Symfony Profiler

[
  "backLabel" => "07 : Mathematics. Natural sciences"
  "backUrl" => "/taxons/main/ics-2277/07-mathematics-natural-sciences-4284"
  "paddingClasses" => "p-2 px-lg-5 py-lg-0"
  "searchPlaceholder" => "sylius.ui.search"
  "showSearch" => "true"
  "title" => "07.030 : Physics. Chemistry"
]

App\Twig\Components\PageBanner {#94230
  +supTitle: null
  +title: "07.030 : Physics. Chemistry"
  +subTitle: null
  +backUrl: "/taxons/main/ics-2277/07-mathematics-natural-sciences-4284"
  +backLabel: "07 : Mathematics. Natural sciences"
  +customClasses: null
  +backgroundType: null
  +centered: true
  +showSearch: true
  +searchPlaceholder: "sylius.ui.search"
  +searchValue: null
  +paddingClasses: "p-2 px-lg-5 py-lg-0"
}

[
  "url" => "/taxons/main/ics-2277/07-mathematics-natural-sciences-4284"
  "label" => "07 : Mathematics. Natural sciences"
]

App\Twig\Components\BackButton {#94321
  +label: "07 : Mathematics. Natural sciences"
  +url: "/taxons/main/ics-2277/07-mathematics-natural-sciences-4284"
}

[
  "product" => App\Entity\Product\Product {#94820
    #id: 10028
    #code: "IEEE00003474"
    #attributes: Doctrine\ORM\PersistentCollection {#94883 …}
    #variants: Doctrine\ORM\PersistentCollection {#94881 …}
    #options: Doctrine\ORM\PersistentCollection {#94877 …}
    #associations: Doctrine\ORM\PersistentCollection {#94879 …}
    #createdAt: DateTime @1751038758 {#94816
      date: 2025-06-27 17:39:18.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#94827
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94893 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95140
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94820}
        #id: 35121
        #name: "IEEE 1650:2005"
        #slug: "ieee-1650-2005-ieee00003474-241680"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Recommended methods and standardized reporting practices for electrical characterization of carbon nanotubes are covered. Due to the nature of carbon nanotubes, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for carbon nanotubes. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring carbon nanotubes.<br />\n
          \t\t\t\t<br />\n
          This project will develop standard methods for the electrical characterization of carbon nanotubes (CNTs). The methods will be independent of processing routes used to fabricate the CNT's.<br />\n
          There is currently no defined standard for the electrical characterization of CNT's and the means of reporting performance and other data. Without openly defined standard test methods the acceptance and diffusion of CNT technology will be severely impeded. This is intended to provide and suggest procedures for characterization and reporting of data. These methods will enable the creation of a suggested reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will recommend the necessary tools and procedures for validation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94891 …}
    #channels: Doctrine\ORM\PersistentCollection {#94885 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94889 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94887 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94899 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94831
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#94834
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1136761200 {#94832
      date: 2006-01-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1573081200 {#94830
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1650"
    -bookCollection: ""
    -pageCount: 25
    -documents: Doctrine\ORM\PersistentCollection {#94897 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94895 …}
  }
  "layout" => "vertical"
  "showPrice" => true
  "showStatusBadges" => true
  "imageFilter" => "product_listing_thumbnail"
  "additionalClasses" => "h-100 border-0"
  "hasStretchedLink" => true
  "backgroundColor" => "white"
  "hoverType" => "border-black"
]

App\Twig\Components\ProductCard {#95040
  +product: App\Entity\Product\Product {#94820
    #id: 10028
    #code: "IEEE00003474"
    #attributes: Doctrine\ORM\PersistentCollection {#94883 …}
    #variants: Doctrine\ORM\PersistentCollection {#94881 …}
    #options: Doctrine\ORM\PersistentCollection {#94877 …}
    #associations: Doctrine\ORM\PersistentCollection {#94879 …}
    #createdAt: DateTime @1751038758 {#94816
      date: 2025-06-27 17:39:18.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#94827
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94893 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95140
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94820}
        #id: 35121
        #name: "IEEE 1650:2005"
        #slug: "ieee-1650-2005-ieee00003474-241680"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Recommended methods and standardized reporting practices for electrical characterization of carbon nanotubes are covered. Due to the nature of carbon nanotubes, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for carbon nanotubes. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring carbon nanotubes.<br />\n
          \t\t\t\t<br />\n
          This project will develop standard methods for the electrical characterization of carbon nanotubes (CNTs). The methods will be independent of processing routes used to fabricate the CNT's.<br />\n
          There is currently no defined standard for the electrical characterization of CNT's and the means of reporting performance and other data. Without openly defined standard test methods the acceptance and diffusion of CNT technology will be severely impeded. This is intended to provide and suggest procedures for characterization and reporting of data. These methods will enable the creation of a suggested reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will recommend the necessary tools and procedures for validation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94891 …}
    #channels: Doctrine\ORM\PersistentCollection {#94885 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94889 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94887 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94899 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94831
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#94834
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1136761200 {#94832
      date: 2006-01-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1573081200 {#94830
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1650"
    -bookCollection: ""
    -pageCount: 25
    -documents: Doctrine\ORM\PersistentCollection {#94897 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94895 …}
  }
  +layout: "vertical"
  +showPrice: true
  +showStatusBadges: true
  +additionalClasses: "h-100 border-0"
  +linkLabel: ""
  +imageFilter: "product_listing_thumbnail"
  +hasStretchedLink: true
  +backgroundColor: "white"
  +hoverType: "border-black"
}

[
  "product" => App\Entity\Product\Product {#94820
    #id: 10028
    #code: "IEEE00003474"
    #attributes: Doctrine\ORM\PersistentCollection {#94883 …}
    #variants: Doctrine\ORM\PersistentCollection {#94881 …}
    #options: Doctrine\ORM\PersistentCollection {#94877 …}
    #associations: Doctrine\ORM\PersistentCollection {#94879 …}
    #createdAt: DateTime @1751038758 {#94816
      date: 2025-06-27 17:39:18.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#94827
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94893 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95140
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94820}
        #id: 35121
        #name: "IEEE 1650:2005"
        #slug: "ieee-1650-2005-ieee00003474-241680"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Recommended methods and standardized reporting practices for electrical characterization of carbon nanotubes are covered. Due to the nature of carbon nanotubes, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for carbon nanotubes. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring carbon nanotubes.<br />\n
          \t\t\t\t<br />\n
          This project will develop standard methods for the electrical characterization of carbon nanotubes (CNTs). The methods will be independent of processing routes used to fabricate the CNT's.<br />\n
          There is currently no defined standard for the electrical characterization of CNT's and the means of reporting performance and other data. Without openly defined standard test methods the acceptance and diffusion of CNT technology will be severely impeded. This is intended to provide and suggest procedures for characterization and reporting of data. These methods will enable the creation of a suggested reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will recommend the necessary tools and procedures for validation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94891 …}
    #channels: Doctrine\ORM\PersistentCollection {#94885 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94889 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94887 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94899 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94831
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#94834
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1136761200 {#94832
      date: 2006-01-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1573081200 {#94830
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1650"
    -bookCollection: ""
    -pageCount: 25
    -documents: Doctrine\ORM\PersistentCollection {#94897 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94895 …}
  }
]

[
  "showFullLabel" => false
]

App\Twig\Components\ProductState {#95147
  +product: App\Entity\Product\Product {#94820
    #id: 10028
    #code: "IEEE00003474"
    #attributes: Doctrine\ORM\PersistentCollection {#94883 …}
    #variants: Doctrine\ORM\PersistentCollection {#94881 …}
    #options: Doctrine\ORM\PersistentCollection {#94877 …}
    #associations: Doctrine\ORM\PersistentCollection {#94879 …}
    #createdAt: DateTime @1751038758 {#94816
      date: 2025-06-27 17:39:18.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#94827
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94893 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95140
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94820}
        #id: 35121
        #name: "IEEE 1650:2005"
        #slug: "ieee-1650-2005-ieee00003474-241680"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Recommended methods and standardized reporting practices for electrical characterization of carbon nanotubes are covered. Due to the nature of carbon nanotubes, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for carbon nanotubes. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring carbon nanotubes.<br />\n
          \t\t\t\t<br />\n
          This project will develop standard methods for the electrical characterization of carbon nanotubes (CNTs). The methods will be independent of processing routes used to fabricate the CNT's.<br />\n
          There is currently no defined standard for the electrical characterization of CNT's and the means of reporting performance and other data. Without openly defined standard test methods the acceptance and diffusion of CNT technology will be severely impeded. This is intended to provide and suggest procedures for characterization and reporting of data. These methods will enable the creation of a suggested reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will recommend the necessary tools and procedures for validation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94891 …}
    #channels: Doctrine\ORM\PersistentCollection {#94885 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94889 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94887 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94899 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94831
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#94834
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1136761200 {#94832
      date: 2006-01-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1573081200 {#94830
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1650"
    -bookCollection: ""
    -pageCount: 25
    -documents: Doctrine\ORM\PersistentCollection {#94897 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94895 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#94820
    #id: 10028
    #code: "IEEE00003474"
    #attributes: Doctrine\ORM\PersistentCollection {#94883 …}
    #variants: Doctrine\ORM\PersistentCollection {#94881 …}
    #options: Doctrine\ORM\PersistentCollection {#94877 …}
    #associations: Doctrine\ORM\PersistentCollection {#94879 …}
    #createdAt: DateTime @1751038758 {#94816
      date: 2025-06-27 17:39:18.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#94827
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94893 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95140
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94820}
        #id: 35121
        #name: "IEEE 1650:2005"
        #slug: "ieee-1650-2005-ieee00003474-241680"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Recommended methods and standardized reporting practices for electrical characterization of carbon nanotubes are covered. Due to the nature of carbon nanotubes, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for carbon nanotubes. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring carbon nanotubes.<br />\n
          \t\t\t\t<br />\n
          This project will develop standard methods for the electrical characterization of carbon nanotubes (CNTs). The methods will be independent of processing routes used to fabricate the CNT's.<br />\n
          There is currently no defined standard for the electrical characterization of CNT's and the means of reporting performance and other data. Without openly defined standard test methods the acceptance and diffusion of CNT technology will be severely impeded. This is intended to provide and suggest procedures for characterization and reporting of data. These methods will enable the creation of a suggested reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will recommend the necessary tools and procedures for validation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94891 …}
    #channels: Doctrine\ORM\PersistentCollection {#94885 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94889 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94887 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94899 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94831
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#94834
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1136761200 {#94832
      date: 2006-01-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1573081200 {#94830
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1650"
    -bookCollection: ""
    -pageCount: 25
    -documents: Doctrine\ORM\PersistentCollection {#94897 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94895 …}
  }
]

