Components
4
Twig Components
17
Render Count
20
ms
Render Time
798.0
MiB
Memory Usage
Components
| Name | Metadata | Render Count | Render Time |
|---|---|---|---|
| ProductState |
"App\Twig\Components\ProductState"components/ProductState.html.twig |
7 | 1.63ms |
| ProductMostRecent |
"App\Twig\Components\ProductMostRecent"components/ProductMostRecent.html.twig |
7 | 4.70ms |
| ProductCard |
"App\Twig\Components\ProductCard"components/ProductCard.html.twig |
2 | 15.32ms |
| ProductType |
"App\Twig\Components\ProductType"components/ProductType.html.twig |
1 | 0.22ms |
Render calls
| ProductState | App\Twig\Components\ProductState | 796.0 MiB | 0.49 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7311 #id: 10635 #code: "IEEE00004743" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751039187 {#7274 : 2025-06-27 17:46:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 37549 #name: "IEEE 1241:2010" #slug: "ieee-1241-2010-ieee00004743-242287" #description: """ Revision Standard - Inactive-Reserved.<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n \t\t\t\t<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618437600 {#7292 : 2021-04-15 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1294959600 {#7318 : 2011-01-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#7316 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 139 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#92877 +product: App\Entity\Product\Product {#7311 #id: 10635 #code: "IEEE00004743" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751039187 {#7274 : 2025-06-27 17:46:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 37549 #name: "IEEE 1241:2010" #slug: "ieee-1241-2010-ieee00004743-242287" #description: """ Revision Standard - Inactive-Reserved.<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n \t\t\t\t<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618437600 {#7292 : 2021-04-15 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1294959600 {#7318 : 2011-01-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#7316 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 139 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductType | App\Twig\Components\ProductType | 796.0 MiB | 0.22 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7311 #id: 10635 #code: "IEEE00004743" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751039187 {#7274 : 2025-06-27 17:46:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 37549 #name: "IEEE 1241:2010" #slug: "ieee-1241-2010-ieee00004743-242287" #description: """ Revision Standard - Inactive-Reserved.<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n \t\t\t\t<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618437600 {#7292 : 2021-04-15 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1294959600 {#7318 : 2011-01-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#7316 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 139 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductType {#93057 +product: App\Entity\Product\Product {#7311 #id: 10635 #code: "IEEE00004743" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751039187 {#7274 : 2025-06-27 17:46:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 37549 #name: "IEEE 1241:2010" #slug: "ieee-1241-2010-ieee00004743-242287" #description: """ Revision Standard - Inactive-Reserved.<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n \t\t\t\t<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618437600 {#7292 : 2021-04-15 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1294959600 {#7318 : 2011-01-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#7316 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 139 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } +label: "Standard" -typeAttributeCode: "type" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 796.0 MiB | 0.74 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7311 #id: 10635 #code: "IEEE00004743" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751039187 {#7274 : 2025-06-27 17:46:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 37549 #name: "IEEE 1241:2010" #slug: "ieee-1241-2010-ieee00004743-242287" #description: """ Revision Standard - Inactive-Reserved.<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n \t\t\t\t<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618437600 {#7292 : 2021-04-15 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1294959600 {#7318 : 2011-01-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#7316 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 139 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#93132 +product: App\Entity\Product\Product {#7311 #id: 10635 #code: "IEEE00004743" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751039187 {#7274 : 2025-06-27 17:46:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 37549 #name: "IEEE 1241:2010" #slug: "ieee-1241-2010-ieee00004743-242287" #description: """ Revision Standard - Inactive-Reserved.<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n \t\t\t\t<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618437600 {#7292 : 2021-04-15 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1294959600 {#7318 : 2011-01-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#7316 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 139 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductState | App\Twig\Components\ProductState | 796.0 MiB | 0.22 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#106707 #id: 9229 #code: "IEEE00001889" #attributes: Doctrine\ORM\PersistentCollection {#106690 …} #variants: Doctrine\ORM\PersistentCollection {#106687 …} #options: Doctrine\ORM\PersistentCollection {#106683 …} #associations: Doctrine\ORM\PersistentCollection {#106685 …} #createdAt: DateTime @1751038079 {#106715 : 2025-06-27 17:27:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106688 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106701 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106740 #locale: "en_US" #translatable: App\Entity\Product\Product {#106707} #id: 31925 #name: "IEEE 1241:2000" #slug: "ieee-1241-2000-ieee00001889-240881" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n \t\t\t\t<br />\n Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n To provide standard terminology for specifying the performance of A/D converters, and to provide test methods for measuring the performance. The standard will be for general purpose applications and will not focus on highly specialized applications such as video recording. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106698 …} #channels: Doctrine\ORM\PersistentCollection {#106692 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#106696 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106694 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106708 …} -apiLastModifiedAt: DateTime @1754517600 {#106675 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106714 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @993160800 {#106713 : 2001-06-22 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 98 -documents: Doctrine\ORM\PersistentCollection {#106705 …} -favorites: Doctrine\ORM\PersistentCollection {#106703 …} } "showFullLabel" => "true" ] |
|||
| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#106723 +product: App\Entity\Product\Product {#106707 #id: 9229 #code: "IEEE00001889" #attributes: Doctrine\ORM\PersistentCollection {#106690 …} #variants: Doctrine\ORM\PersistentCollection {#106687 …} #options: Doctrine\ORM\PersistentCollection {#106683 …} #associations: Doctrine\ORM\PersistentCollection {#106685 …} #createdAt: DateTime @1751038079 {#106715 : 2025-06-27 17:27:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106688 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106701 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106740 #locale: "en_US" #translatable: App\Entity\Product\Product {#106707} #id: 31925 #name: "IEEE 1241:2000" #slug: "ieee-1241-2000-ieee00001889-240881" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n \t\t\t\t<br />\n Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n To provide standard terminology for specifying the performance of A/D converters, and to provide test methods for measuring the performance. The standard will be for general purpose applications and will not focus on highly specialized applications such as video recording. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106698 …} #channels: Doctrine\ORM\PersistentCollection {#106692 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#106696 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106694 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106708 …} -apiLastModifiedAt: DateTime @1754517600 {#106675 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106714 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @993160800 {#106713 : 2001-06-22 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 98 -documents: Doctrine\ORM\PersistentCollection {#106705 …} -favorites: Doctrine\ORM\PersistentCollection {#106703 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 796.0 MiB | 0.77 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#106707 #id: 9229 #code: "IEEE00001889" #attributes: Doctrine\ORM\PersistentCollection {#106690 …} #variants: Doctrine\ORM\PersistentCollection {#106687 …} #options: Doctrine\ORM\PersistentCollection {#106683 …} #associations: Doctrine\ORM\PersistentCollection {#106685 …} #createdAt: DateTime @1751038079 {#106715 : 2025-06-27 17:27:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106688 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106701 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106740 #locale: "en_US" #translatable: App\Entity\Product\Product {#106707} #id: 31925 #name: "IEEE 1241:2000" #slug: "ieee-1241-2000-ieee00001889-240881" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n \t\t\t\t<br />\n Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n To provide standard terminology for specifying the performance of A/D converters, and to provide test methods for measuring the performance. The standard will be for general purpose applications and will not focus on highly specialized applications such as video recording. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106698 …} #channels: Doctrine\ORM\PersistentCollection {#106692 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#106696 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106694 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106708 …} -apiLastModifiedAt: DateTime @1754517600 {#106675 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106714 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @993160800 {#106713 : 2001-06-22 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 98 -documents: Doctrine\ORM\PersistentCollection {#106705 …} -favorites: Doctrine\ORM\PersistentCollection {#106703 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#106822 +product: App\Entity\Product\Product {#106707 #id: 9229 #code: "IEEE00001889" #attributes: Doctrine\ORM\PersistentCollection {#106690 …} #variants: Doctrine\ORM\PersistentCollection {#106687 …} #options: Doctrine\ORM\PersistentCollection {#106683 …} #associations: Doctrine\ORM\PersistentCollection {#106685 …} #createdAt: DateTime @1751038079 {#106715 : 2025-06-27 17:27:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106688 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106701 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106740 #locale: "en_US" #translatable: App\Entity\Product\Product {#106707} #id: 31925 #name: "IEEE 1241:2000" #slug: "ieee-1241-2000-ieee00001889-240881" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n \t\t\t\t<br />\n Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n To provide standard terminology for specifying the performance of A/D converters, and to provide test methods for measuring the performance. The standard will be for general purpose applications and will not focus on highly specialized applications such as video recording. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106698 …} #channels: Doctrine\ORM\PersistentCollection {#106692 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#106696 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106694 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106708 …} -apiLastModifiedAt: DateTime @1754517600 {#106675 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106714 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @993160800 {#106713 : 2001-06-22 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 98 -documents: Doctrine\ORM\PersistentCollection {#106705 …} -favorites: Doctrine\ORM\PersistentCollection {#106703 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductState | App\Twig\Components\ProductState | 796.0 MiB | 0.20 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#93569 #id: 11933 #code: "IEEE00006797" #attributes: Doctrine\ORM\PersistentCollection {#93551 …} #variants: Doctrine\ORM\PersistentCollection {#93548 …} #options: Doctrine\ORM\PersistentCollection {#93544 …} #associations: Doctrine\ORM\PersistentCollection {#93546 …} #createdAt: DateTime @1751040085 {#93577 : 2025-06-27 18:01:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#93556 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#93562 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#93597 #locale: "en_US" #translatable: App\Entity\Product\Product {#93569} #id: 42741 #name: "IEEE 1241:2023" #slug: "ieee-1241-2023-ieee00006797-243585" #description: """ Revision Standard - Active.<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n \t\t\t\t<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.4, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. The reader should note that this standard has many similarities to IEEE Std 1057™. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#93560 …} #channels: Doctrine\ORM\PersistentCollection {#93553 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#93558 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#93555 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93570 …} -apiLastModifiedAt: DateTime @1754517600 {#93540 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1703718000 {#93576 : 2023-12-28 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1696543200 {#93575 : 2023-10-06 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 143 -documents: Doctrine\ORM\PersistentCollection {#93566 …} -favorites: Doctrine\ORM\PersistentCollection {#93564 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#113437 +product: App\Entity\Product\Product {#93569 #id: 11933 #code: "IEEE00006797" #attributes: Doctrine\ORM\PersistentCollection {#93551 …} #variants: Doctrine\ORM\PersistentCollection {#93548 …} #options: Doctrine\ORM\PersistentCollection {#93544 …} #associations: Doctrine\ORM\PersistentCollection {#93546 …} #createdAt: DateTime @1751040085 {#93577 : 2025-06-27 18:01:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#93556 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#93562 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#93597 #locale: "en_US" #translatable: App\Entity\Product\Product {#93569} #id: 42741 #name: "IEEE 1241:2023" #slug: "ieee-1241-2023-ieee00006797-243585" #description: """ Revision Standard - Active.<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n \t\t\t\t<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.4, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. The reader should note that this standard has many similarities to IEEE Std 1057™. