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Response
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IP
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Profiled on
Token
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Components

3 Twig Components
13 Render Count
6 ms Render Time
88.0 MiB Memory Usage

Components

Name Metadata Render Count Render Time
ProductState 
"App\Twig\Components\ProductState"
components/ProductState.html.twig 		6 1.50ms
ProductMostRecent 
"App\Twig\Components\ProductMostRecent"
components/ProductMostRecent.html.twig 		6 4.71ms
ProductType 
"App\Twig\Components\ProductType"
components/ProductType.html.twig 		1 0.22ms

Render calls

ProductState App\Twig\Components\ProductState 68.0 MiB 0.40 ms
Input props 
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    #id: 8661
    #code: "IEEE00000823"
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        #id: 29653
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        #description: """
          Revision Standard - Inactive-Withdrawn.<br />\n
          This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
          \t\t\t\t<br />\n
          This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
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        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors"
        -notes: "Inactive-Withdrawn"
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    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7535 …}
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    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7308 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7614 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7646 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7422 …}
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    -apiLastModifiedAt: DateTime @1754517600 {#7317
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    -lastUpdatedAt: DateTime @1578006000 {#7292
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    -author: ""
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Attributes 
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Component 
App\Twig\Components\ProductState {#92879
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          Revision Standard - Inactive-Withdrawn.<br />\n
          This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
          \t\t\t\t<br />\n
          This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
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        #metaKeywords: null
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}
ProductType App\Twig\Components\ProductType 68.0 MiB 0.22 ms
Input props 
[
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    #id: 8661
    #code: "IEEE00000823"
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      "en_US" => App\Entity\Product\ProductTranslation {#7922
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        #description: """
          Revision Standard - Inactive-Withdrawn.<br />\n
          This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
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          This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors"
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    #currentTranslation: null
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Attributes 
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Component 
App\Twig\Components\ProductType {#93072
  +product: App\Entity\Product\Product {#7309
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        #description: """
          Revision Standard - Inactive-Withdrawn.<br />\n
          This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
          \t\t\t\t<br />\n
          This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
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        #metaKeywords: null
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    #currentTranslation: null
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    #averageRating: 0.0
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    -pageCount: 10
    -documents: Doctrine\ORM\PersistentCollection {#7466 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7501 …}
  }
  +label: "Standard"
  -typeAttributeCode: "type"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 68.0 MiB 0.78 ms
Input props 
[
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    #id: 8661
    #code: "IEEE00000823"
    #attributes: Doctrine\ORM\PersistentCollection {#7702 …}
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    #createdAt: DateTime @1751037603 {#7274
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    #enabled: true
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          This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
          \t\t\t\t<br />\n
          This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
          """
        #metaKeywords: null
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Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#93147
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          Revision Standard - Inactive-Withdrawn.<br />\n
          This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
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  +label: "Historical"
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  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 82.0 MiB 0.30 ms
Input props 
[
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    #id: 8660
    #code: "IEEE00000822"
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        #id: 29649
        #name: "IEEE 592:1977"
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        #description: """
          New IEEE Standard - Superseded.<br />\n
          IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
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          This standard covers electrical tests and performance requirements for exposed semiconducting shields on premolded cable accessories, specifically joints and separable insulated connectors, rated 5 kV through 35 kV.
          """
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