GET https://dev.normadoc.fr/products/ieee-iec-62528-2007-ieee00004254-242020

Components

3 Twig Components
5 Render Count
2 ms Render Time
84.0 MiB Memory Usage

Components

Name Metadata Render Count Render Time
ProductState
"App\Twig\Components\ProductState"
components/ProductState.html.twig
2 0.49ms
ProductMostRecent
"App\Twig\Components\ProductMostRecent"
components/ProductMostRecent.html.twig
2 1.40ms
ProductType
"App\Twig\Components\ProductType"
components/ProductType.html.twig
1 0.22ms

Render calls

ProductState App\Twig\Components\ProductState 84.0 MiB 0.30 ms
Input props
[
  "product" => App\Entity\Product\Product {#7310
    #id: 10368
    #code: "IEEE00004254"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039019 {#7274
      date: 2025-06-27 17:43:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 36481
        #name: "IEEE/IEC 62528:2007"
        #slug: "ieee-iec-62528-2007-ieee00004254-242020"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facilitate communication between core designers and core integrators.<br />\n
          \t\t\t\t<br />\n
          IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing<br />\n
          embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or<br />\n
          its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while<br />\n
          allowing for ease of interoperability of cores that may have originated from different sources.<br />\n
          The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to<br />\n
          the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores.<br />\n
          This objective is achieved through provision of a core-centric methodology that enables successful integration<br />\n
          of cores into SoCs.<br />\n
          IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation<br />\n
          of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation<br />\n
          relies on information requirements (the information model) placed on the core provider to ensure that<br />\n
          the core can be successfully integrated by the core user. The result is shorter time to market for core providers<br />\n
          and core users.<br />\n
          The data transfer and reuse from the core provider to the core user are based on the premise that the core test<br />\n
          data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the<br />\n
          SoC.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1197154800 {#7318
      date: 2007-12-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62528"
    -bookCollection: ""
    -pageCount: 130
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  "showFullLabel" => "true"
]
Attributes
[
  "showFullLabel" => "true"
]
Component
App\Twig\Components\ProductState {#93007
  +product: App\Entity\Product\Product {#7310
    #id: 10368
    #code: "IEEE00004254"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039019 {#7274
      date: 2025-06-27 17:43:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 36481
        #name: "IEEE/IEC 62528:2007"
        #slug: "ieee-iec-62528-2007-ieee00004254-242020"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facilitate communication between core designers and core integrators.<br />\n
          \t\t\t\t<br />\n
          IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing<br />\n
          embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or<br />\n
          its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while<br />\n
          allowing for ease of interoperability of cores that may have originated from different sources.<br />\n
          The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to<br />\n
          the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores.<br />\n
          This objective is achieved through provision of a core-centric methodology that enables successful integration<br />\n
          of cores into SoCs.<br />\n
          IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation<br />\n
          of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation<br />\n
          relies on information requirements (the information model) placed on the core provider to ensure that<br />\n
          the core can be successfully integrated by the core user. The result is shorter time to market for core providers<br />\n
          and core users.<br />\n
          The data transfer and reuse from the core provider to the core user are based on the premise that the core test<br />\n
          data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the<br />\n
          SoC.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1197154800 {#7318
      date: 2007-12-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62528"
    -bookCollection: ""
    -pageCount: 130
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductType App\Twig\Components\ProductType 84.0 MiB 0.22 ms
Input props
[
  "product" => App\Entity\Product\Product {#7310
    #id: 10368
    #code: "IEEE00004254"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039019 {#7274
      date: 2025-06-27 17:43:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 36481
        #name: "IEEE/IEC 62528:2007"
        #slug: "ieee-iec-62528-2007-ieee00004254-242020"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facilitate communication between core designers and core integrators.<br />\n
          \t\t\t\t<br />\n
          IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing<br />\n
          embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or<br />\n
          its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while<br />\n
          allowing for ease of interoperability of cores that may have originated from different sources.<br />\n
          The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to<br />\n
          the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores.<br />\n
          This objective is achieved through provision of a core-centric methodology that enables successful integration<br />\n
          of cores into SoCs.<br />\n
          IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation<br />\n
          of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation<br />\n
          relies on information requirements (the information model) placed on the core provider to ensure that<br />\n
          the core can be successfully integrated by the core user. The result is shorter time to market for core providers<br />\n
          and core users.<br />\n
          The data transfer and reuse from the core provider to the core user are based on the premise that the core test<br />\n
          data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the<br />\n
          SoC.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1197154800 {#7318
      date: 2007-12-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62528"
    -bookCollection: ""
    -pageCount: 130
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
]
Attributes
[]
Component
App\Twig\Components\ProductType {#93187
  +product: App\Entity\Product\Product {#7310
    #id: 10368
    #code: "IEEE00004254"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039019 {#7274
      date: 2025-06-27 17:43:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 36481
        #name: "IEEE/IEC 62528:2007"
