GET https://dev.normadoc.fr/products/ieee-1241-2023-ieee00006797-243585

Components

4 Twig Components
14 Render Count
21 ms Render Time
236.0 MiB Memory Usage

Components

Name Metadata Render Count Render Time
ProductState
"App\Twig\Components\ProductState"
components/ProductState.html.twig
6 3.51ms
ProductMostRecent
"App\Twig\Components\ProductMostRecent"
components/ProductMostRecent.html.twig
6 5.63ms
ProductType
"App\Twig\Components\ProductType"
components/ProductType.html.twig
1 0.61ms
ProductCard
"App\Twig\Components\ProductCard"
components/ProductCard.html.twig
1 12.43ms

Render calls

ProductState App\Twig\Components\ProductState 236.0 MiB 2.34 ms
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        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n
          Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n
          errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
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ProductState App\Twig\Components\ProductState 236.0 MiB 0.22 ms
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          New IEEE Standard - Superseded.<br />\n
          IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n
          \t\t\t\t<br />\n
          Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n
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App\Twig\Components\ProductState {#107147
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          Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n
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ProductMostRecent App\Twig\Components\ProductMostRecent 236.0 MiB 0.92 ms
Input props
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          New IEEE Standard - Superseded.<br />\n
          IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n
          \t\t\t\t<br />\n
          Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n
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          New IEEE Standard - Superseded.<br />\n
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ProductCard App\Twig\Components\ProductCard 236.0 MiB 12.43 ms
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    #id: 10449
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  "hoverType" => "shadow"
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App\Twig\Components\ProductCard {#128723
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