Symfony Profiler

[
  "product" => App\Entity\Product\Product {#7311
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038014 {#7274
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#7318
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#7316
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  "showFullLabel" => "true"
]

[
  "showFullLabel" => "true"
]

App\Twig\Components\ProductState {#93008
  +product: App\Entity\Product\Product {#7311
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038014 {#7274
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#7318
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#7316
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
    "Confirmed"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#7311
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038014 {#7274
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#7318
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#7316
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
]

App\Twig\Components\ProductType {#93201
  +product: App\Entity\Product\Product {#7311
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038014 {#7274
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#7318
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#7316
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +label: "Standard"
  -typeAttributeCode: "type"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#7311
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038014 {#7274
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#7318
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#7316
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
]

App\Twig\Components\ProductMostRecent {#93276
  +product: App\Entity\Product\Product {#7311
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038014 {#7274
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#7318
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#7316
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#106827
    #id: 9151
    #code: "IEEE00001727"
    #attributes: Doctrine\ORM\PersistentCollection {#106810 …}
    #variants: Doctrine\ORM\PersistentCollection {#106807 …}
    #options: Doctrine\ORM\PersistentCollection {#106803 …}
    #associations: Doctrine\ORM\PersistentCollection {#106805 …}
    #createdAt: DateTime @1751038014 {#106835
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#106808
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106821 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106860
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106827}
        #id: 31613
        #name: "IEEE 1149.1:1990"
        #slug: "ieee-1149-1-1990-ieee00001727-240803"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary-Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106818 …}
    #channels: Doctrine\ORM\PersistentCollection {#106812 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106816 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106814 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106828 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106795
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106834
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @643240800 {#106833
      date: 1990-05-21 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#106825 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106823 …}
  }
  "showFullLabel" => "true"
]

[
  "showFullLabel" => "true"
]

App\Twig\Components\ProductState {#106843
  +product: App\Entity\Product\Product {#106827
    #id: 9151
    #code: "IEEE00001727"
    #attributes: Doctrine\ORM\PersistentCollection {#106810 …}
    #variants: Doctrine\ORM\PersistentCollection {#106807 …}
    #options: Doctrine\ORM\PersistentCollection {#106803 …}
    #associations: Doctrine\ORM\PersistentCollection {#106805 …}
    #createdAt: DateTime @1751038014 {#106835
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#106808
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106821 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106860
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106827}
        #id: 31613
        #name: "IEEE 1149.1:1990"
        #slug: "ieee-1149-1-1990-ieee00001727-240803"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary-Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106818 …}
    #channels: Doctrine\ORM\PersistentCollection {#106812 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106816 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106814 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106828 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106795
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106834
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @643240800 {#106833
      date: 1990-05-21 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#106825 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106823 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#106827
    #id: 9151
    #code: "IEEE00001727"
    #attributes: Doctrine\ORM\PersistentCollection {#106810 …}
    #variants: Doctrine\ORM\PersistentCollection {#106807 …}
    #options: Doctrine\ORM\PersistentCollection {#106803 …}
    #associations: Doctrine\ORM\PersistentCollection {#106805 …}
    #createdAt: DateTime @1751038014 {#106835
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#106808
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106821 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106860
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106827}
        #id: 31613
        #name: "IEEE 1149.1:1990"
        #slug: "ieee-1149-1-1990-ieee00001727-240803"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary-Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106818 …}
    #channels: Doctrine\ORM\PersistentCollection {#106812 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106816 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106814 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106828 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106795
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106834
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @643240800 {#106833
      date: 1990-05-21 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#106825 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106823 …}
  }
]

