GET https://dev.normadoc.fr/_fragment?_path=_format%3Dhtml%26_locale%3Den_US%26_controller%3DSylius%255CPayPalPlugin%255CController%255CPayPalButtonsController%253A…

Response
200 OK
IP
216.73.217.22
Profiled on
Token
5acb6b

Forms

  • sylius_add_to_cart
    • cartItem
    • _token

sylius_add_to_cart

Form type: 
"Sylius\Bundle\CoreBundle\Form\Type\Order\AddToCartType"

Errors

This form has no errors.

Default Data

Property Value
Model Format same as normalized format
Normalized Format 
Sylius\Bundle\OrderBundle\Controller\AddToCartCommand {#113657
  -cart: App\Entity\Order\Order {#13364 …}
  -cartItem: App\Entity\Order\OrderItem {#113645
    #id: null
    #order: null
    #quantity: 1
    #unitPrice: 0
    #originalUnitPrice: 0
    #total: 0
    #immutable: false
    #units: Doctrine\Common\Collections\ArrayCollection {#113670 …}
    #unitsTotal: 0
    #adjustments: Doctrine\Common\Collections\ArrayCollection {#113669 …}
    #adjustmentsTotal: 0
    #version: 1
    #variant: App\Entity\Product\ProductVariant {#8103
      #id: 8687
      #code: "IEEE00010488PDF"
      #product: App\Entity\Product\Product {#7310
        #id: 12704
        #code: "IEEE00010488"
        #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
        #variants: Doctrine\ORM\PersistentCollection {#7743 …}
        #options: Doctrine\ORM\PersistentCollection {#7915
          #collection: Doctrine\Common\Collections\ArrayCollection {#7917 …}
          #initialized: true
          -snapshot: [ …4]
          -owner: App\Entity\Product\Product {#7310}
          -association: [ …21]
          -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …}
          -backRefFieldName: null
          -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#215611 …}
          -isDirty: false
        }
        #associations: Doctrine\ORM\PersistentCollection {#7899 …}
        #createdAt: DateTime @1751040607 {#7274
          date: 2025-06-27 18:10:07.0 Europe/Paris (+02:00)
        }
        #updatedAt: DateTime @1754608621 {#7322
          date: 2025-08-08 01:17:01.0 Europe/Paris (+02:00)
        }
        #enabled: true
        #translations: Doctrine\ORM\PersistentCollection {#7921 …}
        #translationsCache: [
          "en_US" => App\Entity\Product\ProductTranslation {#7920
            #locale: "en_US"
            #translatable: App\Entity\Product\Product {#7310}
            #id: 45825
            #name: "IEEE 1450:2023"
            #slug: "ieee-1450-2023-ieee00010488-244359"
            #description: """
              Revision Standard - Active.<br />\n
              Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.<br />\n
              \t\t\t\t<br />\n
              This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from computer-aided engineering (CAE) environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.<br />\n
              This standard addresses a need in the integrated circuit (IC) test industry to define a standard mechanism for transferring the large volumes of digital test data from the generation environment through to test. The environment today contains unique output formats of existing CAE tools, individual test environments of IC manufacturers, and proprietary IC ATE input interfaces. As each of these three arenas solves individual problems, together they have created a morass of interfaces, translators, and software environments that provide no opportunity to leverage common goals and result in much wasted efforts re-engineering solutions. As device density increases, the magnitude of test data threatens to shift the test bottleneck from the generation process to the processes necessary solely to maintain and transport this data. These two factors threaten to eliminate any productive work performed in this area unless a viable standard is defined. With a common standard for CAE and IC ATE environments, the generation, movement, and processing of this test data is greatly facilitated. This standard also allows for immediate access to test equipment supporting this standard, which benefits both ATE and IC vendors reviewing this equipment. This standard also serves as a catalyst for the development of a set of standard third party interface tools to both test and design aspects of IC device generation.