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#93560 …} #channels: Doctrine\ORM\PersistentCollection {#93553 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#93558 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#93555 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93570 …} -apiLastModifiedAt: DateTime @1754517600 {#93540 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1703718000 {#93576 : 2023-12-28 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1696543200 {#93575 : 2023-10-06 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 143 -documents: Doctrine\ORM\PersistentCollection {#93566 …} -favorites: Doctrine\ORM\PersistentCollection {#93564 …} } +appearance: "state-active" +labels: [ "Active" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 796.0 MiB | 0.71 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#93569 #id: 11933 #code: "IEEE00006797" #attributes: Doctrine\ORM\PersistentCollection {#93551 …} #variants: Doctrine\ORM\PersistentCollection {#93548 …} #options: Doctrine\ORM\PersistentCollection {#93544 …} #associations: Doctrine\ORM\PersistentCollection {#93546 …} #createdAt: DateTime @1751040085 {#93577 : 2025-06-27 18:01:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#93556 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#93562 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#93597 #locale: "en_US" #translatable: App\Entity\Product\Product {#93569} #id: 42741 #name: "IEEE 1241:2023" #slug: "ieee-1241-2023-ieee00006797-243585" #description: """ Revision Standard - Active.<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n \t\t\t\t<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.4, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. The reader should note that this standard has many similarities to IEEE Std 1057™. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#93560 …} #channels: Doctrine\ORM\PersistentCollection {#93553 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#93558 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#93555 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93570 …} -apiLastModifiedAt: DateTime @1754517600 {#93540 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1703718000 {#93576 : 2023-12-28 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1696543200 {#93575 : 2023-10-06 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 143 -documents: Doctrine\ORM\PersistentCollection {#93566 …} -favorites: Doctrine\ORM\PersistentCollection {#93564 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#113504 +product: App\Entity\Product\Product {#93569 #id: 11933 #code: "IEEE00006797" #attributes: Doctrine\ORM\PersistentCollection {#93551 …} #variants: Doctrine\ORM\PersistentCollection {#93548 …} #options: Doctrine\ORM\PersistentCollection {#93544 …} #associations: Doctrine\ORM\PersistentCollection {#93546 …} #createdAt: DateTime @1751040085 {#93577 : 2025-06-27 18:01:25.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#93556 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#93562 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#93597 #locale: "en_US" #translatable: App\Entity\Product\Product {#93569} #id: 42741 #name: "IEEE 1241:2023" #slug: "ieee-1241-2023-ieee00006797-243585" #description: """ Revision Standard - Active.<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n \t\t\t\t<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.4, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. The reader should note that this standard has many similarities to IEEE Std 1057™. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#93560 …} #channels: Doctrine\ORM\PersistentCollection {#93553 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#93558 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#93555 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#93570 …} -apiLastModifiedAt: DateTime @1754517600 {#93540 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1703718000 {#93576 : 2023-12-28 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1696543200 {#93575 : 2023-10-06 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 143 -documents: Doctrine\ORM\PersistentCollection {#93566 …} -favorites: Doctrine\ORM\PersistentCollection {#93564 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductState | App\Twig\Components\ProductState | 796.0 MiB | 0.18 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#7311 #id: 10635 #code: "IEEE00004743" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751039187 {#7274 : 2025-06-27 17:46:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 37549 #name: "IEEE 1241:2010" #slug: "ieee-1241-2010-ieee00004743-242287" #description: """ Revision Standard - Inactive-Reserved.<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n \t\t\t\t<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618437600 {#7292 : 2021-04-15 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1294959600 {#7318 : 2011-01-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#7316 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 139 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#113569 +product: App\Entity\Product\Product {#7311 #id: 10635 #code: "IEEE00004743" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751039187 {#7274 : 2025-06-27 17:46:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 37549 #name: "IEEE 1241:2010" #slug: "ieee-1241-2010-ieee00004743-242287" #description: """ Revision Standard - Inactive-Reserved.<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n \t\t\t\t<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618437600 {#7292 : 2021-04-15 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1294959600 {#7318 : 2011-01-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#7316 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 139 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 796.0 MiB | 0.60 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7311 #id: 10635 #code: "IEEE00004743" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751039187 {#7274 : 2025-06-27 17:46:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 37549 #name: "IEEE 1241:2010" #slug: "ieee-1241-2010-ieee00004743-242287" #description: """ Revision Standard - Inactive-Reserved.<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n \t\t\t\t<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618437600 {#7292 : 2021-04-15 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1294959600 {#7318 : 2011-01-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#7316 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 139 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#113596 +product: App\Entity\Product\Product {#7311 #id: 10635 #code: "IEEE00004743" #attributes: Doctrine\ORM\PersistentCollection {#7701 …} #variants: Doctrine\ORM\PersistentCollection {#7744 …} #options: Doctrine\ORM\PersistentCollection {#7916 …} #associations: Doctrine\ORM\PersistentCollection {#7900 …} #createdAt: DateTime @1751039187 {#7274 : 2025-06-27 17:46:27.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#7322 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7922 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7921 #locale: "en_US" #translatable: App\Entity\Product\Product {#7311} #id: 37549 #name: "IEEE 1241:2010" #slug: "ieee-1241-2010-ieee00004743-242287" #description: """ Revision Standard - Inactive-Reserved.<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n \t\t\t\t<br />\n The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …} #channels: Doctrine\ORM\PersistentCollection {#7628 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#7613 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7645 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1618437600 {#7292 : 2021-04-15 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1294959600 {#7318 : 2011-01-14 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @1616626800 {#7316 : 2021-03-25 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 139 -documents: Doctrine\ORM\PersistentCollection {#7465 …} -favorites: Doctrine\ORM\PersistentCollection {#7500 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductState | App\Twig\Components\ProductState | 796.0 MiB | 0.18 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#106707 #id: 9229 #code: "IEEE00001889" #attributes: Doctrine\ORM\PersistentCollection {#106690 …} #variants: Doctrine\ORM\PersistentCollection {#106687 …} #options: Doctrine\ORM\PersistentCollection {#106683 …} #associations: Doctrine\ORM\PersistentCollection {#106685 …} #createdAt: DateTime @1751038079 {#106715 : 2025-06-27 17:27:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106688 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106701 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106740 #locale: "en_US" #translatable: App\Entity\Product\Product {#106707} #id: 31925 #name: "IEEE 1241:2000" #slug: "ieee-1241-2000-ieee00001889-240881" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n \t\t\t\t<br />\n Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n To provide standard terminology for specifying the performance of A/D converters, and to provide test methods for measuring the performance. The standard will be for general purpose applications and will not focus on highly specialized applications such as video recording. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106698 …} #channels: Doctrine\ORM\PersistentCollection {#106692 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#106696 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106694 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106708 …} -apiLastModifiedAt: DateTime @1754517600 {#106675 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106714 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @993160800 {#106713 : 2001-06-22 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 98 -documents: Doctrine\ORM\PersistentCollection {#106705 …} -favorites: Doctrine\ORM\PersistentCollection {#106703 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#113660 +product: App\Entity\Product\Product {#106707 #id: 9229 #code: "IEEE00001889" #attributes: Doctrine\ORM\PersistentCollection {#106690 …} #variants: Doctrine\ORM\PersistentCollection {#106687 …} #options: Doctrine\ORM\PersistentCollection {#106683 …} #associations: Doctrine\ORM\PersistentCollection {#106685 …} #createdAt: DateTime @1751038079 {#106715 : 2025-06-27 17:27:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106688 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106701 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106740 #locale: "en_US" #translatable: App\Entity\Product\Product {#106707} #id: 31925 #name: "IEEE 1241:2000" #slug: "ieee-1241-2000-ieee00001889-240881" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n \t\t\t\t<br />\n Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n To provide standard terminology for specifying the performance of A/D converters, and to provide test methods for measuring the performance. The standard will be for general purpose applications and will not focus on highly specialized applications such as video recording. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106698 …} #channels: Doctrine\ORM\PersistentCollection {#106692 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#106696 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106694 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106708 …} -apiLastModifiedAt: DateTime @1754517600 {#106675 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106714 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @993160800 {#106713 : 2001-06-22 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 98 -documents: Doctrine\ORM\PersistentCollection {#106705 …} -favorites: Doctrine\ORM\PersistentCollection {#106703 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductMostRecent | App\Twig\Components\ProductMostRecent | 796.0 MiB | 0.61 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#106707 #id: 9229 #code: "IEEE00001889" #attributes: Doctrine\ORM\PersistentCollection {#106690 …} #variants: Doctrine\ORM\PersistentCollection {#106687 …} #options: Doctrine\ORM\PersistentCollection {#106683 …} #associations: Doctrine\ORM\PersistentCollection {#106685 …} #createdAt: DateTime @1751038079 {#106715 : 2025-06-27 17:27:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106688 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106701 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106740 #locale: "en_US" #translatable: App\Entity\Product\Product {#106707} #id: 31925 #name: "IEEE 1241:2000" #slug: "ieee-1241-2000-ieee00001889-240881" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n \t\t\t\t<br />\n Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n To provide standard terminology for specifying the performance of A/D converters, and to provide test methods for measuring the performance. The standard will be for general purpose applications and will not focus on highly specialized applications such as video recording. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106698 …} #channels: Doctrine\ORM\PersistentCollection {#106692 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#106696 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106694 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106708 …} -apiLastModifiedAt: DateTime @1754517600 {#106675 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106714 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @993160800 {#106713 : 2001-06-22 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 98 -documents: Doctrine\ORM\PersistentCollection {#106705 …} -favorites: Doctrine\ORM\PersistentCollection {#106703 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#113687 +product: App\Entity\Product\Product {#106707 #id: 9229 #code: "IEEE00001889" #attributes: Doctrine\ORM\PersistentCollection {#106690 …} #variants: Doctrine\ORM\PersistentCollection {#106687 …} #options: Doctrine\ORM\PersistentCollection {#106683 …} #associations: Doctrine\ORM\PersistentCollection {#106685 …} #createdAt: DateTime @1751038079 {#106715 : 2025-06-27 17:27:59.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#106688 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#106701 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#106740 #locale: "en_US" #translatable: App\Entity\Product\Product {#106707} #id: 31925 #name: "IEEE 1241:2000" #slug: "ieee-1241-2000-ieee00001889-240881" #description: """ New IEEE Standard - Superseded.<br />\n IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n \t\t\t\t<br />\n Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n To provide standard terminology for specifying the performance of A/D converters, and to provide test methods for measuring the performance. The standard will be for general purpose applications and will not focus on highly specialized applications such as video recording. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#106698 …} #channels: Doctrine\ORM\PersistentCollection {#106692 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#106696 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#106694 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#106708 …} -apiLastModifiedAt: DateTime @1754517600 {#106675 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#106714 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @993160800 {#106713 : 2001-06-22 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1241" -bookCollection: "" -pageCount: 98 -documents: Doctrine\ORM\PersistentCollection {#106705 …} -favorites: Doctrine\ORM\PersistentCollection {#106703 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 798.0 MiB | 8.62 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#135202 #id: 8767 #code: "IEEE00000985" #attributes: Doctrine\ORM\PersistentCollection {#135185 …} #variants: Doctrine\ORM\PersistentCollection {#135183 …} #options: Doctrine\ORM\PersistentCollection {#135178 …} #associations: Doctrine\ORM\PersistentCollection {#135180 …} #createdAt: DateTime @1751037693 {#135175 : 2025-06-27 17:21:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#135210 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#135196 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#135349 #locale: "en_US" #translatable: App\Entity\Product\Product {#135202} #id: 30077 #name: "IEEE 746:1984" #slug: "ieee-746-1984-ieee00000985-240419" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard describes methods for measuring there performance of uniformly coded alnalog-to-digital (A/D) coverters and digital-to-analog (D/A) converters for pulse code modulation (PSM) television video signals. Excluded are A/D and D/A converters that employ nonlinear processes for bit reduction television circuits, as for example, sub-Nyquist encoding, differential PCM, transform coders, etc. This standard is intended primarily for CCIR System M, 525-line/60-field television circuits. The performance to be measured should be relevant to the subjective quality of the television picture. Measurements not related to the quality of the video signal are excluded from this standard. Where possible, television type test signals are used to accommodate clamping circuits in the converters.