App\Twig\Components\ProductMostRecent {#95241
  +product: App\Entity\Product\Product {#94820
    #id: 10028
    #code: "IEEE00003474"
    #attributes: Doctrine\ORM\PersistentCollection {#94883 …}
    #variants: Doctrine\ORM\PersistentCollection {#94881 …}
    #options: Doctrine\ORM\PersistentCollection {#94877 …}
    #associations: Doctrine\ORM\PersistentCollection {#94879 …}
    #createdAt: DateTime @1751038758 {#94816
      date: 2025-06-27 17:39:18.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#94827
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94893 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95140
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94820}
        #id: 35121
        #name: "IEEE 1650:2005"
        #slug: "ieee-1650-2005-ieee00003474-241680"
        #description: """
          New IEEE Standard - Inactive-Reserved.<br />\n
          Recommended methods and standardized reporting practices for electrical characterization of carbon nanotubes are covered. Due to the nature of carbon nanotubes, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for carbon nanotubes. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring carbon nanotubes.<br />\n
          \t\t\t\t<br />\n
          This project will develop standard methods for the electrical characterization of carbon nanotubes (CNTs). The methods will be independent of processing routes used to fabricate the CNT's.<br />\n
          There is currently no defined standard for the electrical characterization of CNT's and the means of reporting performance and other data. Without openly defined standard test methods the acceptance and diffusion of CNT technology will be severely impeded. This is intended to provide and suggest procedures for characterization and reporting of data. These methods will enable the creation of a suggested reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will recommend the necessary tools and procedures for validation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94891 …}
    #channels: Doctrine\ORM\PersistentCollection {#94885 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94889 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94887 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94899 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94831
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1580338800 {#94834
      date: 2020-01-30 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1136761200 {#94832
      date: 2006-01-09 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1573081200 {#94830
      date: 2019-11-07 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1650"
    -bookCollection: ""
    -pageCount: 25
    -documents: Doctrine\ORM\PersistentCollection {#94897 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94895 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#94848
    #id: 10848
    #code: "IEEE00005171"
    #attributes: Doctrine\ORM\PersistentCollection {#94865 …}
    #variants: Doctrine\ORM\PersistentCollection {#94867 …}
    #options: Doctrine\ORM\PersistentCollection {#94902 …}
    #associations: Doctrine\ORM\PersistentCollection {#94869 …}
    #createdAt: DateTime @1751039321 {#94875
      date: 2025-06-27 17:48:41.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94874
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94857 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95454
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94848}
        #id: 38401
        #name: "IEEE 1906.1:2015"
        #slug: "ieee-1906-1-2015-ieee00005171-242500"
        #description: """
          New IEEE Standard - Active.<br />\n
          A definition, terminology, conceptual model, and standard metrics for ad hoc network communication at the nanoscale are provided. Human-engineered networking is extended by the physical properties of nanoscale communication in ways beyond that defined in existing<br />\n
          communication standards. These include in vivo, sub-cellular medical communication, smart materials and sensing at the molecular level, and the ability to operate in environments that would be too harsh for macroscale communication mechanisms to operate. Collaboration among a highly diverse set of disciplines with differing definitions and connotations for some terms is required by nanoscale communication, thus a common terminology is necessary in order to aid inter-discipline collaboration. A common framework for thinking abstractly about nanoscale communication can aid in defining and relating research and development effort. Components of the framework are independent enough to allow them to be developed in relative isolation, yet the components are also interoperable. To illustrate the recommended practice, example mappings between specific nanoscale communication use-cases and the common framework are included. Simulation code implementing the common framework for both wireless and molecular nanoscale communication is an embodiment of the common framework demonstrating precisely how the framework is applied.<br />\n
          \t\t\t\t<br />\n
          This recommended practice contains a conceptual model and a standard terminology for ad hoc network communication at the nanoscale. More specifically, this recommended practice contains: a) the definition of nanoscale communication networking; b) the conceptual model for ad hoc nanoscale communication networking; c) the common terminology for nanoscale communication networking, including: 1) the definition of a nanoscale communication channel highlighting the fundamental differences from a macroscale channel; 2) abstract nanoscale communication channel interfaces with nanoscale systems; 3) performance metrics common to ad hoc nanoscale communication networks; 4) the mapping between nanoscale and traditional communication networks, including necessary high-level components such as a map of major components: coding and packets, addressing, routing, localization, layering, and reliability;<br />\n
          A common framework greatly aids in communicating ideas among researchers from diverse fields and developing useful simulators for nanoscale communication. This includes interconnecting systems of multiple types of nanoscale simulators. A common abstract model enables theoretical progress to proceed from different disciplines with a common language. This framework serves as a recommended practice for additional nanoscale communication networking standards as industry becomes more involved in commercial integration of the technology. Nanoscale communication standards are needed by the biomedical industry to create break-through diagnostic and treatment methods. Technical discussions and establishment of standards in nanoscale communications are impaired by lack of a common conceptual model and common nomenclature. This standard will enable research and development in this area by focusing industry and academia on a common conceptual model, common language, and nomenclature for nanoscale communications. IEEE Std 1906.1 will allow a family of standards to be developed that will lead to creation of the nanoscale communications mechanisms for various applications. The stakeholders are broad, including the telecommunications industry, computer industry, biological and medical devices industry, and material science-related industries as some of the most obvious beneficiaries.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Recommended Practice for Nanoscale and Molecular Communication Framework"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94856 …}
    #channels: Doctrine\ORM\PersistentCollection {#94863 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94859 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94861 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94847 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94873
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94872
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1452466800 {#94871
      date: 2016-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1452466800 {#94870
      date: 2016-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1906.1"
    -bookCollection: ""
    -pageCount: 64
    -documents: Doctrine\ORM\PersistentCollection {#94842 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94840 …}
  }
  "layout" => "vertical"
  "showPrice" => true
  "showStatusBadges" => true
  "imageFilter" => "product_listing_thumbnail"
  "additionalClasses" => "h-100 border-0"
  "hasStretchedLink" => true
  "backgroundColor" => "secondary-lighter"
  "hoverType" => "border-black"
]

