Components
5
Twig Components
26
Render Count
56
ms
Render Time
112.0
MiB
Memory Usage
Components
| Name | Metadata | Render Count | Render Time |
|---|---|---|---|
| ProductCard |
"App\Twig\Components\ProductCard"components/ProductCard.html.twig |
8 | 51.62ms |
| ProductState |
"App\Twig\Components\ProductState"components/ProductState.html.twig |
8 | 1.45ms |
| ProductMostRecent |
"App\Twig\Components\ProductMostRecent"components/ProductMostRecent.html.twig |
8 | 5.37ms |
| PageBanner |
"App\Twig\Components\PageBanner"components/PageBanner.html.twig |
1 | 4.69ms |
| BackButton |
"App\Twig\Components\BackButton"components/BackButton.html.twig |
1 | 0.22ms |
Render calls
| PageBanner | App\Twig\Components\PageBanner | 112.0 MiB | 4.69 ms | |
|---|---|---|---|---|
| Input props | [ "backLabel" => "31.080 : Semiconductor devices" "backUrl" => "/taxons/main/ics-2277/31-electronics-4445/31-080-semiconductor-devices-4508" "paddingClasses" => "p-2 px-lg-5 py-lg-0" "searchPlaceholder" => "sylius.ui.search" "showSearch" => "true" "title" => "31.080.30 : Transistors" ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\PageBanner {#94284 +supTitle: null +title: "31.080.30 : Transistors" +subTitle: null +backUrl: "/taxons/main/ics-2277/31-electronics-4445/31-080-semiconductor-devices-4508" +backLabel: "31.080 : Semiconductor devices" +customClasses: null +backgroundType: null +centered: true +showSearch: true +searchPlaceholder: "sylius.ui.search" +searchValue: null +paddingClasses: "p-2 px-lg-5 py-lg-0" } |
|||
| BackButton | App\Twig\Components\BackButton | 112.0 MiB | 0.22 ms | |
|---|---|---|---|---|
| Input props | [ "url" => "/taxons/main/ics-2277/31-electronics-4445/31-080-semiconductor-devices-4508" "label" => "31.080 : Semiconductor devices" ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\BackButton {#94386 +label: "31.080 : Semiconductor devices" +url: "/taxons/main/ics-2277/31-electronics-4445/31-080-semiconductor-devices-4508" } |
|||
| ProductCard | App\Twig\Components\ProductCard | 112.0 MiB | 9.65 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94919 #id: 8656 #code: "IEEE00000814" #attributes: Doctrine\ORM\PersistentCollection {#94977 …} #variants: Doctrine\ORM\PersistentCollection {#94975 …} #options: Doctrine\ORM\PersistentCollection {#94971 …} #associations: Doctrine\ORM\PersistentCollection {#94973 …} #createdAt: DateTime @1751037599 {#94908 : 2025-06-27 17:19:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94918 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94987 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95297 #locale: "en_US" #translatable: App\Entity\Product\Product {#94919} #id: 29633 #name: "IEEE 581:1978" #slug: "ieee-581-1978-ieee00000814-240308" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n no abstract. Withdrawn Standard. Withdrawn Date: Dec 05, 1991.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94985 …} #channels: Doctrine\ORM\PersistentCollection {#94979 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94983 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94981 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94993 …} -apiLastModifiedAt: DateTime @1754517600 {#94925 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94928 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @262562400 {#94926 : 1978-04-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @691887600 {#94924 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "581" -bookCollection: "" -pageCount: 44 -documents: Doctrine\ORM\PersistentCollection {#94991 …} -favorites: Doctrine\ORM\PersistentCollection {#94989 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductCard {#95188 +product: App\Entity\Product\Product {#94919 #id: 8656 #code: "IEEE00000814" #attributes: Doctrine\ORM\PersistentCollection {#94977 …} #variants: Doctrine\ORM\PersistentCollection {#94975 …} #options: Doctrine\ORM\PersistentCollection {#94971 …} #associations: Doctrine\ORM\PersistentCollection {#94973 …} #createdAt: DateTime @1751037599 {#94908 : 2025-06-27 17:19:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94918 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94987 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95297 #locale: "en_US" #translatable: App\Entity\Product\Product {#94919} #id: 29633 #name: "IEEE 581:1978" #slug: "ieee-581-1978-ieee00000814-240308" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n no abstract. Withdrawn Standard. Withdrawn Date: Dec 05, 1991.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94985 …} #channels: Doctrine\ORM\PersistentCollection {#94979 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94983 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94981 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94993 …} -apiLastModifiedAt: DateTime @1754517600 {#94925 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94928 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @262562400 {#94926 : 1978-04-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @691887600 {#94924 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "581" -bookCollection: "" -pageCount: 44 -documents: Doctrine\ORM\PersistentCollection {#94991 …} -favorites: Doctrine\ORM\PersistentCollection {#94989 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 112.0 MiB | 0.27 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94919 #id: 8656 #code: "IEEE00000814" #attributes: Doctrine\ORM\PersistentCollection {#94977 …} #variants: Doctrine\ORM\PersistentCollection {#94975 …} #options: Doctrine\ORM\PersistentCollection {#94971 …} #associations: Doctrine\ORM\PersistentCollection {#94973 …} #createdAt: DateTime @1751037599 {#94908 : 2025-06-27 17:19:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94918 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94987 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95297 #locale: "en_US" #translatable: App\Entity\Product\Product {#94919} #id: 29633 #name: "IEEE 581:1978" #slug: "ieee-581-1978-ieee00000814-240308" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n no abstract. Withdrawn Standard. Withdrawn Date: Dec 05, 1991.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94985 …} #channels: Doctrine\ORM\PersistentCollection {#94979 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94983 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94981 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94993 …} -apiLastModifiedAt: DateTime @1754517600 {#94925 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94928 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @262562400 {#94926 : 1978-04-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @691887600 {#94924 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "581" -bookCollection: "" -pageCount: 44 -documents: Doctrine\ORM\PersistentCollection {#94991 …} -favorites: Doctrine\ORM\PersistentCollection {#94989 …} } ] |
|||
| Attributes | [ "showFullLabel" => false ] |
|||
| Component | App\Twig\Components\ProductState {#95304 +product: App\Entity\Product\Product {#94919 #id: 8656 #code: "IEEE00000814" #attributes: Doctrine\ORM\PersistentCollection {#94977 …} #variants: Doctrine\ORM\PersistentCollection {#94975 …} #options: Doctrine\ORM\PersistentCollection {#94971 …} #associations: Doctrine\ORM\PersistentCollection {#94973 …} #createdAt: DateTime @1751037599 {#94908 : 2025-06-27 17:19:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94918 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94987 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95297 #locale: "en_US" #translatable: App\Entity\Product\Product {#94919} #id: 29633 #name: "IEEE 581:1978" #slug: "ieee-581-1978-ieee00000814-240308" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n no abstract. Withdrawn Standard. Withdrawn Date: Dec 05, 1991.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94985 …} #channels: Doctrine\ORM\PersistentCollection {#94979 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94983 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94981 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94993 …} -apiLastModifiedAt: DateTime @1754517600 {#94925 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94928 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @262562400 {#94926 : 1978-04-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @691887600 {#94924 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "581" -bookCollection: "" -pageCount: 44 -documents: Doctrine\ORM\PersistentCollection {#94991 …} -favorites: Doctrine\ORM\PersistentCollection {#94989 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductMostRecent | App\Twig\Components\ProductMostRecent | 112.0 MiB | 0.78 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94919 #id: 8656 #code: "IEEE00000814" #attributes: Doctrine\ORM\PersistentCollection {#94977 …} #variants: Doctrine\ORM\PersistentCollection {#94975 …} #options: Doctrine\ORM\PersistentCollection {#94971 …} #associations: Doctrine\ORM\PersistentCollection {#94973 …} #createdAt: DateTime @1751037599 {#94908 : 2025-06-27 17:19:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94918 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94987 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95297 #locale: "en_US" #translatable: App\Entity\Product\Product {#94919} #id: 29633 #name: "IEEE 581:1978" #slug: "ieee-581-1978-ieee00000814-240308" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n no abstract. Withdrawn Standard. Withdrawn Date: Dec 05, 1991.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94985 …} #channels: Doctrine\ORM\PersistentCollection {#94979 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94983 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94981 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94993 …} -apiLastModifiedAt: DateTime @1754517600 {#94925 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94928 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @262562400 {#94926 : 1978-04-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @691887600 {#94924 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "581" -bookCollection: "" -pageCount: 44 -documents: Doctrine\ORM\PersistentCollection {#94991 …} -favorites: Doctrine\ORM\PersistentCollection {#94989 …} } ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductMostRecent {#95398 +product: App\Entity\Product\Product {#94919 #id: 8656 #code: "IEEE00000814" #attributes: Doctrine\ORM\PersistentCollection {#94977 …} #variants: Doctrine\ORM\PersistentCollection {#94975 …} #options: Doctrine\ORM\PersistentCollection {#94971 …} #associations: Doctrine\ORM\PersistentCollection {#94973 …} #createdAt: DateTime @1751037599 {#94908 : 2025-06-27 17:19:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94918 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94987 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95297 #locale: "en_US" #translatable: App\Entity\Product\Product {#94919} #id: 29633 #name: "IEEE 581:1978" #slug: "ieee-581-1978-ieee00000814-240308" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n no abstract. Withdrawn Standard. Withdrawn Date: Dec 05, 1991.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94985 …} #channels: Doctrine\ORM\PersistentCollection {#94979 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94983 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94981 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94993 …} -apiLastModifiedAt: DateTime @1754517600 {#94925 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94928 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @262562400 {#94926 : 1978-04-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @691887600 {#94924 : 1991-12-05 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "581" -bookCollection: "" -pageCount: 44 -documents: Doctrine\ORM\PersistentCollection {#94991 …} -favorites: Doctrine\ORM\PersistentCollection {#94989 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductCard | App\Twig\Components\ProductCard | 112.0 MiB | 5.74 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94964 #id: 9001 #code: "IEEE00001457" #attributes: Doctrine\ORM\PersistentCollection {#94958 …} #variants: Doctrine\ORM\PersistentCollection {#94960 …} #options: Doctrine\ORM\PersistentCollection {#94995 …} #associations: Doctrine\ORM\PersistentCollection {#94962 …} #createdAt: DateTime @1751037888 {#94969 : 2025-06-27 17:24:48.