Components
4
Twig Components
12
Render Count
13
ms
Render Time
422.0
MiB
Memory Usage
Components
| Name | Metadata | Render Count | Render Time |
|---|---|---|---|
| ProductState |
"App\Twig\Components\ProductState"components/ProductState.html.twig |
5 | 1.17ms |
| ProductMostRecent |
"App\Twig\Components\ProductMostRecent"components/ProductMostRecent.html.twig |
5 | 3.50ms |
| ProductType |
"App\Twig\Components\ProductType"components/ProductType.html.twig |
1 | 0.23ms |
| ProductCard |
"App\Twig\Components\ProductCard"components/ProductCard.html.twig |
1 | 9.02ms |
Render calls
| ProductState | App\Twig\Components\ProductState | 422.0 MiB | 0.33 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7310 #id: 13161 #code: "IEEE00010489" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751040914 {#7274 : 2025-06-27 18:15:14.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#7322 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 47653 #name: "IEEE 1450.1:2025" #slug: "ieee-p1450-1-ieee00010489-496235" #description: """ Revision Standard - Active - Draft.<br />\n Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n \t\t\t\t<br />\n Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and Built-In Self-Test (BIST), and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1753048800 {#7292 : 2025-07-21 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1750888800 {#7318 : 2025-06-26 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1450.1" -bookCollection: "" -pageCount: 141 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#93007 +product: App\Entity\Product\Product {#7310 #id: 13161 #code: "IEEE00010489" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751040914 {#7274 : 2025-06-27 18:15:14.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#7322 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 47653 #name: "IEEE 1450.1:2025" #slug: "ieee-p1450-1-ieee00010489-496235" #description: """ Revision Standard - Active - Draft.<br />\n Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n \t\t\t\t<br />\n Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and Built-In Self-Test (BIST), and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1753048800 {#7292 : 2025-07-21 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1750888800 {#7318 : 2025-06-26 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1450.1" -bookCollection: "" -pageCount: 141 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } +appearance: "state-active" +labels: [ "Active" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductType | App\Twig\Components\ProductType | 422.0 MiB | 0.23 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7310 #id: 13161 #code: "IEEE00010489" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751040914 {#7274 : 2025-06-27 18:15:14.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#7322 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 47653 #name: "IEEE 1450.1:2025" #slug: "ieee-p1450-1-ieee00010489-496235" #description: """ Revision Standard - Active - Draft.<br />\n Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n \t\t\t\t<br />\n Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and Built-In Self-Test (BIST), and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1753048800 {#7292 : 2025-07-21 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1750888800 {#7318 : 2025-06-26 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1450.1" -bookCollection: "" -pageCount: 141 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } ] |
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| Component | App\Twig\Components\ProductType {#93185 +product: App\Entity\Product\Product {#7310 #id: 13161 #code: "IEEE00010489" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751040914 {#7274 : 2025-06-27 18:15:14.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#7322 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 47653 #name: "IEEE 1450.1:2025" #slug: "ieee-p1450-1-ieee00010489-496235" #description: """ Revision Standard - Active - Draft.<br />\n Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n \t\t\t\t<br />\n Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and Built-In Self-Test (BIST), and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1753048800 {#7292 : 2025-07-21 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1750888800 {#7318 : 2025-06-26 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1450.1" -bookCollection: "" -pageCount: 141 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } +label: "Standard" -typeAttributeCode: "type" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 422.0 MiB | 0.74 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#7310 #id: 13161 #code: "IEEE00010489" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751040914 {#7274 : 2025-06-27 18:15:14.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#7322 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 47653 #name: "IEEE 1450.1:2025" #slug: "ieee-p1450-1-ieee00010489-496235" #description: """ Revision Standard - Active - Draft.<br />\n Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n \t\t\t\t<br />\n Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and Built-In Self-Test (BIST), and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1753048800 {#7292 : 2025-07-21 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1750888800 {#7318 : 2025-06-26 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1450.1" -bookCollection: "" -pageCount: 141 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } ] |