App\Twig\Components\ProductCard {#95432
  +product: App\Entity\Product\Product {#94848
    #id: 10848
    #code: "IEEE00005171"
    #attributes: Doctrine\ORM\PersistentCollection {#94865 …}
    #variants: Doctrine\ORM\PersistentCollection {#94867 …}
    #options: Doctrine\ORM\PersistentCollection {#94902 …}
    #associations: Doctrine\ORM\PersistentCollection {#94869 …}
    #createdAt: DateTime @1751039321 {#94875
      date: 2025-06-27 17:48:41.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94874
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94857 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95454
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94848}
        #id: 38401
        #name: "IEEE 1906.1:2015"
        #slug: "ieee-1906-1-2015-ieee00005171-242500"
        #description: """
          New IEEE Standard - Active.<br />\n
          A definition, terminology, conceptual model, and standard metrics for ad hoc network communication at the nanoscale are provided. Human-engineered networking is extended by the physical properties of nanoscale communication in ways beyond that defined in existing<br />\n
          communication standards. These include in vivo, sub-cellular medical communication, smart materials and sensing at the molecular level, and the ability to operate in environments that would be too harsh for macroscale communication mechanisms to operate. Collaboration among a highly diverse set of disciplines with differing definitions and connotations for some terms is required by nanoscale communication, thus a common terminology is necessary in order to aid inter-discipline collaboration. A common framework for thinking abstractly about nanoscale communication can aid in defining and relating research and development effort. Components of the framework are independent enough to allow them to be developed in relative isolation, yet the components are also interoperable. To illustrate the recommended practice, example mappings between specific nanoscale communication use-cases and the common framework are included. Simulation code implementing the common framework for both wireless and molecular nanoscale communication is an embodiment of the common framework demonstrating precisely how the framework is applied.<br />\n
          \t\t\t\t<br />\n
          This recommended practice contains a conceptual model and a standard terminology for ad hoc network communication at the nanoscale. More specifically, this recommended practice contains: a) the definition of nanoscale communication networking; b) the conceptual model for ad hoc nanoscale communication networking; c) the common terminology for nanoscale communication networking, including: 1) the definition of a nanoscale communication channel highlighting the fundamental differences from a macroscale channel; 2) abstract nanoscale communication channel interfaces with nanoscale systems; 3) performance metrics common to ad hoc nanoscale communication networks; 4) the mapping between nanoscale and traditional communication networks, including necessary high-level components such as a map of major components: coding and packets, addressing, routing, localization, layering, and reliability;<br />\n
          A common framework greatly aids in communicating ideas among researchers from diverse fields and developing useful simulators for nanoscale communication. This includes interconnecting systems of multiple types of nanoscale simulators. A common abstract model enables theoretical progress to proceed from different disciplines with a common language. This framework serves as a recommended practice for additional nanoscale communication networking standards as industry becomes more involved in commercial integration of the technology. Nanoscale communication standards are needed by the biomedical industry to create break-through diagnostic and treatment methods. Technical discussions and establishment of standards in nanoscale communications are impaired by lack of a common conceptual model and common nomenclature. This standard will enable research and development in this area by focusing industry and academia on a common conceptual model, common language, and nomenclature for nanoscale communications. IEEE Std 1906.1 will allow a family of standards to be developed that will lead to creation of the nanoscale communications mechanisms for various applications. The stakeholders are broad, including the telecommunications industry, computer industry, biological and medical devices industry, and material science-related industries as some of the most obvious beneficiaries.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Recommended Practice for Nanoscale and Molecular Communication Framework"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94856 …}
    #channels: Doctrine\ORM\PersistentCollection {#94863 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94859 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94861 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94847 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94873
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94872
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1452466800 {#94871
      date: 2016-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1452466800 {#94870
      date: 2016-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1906.1"
    -bookCollection: ""
    -pageCount: 64
    -documents: Doctrine\ORM\PersistentCollection {#94842 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94840 …}
  }
  +layout: "vertical"
  +showPrice: true
  +showStatusBadges: true
  +additionalClasses: "h-100 border-0"
  +linkLabel: ""
  +imageFilter: "product_listing_thumbnail"
  +hasStretchedLink: true
  +backgroundColor: "secondary-lighter"
  +hoverType: "border-black"
}

[
  "product" => App\Entity\Product\Product {#94848
    #id: 10848
    #code: "IEEE00005171"
    #attributes: Doctrine\ORM\PersistentCollection {#94865 …}
    #variants: Doctrine\ORM\PersistentCollection {#94867 …}
    #options: Doctrine\ORM\PersistentCollection {#94902 …}
    #associations: Doctrine\ORM\PersistentCollection {#94869 …}
    #createdAt: DateTime @1751039321 {#94875
      date: 2025-06-27 17:48:41.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94874
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94857 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95454
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94848}
        #id: 38401
        #name: "IEEE 1906.1:2015"
        #slug: "ieee-1906-1-2015-ieee00005171-242500"
        #description: """
          New IEEE Standard - Active.<br />\n
          A definition, terminology, conceptual model, and standard metrics for ad hoc network communication at the nanoscale are provided. Human-engineered networking is extended by the physical properties of nanoscale communication in ways beyond that defined in existing<br />\n
          communication standards. These include in vivo, sub-cellular medical communication, smart materials and sensing at the molecular level, and the ability to operate in environments that would be too harsh for macroscale communication mechanisms to operate. Collaboration among a highly diverse set of disciplines with differing definitions and connotations for some terms is required by nanoscale communication, thus a common terminology is necessary in order to aid inter-discipline collaboration. A common framework for thinking abstractly about nanoscale communication can aid in defining and relating research and development effort. Components of the framework are independent enough to allow them to be developed in relative isolation, yet the components are also interoperable. To illustrate the recommended practice, example mappings between specific nanoscale communication use-cases and the common framework are included. Simulation code implementing the common framework for both wireless and molecular nanoscale communication is an embodiment of the common framework demonstrating precisely how the framework is applied.<br />\n
          \t\t\t\t<br />\n
          This recommended practice contains a conceptual model and a standard terminology for ad hoc network communication at the nanoscale. More specifically, this recommended practice contains: a) the definition of nanoscale communication networking; b) the conceptual model for ad hoc nanoscale communication networking; c) the common terminology for nanoscale communication networking, including: 1) the definition of a nanoscale communication channel highlighting the fundamental differences from a macroscale channel; 2) abstract nanoscale communication channel interfaces with nanoscale systems; 3) performance metrics common to ad hoc nanoscale communication networks; 4) the mapping between nanoscale and traditional communication networks, including necessary high-level components such as a map of major components: coding and packets, addressing, routing, localization, layering, and reliability;<br />\n
          A common framework greatly aids in communicating ideas among researchers from diverse fields and developing useful simulators for nanoscale communication. This includes interconnecting systems of multiple types of nanoscale simulators. A common abstract model enables theoretical progress to proceed from different disciplines with a common language. This framework serves as a recommended practice for additional nanoscale communication networking standards as industry becomes more involved in commercial integration of the technology. Nanoscale communication standards are needed by the biomedical industry to create break-through diagnostic and treatment methods. Technical discussions and establishment of standards in nanoscale communications are impaired by lack of a common conceptual model and common nomenclature. This standard will enable research and development in this area by focusing industry and academia on a common conceptual model, common language, and nomenclature for nanoscale communications. IEEE Std 1906.1 will allow a family of standards to be developed that will lead to creation of the nanoscale communications mechanisms for various applications. The stakeholders are broad, including the telecommunications industry, computer industry, biological and medical devices industry, and material science-related industries as some of the most obvious beneficiaries.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Recommended Practice for Nanoscale and Molecular Communication Framework"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94856 …}
    #channels: Doctrine\ORM\PersistentCollection {#94863 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94859 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94861 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94847 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94873
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94872
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1452466800 {#94871
      date: 2016-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1452466800 {#94870
      date: 2016-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1906.1"
    -bookCollection: ""
    -pageCount: 64
    -documents: Doctrine\ORM\PersistentCollection {#94842 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94840 …}
  }
]

[
  "showFullLabel" => false
]

