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Response
200 OK
IP
216.73.216.149
Profiled on
Token
7fbe46

Forms

  • sylius_add_to_cart
    • cartItem
    • _token

sylius_add_to_cart

Form type: 
"Sylius\Bundle\CoreBundle\Form\Type\Order\AddToCartType"

Errors

This form has no errors.

Default Data

Property Value
Model Format same as normalized format
Normalized Format 
Sylius\Bundle\OrderBundle\Controller\AddToCartCommand {#113697
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    #variant: App\Entity\Product\ProductVariant {#8104
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        #variants: Doctrine\ORM\PersistentCollection {#7744 …}
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          -snapshot: [ …4]
          -owner: App\Entity\Product\Product {#7311}
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          -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#215592 …}
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        }
        #enabled: true
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            #locale: "en_US"
            #translatable: App\Entity\Product\Product {#7311}
            #id: 36397
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            #description: """
              New IEEE Standard - Inactive-Reserved.<br />\n
              IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1(TM)) is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in compliant ICs. The standard is limited to the behavioral description of the implementation and will not include the technical design for the test logic or test mode control circuitry.<br />\n
              \t\t\t\t<br />\n
              This standard defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1)1 is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in compliant ICs. The standard is limited to the behavioral description of the implementation and will not include the technical design for the test logic or test mode control circuitry.<br />\n
              There is currently no defined, independent standard for test technology in memory devices. Each vendor is free in the way of implementing test hardware functionality in their ICs to support connectivity tests. Without an independent standard, testability is reduced, and test coverage may not be complete -- making the test technology less useful for others.<br />\n
              This standard will improve interconnect testing for discrete memory devices by specifying implementation rules for test logic and test mode entry/exit methods included in memory ICs as guidance both to IC vendors implementing the standard and to test equipment manufacturers supporting this standard. The standard is aimed at ICs that are otherwise not provisioned with design for testability (DFT) for any reason, targeting primarily memory devices but also allowing for implementation in other devices, while supporting the highest fault coverage and pin-level diagnostics of board-level connectivity faults on such devices.
              """
            #metaKeywords: null
            #metaDescription: null
            #shortDescription: "IEEE Standard for Static Component Interconnection Test Protocol and Architecture"
            -notes: "Inactive-Reserved"
          }
        ]
        #currentLocale: "en_US"
        #currentTranslation: null
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        #variantSelectionMethod: "match"
        #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
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        #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
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        -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
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        -lastUpdatedAt: DateTime @1648764000 {#7292
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        -author: ""
        -publishedAt: DateTime @1308520800 {#7318
          date: 2011-06-20 00:00:00.0 Europe/Paris (+02:00)
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      }
      #updatedAt: DateTime @1756908201 {#8121
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      }
      #enabled: true
      #translations: Doctrine\ORM\PersistentCollection {#8264 …}
      #translationsCache: [
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          #translatable: App\Entity\Product\ProductVariant {#8104}
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      #taxCategory: Proxies\__CG__\App\Entity\Taxation\TaxCategory {#8136 …}
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View Format same as normalized format

Submitted Data

This form was not submitted.

