GET https://dev.normadoc.fr/products/ieee-1241-2023-ieee00006797-243585

Response
200 OK
IP
216.73.216.149
Profiled on
Token
494436

Components

4 Twig Components
14 Render Count
13 ms Render Time
102.0 MiB Memory Usage

Components

Name Metadata Render Count Render Time
ProductState 
"App\Twig\Components\ProductState"
components/ProductState.html.twig 		6 1.33ms
ProductMostRecent 
"App\Twig\Components\ProductMostRecent"
components/ProductMostRecent.html.twig 		6 4.55ms
ProductType 
"App\Twig\Components\ProductType"
components/ProductType.html.twig 		1 0.22ms
ProductCard 
"App\Twig\Components\ProductCard"
components/ProductCard.html.twig 		1 8.16ms

Render calls

ProductState App\Twig\Components\ProductState 68.0 MiB 0.30 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7310
    #id: 11933
    #code: "IEEE00006797"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751040085 {#7274
      date: 2025-06-27 18:01:25.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 42741
        #name: "IEEE 1241:2023"
        #slug: "ieee-1241-2023-ieee00006797-243585"
        #description: """
          Revision Standard - Active.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.4, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. The reader should note that this standard has many similarities to IEEE Std 1057™. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1703718000 {#7292
      date: 2023-12-28 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1696543200 {#7318
      date: 2023-10-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 143
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#93054
  +product: App\Entity\Product\Product {#7310
    #id: 11933
    #code: "IEEE00006797"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751040085 {#7274
      date: 2025-06-27 18:01:25.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 42741
        #name: "IEEE 1241:2023"
        #slug: "ieee-1241-2023-ieee00006797-243585"
        #description: """
          Revision Standard - Active.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.4, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. The reader should note that this standard has many similarities to IEEE Std 1057™. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1703718000 {#7292
      date: 2023-12-28 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1696543200 {#7318
      date: 2023-10-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 143
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +appearance: "state-active"
  +labels: [
    "Active"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductType App\Twig\Components\ProductType 68.0 MiB 0.22 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7310
    #id: 11933
    #code: "IEEE00006797"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751040085 {#7274
      date: 2025-06-27 18:01:25.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 42741
        #name: "IEEE 1241:2023"
        #slug: "ieee-1241-2023-ieee00006797-243585"
        #description: """
          Revision Standard - Active.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.4, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. The reader should note that this standard has many similarities to IEEE Std 1057™. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1703718000 {#7292
      date: 2023-12-28 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1696543200 {#7318
      date: 2023-10-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 143
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductType {#93234
  +product: App\Entity\Product\Product {#7310
    #id: 11933
    #code: "IEEE00006797"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751040085 {#7274
      date: 2025-06-27 18:01:25.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 42741
        #name: "IEEE 1241:2023"
        #slug: "ieee-1241-2023-ieee00006797-243585"
        #description: """
          Revision Standard - Active.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.4, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. The reader should note that this standard has many similarities to IEEE Std 1057™. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1703718000 {#7292
      date: 2023-12-28 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1696543200 {#7318
      date: 2023-10-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 143
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +label: "Standard"
  -typeAttributeCode: "type"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 68.0 MiB 0.65 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7310
    #id: 11933
    #code: "IEEE00006797"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751040085 {#7274
      date: 2025-06-27 18:01:25.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 42741
        #name: "IEEE 1241:2023"
        #slug: "ieee-1241-2023-ieee00006797-243585"
        #description: """
          Revision Standard - Active.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.4, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. The reader should note that this standard has many similarities to IEEE Std 1057™. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1703718000 {#7292
      date: 2023-12-28 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1696543200 {#7318
      date: 2023-10-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 143
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#93309
  +product: App\Entity\Product\Product {#7310
    #id: 11933
    #code: "IEEE00006797"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751040085 {#7274
      date: 2025-06-27 18:01:25.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 42741
        #name: "IEEE 1241:2023"
        #slug: "ieee-1241-2023-ieee00006797-243585"
        #description: """
          Revision Standard - Active.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.4, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. The reader should note that this standard has many similarities to IEEE Std 1057™. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1703718000 {#7292