              """
            #metaKeywords: null
            #metaDescription: null
            #shortDescription: "IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data"
            -notes: "Active"
          }
        ]
        #currentLocale: "en_US"
        #currentTranslation: null
        #fallbackLocale: "en_US"
        #variantSelectionMethod: "match"
        #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
        #channels: Doctrine\ORM\PersistentCollection {#7627 …}
        #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
        #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
        #averageRating: 0.0
        #images: Doctrine\ORM\PersistentCollection {#7644 …}
        -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
        -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
        -apiLastModifiedAt: DateTime @1754517600 {#7317
          date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
        }
        -lastUpdatedAt: DateTime @1740006000 {#7292
          date: 2025-02-20 00:00:00.0 Europe/Paris (+01:00)
        }
        -author: ""
        -publishedAt: DateTime @1713909600 {#7318
          date: 2024-04-24 00:00:00.0 Europe/Paris (+02:00)
        }
        -releasedAt: null
        -confirmedAt: null
        -canceledAt: null
        -edition: null
        -coreDocument: "1450"
        -bookCollection: ""
        -pageCount: 147
        -documents: Doctrine\ORM\PersistentCollection {#7464 …}
        -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
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      #optionValues: Doctrine\ORM\PersistentCollection {#8319 …}
      #position: 0
      #createdAt: DateTime @1751041371 {#7283
        date: 2025-06-27 18:22:51.0 Europe/Paris (+02:00)
      }
      #updatedAt: DateTime @1755612046 {#8120
        date: 2025-08-19 16:00:46.0 Europe/Paris (+02:00)
      }
      #enabled: true
      #translations: Doctrine\ORM\PersistentCollection {#8263 …}
      #translationsCache: [
        "en_US" => App\Entity\Product\ProductVariantTranslation {#93368
          #locale: "en_US"
          #translatable: App\Entity\Product\ProductVariant {#8103}
          #id: 8774
          #name: null
          -shortDescription: null
          -description: null
          -notes: null
          -shippingInformation: "Instant download"
        }
      ]
      #currentLocale: "en_US"
      #currentTranslation: null
      #fallbackLocale: "en_US"
      #version: 9
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      #onHand: 0
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      #weight: 0.0
      #width: null
      #height: null
      #depth: null
      #taxCategory: Proxies\__CG__\App\Entity\Taxation\TaxCategory {#8135 …}
      #shippingCategory: null
      #channelPricings: Doctrine\ORM\PersistentCollection {#8297 …}
      #shippingRequired: true
      #images: Doctrine\ORM\PersistentCollection {#8294 …}
      -apiLastModifiedAt: DateTime @1753740000 {#8102
        date: 2025-07-29 00:00:00.0 Europe/Paris (+02:00)
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      -publishedAt: null
      -isbn: "979-8-8557-0629-1"
      -ean: "9798855706291"
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      -physicalProduct: false
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      -downloadable: true
      -drmViewerUrl: "https://online-viewer.normadoc.com/tBFEfF"
      -sellable: true
      -documents: Doctrine\ORM\PersistentCollection {#8131 …}
      -drmTokens: Doctrine\ORM\PersistentCollection {#8123 …}
      -enabledForSubscribers: true
      -currentAreaContext: null
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    #productName: null
    #variantName: null
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}
View Format same as normalized format