Passed Options

Option Passed Value Resolved Value
data 
Sylius\Bundle\OrderBundle\Controller\AddToCartCommand {#113697
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  -cartItem: App\Entity\Order\OrderItem {#113685
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    #order: null
    #quantity: 1
    #unitPrice: 0
    #originalUnitPrice: 0
    #total: 0
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    #units: Doctrine\Common\Collections\ArrayCollection {#113709 …}
    #unitsTotal: 0
    #adjustments: Doctrine\Common\Collections\ArrayCollection {#113710 …}
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    #version: 1
    #variant: App\Entity\Product\ProductVariant {#8104
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      #code: "IEEE00004212PDF"
      #product: App\Entity\Product\Product {#7311
        #id: 10347
        #code: "IEEE00004212"
        #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
        #variants: Doctrine\ORM\PersistentCollection {#7744 …}
        #options: Doctrine\ORM\PersistentCollection {#7916
          #collection: Doctrine\Common\Collections\ArrayCollection {#7918 …}
          #initialized: true
          -snapshot: [ …4]
          -owner: App\Entity\Product\Product {#7311}
          -association: [ …21]
          -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …}
          -backRefFieldName: null
          -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#215592 …}
          -isDirty: false
        }
        #associations: Doctrine\ORM\PersistentCollection {#7900 …}
        #createdAt: DateTime @1751039005 {#7274
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        #updatedAt: DateTime @1754607611 {#7322
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        }
        #enabled: true
        #translations: Doctrine\ORM\PersistentCollection {#7922 …}
        #translationsCache: [
          "en_US" => App\Entity\Product\ProductTranslation {#7921
            #locale: "en_US"
            #translatable: App\Entity\Product\Product {#7311}
            #id: 36397
            #name: "IEEE 1581:2011"
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              New IEEE Standard - Inactive-Reserved.<br />\n
              IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1(TM)) is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in compliant ICs. The standard is limited to the behavioral description of the implementation and will not include the technical design for the test logic or test mode control circuitry.<br />\n
              \t\t\t\t<br />\n
              This standard defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1)1 is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in compliant ICs. The standard is limited to the behavioral description of the implementation and will not include the technical design for the test logic or test mode control circuitry.<br />\n
              There is currently no defined, independent standard for test technology in memory devices. Each vendor is free in the way of implementing test hardware functionality in their ICs to support connectivity tests. Without an independent standard, testability is reduced, and test coverage may not be complete -- making the test technology less useful for others.<br />\n
              This standard will improve interconnect testing for discrete memory devices by specifying implementation rules for test logic and test mode entry/exit methods included in memory ICs as guidance both to IC vendors implementing the standard and to test equipment manufacturers supporting this standard. The standard is aimed at ICs that are otherwise not provisioned with design for testability (DFT) for any reason, targeting primarily memory devices but also allowing for implementation in other devices, while supporting the highest fault coverage and pin-level diagnostics of board-level connectivity faults on such devices.
              """
            #metaKeywords: null
            #metaDescription: null
            #shortDescription: "IEEE Standard for Static Component Interconnection Test Protocol and Architecture"
            -notes: "Inactive-Reserved"
          }
        ]
        #currentLocale: "en_US"
        #currentTranslation: null
        #fallbackLocale: "en_US"
        #variantSelectionMethod: "match"
        #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
        #channels: Doctrine\ORM\PersistentCollection {#7628 …}
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        #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
        #averageRating: 0.0
        #images: Doctrine\ORM\PersistentCollection {#7645 …}
        -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
        -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
        -apiLastModifiedAt: DateTime @1754517600 {#7317
          date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
        }
        -lastUpdatedAt: DateTime @1648764000 {#7292
          date: 2022-04-01 00:00:00.0 Europe/Paris (+02:00)
        }
        -author: ""
        -publishedAt: DateTime @1308520800 {#7318
          date: 2011-06-20 00:00:00.0 Europe/Paris (+02:00)
        }
        -releasedAt: null
        -confirmedAt: null
        -canceledAt: DateTime @1648076400 {#7316
          date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
        }
        -edition: null
        -coreDocument: "1581"
        -bookCollection: ""
        -pageCount: 61
        -documents: Doctrine\ORM\PersistentCollection {#7465 …}
        -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
      }
      #optionValues: Doctrine\ORM\PersistentCollection {#8320 …}
      #position: 0
      #createdAt: DateTime @1751041197 {#7283
        date: 2025-06-27 18:19:57.0 Europe/Paris (+02:00)
      }
      #updatedAt: DateTime @1756908201 {#8121
        date: 2025-09-03 16:03:21.0 Europe/Paris (+02:00)
      }
      #enabled: true