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94968 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94933 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95611 #locale: "en_US" #translatable: App\Entity\Product\Product {#94964} #id: 31013 #name: "IEEE 1005:1991" #slug: "ieee-1005-1991-ieee00001457-240653" #description: """ New IEEE Standard - Superseded.<br />\n An introduction to the physics unique to this type of memory and an overview of typical<br />\n array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n structure that have been used in commercially available devices are described. The various<br />\n reliability considerations involved in these devices are explored. Retention and endurance<br />\n failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n endurance of the arrays are discussed. The specification and engineering verification of<br />\n endurance are described. The more common features incorporated into the arrays and methods<br />\n for testing these complex products efficiently are addressed. The effects that various forms of<br />\n ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n \t\t\t\t<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94944 …} #channels: Doctrine\ORM\PersistentCollection {#94956 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94952 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94954 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94942 …} -apiLastModifiedAt: DateTime @1754517600 {#94967 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94966 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @687654000 {#94965 : 1991-10-17 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 41 -documents: Doctrine\ORM\PersistentCollection {#94939 …} -favorites: Doctrine\ORM\PersistentCollection {#94935 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "secondary-lighter" "hoverType" => "border-black" ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductCard {#95589 +product: App\Entity\Product\Product {#94964 #id: 9001 #code: "IEEE00001457" #attributes: Doctrine\ORM\PersistentCollection {#94958 …} #variants: Doctrine\ORM\PersistentCollection {#94960 …} #options: Doctrine\ORM\PersistentCollection {#94995 …} #associations: Doctrine\ORM\PersistentCollection {#94962 …} #createdAt: DateTime @1751037888 {#94969 : 2025-06-27 17:24:48.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94968 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94933 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95611 #locale: "en_US" #translatable: App\Entity\Product\Product {#94964} #id: 31013 #name: "IEEE 1005:1991" #slug: "ieee-1005-1991-ieee00001457-240653" #description: """ New IEEE Standard - Superseded.<br />\n An introduction to the physics unique to this type of memory and an overview of typical<br />\n array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n structure that have been used in commercially available devices are described. The various<br />\n reliability considerations involved in these devices are explored. Retention and endurance<br />\n failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n endurance of the arrays are discussed. The specification and engineering verification of<br />\n endurance are described. The more common features incorporated into the arrays and methods<br />\n for testing these complex products efficiently are addressed. The effects that various forms of<br />\n ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n \t\t\t\t<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94944 …} #channels: Doctrine\ORM\PersistentCollection {#94956 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94952 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94954 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94942 …} -apiLastModifiedAt: DateTime @1754517600 {#94967 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94966 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @687654000 {#94965 : 1991-10-17 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 41 -documents: Doctrine\ORM\PersistentCollection {#94939 …} -favorites: Doctrine\ORM\PersistentCollection {#94935 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "secondary-lighter" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 112.0 MiB | 0.19 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94964 #id: 9001 #code: "IEEE00001457" #attributes: Doctrine\ORM\PersistentCollection {#94958 …} #variants: Doctrine\ORM\PersistentCollection {#94960 …} #options: Doctrine\ORM\PersistentCollection {#94995 …} #associations: Doctrine\ORM\PersistentCollection {#94962 …} #createdAt: DateTime @1751037888 {#94969 : 2025-06-27 17:24:48.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94968 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94933 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95611 #locale: "en_US" #translatable: App\Entity\Product\Product {#94964} #id: 31013 #name: "IEEE 1005:1991" #slug: "ieee-1005-1991-ieee00001457-240653" #description: """ New IEEE Standard - Superseded.<br />\n An introduction to the physics unique to this type of memory and an overview of typical<br />\n array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n structure that have been used in commercially available devices are described. The various<br />\n reliability considerations involved in these devices are explored. Retention and endurance<br />\n failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n endurance of the arrays are discussed. The specification and engineering verification of<br />\n endurance are described. The more common features incorporated into the arrays and methods<br />\n for testing these complex products efficiently are addressed. The effects that various forms of<br />\n ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n \t\t\t\t<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94944 …} #channels: Doctrine\ORM\PersistentCollection {#94956 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94952 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94954 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94942 …} -apiLastModifiedAt: DateTime @1754517600 {#94967 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94966 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @687654000 {#94965 : 1991-10-17 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 41 -documents: Doctrine\ORM\PersistentCollection {#94939 …} -favorites: Doctrine\ORM\PersistentCollection {#94935 …} } ] |
|||
| Attributes | [ "showFullLabel" => false ] |
|||
| Component | App\Twig\Components\ProductState {#95618 +product: App\Entity\Product\Product {#94964 #id: 9001 #code: "IEEE00001457" #attributes: Doctrine\ORM\PersistentCollection {#94958 …} #variants: Doctrine\ORM\PersistentCollection {#94960 …} #options: Doctrine\ORM\PersistentCollection {#94995 …} #associations: Doctrine\ORM\PersistentCollection {#94962 …} #createdAt: DateTime @1751037888 {#94969 : 2025-06-27 17:24:48.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94968 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94933 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95611 #locale: "en_US" #translatable: App\Entity\Product\Product {#94964} #id: 31013 #name: "IEEE 1005:1991" #slug: "ieee-1005-1991-ieee00001457-240653" #description: """ New IEEE Standard - Superseded.<br />\n An introduction to the physics unique to this type of memory and an overview of typical<br />\n array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n structure that have been used in commercially available devices are described. The various<br />\n reliability considerations involved in these devices are explored. Retention and endurance<br />\n failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n endurance of the arrays are discussed. The specification and engineering verification of<br />\n endurance are described. The more common features incorporated into the arrays and methods<br />\n for testing these complex products efficiently are addressed. The effects that various forms of<br />\n ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n \t\t\t\t<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94944 …} #channels: Doctrine\ORM\PersistentCollection {#94956 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94952 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94954 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94942 …} -apiLastModifiedAt: DateTime @1754517600 {#94967 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94966 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @687654000 {#94965 : 1991-10-17 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 41 -documents: Doctrine\ORM\PersistentCollection {#94939 …} -favorites: Doctrine\ORM\PersistentCollection {#94935 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductMostRecent | App\Twig\Components\ProductMostRecent | 112.0 MiB | 0.68 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#94964 #id: 9001 #code: "IEEE00001457" #attributes: Doctrine\ORM\PersistentCollection {#94958 …} #variants: Doctrine\ORM\PersistentCollection {#94960 …} #options: Doctrine\ORM\PersistentCollection {#94995 …} #associations: Doctrine\ORM\PersistentCollection {#94962 …} #createdAt: DateTime @1751037888 {#94969 : 2025-06-27 17:24:48.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94968 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94933 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95611 #locale: "en_US" #translatable: App\Entity\Product\Product {#94964} #id: 31013 #name: "IEEE 1005:1991" #slug: "ieee-1005-1991-ieee00001457-240653" #description: """ New IEEE Standard - Superseded.<br />\n An introduction to the physics unique to this type of memory and an overview of typical<br />\n array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n structure that have been used in commercially available devices are described. The various<br />\n reliability considerations involved in these devices are explored. Retention and endurance<br />\n failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n endurance of the arrays are discussed. The specification and engineering verification of<br />\n endurance are described. The more common features incorporated into the arrays and methods<br />\n for testing these complex products efficiently are addressed. The effects that various forms of<br />\n ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n \t\t\t\t<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94944 …} #channels: Doctrine\ORM\PersistentCollection {#94956 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94952 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94954 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94942 …} -apiLastModifiedAt: DateTime @1754517600 {#94967 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94966 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @687654000 {#94965 : 1991-10-17 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 41 -documents: Doctrine\ORM\PersistentCollection {#94939 …} -favorites: Doctrine\ORM\PersistentCollection {#94935 …} } ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductMostRecent {#95695 +product: App\Entity\Product\Product {#94964 #id: 9001 #code: "IEEE00001457" #attributes: Doctrine\ORM\PersistentCollection {#94958 …} #variants: Doctrine\ORM\PersistentCollection {#94960 …} #options: Doctrine\ORM\PersistentCollection {#94995 …} #associations: Doctrine\ORM\PersistentCollection {#94962 …} #createdAt: DateTime @1751037888 {#94969 : 2025-06-27 17:24:48.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94968 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#94933 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95611 #locale: "en_US" #translatable: App\Entity\Product\Product {#94964} #id: 31013 #name: "IEEE 1005:1991" #slug: "ieee-1005-1991-ieee00001457-240653" #description: """ New IEEE Standard - Superseded.<br />\n An introduction to the physics unique to this type of memory and an overview of typical<br />\n array architectures are presented. The variations on the basic floating gate nonvolatile cell<br />\n structure that have been used in commercially available devices are described. The various<br />\n reliability considerations involved in these devices are explored. Retention and endurance<br />\n failures and the interaction between endurance, retention, and standard semiconductor failure<br />\n mechanisms in determining the device failure rate are covered. How to specify and perform<br />\n engineering verification of retention of data stored in the arrays is described. Effects that limit the<br />\n endurance of the arrays are discussed. The specification and engineering verification of<br />\n endurance are described. The more common features incorporated into the arrays and methods<br />\n for testing these complex products efficiently are addressed. The effects that various forms of<br />\n ionizing radiation may have on floating gate arrays and approaches to test for these effects are<br />\n covered. The use of floating gate cells in nonmemory applications is briefly considered.