App\Entity\Product\Product {#7520
    #id: 9001
    #code: "IEEE00001457"
    #attributes: Doctrine\ORM\PersistentCollection {#8207 …}
    #variants: Doctrine\ORM\PersistentCollection {#8289 …}
    #options: Doctrine\ORM\PersistentCollection {#8628 …}
    #associations: Doctrine\ORM\PersistentCollection {#8585 …}
    #createdAt: DateTime @1751037888 {#7536
      date: 2025-06-27 17:24:48.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7535
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#8627 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#8612
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7520}
        #id: 31013
        #name: "IEEE 1005:1991"
        #slug: "ieee-1005-1991-ieee00001457-240653"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          An introduction to the physics unique to this type of memory and an overview of typical<br />\n
          array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n
          structure that have been used in commercially available devices are described. The various<br />\n
          reliability considerations involved in these devices are explored. Retention and endurance<br />\n
          failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n
          mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n
          engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n
          endurance of the arrays are discussed. The specification and engineering verification of<br />\n
          endurance are described. The more common features incorporated into the arrays and methods<br />\n
          for testing these complex products efficiently are addressed. The effects that various forms of<br />\n
          ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n
          covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n
          \t\t\t\t<br />\n
          This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7943 …}
    #channels: Doctrine\ORM\PersistentCollection {#8104 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7519 …}
    #reviews: Doctrine\ORM\PersistentCollection {#8066 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#8118 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7681 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7746 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7530
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7496
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @687654000 {#7531
      date: 1991-10-17 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1005"
    -bookCollection: ""
    -pageCount: 41
    -documents: Doctrine\ORM\PersistentCollection {#7786 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7928 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductType App\Twig\Components\ProductType 186.0 MiB 0.49 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7520
    #id: 9001
    #code: "IEEE00001457"
    #attributes: Doctrine\ORM\PersistentCollection {#8207 …}
    #variants: Doctrine\ORM\PersistentCollection {#8289 …}
    #options: Doctrine\ORM\PersistentCollection {#8628 …}
    #associations: Doctrine\ORM\PersistentCollection {#8585 …}
    #createdAt: DateTime @1751037888 {#7536
      date: 2025-06-27 17:24:48.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7535
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#8627 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#8612
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7520}
        #id: 31013
        #name: "IEEE 1005:1991"
        #slug: "ieee-1005-1991-ieee00001457-240653"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          An introduction to the physics unique to this type of memory and an overview of typical<br />\n
          array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n
          structure that have been used in commercially available devices are described. The various<br />\n
          reliability considerations involved in these devices are explored. Retention and endurance<br />\n
          failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n
          mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n
          engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n
          endurance of the arrays are discussed. The specification and engineering verification of<br />\n
          endurance are described. The more common features incorporated into the arrays and methods<br />\n
          for testing these complex products efficiently are addressed. The effects that various forms of<br />\n
          ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n
          covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n
          \t\t\t\t<br />\n
          This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7943 …}
    #channels: Doctrine\ORM\PersistentCollection {#8104 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7519 …}
    #reviews: Doctrine\ORM\PersistentCollection {#8066 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#8118 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7681 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7746 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7530
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7496
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @687654000 {#7531
      date: 1991-10-17 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1005"
    -bookCollection: ""
    -pageCount: 41
    -documents: Doctrine\ORM\PersistentCollection {#7786 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7928 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductType {#95054
  +product: App\Entity\Product\Product {#7520
    #id: 9001
    #code: "IEEE00001457"
    #attributes: Doctrine\ORM\PersistentCollection {#8207 …}
    #variants: Doctrine\ORM\PersistentCollection {#8289 …}
    #options: Doctrine\ORM\PersistentCollection {#8628 …}
    #associations: Doctrine\ORM\PersistentCollection {#8585 …}
    #createdAt: DateTime @1751037888 {#7536
      date: 2025-06-27 17:24:48.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7535
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#8627 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#8612
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7520}
        #id: 31013
        #name: "IEEE 1005:1991"
        #slug: "ieee-1005-1991-ieee00001457-240653"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          An introduction to the physics unique to this type of memory and an overview of typical<br />\n
          array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n
          structure that have been used in commercially available devices are described. The various<br />\n
          reliability considerations involved in these devices are explored. Retention and endurance<br />\n
          failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n
          mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n
          engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n
          endurance of the arrays are discussed. The specification and engineering verification of<br />\n
          endurance are described. The more common features incorporated into the arrays and methods<br />\n
          for testing these complex products efficiently are addressed. The effects that various forms of<br />\n
          ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n
          covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n
          \t\t\t\t<br />\n
          This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7943 …}
    #channels: Doctrine\ORM\PersistentCollection {#8104 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7519 …}
    #reviews: Doctrine\ORM\PersistentCollection {#8066 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#8118 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7681 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7746 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7530
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7496
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @687654000 {#7531
      date: 1991-10-17 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1005"
    -bookCollection: ""
    -pageCount: 41
    -documents: Doctrine\ORM\PersistentCollection {#7786 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7928 …}
  }
  +label: "Standard"
  -typeAttributeCode: "type"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 186.0 MiB 1.22 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7520
    #id: 9001
    #code: "IEEE00001457"
    #attributes: Doctrine\ORM\PersistentCollection {#8207 …}
    #variants: Doctrine\ORM\PersistentCollection {#8289 …}
    #options: Doctrine\ORM\PersistentCollection {#8628 …}
    #associations: Doctrine\ORM\PersistentCollection {#8585 …}
    #createdAt: DateTime @1751037888 {#7536
      date: 2025-06-27 17:24:48.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7535
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#8627 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#8612
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7520}
        #id: 31013
        #name: "IEEE 1005:1991"
        #slug: "ieee-1005-1991-ieee00001457-240653"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          An introduction to the physics unique to this type of memory and an overview of typical<br />\n
          array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n
          structure that have been used in commercially available devices are described. The various<br />\n
          reliability considerations involved in these devices are explored. Retention and endurance<br />\n
          failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n
          mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n
          engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n
          endurance of the arrays are discussed. The specification and engineering verification of<br />\n
          endurance are described. The more common features incorporated into the arrays and methods<br />\n
          for testing these complex products efficiently are addressed. The effects that various forms of<br />\n
          ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n
          covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n
          \t\t\t\t<br />\n
          This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7943 …}
    #channels: Doctrine\ORM\PersistentCollection {#8104 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7519 …}
    #reviews: Doctrine\ORM\PersistentCollection {#8066 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#8118 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7681 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7746 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7530
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7496
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @687654000 {#7531
      date: 1991-10-17 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1005"
    -bookCollection: ""
    -pageCount: 41
    -documents: Doctrine\ORM\PersistentCollection {#7786 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7928 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#95129
  +product: App\Entity\Product\Product {#7520
    #id: 9001
    #code: "IEEE00001457"
    #attributes: Doctrine\ORM\PersistentCollection {#8207 …}
    #variants: Doctrine\ORM\PersistentCollection {#8289 …}
    #options: Doctrine\ORM\PersistentCollection {#8628 …}
    #associations: Doctrine\ORM\PersistentCollection {#8585 …}
    #createdAt: DateTime @1751037888 {#7536
      date: 2025-06-27 17:24:48.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7535
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#8627 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#8612
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7520}
        #id: 31013
        #name: "IEEE 1005:1991"
        #slug: "ieee-1005-1991-ieee00001457-240653"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          An introduction to the physics unique to this type of memory and an overview of typical<br />\n
          array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n
          structure that have been used in commercially available devices are described. The various<br />\n
          reliability considerations involved in these devices are explored. Retention and endurance<br />\n
          failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n
          mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n
          engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n
          endurance of the arrays are discussed. The specification and engineering verification of<br />\n
          endurance are described. The more common features incorporated into the arrays and methods<br />\n
          for testing these complex products efficiently are addressed. The effects that various forms of<br />\n
          ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n
          covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n
          \t\t\t\t<br />\n
          This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7943 …}
    #channels: Doctrine\ORM\PersistentCollection {#8104 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7519 …}
    #reviews: Doctrine\ORM\PersistentCollection {#8066 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#8118 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7681 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7746 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7530
