GET https://dev.normadoc.fr/_partial/products/cross-sell?limit=2&products=%5B10770%5D&template=%40SyliusShop%2FProduct%2FsimilarList.html.twig

Response
200 OK
IP
216.73.216.19
Profiled on
Token
22ed96

Components

4 Twig Components
8 Render Count
9 ms Render Time
96.0 MiB Memory Usage

Components

Name Metadata Render Count Render Time
ProductState 
"App\Twig\Components\ProductState"
components/ProductState.html.twig 		3 0.59ms
ProductMostRecent 
"App\Twig\Components\ProductMostRecent"
components/ProductMostRecent.html.twig 		3 2.03ms
ProductType 
"App\Twig\Components\ProductType"
components/ProductType.html.twig 		1 0.19ms
ProductCard 
"App\Twig\Components\ProductCard"
components/ProductCard.html.twig 		1 7.12ms

Render calls

ProductState App\Twig\Components\ProductState 66.0 MiB 0.27 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7311
    #id: 10770
    #code: "IEEE00004983"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751039272 {#7274
      date: 2025-06-27 17:47:52.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 38089
        #name: "IEEE 1696:2013"
        #slug: "ieee-1696-2013-ieee00004983-242422"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Currently, no defined, industry-accepted method exists for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving probe customers and users without a valid means of comparing probe performance and/or of understanding the circuit-loading effect of the probe. Methods for measuring parameters indicative of a probe's or probe system's performance and guidance on the design and use of a test fixture for measuring probe performance are provided by this standard. An industry-accepted, unbiased means for characterizing probe performance is given by these methods. High-impedance voltage probes that are used to measure the performance of electrical circuits are considered by this standard. The probe systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe will include the mechanism by which the circuit is contacted. This method and standard will be applicable to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance at least five times greater than the impedance of the circuit under test.<br />\n
          \t\t\t\t<br />\n
          This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.<br />\n
          This document provides an unbiased means for accurately characterizing circuit probe performance.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Circuit Probes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712613600 {#7292
      date: 2024-04-09 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1392332400 {#7318
      date: 2014-02-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#7316
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1696"
    -bookCollection: ""
    -pageCount: 65
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#93067
  +product: App\Entity\Product\Product {#7311
    #id: 10770
    #code: "IEEE00004983"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751039272 {#7274
      date: 2025-06-27 17:47:52.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 38089
        #name: "IEEE 1696:2013"
        #slug: "ieee-1696-2013-ieee00004983-242422"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Currently, no defined, industry-accepted method exists for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving probe customers and users without a valid means of comparing probe performance and/or of understanding the circuit-loading effect of the probe. Methods for measuring parameters indicative of a probe's or probe system's performance and guidance on the design and use of a test fixture for measuring probe performance are provided by this standard. An industry-accepted, unbiased means for characterizing probe performance is given by these methods. High-impedance voltage probes that are used to measure the performance of electrical circuits are considered by this standard. The probe systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe will include the mechanism by which the circuit is contacted. This method and standard will be applicable to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance at least five times greater than the impedance of the circuit under test.<br />\n
          \t\t\t\t<br />\n
          This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.<br />\n
          This document provides an unbiased means for accurately characterizing circuit probe performance.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Circuit Probes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712613600 {#7292
      date: 2024-04-09 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1392332400 {#7318
      date: 2014-02-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#7316
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1696"
    -bookCollection: ""
    -pageCount: 65
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductType App\Twig\Components\ProductType 68.0 MiB 0.19 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7311
    #id: 10770
    #code: "IEEE00004983"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751039272 {#7274
      date: 2025-06-27 17:47:52.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 38089
        #name: "IEEE 1696:2013"
        #slug: "ieee-1696-2013-ieee00004983-242422"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Currently, no defined, industry-accepted method exists for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving probe customers and users without a valid means of comparing probe performance and/or of understanding the circuit-loading effect of the probe. Methods for measuring parameters indicative of a probe's or probe system's performance and guidance on the design and use of a test fixture for measuring probe performance are provided by this standard. An industry-accepted, unbiased means for characterizing probe performance is given by these methods. High-impedance voltage probes that are used to measure the performance of electrical circuits are considered by this standard. The probe systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe will include the mechanism by which the circuit is contacted. This method and standard will be applicable to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance at least five times greater than the impedance of the circuit under test.<br />\n
          \t\t\t\t<br />\n
          This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.<br />\n