      date: 2023-12-28 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1696543200 {#7318
      date: 2023-10-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 143
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 74.0 MiB 0.26 ms
Input props 
[
  "product" => App\Entity\Product\Product {#100317
    #id: 10635
    #code: "IEEE00004743"
    #attributes: Doctrine\ORM\PersistentCollection {#100298 …}
    #variants: Doctrine\ORM\PersistentCollection {#100295 …}
    #options: Doctrine\ORM\PersistentCollection {#100291 …}
    #associations: Doctrine\ORM\PersistentCollection {#100293 …}
    #createdAt: DateTime @1751039187 {#100324
      date: 2025-06-27 17:46:27.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#100297
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100308 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100335
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100317}
        #id: 37549
        #name: "IEEE 1241:2010"
        #slug: "ieee-1241-2010-ieee00004743-242287"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n
          Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n
          errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100306 …}
    #channels: Doctrine\ORM\PersistentCollection {#100300 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100304 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100302 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100315 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100284
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618437600 {#100323
      date: 2021-04-15 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1294959600 {#100322
      date: 2011-01-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#100316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#100313 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100311 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#100371
  +product: App\Entity\Product\Product {#100317
    #id: 10635
    #code: "IEEE00004743"
    #attributes: Doctrine\ORM\PersistentCollection {#100298 …}
    #variants: Doctrine\ORM\PersistentCollection {#100295 …}
    #options: Doctrine\ORM\PersistentCollection {#100291 …}
    #associations: Doctrine\ORM\PersistentCollection {#100293 …}
    #createdAt: DateTime @1751039187 {#100324
      date: 2025-06-27 17:46:27.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#100297
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100308 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100335
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100317}
        #id: 37549
        #name: "IEEE 1241:2010"
        #slug: "ieee-1241-2010-ieee00004743-242287"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n
          Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n
          errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100306 …}
    #channels: Doctrine\ORM\PersistentCollection {#100300 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100304 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100302 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100315 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100284
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618437600 {#100323
      date: 2021-04-15 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1294959600 {#100322
      date: 2011-01-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#100316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#100313 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100311 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 74.0 MiB 1.03 ms
Input props 
[
  "product" => App\Entity\Product\Product {#100317
    #id: 10635
    #code: "IEEE00004743"
    #attributes: Doctrine\ORM\PersistentCollection {#100298 …}
    #variants: Doctrine\ORM\PersistentCollection {#100295 …}
    #options: Doctrine\ORM\PersistentCollection {#100291 …}
    #associations: Doctrine\ORM\PersistentCollection {#100293 …}
    #createdAt: DateTime @1751039187 {#100324
      date: 2025-06-27 17:46:27.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#100297
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100308 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100335
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100317}
        #id: 37549
        #name: "IEEE 1241:2010"
        #slug: "ieee-1241-2010-ieee00004743-242287"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n
          Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n
          errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100306 …}
    #channels: Doctrine\ORM\PersistentCollection {#100300 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100304 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100302 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100315 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100284
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618437600 {#100323
      date: 2021-04-15 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1294959600 {#100322
      date: 2011-01-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#100316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#100313 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100311 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#100438
  +product: App\Entity\Product\Product {#100317
    #id: 10635
    #code: "IEEE00004743"
    #attributes: Doctrine\ORM\PersistentCollection {#100298 …}
    #variants: Doctrine\ORM\PersistentCollection {#100295 …}
    #options: Doctrine\ORM\PersistentCollection {#100291 …}
    #associations: Doctrine\ORM\PersistentCollection {#100293 …}
    #createdAt: DateTime @1751039187 {#100324
      date: 2025-06-27 17:46:27.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#100297
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100308 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100335
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100317}
        #id: 37549
        #name: "IEEE 1241:2010"
        #slug: "ieee-1241-2010-ieee00004743-242287"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n
          Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n
          errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100306 …}
    #channels: Doctrine\ORM\PersistentCollection {#100300 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100304 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100302 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100315 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100284
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618437600 {#100323
      date: 2021-04-15 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1294959600 {#100322
      date: 2011-01-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#100316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#100313 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100311 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 80.0 MiB 0.20 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7310
    #id: 11933
    #code: "IEEE00006797"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751040085 {#7274
      date: 2025-06-27 18:01:25.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 42741
        #name: "IEEE 1241:2023"
        #slug: "ieee-1241-2023-ieee00006797-243585"
        #description: """
          Revision Standard - Active.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.4, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. The reader should note that this standard has many similarities to IEEE Std 1057™. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1703718000 {#7292
      date: 2023-12-28 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1696543200 {#7318
      date: 2023-10-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 143
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#107057
  +product: App\Entity\Product\Product {#7310
    #id: 11933
    #code: "IEEE00006797"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751040085 {#7274
      date: 2025-06-27 18:01:25.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 42741
        #name: "IEEE 1241:2023"
        #slug: "ieee-1241-2023-ieee00006797-243585"
        #description: """
          Revision Standard - Active.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.4, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. The reader should note that this standard has many similarities to IEEE Std 1057™. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1703718000 {#7292
      date: 2023-12-28 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1696543200 {#7318
      date: 2023-10-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 143
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +appearance: "state-active"
  +labels: [
    "Active"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 80.0 MiB 0.75 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7310
    #id: 11933
    #code: "IEEE00006797"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751040085 {#7274
      date: 2025-06-27 18:01:25.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 42741
        #name: "IEEE 1241:2023"
        #slug: "ieee-1241-2023-ieee00006797-243585"
        #description: """
          Revision Standard - Active.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.4, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. The reader should note that this standard has many similarities to IEEE Std 1057™. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1703718000 {#7292
      date: 2023-12-28 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1696543200 {#7318
      date: 2023-10-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 143
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#107099
  +product: App\Entity\Product\Product {#7310
    #id: 11933
    #code: "IEEE00006797"
    #attributes: Doctrine\ORM\PersistentCollection {#7700 …}
    #variants: Doctrine\ORM\PersistentCollection {#7743 …}
    #options: Doctrine\ORM\PersistentCollection {#7915 …}
    #associations: Doctrine\ORM\PersistentCollection {#7899 …}
    #createdAt: DateTime @1751040085 {#7274
      date: 2025-06-27 18:01:25.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#7322
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7921 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7920
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7310}
        #id: 42741
        #name: "IEEE 1241:2023"
        #slug: "ieee-1241-2023-ieee00006797-243585"
        #description: """
          Revision Standard - Active.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.4, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. The reader should note that this standard has many similarities to IEEE Std 1057™. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …}
    #channels: Doctrine\ORM\PersistentCollection {#7627 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7612 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7644 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1703718000 {#7292
      date: 2023-12-28 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1696543200 {#7318
      date: 2023-10-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 143
    -documents: Doctrine\ORM\PersistentCollection {#7464 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7499 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 80.0 MiB 0.18 ms
Input props 
[
  "product" => App\Entity\Product\Product {#100317
    #id: 10635
    #code: "IEEE00004743"
    #attributes: Doctrine\ORM\PersistentCollection {#100298 …}
    #variants: Doctrine\ORM\PersistentCollection {#100295 …}
    #options: Doctrine\ORM\PersistentCollection {#100291 …}
    #associations: Doctrine\ORM\PersistentCollection {#100293 …}
    #createdAt: DateTime @1751039187 {#100324
      date: 2025-06-27 17:46:27.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#100297
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100308 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100335
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100317}
        #id: 37549
        #name: "IEEE 1241:2010"
        #slug: "ieee-1241-2010-ieee00004743-242287"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n
          Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n
          errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100306 …}
    #channels: Doctrine\ORM\PersistentCollection {#100300 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100304 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100302 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100315 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100284
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618437600 {#100323
      date: 2021-04-15 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1294959600 {#100322
      date: 2011-01-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#100316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#100313 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100311 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#107164
  +product: App\Entity\Product\Product {#100317
    #id: 10635
    #code: "IEEE00004743"
    #attributes: Doctrine\ORM\PersistentCollection {#100298 …}
    #variants: Doctrine\ORM\PersistentCollection {#100295 …}
    #options: Doctrine\ORM\PersistentCollection {#100291 …}
    #associations: Doctrine\ORM\PersistentCollection {#100293 …}
    #createdAt: DateTime @1751039187 {#100324
      date: 2025-06-27 17:46:27.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#100297
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100308 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100335
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100317}
        #id: 37549
        #name: "IEEE 1241:2010"
        #slug: "ieee-1241-2010-ieee00004743-242287"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n
          Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n
          errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100306 …}
    #channels: Doctrine\ORM\PersistentCollection {#100300 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100304 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100302 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100315 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100284
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618437600 {#100323
      date: 2021-04-15 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1294959600 {#100322
      date: 2011-01-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#100316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#100313 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100311 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 80.0 MiB 0.65 ms
Input props 
[
  "product" => App\Entity\Product\Product {#100317
    #id: 10635
    #code: "IEEE00004743"
    #attributes: Doctrine\ORM\PersistentCollection {#100298 …}
    #variants: Doctrine\ORM\PersistentCollection {#100295 …}
    #options: Doctrine\ORM\PersistentCollection {#100291 …}
    #associations: Doctrine\ORM\PersistentCollection {#100293 …}
    #createdAt: DateTime @1751039187 {#100324
      date: 2025-06-27 17:46:27.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#100297
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100308 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100335
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100317}
        #id: 37549
        #name: "IEEE 1241:2010"
        #slug: "ieee-1241-2010-ieee00004743-242287"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n
          Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n
          errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100306 …}
    #channels: Doctrine\ORM\PersistentCollection {#100300 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100304 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100302 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100315 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100284
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618437600 {#100323
      date: 2021-04-15 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1294959600 {#100322
      date: 2011-01-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#100316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#100313 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100311 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#107191
  +product: App\Entity\Product\Product {#100317
    #id: 10635
    #code: "IEEE00004743"
    #attributes: Doctrine\ORM\PersistentCollection {#100298 …}
    #variants: Doctrine\ORM\PersistentCollection {#100295 …}
    #options: Doctrine\ORM\PersistentCollection {#100291 …}
    #associations: Doctrine\ORM\PersistentCollection {#100293 …}
    #createdAt: DateTime @1751039187 {#100324
      date: 2025-06-27 17:46:27.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#100297
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100308 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100335
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100317}
        #id: 37549
        #name: "IEEE 1241:2010"
        #slug: "ieee-1241-2010-ieee00004743-242287"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<br />\n
          \t\t\t\t<br />\n
          The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.<br />\n
          Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.<br />\n
          This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset<br />\n
          errors. The reader should note that this standard has many similarities to IEEE Std 1057. Many of the tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveform recorders.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100306 …}
    #channels: Doctrine\ORM\PersistentCollection {#100300 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100304 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100302 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100315 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100284
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618437600 {#100323
      date: 2021-04-15 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1294959600 {#100322
      date: 2011-01-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#100316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 139