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7496
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @687654000 {#7531
      date: 1991-10-17 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1005"
    -bookCollection: ""
    -pageCount: 41
    -documents: Doctrine\ORM\PersistentCollection {#7786 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7928 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 186.0 MiB 0.26 ms
Input props 
[
  "product" => App\Entity\Product\Product {#95539
    #id: 9002
    #code: "IEEE00001458"
    #attributes: Doctrine\ORM\PersistentCollection {#95519 …}
    #variants: Doctrine\ORM\PersistentCollection {#95516 …}
    #options: Doctrine\ORM\PersistentCollection {#95512 …}
    #associations: Doctrine\ORM\PersistentCollection {#95508 …}
    #createdAt: DateTime @1751037889 {#95546
      date: 2025-06-27 17:24:49.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#95525
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#95530 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95571
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#95539}
        #id: 31017
        #name: "IEEE 1005:1998"
        #slug: "ieee-1005-1998-ieee00001458-240654"
        #description: """
          Revision Standard - Inactive-Withdrawn.<br />\n
          This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n
          \t\t\t\t<br />\n
          Modify the present FGA standard to include floating gate &quot;flash&quot; EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n
          Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays"
        -notes: "Inactive-Withdrawn"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#95528 …}
    #channels: Doctrine\ORM\PersistentCollection {#95521 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7519 …}
    #reviews: Doctrine\ORM\PersistentCollection {#95526 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#95523 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7681 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95536 …}
    -apiLastModifiedAt: DateTime @1754517600 {#95509
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#95545
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @918514800 {#95544
      date: 1999-02-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1074207600 {#95538
      date: 2004-01-16 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1005"
    -bookCollection: ""
    -pageCount: 129
    -documents: Doctrine\ORM\PersistentCollection {#95534 …}
    -favorites: Doctrine\ORM\PersistentCollection {#95532 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#108707
  +product: App\Entity\Product\Product {#95539
    #id: 9002
    #code: "IEEE00001458"
    #attributes: Doctrine\ORM\PersistentCollection {#95519 …}
    #variants: Doctrine\ORM\PersistentCollection {#95516 …}
    #options: Doctrine\ORM\PersistentCollection {#95512 …}
    #associations: Doctrine\ORM\PersistentCollection {#95508 …}
    #createdAt: DateTime @1751037889 {#95546
      date: 2025-06-27 17:24:49.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#95525
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#95530 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95571
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#95539}
        #id: 31017
        #name: "IEEE 1005:1998"
        #slug: "ieee-1005-1998-ieee00001458-240654"
        #description: """
          Revision Standard - Inactive-Withdrawn.<br />\n
          This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n
          \t\t\t\t<br />\n
          Modify the present FGA standard to include floating gate &quot;flash&quot; EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n
          Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays"
        -notes: "Inactive-Withdrawn"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#95528 …}
    #channels: Doctrine\ORM\PersistentCollection {#95521 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7519 …}
    #reviews: Doctrine\ORM\PersistentCollection {#95526 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#95523 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7681 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95536 …}
    -apiLastModifiedAt: DateTime @1754517600 {#95509
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#95545
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @918514800 {#95544
      date: 1999-02-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1074207600 {#95538
      date: 2004-01-16 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1005"
    -bookCollection: ""
    -pageCount: 129
    -documents: Doctrine\ORM\PersistentCollection {#95534 …}
    -favorites: Doctrine\ORM\PersistentCollection {#95532 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 186.0 MiB 0.91 ms
Input props 
[
  "product" => App\Entity\Product\Product {#95539
    #id: 9002
    #code: "IEEE00001458"
    #attributes: Doctrine\ORM\PersistentCollection {#95519 …}
    #variants: Doctrine\ORM\PersistentCollection {#95516 …}
    #options: Doctrine\ORM\PersistentCollection {#95512 …}
    #associations: Doctrine\ORM\PersistentCollection {#95508 …}
    #createdAt: DateTime @1751037889 {#95546
      date: 2025-06-27 17:24:49.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#95525
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#95530 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95571
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#95539}
        #id: 31017
        #name: "IEEE 1005:1998"
        #slug: "ieee-1005-1998-ieee00001458-240654"
        #description: """
          Revision Standard - Inactive-Withdrawn.<br />\n
          This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n
          \t\t\t\t<br />\n
          Modify the present FGA standard to include floating gate &quot;flash&quot; EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n
          Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays"
        -notes: "Inactive-Withdrawn"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#95528 …}
    #channels: Doctrine\ORM\PersistentCollection {#95521 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7519 …}
    #reviews: Doctrine\ORM\PersistentCollection {#95526 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#95523 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7681 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95536 …}
    -apiLastModifiedAt: DateTime @1754517600 {#95509
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#95545
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @918514800 {#95544
      date: 1999-02-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1074207600 {#95538
      date: 2004-01-16 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1005"