      #translations: Doctrine\ORM\PersistentCollection {#8264 …}
      #translationsCache: [
        "en_US" => App\Entity\Product\ProductVariantTranslation {#93381
          #locale: "en_US"
          #translatable: App\Entity\Product\ProductVariant {#8104}
          #id: 4527
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          -notes: null
          -shippingInformation: "Instant download"
        }
      ]
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      #version: 10
      #onHold: 0
      #onHand: 0
      #tracked: false
      #weight: 0.0
      #width: null
      #height: null
      #depth: null
      #taxCategory: Proxies\__CG__\App\Entity\Taxation\TaxCategory {#8136 …}
      #shippingCategory: null
      #channelPricings: Doctrine\ORM\PersistentCollection {#8298 …}
      #shippingRequired: true
      #images: Doctrine\ORM\PersistentCollection {#8295 …}
      -apiLastModifiedAt: DateTime @1756850400 {#8103
        date: 2025-09-03 00:00:00.0 Europe/Paris (+02:00)
      }
      -publishedAt: null
      -isbn: "978-0-7381-6613-1"
      -ean: "9780738166131"
      -numberOfUsers: 1
      -physicalProduct: false
      -downloadableImmediately: true
      -downloadable: true
      -drmViewerUrl: "https://online-viewer.normadoc.com/WM9HUb"
      -sellable: true
      -documents: Doctrine\ORM\PersistentCollection {#8132 …}
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      -enabledForSubscribers: true
      -currentAreaContext: null
    }
    #productName: null
    #variantName: null
  }
}
 same as passed value
product 
App\Entity\Product\Product {#7311
  #id: 10347
  #code: "IEEE00004212"
  #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
  #variants: Doctrine\ORM\PersistentCollection {#7744 …}
  #options: Doctrine\ORM\PersistentCollection {#7916
    #collection: Doctrine\Common\Collections\ArrayCollection {#7918 …}
    #initialized: true
    -snapshot: [ …4]
    -owner: App\Entity\Product\Product {#7311}
    -association: [ …21]
    -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …}
    -backRefFieldName: null
    -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#215592 …}
    -isDirty: false
  }
  #associations: Doctrine\ORM\PersistentCollection {#7900 …}
  #createdAt: DateTime @1751039005 {#7274
    date: 2025-06-27 17:43:25.0 Europe/Paris (+02:00)
  }
  #updatedAt: DateTime @1754607611 {#7322
    date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
  }
  #enabled: true
  #translations: Doctrine\ORM\PersistentCollection {#7922 …}
  #translationsCache: [
    "en_US" => App\Entity\Product\ProductTranslation {#7921
      #locale: "en_US"
      #translatable: App\Entity\Product\Product {#7311}
      #id: 36397
      #name: "IEEE 1581:2011"
      #slug: "ieee-1581-2011-ieee00004212-241999"
      #description: """
        New IEEE Standard - Inactive-Reserved.<br />\n
        IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1(TM)) is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in compliant ICs. The standard is limited to the behavioral description of the implementation and will not include the technical design for the test logic or test mode control circuitry.<br />\n
        \t\t\t\t<br />\n
        This standard defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1)1 is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in compliant ICs. The standard is limited to the behavioral description of the implementation and will not include the technical design for the test logic or test mode control circuitry.<br />\n
        There is currently no defined, independent standard for test technology in memory devices. Each vendor is free in the way of implementing test hardware functionality in their ICs to support connectivity tests. Without an independent standard, testability is reduced, and test coverage may not be complete -- making the test technology less useful for others.<br />\n
        This standard will improve interconnect testing for discrete memory devices by specifying implementation rules for test logic and test mode entry/exit methods included in memory ICs as guidance both to IC vendors implementing the standard and to test equipment manufacturers supporting this standard. The standard is aimed at ICs that are otherwise not provisioned with design for testability (DFT) for any reason, targeting primarily memory devices but also allowing for implementation in other devices, while supporting the highest fault coverage and pin-level diagnostics of board-level connectivity faults on such devices.
        """
      #metaKeywords: null
      #metaDescription: null
      #shortDescription: "IEEE Standard for Static Component Interconnection Test Protocol and Architecture"
      -notes: "Inactive-Reserved"
    }
  ]
  #currentLocale: "en_US"
  #currentTranslation: null
  #fallbackLocale: "en_US"
  #variantSelectionMethod: "match"
  #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
  #channels: Doctrine\ORM\PersistentCollection {#7628 …}
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  #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
  #averageRating: 0.0
  #images: Doctrine\ORM\PersistentCollection {#7645 …}
  -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
  -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
  -apiLastModifiedAt: DateTime @1754517600 {#7317
    date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
  }
  -lastUpdatedAt: DateTime @1648764000 {#7292
    date: 2022-04-01 00:00:00.0 Europe/Paris (+02:00)
  }
  -author: ""
  -publishedAt: DateTime @1308520800 {#7318
    date: 2011-06-20 00:00:00.0 Europe/Paris (+02:00)
  }
  -releasedAt: null
  -confirmedAt: null
  -canceledAt: DateTime @1648076400 {#7316
    date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
  }
  -edition: null
  -coreDocument: "1581"
  -bookCollection: ""
  -pageCount: 61
  -documents: Doctrine\ORM\PersistentCollection {#7465 …}
  -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
}
 same as passed value