App\Twig\Components\ProductState {#95468
  +product: App\Entity\Product\Product {#94848
    #id: 10848
    #code: "IEEE00005171"
    #attributes: Doctrine\ORM\PersistentCollection {#94865 …}
    #variants: Doctrine\ORM\PersistentCollection {#94867 …}
    #options: Doctrine\ORM\PersistentCollection {#94902 …}
    #associations: Doctrine\ORM\PersistentCollection {#94869 …}
    #createdAt: DateTime @1751039321 {#94875
      date: 2025-06-27 17:48:41.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94874
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94857 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95454
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94848}
        #id: 38401
        #name: "IEEE 1906.1:2015"
        #slug: "ieee-1906-1-2015-ieee00005171-242500"
        #description: """
          New IEEE Standard - Active.<br />\n
          A definition, terminology, conceptual model, and standard metrics for ad hoc network communication at the nanoscale are provided. Human-engineered networking is extended by the physical properties of nanoscale communication in ways beyond that defined in existing<br />\n
          communication standards. These include in vivo, sub-cellular medical communication, smart materials and sensing at the molecular level, and the ability to operate in environments that would be too harsh for macroscale communication mechanisms to operate. Collaboration among a highly diverse set of disciplines with differing definitions and connotations for some terms is required by nanoscale communication, thus a common terminology is necessary in order to aid inter-discipline collaboration. A common framework for thinking abstractly about nanoscale communication can aid in defining and relating research and development effort. Components of the framework are independent enough to allow them to be developed in relative isolation, yet the components are also interoperable. To illustrate the recommended practice, example mappings between specific nanoscale communication use-cases and the common framework are included. Simulation code implementing the common framework for both wireless and molecular nanoscale communication is an embodiment of the common framework demonstrating precisely how the framework is applied.<br />\n
          \t\t\t\t<br />\n
          This recommended practice contains a conceptual model and a standard terminology for ad hoc network communication at the nanoscale. More specifically, this recommended practice contains: a) the definition of nanoscale communication networking; b) the conceptual model for ad hoc nanoscale communication networking; c) the common terminology for nanoscale communication networking, including: 1) the definition of a nanoscale communication channel highlighting the fundamental differences from a macroscale channel; 2) abstract nanoscale communication channel interfaces with nanoscale systems; 3) performance metrics common to ad hoc nanoscale communication networks; 4) the mapping between nanoscale and traditional communication networks, including necessary high-level components such as a map of major components: coding and packets, addressing, routing, localization, layering, and reliability;<br />\n
          A common framework greatly aids in communicating ideas among researchers from diverse fields and developing useful simulators for nanoscale communication. This includes interconnecting systems of multiple types of nanoscale simulators. A common abstract model enables theoretical progress to proceed from different disciplines with a common language. This framework serves as a recommended practice for additional nanoscale communication networking standards as industry becomes more involved in commercial integration of the technology. Nanoscale communication standards are needed by the biomedical industry to create break-through diagnostic and treatment methods. Technical discussions and establishment of standards in nanoscale communications are impaired by lack of a common conceptual model and common nomenclature. This standard will enable research and development in this area by focusing industry and academia on a common conceptual model, common language, and nomenclature for nanoscale communications. IEEE Std 1906.1 will allow a family of standards to be developed that will lead to creation of the nanoscale communications mechanisms for various applications. The stakeholders are broad, including the telecommunications industry, computer industry, biological and medical devices industry, and material science-related industries as some of the most obvious beneficiaries.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Recommended Practice for Nanoscale and Molecular Communication Framework"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94856 …}
    #channels: Doctrine\ORM\PersistentCollection {#94863 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94859 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94861 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94847 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94873
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94872
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1452466800 {#94871
      date: 2016-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1452466800 {#94870
      date: 2016-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1906.1"
    -bookCollection: ""
    -pageCount: 64
    -documents: Doctrine\ORM\PersistentCollection {#94842 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94840 …}
  }
  +appearance: "state-active"
  +labels: [
    "Active"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#94848
    #id: 10848
    #code: "IEEE00005171"
    #attributes: Doctrine\ORM\PersistentCollection {#94865 …}
    #variants: Doctrine\ORM\PersistentCollection {#94867 …}
    #options: Doctrine\ORM\PersistentCollection {#94902 …}
    #associations: Doctrine\ORM\PersistentCollection {#94869 …}
    #createdAt: DateTime @1751039321 {#94875
      date: 2025-06-27 17:48:41.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94874
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94857 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95454
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94848}
        #id: 38401
        #name: "IEEE 1906.1:2015"
        #slug: "ieee-1906-1-2015-ieee00005171-242500"
        #description: """
          New IEEE Standard - Active.<br />\n
          A definition, terminology, conceptual model, and standard metrics for ad hoc network communication at the nanoscale are provided. Human-engineered networking is extended by the physical properties of nanoscale communication in ways beyond that defined in existing<br />\n
          communication standards. These include in vivo, sub-cellular medical communication, smart materials and sensing at the molecular level, and the ability to operate in environments that would be too harsh for macroscale communication mechanisms to operate. Collaboration among a highly diverse set of disciplines with differing definitions and connotations for some terms is required by nanoscale communication, thus a common terminology is necessary in order to aid inter-discipline collaboration. A common framework for thinking abstractly about nanoscale communication can aid in defining and relating research and development effort. Components of the framework are independent enough to allow them to be developed in relative isolation, yet the components are also interoperable. To illustrate the recommended practice, example mappings between specific nanoscale communication use-cases and the common framework are included. Simulation code implementing the common framework for both wireless and molecular nanoscale communication is an embodiment of the common framework demonstrating precisely how the framework is applied.<br />\n
          \t\t\t\t<br />\n
          This recommended practice contains a conceptual model and a standard terminology for ad hoc network communication at the nanoscale. More specifically, this recommended practice contains: a) the definition of nanoscale communication networking; b) the conceptual model for ad hoc nanoscale communication networking; c) the common terminology for nanoscale communication networking, including: 1) the definition of a nanoscale communication channel highlighting the fundamental differences from a macroscale channel; 2) abstract nanoscale communication channel interfaces with nanoscale systems; 3) performance metrics common to ad hoc nanoscale communication networks; 4) the mapping between nanoscale and traditional communication networks, including necessary high-level components such as a map of major components: coding and packets, addressing, routing, localization, layering, and reliability;<br />\n
          A common framework greatly aids in communicating ideas among researchers from diverse fields and developing useful simulators for nanoscale communication. This includes interconnecting systems of multiple types of nanoscale simulators. A common abstract model enables theoretical progress to proceed from different disciplines with a common language. This framework serves as a recommended practice for additional nanoscale communication networking standards as industry becomes more involved in commercial integration of the technology. Nanoscale communication standards are needed by the biomedical industry to create break-through diagnostic and treatment methods. Technical discussions and establishment of standards in nanoscale communications are impaired by lack of a common conceptual model and common nomenclature. This standard will enable research and development in this area by focusing industry and academia on a common conceptual model, common language, and nomenclature for nanoscale communications. IEEE Std 1906.1 will allow a family of standards to be developed that will lead to creation of the nanoscale communications mechanisms for various applications. The stakeholders are broad, including the telecommunications industry, computer industry, biological and medical devices industry, and material science-related industries as some of the most obvious beneficiaries.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Recommended Practice for Nanoscale and Molecular Communication Framework"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94856 …}
    #channels: Doctrine\ORM\PersistentCollection {#94863 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94859 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94861 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94847 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94873
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94872
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1452466800 {#94871
      date: 2016-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1452466800 {#94870
      date: 2016-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1906.1"
    -bookCollection: ""
    -pageCount: 64
    -documents: Doctrine\ORM\PersistentCollection {#94842 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94840 …}
  }
]

App\Twig\Components\ProductMostRecent {#95542
  +product: App\Entity\Product\Product {#94848
    #id: 10848
    #code: "IEEE00005171"
    #attributes: Doctrine\ORM\PersistentCollection {#94865 …}
    #variants: Doctrine\ORM\PersistentCollection {#94867 …}
    #options: Doctrine\ORM\PersistentCollection {#94902 …}
    #associations: Doctrine\ORM\PersistentCollection {#94869 …}
    #createdAt: DateTime @1751039321 {#94875
      date: 2025-06-27 17:48:41.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94874
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94857 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95454
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94848}
        #id: 38401
        #name: "IEEE 1906.1:2015"
        #slug: "ieee-1906-1-2015-ieee00005171-242500"
        #description: """
          New IEEE Standard - Active.<br />\n
          A definition, terminology, conceptual model, and standard metrics for ad hoc network communication at the nanoscale are provided. Human-engineered networking is extended by the physical properties of nanoscale communication in ways beyond that defined in existing<br />\n
          communication standards. These include in vivo, sub-cellular medical communication, smart materials and sensing at the molecular level, and the ability to operate in environments that would be too harsh for macroscale communication mechanisms to operate. Collaboration among a highly diverse set of disciplines with differing definitions and connotations for some terms is required by nanoscale communication, thus a common terminology is necessary in order to aid inter-discipline collaboration. A common framework for thinking abstractly about nanoscale communication can aid in defining and relating research and development effort. Components of the framework are independent enough to allow them to be developed in relative isolation, yet the components are also interoperable. To illustrate the recommended practice, example mappings between specific nanoscale communication use-cases and the common framework are included. Simulation code implementing the common framework for both wireless and molecular nanoscale communication is an embodiment of the common framework demonstrating precisely how the framework is applied.<br />\n
          \t\t\t\t<br />\n
          This recommended practice contains a conceptual model and a standard terminology for ad hoc network communication at the nanoscale. More specifically, this recommended practice contains: a) the definition of nanoscale communication networking; b) the conceptual model for ad hoc nanoscale communication networking; c) the common terminology for nanoscale communication networking, including: 1) the definition of a nanoscale communication channel highlighting the fundamental differences from a macroscale channel; 2) abstract nanoscale communication channel interfaces with nanoscale systems; 3) performance metrics common to ad hoc nanoscale communication networks; 4) the mapping between nanoscale and traditional communication networks, including necessary high-level components such as a map of major components: coding and packets, addressing, routing, localization, layering, and reliability;<br />\n
          A common framework greatly aids in communicating ideas among researchers from diverse fields and developing useful simulators for nanoscale communication. This includes interconnecting systems of multiple types of nanoscale simulators. A common abstract model enables theoretical progress to proceed from different disciplines with a common language. This framework serves as a recommended practice for additional nanoscale communication networking standards as industry becomes more involved in commercial integration of the technology. Nanoscale communication standards are needed by the biomedical industry to create break-through diagnostic and treatment methods. Technical discussions and establishment of standards in nanoscale communications are impaired by lack of a common conceptual model and common nomenclature. This standard will enable research and development in this area by focusing industry and academia on a common conceptual model, common language, and nomenclature for nanoscale communications. IEEE Std 1906.1 will allow a family of standards to be developed that will lead to creation of the nanoscale communications mechanisms for various applications. The stakeholders are broad, including the telecommunications industry, computer industry, biological and medical devices industry, and material science-related industries as some of the most obvious beneficiaries.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Recommended Practice for Nanoscale and Molecular Communication Framework"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94856 …}
    #channels: Doctrine\ORM\PersistentCollection {#94863 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94859 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94861 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94847 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94873
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94872
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1452466800 {#94871
      date: 2016-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1452466800 {#94870
      date: 2016-01-11 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1906.1"
    -bookCollection: ""
    -pageCount: 64
    -documents: Doctrine\ORM\PersistentCollection {#94842 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94840 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#94909
    #id: 10881
    #code: "IEEE00005231"
    #attributes: Doctrine\ORM\PersistentCollection {#94926 …}
    #variants: Doctrine\ORM\PersistentCollection {#94928 …}
    #options: Doctrine\ORM\PersistentCollection {#94932 …}
    #associations: Doctrine\ORM\PersistentCollection {#94930 …}
    #createdAt: DateTime @1751039342 {#94904
      date: 2025-06-27 17:49:02.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#94905
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94916 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95684
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94909}
        #id: 38533
        #name: "IEEE/IEC 62624:2009"
        #slug: "ieee-iec-62624-2009-ieee00005231-242533"
        #description: """
          Revision Standard - Active.<br />\n
          Adoption of IEEE Std 1650-2005. Recommended methods and standardized reporting practices for electrical characterization of carbon nanotubes (CNTs) are covered. Due to the nature of CNTs, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. The most common sources of measurement error, particularly for highimpedance electrical measurements commonly required for CNTs, are described. Recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring CNTs are given.<br />\n
          \t\t\t\t<br />\n
          This standard provides methods for the electrical characterization of carbon nanotubes(CNTs). The methods will be independent of processing routes used to fabricate the CNTs.<br />\n
          There is currently no defined standard for the electrical characterization of CNTs and the means of reporting performance and other data. Without openly defined standard test methods, the acceptance and diffusion of CNT technology will be severely impeded. This standard is intended to provide and suggest procedures for characterization and reporting of data. These methods will enable the creation of a suggested reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will recommend the necessary tools and procedures for validation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "Test methods for measurement of electrical properties of carbon nanotubes"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94918 …}
    #channels: Doctrine\ORM\PersistentCollection {#94924 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94920 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94922 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94910 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94906
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94907
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1249336800 {#94908
      date: 2009-08-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62624"
    -bookCollection: ""
    -pageCount: 30
    -documents: Doctrine\ORM\PersistentCollection {#94912 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94914 …}
  }
  "layout" => "vertical"
  "showPrice" => true
  "showStatusBadges" => true
  "imageFilter" => "product_listing_thumbnail"
  "additionalClasses" => "h-100 border-0"
  "hasStretchedLink" => true
  "backgroundColor" => "white"
  "hoverType" => "border-black"
]