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| Component | App\Twig\Components\ProductMostRecent {#93252 +product: App\Entity\Product\Product {#7310 #id: 13161 #code: "IEEE00010489" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751040914 {#7274 : 2025-06-27 18:15:14.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#7322 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 47653 #name: "IEEE 1450.1:2025" #slug: "ieee-p1450-1-ieee00010489-496235" #description: """ Revision Standard - Active - Draft.<br />\n Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n \t\t\t\t<br />\n Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and Built-In Self-Test (BIST), and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1753048800 {#7292 : 2025-07-21 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1750888800 {#7318 : 2025-06-26 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1450.1" -bookCollection: "" -pageCount: 141 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductState | App\Twig\Components\ProductState | 422.0 MiB | 0.27 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#100244 #id: 9361 #code: "IEEE00002159" #attributes: Doctrine\ORM\PersistentCollection {#100225 …} #variants: Doctrine\ORM\PersistentCollection {#100223 …} #options: Doctrine\ORM\PersistentCollection {#100218 …} #associations: Doctrine\ORM\PersistentCollection {#100221 …} #createdAt: DateTime @1751038200 {#100253 : 2025-06-27 17:30:00.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#100226 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#100236 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#100269 #locale: "en_US" #translatable: App\Entity\Product\Product {#100244} #id: 32453 #name: "IEEE 1450.1:2005 (R2011)" #slug: "ieee-1450-1-2005-r2011-ieee00002159-241013" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n \t\t\t\t<br />\n Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. This effort is to be done in conjunction with IEEE P1500 which is defining standards for the definition and integration of embedded cores. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#100234 …} #channels: Doctrine\ORM\PersistentCollection {#100228 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#100232 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#100230 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100243 …} -apiLastModifiedAt: DateTime @1754517600 {#100213 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1649023200 {#100252 : 2022-04-04 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1128031200 {#100251 : 2005-09-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1308175200 {#100245 : 2011-06-16 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1648076400 {#100246 : 2022-03-24 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1450.1" -bookCollection: "" -pageCount: 123 -documents: Doctrine\ORM\PersistentCollection {#100241 …} -favorites: Doctrine\ORM\PersistentCollection {#100239 …} } "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#100301 +product: App\Entity\Product\Product {#100244 #id: 9361 #code: "IEEE00002159" #attributes: Doctrine\ORM\PersistentCollection {#100225 …} #variants: Doctrine\ORM\PersistentCollection {#100223 …} #options: Doctrine\ORM\PersistentCollection {#100218 …} #associations: Doctrine\ORM\PersistentCollection {#100221 …} #createdAt: DateTime @1751038200 {#100253 : 2025-06-27 17:30:00.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#100226 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#100236 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#100269 #locale: "en_US" #translatable: App\Entity\Product\Product {#100244} #id: 32453 #name: "IEEE 1450.1:2005 (R2011)" #slug: "ieee-1450-1-2005-r2011-ieee00002159-241013" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n \t\t\t\t<br />\n Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. This effort is to be done in conjunction with IEEE P1500 which is defining standards for the definition and integration of embedded cores. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#100234 …} #channels: Doctrine\ORM\PersistentCollection {#100228 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#100232 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#100230 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100243 …} -apiLastModifiedAt: DateTime @1754517600 {#100213 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1649023200 {#100252 : 2022-04-04 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1128031200 {#100251 : 2005-09-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1308175200 {#100245 : 2011-06-16 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1648076400 {#100246 : 2022-03-24 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1450.1" -bookCollection: "" -pageCount: 123 -documents: Doctrine\ORM\PersistentCollection {#100241 …} -favorites: Doctrine\ORM\PersistentCollection {#100239 …} } +appearance: "state-withdrawn" +labels: [ "Withdrawn" "Confirmed" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 422.0 MiB | 0.78 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#100244 #id: 9361 #code: "IEEE00002159" #attributes: Doctrine\ORM\PersistentCollection {#100225 …} #variants: Doctrine\ORM\PersistentCollection {#100223 …} #options: Doctrine\ORM\PersistentCollection {#100218 …} #associations: Doctrine\ORM\PersistentCollection {#100221 …} #createdAt: DateTime @1751038200 {#100253 : 2025-06-27 17:30:00.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#100226 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#100236 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#100269 #locale: "en_US" #translatable: App\Entity\Product\Product {#100244} #id: 32453 #name: "IEEE 1450.1:2005 (R2011)" #slug: "ieee-1450-1-2005-r2011-ieee00002159-241013" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n \t\t\t\t<br />\n Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. This effort is to be done in conjunction with IEEE P1500 which is defining standards for the definition and integration of embedded cores. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#100234 …} #channels: Doctrine\ORM\PersistentCollection {#100228 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#100232 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#100230 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100243 …} -apiLastModifiedAt: DateTime @1754517600 {#100213 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1649023200 {#100252 : 2022-04-04 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1128031200 {#100251 : 2005-09-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1308175200 {#100245 : 2011-06-16 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1648076400 {#100246 : 2022-03-24 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1450.1" -bookCollection: "" -pageCount: 123 -documents: Doctrine\ORM\PersistentCollection {#100241 …} -favorites: Doctrine\ORM\PersistentCollection {#100239 …} } ] |
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| ProductState | App\Twig\Components\ProductState | 422.0 MiB | 0.20 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#7310 #id: 13161 #code: "IEEE00010489" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751040914 {#7274 : 2025-06-27 18:15:14.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#7322 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 47653 #name: "IEEE 1450.1:2025" #slug: "ieee-p1450-1-ieee00010489-496235" #description: """ Revision Standard - Active - Draft.<br />\n Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n \t\t\t\t<br />\n Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and Built-In Self-Test (BIST), and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1753048800 {#7292 : 2025-07-21 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1750888800 {#7318 : 2025-06-26 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1450.1" -bookCollection: "" -pageCount: 141 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } "showFullLabel" => "true" ] |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 422.0 MiB | 0.68 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#7310 #id: 13161 #code: "IEEE00010489" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751040914 {#7274 : 2025-06-27 18:15:14.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608190 {#7322 : 2025-08-08 01:09:50.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 47653 #name: "IEEE 1450.1:2025" #slug: "ieee-p1450-1-ieee00010489-496235" #description: """ Revision Standard - Active - Draft.<br />\n Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and<br />\n (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n \t\t\t\t<br />\n Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and Built-In Self-Test (BIST), and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1754517600 {#7317 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1753048800 {#7292 : 2025-07-21 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1750888800 {#7318 : 2025-06-26 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1450.1" -bookCollection: "" -pageCount: 141 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } ] |
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| ProductState | App\Twig\Components\ProductState | 422.0 MiB | 0.19 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#100244 #id: 9361 #code: "IEEE00002159" #attributes: Doctrine\ORM\PersistentCollection {#100225 …} #variants: Doctrine\ORM\PersistentCollection {#100223 …} #options: Doctrine\ORM\PersistentCollection {#100218 …} #associations: Doctrine\ORM\PersistentCollection {#100221 …} #createdAt: DateTime @1751038200 {#100253 : 2025-06-27 17:30:00.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#100226 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#100236 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#100269 #locale: "en_US" #translatable: App\Entity\Product\Product {#100244} #id: 32453 #name: "IEEE 1450.1:2005 (R2011)" #slug: "ieee-1450-1-2005-r2011-ieee00002159-241013" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n \t\t\t\t<br />\n Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. This effort is to be done in conjunction with IEEE P1500 which is defining standards for the definition and integration of embedded cores. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#100234 …} #channels: Doctrine\ORM\PersistentCollection {#100228 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#100232 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#100230 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100243 …} -apiLastModifiedAt: DateTime @1754517600 {#100213 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1649023200 {#100252 : 2022-04-04 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1128031200 {#100251 : 2005-09-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1308175200 {#100245 : 2011-06-16 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1648076400 {#100246 : 2022-03-24 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1450.1" -bookCollection: "" -pageCount: 123 -documents: Doctrine\ORM\PersistentCollection {#100241 …} -favorites: Doctrine\ORM\PersistentCollection {#100239 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 422.0 MiB | 0.61 ms | |
