Components

3 Twig Components
7 Render Count
4 ms Render Time
80.0 MiB Memory Usage

Components

Name Metadata Render Count Render Time
ProductState
"App\Twig\Components\ProductState"
components/ProductState.html.twig
3 0.71ms
ProductMostRecent
"App\Twig\Components\ProductMostRecent"
components/ProductMostRecent.html.twig
3 2.18ms
ProductType
"App\Twig\Components\ProductType"
components/ProductType.html.twig
1 0.72ms

Render calls

ProductState App\Twig\Components\ProductState 68.0 MiB 0.33 ms
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           - Superseded.<br />\n
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          \t\t\t\t<br />\n
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Component
App\Twig\Components\ProductState {#93007
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           - Superseded.<br />\n
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          (2) to review existing test values and practices in present standards<br />\n
          (3) to propose guiding principles for the selection of dielectric test values<br />\n
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ProductType App\Twig\Components\ProductType 68.0 MiB 0.72 ms
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          (2) to review existing test values and practices in present standards<br />\n
          (3) to propose guiding principles for the selection of dielectric test values<br />\n
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Component
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ProductMostRecent App\Twig\Components\ProductMostRecent 68.0 MiB 0.78 ms
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          (3) to propose guiding principles for the selection of dielectric test values<br />\n
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ProductState App\Twig\Components\ProductState 80.0 MiB 0.20 ms
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          Revision Standard - Inactive-Withdrawn.<br />\n
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          \t\t\t\t<br />\n
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    #code: "IEEE00006475"
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      date: 2025-06-27 17:58:41.0 Europe/Paris (+02:00)
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        #id: 41869
        #name: "IEEE/AIEE 51:1949"
        #slug: "ieee-aiee-51-1949-ieee00006475-243367"
        #description: """
           - Superseded.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          This report deals with dielectric tests on completed apparatus. Tests on materials and on components during the course of fabrication usually are left to the discretion of the manufacturer and are not a subject for standardization except as to method and technique. Impulse test values where specified in standards are based on the Basic Impulse Levels and thus are consistent for different equipment. Impulse test conditions and technique are outside the scope. Hence, this report deals mostly with conditions and test values associated with lowfrequency dielectric tests<br />\n
          A statement of the purpose of this report follows from this review of the general problem. It is:<br />\n
          (1) to present a survey of the over voltages encountered in service<br />\n
          (2) to review existing test values and practices in present standards<br />\n
          (3) to propose guiding principles for the selection of dielectric test values<br />\n
          (4) to investigate other types of testing to determine their latent usefulness and the desirability of standardization.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "AIEE Report on Guiding Principles for Dielectric Tests"
        -notes: "Superseded"
      }
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      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @-641782800 {#7318
      date: 1949-08-31 00:00:00.0 Europe/Paris (+01:00)
    }
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    -edition: null
    -coreDocument: "51"
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    -pageCount: 14
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