          This document provides an unbiased means for accurately characterizing circuit probe performance.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Circuit Probes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712613600 {#7292
      date: 2024-04-09 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1392332400 {#7318
      date: 2014-02-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#7316
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1696"
    -bookCollection: ""
    -pageCount: 65
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductType {#93247
  +product: App\Entity\Product\Product {#7311
    #id: 10770
    #code: "IEEE00004983"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751039272 {#7274
      date: 2025-06-27 17:47:52.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 38089
        #name: "IEEE 1696:2013"
        #slug: "ieee-1696-2013-ieee00004983-242422"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Currently, no defined, industry-accepted method exists for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving probe customers and users without a valid means of comparing probe performance and/or of understanding the circuit-loading effect of the probe. Methods for measuring parameters indicative of a probe's or probe system's performance and guidance on the design and use of a test fixture for measuring probe performance are provided by this standard. An industry-accepted, unbiased means for characterizing probe performance is given by these methods. High-impedance voltage probes that are used to measure the performance of electrical circuits are considered by this standard. The probe systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe will include the mechanism by which the circuit is contacted. This method and standard will be applicable to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance at least five times greater than the impedance of the circuit under test.<br />\n
          \t\t\t\t<br />\n
          This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.<br />\n
          This document provides an unbiased means for accurately characterizing circuit probe performance.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Circuit Probes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712613600 {#7292
      date: 2024-04-09 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1392332400 {#7318
      date: 2014-02-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#7316
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1696"
    -bookCollection: ""
    -pageCount: 65
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +label: "Standard"
  -typeAttributeCode: "type"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 68.0 MiB 0.66 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7311
    #id: 10770
    #code: "IEEE00004983"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751039272 {#7274
      date: 2025-06-27 17:47:52.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 38089
        #name: "IEEE 1696:2013"
        #slug: "ieee-1696-2013-ieee00004983-242422"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Currently, no defined, industry-accepted method exists for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving probe customers and users without a valid means of comparing probe performance and/or of understanding the circuit-loading effect of the probe. Methods for measuring parameters indicative of a probe's or probe system's performance and guidance on the design and use of a test fixture for measuring probe performance are provided by this standard. An industry-accepted, unbiased means for characterizing probe performance is given by these methods. High-impedance voltage probes that are used to measure the performance of electrical circuits are considered by this standard. The probe systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe will include the mechanism by which the circuit is contacted. This method and standard will be applicable to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance at least five times greater than the impedance of the circuit under test.<br />\n
          \t\t\t\t<br />\n
          This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.<br />\n
          This document provides an unbiased means for accurately characterizing circuit probe performance.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Circuit Probes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712613600 {#7292
      date: 2024-04-09 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1392332400 {#7318
      date: 2014-02-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#7316
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1696"
    -bookCollection: ""
    -pageCount: 65
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#93322
  +product: App\Entity\Product\Product {#7311
    #id: 10770
    #code: "IEEE00004983"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751039272 {#7274
      date: 2025-06-27 17:47:52.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 38089
        #name: "IEEE 1696:2013"
        #slug: "ieee-1696-2013-ieee00004983-242422"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Currently, no defined, industry-accepted method exists for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving probe customers and users without a valid means of comparing probe performance and/or of understanding the circuit-loading effect of the probe. Methods for measuring parameters indicative of a probe's or probe system's performance and guidance on the design and use of a test fixture for measuring probe performance are provided by this standard. An industry-accepted, unbiased means for characterizing probe performance is given by these methods. High-impedance voltage probes that are used to measure the performance of electrical circuits are considered by this standard. The probe systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe will include the mechanism by which the circuit is contacted. This method and standard will be applicable to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance at least five times greater than the impedance of the circuit under test.<br />\n
          \t\t\t\t<br />\n
          This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.<br />\n