<br />\n \t\t\t\t<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E2PROMs, and block rewritable “flash” EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#94944 …} #channels: Doctrine\ORM\PersistentCollection {#94956 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#94952 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#94954 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94942 …} -apiLastModifiedAt: DateTime @1754517600 {#94967 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#94966 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @687654000 {#94965 : 1991-10-17 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 41 -documents: Doctrine\ORM\PersistentCollection {#94939 …} -favorites: Doctrine\ORM\PersistentCollection {#94935 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductCard | App\Twig\Components\ProductCard | 112.0 MiB | 5.78 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95003 #id: 9002 #code: "IEEE00001458" #attributes: Doctrine\ORM\PersistentCollection {#95020 …} #variants: Doctrine\ORM\PersistentCollection {#95022 …} #options: Doctrine\ORM\PersistentCollection {#95026 …} #associations: Doctrine\ORM\PersistentCollection {#95024 …} #createdAt: DateTime @1751037889 {#94997 : 2025-06-27 17:24:49.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94998 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95010 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95820 #locale: "en_US" #translatable: App\Entity\Product\Product {#95003} #id: 31017 #name: "IEEE 1005:1998" #slug: "ieee-1005-1998-ieee00001458-240654" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n \t\t\t\t<br />\n Modify the present FGA standard to include floating gate "flash" EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95012 …} #channels: Doctrine\ORM\PersistentCollection {#95018 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95014 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95016 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95004 …} -apiLastModifiedAt: DateTime @1754517600 {#94999 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95000 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @918514800 {#95001 : 1999-02-09 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1074207600 {#95002 : 2004-01-16 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 129 -documents: Doctrine\ORM\PersistentCollection {#95006 …} -favorites: Doctrine\ORM\PersistentCollection {#95008 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductCard {#95800 +product: App\Entity\Product\Product {#95003 #id: 9002 #code: "IEEE00001458" #attributes: Doctrine\ORM\PersistentCollection {#95020 …} #variants: Doctrine\ORM\PersistentCollection {#95022 …} #options: Doctrine\ORM\PersistentCollection {#95026 …} #associations: Doctrine\ORM\PersistentCollection {#95024 …} #createdAt: DateTime @1751037889 {#94997 : 2025-06-27 17:24:49.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94998 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95010 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95820 #locale: "en_US" #translatable: App\Entity\Product\Product {#95003} #id: 31017 #name: "IEEE 1005:1998" #slug: "ieee-1005-1998-ieee00001458-240654" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n \t\t\t\t<br />\n Modify the present FGA standard to include floating gate "flash" EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95012 …} #channels: Doctrine\ORM\PersistentCollection {#95018 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95014 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95016 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95004 …} -apiLastModifiedAt: DateTime @1754517600 {#94999 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95000 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @918514800 {#95001 : 1999-02-09 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1074207600 {#95002 : 2004-01-16 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 129 -documents: Doctrine\ORM\PersistentCollection {#95006 …} -favorites: Doctrine\ORM\PersistentCollection {#95008 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 112.0 MiB | 0.18 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95003 #id: 9002 #code: "IEEE00001458" #attributes: Doctrine\ORM\PersistentCollection {#95020 …} #variants: Doctrine\ORM\PersistentCollection {#95022 …} #options: Doctrine\ORM\PersistentCollection {#95026 …} #associations: Doctrine\ORM\PersistentCollection {#95024 …} #createdAt: DateTime @1751037889 {#94997 : 2025-06-27 17:24:49.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94998 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95010 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95820 #locale: "en_US" #translatable: App\Entity\Product\Product {#95003} #id: 31017 #name: "IEEE 1005:1998" #slug: "ieee-1005-1998-ieee00001458-240654" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n \t\t\t\t<br />\n Modify the present FGA standard to include floating gate "flash" EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95012 …} #channels: Doctrine\ORM\PersistentCollection {#95018 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95014 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95016 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95004 …} -apiLastModifiedAt: DateTime @1754517600 {#94999 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95000 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @918514800 {#95001 : 1999-02-09 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1074207600 {#95002 : 2004-01-16 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 129 -documents: Doctrine\ORM\PersistentCollection {#95006 …} -favorites: Doctrine\ORM\PersistentCollection {#95008 …} } ] |
|||
| Attributes | [ "showFullLabel" => false ] |
|||
| Component | App\Twig\Components\ProductState {#95827 +product: App\Entity\Product\Product {#95003 #id: 9002 #code: "IEEE00001458" #attributes: Doctrine\ORM\PersistentCollection {#95020 …} #variants: Doctrine\ORM\PersistentCollection {#95022 …} #options: Doctrine\ORM\PersistentCollection {#95026 …} #associations: Doctrine\ORM\PersistentCollection {#95024 …} #createdAt: DateTime @1751037889 {#94997 : 2025-06-27 17:24:49.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94998 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95010 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95820 #locale: "en_US" #translatable: App\Entity\Product\Product {#95003} #id: 31017 #name: "IEEE 1005:1998" #slug: "ieee-1005-1998-ieee00001458-240654" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n \t\t\t\t<br />\n Modify the present FGA standard to include floating gate "flash" EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95012 …} #channels: Doctrine\ORM\PersistentCollection {#95018 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95014 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95016 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95004 …} -apiLastModifiedAt: DateTime @1754517600 {#94999 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95000 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @918514800 {#95001 : 1999-02-09 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1074207600 {#95002 : 2004-01-16 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 129 -documents: Doctrine\ORM\PersistentCollection {#95006 …} -favorites: Doctrine\ORM\PersistentCollection {#95008 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductMostRecent | App\Twig\Components\ProductMostRecent | 112.0 MiB | 0.75 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95003 #id: 9002 #code: "IEEE00001458" #attributes: Doctrine\ORM\PersistentCollection {#95020 …} #variants: Doctrine\ORM\PersistentCollection {#95022 …} #options: Doctrine\ORM\PersistentCollection {#95026 …} #associations: Doctrine\ORM\PersistentCollection {#95024 …} #createdAt: DateTime @1751037889 {#94997 : 2025-06-27 17:24:49.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94998 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95010 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95820 #locale: "en_US" #translatable: App\Entity\Product\Product {#95003} #id: 31017 #name: "IEEE 1005:1998" #slug: "ieee-1005-1998-ieee00001458-240654" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n \t\t\t\t<br />\n Modify the present FGA standard to include floating gate "flash" EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95012 …} #channels: Doctrine\ORM\PersistentCollection {#95018 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95014 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95016 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95004 …} -apiLastModifiedAt: DateTime @1754517600 {#94999 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95000 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @918514800 {#95001 : 1999-02-09 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1074207600 {#95002 : 2004-01-16 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 129 -documents: Doctrine\ORM\PersistentCollection {#95006 …} -favorites: Doctrine\ORM\PersistentCollection {#95008 …} } ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductMostRecent {#95904 +product: App\Entity\Product\Product {#95003 #id: 9002 #code: "IEEE00001458" #attributes: Doctrine\ORM\PersistentCollection {#95020 …} #variants: Doctrine\ORM\PersistentCollection {#95022 …} #options: Doctrine\ORM\PersistentCollection {#95026 …} #associations: Doctrine\ORM\PersistentCollection {#95024 …} #createdAt: DateTime @1751037889 {#94997 : 2025-06-27 17:24:49.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#94998 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95010 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#95820 #locale: "en_US" #translatable: App\Entity\Product\Product {#95003} #id: 31017 #name: "IEEE 1005:1998" #slug: "ieee-1005-1998-ieee00001458-240654" #description: """ Revision Standard - Inactive-Withdrawn.<br />\n This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.<br />\n \t\t\t\t<br />\n Modify the present FGA standard to include floating gate "flash" EEPROM's that use Fowler-Nordheim tunneling and/or hot electron injection programming techniques. Hot electron injection EPROM's are included for completeness.<br />\n Flash EEPROM technology is not currently included in the standard, but is a rapidly growing technology in terms of use. This amendment defines terms used in this technology, explains its operation and limitation. It is intended to assist users in selecting, specifying, using and testing Floating Gate Memory Arrays. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95012 …} #channels: Doctrine\ORM\PersistentCollection {#95018 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95014 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95016 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95004 …} -apiLastModifiedAt: DateTime @1754517600 {#94999 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95000 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @918514800 {#95001 : 1999-02-09 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1074207600 {#95002 : 2004-01-16 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1005" -bookCollection: "" -pageCount: 129 -documents: Doctrine\ORM\PersistentCollection {#95006 …} -favorites: Doctrine\ORM\PersistentCollection {#95008 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductCard | App\Twig\Components\ProductCard | 112.0 MiB | 5.85 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95033 #id: 10029 #code: "IEEE00003476" #attributes: Doctrine\ORM\PersistentCollection {#95050 …} #variants: Doctrine\ORM\PersistentCollection {#95052 …} #options: Doctrine\ORM\PersistentCollection {#95056 …} #associations: Doctrine\ORM\PersistentCollection {#95054 …} #createdAt: DateTime @1751038758 {#95028 : 2025-06-27 17:39:18.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95029 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95040 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96029 #locale: "en_US" #translatable: App\Entity\Product\Product {#95033} #id: 35125 #name: "IEEE 1620:2004" #slug: "ieee-1620-2004-ieee00003476-241681" #description: """ New IEEE Standard - Superseded.