App\Twig\Components\ProductCard {#95664
  +product: App\Entity\Product\Product {#94909
    #id: 10881
    #code: "IEEE00005231"
    #attributes: Doctrine\ORM\PersistentCollection {#94926 …}
    #variants: Doctrine\ORM\PersistentCollection {#94928 …}
    #options: Doctrine\ORM\PersistentCollection {#94932 …}
    #associations: Doctrine\ORM\PersistentCollection {#94930 …}
    #createdAt: DateTime @1751039342 {#94904
      date: 2025-06-27 17:49:02.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#94905
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94916 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95684
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94909}
        #id: 38533
        #name: "IEEE/IEC 62624:2009"
        #slug: "ieee-iec-62624-2009-ieee00005231-242533"
        #description: """
          Revision Standard - Active.<br />\n
          Adoption of IEEE Std 1650-2005. Recommended methods and standardized reporting practices for electrical characterization of carbon nanotubes (CNTs) are covered. Due to the nature of CNTs, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. The most common sources of measurement error, particularly for highimpedance electrical measurements commonly required for CNTs, are described. Recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring CNTs are given.<br />\n
          \t\t\t\t<br />\n
          This standard provides methods for the electrical characterization of carbon nanotubes(CNTs). The methods will be independent of processing routes used to fabricate the CNTs.<br />\n
          There is currently no defined standard for the electrical characterization of CNTs and the means of reporting performance and other data. Without openly defined standard test methods, the acceptance and diffusion of CNT technology will be severely impeded. This standard is intended to provide and suggest procedures for characterization and reporting of data. These methods will enable the creation of a suggested reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will recommend the necessary tools and procedures for validation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "Test methods for measurement of electrical properties of carbon nanotubes"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94918 …}
    #channels: Doctrine\ORM\PersistentCollection {#94924 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94920 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94922 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94910 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94906
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94907
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1249336800 {#94908
      date: 2009-08-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62624"
    -bookCollection: ""
    -pageCount: 30
    -documents: Doctrine\ORM\PersistentCollection {#94912 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94914 …}
  }
  +layout: "vertical"
  +showPrice: true
  +showStatusBadges: true
  +additionalClasses: "h-100 border-0"
  +linkLabel: ""
  +imageFilter: "product_listing_thumbnail"
  +hasStretchedLink: true
  +backgroundColor: "white"
  +hoverType: "border-black"
}

[
  "product" => App\Entity\Product\Product {#94909
    #id: 10881
    #code: "IEEE00005231"
    #attributes: Doctrine\ORM\PersistentCollection {#94926 …}
    #variants: Doctrine\ORM\PersistentCollection {#94928 …}
    #options: Doctrine\ORM\PersistentCollection {#94932 …}
    #associations: Doctrine\ORM\PersistentCollection {#94930 …}
    #createdAt: DateTime @1751039342 {#94904
      date: 2025-06-27 17:49:02.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#94905
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94916 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95684
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94909}
        #id: 38533
        #name: "IEEE/IEC 62624:2009"
        #slug: "ieee-iec-62624-2009-ieee00005231-242533"
        #description: """
          Revision Standard - Active.<br />\n
          Adoption of IEEE Std 1650-2005. Recommended methods and standardized reporting practices for electrical characterization of carbon nanotubes (CNTs) are covered. Due to the nature of CNTs, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. The most common sources of measurement error, particularly for highimpedance electrical measurements commonly required for CNTs, are described. Recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring CNTs are given.<br />\n
          \t\t\t\t<br />\n
          This standard provides methods for the electrical characterization of carbon nanotubes(CNTs). The methods will be independent of processing routes used to fabricate the CNTs.<br />\n
          There is currently no defined standard for the electrical characterization of CNTs and the means of reporting performance and other data. Without openly defined standard test methods, the acceptance and diffusion of CNT technology will be severely impeded. This standard is intended to provide and suggest procedures for characterization and reporting of data. These methods will enable the creation of a suggested reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will recommend the necessary tools and procedures for validation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "Test methods for measurement of electrical properties of carbon nanotubes"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94918 …}
    #channels: Doctrine\ORM\PersistentCollection {#94924 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94920 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94922 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94910 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94906
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94907
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1249336800 {#94908
      date: 2009-08-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62624"
    -bookCollection: ""
    -pageCount: 30
    -documents: Doctrine\ORM\PersistentCollection {#94912 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94914 …}
  }
]

[
  "showFullLabel" => false
]

App\Twig\Components\ProductState {#95698
  +product: App\Entity\Product\Product {#94909
    #id: 10881
    #code: "IEEE00005231"
    #attributes: Doctrine\ORM\PersistentCollection {#94926 …}
    #variants: Doctrine\ORM\PersistentCollection {#94928 …}
    #options: Doctrine\ORM\PersistentCollection {#94932 …}
    #associations: Doctrine\ORM\PersistentCollection {#94930 …}
    #createdAt: DateTime @1751039342 {#94904
      date: 2025-06-27 17:49:02.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#94905
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94916 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95684
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94909}
        #id: 38533
        #name: "IEEE/IEC 62624:2009"
        #slug: "ieee-iec-62624-2009-ieee00005231-242533"
        #description: """
          Revision Standard - Active.<br />\n
          Adoption of IEEE Std 1650-2005. Recommended methods and standardized reporting practices for electrical characterization of carbon nanotubes (CNTs) are covered. Due to the nature of CNTs, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. The most common sources of measurement error, particularly for highimpedance electrical measurements commonly required for CNTs, are described. Recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring CNTs are given.<br />\n
          \t\t\t\t<br />\n
          This standard provides methods for the electrical characterization of carbon nanotubes(CNTs). The methods will be independent of processing routes used to fabricate the CNTs.<br />\n
          There is currently no defined standard for the electrical characterization of CNTs and the means of reporting performance and other data. Without openly defined standard test methods, the acceptance and diffusion of CNT technology will be severely impeded. This standard is intended to provide and suggest procedures for characterization and reporting of data. These methods will enable the creation of a suggested reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will recommend the necessary tools and procedures for validation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "Test methods for measurement of electrical properties of carbon nanotubes"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94918 …}
    #channels: Doctrine\ORM\PersistentCollection {#94924 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94920 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94922 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94910 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94906
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94907
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1249336800 {#94908
      date: 2009-08-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62624"
    -bookCollection: ""
    -pageCount: 30
    -documents: Doctrine\ORM\PersistentCollection {#94912 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94914 …}
  }
  +appearance: "state-active"
  +labels: [
    "Active"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#94909
    #id: 10881
    #code: "IEEE00005231"
    #attributes: Doctrine\ORM\PersistentCollection {#94926 …}
    #variants: Doctrine\ORM\PersistentCollection {#94928 …}
    #options: Doctrine\ORM\PersistentCollection {#94932 …}
    #associations: Doctrine\ORM\PersistentCollection {#94930 …}
    #createdAt: DateTime @1751039342 {#94904
      date: 2025-06-27 17:49:02.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#94905
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94916 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95684
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94909}
        #id: 38533
        #name: "IEEE/IEC 62624:2009"
        #slug: "ieee-iec-62624-2009-ieee00005231-242533"
        #description: """
          Revision Standard - Active.<br />\n
          Adoption of IEEE Std 1650-2005. Recommended methods and standardized reporting practices for electrical characterization of carbon nanotubes (CNTs) are covered. Due to the nature of CNTs, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. The most common sources of measurement error, particularly for highimpedance electrical measurements commonly required for CNTs, are described. Recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring CNTs are given.<br />\n
          \t\t\t\t<br />\n
          This standard provides methods for the electrical characterization of carbon nanotubes(CNTs). The methods will be independent of processing routes used to fabricate the CNTs.<br />\n
          There is currently no defined standard for the electrical characterization of CNTs and the means of reporting performance and other data. Without openly defined standard test methods, the acceptance and diffusion of CNT technology will be severely impeded. This standard is intended to provide and suggest procedures for characterization and reporting of data. These methods will enable the creation of a suggested reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will recommend the necessary tools and procedures for validation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "Test methods for measurement of electrical properties of carbon nanotubes"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94918 …}
    #channels: Doctrine\ORM\PersistentCollection {#94924 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94920 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94922 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94910 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94906
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94907
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1249336800 {#94908
      date: 2009-08-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62624"
    -bookCollection: ""
    -pageCount: 30
    -documents: Doctrine\ORM\PersistentCollection {#94912 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94914 …}
  }
]

