Components
4
Twig Components
8
Render Count
10
ms
Render Time
430.0
MiB
Memory Usage
Components
| Name | Metadata | Render Count | Render Time |
|---|---|---|---|
| ProductState |
"App\Twig\Components\ProductState"components/ProductState.html.twig |
3 | 0.75ms |
| ProductMostRecent |
"App\Twig\Components\ProductMostRecent"components/ProductMostRecent.html.twig |
3 | 2.45ms |
| ProductType |
"App\Twig\Components\ProductType"components/ProductType.html.twig |
1 | 0.21ms |
| ProductCard |
"App\Twig\Components\ProductCard"components/ProductCard.html.twig |
1 | 8.12ms |
Render calls
| ProductState | App\Twig\Components\ProductState | 430.0 MiB | 0.30 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7310 #id: 10183 #code: "IEEE00003827" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751038879 {#7274 : 2025-06-27 17:41:19.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 35741 #name: "IEEE 1505.1:2008" #slug: "ieee-1505-1-2008-ieee00003827-241835" #description: """ New IEEE Standard - Superseded.<br />\n This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).<br />\n \t\t\t\t<br />\n The scope of this standard is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.<br />\n Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375308000 {#7318 : 2013-08-01 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1505.1" -bookCollection: "" -pageCount: 170 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#93007 +product: App\Entity\Product\Product {#7310 #id: 10183 #code: "IEEE00003827" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751038879 {#7274 : 2025-06-27 17:41:19.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 35741 #name: "IEEE 1505.1:2008" #slug: "ieee-1505-1-2008-ieee00003827-241835" #description: """ New IEEE Standard - Superseded.<br />\n This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).<br />\n \t\t\t\t<br />\n The scope of this standard is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.<br />\n Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375308000 {#7318 : 2013-08-01 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1505.1" -bookCollection: "" -pageCount: 170 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductType | App\Twig\Components\ProductType | 430.0 MiB | 0.21 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7310 #id: 10183 #code: "IEEE00003827" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751038879 {#7274 : 2025-06-27 17:41:19.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 35741 #name: "IEEE 1505.1:2008" #slug: "ieee-1505-1-2008-ieee00003827-241835" #description: """ New IEEE Standard - Superseded.<br />\n This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).<br />\n \t\t\t\t<br />\n The scope of this standard is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.<br />\n Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375308000 {#7318 : 2013-08-01 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1505.1" -bookCollection: "" -pageCount: 170 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductType {#93187 +product: App\Entity\Product\Product {#7310 #id: 10183 #code: "IEEE00003827" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751038879 {#7274 : 2025-06-27 17:41:19.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 35741 #name: "IEEE 1505.1:2008" #slug: "ieee-1505-1-2008-ieee00003827-241835" #description: """ New IEEE Standard - Superseded.<br />\n This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).<br />\n \t\t\t\t<br />\n The scope of this standard is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.<br />\n Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375308000 {#7318 : 2013-08-01 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1505.1" -bookCollection: "" -pageCount: 170 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } +label: "Standard" -typeAttributeCode: "type" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 430.0 MiB | 0.71 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7310 #id: 10183 #code: "IEEE00003827" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751038879 {#7274 : 2025-06-27 17:41:19.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 35741 #name: "IEEE 1505.1:2008" #slug: "ieee-1505-1-2008-ieee00003827-241835" #description: """ New IEEE Standard - Superseded.<br />\n This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).<br />\n \t\t\t\t<br />\n The scope of this standard is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.<br />\n Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375308000 {#7318 : 2013-08-01 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1505.1" -bookCollection: "" -pageCount: 170 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#93262 +product: App\Entity\Product\Product {#7310 #id: 10183 #code: "IEEE00003827" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751038879 {#7274 : 2025-06-27 17:41:19.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 35741 #name: "IEEE 1505.1:2008" #slug: "ieee-1505-1-2008-ieee00003827-241835" #description: """ New IEEE Standard - Superseded.<br />\n This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).<br />\n \t\t\t\t<br />\n The scope of this standard is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.