Forms
sylius_add_to_cart
Errors
This form has no errors.
Default Data
| Property | Value |
|---|---|
| Model Format | same as normalized format |
| Normalized Format | Sylius\Bundle\OrderBundle\Controller\AddToCartCommand {#113882 -cart: App\Entity\Order\Order {#13330 …} -cartItem: App\Entity\Order\OrderItem {#113870 #id: null #order: null #quantity: 1 #unitPrice: 0 #originalUnitPrice: 0 #total: 0 #immutable: false #units: Doctrine\Common\Collections\ArrayCollection {#113894 …} #unitsTotal: 0 #adjustments: Doctrine\Common\Collections\ArrayCollection {#113895 …} #adjustmentsTotal: 0 #version: 1 #variant: App\Entity\Product\ProductVariant {#8099 #id: 6854 #code: "IEEE00006388PDF" #product: App\Entity\Product\Product {#7310 #id: 11629 #code: "IEEE00006388" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 #collection: Doctrine\Common\Collections\ArrayCollection {#7917 …} #initialized: true -snapshot: [ …4] -owner: App\Entity\Product\Product {#7310} -association: [ …21] -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …} -backRefFieldName: null -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#223620 …} -isDirty: false } #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039849 {#7274 : 2025-06-27 17:57:29.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753970307 {#7322 : 2025-07-31 15:58:27.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 41525 #name: "ANSI/IEEE 300:1982" #slug: "ansi-ieee-300-1982-ieee00006388-243281" #description: """ Revision Standard - Superseded.<br />\n The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.<br />\n \t\t\t\t<br />\n This standard applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are t o o complex or require equipment (such as particle accelerators) which may not be readily available. Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation, and the equivalent international publication IEC 340. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @721350000 {#7318 : 1992-11-10 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "300" -bookCollection: "" -pageCount: 30 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } #optionValues: Doctrine\ORM\PersistentCollection {#8315 …} #position: 0 #createdAt: DateTime @1751041292 {#7283 : 2025-06-27 18:21:32.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1755612011 {#8116 : 2025-08-19 16:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#8259 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductVariantTranslation {#93321 #locale: "en_US" #translatable: App\Entity\Product\ProductVariant {#8099} #id: 6884 #name: null -shortDescription: null -description: null -notes: null -shippingInformation: "Instant download" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #version: 9 #onHold: 0 #onHand: 0 #tracked: false #weight: 0.0 #width: null #height: null #depth: null #taxCategory: Proxies\__CG__\App\Entity\Taxation\TaxCategory {#8131 …} #shippingCategory: null #channelPricings: Doctrine\ORM\PersistentCollection {#8293 …} #shippingRequired: true #images: Doctrine\ORM\PersistentCollection {#8290 …} -apiLastModifiedAt: DateTime @1753740000 {#8098 : 2025-07-29 00:00:00.0 Europe/Paris (+02:00) } -publishedAt: null -isbn: "978-1-5044-0276-7" -ean: "9781504402767" -numberOfUsers: 1 -physicalProduct: false -downloadableImmediately: true -downloadable: true -drmViewerUrl: "https://online-viewer.normadoc.com/amWCGD" -sellable: true -documents: Doctrine\ORM\PersistentCollection {#8127 …} -drmTokens: Doctrine\ORM\PersistentCollection {#8119 …} -enabledForSubscribers: true -currentAreaContext: null } #productName: null #variantName: null } } |
| View Format | same as normalized format |
Submitted Data
This form was not submitted.