App\Twig\Components\ProductMostRecent {#106942
  +product: App\Entity\Product\Product {#106827
    #id: 9151
    #code: "IEEE00001727"
    #attributes: Doctrine\ORM\PersistentCollection {#106810 …}
    #variants: Doctrine\ORM\PersistentCollection {#106807 …}
    #options: Doctrine\ORM\PersistentCollection {#106803 …}
    #associations: Doctrine\ORM\PersistentCollection {#106805 …}
    #createdAt: DateTime @1751038014 {#106835
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#106808
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106821 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106860
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106827}
        #id: 31613
        #name: "IEEE 1149.1:1990"
        #slug: "ieee-1149-1-1990-ieee00001727-240803"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary-Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106818 …}
    #channels: Doctrine\ORM\PersistentCollection {#106812 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106816 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106814 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106828 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106795
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106834
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @643240800 {#106833
      date: 1990-05-21 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#106825 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106823 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#93699
    #id: 10496
    #code: "IEEE00004484"
    #attributes: Doctrine\ORM\PersistentCollection {#93679 …}
    #variants: Doctrine\ORM\PersistentCollection {#93676 …}
    #options: Doctrine\ORM\PersistentCollection {#93672 …}
    #associations: Doctrine\ORM\PersistentCollection {#93668 …}
    #createdAt: DateTime @1751039097 {#93706
      date: 2025-06-27 17:44:57.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#93685
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93690 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93731
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93699}
        #id: 36993
        #name: "IEEE 1149.1:2013"
        #slug: "ieee-1149-1-2013-ieee00004484-242148"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that allows rigorous structural description of the component-specific aspects of such testability features, and a second language is defined that allows rigorous procedural description of how the testability features may be used.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to: Testing the interconnections between integrated circuits once they have been assembled onto a printed circuit board or other substrate - Testing the integrated circuit itself - Observing or modifying circuit activity during the component's normal operation The test logic consists of a boundary-scan register and other building blocks and is accessed through a test access port (TAP).<br />\n
          This subclause provides a general overview of the operation of a component compatible with this standard and provides a background to the detailed discussion in later clauses. The circuitry defined by this standard allows test instructions (which take control of the component outputs and observe the component inputs) and associated test data to be fed into a component and, subsequently, allows the results of execution of such instructions to be read out. All information (instructions, test data, and test results) is communicated in a serial format
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Test Access Port and Boundary-Scan Architecture"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93688 …}
    #channels: Doctrine\ORM\PersistentCollection {#93681 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93686 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93683 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93696 …}
    -apiLastModifiedAt: DateTime @1754517600 {#93669
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712700000 {#93705
      date: 2024-04-10 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1368396000 {#93704
      date: 2013-05-13 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#93698
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 444
    -documents: Doctrine\ORM\PersistentCollection {#93694 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93692 …}
  }
  "showFullLabel" => "true"
]

[
  "showFullLabel" => "true"
]

App\Twig\Components\ProductState {#113591
  +product: App\Entity\Product\Product {#93699
    #id: 10496
    #code: "IEEE00004484"
    #attributes: Doctrine\ORM\PersistentCollection {#93679 …}
    #variants: Doctrine\ORM\PersistentCollection {#93676 …}
    #options: Doctrine\ORM\PersistentCollection {#93672 …}
    #associations: Doctrine\ORM\PersistentCollection {#93668 …}
    #createdAt: DateTime @1751039097 {#93706
      date: 2025-06-27 17:44:57.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#93685
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93690 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93731
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93699}
        #id: 36993
        #name: "IEEE 1149.1:2013"
        #slug: "ieee-1149-1-2013-ieee00004484-242148"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that allows rigorous structural description of the component-specific aspects of such testability features, and a second language is defined that allows rigorous procedural description of how the testability features may be used.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to: Testing the interconnections between integrated circuits once they have been assembled onto a printed circuit board or other substrate - Testing the integrated circuit itself - Observing or modifying circuit activity during the component's normal operation The test logic consists of a boundary-scan register and other building blocks and is accessed through a test access port (TAP).<br />\n
          This subclause provides a general overview of the operation of a component compatible with this standard and provides a background to the detailed discussion in later clauses. The circuitry defined by this standard allows test instructions (which take control of the component outputs and observe the component inputs) and associated test data to be fed into a component and, subsequently, allows the results of execution of such instructions to be read out. All information (instructions, test data, and test results) is communicated in a serial format
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Test Access Port and Boundary-Scan Architecture"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93688 …}
    #channels: Doctrine\ORM\PersistentCollection {#93681 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93686 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93683 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93696 …}
    -apiLastModifiedAt: DateTime @1754517600 {#93669
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712700000 {#93705
      date: 2024-04-10 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1368396000 {#93704
      date: 2013-05-13 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#93698
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 444
    -documents: Doctrine\ORM\PersistentCollection {#93694 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93692 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#93699
    #id: 10496
    #code: "IEEE00004484"
    #attributes: Doctrine\ORM\PersistentCollection {#93679 …}
    #variants: Doctrine\ORM\PersistentCollection {#93676 …}
    #options: Doctrine\ORM\PersistentCollection {#93672 …}
    #associations: Doctrine\ORM\PersistentCollection {#93668 …}
    #createdAt: DateTime @1751039097 {#93706
      date: 2025-06-27 17:44:57.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#93685
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93690 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93731
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93699}
        #id: 36993
        #name: "IEEE 1149.1:2013"
        #slug: "ieee-1149-1-2013-ieee00004484-242148"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that allows rigorous structural description of the component-specific aspects of such testability features, and a second language is defined that allows rigorous procedural description of how the testability features may be used.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to: Testing the interconnections between integrated circuits once they have been assembled onto a printed circuit board or other substrate - Testing the integrated circuit itself - Observing or modifying circuit activity during the component's normal operation The test logic consists of a boundary-scan register and other building blocks and is accessed through a test access port (TAP).<br />\n
          This subclause provides a general overview of the operation of a component compatible with this standard and provides a background to the detailed discussion in later clauses. The circuitry defined by this standard allows test instructions (which take control of the component outputs and observe the component inputs) and associated test data to be fed into a component and, subsequently, allows the results of execution of such instructions to be read out. All information (instructions, test data, and test results) is communicated in a serial format
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Test Access Port and Boundary-Scan Architecture"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93688 …}
    #channels: Doctrine\ORM\PersistentCollection {#93681 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93686 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93683 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93696 …}
    -apiLastModifiedAt: DateTime @1754517600 {#93669
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712700000 {#93705
      date: 2024-04-10 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1368396000 {#93704
      date: 2013-05-13 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#93698
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 444
    -documents: Doctrine\ORM\PersistentCollection {#93694 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93692 …}
  }
]