    -bookCollection: ""
    -pageCount: 129
    -documents: Doctrine\ORM\PersistentCollection {#95534 …}
    -favorites: Doctrine\ORM\PersistentCollection {#95532 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#108762
  +product: App\Entity\Product\Product {#95539
    #id: 9002
    #code: "IEEE00001458"
    #attributes: Doctrine\ORM\PersistentCollection {#95519 …}
    #variants: Doctrine\ORM\PersistentCollection {#95516 …}
    #options: Doctrine\ORM\PersistentCollection {#95512 …}
    #associations: Doctrine\ORM\PersistentCollection {#95508 …}
    #createdAt: DateTime @1751037889 {#95546
      date: 2025-06-27 17:24:49.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#95525
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#95530 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95571
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#95539}
        #id: 31017
        #name: "IEEE 1005:1998"
        #slug: "ieee-1005-1998-ieee00001458-240654"
        #description: """
          Revision Standard - Inactive-Withdrawn.<br />\n
          This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n
          \t\t\t\t<br />\n
          Modify the present FGA standard to include floating gate &quot;flash&quot; EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n
          Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays"
        -notes: "Inactive-Withdrawn"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#95528 …}
    #channels: Doctrine\ORM\PersistentCollection {#95521 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7519 …}
    #reviews: Doctrine\ORM\PersistentCollection {#95526 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#95523 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7681 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95536 …}
    -apiLastModifiedAt: DateTime @1754517600 {#95509
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#95545
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @918514800 {#95544
      date: 1999-02-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1074207600 {#95538
      date: 2004-01-16 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1005"
    -bookCollection: ""
    -pageCount: 129
    -documents: Doctrine\ORM\PersistentCollection {#95534 …}
    -favorites: Doctrine\ORM\PersistentCollection {#95532 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 186.0 MiB 0.21 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7520
    #id: 9001
    #code: "IEEE00001457"
    #attributes: Doctrine\ORM\PersistentCollection {#8207 …}
    #variants: Doctrine\ORM\PersistentCollection {#8289 …}
    #options: Doctrine\ORM\PersistentCollection {#8628 …}
    #associations: Doctrine\ORM\PersistentCollection {#8585 …}
    #createdAt: DateTime @1751037888 {#7536
      date: 2025-06-27 17:24:48.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7535
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#8627 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#8612
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7520}
        #id: 31013
        #name: "IEEE 1005:1991"
        #slug: "ieee-1005-1991-ieee00001457-240653"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          An introduction to the physics unique to this type of memory and an overview of typical<br />\n
          array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n
          structure that have been used in commercially available devices are described. The various<br />\n
          reliability considerations involved in these devices are explored. Retention and endurance<br />\n
          failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n
          mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n
          engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n
          endurance of the arrays are discussed. The specification and engineering verification of<br />\n
          endurance are described. The more common features incorporated into the arrays and methods<br />\n
          for testing these complex products efficiently are addressed. The effects that various forms of<br />\n
          ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n
          covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n
          \t\t\t\t<br />\n
          This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7943 …}
    #channels: Doctrine\ORM\PersistentCollection {#8104 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7519 …}
    #reviews: Doctrine\ORM\PersistentCollection {#8066 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#8118 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7681 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7746 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7530
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7496
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @687654000 {#7531
      date: 1991-10-17 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1005"
    -bookCollection: ""
    -pageCount: 41
    -documents: Doctrine\ORM\PersistentCollection {#7786 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7928 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#108827
  +product: App\Entity\Product\Product {#7520
    #id: 9001
    #code: "IEEE00001457"
    #attributes: Doctrine\ORM\PersistentCollection {#8207 …}
    #variants: Doctrine\ORM\PersistentCollection {#8289 …}
    #options: Doctrine\ORM\PersistentCollection {#8628 …}
    #associations: Doctrine\ORM\PersistentCollection {#8585 …}
    #createdAt: DateTime @1751037888 {#7536
      date: 2025-06-27 17:24:48.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7535
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#8627 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#8612
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7520}
        #id: 31013
        #name: "IEEE 1005:1991"
        #slug: "ieee-1005-1991-ieee00001457-240653"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          An introduction to the physics unique to this type of memory and an overview of typical<br />\n
          array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n
          structure that have been used in commercially available devices are described. The various<br />\n
          reliability considerations involved in these devices are explored. Retention and endurance<br />\n
          failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n
          mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n
          engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n
          endurance of the arrays are discussed. The specification and engineering verification of<br />\n
          endurance are described. The more common features incorporated into the arrays and methods<br />\n