<br />\n Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375308000 {#7318 : 2013-08-01 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1505.1" -bookCollection: "" -pageCount: 170 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductState | App\Twig\Components\ProductState | 430.0 MiB | 0.19 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7310 #id: 10183 #code: "IEEE00003827" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751038879 {#7274 : 2025-06-27 17:41:19.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 35741 #name: "IEEE 1505.1:2008" #slug: "ieee-1505-1-2008-ieee00003827-241835" #description: """ New IEEE Standard - Superseded.<br />\n This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).<br />\n \t\t\t\t<br />\n The scope of this standard is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.<br />\n Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375308000 {#7318 : 2013-08-01 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1505.1" -bookCollection: "" -pageCount: 170 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#100215 +product: App\Entity\Product\Product {#7310 #id: 10183 #code: "IEEE00003827" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751038879 {#7274 : 2025-06-27 17:41:19.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 35741 #name: "IEEE 1505.1:2008" #slug: "ieee-1505-1-2008-ieee00003827-241835" #description: """ New IEEE Standard - Superseded.<br />\n This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).<br />\n \t\t\t\t<br />\n The scope of this standard is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.<br />\n Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375308000 {#7318 : 2013-08-01 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1505.1" -bookCollection: "" -pageCount: 170 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 430.0 MiB | 0.74 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#7310 #id: 10183 #code: "IEEE00003827" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751038879 {#7274 : 2025-06-27 17:41:19.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 35741 #name: "IEEE 1505.1:2008" #slug: "ieee-1505-1-2008-ieee00003827-241835" #description: """ New IEEE Standard - Superseded.<br />\n This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).<br />\n \t\t\t\t<br />\n The scope of this standard is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.<br />\n Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375308000 {#7318 : 2013-08-01 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1505.1" -bookCollection: "" -pageCount: 170 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } ] |
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| Component | App\Twig\Components\ProductMostRecent {#100299 +product: App\Entity\Product\Product {#7310 #id: 10183 #code: "IEEE00003827" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751038879 {#7274 : 2025-06-27 17:41:19.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 35741 #name: "IEEE 1505.1:2008" #slug: "ieee-1505-1-2008-ieee00003827-241835" #description: """ New IEEE Standard - Superseded.<br />\n This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).<br />\n \t\t\t\t<br />\n The scope of this standard is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.<br />\n Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375308000 {#7318 : 2013-08-01 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1505.1" -bookCollection: "" -pageCount: 170 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 430.0 MiB | 8.12 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#121667 #id: 10144 #code: "IEEE00003720" #attributes: Doctrine\ORM\PersistentCollection {#121691 …} #variants: Doctrine\ORM\PersistentCollection {#121689 …} #options: Doctrine\ORM\PersistentCollection {#121684 …} #associations: Doctrine\ORM\PersistentCollection {#121687 …} #createdAt: DateTime @1751038851 {#121680 : 2025-06-27 17:40:51.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#121673 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#121702 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#121800 #locale: "en_US" #translatable: App\Entity\Product\Product {#121667} #id: 35585 #name: "IEEE 1505:2006" #slug: "ieee-1505-2006-ieee00003720-241796" #description: """ New IEEE Standard - Superseded.<br />\n A mechanical and electrical specification for implementing a common interoperable mechanical quick-disconnect interconnect system for use by industry for interfacing large numbers of electrical signals (digital, analog, RF, power, etc.) is provided. These large interface panels (receiver and fixture panels) are employed primarily in test systems between stimulus/measurement assets and a related unit-under-test (UUT), although any application involving high-density contacts requiring a quick disconnect interface could benefit. The receiver is a receptacle that is mounted to test system mates with multiple fixtures, which serve as the buffer between the UUT and automatic test equipment (ATE). Fixtures translate standard input/output (I/O) signal routing offered at the receiver to a wiring interface that directly connects to the UUT. These UUT interfaces can represent cable connectors, direct plug-in (printed circuit board edge connectors), sensor monitoring, or manual feedback from the test technician. The primary objectives of this standard are: (a) to establish interface standards that permit interchangeability of mechanical/electrical receiver/fixture/connector product assemblies from various manufacturers under an open architecture; and (b) to develop within this framework a defined set(s) of interconnecting connector and mechanical specifications that supports available, accepted, low-cost commercial technology to reduced dependence on proprietary designs and extend life-cycle availability.