        #slug: "ieee-iec-62528-2007-ieee00004254-242020"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facilitate communication between core designers and core integrators.<br />\n
          \t\t\t\t<br />\n
          IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing<br />\n
          embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or<br />\n
          its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while<br />\n
          allowing for ease of interoperability of cores that may have originated from different sources.<br />\n
          The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to<br />\n
          the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores.<br />\n
          This objective is achieved through provision of a core-centric methodology that enables successful integration<br />\n
          of cores into SoCs.<br />\n
          IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation<br />\n
          of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation<br />\n
          relies on information requirements (the information model) placed on the core provider to ensure that<br />\n
          the core can be successfully integrated by the core user. The result is shorter time to market for core providers<br />\n
          and core users.<br />\n
          The data transfer and reuse from the core provider to the core user are based on the premise that the core test<br />\n
          data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the<br />\n
          SoC.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1197154800 {#7318
      date: 2007-12-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62528"
    -bookCollection: ""
    -pageCount: 130
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +label: "Standard"
  -typeAttributeCode: "type"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 84.0 MiB 0.67 ms
Input props
[
  "product" => App\Entity\Product\Product {#7310
    #id: 10368
    #code: "IEEE00004254"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039019 {#7274
      date: 2025-06-27 17:43:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 36481
        #name: "IEEE/IEC 62528:2007"
        #slug: "ieee-iec-62528-2007-ieee00004254-242020"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facilitate communication between core designers and core integrators.<br />\n
          \t\t\t\t<br />\n
          IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing<br />\n
          embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or<br />\n
          its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while<br />\n
          allowing for ease of interoperability of cores that may have originated from different sources.<br />\n
          The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to<br />\n
          the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores.<br />\n
          This objective is achieved through provision of a core-centric methodology that enables successful integration<br />\n
          of cores into SoCs.<br />\n
          IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation<br />\n
          of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation<br />\n
          relies on information requirements (the information model) placed on the core provider to ensure that<br />\n
          the core can be successfully integrated by the core user. The result is shorter time to market for core providers<br />\n
          and core users.<br />\n
          The data transfer and reuse from the core provider to the core user are based on the premise that the core test<br />\n
          data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the<br />\n
          SoC.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1197154800 {#7318
      date: 2007-12-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62528"
    -bookCollection: ""
    -pageCount: 130
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
]
Attributes
[]
Component
App\Twig\Components\ProductMostRecent {#93262
  +product: App\Entity\Product\Product {#7310
    #id: 10368
    #code: "IEEE00004254"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039019 {#7274
      date: 2025-06-27 17:43:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 36481
        #name: "IEEE/IEC 62528:2007"
        #slug: "ieee-iec-62528-2007-ieee00004254-242020"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facilitate communication between core designers and core integrators.<br />\n
          \t\t\t\t<br />\n
          IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing<br />\n
          embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or<br />\n
          its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while<br />\n
          allowing for ease of interoperability of cores that may have originated from different sources.<br />\n
          The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to<br />\n
          the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores.<br />\n
          This objective is achieved through provision of a core-centric methodology that enables successful integration<br />\n
          of cores into SoCs.<br />\n
          IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation<br />\n
          of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation<br />\n
          relies on information requirements (the information model) placed on the core provider to ensure that<br />\n
          the core can be successfully integrated by the core user. The result is shorter time to market for core providers<br />\n
          and core users.<br />\n
          The data transfer and reuse from the core provider to the core user are based on the premise that the core test<br />\n
          data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the<br />\n
          SoC.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1197154800 {#7318
      date: 2007-12-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62528"
    -bookCollection: ""
    -pageCount: 130
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 84.0 MiB 0.19 ms
Input props
[
  "product" => App\Entity\Product\Product {#7310
    #id: 10368
    #code: "IEEE00004254"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039019 {#7274
      date: 2025-06-27 17:43:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 36481
        #name: "IEEE/IEC 62528:2007"
        #slug: "ieee-iec-62528-2007-ieee00004254-242020"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facilitate communication between core designers and core integrators.<br />\n
          \t\t\t\t<br />\n
          IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing<br />\n
          embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or<br />\n
          its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while<br />\n
          allowing for ease of interoperability of cores that may have originated from different sources.<br />\n
          The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to<br />\n
          the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores.<br />\n
          This objective is achieved through provision of a core-centric methodology that enables successful integration<br />\n
          of cores into SoCs.<br />\n
          IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation<br />\n
          of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation<br />\n
          relies on information requirements (the information model) placed on the core provider to ensure that<br />\n
          the core can be successfully integrated by the core user. The result is shorter time to market for core providers<br />\n
          and core users.<br />\n
          The data transfer and reuse from the core provider to the core user are based on the premise that the core test<br />\n
          data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the<br />\n
          SoC.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1197154800 {#7318
      date: 2007-12-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62528"
    -bookCollection: ""
    -pageCount: 130
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  "showFullLabel" => "true"
]
Attributes
[
  "showFullLabel" => "true"
]
Component
App\Twig\Components\ProductState {#100201
  +product: App\Entity\Product\Product {#7310
    #id: 10368
    #code: "IEEE00004254"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039019 {#7274
      date: 2025-06-27 17:43:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 36481
        #name: "IEEE/IEC 62528:2007"
        #slug: "ieee-iec-62528-2007-ieee00004254-242020"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facilitate communication between core designers and core integrators.<br />\n
          \t\t\t\t<br />\n
          IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing<br />\n
          embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or<br />\n
          its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while<br />\n
          allowing for ease of interoperability of cores that may have originated from different sources.<br />\n
          The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to<br />\n
          the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores.<br />\n
          This objective is achieved through provision of a core-centric methodology that enables successful integration<br />\n
          of cores into SoCs.<br />\n
          IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation<br />\n
          of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation<br />\n
          relies on information requirements (the information model) placed on the core provider to ensure that<br />\n
          the core can be successfully integrated by the core user. The result is shorter time to market for core providers<br />\n
          and core users.<br />\n
          The data transfer and reuse from the core provider to the core user are based on the premise that the core test<br />\n
          data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the<br />\n
          SoC.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1197154800 {#7318
      date: 2007-12-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62528"
    -bookCollection: ""
    -pageCount: 130
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 84.0 MiB 0.73 ms
Input props
[
  "product" => App\Entity\Product\Product {#7310
    #id: 10368
    #code: "IEEE00004254"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039019 {#7274
      date: 2025-06-27 17:43:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 36481
        #name: "IEEE/IEC 62528:2007"
        #slug: "ieee-iec-62528-2007-ieee00004254-242020"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facilitate communication between core designers and core integrators.<br />\n
          \t\t\t\t<br />\n
          IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing<br />\n
          embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or<br />\n
          its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while<br />\n
          allowing for ease of interoperability of cores that may have originated from different sources.<br />\n
          The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to<br />\n
          the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores.<br />\n
          This objective is achieved through provision of a core-centric methodology that enables successful integration<br />\n
          of cores into SoCs.<br />\n
          IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation<br />\n
          of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation<br />\n
          relies on information requirements (the information model) placed on the core provider to ensure that<br />\n
          the core can be successfully integrated by the core user. The result is shorter time to market for core providers<br />\n
          and core users.<br />\n
          The data transfer and reuse from the core provider to the core user are based on the premise that the core test<br />\n
          data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the<br />\n
          SoC.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1197154800 {#7318
      date: 2007-12-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62528"
    -bookCollection: ""
    -pageCount: 130
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
]
Attributes
[]
Component
App\Twig\Components\ProductMostRecent {#100285
  +product: App\Entity\Product\Product {#7310
    #id: 10368
    #code: "IEEE00004254"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751039019 {#7274
      date: 2025-06-27 17:43:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 36481
        #name: "IEEE/IEC 62528:2007"
        #slug: "ieee-iec-62528-2007-ieee00004254-242020"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facilitate communication between core designers and core integrators.<br />\n
          \t\t\t\t<br />\n
          IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing<br />\n
          embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or<br />\n
          its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while<br />\n
          allowing for ease of interoperability of cores that may have originated from different sources.<br />\n
          The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to<br />\n
          the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores.<br />\n
          This objective is achieved through provision of a core-centric methodology that enables successful integration<br />\n
          of cores into SoCs.<br />\n
          IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation<br />\n
          of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation<br />\n
          relies on information requirements (the information model) placed on the core provider to ensure that<br />\n
          the core can be successfully integrated by the core user. The result is shorter time to market for core providers<br />\n
          and core users.<br />\n
          The data transfer and reuse from the core provider to the core user are based on the premise that the core test<br />\n
          data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the<br />\n
          SoC.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1197154800 {#7318
      date: 2007-12-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62528"
    -bookCollection: ""
    -pageCount: 130
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}