          This document provides an unbiased means for accurately characterizing circuit probe performance.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Circuit Probes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712613600 {#7292
      date: 2024-04-09 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1392332400 {#7318
      date: 2014-02-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#7316
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1696"
    -bookCollection: ""
    -pageCount: 65
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductState App\Twig\Components\ProductState 74.0 MiB 0.16 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7311
    #id: 10770
    #code: "IEEE00004983"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751039272 {#7274
      date: 2025-06-27 17:47:52.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 38089
        #name: "IEEE 1696:2013"
        #slug: "ieee-1696-2013-ieee00004983-242422"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Currently, no defined, industry-accepted method exists for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving probe customers and users without a valid means of comparing probe performance and/or of understanding the circuit-loading effect of the probe. Methods for measuring parameters indicative of a probe's or probe system's performance and guidance on the design and use of a test fixture for measuring probe performance are provided by this standard. An industry-accepted, unbiased means for characterizing probe performance is given by these methods. High-impedance voltage probes that are used to measure the performance of electrical circuits are considered by this standard. The probe systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe will include the mechanism by which the circuit is contacted. This method and standard will be applicable to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance at least five times greater than the impedance of the circuit under test.<br />\n
          \t\t\t\t<br />\n
          This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.<br />\n
          This document provides an unbiased means for accurately characterizing circuit probe performance.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Circuit Probes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712613600 {#7292
      date: 2024-04-09 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1392332400 {#7318
      date: 2014-02-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#7316
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1696"
    -bookCollection: ""
    -pageCount: 65
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  "showFullLabel" => "true"
]
Attributes 
[
  "showFullLabel" => "true"
]
Component 
App\Twig\Components\ProductState {#100279
  +product: App\Entity\Product\Product {#7311
    #id: 10770
    #code: "IEEE00004983"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751039272 {#7274
      date: 2025-06-27 17:47:52.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 38089
        #name: "IEEE 1696:2013"
        #slug: "ieee-1696-2013-ieee00004983-242422"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Currently, no defined, industry-accepted method exists for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving probe customers and users without a valid means of comparing probe performance and/or of understanding the circuit-loading effect of the probe. Methods for measuring parameters indicative of a probe's or probe system's performance and guidance on the design and use of a test fixture for measuring probe performance are provided by this standard. An industry-accepted, unbiased means for characterizing probe performance is given by these methods. High-impedance voltage probes that are used to measure the performance of electrical circuits are considered by this standard. The probe systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe will include the mechanism by which the circuit is contacted. This method and standard will be applicable to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance at least five times greater than the impedance of the circuit under test.<br />\n
          \t\t\t\t<br />\n
          This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.<br />\n
          This document provides an unbiased means for accurately characterizing circuit probe performance.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Circuit Probes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712613600 {#7292
      date: 2024-04-09 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1392332400 {#7318
      date: 2014-02-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#7316
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1696"
    -bookCollection: ""
    -pageCount: 65
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 74.0 MiB 0.68 ms
Input props 
[
  "product" => App\Entity\Product\Product {#7311
    #id: 10770
    #code: "IEEE00004983"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751039272 {#7274
      date: 2025-06-27 17:47:52.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 38089
        #name: "IEEE 1696:2013"
        #slug: "ieee-1696-2013-ieee00004983-242422"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Currently, no defined, industry-accepted method exists for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving probe customers and users without a valid means of comparing probe performance and/or of understanding the circuit-loading effect of the probe. Methods for measuring parameters indicative of a probe's or probe system's performance and guidance on the design and use of a test fixture for measuring probe performance are provided by this standard. An industry-accepted, unbiased means for characterizing probe performance is given by these methods. High-impedance voltage probes that are used to measure the performance of electrical circuits are considered by this standard. The probe systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe will include the mechanism by which the circuit is contacted. This method and standard will be applicable to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance at least five times greater than the impedance of the circuit under test.<br />\n
          \t\t\t\t<br />\n
          This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.<br />\n
          This document provides an unbiased means for accurately characterizing circuit probe performance.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Circuit Probes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712613600 {#7292