<br />\n \t\t\t\t<br />\n The scope of this document is the development of a common receiver/fixture interface (RFI) specification that is based upon available commercial standards integrated under a common “open” architecture. This mechanical/electrical interface is intended to serve government/commercial interest for applications in test, system integration, manufacturing, monitoring, and other functional requirements that demand large contact densities and quick-disconnect mechanical operation. A joint technical forum has been operational since 1997 under the auspices of the IEEE Std 1505 RFI Working Group and a recently formed industry/government Common Test Interface (CTI) Working Group.<br />\n Readers of this document are encouraged to comment on details unclear, contradictory, or undefined to the IEEE 1505 RFI Working Group or the IEEE Standards Association for review and change. These organizations can be contacted at the locations described in the preface of this document.<br />\n As IEEE Std 1505 evolves, additional revisions may be required and reballoted by the IEEE Standards<br />\n Association. The RFI Working Group serves to encourage vendors to produce same product class types that are intermatable and interchangeable by adhering to performance specifications of this standard.<br />\n The document has been developed in accordance with Institute of Electrical and Electronic Engineers<br />\n (IEEE) Standards Assocation Policies and Procedures per the IEEE SA Standards Board Bylaws [B23],1 the IEEE SA Standards Board Operations Manual [B24], the IEEE SA Standards Companion [B25], and the<br />\n IEEE Standards Style Manual [B26]. Additional guidance and reference was utilized from The Authoritative Dictionary of IEEE Standard Terms [B15] and SI 10™ American National Standard for Use of the International System of Units (SI): The Modern Metric System [B35].<br />\n The purpose of this standard is to permit interchangeability of mechanical/electrical receiver/fixture/connector product assemblies from various manufacturers under an “open architecture.” To develop within this framework, a defined set(s) of interconnecting connector and mechanical specifications that supports available, accepted, low-cost commercial technology to reduce dependence on proprietary designs and extends life-cycle availability. Technical requirements identified by government and industry include maximum flexibility, scalability, and range of application. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Receiver Fixture Interface" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#121700 …} #channels: Doctrine\ORM\PersistentCollection {#121693 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#121697 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#121695 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#121707 …} -apiLastModifiedAt: DateTime @1754517600 {#121666 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#121715 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1176674400 {#121686 : 2007-04-16 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1505" -bookCollection: "" -pageCount: 120 -documents: Doctrine\ORM\PersistentCollection {#121706 …} -favorites: Doctrine\ORM\PersistentCollection {#121704 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "additionalClasses" => "product__teaser--with-grey-border" "hasStretchedLink" => true "hoverType" => "shadow" "linkLabel" => "See more" ] |
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| Component | App\Twig\Components\ProductCard {#121759 +product: App\Entity\Product\Product {#121667 #id: 10144 #code: "IEEE00003720" #attributes: Doctrine\ORM\PersistentCollection {#121691 …} #variants: Doctrine\ORM\PersistentCollection {#121689 …} #options: Doctrine\ORM\PersistentCollection {#121684 …} #associations: Doctrine\ORM\PersistentCollection {#121687 …} #createdAt: DateTime @1751038851 {#121680 : 2025-06-27 17:40:51.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#121673 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#121702 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#121800 #locale: "en_US" #translatable: App\Entity\Product\Product {#121667} #id: 35585 #name: "IEEE 1505:2006" #slug: "ieee-1505-2006-ieee00003720-241796" #description: """ New IEEE Standard - Superseded.