          for testing these complex products efficiently are addressed. The effects that various forms of<br />\n
          ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n
          covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n
          \t\t\t\t<br />\n
          This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7943 …}
    #channels: Doctrine\ORM\PersistentCollection {#8104 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7519 …}
    #reviews: Doctrine\ORM\PersistentCollection {#8066 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#8118 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7681 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7746 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7530
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7496
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @687654000 {#7531
      date: 1991-10-17 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1005"
    -bookCollection: ""
    -pageCount: 41
    -documents: Doctrine\ORM\PersistentCollection {#7786 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7928 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 186.0 MiB 0.78 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7520
    #id: 9001
    #code: "IEEE00001457"
    #attributes: Doctrine\ORM\PersistentCollection {#8207 …}
    #variants: Doctrine\ORM\PersistentCollection {#8289 …}
    #options: Doctrine\ORM\PersistentCollection {#8628 …}
    #associations: Doctrine\ORM\PersistentCollection {#8585 …}
    #createdAt: DateTime @1751037888 {#7536
      date: 2025-06-27 17:24:48.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7535
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#8627 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#8612
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7520}
        #id: 31013
        #name: "IEEE 1005:1991"
        #slug: "ieee-1005-1991-ieee00001457-240653"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          An introduction to the physics unique to this type of memory and an overview of typical<br />\n
          array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n
          structure that have been used in commercially available devices are described. The various<br />\n
          reliability considerations involved in these devices are explored. Retention and endurance<br />\n
          failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n
          mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n
          engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n
          endurance of the arrays are discussed. The specification and engineering verification of<br />\n
          endurance are described. The more common features incorporated into the arrays and methods<br />\n
          for testing these complex products efficiently are addressed. The effects that various forms of<br />\n
          ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n
          covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n
          \t\t\t\t<br />\n
          This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7943 …}
    #channels: Doctrine\ORM\PersistentCollection {#8104 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7519 …}
    #reviews: Doctrine\ORM\PersistentCollection {#8066 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#8118 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7681 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7746 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7530
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7496
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @687654000 {#7531
      date: 1991-10-17 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1005"
    -bookCollection: ""
    -pageCount: 41
    -documents: Doctrine\ORM\PersistentCollection {#7786 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7928 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#108854
  +product: App\Entity\Product\Product {#7520
    #id: 9001
    #code: "IEEE00001457"
    #attributes: Doctrine\ORM\PersistentCollection {#8207 …}
    #variants: Doctrine\ORM\PersistentCollection {#8289 …}
    #options: Doctrine\ORM\PersistentCollection {#8628 …}
    #associations: Doctrine\ORM\PersistentCollection {#8585 …}
    #createdAt: DateTime @1751037888 {#7536
      date: 2025-06-27 17:24:48.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#7535
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#8627 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#8612
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7520}
        #id: 31013
        #name: "IEEE 1005:1991"
        #slug: "ieee-1005-1991-ieee00001457-240653"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          An introduction to the physics unique to this type of memory and an overview of typical<br />\n
          array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n
          structure that have been used in commercially available devices are described. The various<br />\n
          reliability considerations involved in these devices are explored. Retention and endurance<br />\n
          failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n
          mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n
          engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n
          endurance of the arrays are discussed. The specification and engineering verification of<br />\n
          endurance are described. The more common features incorporated into the arrays and methods<br />\n
          for testing these complex products efficiently are addressed. The effects that various forms of<br />\n
          ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n
          covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n
          \t\t\t\t<br />\n
          This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7943 …}
    #channels: Doctrine\ORM\PersistentCollection {#8104 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7519 …}
    #reviews: Doctrine\ORM\PersistentCollection {#8066 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#8118 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7681 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7746 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7530
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7496
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @687654000 {#7531
      date: 1991-10-17 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1005"
    -bookCollection: ""
    -pageCount: 41
    -documents: Doctrine\ORM\PersistentCollection {#7786 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7928 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}