GET https://dev.normadoc.fr/_partial/product/IEEE00000822/features

Components

3 Twig Components
11 Render Count
5 ms Render Time
210.0 MiB Memory Usage

Components

Name Metadata Render Count Render Time
ProductState
"App\Twig\Components\ProductState"
components/ProductState.html.twig
5 1.05ms
ProductMostRecent
"App\Twig\Components\ProductMostRecent"
components/ProductMostRecent.html.twig
5 3.25ms
ProductType
"App\Twig\Components\ProductType"
components/ProductType.html.twig
1 0.22ms

Render calls

ProductState App\Twig\Components\ProductState 210.0 MiB 0.30 ms
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          IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
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          New IEEE Standard - Superseded.<br />\n
          IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
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          New IEEE Standard - Superseded.<br />\n
          IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
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          New IEEE Standard - Superseded.<br />\n
          IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
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ProductMostRecent App\Twig\Components\ProductMostRecent 210.0 MiB 0.67 ms
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          New IEEE Standard - Superseded.<br />\n
          IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
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          New IEEE Standard - Superseded.<br />\n
          IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<br />\n
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ProductState App\Twig\Components\ProductState 210.0 MiB 0.20 ms
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Component
App\Twig\Components\ProductState {#106900
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}