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| Input props | [ "product" => App\Entity\Product\Product {#100244 #id: 9361 #code: "IEEE00002159" #attributes: Doctrine\ORM\PersistentCollection {#100225 …} #variants: Doctrine\ORM\PersistentCollection {#100223 …} #options: Doctrine\ORM\PersistentCollection {#100218 …} #associations: Doctrine\ORM\PersistentCollection {#100221 …} #createdAt: DateTime @1751038200 {#100253 : 2025-06-27 17:30:00.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754607611 {#100226 : 2025-08-08 01:00:11.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#100236 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#100269 #locale: "en_US" #translatable: App\Entity\Product\Product {#100244} #id: 32453 #name: "IEEE 1450.1:2005 (R2011)" #slug: "ieee-1450-1-2005-r2011-ieee00002159-241013" #description: """ New IEEE Standard - Inactive-Reserved.<br />\n Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.<br />\n \t\t\t\t<br />\n Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.<br />\n Enhance the STIL language definition to support the usage of STIL in the design environment. This includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments. In addition, define extensions to support the definition of sub element tests, and to define the mechanisms to integrate those tests into a complete device test. This effort is to be done in conjunction with IEEE P1500 which is defining standards for the definition and integration of embedded cores. Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments" -notes: "Inactive-Reserved" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#100234 …} #channels: Doctrine\ORM\PersistentCollection {#100228 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#100232 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#100230 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100243 …} -apiLastModifiedAt: DateTime @1754517600 {#100213 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1649023200 {#100252 : 2022-04-04 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1128031200 {#100251 : 2005-09-30 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: DateTime @1308175200 {#100245 : 2011-06-16 00:00:00.0 Europe/Paris (+02:00) } -canceledAt: DateTime @1648076400 {#100246 : 2022-03-24 00:00:00.0 Europe/Paris (+01:00) } -edition: null -coreDocument: "1450.1" -bookCollection: "" -pageCount: 123 -documents: Doctrine\ORM\PersistentCollection {#100241 …} -favorites: Doctrine\ORM\PersistentCollection {#100239 …} } ] |
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| ProductCard | App\Twig\Components\ProductCard | 422.0 MiB | 9.02 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#128356 #id: 12704 #code: "IEEE00010488" #attributes: Doctrine\ORM\PersistentCollection {#128380 …} #variants: Doctrine\ORM\PersistentCollection {#128378 …} #options: Doctrine\ORM\PersistentCollection {#128373 …} #associations: Doctrine\ORM\PersistentCollection {#128376 …} #createdAt: DateTime @1751040607 {#128369 : 2025-06-27 18:10:07.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608621 {#128362 : 2025-08-08 01:17:01.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#128391 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#128487 #locale: "en_US" #translatable: App\Entity\Product\Product {#128356} #id: 45825 #name: "IEEE 1450:2023" #slug: "ieee-1450-2023-ieee00010488-244359" #description: """ Revision Standard - Active.<br />\n Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.<br />\n \t\t\t\t<br />\n This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from computer-aided engineering (CAE) environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.<br />\n This standard addresses a need in the integrated circuit (IC) test industry to define a standard mechanism for transferring the large volumes of digital test data from the generation environment through to test. The environment today contains unique output formats of existing CAE tools, individual test environments of IC manufacturers, and proprietary IC ATE input interfaces. As each of these three arenas solves individual problems, together they have created a morass of interfaces, translators, and software environments that provide no opportunity to leverage common goals and result in much wasted efforts re-engineering solutions. As device density increases, the magnitude of test data threatens to shift the test bottleneck from the generation process to the processes necessary solely to maintain and transport this data. These two factors threaten to eliminate any productive work performed in this area unless a viable standard is defined. With a common standard for CAE and IC ATE environments, the generation, movement, and processing of this test data is greatly facilitated. This standard also allows for immediate access to test equipment supporting this standard, which benefits both ATE and IC vendors reviewing this equipment. This standard also serves as a catalyst for the development of a set of standard third party interface tools to both test and design aspects of IC device generation. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#128389 …} #channels: Doctrine\ORM\PersistentCollection {#128382 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#128386 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#128384 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128396 …} -apiLastModifiedAt: DateTime @1754517600 {#128355 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1740006000 {#128404 : 2025-02-20 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1713909600 {#128375 : 2024-04-24 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1450" -bookCollection: "" -pageCount: 147 -documents: Doctrine\ORM\PersistentCollection {#128395 …} -favorites: Doctrine\ORM\PersistentCollection {#128393 …} } "layout" => "vertical" "showPrice" => true "showStatusBadges" => true "additionalClasses" => "product__teaser--with-grey-border" "hasStretchedLink" => true "hoverType" => "shadow" "linkLabel" => "See more" ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductCard {#128448 +product: App\Entity\Product\Product {#128356 #id: 12704 #code: "IEEE00010488" #attributes: Doctrine\ORM\PersistentCollection {#128380 …} #variants: Doctrine\ORM\PersistentCollection {#128378 …} #options: Doctrine\ORM\PersistentCollection {#128373 …} #associations: Doctrine\ORM\PersistentCollection {#128376 …} #createdAt: DateTime @1751040607 {#128369 : 2025-06-27 18:10:07.