Submitted Data

This form was not submitted.

Passed Options

Option Passed Value Resolved Value
data 
Sylius\Bundle\OrderBundle\Controller\AddToCartCommand {#113657
  -cart: App\Entity\Order\Order {#13364 …}
  -cartItem: App\Entity\Order\OrderItem {#113645
    #id: null
    #order: null
    #quantity: 1
    #unitPrice: 0
    #originalUnitPrice: 0
    #total: 0
    #immutable: false
    #units: Doctrine\Common\Collections\ArrayCollection {#113670 …}
    #unitsTotal: 0
    #adjustments: Doctrine\Common\Collections\ArrayCollection {#113669 …}
    #adjustmentsTotal: 0
    #version: 1
    #variant: App\Entity\Product\ProductVariant {#8103
      #id: 8687
      #code: "IEEE00010488PDF"
      #product: App\Entity\Product\Product {#7310
        #id: 12704
        #code: "IEEE00010488"
        #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
        #variants: Doctrine\ORM\PersistentCollection {#7743 …}
        #options: Doctrine\ORM\PersistentCollection {#7915
          #collection: Doctrine\Common\Collections\ArrayCollection {#7917 …}
          #initialized: true
          -snapshot: [ …4]
          -owner: App\Entity\Product\Product {#7310}
          -association: [ …21]
          -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …}
          -backRefFieldName: null
          -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#215611 …}
          -isDirty: false
        }
        #associations: Doctrine\ORM\PersistentCollection {#7899 …}
        #createdAt: DateTime @1751040607 {#7274
          date: 2025-06-27 18:10:07.0 Europe/Paris (+02:00)
        }
        #updatedAt: DateTime @1754608621 {#7322
          date: 2025-08-08 01:17:01.0 Europe/Paris (+02:00)
        }
        #enabled: true
        #translations: Doctrine\ORM\PersistentCollection {#7921 …}
        #translationsCache: [
          "en_US" => App\Entity\Product\ProductTranslation {#7920
            #locale: "en_US"
            #translatable: App\Entity\Product\Product {#7310}
            #id: 45825
            #name: "IEEE 1450:2023"
            #slug: "ieee-1450-2023-ieee00010488-244359"
            #description: """
              Revision Standard - Active.<br />\n
              Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.<br />\n
              \t\t\t\t<br />\n
              This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from computer-aided engineering (CAE) environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.<br />\n
              This standard addresses a need in the integrated circuit (IC) test industry to define a standard mechanism for transferring the large volumes of digital test data from the generation environment through to test. The environment today contains unique output formats of existing CAE tools, individual test environments of IC manufacturers, and proprietary IC ATE input interfaces. As each of these three arenas solves individual problems, together they have created a morass of interfaces, translators, and software environments that provide no opportunity to leverage common goals and result in much wasted efforts re-engineering solutions. As device density increases, the magnitude of test data threatens to shift the test bottleneck from the generation process to the processes necessary solely to maintain and transport this data. These two factors threaten to eliminate any productive work performed in this area unless a viable standard is defined. With a common standard for CAE and IC ATE environments, the generation, movement, and processing of this test data is greatly facilitated. This standard also allows for immediate access to test equipment supporting this standard, which benefits both ATE and IC vendors reviewing this equipment. This standard also serves as a catalyst for the development of a set of standard third party interface tools to both test and design aspects of IC device generation.
              """
            #metaKeywords: null
            #metaDescription: null
            #shortDescription: "IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data"
            -notes: "Active"
          }
        ]
        #currentLocale: "en_US"
        #currentTranslation: null
        #fallbackLocale: "en_US"
        #variantSelectionMethod: "match"
        #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
        #channels: Doctrine\ORM\PersistentCollection {#7627 …}
        #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
        #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
        #averageRating: 0.0
        #images: Doctrine\ORM\PersistentCollection {#7644 …}
        -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
        -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
        -apiLastModifiedAt: DateTime @1754517600 {#7317
          date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
        }
        -lastUpdatedAt: DateTime @1740006000 {#7292
          date: 2025-02-20 00:00:00.0 Europe/Paris (+01:00)
        }
        -author: ""
        -publishedAt: DateTime @1713909600 {#7318
          date: 2024-04-24 00:00:00.0 Europe/Paris (+02:00)
        }
        -releasedAt: null
        -confirmedAt: null
        -canceledAt: null
        -edition: null
        -coreDocument: "1450"
        -bookCollection: ""
        -pageCount: 147
        -documents: Doctrine\ORM\PersistentCollection {#7464 …}
        -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
      }
      #optionValues: Doctrine\ORM\PersistentCollection {#8319 …}
      #position: 0
      #createdAt: DateTime @1751041371 {#7283
        date: 2025-06-27 18:22:51.0 Europe/Paris (+02:00)
      }
      #updatedAt: DateTime @1755612046 {#8120
        date: 2025-08-19 16:00:46.0 Europe/Paris (+02:00)
      }
      #enabled: true
      #translations: Doctrine\ORM\PersistentCollection {#8263 …}
      #translationsCache: [