App\Twig\Components\ProductMostRecent {#113658
  +product: App\Entity\Product\Product {#93699
    #id: 10496
    #code: "IEEE00004484"
    #attributes: Doctrine\ORM\PersistentCollection {#93679 …}
    #variants: Doctrine\ORM\PersistentCollection {#93676 …}
    #options: Doctrine\ORM\PersistentCollection {#93672 …}
    #associations: Doctrine\ORM\PersistentCollection {#93668 …}
    #createdAt: DateTime @1751039097 {#93706
      date: 2025-06-27 17:44:57.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#93685
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#93690 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#93731
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#93699}
        #id: 36993
        #name: "IEEE 1149.1:2013"
        #slug: "ieee-1149-1-2013-ieee00004484-242148"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that allows rigorous structural description of the component-specific aspects of such testability features, and a second language is defined that allows rigorous procedural description of how the testability features may be used.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to: Testing the interconnections between integrated circuits once they have been assembled onto a printed circuit board or other substrate - Testing the integrated circuit itself - Observing or modifying circuit activity during the component's normal operation The test logic consists of a boundary-scan register and other building blocks and is accessed through a test access port (TAP).<br />\n
          This subclause provides a general overview of the operation of a component compatible with this standard and provides a background to the detailed discussion in later clauses. The circuitry defined by this standard allows test instructions (which take control of the component outputs and observe the component inputs) and associated test data to be fed into a component and, subsequently, allows the results of execution of such instructions to be read out. All information (instructions, test data, and test results) is communicated in a serial format
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Test Access Port and Boundary-Scan Architecture"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#93688 …}
    #channels: Doctrine\ORM\PersistentCollection {#93681 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#93686 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#93683 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93696 …}
    -apiLastModifiedAt: DateTime @1754517600 {#93669
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712700000 {#93705
      date: 2024-04-10 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1368396000 {#93704
      date: 2013-05-13 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#93698
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 444
    -documents: Doctrine\ORM\PersistentCollection {#93694 …}
    -favorites: Doctrine\ORM\PersistentCollection {#93692 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#7311
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038014 {#7274
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#7318
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#7316
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  "showFullLabel" => "true"
]

[
  "showFullLabel" => "true"
]

App\Twig\Components\ProductState {#113723
  +product: App\Entity\Product\Product {#7311
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038014 {#7274
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#7318
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#7316
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
    "Confirmed"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#7311
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038014 {#7274
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#7318
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#7316
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
]

App\Twig\Components\ProductMostRecent {#113750
  +product: App\Entity\Product\Product {#7311
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038014 {#7274
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#7292
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#7318
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#7316
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#113520
    #id: 9153
    #code: "IEEE00001730"
    #attributes: Doctrine\ORM\PersistentCollection {#113536 …}
    #variants: Doctrine\ORM\PersistentCollection {#113538 …}
    #options: Doctrine\ORM\PersistentCollection {#113542 …}
    #associations: Doctrine\ORM\PersistentCollection {#113540 …}
    #createdAt: DateTime @1751038015 {#113512
      date: 2025-06-27 17:26:55.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#113509
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#113526 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#113816
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#113520}
        #id: 31621
        #name: "IEEE 1149.1b:1994"
        #slug: "ieee-1149-1b-1994-ieee00001730-240805"
        #description: """
          Amendment Standard - Superseded.<br />\n
          Superseded by 1149.1-2001 A language to describe components that conform to IEEE Std 1149.1-1990 is described in this supplement. The language is based on the VHSIC Hardware Description Language (VHDL). General characteristics, the overall structure of a boundary-scan description language (BSDL) description, special cases, and example packages are included.<br />\n
          \t\t\t\t
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1)"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#113528 …}
    #channels: Doctrine\ORM\PersistentCollection {#113534 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#113530 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#113532 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#113519 …}
    -apiLastModifiedAt: DateTime @1754517600 {#113511
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#113513
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @794012400 {#113514
      date: 1995-03-01 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 80
    -documents: Doctrine\ORM\PersistentCollection {#113522 …}
    -favorites: Doctrine\ORM\PersistentCollection {#113524 …}
  }
  "showFullLabel" => "true"
]