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608621 {#128362 : 2025-08-08 01:17:01.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#128391 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#128487 #locale: "en_US" #translatable: App\Entity\Product\Product {#128356} #id: 45825 #name: "IEEE 1450:2023" #slug: "ieee-1450-2023-ieee00010488-244359" #description: """ Revision Standard - Active.<br />\n Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.<br />\n \t\t\t\t<br />\n This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from computer-aided engineering (CAE) environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.<br />\n This standard addresses a need in the integrated circuit (IC) test industry to define a standard mechanism for transferring the large volumes of digital test data from the generation environment through to test. The environment today contains unique output formats of existing CAE tools, individual test environments of IC manufacturers, and proprietary IC ATE input interfaces. As each of these three arenas solves individual problems, together they have created a morass of interfaces, translators, and software environments that provide no opportunity to leverage common goals and result in much wasted efforts re-engineering solutions. As device density increases, the magnitude of test data threatens to shift the test bottleneck from the generation process to the processes necessary solely to maintain and transport this data. These two factors threaten to eliminate any productive work performed in this area unless a viable standard is defined. With a common standard for CAE and IC ATE environments, the generation, movement, and processing of this test data is greatly facilitated. This standard also allows for immediate access to test equipment supporting this standard, which benefits both ATE and IC vendors reviewing this equipment. This standard also serves as a catalyst for the development of a set of standard third party interface tools to both test and design aspects of IC device generation. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#128389 …} #channels: Doctrine\ORM\PersistentCollection {#128382 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#128386 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#128384 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128396 …} -apiLastModifiedAt: DateTime @1754517600 {#128355 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1740006000 {#128404 : 2025-02-20 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1713909600 {#128375 : 2024-04-24 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1450" -bookCollection: "" -pageCount: 147 -documents: Doctrine\ORM\PersistentCollection {#128395 …} -favorites: Doctrine\ORM\PersistentCollection {#128393 …} } +layout: "vertical" +showPrice: true +showStatusBadges: true +additionalClasses: "product__teaser--with-grey-border" +linkLabel: "See more" +imageFilter: "product_thumbnail_teaser" +hasStretchedLink: true +backgroundColor: "white" +hoverType: "shadow" } |
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| ProductState | App\Twig\Components\ProductState | 422.0 MiB | 0.19 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#128356 #id: 12704 #code: "IEEE00010488" #attributes: Doctrine\ORM\PersistentCollection {#128380 …} #variants: Doctrine\ORM\PersistentCollection {#128378 …} #options: Doctrine\ORM\PersistentCollection {#128373 …} #associations: Doctrine\ORM\PersistentCollection {#128376 …} #createdAt: DateTime @1751040607 {#128369 : 2025-06-27 18:10:07.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608621 {#128362 : 2025-08-08 01:17:01.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#128391 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#128487 #locale: "en_US" #translatable: App\Entity\Product\Product {#128356} #id: 45825 #name: "IEEE 1450:2023" #slug: "ieee-1450-2023-ieee00010488-244359" #description: """ Revision Standard - Active.<br />\n Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.<br />\n \t\t\t\t<br />\n This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from computer-aided engineering (CAE) environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.<br />\n This standard addresses a need in the integrated circuit (IC) test industry to define a standard mechanism for transferring the large volumes of digital test data from the generation environment through to test. The environment today contains unique output formats of existing CAE tools, individual test environments of IC manufacturers, and proprietary IC ATE input interfaces. As each of these three arenas solves individual problems, together they have created a morass of interfaces, translators, and software environments that provide no opportunity to leverage common goals and result in much wasted efforts re-engineering solutions. As device density increases, the magnitude of test data threatens to shift the test bottleneck from the generation process to the processes necessary solely to maintain and transport this data. These two factors threaten to eliminate any productive work performed in this area unless a viable standard is defined. With a common standard for CAE and IC ATE environments, the generation, movement, and processing of this test data is greatly facilitated. This standard also allows for immediate access to test equipment supporting this standard, which benefits both ATE and IC vendors reviewing this equipment. This standard also serves as a catalyst for the development of a set of standard third party interface tools to both test and design aspects of IC device generation. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#128389 …} #channels: Doctrine\ORM\PersistentCollection {#128382 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#128386 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#128384 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128396 …} -apiLastModifiedAt: DateTime @1754517600 {#128355 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1740006000 {#128404 : 2025-02-20 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1713909600 {#128375 : 2024-04-24 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1450" -bookCollection: "" -pageCount: 147 -documents: Doctrine\ORM\PersistentCollection {#128395 …} -favorites: Doctrine\ORM\PersistentCollection {#128393 …} } ] |
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| Attributes | [ "showFullLabel" => false ] |
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| Component | App\Twig\Components\ProductState {#128489 +product: App\Entity\Product\Product {#128356 #id: 12704 #code: "IEEE00010488" #attributes: Doctrine\ORM\PersistentCollection {#128380 …} #variants: Doctrine\ORM\PersistentCollection {#128378 …} #options: Doctrine\ORM\PersistentCollection {#128373 …} #associations: Doctrine\ORM\PersistentCollection {#128376 …} #createdAt: DateTime @1751040607 {#128369 : 2025-06-27 18:10:07.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608621 {#128362 : 2025-08-08 01:17:01.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#128391 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#128487 #locale: "en_US" #translatable: App\Entity\Product\Product {#128356} #id: 45825 #name: "IEEE 1450:2023" #slug: "ieee-1450-2023-ieee00010488-244359" #description: """ Revision Standard - Active.<br />\n Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.<br />\n \t\t\t\t<br />\n This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from computer-aided engineering (CAE) environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.<br />\n This standard addresses a need in the integrated circuit (IC) test industry to define a standard mechanism for transferring the large volumes of digital test data from the generation environment through to test. The environment today contains unique output formats of existing CAE tools, individual test environments of IC manufacturers, and proprietary IC ATE input interfaces. As each of these three arenas solves individual problems, together they have created a morass of interfaces, translators, and software environments that provide no opportunity to leverage common goals and result in much wasted efforts re-engineering solutions. As device density increases, the magnitude of test data threatens to shift the test bottleneck from the generation process to the processes necessary solely to maintain and transport this data. These two factors threaten to eliminate any productive work performed in this area unless a viable standard is defined. With a common standard for CAE and IC ATE environments, the generation, movement, and processing of this test data is greatly facilitated. This standard also allows for immediate access to test equipment supporting this standard, which benefits both ATE and IC vendors reviewing this equipment. This standard also serves as a catalyst for the development of a set of standard third party interface tools to both test and design aspects of IC device generation. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#128389 …} #channels: Doctrine\ORM\PersistentCollection {#128382 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#128386 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#128384 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128396 …} -apiLastModifiedAt: DateTime @1754517600 {#128355 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1740006000 {#128404 : 2025-02-20 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1713909600 {#128375 : 2024-04-24 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1450" -bookCollection: "" -pageCount: 147 -documents: Doctrine\ORM\PersistentCollection {#128395 …} -favorites: Doctrine\ORM\PersistentCollection {#128393 …} } +appearance: "state-active" +labels: [ "Active" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 422.0 MiB | 0.69 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#128356 #id: 12704 #code: "IEEE00010488" #attributes: Doctrine\ORM\PersistentCollection {#128380 …} #variants: Doctrine\ORM\PersistentCollection {#128378 …} #options: Doctrine\ORM\PersistentCollection {#128373 …} #associations: Doctrine\ORM\PersistentCollection {#128376 …} #createdAt: DateTime @1751040607 {#128369 : 2025-06-27 18:10:07.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608621 {#128362 : 2025-08-08 01:17:01.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#128391 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#128487 #locale: "en_US" #translatable: App\Entity\Product\Product {#128356} #id: 45825 #name: "IEEE 1450:2023" #slug: "ieee-1450-2023-ieee00010488-244359" #description: """ Revision Standard - Active.<br />\n Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.