GET https://dev.normadoc.fr/products/ieee-592-1977-ieee00000822-240312

Response
200 OK
IP
216.73.216.149
Profiled on
Token
8315db

Components

3 Twig Components
11 Render Count
9 ms Render Time
414.0 MiB Memory Usage

Components

Name Metadata Render Count Render Time
ProductState 
"App\Twig\Components\ProductState"
components/ProductState.html.twig 		5 4.11ms
ProductMostRecent 
"App\Twig\Components\ProductMostRecent"
components/ProductMostRecent.html.twig 		5 4.49ms
ProductType 
"App\Twig\Components\ProductType"
components/ProductType.html.twig 		1 0.66ms

Render calls

ProductState App\Twig\Components\ProductState 414.0 MiB 3.16 ms
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          New IEEE Standard - Superseded.<br />\n
          IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
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          New IEEE Standard - Superseded.<br />\n
          IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
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          New IEEE Standard - Superseded.<br />\n
          IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
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          New IEEE Standard - Superseded.<br />\n
          IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
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ProductMostRecent App\Twig\Components\ProductMostRecent 414.0 MiB 1.41 ms
Input props 
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          New IEEE Standard - Superseded.<br />\n
          IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
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          This standard covers electrical tests and performance requirements for exposed semiconducting shields on premolded cable accessories, specifically joints and separable insulated connectors, rated 5 kV through 35 kV.
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          New IEEE Standard - Superseded.<br />\n
          IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
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ProductState App\Twig\Components\ProductState 414.0 MiB 0.32 ms
Input props 
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Component 
App\Twig\Components\ProductState {#106772
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