        "en_US" => App\Entity\Product\ProductVariantTranslation {#93368
          #locale: "en_US"
          #translatable: App\Entity\Product\ProductVariant {#8103}
          #id: 8774
          #name: null
          -shortDescription: null
          -description: null
          -notes: null
          -shippingInformation: "Instant download"
        }
      ]
      #currentLocale: "en_US"
      #currentTranslation: null
      #fallbackLocale: "en_US"
      #version: 9
      #onHold: 0
      #onHand: 0
      #tracked: false
      #weight: 0.0
      #width: null
      #height: null
      #depth: null
      #taxCategory: Proxies\__CG__\App\Entity\Taxation\TaxCategory {#8135 …}
      #shippingCategory: null
      #channelPricings: Doctrine\ORM\PersistentCollection {#8297 …}
      #shippingRequired: true
      #images: Doctrine\ORM\PersistentCollection {#8294 …}
      -apiLastModifiedAt: DateTime @1753740000 {#8102
        date: 2025-07-29 00:00:00.0 Europe/Paris (+02:00)
      }
      -publishedAt: null
      -isbn: "979-8-8557-0629-1"
      -ean: "9798855706291"
      -numberOfUsers: 1
      -physicalProduct: false
      -downloadableImmediately: true
      -downloadable: true
      -drmViewerUrl: "https://online-viewer.normadoc.com/tBFEfF"
      -sellable: true
      -documents: Doctrine\ORM\PersistentCollection {#8131 …}
      -drmTokens: Doctrine\ORM\PersistentCollection {#8123 …}
      -enabledForSubscribers: true
      -currentAreaContext: null
    }
    #productName: null
    #variantName: null
  }
}
 same as passed value
product 
App\Entity\Product\Product {#7310
  #id: 12704
  #code: "IEEE00010488"
  #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
  #variants: Doctrine\ORM\PersistentCollection {#7743 …}
  #options: Doctrine\ORM\PersistentCollection {#7915
    #collection: Doctrine\Common\Collections\ArrayCollection {#7917 …}
    #initialized: true
    -snapshot: [ …4]
    -owner: App\Entity\Product\Product {#7310}
    -association: [ …21]
    -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …}
    -backRefFieldName: null
    -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#215611 …}
    -isDirty: false
  }
  #associations: Doctrine\ORM\PersistentCollection {#7899 …}
  #createdAt: DateTime @1751040607 {#7274
    date: 2025-06-27 18:10:07.0 Europe/Paris (+02:00)
  }
  #updatedAt: DateTime @1754608621 {#7322
    date: 2025-08-08 01:17:01.0 Europe/Paris (+02:00)
  }
  #enabled: true
  #translations: Doctrine\ORM\PersistentCollection {#7921 …}
  #translationsCache: [
    "en_US" => App\Entity\Product\ProductTranslation {#7920
      #locale: "en_US"
      #translatable: App\Entity\Product\Product {#7310}
      #id: 45825
      #name: "IEEE 1450:2023"
      #slug: "ieee-1450-2023-ieee00010488-244359"
      #description: """
        Revision Standard - Active.<br />\n
        Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.<br />\n
        \t\t\t\t<br />\n
        This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from computer-aided engineering (CAE) environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.<br />\n
        This standard addresses a need in the integrated circuit (IC) test industry to define a standard mechanism for transferring the large volumes of digital test data from the generation environment through to test. The environment today contains unique output formats of existing CAE tools, individual test environments of IC manufacturers, and proprietary IC ATE input interfaces. As each of these three arenas solves individual problems, together they have created a morass of interfaces, translators, and software environments that provide no opportunity to leverage common goals and result in much wasted efforts re-engineering solutions. As device density increases, the magnitude of test data threatens to shift the test bottleneck from the generation process to the processes necessary solely to maintain and transport this data. These two factors threaten to eliminate any productive work performed in this area unless a viable standard is defined. With a common standard for CAE and IC ATE environments, the generation, movement, and processing of this test data is greatly facilitated. This standard also allows for immediate access to test equipment supporting this standard, which benefits both ATE and IC vendors reviewing this equipment. This standard also serves as a catalyst for the development of a set of standard third party interface tools to both test and design aspects of IC device generation.
        """
      #metaKeywords: null
      #metaDescription: null
      #shortDescription: "IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data"
      -notes: "Active"
    }
  ]
  #currentLocale: "en_US"
  #currentTranslation: null
  #fallbackLocale: "en_US"
  #variantSelectionMethod: "match"
  #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
  #channels: Doctrine\ORM\PersistentCollection {#7627 …}
  #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
  #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
  #averageRating: 0.0
  #images: Doctrine\ORM\PersistentCollection {#7644 …}
  -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
  -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
  -apiLastModifiedAt: DateTime @1754517600 {#7317
    date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
  }
  -lastUpdatedAt: DateTime @1740006000 {#7292
    date: 2025-02-20 00:00:00.0 Europe/Paris (+01:00)
  }
  -author: ""
  -publishedAt: DateTime @1713909600 {#7318
    date: 2024-04-24 00:00:00.0 Europe/Paris (+02:00)
  }
  -releasedAt: null
  -confirmedAt: null
  -canceledAt: null
  -edition: null
  -coreDocument: "1450"
  -bookCollection: ""
  -pageCount: 147
  -documents: Doctrine\ORM\PersistentCollection {#7464 …}
  -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
}
 same as passed value