App\Twig\Components\ProductMostRecent {#95772
  +product: App\Entity\Product\Product {#94909
    #id: 10881
    #code: "IEEE00005231"
    #attributes: Doctrine\ORM\PersistentCollection {#94926 …}
    #variants: Doctrine\ORM\PersistentCollection {#94928 …}
    #options: Doctrine\ORM\PersistentCollection {#94932 …}
    #associations: Doctrine\ORM\PersistentCollection {#94930 …}
    #createdAt: DateTime @1751039342 {#94904
      date: 2025-06-27 17:49:02.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#94905
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94916 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95684
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94909}
        #id: 38533
        #name: "IEEE/IEC 62624:2009"
        #slug: "ieee-iec-62624-2009-ieee00005231-242533"
        #description: """
          Revision Standard - Active.<br />\n
          Adoption of IEEE Std 1650-2005. Recommended methods and standardized reporting practices for electrical characterization of carbon nanotubes (CNTs) are covered. Due to the nature of CNTs, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. The most common sources of measurement error, particularly for highimpedance electrical measurements commonly required for CNTs, are described. Recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring CNTs are given.<br />\n
          \t\t\t\t<br />\n
          This standard provides methods for the electrical characterization of carbon nanotubes(CNTs). The methods will be independent of processing routes used to fabricate the CNTs.<br />\n
          There is currently no defined standard for the electrical characterization of CNTs and the means of reporting performance and other data. Without openly defined standard test methods, the acceptance and diffusion of CNT technology will be severely impeded. This standard is intended to provide and suggest procedures for characterization and reporting of data. These methods will enable the creation of a suggested reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will recommend the necessary tools and procedures for validation.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "Test methods for measurement of electrical properties of carbon nanotubes"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94918 …}
    #channels: Doctrine\ORM\PersistentCollection {#94924 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94920 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94922 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94910 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94906
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94907
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1249336800 {#94908
      date: 2009-08-04 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62624"
    -bookCollection: ""
    -pageCount: 30
    -documents: Doctrine\ORM\PersistentCollection {#94912 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94914 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#94939
    #id: 11227
    #code: "IEEE00005771"
    #attributes: Doctrine\ORM\PersistentCollection {#94956 …}
    #variants: Doctrine\ORM\PersistentCollection {#94958 …}
    #options: Doctrine\ORM\PersistentCollection {#94962 …}
    #associations: Doctrine\ORM\PersistentCollection {#94960 …}
    #createdAt: DateTime @1751039559 {#94934
      date: 2025-06-27 17:52:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94935
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94946 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95914
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94939}
        #id: 39917
        #name: "IEEE/IEC 62860:2013"
        #slug: "ieee-iec-62860-2013-ieee00005771-242879"
        #description: """
          Adoption Standard - Active.<br />\n
          Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.<br />\n
          \t\t\t\t<br />\n
          This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n
          The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistors and materials"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94948 …}
    #channels: Doctrine\ORM\PersistentCollection {#94954 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94950 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94952 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94940 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94936
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1632348000 {#94937
      date: 2021-09-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1375135200 {#94938
      date: 2013-07-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62860"
    -bookCollection: ""
    -pageCount: 28
    -documents: Doctrine\ORM\PersistentCollection {#94942 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94944 …}
  }
  "layout" => "vertical"
  "showPrice" => true
  "showStatusBadges" => true
  "imageFilter" => "product_listing_thumbnail"
  "additionalClasses" => "h-100 border-0"
  "hasStretchedLink" => true
  "backgroundColor" => "secondary-lighter"
  "hoverType" => "border-black"
]

App\Twig\Components\ProductCard {#95894
  +product: App\Entity\Product\Product {#94939
    #id: 11227
    #code: "IEEE00005771"
    #attributes: Doctrine\ORM\PersistentCollection {#94956 …}
    #variants: Doctrine\ORM\PersistentCollection {#94958 …}
    #options: Doctrine\ORM\PersistentCollection {#94962 …}
    #associations: Doctrine\ORM\PersistentCollection {#94960 …}
    #createdAt: DateTime @1751039559 {#94934
      date: 2025-06-27 17:52:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94935
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94946 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95914
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94939}
        #id: 39917
        #name: "IEEE/IEC 62860:2013"
        #slug: "ieee-iec-62860-2013-ieee00005771-242879"
        #description: """
          Adoption Standard - Active.<br />\n
          Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.<br />\n
          \t\t\t\t<br />\n
          This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n
          The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistors and materials"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94948 …}
    #channels: Doctrine\ORM\PersistentCollection {#94954 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94950 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94952 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94940 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94936
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1632348000 {#94937
      date: 2021-09-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1375135200 {#94938
      date: 2013-07-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62860"
    -bookCollection: ""
    -pageCount: 28
    -documents: Doctrine\ORM\PersistentCollection {#94942 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94944 …}
  }
  +layout: "vertical"
  +showPrice: true
  +showStatusBadges: true
  +additionalClasses: "h-100 border-0"
  +linkLabel: ""
  +imageFilter: "product_listing_thumbnail"
  +hasStretchedLink: true
  +backgroundColor: "secondary-lighter"
  +hoverType: "border-black"
}

[
  "product" => App\Entity\Product\Product {#94939
    #id: 11227
    #code: "IEEE00005771"
    #attributes: Doctrine\ORM\PersistentCollection {#94956 …}
    #variants: Doctrine\ORM\PersistentCollection {#94958 …}
    #options: Doctrine\ORM\PersistentCollection {#94962 …}
    #associations: Doctrine\ORM\PersistentCollection {#94960 …}
    #createdAt: DateTime @1751039559 {#94934
      date: 2025-06-27 17:52:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94935
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94946 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95914
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94939}
        #id: 39917
        #name: "IEEE/IEC 62860:2013"
        #slug: "ieee-iec-62860-2013-ieee00005771-242879"
        #description: """
          Adoption Standard - Active.<br />\n
          Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.<br />\n
          \t\t\t\t<br />\n
          This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n
          The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistors and materials"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94948 …}
    #channels: Doctrine\ORM\PersistentCollection {#94954 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94950 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94952 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94940 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94936
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1632348000 {#94937
      date: 2021-09-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1375135200 {#94938
      date: 2013-07-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62860"
    -bookCollection: ""
    -pageCount: 28
    -documents: Doctrine\ORM\PersistentCollection {#94942 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94944 …}
  }
]

[
  "showFullLabel" => false
]

App\Twig\Components\ProductState {#95928
  +product: App\Entity\Product\Product {#94939
    #id: 11227
    #code: "IEEE00005771"
    #attributes: Doctrine\ORM\PersistentCollection {#94956 …}
    #variants: Doctrine\ORM\PersistentCollection {#94958 …}
    #options: Doctrine\ORM\PersistentCollection {#94962 …}
    #associations: Doctrine\ORM\PersistentCollection {#94960 …}
    #createdAt: DateTime @1751039559 {#94934
      date: 2025-06-27 17:52:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94935
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94946 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95914
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94939}
        #id: 39917
        #name: "IEEE/IEC 62860:2013"
        #slug: "ieee-iec-62860-2013-ieee00005771-242879"
        #description: """
          Adoption Standard - Active.<br />\n
          Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.<br />\n
          \t\t\t\t<br />\n
          This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n
          The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistors and materials"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94948 …}
    #channels: Doctrine\ORM\PersistentCollection {#94954 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94950 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94952 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94940 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94936
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1632348000 {#94937
      date: 2021-09-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1375135200 {#94938
      date: 2013-07-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62860"
    -bookCollection: ""
    -pageCount: 28
    -documents: Doctrine\ORM\PersistentCollection {#94942 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94944 …}
  }
  +appearance: "state-active"
  +labels: [
    "Active"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#94939
    #id: 11227
    #code: "IEEE00005771"
    #attributes: Doctrine\ORM\PersistentCollection {#94956 …}
    #variants: Doctrine\ORM\PersistentCollection {#94958 …}
    #options: Doctrine\ORM\PersistentCollection {#94962 …}
    #associations: Doctrine\ORM\PersistentCollection {#94960 …}
    #createdAt: DateTime @1751039559 {#94934
      date: 2025-06-27 17:52:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94935
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94946 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95914
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94939}
        #id: 39917
        #name: "IEEE/IEC 62860:2013"
        #slug: "ieee-iec-62860-2013-ieee00005771-242879"
        #description: """
          Adoption Standard - Active.<br />\n
          Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.<br />\n
          \t\t\t\t<br />\n
          This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n
          The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistors and materials"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94948 …}
    #channels: Doctrine\ORM\PersistentCollection {#94954 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94950 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94952 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94940 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94936
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1632348000 {#94937
      date: 2021-09-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1375135200 {#94938
      date: 2013-07-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62860"
    -bookCollection: ""
    -pageCount: 28
    -documents: Doctrine\ORM\PersistentCollection {#94942 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94944 …}
  }
]