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n \t\t\t\t<br />\n This project will develop standard methods for the characterization of organic transistors and materials. The methods will be independent of processing routes used to fabricate the transistors. The characterization methods will be usable for all transistors comprised of organic semiconductor materials.<br />\n There is currently no defined standard for characterizing organic transistors and materials and means of reporting performance and other data. This is intended to replace the diverse sets of procedures and measurements currently being used. However, without openly defined standard test methods the acceptance and diffusion of organic semiconductor technology will be severely impeded. These methods will enable the creation of a testing and reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will provide the necessary tools and procedures for validation. """ #metaKeywords: null #metaDescription: null #shortDescription: "Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95042 …} #channels: Doctrine\ORM\PersistentCollection {#95048 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95044 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95046 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95034 …} -apiLastModifiedAt: DateTime @1754517600 {#95030 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95031 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1083189600 {#95032 : 2004-04-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95036 …} -favorites: Doctrine\ORM\PersistentCollection {#95038 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "secondary-lighter" "hoverType" => "border-black" ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductCard {#96009 +product: App\Entity\Product\Product {#95033 #id: 10029 #code: "IEEE00003476" #attributes: Doctrine\ORM\PersistentCollection {#95050 …} #variants: Doctrine\ORM\PersistentCollection {#95052 …} #options: Doctrine\ORM\PersistentCollection {#95056 …} #associations: Doctrine\ORM\PersistentCollection {#95054 …} #createdAt: DateTime @1751038758 {#95028 : 2025-06-27 17:39:18.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95029 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95040 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96029 #locale: "en_US" #translatable: App\Entity\Product\Product {#95033} #id: 35125 #name: "IEEE 1620:2004" #slug: "ieee-1620-2004-ieee00003476-241681" #description: """ New IEEE Standard - Superseded.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n \t\t\t\t<br />\n This project will develop standard methods for the characterization of organic transistors and materials. The methods will be independent of processing routes used to fabricate the transistors. The characterization methods will be usable for all transistors comprised of organic semiconductor materials.<br />\n There is currently no defined standard for characterizing organic transistors and materials and means of reporting performance and other data. This is intended to replace the diverse sets of procedures and measurements currently being used. However, without openly defined standard test methods the acceptance and diffusion of organic semiconductor technology will be severely impeded. These methods will enable the creation of a testing and reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will provide the necessary tools and procedures for validation. """ #metaKeywords: null #metaDescription: null #shortDescription: "Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95042 …} #channels: Doctrine\ORM\PersistentCollection {#95048 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95044 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95046 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95034 …} -apiLastModifiedAt: DateTime @1754517600 {#95030 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95031 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1083189600 {#95032 : 2004-04-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95036 …} -favorites: Doctrine\ORM\PersistentCollection {#95038 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "secondary-lighter" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 112.0 MiB | 0.15 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95033 #id: 10029 #code: "IEEE00003476" #attributes: Doctrine\ORM\PersistentCollection {#95050 …} #variants: Doctrine\ORM\PersistentCollection {#95052 …} #options: Doctrine\ORM\PersistentCollection {#95056 …} #associations: Doctrine\ORM\PersistentCollection {#95054 …} #createdAt: DateTime @1751038758 {#95028 : 2025-06-27 17:39:18.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95029 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95040 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96029 #locale: "en_US" #translatable: App\Entity\Product\Product {#95033} #id: 35125 #name: "IEEE 1620:2004" #slug: "ieee-1620-2004-ieee00003476-241681" #description: """ New IEEE Standard - Superseded.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n \t\t\t\t<br />\n This project will develop standard methods for the characterization of organic transistors and materials. The methods will be independent of processing routes used to fabricate the transistors. The characterization methods will be usable for all transistors comprised of organic semiconductor materials.<br />\n There is currently no defined standard for characterizing organic transistors and materials and means of reporting performance and other data. This is intended to replace the diverse sets of procedures and measurements currently being used. However, without openly defined standard test methods the acceptance and diffusion of organic semiconductor technology will be severely impeded. These methods will enable the creation of a testing and reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will provide the necessary tools and procedures for validation. """ #metaKeywords: null #metaDescription: null #shortDescription: "Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95042 …} #channels: Doctrine\ORM\PersistentCollection {#95048 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95044 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95046 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95034 …} -apiLastModifiedAt: DateTime @1754517600 {#95030 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95031 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1083189600 {#95032 : 2004-04-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95036 …} -favorites: Doctrine\ORM\PersistentCollection {#95038 …} } ] |
|||
| Attributes | [ "showFullLabel" => false ] |
|||
| Component | App\Twig\Components\ProductState {#96036 +product: App\Entity\Product\Product {#95033 #id: 10029 #code: "IEEE00003476" #attributes: Doctrine\ORM\PersistentCollection {#95050 …} #variants: Doctrine\ORM\PersistentCollection {#95052 …} #options: Doctrine\ORM\PersistentCollection {#95056 …} #associations: Doctrine\ORM\PersistentCollection {#95054 …} #createdAt: DateTime @1751038758 {#95028 : 2025-06-27 17:39:18.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95029 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95040 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96029 #locale: "en_US" #translatable: App\Entity\Product\Product {#95033} #id: 35125 #name: "IEEE 1620:2004" #slug: "ieee-1620-2004-ieee00003476-241681" #description: """ New IEEE Standard - Superseded.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n \t\t\t\t<br />\n This project will develop standard methods for the characterization of organic transistors and materials. The methods will be independent of processing routes used to fabricate the transistors. The characterization methods will be usable for all transistors comprised of organic semiconductor materials.<br />\n There is currently no defined standard for characterizing organic transistors and materials and means of reporting performance and other data. This is intended to replace the diverse sets of procedures and measurements currently being used. However, without openly defined standard test methods the acceptance and diffusion of organic semiconductor technology will be severely impeded. These methods will enable the creation of a testing and reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will provide the necessary tools and procedures for validation. """ #metaKeywords: null #metaDescription: null #shortDescription: "Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95042 …} #channels: Doctrine\ORM\PersistentCollection {#95048 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95044 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95046 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95034 …} -apiLastModifiedAt: DateTime @1754517600 {#95030 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95031 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1083189600 {#95032 : 2004-04-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95036 …} -favorites: Doctrine\ORM\PersistentCollection {#95038 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductMostRecent | App\Twig\Components\ProductMostRecent | 112.0 MiB | 0.67 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95033 #id: 10029 #code: "IEEE00003476" #attributes: Doctrine\ORM\PersistentCollection {#95050 …} #variants: Doctrine\ORM\PersistentCollection {#95052 …} #options: Doctrine\ORM\PersistentCollection {#95056 …} #associations: Doctrine\ORM\PersistentCollection {#95054 …} #createdAt: DateTime @1751038758 {#95028 : 2025-06-27 17:39:18.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95029 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95040 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96029 #locale: "en_US" #translatable: App\Entity\Product\Product {#95033} #id: 35125 #name: "IEEE 1620:2004" #slug: "ieee-1620-2004-ieee00003476-241681" #description: """ New IEEE Standard - Superseded.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n \t\t\t\t<br />\n This project will develop standard methods for the characterization of organic transistors and materials. The methods will be independent of processing routes used to fabricate the transistors. The characterization methods will be usable for all transistors comprised of organic semiconductor materials.<br />\n There is currently no defined standard for characterizing organic transistors and materials and means of reporting performance and other data. This is intended to replace the diverse sets of procedures and measurements currently being used. However, without openly defined standard test methods the acceptance and diffusion of organic semiconductor technology will be severely impeded. These methods will enable the creation of a testing and reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will provide the necessary tools and procedures for validation. """ #metaKeywords: null #metaDescription: null #shortDescription: "Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95042 …} #channels: Doctrine\ORM\PersistentCollection {#95048 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95044 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95046 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95034 …} -apiLastModifiedAt: DateTime @1754517600 {#95030 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95031 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1083189600 {#95032 : 2004-04-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95036 …} -favorites: Doctrine\ORM\PersistentCollection {#95038 …} } ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductMostRecent {#96113 +product: App\Entity\Product\Product {#95033 #id: 10029 #code: "IEEE00003476" #attributes: Doctrine\ORM\PersistentCollection {#95050 …} #variants: Doctrine\ORM\PersistentCollection {#95052 …} #options: Doctrine\ORM\PersistentCollection {#95056 …} #associations: Doctrine\ORM\PersistentCollection {#95054 …} #createdAt: DateTime @1751038758 {#95028 : 2025-06-27 17:39:18.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95029 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95040 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96029 #locale: "en_US" #translatable: App\Entity\Product\Product {#95033} #id: 35125 #name: "IEEE 1620:2004" #slug: "ieee-1620-2004-ieee00003476-241681" #description: """ New IEEE Standard - Superseded.