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Performance Measurements of A/D and D/A Converters for PCM Television Video Circuits" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#135194 …} #channels: Doctrine\ORM\PersistentCollection {#135187 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#135191 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#135189 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135204 …} -apiLastModifiedAt: DateTime @1754517600 {#135161 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#135209 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @466642800 {#135168 : 1984-10-15 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @700959600 {#135181 : 1992-03-19 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "746" -bookCollection: "" -pageCount: 30 -documents: Doctrine\ORM\PersistentCollection {#135200 …} -favorites: Doctrine\ORM\PersistentCollection {#135198 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "additionalClasses" => "product__teaser--with-grey-border" "hasStretchedLink" => true "hoverType" => "shadow" "linkLabel" => "See more" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#135282 +product: App\Entity\Product\Product {#135202 #id: 8767 #code: "IEEE00000985" #attributes: Doctrine\ORM\PersistentCollection {#135185 …} #variants: Doctrine\ORM\PersistentCollection {#135183 …} #options: Doctrine\ORM\PersistentCollection {#135178 …} #associations: Doctrine\ORM\PersistentCollection {#135180 …} #createdAt: DateTime @1751037693 {#135175 : 2025-06-27 17:21:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#135210 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#135196 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#135349 #locale: "en_US" #translatable: App\Entity\Product\Product {#135202} #id: 30077 #name: "IEEE 746:1984" #slug: "ieee-746-1984-ieee00000985-240419" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard describes methods for measuring there performance of uniformly coded alnalog-to-digital (A/D) coverters and digital-to-analog (D/A) converters for pulse code modulation (PSM) television video signals. Excluded are A/D and D/A converters that employ nonlinear processes for bit reduction television circuits, as for example, sub-Nyquist encoding, differential PCM, transform coders, etc. This standard is intended primarily for CCIR System M, 525-line/60-field television circuits. The performance to be measured should be relevant to the subjective quality of the television picture. Measurements not related to the quality of the video signal are excluded from this standard. Where possible, television type test signals are used to accommodate clamping circuits in the converters.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Performance Measurements of A/D and D/A Converters for PCM Television Video Circuits" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#135194 …} #channels: Doctrine\ORM\PersistentCollection {#135187 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#135191 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#135189 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135204 …} -apiLastModifiedAt: DateTime @1754517600 {#135161 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#135209 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @466642800 {#135168 : 1984-10-15 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @700959600 {#135181 : 1992-03-19 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "746" -bookCollection: "" -pageCount: 30 -documents: Doctrine\ORM\PersistentCollection {#135200 …} -favorites: Doctrine\ORM\PersistentCollection {#135198 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "product__teaser--with-grey-border" +linkLabel: "See more" +imageFilter: "product_thumbnail_teaser" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "shadow" } |
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| ProductState | App\Twig\Components\ProductState | 798.0 MiB | 0.19 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#135202 #id: 8767 #code: "IEEE00000985" #attributes: Doctrine\ORM\PersistentCollection {#135185 …} #variants: Doctrine\ORM\PersistentCollection {#135183 …} #options: Doctrine\ORM\PersistentCollection {#135178 …} #associations: Doctrine\ORM\PersistentCollection {#135180 …} #createdAt: DateTime @1751037693 {#135175 : 2025-06-27 17:21:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#135210 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#135196 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#135349 #locale: "en_US" #translatable: App\Entity\Product\Product {#135202} #id: 30077 #name: "IEEE 746:1984" #slug: "ieee-746-1984-ieee00000985-240419" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard describes methods for measuring there performance of uniformly coded alnalog-to-digital (A/D) coverters and digital-to-analog (D/A) converters for pulse code modulation (PSM) television video signals. Excluded are A/D and D/A converters that employ nonlinear processes for bit reduction television circuits, as for example, sub-Nyquist encoding, differential PCM, transform coders, etc. This standard is intended primarily for CCIR System M, 525-line/60-field television circuits. The performance to be measured should be relevant to the subjective quality of the television picture. Measurements not related to the quality of the video signal are excluded from this standard. Where possible, television type test signals are used to accommodate clamping circuits in the converters.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Performance Measurements of A/D and D/A Converters for PCM Television Video Circuits" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#135194 …} #channels: Doctrine\ORM\PersistentCollection {#135187 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#135191 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#135189 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135204 …} -apiLastModifiedAt: DateTime @1754517600 {#135161 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#135209 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @466642800 {#135168 : 1984-10-15 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @700959600 {#135181 : 1992-03-19 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "746" -bookCollection: "" -pageCount: 30 -documents: Doctrine\ORM\PersistentCollection {#135200 …} -favorites: Doctrine\ORM\PersistentCollection {#135198 …} } ] |
|||
| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#135353 +product: App\Entity\Product\Product {#135202 #id: 8767 #code: "IEEE00000985" #attributes: Doctrine\ORM\PersistentCollection {#135185 …} #variants: Doctrine\ORM\PersistentCollection {#135183 …} #options: Doctrine\ORM\PersistentCollection {#135178 …} #associations: Doctrine\ORM\PersistentCollection {#135180 …} #createdAt: DateTime @1751037693 {#135175 : 2025-06-27 17:21:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#135210 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#135196 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#135349 #locale: "en_US" #translatable: App\Entity\Product\Product {#135202} #id: 30077 #name: "IEEE 746:1984" #slug: "ieee-746-1984-ieee00000985-240419" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard describes methods for measuring there performance of uniformly coded alnalog-to-digital (A/D) coverters and digital-to-analog (D/A) converters for pulse code modulation (PSM) television video signals. Excluded are A/D and D/A converters that employ nonlinear processes for bit reduction television circuits, as for example, sub-Nyquist encoding, differential PCM, transform coders, etc. This standard is intended primarily for CCIR System M, 525-line/60-field television circuits. The performance to be measured should be relevant to the subjective quality of the television picture. Measurements not related to the quality of the video signal are excluded from this standard. Where possible, television type test signals are used to accommodate clamping circuits in the converters.