App\Twig\Components\ProductMostRecent {#96002
  +product: App\Entity\Product\Product {#94939
    #id: 11227
    #code: "IEEE00005771"
    #attributes: Doctrine\ORM\PersistentCollection {#94956 …}
    #variants: Doctrine\ORM\PersistentCollection {#94958 …}
    #options: Doctrine\ORM\PersistentCollection {#94962 …}
    #associations: Doctrine\ORM\PersistentCollection {#94960 …}
    #createdAt: DateTime @1751039559 {#94934
      date: 2025-06-27 17:52:39.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94935
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94946 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#95914
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94939}
        #id: 39917
        #name: "IEEE/IEC 62860:2013"
        #slug: "ieee-iec-62860-2013-ieee00005771-242879"
        #description: """
          Adoption Standard - Active.<br />\n
          Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.<br />\n
          \t\t\t\t<br />\n
          This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n
          The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistors and materials"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94948 …}
    #channels: Doctrine\ORM\PersistentCollection {#94954 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94950 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94952 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94940 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94936
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1632348000 {#94937
      date: 2021-09-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1375135200 {#94938
      date: 2013-07-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62860"
    -bookCollection: ""
    -pageCount: 28
    -documents: Doctrine\ORM\PersistentCollection {#94942 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94944 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#94969
    #id: 11228
    #code: "IEEE00005772"
    #attributes: Doctrine\ORM\PersistentCollection {#94986 …}
    #variants: Doctrine\ORM\PersistentCollection {#94988 …}
    #options: Doctrine\ORM\PersistentCollection {#94992 …}
    #associations: Doctrine\ORM\PersistentCollection {#94990 …}
    #createdAt: DateTime @1751039560 {#94964
      date: 2025-06-27 17:52:40.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94965
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94976 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#96144
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94969}
        #id: 39921
        #name: "IEEE/IEC 62860-1:2013"
        #slug: "ieee-iec-62860-1-2013-ieee00005772-242880"
        #description: """
          Adoption Standard - Active.<br />\n
          Recommended methods and standardized reporting practices for electrical<br />\n
          characterization of printed and organic ring oscillators are covered. Due to the nature of printed<br />\n
          and organic circuits, significant measurement errors can be introduced if the electrical<br />\n
          characterization design-of-experiment is not properly addressed. This standard describes the<br />\n
          most common sources of measurement error, particularly for high-impedance electrical<br />\n
          measurements commonly required for printed and organic ring oscillators. This standard also<br />\n
          gives recommended practices in order to minimize and/or characterize the effect of measurement<br />\n
          artifacts and other sources of error encountered while measuring printed and organic ring<br />\n
          oscillators.<br />\n
          \t\t\t\t<br />\n
          This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n
          The purpose of this standard is to provide a method for systematically characterizing organic transistorbased<br />\n
          ring oscillators. This standard is intended to maximize reproducibility of published results by<br />\n
          providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94978 …}
    #channels: Doctrine\ORM\PersistentCollection {#94984 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94980 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94982 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94970 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94966
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94967
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1375135200 {#94968
      date: 2013-07-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62860-1"
    -bookCollection: ""
    -pageCount: 26
    -documents: Doctrine\ORM\PersistentCollection {#94972 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94974 …}
  }
  "layout" => "vertical"
  "showPrice" => true
  "showStatusBadges" => true
  "imageFilter" => "product_listing_thumbnail"
  "additionalClasses" => "h-100 border-0"
  "hasStretchedLink" => true
  "backgroundColor" => "white"
  "hoverType" => "border-black"
]

App\Twig\Components\ProductCard {#96124
  +product: App\Entity\Product\Product {#94969
    #id: 11228
    #code: "IEEE00005772"
    #attributes: Doctrine\ORM\PersistentCollection {#94986 …}
    #variants: Doctrine\ORM\PersistentCollection {#94988 …}
    #options: Doctrine\ORM\PersistentCollection {#94992 …}
    #associations: Doctrine\ORM\PersistentCollection {#94990 …}
    #createdAt: DateTime @1751039560 {#94964
      date: 2025-06-27 17:52:40.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94965
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94976 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#96144
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94969}
        #id: 39921
        #name: "IEEE/IEC 62860-1:2013"
        #slug: "ieee-iec-62860-1-2013-ieee00005772-242880"
        #description: """
          Adoption Standard - Active.<br />\n
          Recommended methods and standardized reporting practices for electrical<br />\n
          characterization of printed and organic ring oscillators are covered. Due to the nature of printed<br />\n
          and organic circuits, significant measurement errors can be introduced if the electrical<br />\n
          characterization design-of-experiment is not properly addressed. This standard describes the<br />\n
          most common sources of measurement error, particularly for high-impedance electrical<br />\n
          measurements commonly required for printed and organic ring oscillators. This standard also<br />\n
          gives recommended practices in order to minimize and/or characterize the effect of measurement<br />\n
          artifacts and other sources of error encountered while measuring printed and organic ring<br />\n
          oscillators.<br />\n
          \t\t\t\t<br />\n
          This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n
          The purpose of this standard is to provide a method for systematically characterizing organic transistorbased<br />\n
          ring oscillators. This standard is intended to maximize reproducibility of published results by<br />\n
          providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94978 …}
    #channels: Doctrine\ORM\PersistentCollection {#94984 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94980 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94982 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94970 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94966
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94967
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1375135200 {#94968
      date: 2013-07-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62860-1"
    -bookCollection: ""
    -pageCount: 26
    -documents: Doctrine\ORM\PersistentCollection {#94972 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94974 …}
  }
  +layout: "vertical"
  +showPrice: true
  +showStatusBadges: true
  +additionalClasses: "h-100 border-0"
  +linkLabel: ""
  +imageFilter: "product_listing_thumbnail"
  +hasStretchedLink: true
  +backgroundColor: "white"
  +hoverType: "border-black"
}

[
  "product" => App\Entity\Product\Product {#94969
    #id: 11228
    #code: "IEEE00005772"
    #attributes: Doctrine\ORM\PersistentCollection {#94986 …}
    #variants: Doctrine\ORM\PersistentCollection {#94988 …}
    #options: Doctrine\ORM\PersistentCollection {#94992 …}
    #associations: Doctrine\ORM\PersistentCollection {#94990 …}
    #createdAt: DateTime @1751039560 {#94964
      date: 2025-06-27 17:52:40.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94965
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94976 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#96144
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94969}
        #id: 39921
        #name: "IEEE/IEC 62860-1:2013"
        #slug: "ieee-iec-62860-1-2013-ieee00005772-242880"
        #description: """
          Adoption Standard - Active.<br />\n
          Recommended methods and standardized reporting practices for electrical<br />\n
          characterization of printed and organic ring oscillators are covered. Due to the nature of printed<br />\n
          and organic circuits, significant measurement errors can be introduced if the electrical<br />\n
          characterization design-of-experiment is not properly addressed. This standard describes the<br />\n
          most common sources of measurement error, particularly for high-impedance electrical<br />\n
          measurements commonly required for printed and organic ring oscillators. This standard also<br />\n
          gives recommended practices in order to minimize and/or characterize the effect of measurement<br />\n
          artifacts and other sources of error encountered while measuring printed and organic ring<br />\n
          oscillators.<br />\n
          \t\t\t\t<br />\n
          This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n
          The purpose of this standard is to provide a method for systematically characterizing organic transistorbased<br />\n
          ring oscillators. This standard is intended to maximize reproducibility of published results by<br />\n
          providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94978 …}
    #channels: Doctrine\ORM\PersistentCollection {#94984 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94980 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94982 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94970 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94966
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94967
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1375135200 {#94968
      date: 2013-07-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62860-1"
    -bookCollection: ""
    -pageCount: 26
    -documents: Doctrine\ORM\PersistentCollection {#94972 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94974 …}
  }
]

[
  "showFullLabel" => false
]