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n \t\t\t\t<br />\n This project will develop standard methods for the characterization of organic transistors and materials. The methods will be independent of processing routes used to fabricate the transistors. The characterization methods will be usable for all transistors comprised of organic semiconductor materials.<br />\n There is currently no defined standard for characterizing organic transistors and materials and means of reporting performance and other data. This is intended to replace the diverse sets of procedures and measurements currently being used. However, without openly defined standard test methods the acceptance and diffusion of organic semiconductor technology will be severely impeded. These methods will enable the creation of a testing and reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will provide the necessary tools and procedures for validation. """ #metaKeywords: null #metaDescription: null #shortDescription: "Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95042 …} #channels: Doctrine\ORM\PersistentCollection {#95048 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95044 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95046 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95034 …} -apiLastModifiedAt: DateTime @1754517600 {#95030 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95031 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1083189600 {#95032 : 2004-04-29 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 20 -documents: Doctrine\ORM\PersistentCollection {#95036 …} -favorites: Doctrine\ORM\PersistentCollection {#95038 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductCard | App\Twig\Components\ProductCard | 112.0 MiB | 6.65 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95065 #id: 10197 #code: "IEEE00003863" #attributes: Doctrine\ORM\PersistentCollection {#95082 …} #variants: Doctrine\ORM\PersistentCollection {#95084 …} #options: Doctrine\ORM\PersistentCollection {#95088 …} #associations: Doctrine\ORM\PersistentCollection {#95086 …} #createdAt: DateTime @1751038889 {#95058 : 2025-06-27 17:41:29.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95059 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95072 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96238 #locale: "en_US" #translatable: App\Entity\Product\Product {#95065} #id: 35797 #name: "IEEE 1620.1:2006 (R2012)" #slug: "ieee-1620-1-2006-r2012-ieee00003863-241849" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.<br />\n \t\t\t\t<br />\n This is a full-use standard that specifies methods for the characterization of organic transistor-based ring oscillators. The methods are applicable to all ring oscillators fabricated from organic semiconductor materials and are independent of the fabrication process.<br />\n The purpose of this project is to develop a standard methodology to characterize organic transistor based-ring oscillators and to allow reporting of their performance and associated data. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95074 …} #channels: Doctrine\ORM\PersistentCollection {#95080 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95076 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95078 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95066 …} -apiLastModifiedAt: DateTime @1754517600 {#95060 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1683151200 {#95061 : 2023-05-04 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1162940400 {#95062 : 2006-11-08 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @1339106400 {#95063 : 2012-06-08 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1680127200 {#95064 : 2023-03-30 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "1620.1" -bookCollection: "" -pageCount: 16 -documents: Doctrine\ORM\PersistentCollection {#95068 …} -favorites: Doctrine\ORM\PersistentCollection {#95070 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductCard {#96218 +product: App\Entity\Product\Product {#95065 #id: 10197 #code: "IEEE00003863" #attributes: Doctrine\ORM\PersistentCollection {#95082 …} #variants: Doctrine\ORM\PersistentCollection {#95084 …} #options: Doctrine\ORM\PersistentCollection {#95088 …} #associations: Doctrine\ORM\PersistentCollection {#95086 …} #createdAt: DateTime @1751038889 {#95058 : 2025-06-27 17:41:29.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95059 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95072 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96238 #locale: "en_US" #translatable: App\Entity\Product\Product {#95065} #id: 35797 #name: "IEEE 1620.1:2006 (R2012)" #slug: "ieee-1620-1-2006-r2012-ieee00003863-241849" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.<br />\n \t\t\t\t<br />\n This is a full-use standard that specifies methods for the characterization of organic transistor-based ring oscillators. The methods are applicable to all ring oscillators fabricated from organic semiconductor materials and are independent of the fabrication process.<br />\n The purpose of this project is to develop a standard methodology to characterize organic transistor based-ring oscillators and to allow reporting of their performance and associated data. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95074 …} #channels: Doctrine\ORM\PersistentCollection {#95080 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95076 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95078 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95066 …} -apiLastModifiedAt: DateTime @1754517600 {#95060 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1683151200 {#95061 : 2023-05-04 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1162940400 {#95062 : 2006-11-08 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @1339106400 {#95063 : 2012-06-08 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1680127200 {#95064 : 2023-03-30 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "1620.1" -bookCollection: "" -pageCount: 16 -documents: Doctrine\ORM\PersistentCollection {#95068 …} -favorites: Doctrine\ORM\PersistentCollection {#95070 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 112.0 MiB | 0.15 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95065 #id: 10197 #code: "IEEE00003863" #attributes: Doctrine\ORM\PersistentCollection {#95082 …} #variants: Doctrine\ORM\PersistentCollection {#95084 …} #options: Doctrine\ORM\PersistentCollection {#95088 …} #associations: Doctrine\ORM\PersistentCollection {#95086 …} #createdAt: DateTime @1751038889 {#95058 : 2025-06-27 17:41:29.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95059 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95072 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96238 #locale: "en_US" #translatable: App\Entity\Product\Product {#95065} #id: 35797 #name: "IEEE 1620.1:2006 (R2012)" #slug: "ieee-1620-1-2006-r2012-ieee00003863-241849" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.<br />\n \t\t\t\t<br />\n This is a full-use standard that specifies methods for the characterization of organic transistor-based ring oscillators. The methods are applicable to all ring oscillators fabricated from organic semiconductor materials and are independent of the fabrication process.<br />\n The purpose of this project is to develop a standard methodology to characterize organic transistor based-ring oscillators and to allow reporting of their performance and associated data. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95074 …} #channels: Doctrine\ORM\PersistentCollection {#95080 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95076 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95078 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95066 …} -apiLastModifiedAt: DateTime @1754517600 {#95060 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1683151200 {#95061 : 2023-05-04 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1162940400 {#95062 : 2006-11-08 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @1339106400 {#95063 : 2012-06-08 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1680127200 {#95064 : 2023-03-30 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "1620.1" -bookCollection: "" -pageCount: 16 -documents: Doctrine\ORM\PersistentCollection {#95068 …} -favorites: Doctrine\ORM\PersistentCollection {#95070 …} } ] |
|||
| Attributes | [ "showFullLabel" => false ] |
|||
| Component | App\Twig\Components\ProductState {#96252 +product: App\Entity\Product\Product {#95065 #id: 10197 #code: "IEEE00003863" #attributes: Doctrine\ORM\PersistentCollection {#95082 …} #variants: Doctrine\ORM\PersistentCollection {#95084 …} #options: Doctrine\ORM\PersistentCollection {#95088 …} #associations: Doctrine\ORM\PersistentCollection {#95086 …} #createdAt: DateTime @1751038889 {#95058 : 2025-06-27 17:41:29.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95059 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95072 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96238 #locale: "en_US" #translatable: App\Entity\Product\Product {#95065} #id: 35797 #name: "IEEE 1620.1:2006 (R2012)" #slug: "ieee-1620-1-2006-r2012-ieee00003863-241849" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.<br />\n \t\t\t\t<br />\n This is a full-use standard that specifies methods for the characterization of organic transistor-based ring oscillators. The methods are applicable to all ring oscillators fabricated from organic semiconductor materials and are independent of the fabrication process.<br />\n The purpose of this project is to develop a standard methodology to characterize organic transistor based-ring oscillators and to allow reporting of their performance and associated data. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95074 …} #channels: Doctrine\ORM\PersistentCollection {#95080 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95076 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95078 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95066 …} -apiLastModifiedAt: DateTime @1754517600 {#95060 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1683151200 {#95061 : 2023-05-04 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1162940400 {#95062 : 2006-11-08 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @1339106400 {#95063 : 2012-06-08 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1680127200 {#95064 : 2023-03-30 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "1620.1" -bookCollection: "" -pageCount: 16 -documents: Doctrine\ORM\PersistentCollection {#95068 …} -favorites: Doctrine\ORM\PersistentCollection {#95070 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductMostRecent | App\Twig\Components\ProductMostRecent | 112.0 MiB | 0.73 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95065 #id: 10197 #code: "IEEE00003863" #attributes: Doctrine\ORM\PersistentCollection {#95082 …} #variants: Doctrine\ORM\PersistentCollection {#95084 …} #options: Doctrine\ORM\PersistentCollection {#95088 …} #associations: Doctrine\ORM\PersistentCollection {#95086 …} #createdAt: DateTime @1751038889 {#95058 : 2025-06-27 17:41:29.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95059 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95072 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96238 #locale: "en_US" #translatable: App\Entity\Product\Product {#95065} #id: 35797 #name: "IEEE 1620.1:2006 (R2012)" #slug: "ieee-1620-1-2006-r2012-ieee00003863-241849" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.<br />\n \t\t\t\t<br />\n This is a full-use standard that specifies methods for the characterization of organic transistor-based ring oscillators. The methods are applicable to all ring oscillators fabricated from organic semiconductor materials and are independent of the fabrication process.<br />\n The purpose of this project is to develop a standard methodology to characterize organic transistor based-ring oscillators and to allow reporting of their performance and associated data. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95074 …} #channels: Doctrine\ORM\PersistentCollection {#95080 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95076 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95078 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95066 …} -apiLastModifiedAt: DateTime @1754517600 {#95060 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1683151200 {#95061 : 2023-05-04 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1162940400 {#95062 : 2006-11-08 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @1339106400 {#95063 : 2012-06-08 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1680127200 {#95064 : 2023-03-30 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "1620.1" -bookCollection: "" -pageCount: 16 -documents: Doctrine\ORM\PersistentCollection {#95068 …} -favorites: Doctrine\ORM\PersistentCollection {#95070 …} } ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductMostRecent {#96326 +product: App\Entity\Product\Product {#95065 #id: 10197 #code: "IEEE00003863" #attributes: Doctrine\ORM\PersistentCollection {#95082 …} #variants: Doctrine\ORM\PersistentCollection {#95084 …} #options: Doctrine\ORM\PersistentCollection {#95088 …} #associations: Doctrine\ORM\PersistentCollection {#95086 …} #createdAt: DateTime @1751038889 {#95058 : 2025-06-27 17:41:29.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#95059 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95072 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96238 #locale: "en_US" #translatable: App\Entity\Product\Product {#95065} #id: 35797 #name: "IEEE 1620.1:2006 (R2012)" #slug: "ieee-1620-1-2006-r2012-ieee00003863-241849" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.<br />\n \t\t\t\t<br />\n This is a full-use standard that specifies methods for the characterization of organic transistor-based ring oscillators. The methods are applicable to all ring oscillators fabricated from organic semiconductor materials and are independent of the fabrication process.<br />\n The purpose of this project is to develop a standard methodology to characterize organic transistor based-ring oscillators and to allow reporting of their performance and associated data. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95074 …} #channels: Doctrine\ORM\PersistentCollection {#95080 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95076 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95078 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95066 …} -apiLastModifiedAt: DateTime @1754517600 {#95060 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1683151200 {#95061 : 2023-05-04 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1162940400 {#95062 : 2006-11-08 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: DateTime @1339106400 {#95063 : 2012-06-08 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1680127200 {#95064 : 2023-03-30 00:00:00.0 Europe/Paris (+02:00) } -edition: null -coreDocument: "1620.1" -bookCollection: "" -pageCount: 16 -documents: Doctrine\ORM\PersistentCollection {#95068 …} -favorites: Doctrine\ORM\PersistentCollection {#95070 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductCard | App\Twig\Components\ProductCard | 112.0 MiB | 6.20 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95096 #id: 10247 #code: "IEEE00003981" #attributes: Doctrine\ORM\PersistentCollection {#95113 …} #variants: Doctrine\ORM\PersistentCollection {#95115 …} #options: Doctrine\ORM\PersistentCollection {#95119 …} #associations: Doctrine\ORM\PersistentCollection {#95117 …} #createdAt: DateTime @1751038925 {#95090 : 2025-06-27 17:42:05.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95091 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95103 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96476 #locale: "en_US" #translatable: App\Entity\Product\Product {#95096} #id: 35997 #name: "IEEE 1620:2008" #slug: "ieee-1620-2008-ieee00003981-241899" #description: """ Revision Standard - Inactive-Reserved.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95105 …} #channels: Doctrine\ORM\PersistentCollection {#95111 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95107 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95109 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95097 …} -apiLastModifiedAt: DateTime @1754517600 {#95092 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1627596000 {#95093 : 2021-07-30 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1228431600 {#95094 : 2008-12-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1573081200 {#95095 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95099 …} -favorites: Doctrine\ORM\PersistentCollection {#95101 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "secondary-lighter" "hoverType" => "border-black" ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductCard {#96456 +product: App\Entity\Product\Product {#95096 #id: 10247 #code: "IEEE00003981" #attributes: Doctrine\ORM\PersistentCollection {#95113 …} #variants: Doctrine\ORM\PersistentCollection {#95115 …} #options: Doctrine\ORM\PersistentCollection {#95119 …} #associations: Doctrine\ORM\PersistentCollection {#95117 …} #createdAt: DateTime @1751038925 {#95090 : 2025-06-27 17:42:05.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95091 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95103 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96476 #locale: "en_US" #translatable: App\Entity\Product\Product {#95096} #id: 35997 #name: "IEEE 1620:2008" #slug: "ieee-1620-2008-ieee00003981-241899" #description: """ Revision Standard - Inactive-Reserved.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95105 …} #channels: Doctrine\ORM\PersistentCollection {#95111 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95107 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95109 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95097 …} -apiLastModifiedAt: DateTime @1754517600 {#95092 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1627596000 {#95093 : 2021-07-30 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1228431600 {#95094 : 2008-12-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1573081200 {#95095 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95099 …} -favorites: Doctrine\ORM\PersistentCollection {#95101 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "secondary-lighter" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 112.0 MiB | 0.18 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95096 #id: 10247 #code: "IEEE00003981" #attributes: Doctrine\ORM\PersistentCollection {#95113 …} #variants: Doctrine\ORM\PersistentCollection {#95115 …} #options: Doctrine\ORM\PersistentCollection {#95119 …} #associations: Doctrine\ORM\PersistentCollection {#95117 …} #createdAt: DateTime @1751038925 {#95090 : 2025-06-27 17:42:05.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95091 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95103 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96476 #locale: "en_US" #translatable: App\Entity\Product\Product {#95096} #id: 35997 #name: "IEEE 1620:2008" #slug: "ieee-1620-2008-ieee00003981-241899" #description: """ Revision Standard - Inactive-Reserved.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95105 …} #channels: Doctrine\ORM\PersistentCollection {#95111 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95107 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95109 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95097 …} -apiLastModifiedAt: DateTime @1754517600 {#95092 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1627596000 {#95093 : 2021-07-30 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1228431600 {#95094 : 2008-12-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1573081200 {#95095 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95099 …} -favorites: Doctrine\ORM\PersistentCollection {#95101 …} } ] |
|||
| Attributes | [ "showFullLabel" => false ] |
|||
| Component | App\Twig\Components\ProductState {#96490 +product: App\Entity\Product\Product {#95096 #id: 10247 #code: "IEEE00003981" #attributes: Doctrine\ORM\PersistentCollection {#95113 …} #variants: Doctrine\ORM\PersistentCollection {#95115 …} #options: Doctrine\ORM\PersistentCollection {#95119 …} #associations: Doctrine\ORM\PersistentCollection {#95117 …} #createdAt: DateTime @1751038925 {#95090 : 2025-06-27 17:42:05.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95091 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95103 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96476 #locale: "en_US" #translatable: App\Entity\Product\Product {#95096} #id: 35997 #name: "IEEE 1620:2008" #slug: "ieee-1620-2008-ieee00003981-241899" #description: """ Revision Standard - Inactive-Reserved.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95105 …} #channels: Doctrine\ORM\PersistentCollection {#95111 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95107 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95109 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95097 …} -apiLastModifiedAt: DateTime @1754517600 {#95092 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1627596000 {#95093 : 2021-07-30 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1228431600 {#95094 : 2008-12-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1573081200 {#95095 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95099 …} -favorites: Doctrine\ORM\PersistentCollection {#95101 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductMostRecent | App\Twig\Components\ProductMostRecent | 112.0 MiB | 0.59 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95096 #id: 10247 #code: "IEEE00003981" #attributes: Doctrine\ORM\PersistentCollection {#95113 …} #variants: Doctrine\ORM\PersistentCollection {#95115 …} #options: Doctrine\ORM\PersistentCollection {#95119 …} #associations: Doctrine\ORM\PersistentCollection {#95117 …} #createdAt: DateTime @1751038925 {#95090 : 2025-06-27 17:42:05.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95091 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95103 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96476 #locale: "en_US" #translatable: App\Entity\Product\Product {#95096} #id: 35997 #name: "IEEE 1620:2008" #slug: "ieee-1620-2008-ieee00003981-241899" #description: """ Revision Standard - Inactive-Reserved.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95105 …} #channels: Doctrine\ORM\PersistentCollection {#95111 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95107 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95109 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95097 …} -apiLastModifiedAt: DateTime @1754517600 {#95092 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1627596000 {#95093 : 2021-07-30 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1228431600 {#95094 : 2008-12-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1573081200 {#95095 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95099 …} -favorites: Doctrine\ORM\PersistentCollection {#95101 …} } ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductMostRecent {#96564 +product: App\Entity\Product\Product {#95096 #id: 10247 #code: "IEEE00003981" #attributes: Doctrine\ORM\PersistentCollection {#95113 …} #variants: Doctrine\ORM\PersistentCollection {#95115 …} #options: Doctrine\ORM\PersistentCollection {#95119 …} #associations: Doctrine\ORM\PersistentCollection {#95117 …} #createdAt: DateTime @1751038925 {#95090 : 2025-06-27 17:42:05.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#95091 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95103 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96476 #locale: "en_US" #translatable: App\Entity\Product\Product {#95096} #id: 35997 #name: "IEEE 1620:2008" #slug: "ieee-1620-2008-ieee00003981-241899" #description: """ Revision Standard - Inactive-Reserved.<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95105 …} #channels: Doctrine\ORM\PersistentCollection {#95111 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95107 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95109 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95097 …} -apiLastModifiedAt: DateTime @1754517600 {#95092 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1627596000 {#95093 : 2021-07-30 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1228431600 {#95094 : 2008-12-05 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1573081200 {#95095 : 2019-11-07 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1620" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95099 …} -favorites: Doctrine\ORM\PersistentCollection {#95101 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductCard | App\Twig\Components\ProductCard | 112.0 MiB | 5.87 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95126 #id: 11227 #code: "IEEE00005771" #attributes: Doctrine\ORM\PersistentCollection {#95143 …} #variants: Doctrine\ORM\PersistentCollection {#95145 …} #options: Doctrine\ORM\PersistentCollection {#95149 …} #associations: Doctrine\ORM\PersistentCollection {#95147 …} #createdAt: DateTime @1751039559 {#95121 : 2025-06-27 17:52:39.