Resolved Options

Option Value
action 
""
allow_extra_fields 
false
allow_file_upload 
false
attr 
[]
attr_translation_parameters 
[]
auto_initialize 
true
block_name 
null
block_prefix 
null
by_reference 
true
compound 
true
constraints 
[]
csrf_field_name 
"_token"
csrf_message 
"The CSRF token is invalid. Please try to resubmit the form."
csrf_protection 
true
csrf_token_id 
null
csrf_token_manager 
Symfony\Component\Security\Csrf\CsrfTokenManager {#113717
  -generator: Symfony\Component\Security\Csrf\TokenGenerator\UriSafeTokenGenerator {#113718 …}
  -storage: Symfony\Component\Security\Csrf\TokenStorage\SessionTokenStorage {#113719 …}
  -namespace: Closure() {#113721 …}
}
data 
Sylius\Bundle\OrderBundle\Controller\AddToCartCommand {#113697
  -cart: App\Entity\Order\Order {#13374 …}
  -cartItem: App\Entity\Order\OrderItem {#113685
    #id: null
    #order: null
    #quantity: 1
    #unitPrice: 0
    #originalUnitPrice: 0
    #total: 0
    #immutable: false
    #units: Doctrine\Common\Collections\ArrayCollection {#113709 …}
    #unitsTotal: 0
    #adjustments: Doctrine\Common\Collections\ArrayCollection {#113710 …}
    #adjustmentsTotal: 0
    #version: 1
    #variant: App\Entity\Product\ProductVariant {#8104
      #id: 4509
      #code: "IEEE00004212PDF"
      #product: App\Entity\Product\Product {#7311
        #id: 10347
        #code: "IEEE00004212"
        #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
        #variants: Doctrine\ORM\PersistentCollection {#7744 …}
        #options: Doctrine\ORM\PersistentCollection {#7916
          #collection: Doctrine\Common\Collections\ArrayCollection {#7918 …}
          #initialized: true
          -snapshot: [ …4]
          -owner: App\Entity\Product\Product {#7311}
          -association: [ …21]
          -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …}
          -backRefFieldName: null
          -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#215592 …}
          -isDirty: false
        }
        #associations: Doctrine\ORM\PersistentCollection {#7900 …}
        #createdAt: DateTime @1751039005 {#7274
          date: 2025-06-27 17:43:25.0 Europe/Paris (+02:00)
        }
        #updatedAt: DateTime @1754607611 {#7322
          date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
        }
        #enabled: true
        #translations: Doctrine\ORM\PersistentCollection {#7922 …}
        #translationsCache: [
          "en_US" => App\Entity\Product\ProductTranslation {#7921
            #locale: "en_US"
            #translatable: App\Entity\Product\Product {#7311}
            #id: 36397
            #name: "IEEE 1581:2011"
            #slug: "ieee-1581-2011-ieee00004212-241999"
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              New IEEE Standard - Inactive-Reserved.<br />\n
              IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1(TM)) is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in compliant ICs. The standard is limited to the behavioral description of the implementation and will not include the technical design for the test logic or test mode control circuitry.<br />\n
              \t\t\t\t<br />\n
              This standard defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1)1 is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in compliant ICs. The standard is limited to the behavioral description of the implementation and will not include the technical design for the test logic or test mode control circuitry.<br />\n
              There is currently no defined, independent standard for test technology in memory devices. Each vendor is free in the way of implementing test hardware functionality in their ICs to support connectivity tests. Without an independent standard, testability is reduced, and test coverage may not be complete -- making the test technology less useful for others.<br />\n
              This standard will improve interconnect testing for discrete memory devices by specifying implementation rules for test logic and test mode entry/exit methods included in memory ICs as guidance both to IC vendors implementing the standard and to test equipment manufacturers supporting this standard. The standard is aimed at ICs that are otherwise not provisioned with design for testability (DFT) for any reason, targeting primarily memory devices but also allowing for implementation in other devices, while supporting the highest fault coverage and pin-level diagnostics of board-level connectivity faults on such devices.
              """
            #metaKeywords: null
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            #shortDescription: "IEEE Standard for Static Component Interconnection Test Protocol and Architecture"
            -notes: "Inactive-Reserved"
          }
        ]
        #currentLocale: "en_US"
        #currentTranslation: null
        #fallbackLocale: "en_US"
        #variantSelectionMethod: "match"
        #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
        #channels: Doctrine\ORM\PersistentCollection {#7628 …}
        #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
        #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
        #averageRating: 0.0
        #images: Doctrine\ORM\PersistentCollection {#7645 …}
        -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
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