App\Twig\Components\ProductState {#96158
  +product: App\Entity\Product\Product {#94969
    #id: 11228
    #code: "IEEE00005772"
    #attributes: Doctrine\ORM\PersistentCollection {#94986 …}
    #variants: Doctrine\ORM\PersistentCollection {#94988 …}
    #options: Doctrine\ORM\PersistentCollection {#94992 …}
    #associations: Doctrine\ORM\PersistentCollection {#94990 …}
    #createdAt: DateTime @1751039560 {#94964
      date: 2025-06-27 17:52:40.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94965
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94976 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#96144
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94969}
        #id: 39921
        #name: "IEEE/IEC 62860-1:2013"
        #slug: "ieee-iec-62860-1-2013-ieee00005772-242880"
        #description: """
          Adoption Standard - Active.<br />\n
          Recommended methods and standardized reporting practices for electrical<br />\n
          characterization of printed and organic ring oscillators are covered. Due to the nature of printed<br />\n
          and organic circuits, significant measurement errors can be introduced if the electrical<br />\n
          characterization design-of-experiment is not properly addressed. This standard describes the<br />\n
          most common sources of measurement error, particularly for high-impedance electrical<br />\n
          measurements commonly required for printed and organic ring oscillators. This standard also<br />\n
          gives recommended practices in order to minimize and/or characterize the effect of measurement<br />\n
          artifacts and other sources of error encountered while measuring printed and organic ring<br />\n
          oscillators.<br />\n
          \t\t\t\t<br />\n
          This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n
          The purpose of this standard is to provide a method for systematically characterizing organic transistorbased<br />\n
          ring oscillators. This standard is intended to maximize reproducibility of published results by<br />\n
          providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94978 …}
    #channels: Doctrine\ORM\PersistentCollection {#94984 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94980 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94982 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94970 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94966
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94967
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1375135200 {#94968
      date: 2013-07-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62860-1"
    -bookCollection: ""
    -pageCount: 26
    -documents: Doctrine\ORM\PersistentCollection {#94972 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94974 …}
  }
  +appearance: "state-active"
  +labels: [
    "Active"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#94969
    #id: 11228
    #code: "IEEE00005772"
    #attributes: Doctrine\ORM\PersistentCollection {#94986 …}
    #variants: Doctrine\ORM\PersistentCollection {#94988 …}
    #options: Doctrine\ORM\PersistentCollection {#94992 …}
    #associations: Doctrine\ORM\PersistentCollection {#94990 …}
    #createdAt: DateTime @1751039560 {#94964
      date: 2025-06-27 17:52:40.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94965
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94976 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#96144
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94969}
        #id: 39921
        #name: "IEEE/IEC 62860-1:2013"
        #slug: "ieee-iec-62860-1-2013-ieee00005772-242880"
        #description: """
          Adoption Standard - Active.<br />\n
          Recommended methods and standardized reporting practices for electrical<br />\n
          characterization of printed and organic ring oscillators are covered. Due to the nature of printed<br />\n
          and organic circuits, significant measurement errors can be introduced if the electrical<br />\n
          characterization design-of-experiment is not properly addressed. This standard describes the<br />\n
          most common sources of measurement error, particularly for high-impedance electrical<br />\n
          measurements commonly required for printed and organic ring oscillators. This standard also<br />\n
          gives recommended practices in order to minimize and/or characterize the effect of measurement<br />\n
          artifacts and other sources of error encountered while measuring printed and organic ring<br />\n
          oscillators.<br />\n
          \t\t\t\t<br />\n
          This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n
          The purpose of this standard is to provide a method for systematically characterizing organic transistorbased<br />\n
          ring oscillators. This standard is intended to maximize reproducibility of published results by<br />\n
          providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94978 …}
    #channels: Doctrine\ORM\PersistentCollection {#94984 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94980 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94982 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94970 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94966
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94967
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1375135200 {#94968
      date: 2013-07-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62860-1"
    -bookCollection: ""
    -pageCount: 26
    -documents: Doctrine\ORM\PersistentCollection {#94972 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94974 …}
  }
]

App\Twig\Components\ProductMostRecent {#96232
  +product: App\Entity\Product\Product {#94969
    #id: 11228
    #code: "IEEE00005772"
    #attributes: Doctrine\ORM\PersistentCollection {#94986 …}
    #variants: Doctrine\ORM\PersistentCollection {#94988 …}
    #options: Doctrine\ORM\PersistentCollection {#94992 …}
    #associations: Doctrine\ORM\PersistentCollection {#94990 …}
    #createdAt: DateTime @1751039560 {#94964
      date: 2025-06-27 17:52:40.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754608190 {#94965
      date: 2025-08-08 01:09:50.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#94976 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#96144
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94969}
        #id: 39921
        #name: "IEEE/IEC 62860-1:2013"
        #slug: "ieee-iec-62860-1-2013-ieee00005772-242880"
        #description: """
          Adoption Standard - Active.<br />\n
          Recommended methods and standardized reporting practices for electrical<br />\n
          characterization of printed and organic ring oscillators are covered. Due to the nature of printed<br />\n
          and organic circuits, significant measurement errors can be introduced if the electrical<br />\n
          characterization design-of-experiment is not properly addressed. This standard describes the<br />\n
          most common sources of measurement error, particularly for high-impedance electrical<br />\n
          measurements commonly required for printed and organic ring oscillators. This standard also<br />\n
          gives recommended practices in order to minimize and/or characterize the effect of measurement<br />\n
          artifacts and other sources of error encountered while measuring printed and organic ring<br />\n
          oscillators.<br />\n
          \t\t\t\t<br />\n
          This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<br />\n
          The purpose of this standard is to provide a method for systematically characterizing organic transistorbased<br />\n
          ring oscillators. This standard is intended to maximize reproducibility of published results by<br />\n
          providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#94978 …}
    #channels: Doctrine\ORM\PersistentCollection {#94984 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#94980 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#94982 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#94970 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94966
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94967
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1375135200 {#94968
      date: 2013-07-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62860-1"
    -bookCollection: ""
    -pageCount: 26
    -documents: Doctrine\ORM\PersistentCollection {#94972 …}
    -favorites: Doctrine\ORM\PersistentCollection {#94974 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#94999
    #id: 11395
    #code: "IEEE00006049"
    #attributes: Doctrine\ORM\PersistentCollection {#95016 …}
    #variants: Doctrine\ORM\PersistentCollection {#95018 …}
    #options: Doctrine\ORM\PersistentCollection {#95022 …}
    #associations: Doctrine\ORM\PersistentCollection {#95020 …}
    #createdAt: DateTime @1751039678 {#94994
      date: 2025-06-27 17:54:38.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#94995
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#95006 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#96374
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94999}
        #id: 40589
        #name: "IEEE 62659:2015"
        #slug: "ieee-62659-2015-ieee00006049-243047"
        #description: """
          New IEEE Standard - Active.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          This International Standard provides a framework for introducing nanoelectronics into large scale, high volume production in semiconductor manufacturing facilities through the incorporation of nanomaterials (e.g. carbon nanotubes, graphene, quantum dots, etc.). Since semiconductor manufacturing facilities need to incorporate practices that maintain high yields, there are very strict requirements for how manufacturing is performed. Nanomaterials represent a potential contaminant in semiconductor manufacturing facilities and need to be introduced in a structured and methodical way. This International Standard provides steps employed to facilitate the introduction of nanomaterials into the semiconductor manufacturing facilities. This sequence is described below under the areas of raw materials acquisition, materials processing, design, IC fabrication, testing, and end-use. These activities represent the major stages of the supply chain in semiconductor manufacturing facilities.<br />\n
          [Since this document is being developed jointly with IEC, there will be no purpose clause (in accordance with IEC style).]
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC/IEEE International Standard - Nanomanufacturing -- Large scale manufacturing for nanoelectronics"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#95008 …}
    #channels: Doctrine\ORM\PersistentCollection {#95014 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#95010 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#95012 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95000 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94996
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94997
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1443564000 {#94998
      date: 2015-09-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62659"
    -bookCollection: ""
    -pageCount: 16
    -documents: Doctrine\ORM\PersistentCollection {#95002 …}
    -favorites: Doctrine\ORM\PersistentCollection {#95004 …}
  }
  "layout" => "vertical"
  "showPrice" => true
  "showStatusBadges" => true
  "imageFilter" => "product_listing_thumbnail"
  "additionalClasses" => "h-100 border-0"
  "hasStretchedLink" => true
  "backgroundColor" => "secondary-lighter"
  "hoverType" => "border-black"
]

App\Twig\Components\ProductCard {#96354
  +product: App\Entity\Product\Product {#94999
    #id: 11395
    #code: "IEEE00006049"
    #attributes: Doctrine\ORM\PersistentCollection {#95016 …}
    #variants: Doctrine\ORM\PersistentCollection {#95018 …}
    #options: Doctrine\ORM\PersistentCollection {#95022 …}
    #associations: Doctrine\ORM\PersistentCollection {#95020 …}
    #createdAt: DateTime @1751039678 {#94994
      date: 2025-06-27 17:54:38.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#94995
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#95006 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#96374
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#94999}
        #id: 40589
        #name: "IEEE 62659:2015"
        #slug: "ieee-62659-2015-ieee00006049-243047"
        #description: """
          New IEEE Standard - Active.<br />\n
          <br />\n
          \t\t\t\t<br />\n
          This International Standard provides a framework for introducing nanoelectronics into large scale, high volume production in semiconductor manufacturing facilities through the incorporation of nanomaterials (e.g. carbon nanotubes, graphene, quantum dots, etc.). Since semiconductor manufacturing facilities need to incorporate practices that maintain high yields, there are very strict requirements for how manufacturing is performed. Nanomaterials represent a potential contaminant in semiconductor manufacturing facilities and need to be introduced in a structured and methodical way. This International Standard provides steps employed to facilitate the introduction of nanomaterials into the semiconductor manufacturing facilities. This sequence is described below under the areas of raw materials acquisition, materials processing, design, IC fabrication, testing, and end-use. These activities represent the major stages of the supply chain in semiconductor manufacturing facilities.<br />\n
          [Since this document is being developed jointly with IEC, there will be no purpose clause (in accordance with IEC style).]
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEC/IEEE International Standard - Nanomanufacturing -- Large scale manufacturing for nanoelectronics"
        -notes: "Active"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#95008 …}
    #channels: Doctrine\ORM\PersistentCollection {#95014 …}
    #mainTaxon: App\Entity\Taxonomy\Taxon {#8840 …}
    #reviews: Doctrine\ORM\PersistentCollection {#95010 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#95012 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#94900 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#95000 …}
    -apiLastModifiedAt: DateTime @1754517600 {#94996
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#94997
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @1443564000 {#94998
      date: 2015-09-30 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "62659"
    -bookCollection: ""
    -pageCount: 16
    -documents: Doctrine\ORM\PersistentCollection {#95002 …}
    -favorites: Doctrine\ORM\PersistentCollection {#95004 …}
  }
  +layout: "vertical"
  +showPrice: true
  +showStatusBadges: true
  +additionalClasses: "h-100 border-0"
  +linkLabel: ""
  +imageFilter: "product_listing_thumbnail"
  +hasStretchedLink: true
  +backgroundColor: "secondary-lighter"
  +hoverType: "border-black"
}