Symfony Profiler

[
  "product" => App\Entity\Product\Product {#7311
    #id: 10264
    #code: "IEEE00004022"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038949 {#7274
      date: 2025-06-27 17:42:29.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 36065
        #name: "IEEE 1149.4:2010"
        #slug: "ieee-1149-4-2010-ieee00004022-241916"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.<br />\n
          \t\t\t\t<br />\n
          This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended effectively to provide similar facilities for mixed-signal circuits. In addition to testing of interconnections in the conventional sense of IEEE Std 1149.1-2001, the mixed-signal test bus defined by this standard also provides the means for parametric testing and, optionally, the means to access internal test structures. The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration. Further, the standard develops extensions to Boundary-Scan Description Language (BSDL) as a means of describing key aspects of the implementation of this standard within a particular component. At present, the extensions to BSDL defined by this standard specifically omit the description of any and all analog parameters defined by the standard.<br />\n
          Where structures defined by this standard are incorporated into mixed-signal circuits, the testability problems posed by such circuits are mitigated by way of improving the controllability and observability of mixed-signal designs and supporting mixed-signal built-in test structures in order to reduce both test development time and testing costs and to improve test quality. In particular, these standardized test features allow mixed-signal (analog and/or digital) electronic components, printed circuit assemblies, and electronic systems to be accessible to external or built-in test equipment for interconnect test, parametric test, and internal test.<br />\n
          A further purpose of this standard is to define the descriptive elements of BSDL and specified extensions sufficient to support the development of automated test algorithms used for testing interconnections between devices that adhere to this standard and, where practical, between such devices intermixed with devices that incorporate IEEE Std 1149.1 or IEEE Std 1149.6 as well. The descriptive elements defined by this standard also largely support the automated construction of analog tests for external components attached to or between components that implement this standard with the caveat that such tests may subsequently require modification to account for undocumented analog features within the conformant components.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618351200 {#7292
      date: 2021-04-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1300402800 {#7318
      date: 2011-03-18 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#7316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 116
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  "showFullLabel" => "true"
]

[
  "showFullLabel" => "true"
]

App\Twig\Components\ProductState {#93008
  +product: App\Entity\Product\Product {#7311
    #id: 10264
    #code: "IEEE00004022"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038949 {#7274
      date: 2025-06-27 17:42:29.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 36065
        #name: "IEEE 1149.4:2010"
        #slug: "ieee-1149-4-2010-ieee00004022-241916"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.<br />\n
          \t\t\t\t<br />\n
          This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended effectively to provide similar facilities for mixed-signal circuits. In addition to testing of interconnections in the conventional sense of IEEE Std 1149.1-2001, the mixed-signal test bus defined by this standard also provides the means for parametric testing and, optionally, the means to access internal test structures. The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration. Further, the standard develops extensions to Boundary-Scan Description Language (BSDL) as a means of describing key aspects of the implementation of this standard within a particular component. At present, the extensions to BSDL defined by this standard specifically omit the description of any and all analog parameters defined by the standard.<br />\n
          Where structures defined by this standard are incorporated into mixed-signal circuits, the testability problems posed by such circuits are mitigated by way of improving the controllability and observability of mixed-signal designs and supporting mixed-signal built-in test structures in order to reduce both test development time and testing costs and to improve test quality. In particular, these standardized test features allow mixed-signal (analog and/or digital) electronic components, printed circuit assemblies, and electronic systems to be accessible to external or built-in test equipment for interconnect test, parametric test, and internal test.<br />\n
          A further purpose of this standard is to define the descriptive elements of BSDL and specified extensions sufficient to support the development of automated test algorithms used for testing interconnections between devices that adhere to this standard and, where practical, between such devices intermixed with devices that incorporate IEEE Std 1149.1 or IEEE Std 1149.6 as well. The descriptive elements defined by this standard also largely support the automated construction of analog tests for external components attached to or between components that implement this standard with the caveat that such tests may subsequently require modification to account for undocumented analog features within the conformant components.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618351200 {#7292
      date: 2021-04-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1300402800 {#7318
      date: 2011-03-18 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#7316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 116
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#7311
    #id: 10264
    #code: "IEEE00004022"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038949 {#7274
      date: 2025-06-27 17:42:29.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 36065
        #name: "IEEE 1149.4:2010"
        #slug: "ieee-1149-4-2010-ieee00004022-241916"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.<br />\n
          \t\t\t\t<br />\n
          This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended effectively to provide similar facilities for mixed-signal circuits. In addition to testing of interconnections in the conventional sense of IEEE Std 1149.1-2001, the mixed-signal test bus defined by this standard also provides the means for parametric testing and, optionally, the means to access internal test structures. The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration. Further, the standard develops extensions to Boundary-Scan Description Language (BSDL) as a means of describing key aspects of the implementation of this standard within a particular component. At present, the extensions to BSDL defined by this standard specifically omit the description of any and all analog parameters defined by the standard.<br />\n
          Where structures defined by this standard are incorporated into mixed-signal circuits, the testability problems posed by such circuits are mitigated by way of improving the controllability and observability of mixed-signal designs and supporting mixed-signal built-in test structures in order to reduce both test development time and testing costs and to improve test quality. In particular, these standardized test features allow mixed-signal (analog and/or digital) electronic components, printed circuit assemblies, and electronic systems to be accessible to external or built-in test equipment for interconnect test, parametric test, and internal test.<br />\n
          A further purpose of this standard is to define the descriptive elements of BSDL and specified extensions sufficient to support the development of automated test algorithms used for testing interconnections between devices that adhere to this standard and, where practical, between such devices intermixed with devices that incorporate IEEE Std 1149.1 or IEEE Std 1149.6 as well. The descriptive elements defined by this standard also largely support the automated construction of analog tests for external components attached to or between components that implement this standard with the caveat that such tests may subsequently require modification to account for undocumented analog features within the conformant components.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618351200 {#7292
      date: 2021-04-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1300402800 {#7318
      date: 2011-03-18 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#7316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 116
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
]