Passed Options
| Option | Passed Value | Resolved Value |
|---|---|---|
| data | Sylius\Bundle\OrderBundle\Controller\AddToCartCommand {#113882 -cart: App\Entity\Order\Order {#13330 …} -cartItem: App\Entity\Order\OrderItem {#113870 #id: null #order: null #quantity: 1 #unitPrice: 0 #originalUnitPrice: 0 #total: 0 #immutable: false #units: Doctrine\Common\Collections\ArrayCollection {#113894 …} #unitsTotal: 0 #adjustments: Doctrine\Common\Collections\ArrayCollection {#113895 …} #adjustmentsTotal: 0 #version: 1 #variant: App\Entity\Product\ProductVariant {#8099 #id: 6854 #code: "IEEE00006388PDF" #product: App\Entity\Product\Product {#7310 #id: 11629 #code: "IEEE00006388" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 #collection: Doctrine\Common\Collections\ArrayCollection {#7917 …} #initialized: true -snapshot: [ …4] -owner: App\Entity\Product\Product {#7310} -association: [ …21] -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …} -backRefFieldName: null -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#223620 …} -isDirty: false } #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039849 {#7274 : 2025-06-27 17:57:29.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753970307 {#7322 : 2025-07-31 15:58:27.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 41525 #name: "ANSI/IEEE 300:1982" #slug: "ansi-ieee-300-1982-ieee00006388-243281" #description: """ Revision Standard - Superseded.<br />\n The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.<br />\n \t\t\t\t<br />\n This standard applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are t o o complex or require equipment (such as particle accelerators) which may not be readily available. Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation, and the equivalent international publication IEC 340. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @721350000 {#7318 : 1992-11-10 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "300" -bookCollection: "" -pageCount: 30 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } #optionValues: Doctrine\ORM\PersistentCollection {#8315 …} #position: 0 #createdAt: DateTime @1751041292 {#7283 : 2025-06-27 18:21:32.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1755612011 {#8116 : 2025-08-19 16:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#8259 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductVariantTranslation {#93321 #locale: "en_US" #translatable: App\Entity\Product\ProductVariant {#8099} #id: 6884 #name: null -shortDescription: null -description: null -notes: null -shippingInformation: "Instant download" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #version: 9 #onHold: 0 #onHand: 0 #tracked: false #weight: 0.0 #width: null #height: null #depth: null #taxCategory: Proxies\__CG__\App\Entity\Taxation\TaxCategory {#8131 …} #shippingCategory: null #channelPricings: Doctrine\ORM\PersistentCollection {#8293 …} #shippingRequired: true #images: Doctrine\ORM\PersistentCollection {#8290 …} -apiLastModifiedAt: DateTime @1753740000 {#8098 : 2025-07-29 00:00:00.0 Europe/Paris (+02:00) } -publishedAt: null -isbn: "978-1-5044-0276-7" -ean: "9781504402767" -numberOfUsers: 1 -physicalProduct: false -downloadableImmediately: true -downloadable: true -drmViewerUrl: "https://online-viewer.normadoc.com/amWCGD" -sellable: true -documents: Doctrine\ORM\PersistentCollection {#8127 …} -drmTokens: Doctrine\ORM\PersistentCollection {#8119 …} -enabledForSubscribers: true -currentAreaContext: null } #productName: null #variantName: null } } |
same as passed value |
| product | App\Entity\Product\Product {#7310 #id: 11629 #code: "IEEE00006388" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 #collection: Doctrine\Common\Collections\ArrayCollection {#7917 …} #initialized: true -snapshot: [ …4] -owner: App\Entity\Product\Product {#7310} -association: [ …21] -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …} -backRefFieldName: null -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#223620 …} -isDirty: false } #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039849 {#7274 : 2025-06-27 17:57:29.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753970307 {#7322 : 2025-07-31 15:58:27.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 41525 #name: "ANSI/IEEE 300:1982" #slug: "ansi-ieee-300-1982-ieee00006388-243281" #description: """ Revision Standard - Superseded.<br />\n The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.<br />\n \t\t\t\t<br />\n This standard applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are t o o complex or require equipment (such as particle accelerators) which may not be readily available. Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation, and the equivalent international publication IEC 340. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @721350000 {#7318 : 1992-11-10 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "300" -bookCollection: "" -pageCount: 30 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } |
same as passed value |
Resolved Options
| Option | Value |
|---|---|
| action | "" |
| allow_extra_fields | false |
| allow_file_upload | false |
| attr | [] |
| attr_translation_parameters | [] |
| auto_initialize | true |
| block_name | null |
| block_prefix | null |
| by_reference | true |
| compound | true |
| constraints | [] |
| csrf_field_name | "_token" |
| csrf_message | "The CSRF token is invalid. Please try to resubmit the form." |
| csrf_protection | true |
| csrf_token_id | null |
| csrf_token_manager | Symfony\Component\Security\Csrf\CsrfTokenManager {#113902 -generator: Symfony\Component\Security\Csrf\TokenGenerator\UriSafeTokenGenerator {#113903 …} -storage: Symfony\Component\Security\Csrf\TokenStorage\SessionTokenStorage {#113904 …} -namespace: Closure() {#113906 …} } |