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95122 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95133 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96706 #locale: "en_US" #translatable: App\Entity\Product\Product {#95126} #id: 39917 #name: "IEEE/IEC 62860:2013" #slug: "ieee-iec-62860-2013-ieee00005771-242879" #description: """ Adoption Standard - Active.<br />\n Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistors and materials" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95135 …} #channels: Doctrine\ORM\PersistentCollection {#95141 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95137 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95139 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95127 …} -apiLastModifiedAt: DateTime @1754517600 {#95123 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1632348000 {#95124 : 2021-09-23 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1375135200 {#95125 : 2013-07-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62860" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#95129 …} -favorites: Doctrine\ORM\PersistentCollection {#95131 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "white" "hoverType" => "border-black" ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductCard {#96686 +product: App\Entity\Product\Product {#95126 #id: 11227 #code: "IEEE00005771" #attributes: Doctrine\ORM\PersistentCollection {#95143 …} #variants: Doctrine\ORM\PersistentCollection {#95145 …} #options: Doctrine\ORM\PersistentCollection {#95149 …} #associations: Doctrine\ORM\PersistentCollection {#95147 …} #createdAt: DateTime @1751039559 {#95121 : 2025-06-27 17:52:39.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95122 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95133 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96706 #locale: "en_US" #translatable: App\Entity\Product\Product {#95126} #id: 39917 #name: "IEEE/IEC 62860:2013" #slug: "ieee-iec-62860-2013-ieee00005771-242879" #description: """ Adoption Standard - Active.<br />\n Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistors and materials" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95135 …} #channels: Doctrine\ORM\PersistentCollection {#95141 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95137 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95139 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95127 …} -apiLastModifiedAt: DateTime @1754517600 {#95123 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1632348000 {#95124 : 2021-09-23 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1375135200 {#95125 : 2013-07-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62860" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#95129 …} -favorites: Doctrine\ORM\PersistentCollection {#95131 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 112.0 MiB | 0.16 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95126 #id: 11227 #code: "IEEE00005771" #attributes: Doctrine\ORM\PersistentCollection {#95143 …} #variants: Doctrine\ORM\PersistentCollection {#95145 …} #options: Doctrine\ORM\PersistentCollection {#95149 …} #associations: Doctrine\ORM\PersistentCollection {#95147 …} #createdAt: DateTime @1751039559 {#95121 : 2025-06-27 17:52:39.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95122 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95133 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96706 #locale: "en_US" #translatable: App\Entity\Product\Product {#95126} #id: 39917 #name: "IEEE/IEC 62860:2013" #slug: "ieee-iec-62860-2013-ieee00005771-242879" #description: """ Adoption Standard - Active.<br />\n Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistors and materials" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95135 …} #channels: Doctrine\ORM\PersistentCollection {#95141 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95137 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95139 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95127 …} -apiLastModifiedAt: DateTime @1754517600 {#95123 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1632348000 {#95124 : 2021-09-23 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1375135200 {#95125 : 2013-07-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62860" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#95129 …} -favorites: Doctrine\ORM\PersistentCollection {#95131 …} } ] |
|||
| Attributes | [ "showFullLabel" => false ] |
|||
| Component | App\Twig\Components\ProductState {#96720 +product: App\Entity\Product\Product {#95126 #id: 11227 #code: "IEEE00005771" #attributes: Doctrine\ORM\PersistentCollection {#95143 …} #variants: Doctrine\ORM\PersistentCollection {#95145 …} #options: Doctrine\ORM\PersistentCollection {#95149 …} #associations: Doctrine\ORM\PersistentCollection {#95147 …} #createdAt: DateTime @1751039559 {#95121 : 2025-06-27 17:52:39.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95122 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95133 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96706 #locale: "en_US" #translatable: App\Entity\Product\Product {#95126} #id: 39917 #name: "IEEE/IEC 62860:2013" #slug: "ieee-iec-62860-2013-ieee00005771-242879" #description: """ Adoption Standard - Active.<br />\n Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistors and materials" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95135 …} #channels: Doctrine\ORM\PersistentCollection {#95141 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95137 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95139 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95127 …} -apiLastModifiedAt: DateTime @1754517600 {#95123 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1632348000 {#95124 : 2021-09-23 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1375135200 {#95125 : 2013-07-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62860" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#95129 …} -favorites: Doctrine\ORM\PersistentCollection {#95131 …} } +appearance: "state-active" +labels: [ "Active" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductMostRecent | App\Twig\Components\ProductMostRecent | 112.0 MiB | 0.59 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95126 #id: 11227 #code: "IEEE00005771" #attributes: Doctrine\ORM\PersistentCollection {#95143 …} #variants: Doctrine\ORM\PersistentCollection {#95145 …} #options: Doctrine\ORM\PersistentCollection {#95149 …} #associations: Doctrine\ORM\PersistentCollection {#95147 …} #createdAt: DateTime @1751039559 {#95121 : 2025-06-27 17:52:39.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95122 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95133 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96706 #locale: "en_US" #translatable: App\Entity\Product\Product {#95126} #id: 39917 #name: "IEEE/IEC 62860:2013" #slug: "ieee-iec-62860-2013-ieee00005771-242879" #description: """ Adoption Standard - Active.<br />\n Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistors and materials" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95135 …} #channels: Doctrine\ORM\PersistentCollection {#95141 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95137 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95139 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95127 …} -apiLastModifiedAt: DateTime @1754517600 {#95123 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1632348000 {#95124 : 2021-09-23 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1375135200 {#95125 : 2013-07-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62860" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#95129 …} -favorites: Doctrine\ORM\PersistentCollection {#95131 …} } ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductMostRecent {#96794 +product: App\Entity\Product\Product {#95126 #id: 11227 #code: "IEEE00005771" #attributes: Doctrine\ORM\PersistentCollection {#95143 …} #variants: Doctrine\ORM\PersistentCollection {#95145 …} #options: Doctrine\ORM\PersistentCollection {#95149 …} #associations: Doctrine\ORM\PersistentCollection {#95147 …} #createdAt: DateTime @1751039559 {#95121 : 2025-06-27 17:52:39.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95122 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95133 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96706 #locale: "en_US" #translatable: App\Entity\Product\Product {#95126} #id: 39917 #name: "IEEE/IEC 62860:2013" #slug: "ieee-iec-62860-2013-ieee00005771-242879" #description: """ Adoption Standard - Active.<br />\n Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistors and materials" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95135 …} #channels: Doctrine\ORM\PersistentCollection {#95141 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95137 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95139 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95127 …} -apiLastModifiedAt: DateTime @1754517600 {#95123 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1632348000 {#95124 : 2021-09-23 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1375135200 {#95125 : 2013-07-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62860" -bookCollection: "" -pageCount: 28 -documents: Doctrine\ORM\PersistentCollection {#95129 …} -favorites: Doctrine\ORM\PersistentCollection {#95131 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductCard | App\Twig\Components\ProductCard | 112.0 MiB | 5.88 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95156 #id: 11228 #code: "IEEE00005772" #attributes: Doctrine\ORM\PersistentCollection {#95173 …} #variants: Doctrine\ORM\PersistentCollection {#95175 …} #options: Doctrine\ORM\PersistentCollection {#95179 …} #associations: Doctrine\ORM\PersistentCollection {#95177 …} #createdAt: DateTime @1751039560 {#95151 : 2025-06-27 17:52:40.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95152 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95163 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96936 #locale: "en_US" #translatable: App\Entity\Product\Product {#95156} #id: 39921 #name: "IEEE/IEC 62860-1:2013" #slug: "ieee-iec-62860-1-2013-ieee00005772-242880" #description: """ Adoption Standard - Active.<br />\n Recommended methods and standardized reporting practices for electrical<br />\n characterization of printed and organic ring oscillators are covered. Due to the nature of printed<br />\n and organic circuits, significant measurement errors can be introduced if the electrical<br />\n characterization design-of-experiment is not properly addressed. This standard describes the<br />\n most common sources of measurement error, particularly for high-impedance electrical<br />\n measurements commonly required for printed and organic ring oscillators. This standard also<br />\n gives recommended practices in order to minimize and/or characterize the effect of measurement<br />\n artifacts and other sources of error encountered while measuring printed and organic ring<br />\n oscillators.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistorbased<br />\n ring oscillators. This standard is intended to maximize reproducibility of published results by<br />\n providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95165 …} #channels: Doctrine\ORM\PersistentCollection {#95171 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95167 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95169 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95157 …} -apiLastModifiedAt: DateTime @1754517600 {#95153 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95154 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375135200 {#95155 : 2013-07-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62860-1" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95159 …} -favorites: Doctrine\ORM\PersistentCollection {#95161 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "imageFilter" => "product_listing_thumbnail" "additionalClasses" => "h-100 border-0" "hasStretchedLink" => true "backgroundColor" => "secondary-lighter" "hoverType" => "border-black" ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductCard {#96916 +product: App\Entity\Product\Product {#95156 #id: 11228 #code: "IEEE00005772" #attributes: Doctrine\ORM\PersistentCollection {#95173 …} #variants: Doctrine\ORM\PersistentCollection {#95175 …} #options: Doctrine\ORM\PersistentCollection {#95179 …} #associations: Doctrine\ORM\PersistentCollection {#95177 …} #createdAt: DateTime @1751039560 {#95151 : 2025-06-27 17:52:40.