<br />\n A mechanical and electrical specification for implementing a common interoperable mechanical quick-disconnect interconnect system for use by industry for interfacing large numbers of electrical signals (digital, analog, RF, power, etc.) is provided. These large interface panels (receiver and fixture panels) are employed primarily in test systems between stimulus/measurement assets and a related unit-under-test (UUT), although any application involving high-density contacts requiring a quick disconnect interface could benefit. The receiver is a receptacle that is mounted to test system mates with multiple fixtures, which serve as the buffer between the UUT and automatic test equipment (ATE). Fixtures translate standard input/output (I/O) signal routing offered at the receiver to a wiring interface that directly connects to the UUT. These UUT interfaces can represent cable connectors, direct plug-in (printed circuit board edge connectors), sensor monitoring, or manual feedback from the test technician. The primary objectives of this standard are: (a) to establish interface standards that permit interchangeability of mechanical/electrical receiver/fixture/connector product assemblies from various manufacturers under an open architecture; and (b) to develop within this framework a defined set(s) of interconnecting connector and mechanical specifications that supports available, accepted, low-cost commercial technology to reduced dependence on proprietary designs and extend life-cycle availability.<br />\n \t\t\t\t<br />\n The scope of this document is the development of a common receiver/fixture interface (RFI) specification that is based upon available commercial standards integrated under a common “open” architecture. This mechanical/electrical interface is intended to serve government/commercial interest for applications in test, system integration, manufacturing, monitoring, and other functional requirements that demand large contact densities and quick-disconnect mechanical operation. A joint technical forum has been operational since 1997 under the auspices of the IEEE Std 1505 RFI Working Group and a recently formed industry/government Common Test Interface (CTI) Working Group.<br />\n Readers of this document are encouraged to comment on details unclear, contradictory, or undefined to the IEEE 1505 RFI Working Group or the IEEE Standards Association for review and change. These organizations can be contacted at the locations described in the preface of this document.<br />\n As IEEE Std 1505 evolves, additional revisions may be required and reballoted by the IEEE Standards<br />\n Association. The RFI Working Group serves to encourage vendors to produce same product class types that are intermatable and interchangeable by adhering to performance specifications of this standard.<br />\n The document has been developed in accordance with Institute of Electrical and Electronic Engineers<br />\n (IEEE) Standards Assocation Policies and Procedures per the IEEE SA Standards Board Bylaws [B23],1 the IEEE SA Standards Board Operations Manual [B24], the IEEE SA Standards Companion [B25], and the<br />\n IEEE Standards Style Manual [B26]. Additional guidance and reference was utilized from The Authoritative Dictionary of IEEE Standard Terms [B15] and SI 10™ American National Standard for Use of the International System of Units (SI): The Modern Metric System [B35].<br />\n The purpose of this standard is to permit interchangeability of mechanical/electrical receiver/fixture/connector product assemblies from various manufacturers under an “open architecture.” To develop within this framework, a defined set(s) of interconnecting connector and mechanical specifications that supports available, accepted, low-cost commercial technology to reduce dependence on proprietary designs and extends life-cycle availability. Technical requirements identified by government and industry include maximum flexibility, scalability, and range of application. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Receiver Fixture Interface" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#121700 …} #channels: Doctrine\ORM\PersistentCollection {#121693 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#121697 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#121695 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#121707 …} -apiLastModifiedAt: DateTime @1754517600 {#121666 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#121715 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1176674400 {#121686 : 2007-04-16 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1505" -bookCollection: "" -pageCount: 120 -documents: Doctrine\ORM\PersistentCollection {#121706 …} -favorites: Doctrine\ORM\PersistentCollection {#121704 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "product__teaser--with-grey-border" +linkLabel: "See more" +imageFilter: "product_thumbnail_teaser" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "shadow" } |
|||