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Performance Measurements of A/D and D/A Converters for PCM Television Video Circuits" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#135194 …} #channels: Doctrine\ORM\PersistentCollection {#135187 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#135191 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#135189 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135204 …} -apiLastModifiedAt: DateTime @1754517600 {#135161 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#135209 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @466642800 {#135168 : 1984-10-15 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @700959600 {#135181 : 1992-03-19 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "746" -bookCollection: "" -pageCount: 30 -documents: Doctrine\ORM\PersistentCollection {#135200 …} -favorites: Doctrine\ORM\PersistentCollection {#135198 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 798.0 MiB | 0.67 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#135202 #id: 8767 #code: "IEEE00000985" #attributes: Doctrine\ORM\PersistentCollection {#135185 …} #variants: Doctrine\ORM\PersistentCollection {#135183 …} #options: Doctrine\ORM\PersistentCollection {#135178 …} #associations: Doctrine\ORM\PersistentCollection {#135180 …} #createdAt: DateTime @1751037693 {#135175 : 2025-06-27 17:21:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#135210 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#135196 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#135349 #locale: "en_US" #translatable: App\Entity\Product\Product {#135202} #id: 30077 #name: "IEEE 746:1984" #slug: "ieee-746-1984-ieee00000985-240419" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard describes methods for measuring there performance of uniformly coded alnalog-to-digital (A/D) coverters and digital-to-analog (D/A) converters for pulse code modulation (PSM) television video signals. Excluded are A/D and D/A converters that employ nonlinear processes for bit reduction television circuits, as for example, sub-Nyquist encoding, differential PCM, transform coders, etc. This standard is intended primarily for CCIR System M, 525-line/60-field television circuits. The performance to be measured should be relevant to the subjective quality of the television picture. Measurements not related to the quality of the video signal are excluded from this standard. Where possible, television type test signals are used to accommodate clamping circuits in the converters.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Performance Measurements of A/D and D/A Converters for PCM Television Video Circuits" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#135194 …} #channels: Doctrine\ORM\PersistentCollection {#135187 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#135191 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#135189 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135204 …} -apiLastModifiedAt: DateTime @1754517600 {#135161 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#135209 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @466642800 {#135168 : 1984-10-15 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @700959600 {#135181 : 1992-03-19 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "746" -bookCollection: "" -pageCount: 30 -documents: Doctrine\ORM\PersistentCollection {#135200 …} -favorites: Doctrine\ORM\PersistentCollection {#135198 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#135431 +product: App\Entity\Product\Product {#135202 #id: 8767 #code: "IEEE00000985" #attributes: Doctrine\ORM\PersistentCollection {#135185 …} #variants: Doctrine\ORM\PersistentCollection {#135183 …} #options: Doctrine\ORM\PersistentCollection {#135178 …} #associations: Doctrine\ORM\PersistentCollection {#135180 …} #createdAt: DateTime @1751037693 {#135175 : 2025-06-27 17:21:33.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754606304 {#135210 : 2025-08-08 00:38:24.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#135196 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#135349 #locale: "en_US" #translatable: App\Entity\Product\Product {#135202} #id: 30077 #name: "IEEE 746:1984" #slug: "ieee-746-1984-ieee00000985-240419" #description: """ New IEEE Standard - Inactive-Withdrawn.<br />\n This standard describes methods for measuring there performance of uniformly coded alnalog-to-digital (A/D) coverters and digital-to-analog (D/A) converters for pulse code modulation (PSM) television video signals. Excluded are A/D and D/A converters that employ nonlinear processes for bit reduction television circuits, as for example, sub-Nyquist encoding, differential PCM, transform coders, etc. This standard is intended primarily for CCIR System M, 525-line/60-field television circuits. The performance to be measured should be relevant to the subjective quality of the television picture. Measurements not related to the quality of the video signal are excluded from this standard. Where possible, television type test signals are used to accommodate clamping circuits in the converters.<br />\n \t\t\t\t """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Performance Measurements of A/D and D/A Converters for PCM Television Video Circuits" -notes: "Inactive-Withdrawn" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#135194 …} #channels: Doctrine\ORM\PersistentCollection {#135187 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#135191 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#135189 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135204 …} -apiLastModifiedAt: DateTime @1754517600 {#135161 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#135209 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @466642800 {#135168 : 1984-10-15 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: DateTime @700959600 {#135181 : 1992-03-19 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "746" -bookCollection: "" -pageCount: 30 -documents: Doctrine\ORM\PersistentCollection {#135200 …} -favorites: Doctrine\ORM\PersistentCollection {#135198 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductCard | App\Twig\Components\ProductCard | 798.0 MiB | 6.70 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#135170 #id: 10005 #code: "IEEE00003430" #attributes: Doctrine\ORM\PersistentCollection {#135241 …} #variants: Doctrine\ORM\PersistentCollection {#135248 …} #options: Doctrine\ORM\PersistentCollection {#135242 …} #associations: Doctrine\ORM\PersistentCollection {#135251 …} #createdAt: DateTime @1751038738 {#135176 : 2025-06-27 17:38:58.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#135174 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#135163 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#135558 #locale: "en_US" #translatable: App\Entity\Product\Product {#135170} #id: 35029 #name: "IEEE 181:2003" #slug: "ieee-181-2003-ieee00003430-241657" #description: """ Revision Standard - Superseded.<br />\n This standard presents approximately 100 terms, and their definitions, for accurately and<br />\n precisely describing the waveforms of pulse signals and the process of measuring pulse signals.<br />\n Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform<br />\n aberrations. These analysis algorithms are applicable to two-state waveforms having one or two<br />\n transitions connecting these states. Compound waveform analysis is accomplished by decomposing<br />\n the compound waveform into its constituent two-state single-transition waveforms.<br />\n \t\t\t\t<br />\n The scope of this revised PAR is limited to revising the title of P181. See item 18 for additional explanatory notes. The scope of the previous PAR is: 'Revise and combine IEEE standards 181-1977 and 194-1977 into a single standard which define terms pertaining to transitions, pulses and related signals and defines procedures for estimating their parameters.'