App\Twig\Components\ProductType {#93188
  +product: App\Entity\Product\Product {#7311
    #id: 10264
    #code: "IEEE00004022"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038949 {#7274
      date: 2025-06-27 17:42:29.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 36065
        #name: "IEEE 1149.4:2010"
        #slug: "ieee-1149-4-2010-ieee00004022-241916"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.<br />\n
          \t\t\t\t<br />\n
          This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended effectively to provide similar facilities for mixed-signal circuits. In addition to testing of interconnections in the conventional sense of IEEE Std 1149.1-2001, the mixed-signal test bus defined by this standard also provides the means for parametric testing and, optionally, the means to access internal test structures. The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration. Further, the standard develops extensions to Boundary-Scan Description Language (BSDL) as a means of describing key aspects of the implementation of this standard within a particular component. At present, the extensions to BSDL defined by this standard specifically omit the description of any and all analog parameters defined by the standard.<br />\n
          Where structures defined by this standard are incorporated into mixed-signal circuits, the testability problems posed by such circuits are mitigated by way of improving the controllability and observability of mixed-signal designs and supporting mixed-signal built-in test structures in order to reduce both test development time and testing costs and to improve test quality. In particular, these standardized test features allow mixed-signal (analog and/or digital) electronic components, printed circuit assemblies, and electronic systems to be accessible to external or built-in test equipment for interconnect test, parametric test, and internal test.<br />\n
          A further purpose of this standard is to define the descriptive elements of BSDL and specified extensions sufficient to support the development of automated test algorithms used for testing interconnections between devices that adhere to this standard and, where practical, between such devices intermixed with devices that incorporate IEEE Std 1149.1 or IEEE Std 1149.6 as well. The descriptive elements defined by this standard also largely support the automated construction of analog tests for external components attached to or between components that implement this standard with the caveat that such tests may subsequently require modification to account for undocumented analog features within the conformant components.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618351200 {#7292
      date: 2021-04-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1300402800 {#7318
      date: 2011-03-18 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#7316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 116
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +label: "Standard"
  -typeAttributeCode: "type"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#7311
    #id: 10264
    #code: "IEEE00004022"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038949 {#7274
      date: 2025-06-27 17:42:29.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 36065
        #name: "IEEE 1149.4:2010"
        #slug: "ieee-1149-4-2010-ieee00004022-241916"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.<br />\n
          \t\t\t\t<br />\n
          This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended effectively to provide similar facilities for mixed-signal circuits. In addition to testing of interconnections in the conventional sense of IEEE Std 1149.1-2001, the mixed-signal test bus defined by this standard also provides the means for parametric testing and, optionally, the means to access internal test structures. The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration. Further, the standard develops extensions to Boundary-Scan Description Language (BSDL) as a means of describing key aspects of the implementation of this standard within a particular component. At present, the extensions to BSDL defined by this standard specifically omit the description of any and all analog parameters defined by the standard.<br />\n
          Where structures defined by this standard are incorporated into mixed-signal circuits, the testability problems posed by such circuits are mitigated by way of improving the controllability and observability of mixed-signal designs and supporting mixed-signal built-in test structures in order to reduce both test development time and testing costs and to improve test quality. In particular, these standardized test features allow mixed-signal (analog and/or digital) electronic components, printed circuit assemblies, and electronic systems to be accessible to external or built-in test equipment for interconnect test, parametric test, and internal test.<br />\n
          A further purpose of this standard is to define the descriptive elements of BSDL and specified extensions sufficient to support the development of automated test algorithms used for testing interconnections between devices that adhere to this standard and, where practical, between such devices intermixed with devices that incorporate IEEE Std 1149.1 or IEEE Std 1149.6 as well. The descriptive elements defined by this standard also largely support the automated construction of analog tests for external components attached to or between components that implement this standard with the caveat that such tests may subsequently require modification to account for undocumented analog features within the conformant components.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618351200 {#7292
      date: 2021-04-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1300402800 {#7318
      date: 2011-03-18 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#7316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 116
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
]