<br />\n \t\t\t\t<br />\n This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from computer-aided engineering (CAE) environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.<br />\n This standard addresses a need in the integrated circuit (IC) test industry to define a standard mechanism for transferring the large volumes of digital test data from the generation environment through to test. The environment today contains unique output formats of existing CAE tools, individual test environments of IC manufacturers, and proprietary IC ATE input interfaces. As each of these three arenas solves individual problems, together they have created a morass of interfaces, translators, and software environments that provide no opportunity to leverage common goals and result in much wasted efforts re-engineering solutions. As device density increases, the magnitude of test data threatens to shift the test bottleneck from the generation process to the processes necessary solely to maintain and transport this data. These two factors threaten to eliminate any productive work performed in this area unless a viable standard is defined. With a common standard for CAE and IC ATE environments, the generation, movement, and processing of this test data is greatly facilitated. This standard also allows for immediate access to test equipment supporting this standard, which benefits both ATE and IC vendors reviewing this equipment. This standard also serves as a catalyst for the development of a set of standard third party interface tools to both test and design aspects of IC device generation. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#128389 …} #channels: Doctrine\ORM\PersistentCollection {#128382 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#128386 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#128384 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128396 …} -apiLastModifiedAt: DateTime @1754517600 {#128355 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1740006000 {#128404 : 2025-02-20 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1713909600 {#128375 : 2024-04-24 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1450" -bookCollection: "" -pageCount: 147 -documents: Doctrine\ORM\PersistentCollection {#128395 …} -favorites: Doctrine\ORM\PersistentCollection {#128393 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#128566 +product: App\Entity\Product\Product {#128356 #id: 12704 #code: "IEEE00010488" #attributes: Doctrine\ORM\PersistentCollection {#128380 …} #variants: Doctrine\ORM\PersistentCollection {#128378 …} #options: Doctrine\ORM\PersistentCollection {#128373 …} #associations: Doctrine\ORM\PersistentCollection {#128376 …} #createdAt: DateTime @1751040607 {#128369 : 2025-06-27 18:10:07.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1754608621 {#128362 : 2025-08-08 01:17:01.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#128391 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#128487 #locale: "en_US" #translatable: App\Entity\Product\Product {#128356} #id: 45825 #name: "IEEE 1450:2023" #slug: "ieee-1450-2023-ieee00010488-244359" #description: """ Revision Standard - Active.<br />\n Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.<br />\n \t\t\t\t<br />\n This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from computer-aided engineering (CAE) environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.<br />\n This standard addresses a need in the integrated circuit (IC) test industry to define a standard mechanism for transferring the large volumes of digital test data from the generation environment through to test. The environment today contains unique output formats of existing CAE tools, individual test environments of IC manufacturers, and proprietary IC ATE input interfaces. As each of these three arenas solves individual problems, together they have created a morass of interfaces, translators, and software environments that provide no opportunity to leverage common goals and result in much wasted efforts re-engineering solutions. As device density increases, the magnitude of test data threatens to shift the test bottleneck from the generation process to the processes necessary solely to maintain and transport this data. These two factors threaten to eliminate any productive work performed in this area unless a viable standard is defined. With a common standard for CAE and IC ATE environments, the generation, movement, and processing of this test data is greatly facilitated. This standard also allows for immediate access to test equipment supporting this standard, which benefits both ATE and IC vendors reviewing this equipment. This standard also serves as a catalyst for the development of a set of standard third party interface tools to both test and design aspects of IC device generation. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#128389 …} #channels: Doctrine\ORM\PersistentCollection {#128382 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#128386 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#128384 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128396 …} -apiLastModifiedAt: DateTime @1754517600 {#128355 : 2025-08-07 00:00:00.0 Europe/Paris (+02:00) } -lastUpdatedAt: DateTime @1740006000 {#128404 : 2025-02-20 00:00:00.0 Europe/Paris (+01:00) } -author: "" -publishedAt: DateTime @1713909600 {#128375 : 2024-04-24 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1450" -bookCollection: "" -pageCount: 147 -documents: Doctrine\ORM\PersistentCollection {#128395 …} -favorites: Doctrine\ORM\PersistentCollection {#128393 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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