    -documents: Doctrine\ORM\PersistentCollection {#100313 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100311 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 80.0 MiB 0.21 ms
Input props 
[
  "product" => App\Entity\Product\Product {#107004
    #id: 9229
    #code: "IEEE00001889"
    #attributes: Doctrine\ORM\PersistentCollection {#107026 …}
    #variants: Doctrine\ORM\PersistentCollection {#107028 …}
    #options: Doctrine\ORM\PersistentCollection {#107032 …}
    #associations: Doctrine\ORM\PersistentCollection {#107030 …}
    #createdAt: DateTime @1751038079 {#106995
      date: 2025-06-27 17:27:59.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#107002
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#107016 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107257
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#107004}
        #id: 31925
        #name: "IEEE 1241:2000"
        #slug: "ieee-1241-2000-ieee00001889-240881"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n
          \t\t\t\t<br />\n
          Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n
          To provide standard terminology for specifying the performance of A/D converters, and to provide test methods for measuring the performance. The standard will be for general purpose applications and will not focus on highly specialized applications such as video recording.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#107018 …}
    #channels: Doctrine\ORM\PersistentCollection {#107024 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#107020 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#107022 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#107009 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106999
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#107001
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @993160800 {#107003
      date: 2001-06-22 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 98
    -documents: Doctrine\ORM\PersistentCollection {#107012 …}
    -favorites: Doctrine\ORM\PersistentCollection {#107014 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#107272
  +product: App\Entity\Product\Product {#107004
    #id: 9229
    #code: "IEEE00001889"
    #attributes: Doctrine\ORM\PersistentCollection {#107026 …}
    #variants: Doctrine\ORM\PersistentCollection {#107028 …}
    #options: Doctrine\ORM\PersistentCollection {#107032 …}
    #associations: Doctrine\ORM\PersistentCollection {#107030 …}
    #createdAt: DateTime @1751038079 {#106995
      date: 2025-06-27 17:27:59.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#107002
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#107016 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107257
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#107004}
        #id: 31925
        #name: "IEEE 1241:2000"
        #slug: "ieee-1241-2000-ieee00001889-240881"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n
          \t\t\t\t<br />\n
          Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n
          To provide standard terminology for specifying the performance of A/D converters, and to provide test methods for measuring the performance. The standard will be for general purpose applications and will not focus on highly specialized applications such as video recording.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#107018 …}
    #channels: Doctrine\ORM\PersistentCollection {#107024 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#107020 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#107022 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#107009 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106999
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#107001
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @993160800 {#107003
      date: 2001-06-22 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 98
    -documents: Doctrine\ORM\PersistentCollection {#107012 …}
    -favorites: Doctrine\ORM\PersistentCollection {#107014 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 80.0 MiB 0.73 ms
Input props 
[
  "product" => App\Entity\Product\Product {#107004
    #id: 9229
    #code: "IEEE00001889"
    #attributes: Doctrine\ORM\PersistentCollection {#107026 …}
    #variants: Doctrine\ORM\PersistentCollection {#107028 …}
    #options: Doctrine\ORM\PersistentCollection {#107032 …}
    #associations: Doctrine\ORM\PersistentCollection {#107030 …}
    #createdAt: DateTime @1751038079 {#106995
      date: 2025-06-27 17:27:59.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#107002
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#107016 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107257
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#107004}
        #id: 31925
        #name: "IEEE 1241:2000"
        #slug: "ieee-1241-2000-ieee00001889-240881"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n
          \t\t\t\t<br />\n
          Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n
          To provide standard terminology for specifying the performance of A/D converters, and to provide test methods for measuring the performance. The standard will be for general purpose applications and will not focus on highly specialized applications such as video recording.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#107018 …}
    #channels: Doctrine\ORM\PersistentCollection {#107024 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#107020 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#107022 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#107009 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106999
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#107001
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @993160800 {#107003
      date: 2001-06-22 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 98
    -documents: Doctrine\ORM\PersistentCollection {#107012 …}
    -favorites: Doctrine\ORM\PersistentCollection {#107014 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#107324
  +product: App\Entity\Product\Product {#107004
    #id: 9229
    #code: "IEEE00001889"
    #attributes: Doctrine\ORM\PersistentCollection {#107026 …}