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95152 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95163 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96936 #locale: "en_US" #translatable: App\Entity\Product\Product {#95156} #id: 39921 #name: "IEEE/IEC 62860-1:2013" #slug: "ieee-iec-62860-1-2013-ieee00005772-242880" #description: """ Adoption Standard - Active.<br />\n Recommended methods and standardized reporting practices for electrical<br />\n characterization of printed and organic ring oscillators are covered. Due to the nature of printed<br />\n and organic circuits, significant measurement errors can be introduced if the electrical<br />\n characterization design-of-experiment is not properly addressed. This standard describes the<br />\n most common sources of measurement error, particularly for high-impedance electrical<br />\n measurements commonly required for printed and organic ring oscillators. This standard also<br />\n gives recommended practices in order to minimize and/or characterize the effect of measurement<br />\n artifacts and other sources of error encountered while measuring printed and organic ring<br />\n oscillators.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistorbased<br />\n ring oscillators. This standard is intended to maximize reproducibility of published results by<br />\n providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95165 …} #channels: Doctrine\ORM\PersistentCollection {#95171 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95167 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95169 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95157 …} -apiLastModifiedAt: DateTime @1754517600 {#95153 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95154 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375135200 {#95155 : 2013-07-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62860-1" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95159 …} -favorites: Doctrine\ORM\PersistentCollection {#95161 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "h-100 border-0" +linkLabel: "" +imageFilter: "product_listing_thumbnail" +hasStretchedLink: true +backgroundColor: "secondary-lighter" +hoverType: "border-black" } |
|||
| ProductState | App\Twig\Components\ProductState | 112.0 MiB | 0.15 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95156 #id: 11228 #code: "IEEE00005772" #attributes: Doctrine\ORM\PersistentCollection {#95173 …} #variants: Doctrine\ORM\PersistentCollection {#95175 …} #options: Doctrine\ORM\PersistentCollection {#95179 …} #associations: Doctrine\ORM\PersistentCollection {#95177 …} #createdAt: DateTime @1751039560 {#95151 : 2025-06-27 17:52:40.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95152 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95163 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96936 #locale: "en_US" #translatable: App\Entity\Product\Product {#95156} #id: 39921 #name: "IEEE/IEC 62860-1:2013" #slug: "ieee-iec-62860-1-2013-ieee00005772-242880" #description: """ Adoption Standard - Active.<br />\n Recommended methods and standardized reporting practices for electrical<br />\n characterization of printed and organic ring oscillators are covered. Due to the nature of printed<br />\n and organic circuits, significant measurement errors can be introduced if the electrical<br />\n characterization design-of-experiment is not properly addressed. This standard describes the<br />\n most common sources of measurement error, particularly for high-impedance electrical<br />\n measurements commonly required for printed and organic ring oscillators. This standard also<br />\n gives recommended practices in order to minimize and/or characterize the effect of measurement<br />\n artifacts and other sources of error encountered while measuring printed and organic ring<br />\n oscillators.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistorbased<br />\n ring oscillators. This standard is intended to maximize reproducibility of published results by<br />\n providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95165 …} #channels: Doctrine\ORM\PersistentCollection {#95171 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95167 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95169 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95157 …} -apiLastModifiedAt: DateTime @1754517600 {#95153 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95154 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375135200 {#95155 : 2013-07-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62860-1" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95159 …} -favorites: Doctrine\ORM\PersistentCollection {#95161 …} } ] |
|||
| Attributes | [ "showFullLabel" => false ] |
|||
| Component | App\Twig\Components\ProductState {#96950 +product: App\Entity\Product\Product {#95156 #id: 11228 #code: "IEEE00005772" #attributes: Doctrine\ORM\PersistentCollection {#95173 …} #variants: Doctrine\ORM\PersistentCollection {#95175 …} #options: Doctrine\ORM\PersistentCollection {#95179 …} #associations: Doctrine\ORM\PersistentCollection {#95177 …} #createdAt: DateTime @1751039560 {#95151 : 2025-06-27 17:52:40.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95152 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95163 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96936 #locale: "en_US" #translatable: App\Entity\Product\Product {#95156} #id: 39921 #name: "IEEE/IEC 62860-1:2013" #slug: "ieee-iec-62860-1-2013-ieee00005772-242880" #description: """ Adoption Standard - Active.<br />\n Recommended methods and standardized reporting practices for electrical<br />\n characterization of printed and organic ring oscillators are covered. Due to the nature of printed<br />\n and organic circuits, significant measurement errors can be introduced if the electrical<br />\n characterization design-of-experiment is not properly addressed. This standard describes the<br />\n most common sources of measurement error, particularly for high-impedance electrical<br />\n measurements commonly required for printed and organic ring oscillators. This standard also<br />\n gives recommended practices in order to minimize and/or characterize the effect of measurement<br />\n artifacts and other sources of error encountered while measuring printed and organic ring<br />\n oscillators.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistorbased<br />\n ring oscillators. This standard is intended to maximize reproducibility of published results by<br />\n providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95165 …} #channels: Doctrine\ORM\PersistentCollection {#95171 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95167 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95169 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95157 …} -apiLastModifiedAt: DateTime @1754517600 {#95153 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95154 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375135200 {#95155 : 2013-07-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62860-1" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95159 …} -favorites: Doctrine\ORM\PersistentCollection {#95161 …} } +appearance: "state-active" +labels: [ "Active" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductMostRecent | App\Twig\Components\ProductMostRecent | 112.0 MiB | 0.59 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#95156 #id: 11228 #code: "IEEE00005772" #attributes: Doctrine\ORM\PersistentCollection {#95173 …} #variants: Doctrine\ORM\PersistentCollection {#95175 …} #options: Doctrine\ORM\PersistentCollection {#95179 …} #associations: Doctrine\ORM\PersistentCollection {#95177 …} #createdAt: DateTime @1751039560 {#95151 : 2025-06-27 17:52:40.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95152 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95163 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96936 #locale: "en_US" #translatable: App\Entity\Product\Product {#95156} #id: 39921 #name: "IEEE/IEC 62860-1:2013" #slug: "ieee-iec-62860-1-2013-ieee00005772-242880" #description: """ Adoption Standard - Active.<br />\n Recommended methods and standardized reporting practices for electrical<br />\n characterization of printed and organic ring oscillators are covered. Due to the nature of printed<br />\n and organic circuits, significant measurement errors can be introduced if the electrical<br />\n characterization design-of-experiment is not properly addressed. This standard describes the<br />\n most common sources of measurement error, particularly for high-impedance electrical<br />\n measurements commonly required for printed and organic ring oscillators. This standard also<br />\n gives recommended practices in order to minimize and/or characterize the effect of measurement<br />\n artifacts and other sources of error encountered while measuring printed and organic ring<br />\n oscillators.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistorbased<br />\n ring oscillators. This standard is intended to maximize reproducibility of published results by<br />\n providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95165 …} #channels: Doctrine\ORM\PersistentCollection {#95171 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95167 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95169 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95157 …} -apiLastModifiedAt: DateTime @1754517600 {#95153 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95154 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375135200 {#95155 : 2013-07-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62860-1" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95159 …} -favorites: Doctrine\ORM\PersistentCollection {#95161 …} } ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductMostRecent {#97024 +product: App\Entity\Product\Product {#95156 #id: 11228 #code: "IEEE00005772" #attributes: Doctrine\ORM\PersistentCollection {#95173 …} #variants: Doctrine\ORM\PersistentCollection {#95175 …} #options: Doctrine\ORM\PersistentCollection {#95179 …} #associations: Doctrine\ORM\PersistentCollection {#95177 …} #createdAt: DateTime @1751039560 {#95151 : 2025-06-27 17:52:40.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#95152 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#95163 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#96936 #locale: "en_US" #translatable: App\Entity\Product\Product {#95156} #id: 39921 #name: "IEEE/IEC 62860-1:2013" #slug: "ieee-iec-62860-1-2013-ieee00005772-242880" #description: """ Adoption Standard - Active.<br />\n Recommended methods and standardized reporting practices for electrical<br />\n characterization of printed and organic ring oscillators are covered. Due to the nature of printed<br />\n and organic circuits, significant measurement errors can be introduced if the electrical<br />\n characterization design-of-experiment is not properly addressed. This standard describes the<br />\n most common sources of measurement error, particularly for high-impedance electrical<br />\n measurements commonly required for printed and organic ring oscillators. This standard also<br />\n gives recommended practices in order to minimize and/or characterize the effect of measurement<br />\n artifacts and other sources of error encountered while measuring printed and organic ring<br />\n oscillators.<br />\n \t\t\t\t<br />\n This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n The purpose of this standard is to provide a method for systematically characterizing organic transistorbased<br />\n ring oscillators. This standard is intended to maximize reproducibility of published results by<br />\n providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#95165 …} #channels: Doctrine\ORM\PersistentCollection {#95171 …} #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …} #reviews: Doctrine\ORM\PersistentCollection {#95167 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#95169 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94994 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95157 …} -apiLastModifiedAt: DateTime @1754517600 {#95153 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#95154 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1375135200 {#95155 : 2013-07-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "62860-1" -bookCollection: "" -pageCount: 26 -documents: Doctrine\ORM\PersistentCollection {#95159 …} -favorites: Doctrine\ORM\PersistentCollection {#95161 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||