| ProductState | App\Twig\Components\ProductState | 430.0 MiB | 0.26 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#121667 #id: 10144 #code: "IEEE00003720" #attributes: Doctrine\ORM\PersistentCollection {#121691 …} #variants: Doctrine\ORM\PersistentCollection {#121689 …} #options: Doctrine\ORM\PersistentCollection {#121684 …} #associations: Doctrine\ORM\PersistentCollection {#121687 …} #createdAt: DateTime @1751038851 {#121680 : 2025-06-27 17:40:51.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#121673 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#121702 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#121800 #locale: "en_US" #translatable: App\Entity\Product\Product {#121667} #id: 35585 #name: "IEEE 1505:2006" #slug: "ieee-1505-2006-ieee00003720-241796" #description: """ New IEEE Standard - Superseded.<br />\n A mechanical and electrical specification for implementing a common interoperable mechanical quick-disconnect interconnect system for use by industry for interfacing large numbers of electrical signals (digital, analog, RF, power, etc.) is provided. These large interface panels (receiver and fixture panels) are employed primarily in test systems between stimulus/measurement assets and a related unit-under-test (UUT), although any application involving high-density contacts requiring a quick disconnect interface could benefit. The receiver is a receptacle that is mounted to test system mates with multiple fixtures, which serve as the buffer between the UUT and automatic test equipment (ATE). Fixtures translate standard input/output (I/O) signal routing offered at the receiver to a wiring interface that directly connects to the UUT. These UUT interfaces can represent cable connectors, direct plug-in (printed circuit board edge connectors), sensor monitoring, or manual feedback from the test technician. The primary objectives of this standard are: (a) to establish interface standards that permit interchangeability of mechanical/electrical receiver/fixture/connector product assemblies from various manufacturers under an open architecture; and (b) to develop within this framework a defined set(s) of interconnecting connector and mechanical specifications that supports available, accepted, low-cost commercial technology to reduced dependence on proprietary designs and extend life-cycle availability.<br />\n \t\t\t\t<br />\n The scope of this document is the development of a common receiver/fixture interface (RFI) specification that is based upon available commercial standards integrated under a common “open” architecture. This mechanical/electrical interface is intended to serve government/commercial interest for applications in test, system integration, manufacturing, monitoring, and other functional requirements that demand large contact densities and quick-disconnect mechanical operation. A joint technical forum has been operational since 1997 under the auspices of the IEEE Std 1505 RFI Working Group and a recently formed industry/government Common Test Interface (CTI) Working Group.<br />\n Readers of this document are encouraged to comment on details unclear, contradictory, or undefined to the IEEE 1505 RFI Working Group or the IEEE Standards Association for review and change. These organizations can be contacted at the locations described in the preface of this document.<br />\n As IEEE Std 1505 evolves, additional revisions may be required and reballoted by the IEEE Standards<br />\n Association. The RFI Working Group serves to encourage vendors to produce same product class types that are intermatable and interchangeable by adhering to performance specifications of this standard.<br />\n The document has been developed in accordance with Institute of Electrical and Electronic Engineers<br />\n (IEEE) Standards Assocation Policies and Procedures per the IEEE SA Standards Board Bylaws [B23],1 the IEEE SA Standards Board Operations Manual [B24], the IEEE SA Standards Companion [B25], and the<br />\n IEEE Standards Style Manual [B26]. Additional guidance and reference was utilized from The Authoritative Dictionary of IEEE Standard Terms [B15] and SI 10™ American National Standard for Use of the International System of Units (SI): The Modern Metric System [B35].<br />\n The purpose of this standard is to permit interchangeability of mechanical/electrical receiver/fixture/connector product assemblies from various manufacturers under an “open architecture.” To develop within this framework, a defined set(s) of interconnecting connector and mechanical specifications that supports available, accepted, low-cost commercial technology to reduce dependence on proprietary designs and extends life-cycle availability. Technical requirements identified by government and industry include maximum flexibility, scalability, and range of application. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Receiver Fixture Interface" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#121700 …} #channels: Doctrine\ORM\PersistentCollection {#121693 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#121697 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#121695 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#121707 …} -apiLastModifiedAt: DateTime @1754517600 {#121666 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#121715 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1176674400 {#121686 : 2007-04-16 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1505" -bookCollection: "" -pageCount: 120 -documents: Doctrine\ORM\PersistentCollection {#121706 …} -favorites: Doctrine\ORM\PersistentCollection {#121704 …} } ] |