    #variants: Doctrine\ORM\PersistentCollection {#107028 …}
    #options: Doctrine\ORM\PersistentCollection {#107032 …}
    #associations: Doctrine\ORM\PersistentCollection {#107030 …}
    #createdAt: DateTime @1751038079 {#106995
      date: 2025-06-27 17:27:59.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754606304 {#107002
      date: 2025-08-08 00:38:24.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#107016 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#107257
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#107004}
        #id: 31925
        #name: "IEEE 1241:2000"
        #slug: "ieee-1241-2000-ieee00001889-240881"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.<br />\n
          \t\t\t\t<br />\n
          Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').<br />\n
          To provide standard terminology for specifying the performance of A/D converters, and to provide test methods for measuring the performance. The standard will be for general purpose applications and will not focus on highly specialized applications such as video recording.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#107018 …}
    #channels: Doctrine\ORM\PersistentCollection {#107024 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#107020 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#107022 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#107009 …}
    -apiLastModifiedAt: DateTime @1754517600 {#106999
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#107001
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @993160800 {#107003
      date: 2001-06-22 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1241"
    -bookCollection: ""
    -pageCount: 98
    -documents: Doctrine\ORM\PersistentCollection {#107012 …}
    -favorites: Doctrine\ORM\PersistentCollection {#107014 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductCard App\Twig\Components\ProductCard 102.0 MiB 8.16 ms
Input props 
[
  "product" => App\Entity\Product\Product {#128665
    #id: 10449
    #code: "IEEE00004414"
    #attributes: Doctrine\ORM\PersistentCollection {#128648 …}
    #variants: Doctrine\ORM\PersistentCollection {#128646 …}
    #options: Doctrine\ORM\PersistentCollection {#128641 …}
    #associations: Doctrine\ORM\PersistentCollection {#128643 …}
    #createdAt: DateTime @1751039068 {#128638
      date: 2025-06-27 17:44:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#128631
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128659 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128761
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128665}
        #id: 36805
        #name: "IEEE 181:2011"
        #slug: "ieee-181-2011-ieee00004414-242101"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform aberrations. These analysis algorithms are applicable to two-state waveforms having one or two transitions connecting these states. Compound waveform analysis is accomplished by decomposing the compound waveform into its constituent two-state single-transition waveforms.<br />\n
          \t\t\t\t<br />\n
          This standard defines terms pertaining to transitions, pulses, and related waveforms and defines procedures for estimating their parameters.<br />\n
          The purpose of the standard is to unambiguously and accurately define terms pertaining to transitions, pulses, and related waveforms and the algorithm for their computation. This helps to communicate<br />\n
          requirements between vendors and users, improves understanding and readability of instrument performance specifications, and provides a common ground for parameter and performance comparisons.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Transitions, Pulses, and Related Waveforms"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128657 …}
    #channels: Doctrine\ORM\PersistentCollection {#128650 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128654 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128652 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128667 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128624
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#128673
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1315260000 {#128644
      date: 2011-09-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1648076400 {#128625
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "181"
    -bookCollection: ""
    -pageCount: 71
    -documents: Doctrine\ORM\PersistentCollection {#128663 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128661 …}
  }
  "layout" => "vertical"
  "showPrice" => true
  "showStatusBadges" => true
  "additionalClasses" => "product__teaser--with-grey-border"
  "hasStretchedLink" => true
  "hoverType" => "shadow"
  "linkLabel" => "See more"
]
Attributes 
[]
Component 
App\Twig\Components\ProductCard {#128721
  +product: App\Entity\Product\Product {#128665
    #id: 10449
    #code: "IEEE00004414"
    #attributes: Doctrine\ORM\PersistentCollection {#128648 …}
    #variants: Doctrine\ORM\PersistentCollection {#128646 …}
    #options: Doctrine\ORM\PersistentCollection {#128641 …}
    #associations: Doctrine\ORM\PersistentCollection {#128643 …}
    #createdAt: DateTime @1751039068 {#128638
      date: 2025-06-27 17:44:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#128631
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128659 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128761
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128665}
        #id: 36805
        #name: "IEEE 181:2011"
        #slug: "ieee-181-2011-ieee00004414-242101"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform aberrations. These analysis algorithms are applicable to two-state waveforms having one or two transitions connecting these states. Compound waveform analysis is accomplished by decomposing the compound waveform into its constituent two-state single-transition waveforms.<br />\n
          \t\t\t\t<br />\n
          This standard defines terms pertaining to transitions, pulses, and related waveforms and defines procedures for estimating their parameters.<br />\n