[
  "showFullLabel" => "true"
]

App\Twig\Components\ProductState {#113831
  +product: App\Entity\Product\Product {#113520
    #id: 9153
    #code: "IEEE00001730"
    #attributes: Doctrine\ORM\PersistentCollection {#113536 …}
    #variants: Doctrine\ORM\PersistentCollection {#113538 …}
    #options: Doctrine\ORM\PersistentCollection {#113542 …}
    #associations: Doctrine\ORM\PersistentCollection {#113540 …}
    #createdAt: DateTime @1751038015 {#113512
      date: 2025-06-27 17:26:55.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#113509
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#113526 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#113816
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#113520}
        #id: 31621
        #name: "IEEE 1149.1b:1994"
        #slug: "ieee-1149-1b-1994-ieee00001730-240805"
        #description: """
          Amendment Standard - Superseded.<br />\n
          Superseded by 1149.1-2001 A language to describe components that conform to IEEE Std 1149.1-1990 is described in this supplement. The language is based on the VHSIC Hardware Description Language (VHDL). General characteristics, the overall structure of a boundary-scan description language (BSDL) description, special cases, and example packages are included.<br />\n
          \t\t\t\t
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1)"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#113528 …}
    #channels: Doctrine\ORM\PersistentCollection {#113534 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#113530 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#113532 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#113519 …}
    -apiLastModifiedAt: DateTime @1754517600 {#113511
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#113513
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @794012400 {#113514
      date: 1995-03-01 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 80
    -documents: Doctrine\ORM\PersistentCollection {#113522 …}
    -favorites: Doctrine\ORM\PersistentCollection {#113524 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#113520
    #id: 9153
    #code: "IEEE00001730"
    #attributes: Doctrine\ORM\PersistentCollection {#113536 …}
    #variants: Doctrine\ORM\PersistentCollection {#113538 …}
    #options: Doctrine\ORM\PersistentCollection {#113542 …}
    #associations: Doctrine\ORM\PersistentCollection {#113540 …}
    #createdAt: DateTime @1751038015 {#113512
      date: 2025-06-27 17:26:55.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#113509
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#113526 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#113816
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#113520}
        #id: 31621
        #name: "IEEE 1149.1b:1994"
        #slug: "ieee-1149-1b-1994-ieee00001730-240805"
        #description: """
          Amendment Standard - Superseded.<br />\n
          Superseded by 1149.1-2001 A language to describe components that conform to IEEE Std 1149.1-1990 is described in this supplement. The language is based on the VHSIC Hardware Description Language (VHDL). General characteristics, the overall structure of a boundary-scan description language (BSDL) description, special cases, and example packages are included.<br />\n
          \t\t\t\t
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1)"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#113528 …}
    #channels: Doctrine\ORM\PersistentCollection {#113534 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#113530 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#113532 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#113519 …}
    -apiLastModifiedAt: DateTime @1754517600 {#113511
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#113513
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @794012400 {#113514
      date: 1995-03-01 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 80
    -documents: Doctrine\ORM\PersistentCollection {#113522 …}
    -favorites: Doctrine\ORM\PersistentCollection {#113524 …}
  }
]