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These large interface panels (receiver and fixture panels) are employed primarily in test systems between stimulus/measurement assets and a related unit-under-test (UUT), although any application involving high-density contacts requiring a quick disconnect interface could benefit. The receiver is a receptacle that is mounted to test system mates with multiple fixtures, which serve as the buffer between the UUT and automatic test equipment (ATE). Fixtures translate standard input/output (I/O) signal routing offered at the receiver to a wiring interface that directly connects to the UUT. These UUT interfaces can represent cable connectors, direct plug-in (printed circuit board edge connectors), sensor monitoring, or manual feedback from the test technician. The primary objectives of this standard are: (a) to establish interface standards that permit interchangeability of mechanical/electrical receiver/fixture/connector product assemblies from various manufacturers under an open architecture; and (b) to develop within this framework a defined set(s) of interconnecting connector and mechanical specifications that supports available, accepted, low-cost commercial technology to reduced dependence on proprietary designs and extend life-cycle availability.<br />\n \t\t\t\t<br />\n The scope of this document is the development of a common receiver/fixture interface (RFI) specification that is based upon available commercial standards integrated under a common “open” architecture. This mechanical/electrical interface is intended to serve government/commercial interest for applications in test, system integration, manufacturing, monitoring, and other functional requirements that demand large contact densities and quick-disconnect mechanical operation. A joint technical forum has been operational since 1997 under the auspices of the IEEE Std 1505 RFI Working Group and a recently formed industry/government Common Test Interface (CTI) Working Group.<br />\n Readers of this document are encouraged to comment on details unclear, contradictory, or undefined to the IEEE 1505 RFI Working Group or the IEEE Standards Association for review and change. These organizations can be contacted at the locations described in the preface of this document.<br />\n As IEEE Std 1505 evolves, additional revisions may be required and reballoted by the IEEE Standards<br />\n Association. The RFI Working Group serves to encourage vendors to produce same product class types that are intermatable and interchangeable by adhering to performance specifications of this standard.<br />\n The document has been developed in accordance with Institute of Electrical and Electronic Engineers<br />\n (IEEE) Standards Assocation Policies and Procedures per the IEEE SA Standards Board Bylaws [B23],1 the IEEE SA Standards Board Operations Manual [B24], the IEEE SA Standards Companion [B25], and the<br />\n IEEE Standards Style Manual [B26]. Additional guidance and reference was utilized from The Authoritative Dictionary of IEEE Standard Terms [B15] and SI 10™ American National Standard for Use of the International System of Units (SI): The Modern Metric System [B35].<br />\n The purpose of this standard is to permit interchangeability of mechanical/electrical receiver/fixture/connector product assemblies from various manufacturers under an “open architecture.” To develop within this framework, a defined set(s) of interconnecting connector and mechanical specifications that supports available, accepted, low-cost commercial technology to reduce dependence on proprietary designs and extends life-cycle availability. Technical requirements identified by government and industry include maximum flexibility, scalability, and range of application. 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These large interface panels (receiver and fixture panels) are employed primarily in test systems between stimulus/measurement assets and a related unit-under-test (UUT), although any application involving high-density contacts requiring a quick disconnect interface could benefit. The receiver is a receptacle that is mounted to test system mates with multiple fixtures, which serve as the buffer between the UUT and automatic test equipment (ATE). Fixtures translate standard input/output (I/O) signal routing offered at the receiver to a wiring interface that directly connects to the UUT. These UUT interfaces can represent cable connectors, direct plug-in (printed circuit board edge connectors), sensor monitoring, or manual feedback from the test technician. The primary objectives of this standard are: (a) to establish interface standards that permit interchangeability of mechanical/electrical receiver/fixture/connector product assemblies from various manufacturers under an open architecture; and (b) to develop within this framework a defined set(s) of interconnecting connector and mechanical specifications that supports available, accepted, low-cost commercial technology to reduced dependence on proprietary designs and extend life-cycle availability.<br />\n \t\t\t\t<br />\n The scope of this document is the development of a common receiver/fixture interface (RFI) specification that is based upon available commercial standards integrated under a common “open” architecture. This mechanical/electrical interface is intended to serve government/commercial interest for applications in test, system integration, manufacturing, monitoring, and other functional requirements that demand large contact densities and quick-disconnect mechanical operation. A joint technical forum has been operational since 1997 under the auspices of the IEEE Std 1505 RFI Working Group and a recently formed industry/government Common Test Interface (CTI) Working Group.