<br />\n The purpose of this revised PAR is to change the title (see Item 18). The purpose of the previous PAR is: 'IEEE Standards 181-1977 and 194-1977 have been withdrawn. Manufacturers and users of pulse generators, waveform recorders, and high-speed digital circuits require clear concise terms for effective communication.' """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard on Transitions, Pulses, and Related Waveforms" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#135244 …} #channels: Doctrine\ORM\PersistentCollection {#135254 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#135226 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#135260 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135169 …} -apiLastModifiedAt: DateTime @1754517600 {#135173 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#135172 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1057874400 {#135171 : 2003-07-11 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "181" -bookCollection: "" -pageCount: 60 -documents: Doctrine\ORM\PersistentCollection {#135166 …} -favorites: Doctrine\ORM\PersistentCollection {#135164 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "additionalClasses" => "product__teaser--with-grey-border" "hasStretchedLink" => true "hoverType" => "shadow" "linkLabel" => "See more" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#135519 +product: App\Entity\Product\Product {#135170 #id: 10005 #code: "IEEE00003430" #attributes: Doctrine\ORM\PersistentCollection {#135241 …} #variants: Doctrine\ORM\PersistentCollection {#135248 …} #options: Doctrine\ORM\PersistentCollection {#135242 …} #associations: Doctrine\ORM\PersistentCollection {#135251 …} #createdAt: DateTime @1751038738 {#135176 : 2025-06-27 17:38:58.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#135174 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#135163 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#135558 #locale: "en_US" #translatable: App\Entity\Product\Product {#135170} #id: 35029 #name: "IEEE 181:2003" #slug: "ieee-181-2003-ieee00003430-241657" #description: """ Revision Standard - Superseded.<br />\n This standard presents approximately 100 terms, and their definitions, for accurately and<br />\n precisely describing the waveforms of pulse signals and the process of measuring pulse signals.<br />\n Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform<br />\n aberrations. These analysis algorithms are applicable to two-state waveforms having one or two<br />\n transitions connecting these states. Compound waveform analysis is accomplished by decomposing<br />\n the compound waveform into its constituent two-state single-transition waveforms.<br />\n \t\t\t\t<br />\n The scope of this revised PAR is limited to revising the title of P181. See item 18 for additional explanatory notes. The scope of the previous PAR is: 'Revise and combine IEEE standards 181-1977 and 194-1977 into a single standard which define terms pertaining to transitions, pulses and related signals and defines procedures for estimating their parameters.'<br />\n The purpose of this revised PAR is to change the title (see Item 18). The purpose of the previous PAR is: 'IEEE Standards 181-1977 and 194-1977 have been withdrawn. Manufacturers and users of pulse generators, waveform recorders, and high-speed digital circuits require clear concise terms for effective communication.' """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard on Transitions, Pulses, and Related Waveforms" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#135244 …} #channels: Doctrine\ORM\PersistentCollection {#135254 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#135226 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#135260 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135169 …} -apiLastModifiedAt: DateTime @1754517600 {#135173 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#135172 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1057874400 {#135171 : 2003-07-11 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "181" -bookCollection: "" -pageCount: 60 -documents: Doctrine\ORM\PersistentCollection {#135166 …} -favorites: Doctrine\ORM\PersistentCollection {#135164 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "product__teaser--with-grey-border" +linkLabel: "See more" +imageFilter: "product_thumbnail_teaser" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "shadow" } |
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| ProductState | App\Twig\Components\ProductState | 798.0 MiB | 0.18 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#135170 #id: 10005 #code: "IEEE00003430" #attributes: Doctrine\ORM\PersistentCollection {#135241 …} #variants: Doctrine\ORM\PersistentCollection {#135248 …} #options: Doctrine\ORM\PersistentCollection {#135242 …} #associations: Doctrine\ORM\PersistentCollection {#135251 …} #createdAt: DateTime @1751038738 {#135176 : 2025-06-27 17:38:58.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#135174 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#135163 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#135558 #locale: "en_US" #translatable: App\Entity\Product\Product {#135170} #id: 35029 #name: "IEEE 181:2003" #slug: "ieee-181-2003-ieee00003430-241657" #description: """ Revision Standard - Superseded.<br />\n This standard presents approximately 100 terms, and their definitions, for accurately and<br />\n precisely describing the waveforms of pulse signals and the process of measuring pulse signals.<br />\n Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform<br />\n aberrations. These analysis algorithms are applicable to two-state waveforms having one or two<br />\n transitions connecting these states. Compound waveform analysis is accomplished by decomposing<br />\n the compound waveform into its constituent two-state single-transition waveforms.<br />\n \t\t\t\t<br />\n The scope of this revised PAR is limited to revising the title of P181. See item 18 for additional explanatory notes. The scope of the previous PAR is: 'Revise and combine IEEE standards 181-1977 and 194-1977 into a single standard which define terms pertaining to transitions, pulses and related signals and defines procedures for estimating their parameters.'<br />\n The purpose of this revised PAR is to change the title (see Item 18). The purpose of the previous PAR is: 'IEEE Standards 181-1977 and 194-1977 have been withdrawn. Manufacturers and users of pulse generators, waveform recorders, and high-speed digital circuits require clear concise terms for effective communication.' """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard on Transitions, Pulses, and Related Waveforms" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#135244 …} #channels: Doctrine\ORM\PersistentCollection {#135254 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#135226 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#135260 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135169 …} -apiLastModifiedAt: DateTime @1754517600 {#135173 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#135172 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1057874400 {#135171 : 2003-07-11 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "181" -bookCollection: "" -pageCount: 60 -documents: Doctrine\ORM\PersistentCollection {#135166 …} -favorites: Doctrine\ORM\PersistentCollection {#135164 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#135565 +product: App\Entity\Product\Product {#135170 #id: 10005 #code: "IEEE00003430" #attributes: Doctrine\ORM\PersistentCollection {#135241 …} #variants: Doctrine\ORM\PersistentCollection {#135248 …} #options: Doctrine\ORM\PersistentCollection {#135242 …} #associations: Doctrine\ORM\PersistentCollection {#135251 …} #createdAt: DateTime @1751038738 {#135176 : 2025-06-27 17:38:58.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#135174 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#135163 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#135558 #locale: "en_US" #translatable: App\Entity\Product\Product {#135170} #id: 35029 #name: "IEEE 181:2003" #slug: "ieee-181-2003-ieee00003430-241657" #description: """ Revision Standard - Superseded.