          The purpose of the standard is to unambiguously and accurately define terms pertaining to transitions, pulses, and related waveforms and the algorithm for their computation. This helps to communicate<br />\n
          requirements between vendors and users, improves understanding and readability of instrument performance specifications, and provides a common ground for parameter and performance comparisons.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Transitions, Pulses, and Related Waveforms"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128657 …}
    #channels: Doctrine\ORM\PersistentCollection {#128650 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128654 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128652 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128667 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128624
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#128673
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1315260000 {#128644
      date: 2011-09-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1648076400 {#128625
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "181"
    -bookCollection: ""
    -pageCount: 71
    -documents: Doctrine\ORM\PersistentCollection {#128663 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128661 …}
  }
  +layout: "vertical"
  +showPrice: true
  +showStatusBadges: true
  +additionalClasses: "product__teaser--with-grey-border"
  +linkLabel: "See more"
  +imageFilter: "product_thumbnail_teaser"
  +hasStretchedLink: true
  +backgroundColor: "white"
  +hoverType: "shadow"
}
ProductState App\Twig\Components\ProductState 102.0 MiB 0.19 ms
Input props 
[
  "product" => App\Entity\Product\Product {#128665
    #id: 10449
    #code: "IEEE00004414"
    #attributes: Doctrine\ORM\PersistentCollection {#128648 …}
    #variants: Doctrine\ORM\PersistentCollection {#128646 …}
    #options: Doctrine\ORM\PersistentCollection {#128641 …}
    #associations: Doctrine\ORM\PersistentCollection {#128643 …}
    #createdAt: DateTime @1751039068 {#128638
      date: 2025-06-27 17:44:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#128631
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128659 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128761
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128665}
        #id: 36805
        #name: "IEEE 181:2011"
        #slug: "ieee-181-2011-ieee00004414-242101"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform aberrations. These analysis algorithms are applicable to two-state waveforms having one or two transitions connecting these states. Compound waveform analysis is accomplished by decomposing the compound waveform into its constituent two-state single-transition waveforms.<br />\n
          \t\t\t\t<br />\n
          This standard defines terms pertaining to transitions, pulses, and related waveforms and defines procedures for estimating their parameters.<br />\n
          The purpose of the standard is to unambiguously and accurately define terms pertaining to transitions, pulses, and related waveforms and the algorithm for their computation. This helps to communicate<br />\n
          requirements between vendors and users, improves understanding and readability of instrument performance specifications, and provides a common ground for parameter and performance comparisons.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Transitions, Pulses, and Related Waveforms"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128657 …}
    #channels: Doctrine\ORM\PersistentCollection {#128650 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128654 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128652 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128667 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128624
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#128673
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1315260000 {#128644
      date: 2011-09-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1648076400 {#128625
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "181"
    -bookCollection: ""
    -pageCount: 71
    -documents: Doctrine\ORM\PersistentCollection {#128663 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128661 …}
  }
]
Attributes 
[
  "showFullLabel" => false
]
Component 
App\Twig\Components\ProductState {#128763
  +product: App\Entity\Product\Product {#128665
    #id: 10449
    #code: "IEEE00004414"
    #attributes: Doctrine\ORM\PersistentCollection {#128648 …}
    #variants: Doctrine\ORM\PersistentCollection {#128646 …}
    #options: Doctrine\ORM\PersistentCollection {#128641 …}
    #associations: Doctrine\ORM\PersistentCollection {#128643 …}
    #createdAt: DateTime @1751039068 {#128638
      date: 2025-06-27 17:44:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#128631
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128659 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128761
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128665}
        #id: 36805
        #name: "IEEE 181:2011"
        #slug: "ieee-181-2011-ieee00004414-242101"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform aberrations. These analysis algorithms are applicable to two-state waveforms having one or two transitions connecting these states. Compound waveform analysis is accomplished by decomposing the compound waveform into its constituent two-state single-transition waveforms.<br />\n
          \t\t\t\t<br />\n
          This standard defines terms pertaining to transitions, pulses, and related waveforms and defines procedures for estimating their parameters.<br />\n
          The purpose of the standard is to unambiguously and accurately define terms pertaining to transitions, pulses, and related waveforms and the algorithm for their computation. This helps to communicate<br />\n
          requirements between vendors and users, improves understanding and readability of instrument performance specifications, and provides a common ground for parameter and performance comparisons.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Transitions, Pulses, and Related Waveforms"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128657 …}