      date: 2024-04-09 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1392332400 {#7318
      date: 2014-02-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#7316
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1696"
    -bookCollection: ""
    -pageCount: 65
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#100363
  +product: App\Entity\Product\Product {#7311
    #id: 10770
    #code: "IEEE00004983"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751039272 {#7274
      date: 2025-06-27 17:47:52.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#7322
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 38089
        #name: "IEEE 1696:2013"
        #slug: "ieee-1696-2013-ieee00004983-242422"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Currently, no defined, industry-accepted method exists for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving probe customers and users without a valid means of comparing probe performance and/or of understanding the circuit-loading effect of the probe. Methods for measuring parameters indicative of a probe's or probe system's performance and guidance on the design and use of a test fixture for measuring probe performance are provided by this standard. An industry-accepted, unbiased means for characterizing probe performance is given by these methods. High-impedance voltage probes that are used to measure the performance of electrical circuits are considered by this standard. The probe systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe will include the mechanism by which the circuit is contacted. This method and standard will be applicable to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance at least five times greater than the impedance of the circuit under test.<br />\n
          \t\t\t\t<br />\n
          This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.<br />\n
          This document provides an unbiased means for accurately characterizing circuit probe performance.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Terminology and Test Methods for Circuit Probes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1712613600 {#7292
      date: 2024-04-09 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1392332400 {#7318
      date: 2014-02-14 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1710975600 {#7316
      date: 2024-03-21 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1696"
    -bookCollection: ""
    -pageCount: 65
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductCard App\Twig\Components\ProductCard 96.0 MiB 7.12 ms
Input props 
[
  "product" => App\Entity\Product\Product {#121634
    #id: 10449
    #code: "IEEE00004414"
    #attributes: Doctrine\ORM\PersistentCollection {#121617 …}
    #variants: Doctrine\ORM\PersistentCollection {#121615 …}
    #options: Doctrine\ORM\PersistentCollection {#121610 …}
    #associations: Doctrine\ORM\PersistentCollection {#121612 …}
    #createdAt: DateTime @1751039068 {#121607
      date: 2025-06-27 17:44:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#121642
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#121628 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#121736
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#121634}
        #id: 36805
        #name: "IEEE 181:2011"
        #slug: "ieee-181-2011-ieee00004414-242101"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform aberrations. These analysis algorithms are applicable to two-state waveforms having one or two transitions connecting these states. Compound waveform analysis is accomplished by decomposing the compound waveform into its constituent two-state single-transition waveforms.<br />\n
          \t\t\t\t<br />\n
          This standard defines terms pertaining to transitions, pulses, and related waveforms and defines procedures for estimating their parameters.<br />\n
          The purpose of the standard is to unambiguously and accurately define terms pertaining to transitions, pulses, and related waveforms and the algorithm for their computation. This helps to communicate<br />\n
          requirements between vendors and users, improves understanding and readability of instrument performance specifications, and provides a common ground for parameter and performance comparisons.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Transitions, Pulses, and Related Waveforms"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#121626 …}
    #channels: Doctrine\ORM\PersistentCollection {#121619 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#121623 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#121621 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#121636 …}
    -apiLastModifiedAt: DateTime @1754517600 {#121593
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#121641
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1315260000 {#121600
      date: 2011-09-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1648076400 {#121613
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "181"
    -bookCollection: ""
    -pageCount: 71
    -documents: Doctrine\ORM\PersistentCollection {#121632 …}
    -favorites: Doctrine\ORM\PersistentCollection {#121630 …}
  }
  "layout" => "vertical"
  "showPrice" => true
  "showStatusBadges" => true
  "additionalClasses" => "product__teaser--with-grey-border"
  "hasStretchedLink" => true
  "hoverType" => "shadow"
  "linkLabel" => "See more"
]
Attributes 
[]
Component 
App\Twig\Components\ProductCard {#121690
  +product: App\Entity\Product\Product {#121634
    #id: 10449
    #code: "IEEE00004414"
    #attributes: Doctrine\ORM\PersistentCollection {#121617 …}
    #variants: Doctrine\ORM\PersistentCollection {#121615 …}
    #options: Doctrine\ORM\PersistentCollection {#121610 …}
    #associations: Doctrine\ORM\PersistentCollection {#121612 …}
    #createdAt: DateTime @1751039068 {#121607
      date: 2025-06-27 17:44:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#121642
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#121628 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#121736
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#121634}
        #id: 36805
        #name: "IEEE 181:2011"