<br />\n Readers of this document are encouraged to comment on details unclear, contradictory, or undefined to the IEEE 1505 RFI Working Group or the IEEE Standards Association for review and change. These organizations can be contacted at the locations described in the preface of this document.<br />\n As IEEE Std 1505 evolves, additional revisions may be required and reballoted by the IEEE Standards<br />\n Association. 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Additional guidance and reference was utilized from The Authoritative Dictionary of IEEE Standard Terms [B15] and SI 10™ American National Standard for Use of the International System of Units (SI): The Modern Metric System [B35].<br />\n The purpose of this standard is to permit interchangeability of mechanical/electrical receiver/fixture/connector product assemblies from various manufacturers under an “open architecture.” To develop within this framework, a defined set(s) of interconnecting connector and mechanical specifications that supports available, accepted, low-cost commercial technology to reduce dependence on proprietary designs and extends life-cycle availability. Technical requirements identified by government and industry include maximum flexibility, scalability, and range of application. 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These large interface panels (receiver and fixture panels) are employed primarily in test systems between stimulus/measurement assets and a related unit-under-test (UUT), although any application involving high-density contacts requiring a quick disconnect interface could benefit. The receiver is a receptacle that is mounted to test system mates with multiple fixtures, which serve as the buffer between the UUT and automatic test equipment (ATE). Fixtures translate standard input/output (I/O) signal routing offered at the receiver to a wiring interface that directly connects to the UUT. These UUT interfaces can represent cable connectors, direct plug-in (printed circuit board edge connectors), sensor monitoring, or manual feedback from the test technician. The primary objectives of this standard are: (a) to establish interface standards that permit interchangeability of mechanical/electrical receiver/fixture/connector product assemblies from various manufacturers under an open architecture; and (b) to develop within this framework a defined set(s) of interconnecting connector and mechanical specifications that supports available, accepted, low-cost commercial technology to reduced dependence on proprietary designs and extend life-cycle availability.<br />\n \t\t\t\t<br />\n The scope of this document is the development of a common receiver/fixture interface (RFI) specification that is based upon available commercial standards integrated under a common “open” architecture. This mechanical/electrical interface is intended to serve government/commercial interest for applications in test, system integration, manufacturing, monitoring, and other functional requirements that demand large contact densities and quick-disconnect mechanical operation. A joint technical forum has been operational since 1997 under the auspices of the IEEE Std 1505 RFI Working Group and a recently formed industry/government Common Test Interface (CTI) Working Group.<br />\n Readers of this document are encouraged to comment on details unclear, contradictory, or undefined to the IEEE 1505 RFI Working Group or the IEEE Standards Association for review and change. These organizations can be contacted at the locations described in the preface of this document.<br />\n As IEEE Std 1505 evolves, additional revisions may be required and reballoted by the IEEE Standards<br />\n Association. The RFI Working Group serves to encourage vendors to produce same product class types that are intermatable and interchangeable by adhering to performance specifications of this standard.<br />\n The document has been developed in accordance with Institute of Electrical and Electronic Engineers<br />\n (IEEE) Standards Assocation Policies and Procedures per the IEEE SA Standards Board Bylaws [B23],1 the IEEE SA Standards Board Operations Manual [B24], the IEEE SA Standards Companion [B25], and the<br />\n IEEE Standards Style Manual [B26]. Additional guidance and reference was utilized from The Authoritative Dictionary of IEEE Standard Terms [B15] and SI 10™ American National Standard for Use of the International System of Units (SI): The Modern Metric System [B35].<br />\n The purpose of this standard is to permit interchangeability of mechanical/electrical receiver/fixture/connector product assemblies from various manufacturers under an “open architecture.” To develop within this framework, a defined set(s) of interconnecting connector and mechanical specifications that supports available, accepted, low-cost commercial technology to reduce dependence on proprietary designs and extends life-cycle availability. Technical requirements identified by government and industry include maximum flexibility, scalability, and range of application. 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