| data | Sylius\Bundle\OrderBundle\Controller\AddToCartCommand {#113882 -cart: App\Entity\Order\Order {#13330 …} -cartItem: App\Entity\Order\OrderItem {#113870 #id: null #order: null #quantity: 1 #unitPrice: 0 #originalUnitPrice: 0 #total: 0 #immutable: false #units: Doctrine\Common\Collections\ArrayCollection {#113894 …} #unitsTotal: 0 #adjustments: Doctrine\Common\Collections\ArrayCollection {#113895 …} #adjustmentsTotal: 0 #version: 1 #variant: App\Entity\Product\ProductVariant {#8099 #id: 6854 #code: "IEEE00006388PDF" #product: App\Entity\Product\Product {#7310 #id: 11629 #code: "IEEE00006388" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 #collection: Doctrine\Common\Collections\ArrayCollection {#7917 …} #initialized: true -snapshot: [ …4] -owner: App\Entity\Product\Product {#7310} -association: [ …21] -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …} -backRefFieldName: null -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#223620 …} -isDirty: false } #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039849 {#7274 : 2025-06-27 17:57:29.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753970307 {#7322 : 2025-07-31 15:58:27.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 41525 #name: "ANSI/IEEE 300:1982" #slug: "ansi-ieee-300-1982-ieee00006388-243281" #description: """ Revision Standard - Superseded.<br />\n The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.<br />\n \t\t\t\t<br />\n This standard applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are t o o complex or require equipment (such as particle accelerators) which may not be readily available. Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation, and the equivalent international publication IEC 340. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @721350000 {#7318 : 1992-11-10 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "300" -bookCollection: "" -pageCount: 30 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } #optionValues: Doctrine\ORM\PersistentCollection {#8315 …} #position: 0 #createdAt: DateTime @1751041292 {#7283 : 2025-06-27 18:21:32.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1755612011 {#8116 : 2025-08-19 16:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#8259 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductVariantTranslation {#93321 #locale: "en_US" #translatable: App\Entity\Product\ProductVariant {#8099} #id: 6884 #name: null -shortDescription: null -description: null -notes: null -shippingInformation: "Instant download" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #version: 9 #onHold: 0 #onHand: 0 #tracked: false #weight: 0.0 #width: null #height: null #depth: null #taxCategory: Proxies\__CG__\App\Entity\Taxation\TaxCategory {#8131 …} #shippingCategory: null #channelPricings: Doctrine\ORM\PersistentCollection {#8293 …} #shippingRequired: true #images: Doctrine\ORM\PersistentCollection {#8290 …} -apiLastModifiedAt: DateTime @1753740000 {#8098 : 2025-07-29 00:00:00.0 Europe/Paris (+02:00) } -publishedAt: null -isbn: "978-1-5044-0276-7" -ean: "9781504402767" -numberOfUsers: 1 -physicalProduct: false -downloadableImmediately: true -downloadable: true -drmViewerUrl: "https://online-viewer.normadoc.com/amWCGD" -sellable: true -documents: Doctrine\ORM\PersistentCollection {#8127 …} -drmTokens: Doctrine\ORM\PersistentCollection {#8119 …} -enabledForSubscribers: true -currentAreaContext: null } #productName: null #variantName: null } } |
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| disabled | false |
| empty_data | Closure(FormInterface $form) {#113929 : "Symfony\Component\Form\Extension\Core\Type\FormType" : { : "Sylius\Bundle\OrderBundle\Controller\AddToCartCommand" } } |
| error_bubbling | true |
| error_mapping | [] |
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| form_attr | false |
| getter | null |
| help | null |
| help_attr | [] |
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| help_translation_parameters | [] |
| inherit_data | false |
| invalid_message | "This value is not valid." |
| invalid_message_parameters | [] |
| is_empty_callback | null |
| label | null |
| label_attr | [] |
| label_format | null |
| label_html | false |
| label_translation_parameters | [] |
| mapped | true |
| method | "POST" |
| post_max_size_message | "The uploaded file was too large. Please try to upload a smaller file." |
| priority | 0 |
| product | App\Entity\Product\Product {#7310 #id: 11629 #code: "IEEE00006388" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 #collection: Doctrine\Common\Collections\ArrayCollection {#7917 …} #initialized: true -snapshot: [ …4] -owner: App\Entity\Product\Product {#7310} -association: [ …21] -em: ContainerHAOxQ06\EntityManagerGhostEbeb667 {#775 …} -backRefFieldName: null -typeClass: Symfony\Component\VarDumper\Caster\CutStub {#223620 …} -isDirty: false } #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039849 {#7274 : 2025-06-27 17:57:29.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753970307 {#7322 : 2025-07-31 15:58:27.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 41525 #name: "ANSI/IEEE 300:1982" #slug: "ansi-ieee-300-1982-ieee00006388-243281" #description: """ Revision Standard - Superseded.<br />\n The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.<br />\n \t\t\t\t<br />\n This standard applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are t o o complex or require equipment (such as particle accelerators) which may not be readily available. Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation, and the equivalent international publication IEC 340. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors" -notes: "Superseded" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1578006000 {#7292 : 2020-01-03 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @721350000 {#7318 : 1992-11-10 00:00:00.0 Europe/Paris (+01:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "300" -bookCollection: "" -pageCount: 30 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } |
| property_path | null |
| required | true |
| row_attr | [] |
| setter | null |
| translation_domain | null |
| trim | true |
| upload_max_size_message | Closure() {#113931 : "Symfony\Component\Form\Extension\Validator\Type\UploadValidatorExtension" : { : Symfony\Component\Translation\DataCollectorTranslator {#2251 …} : Closure() {#113930 …} : "validators" } } |
| validation_groups | [
"sylius"
] |
View Vars
| Variable | Value |
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