    #channels: Doctrine\ORM\PersistentCollection {#128650 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128654 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128652 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128667 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128624
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#128673
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1315260000 {#128644
      date: 2011-09-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1648076400 {#128625
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "181"
    -bookCollection: ""
    -pageCount: 71
    -documents: Doctrine\ORM\PersistentCollection {#128663 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128661 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 102.0 MiB 0.72 ms
Input props 
[
  "product" => App\Entity\Product\Product {#128665
    #id: 10449
    #code: "IEEE00004414"
    #attributes: Doctrine\ORM\PersistentCollection {#128648 …}
    #variants: Doctrine\ORM\PersistentCollection {#128646 …}
    #options: Doctrine\ORM\PersistentCollection {#128641 …}
    #associations: Doctrine\ORM\PersistentCollection {#128643 …}
    #createdAt: DateTime @1751039068 {#128638
      date: 2025-06-27 17:44:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#128631
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128659 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128761
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128665}
        #id: 36805
        #name: "IEEE 181:2011"
        #slug: "ieee-181-2011-ieee00004414-242101"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform aberrations. These analysis algorithms are applicable to two-state waveforms having one or two transitions connecting these states. Compound waveform analysis is accomplished by decomposing the compound waveform into its constituent two-state single-transition waveforms.<br />\n
          \t\t\t\t<br />\n
          This standard defines terms pertaining to transitions, pulses, and related waveforms and defines procedures for estimating their parameters.<br />\n
          The purpose of the standard is to unambiguously and accurately define terms pertaining to transitions, pulses, and related waveforms and the algorithm for their computation. This helps to communicate<br />\n
          requirements between vendors and users, improves understanding and readability of instrument performance specifications, and provides a common ground for parameter and performance comparisons.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Transitions, Pulses, and Related Waveforms"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128657 …}
    #channels: Doctrine\ORM\PersistentCollection {#128650 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128654 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128652 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128667 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128624
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#128673
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1315260000 {#128644
      date: 2011-09-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1648076400 {#128625
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "181"
    -bookCollection: ""
    -pageCount: 71
    -documents: Doctrine\ORM\PersistentCollection {#128663 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128661 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#128840
  +product: App\Entity\Product\Product {#128665
    #id: 10449
    #code: "IEEE00004414"
    #attributes: Doctrine\ORM\PersistentCollection {#128648 …}
    #variants: Doctrine\ORM\PersistentCollection {#128646 …}
    #options: Doctrine\ORM\PersistentCollection {#128641 …}
    #associations: Doctrine\ORM\PersistentCollection {#128643 …}
    #createdAt: DateTime @1751039068 {#128638
      date: 2025-06-27 17:44:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#128631
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128659 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128761
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128665}
        #id: 36805
        #name: "IEEE 181:2011"
        #slug: "ieee-181-2011-ieee00004414-242101"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform aberrations. These analysis algorithms are applicable to two-state waveforms having one or two transitions connecting these states. Compound waveform analysis is accomplished by decomposing the compound waveform into its constituent two-state single-transition waveforms.<br />\n
          \t\t\t\t<br />\n
          This standard defines terms pertaining to transitions, pulses, and related waveforms and defines procedures for estimating their parameters.<br />\n
          The purpose of the standard is to unambiguously and accurately define terms pertaining to transitions, pulses, and related waveforms and the algorithm for their computation. This helps to communicate<br />\n
          requirements between vendors and users, improves understanding and readability of instrument performance specifications, and provides a common ground for parameter and performance comparisons.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Transitions, Pulses, and Related Waveforms"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128657 …}
    #channels: Doctrine\ORM\PersistentCollection {#128650 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128654 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128652 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128667 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128624
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#128673
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1315260000 {#128644
      date: 2011-09-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1648076400 {#128625
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "181"
    -bookCollection: ""
    -pageCount: 71
    -documents: Doctrine\ORM\PersistentCollection {#128663 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128661 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}