        #slug: "ieee-181-2011-ieee00004414-242101"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform aberrations. These analysis algorithms are applicable to two-state waveforms having one or two transitions connecting these states. Compound waveform analysis is accomplished by decomposing the compound waveform into its constituent two-state single-transition waveforms.<br />\n
          \t\t\t\t<br />\n
          This standard defines terms pertaining to transitions, pulses, and related waveforms and defines procedures for estimating their parameters.<br />\n
          The purpose of the standard is to unambiguously and accurately define terms pertaining to transitions, pulses, and related waveforms and the algorithm for their computation. This helps to communicate<br />\n
          requirements between vendors and users, improves understanding and readability of instrument performance specifications, and provides a common ground for parameter and performance comparisons.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Transitions, Pulses, and Related Waveforms"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#121626 …}
    #channels: Doctrine\ORM\PersistentCollection {#121619 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#121623 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#121621 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#121636 …}
    -apiLastModifiedAt: DateTime @1754517600 {#121593
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#121641
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1315260000 {#121600
      date: 2011-09-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1648076400 {#121613
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "181"
    -bookCollection: ""
    -pageCount: 71
    -documents: Doctrine\ORM\PersistentCollection {#121632 …}
    -favorites: Doctrine\ORM\PersistentCollection {#121630 …}
  }
  +layout: "vertical"
  +showPrice: true
  +showStatusBadges: true
  +additionalClasses: "product__teaser--with-grey-border"
  +linkLabel: "See more"
  +imageFilter: "product_thumbnail_teaser"
  +hasStretchedLink: true
  +backgroundColor: "white"
  +hoverType: "shadow"
}
ProductState App\Twig\Components\ProductState 96.0 MiB 0.16 ms
Input props 
[
  "product" => App\Entity\Product\Product {#121634
    #id: 10449
    #code: "IEEE00004414"
    #attributes: Doctrine\ORM\PersistentCollection {#121617 …}
    #variants: Doctrine\ORM\PersistentCollection {#121615 …}
    #options: Doctrine\ORM\PersistentCollection {#121610 …}
    #associations: Doctrine\ORM\PersistentCollection {#121612 …}
    #createdAt: DateTime @1751039068 {#121607
      date: 2025-06-27 17:44:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#121642
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#121628 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#121736
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#121634}
        #id: 36805
        #name: "IEEE 181:2011"
        #slug: "ieee-181-2011-ieee00004414-242101"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform aberrations. These analysis algorithms are applicable to two-state waveforms having one or two transitions connecting these states. Compound waveform analysis is accomplished by decomposing the compound waveform into its constituent two-state single-transition waveforms.<br />\n
          \t\t\t\t<br />\n
          This standard defines terms pertaining to transitions, pulses, and related waveforms and defines procedures for estimating their parameters.<br />\n
          The purpose of the standard is to unambiguously and accurately define terms pertaining to transitions, pulses, and related waveforms and the algorithm for their computation. This helps to communicate<br />\n
          requirements between vendors and users, improves understanding and readability of instrument performance specifications, and provides a common ground for parameter and performance comparisons.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Transitions, Pulses, and Related Waveforms"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#121626 …}
    #channels: Doctrine\ORM\PersistentCollection {#121619 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#121623 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#121621 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#121636 …}
    -apiLastModifiedAt: DateTime @1754517600 {#121593
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#121641
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1315260000 {#121600
      date: 2011-09-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1648076400 {#121613
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "181"
    -bookCollection: ""
    -pageCount: 71
    -documents: Doctrine\ORM\PersistentCollection {#121632 …}
    -favorites: Doctrine\ORM\PersistentCollection {#121630 …}
  }
]
Attributes 
[
  "showFullLabel" => false
]
Component 
App\Twig\Components\ProductState {#121738
  +product: App\Entity\Product\Product {#121634
    #id: 10449
    #code: "IEEE00004414"
    #attributes: Doctrine\ORM\PersistentCollection {#121617 …}
    #variants: Doctrine\ORM\PersistentCollection {#121615 …}
    #options: Doctrine\ORM\PersistentCollection {#121610 …}
    #associations: Doctrine\ORM\PersistentCollection {#121612 …}
    #createdAt: DateTime @1751039068 {#121607
      date: 2025-06-27 17:44:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#121642
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#121628 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#121736
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#121634}
        #id: 36805
        #name: "IEEE 181:2011"
        #slug: "ieee-181-2011-ieee00004414-242101"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform aberrations. These analysis algorithms are applicable to two-state waveforms having one or two transitions connecting these states. Compound waveform analysis is accomplished by decomposing the compound waveform into its constituent two-state single-transition waveforms.<br />\n
          \t\t\t\t<br />\n
          This standard defines terms pertaining to transitions, pulses, and related waveforms and defines procedures for estimating their parameters.<br />\n
          The purpose of the standard is to unambiguously and accurately define terms pertaining to transitions, pulses, and related waveforms and the algorithm for their computation. This helps to communicate<br />\n
          requirements between vendors and users, improves understanding and readability of instrument performance specifications, and provides a common ground for parameter and performance comparisons.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Transitions, Pulses, and Related Waveforms"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#121626 …}