Resolved Options

Option Value
action 
""
allow_extra_fields 
false
allow_file_upload 
false
attr 
[]
attr_translation_parameters 
[]
auto_initialize 
true
block_name 
null
block_prefix 
null
by_reference 
true
compound 
true
constraints 
[]
csrf_field_name 
"_token"
csrf_message 
"The CSRF token is invalid. Please try to resubmit the form."
csrf_protection 
true
csrf_token_id 
null
csrf_token_manager 
Symfony\Component\Security\Csrf\CsrfTokenManager {#113677
  -generator: Symfony\Component\Security\Csrf\TokenGenerator\UriSafeTokenGenerator {#113678 …}
  -storage: Symfony\Component\Security\Csrf\TokenStorage\SessionTokenStorage {#113679 …}
  -namespace: Closure() {#113681 …}
}
data 
Sylius\Bundle\OrderBundle\Controller\AddToCartCommand {#113657
  -cart: App\Entity\Order\Order {#13364 …}
  -cartItem: App\Entity\Order\OrderItem {#113645
    #id: null
    #order: null
    #quantity: 1
    #unitPrice: 0
    #originalUnitPrice: 0
    #total: 0
    #immutable: false
    #units: Doctrine\Common\Collections\ArrayCollection {#113670 …}
    #unitsTotal: 0
    #adjustments: Doctrine\Common\Collections\ArrayCollection {#113669 …}
    #adjustmentsTotal: 0
    #version: 1
    #variant: App\Entity\Product\ProductVariant {#8103
      #id: 8687
      #code: "IEEE00010488PDF"
      #product: App\Entity\Product\Product {#7310
        #id: 12704
        #code: "IEEE00010488"
        #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
        #variants: Doctrine\ORM\PersistentCollection {#7743 …}
        #options: Doctrine\ORM\PersistentCollection {#7915
          #collection: Doctrine\Common\Collections\ArrayCollection {#7917 …}
          #initialized: true
          -snapshot: [ …4]
          -owner: App\Entity\Product\Product {#7310}
          -association: [ …21]
          -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …}
          -backRefFieldName: null
          -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#215611 …}
          -isDirty: false
        }
        #associations: Doctrine\ORM\PersistentCollection {#7899 …}
        #createdAt: DateTime @1751040607 {#7274
          date: 2025-06-27 18:10:07.0 Europe/Paris (+02:00)
        }
        #updatedAt: DateTime @1754608621 {#7322
          date: 2025-08-08 01:17:01.0 Europe/Paris (+02:00)
        }
        #enabled: true
        #translations: Doctrine\ORM\PersistentCollection {#7921 …}
        #translationsCache: [
          "en_US" => App\Entity\Product\ProductTranslation {#7920
            #locale: "en_US"
            #translatable: App\Entity\Product\Product {#7310}
            #id: 45825
            #name: "IEEE 1450:2023"
            #slug: "ieee-1450-2023-ieee00010488-244359"
            #description: """
              Revision Standard - Active.<br />\n
              Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.<br />\n
              \t\t\t\t<br />\n
              This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from computer-aided engineering (CAE) environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.<br />\n
              This standard addresses a need in the integrated circuit (IC) test industry to define a standard mechanism for transferring the large volumes of digital test data from the generation environment through to test. The environment today contains unique output formats of existing CAE tools, individual test environments of IC manufacturers, and proprietary IC ATE input interfaces. As each of these three arenas solves individual problems, together they have created a morass of interfaces, translators, and software environments that provide no opportunity to leverage common goals and result in much wasted efforts re-engineering solutions. As device density increases, the magnitude of test data threatens to shift the test bottleneck from the generation process to the processes necessary solely to maintain and transport this data. These two factors threaten to eliminate any productive work performed in this area unless a viable standard is defined. With a common standard for CAE and IC ATE environments, the generation, movement, and processing of this test data is greatly facilitated. This standard also allows for immediate access to test equipment supporting this standard, which benefits both ATE and IC vendors reviewing this equipment. This standard also serves as a catalyst for the development of a set of standard third party interface tools to both test and design aspects of IC device generation.
              """
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