<br />\n This standard presents approximately 100 terms, and their definitions, for accurately and<br />\n precisely describing the waveforms of pulse signals and the process of measuring pulse signals.<br />\n Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform<br />\n aberrations. These analysis algorithms are applicable to two-state waveforms having one or two<br />\n transitions connecting these states. Compound waveform analysis is accomplished by decomposing<br />\n the compound waveform into its constituent two-state single-transition waveforms.<br />\n \t\t\t\t<br />\n The scope of this revised PAR is limited to revising the title of P181. See item 18 for additional explanatory notes. The scope of the previous PAR is: 'Revise and combine IEEE standards 181-1977 and 194-1977 into a single standard which define terms pertaining to transitions, pulses and related signals and defines procedures for estimating their parameters.'<br />\n The purpose of this revised PAR is to change the title (see Item 18). The purpose of the previous PAR is: 'IEEE Standards 181-1977 and 194-1977 have been withdrawn. Manufacturers and users of pulse generators, waveform recorders, and high-speed digital circuits require clear concise terms for effective communication.' """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard on Transitions, Pulses, and Related Waveforms" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#135244 …} #channels: Doctrine\ORM\PersistentCollection {#135254 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#135226 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#135260 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135169 …} -apiLastModifiedAt: DateTime @1754517600 {#135173 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#135172 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1057874400 {#135171 : 2003-07-11 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "181" -bookCollection: "" -pageCount: 60 -documents: Doctrine\ORM\PersistentCollection {#135166 …} -favorites: Doctrine\ORM\PersistentCollection {#135164 …} } +appearance: "state-suspended" +labels: [ "Superseded" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 798.0 MiB | 0.60 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#135170 #id: 10005 #code: "IEEE00003430" #attributes: Doctrine\ORM\PersistentCollection {#135241 …} #variants: Doctrine\ORM\PersistentCollection {#135248 …} #options: Doctrine\ORM\PersistentCollection {#135242 …} #associations: Doctrine\ORM\PersistentCollection {#135251 …} #createdAt: DateTime @1751038738 {#135176 : 2025-06-27 17:38:58.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#135174 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#135163 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#135558 #locale: "en_US" #translatable: App\Entity\Product\Product {#135170} #id: 35029 #name: "IEEE 181:2003" #slug: "ieee-181-2003-ieee00003430-241657" #description: """ Revision Standard - Superseded.<br />\n This standard presents approximately 100 terms, and their definitions, for accurately and<br />\n precisely describing the waveforms of pulse signals and the process of measuring pulse signals.<br />\n Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform<br />\n aberrations. These analysis algorithms are applicable to two-state waveforms having one or two<br />\n transitions connecting these states. Compound waveform analysis is accomplished by decomposing<br />\n the compound waveform into its constituent two-state single-transition waveforms.<br />\n \t\t\t\t<br />\n The scope of this revised PAR is limited to revising the title of P181. See item 18 for additional explanatory notes. The scope of the previous PAR is: 'Revise and combine IEEE standards 181-1977 and 194-1977 into a single standard which define terms pertaining to transitions, pulses and related signals and defines procedures for estimating their parameters.'<br />\n The purpose of this revised PAR is to change the title (see Item 18). The purpose of the previous PAR is: 'IEEE Standards 181-1977 and 194-1977 have been withdrawn. Manufacturers and users of pulse generators, waveform recorders, and high-speed digital circuits require clear concise terms for effective communication.' """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard on Transitions, Pulses, and Related Waveforms" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#135244 …} #channels: Doctrine\ORM\PersistentCollection {#135254 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#135226 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#135260 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135169 …} -apiLastModifiedAt: DateTime @1754517600 {#135173 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#135172 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1057874400 {#135171 : 2003-07-11 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "181" -bookCollection: "" -pageCount: 60 -documents: Doctrine\ORM\PersistentCollection {#135166 …} -favorites: Doctrine\ORM\PersistentCollection {#135164 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#135642 +product: App\Entity\Product\Product {#135170 #id: 10005 #code: "IEEE00003430" #attributes: Doctrine\ORM\PersistentCollection {#135241 …} #variants: Doctrine\ORM\PersistentCollection {#135248 …} #options: Doctrine\ORM\PersistentCollection {#135242 …} #associations: Doctrine\ORM\PersistentCollection {#135251 …} #createdAt: DateTime @1751038738 {#135176 : 2025-06-27 17:38:58.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607004 {#135174 : 2025-08-08 00:50:04.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#135163 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#135558 #locale: "en_US" #translatable: App\Entity\Product\Product {#135170} #id: 35029 #name: "IEEE 181:2003" #slug: "ieee-181-2003-ieee00003430-241657" #description: """ Revision Standard - Superseded.<br />\n This standard presents approximately 100 terms, and their definitions, for accurately and<br />\n precisely describing the waveforms of pulse signals and the process of measuring pulse signals.<br />\n Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform<br />\n aberrations. These analysis algorithms are applicable to two-state waveforms having one or two<br />\n transitions connecting these states. Compound waveform analysis is accomplished by decomposing<br />\n the compound waveform into its constituent two-state single-transition waveforms.<br />\n \t\t\t\t<br />\n The scope of this revised PAR is limited to revising the title of P181. See item 18 for additional explanatory notes. The scope of the previous PAR is: 'Revise and combine IEEE standards 181-1977 and 194-1977 into a single standard which define terms pertaining to transitions, pulses and related signals and defines procedures for estimating their parameters.'<br />\n The purpose of this revised PAR is to change the title (see Item 18). The purpose of the previous PAR is: 'IEEE Standards 181-1977 and 194-1977 have been withdrawn. Manufacturers and users of pulse generators, waveform recorders, and high-speed digital circuits require clear concise terms for effective communication.' """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard on Transitions, Pulses, and Related Waveforms" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#135244 …} #channels: Doctrine\ORM\PersistentCollection {#135254 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …} #reviews: Doctrine\ORM\PersistentCollection {#135226 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#135260 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#135169 …} -apiLastModifiedAt: DateTime @1754517600 {#135173 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1578006000 {#135172 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1057874400 {#135171 : 2003-07-11 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "181" -bookCollection: "" -pageCount: 60 -documents: Doctrine\ORM\PersistentCollection {#135166 …} -favorites: Doctrine\ORM\PersistentCollection {#135164 …} } +label: "Historical" +icon: "historical" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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