    #channels: Doctrine\ORM\PersistentCollection {#121619 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#121623 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#121621 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#121636 …}
    -apiLastModifiedAt: DateTime @1754517600 {#121593
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#121641
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1315260000 {#121600
      date: 2011-09-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1648076400 {#121613
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "181"
    -bookCollection: ""
    -pageCount: 71
    -documents: Doctrine\ORM\PersistentCollection {#121632 …}
    -favorites: Doctrine\ORM\PersistentCollection {#121630 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}
ProductMostRecent App\Twig\Components\ProductMostRecent 96.0 MiB 0.69 ms
Input props 
[
  "product" => App\Entity\Product\Product {#121634
    #id: 10449
    #code: "IEEE00004414"
    #attributes: Doctrine\ORM\PersistentCollection {#121617 …}
    #variants: Doctrine\ORM\PersistentCollection {#121615 …}
    #options: Doctrine\ORM\PersistentCollection {#121610 …}
    #associations: Doctrine\ORM\PersistentCollection {#121612 …}
    #createdAt: DateTime @1751039068 {#121607
      date: 2025-06-27 17:44:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#121642
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#121628 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#121736
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#121634}
        #id: 36805
        #name: "IEEE 181:2011"
        #slug: "ieee-181-2011-ieee00004414-242101"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform aberrations. These analysis algorithms are applicable to two-state waveforms having one or two transitions connecting these states. Compound waveform analysis is accomplished by decomposing the compound waveform into its constituent two-state single-transition waveforms.<br />\n
          \t\t\t\t<br />\n
          This standard defines terms pertaining to transitions, pulses, and related waveforms and defines procedures for estimating their parameters.<br />\n
          The purpose of the standard is to unambiguously and accurately define terms pertaining to transitions, pulses, and related waveforms and the algorithm for their computation. This helps to communicate<br />\n
          requirements between vendors and users, improves understanding and readability of instrument performance specifications, and provides a common ground for parameter and performance comparisons.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Transitions, Pulses, and Related Waveforms"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#121626 …}
    #channels: Doctrine\ORM\PersistentCollection {#121619 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#121623 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#121621 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#121636 …}
    -apiLastModifiedAt: DateTime @1754517600 {#121593
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#121641
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1315260000 {#121600
      date: 2011-09-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1648076400 {#121613
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "181"
    -bookCollection: ""
    -pageCount: 71
    -documents: Doctrine\ORM\PersistentCollection {#121632 …}
    -favorites: Doctrine\ORM\PersistentCollection {#121630 …}
  }
]
Attributes 
[]
Component 
App\Twig\Components\ProductMostRecent {#121815
  +product: App\Entity\Product\Product {#121634
    #id: 10449
    #code: "IEEE00004414"
    #attributes: Doctrine\ORM\PersistentCollection {#121617 …}
    #variants: Doctrine\ORM\PersistentCollection {#121615 …}
    #options: Doctrine\ORM\PersistentCollection {#121610 …}
    #associations: Doctrine\ORM\PersistentCollection {#121612 …}
    #createdAt: DateTime @1751039068 {#121607
      date: 2025-06-27 17:44:28.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#121642
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#121628 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#121736
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#121634}
        #id: 36805
        #name: "IEEE 181:2011"
        #slug: "ieee-181-2011-ieee00004414-242101"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform aberrations. These analysis algorithms are applicable to two-state waveforms having one or two transitions connecting these states. Compound waveform analysis is accomplished by decomposing the compound waveform into its constituent two-state single-transition waveforms.<br />\n
          \t\t\t\t<br />\n
          This standard defines terms pertaining to transitions, pulses, and related waveforms and defines procedures for estimating their parameters.<br />\n
          The purpose of the standard is to unambiguously and accurately define terms pertaining to transitions, pulses, and related waveforms and the algorithm for their computation. This helps to communicate<br />\n
          requirements between vendors and users, improves understanding and readability of instrument performance specifications, and provides a common ground for parameter and performance comparisons.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for Transitions, Pulses, and Related Waveforms"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#121626 …}
    #channels: Doctrine\ORM\PersistentCollection {#121619 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#121623 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#121621 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#121636 …}
    -apiLastModifiedAt: DateTime @1754517600 {#121593
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1649023200 {#121641
      date: 2022-04-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1315260000 {#121600
      date: 2011-09-06 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1648076400 {#121613
      date: 2022-03-24 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "181"
    -bookCollection: ""
    -pageCount: 71
    -documents: Doctrine\ORM\PersistentCollection {#121632 …}
    -favorites: Doctrine\ORM\PersistentCollection {#121630 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}