App\Twig\Components\ProductMostRecent {#113883
  +product: App\Entity\Product\Product {#113520
    #id: 9153
    #code: "IEEE00001730"
    #attributes: Doctrine\ORM\PersistentCollection {#113536 …}
    #variants: Doctrine\ORM\PersistentCollection {#113538 …}
    #options: Doctrine\ORM\PersistentCollection {#113542 …}
    #associations: Doctrine\ORM\PersistentCollection {#113540 …}
    #createdAt: DateTime @1751038015 {#113512
      date: 2025-06-27 17:26:55.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#113509
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#113526 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#113816
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#113520}
        #id: 31621
        #name: "IEEE 1149.1b:1994"
        #slug: "ieee-1149-1b-1994-ieee00001730-240805"
        #description: """
          Amendment Standard - Superseded.<br />\n
          Superseded by 1149.1-2001 A language to describe components that conform to IEEE Std 1149.1-1990 is described in this supplement. The language is based on the VHSIC Hardware Description Language (VHDL). General characteristics, the overall structure of a boundary-scan description language (BSDL) description, special cases, and example packages are included.<br />\n
          \t\t\t\t
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1)"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#113528 …}
    #channels: Doctrine\ORM\PersistentCollection {#113534 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#113530 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#113532 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#113519 …}
    -apiLastModifiedAt: DateTime @1754517600 {#113511
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#113513
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @794012400 {#113514
      date: 1995-03-01 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 80
    -documents: Doctrine\ORM\PersistentCollection {#113522 …}
    -favorites: Doctrine\ORM\PersistentCollection {#113524 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#106827
    #id: 9151
    #code: "IEEE00001727"
    #attributes: Doctrine\ORM\PersistentCollection {#106810 …}
    #variants: Doctrine\ORM\PersistentCollection {#106807 …}
    #options: Doctrine\ORM\PersistentCollection {#106803 …}
    #associations: Doctrine\ORM\PersistentCollection {#106805 …}
    #createdAt: DateTime @1751038014 {#106835
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#106808
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106821 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106860
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106827}
        #id: 31613
        #name: "IEEE 1149.1:1990"
        #slug: "ieee-1149-1-1990-ieee00001727-240803"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary-Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106818 …}
    #channels: Doctrine\ORM\PersistentCollection {#106812 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106816 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106814 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106828 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106795
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106834
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @643240800 {#106833
      date: 1990-05-21 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#106825 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106823 …}
  }
  "showFullLabel" => "true"
]

[
  "showFullLabel" => "true"
]

App\Twig\Components\ProductState {#113947
  +product: App\Entity\Product\Product {#106827
    #id: 9151
    #code: "IEEE00001727"
    #attributes: Doctrine\ORM\PersistentCollection {#106810 …}
    #variants: Doctrine\ORM\PersistentCollection {#106807 …}
    #options: Doctrine\ORM\PersistentCollection {#106803 …}
    #associations: Doctrine\ORM\PersistentCollection {#106805 …}
    #createdAt: DateTime @1751038014 {#106835
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#106808
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106821 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106860
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106827}
        #id: 31613
        #name: "IEEE 1149.1:1990"
        #slug: "ieee-1149-1-1990-ieee00001727-240803"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary-Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106818 …}
    #channels: Doctrine\ORM\PersistentCollection {#106812 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106816 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106814 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106828 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106795
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106834
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @643240800 {#106833
      date: 1990-05-21 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#106825 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106823 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#106827
    #id: 9151
    #code: "IEEE00001727"
    #attributes: Doctrine\ORM\PersistentCollection {#106810 …}
    #variants: Doctrine\ORM\PersistentCollection {#106807 …}
    #options: Doctrine\ORM\PersistentCollection {#106803 …}
    #associations: Doctrine\ORM\PersistentCollection {#106805 …}
    #createdAt: DateTime @1751038014 {#106835
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#106808
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106821 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106860
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106827}
        #id: 31613
        #name: "IEEE 1149.1:1990"
        #slug: "ieee-1149-1-1990-ieee00001727-240803"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary-Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106818 …}
    #channels: Doctrine\ORM\PersistentCollection {#106812 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106816 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106814 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106828 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106795
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106834
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @643240800 {#106833
      date: 1990-05-21 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#106825 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106823 …}
  }
]

App\Twig\Components\ProductMostRecent {#113974
  +product: App\Entity\Product\Product {#106827
    #id: 9151
    #code: "IEEE00001727"
    #attributes: Doctrine\ORM\PersistentCollection {#106810 …}
    #variants: Doctrine\ORM\PersistentCollection {#106807 …}
    #options: Doctrine\ORM\PersistentCollection {#106803 …}
    #associations: Doctrine\ORM\PersistentCollection {#106805 …}
    #createdAt: DateTime @1751038014 {#106835
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#106808
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#106821 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#106860
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#106827}
        #id: 31613
        #name: "IEEE 1149.1:1990"
        #slug: "ieee-1149-1-1990-ieee00001727-240803"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary-Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#106818 …}
    #channels: Doctrine\ORM\PersistentCollection {#106812 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#106816 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#106814 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106828 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106795
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#106834
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @643240800 {#106833
      date: 1990-05-21 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#106825 …}
    -favorites: Doctrine\ORM\PersistentCollection {#106823 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}