App\Twig\Components\ProductMostRecent {#93263
  +product: App\Entity\Product\Product {#7311
    #id: 10264
    #code: "IEEE00004022"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038949 {#7274
      date: 2025-06-27 17:42:29.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 36065
        #name: "IEEE 1149.4:2010"
        #slug: "ieee-1149-4-2010-ieee00004022-241916"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.<br />\n
          \t\t\t\t<br />\n
          This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended effectively to provide similar facilities for mixed-signal circuits. In addition to testing of interconnections in the conventional sense of IEEE Std 1149.1-2001, the mixed-signal test bus defined by this standard also provides the means for parametric testing and, optionally, the means to access internal test structures. The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration. Further, the standard develops extensions to Boundary-Scan Description Language (BSDL) as a means of describing key aspects of the implementation of this standard within a particular component. At present, the extensions to BSDL defined by this standard specifically omit the description of any and all analog parameters defined by the standard.<br />\n
          Where structures defined by this standard are incorporated into mixed-signal circuits, the testability problems posed by such circuits are mitigated by way of improving the controllability and observability of mixed-signal designs and supporting mixed-signal built-in test structures in order to reduce both test development time and testing costs and to improve test quality. In particular, these standardized test features allow mixed-signal (analog and/or digital) electronic components, printed circuit assemblies, and electronic systems to be accessible to external or built-in test equipment for interconnect test, parametric test, and internal test.<br />\n
          A further purpose of this standard is to define the descriptive elements of BSDL and specified extensions sufficient to support the development of automated test algorithms used for testing interconnections between devices that adhere to this standard and, where practical, between such devices intermixed with devices that incorporate IEEE Std 1149.1 or IEEE Std 1149.6 as well. The descriptive elements defined by this standard also largely support the automated construction of analog tests for external components attached to or between components that implement this standard with the caveat that such tests may subsequently require modification to account for undocumented analog features within the conformant components.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618351200 {#7292
      date: 2021-04-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1300402800 {#7318
      date: 2011-03-18 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#7316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 116
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#100267
    #id: 9154
    #code: "IEEE00001732"
    #attributes: Doctrine\ORM\PersistentCollection {#100250 …}
    #variants: Doctrine\ORM\PersistentCollection {#100247 …}
    #options: Doctrine\ORM\PersistentCollection {#100243 …}
    #associations: Doctrine\ORM\PersistentCollection {#100245 …}
    #createdAt: DateTime @1751038016 {#100275
      date: 2025-06-27 17:26:56.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#100248
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100261 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100285
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100267}
        #id: 31625
        #name: "IEEE 1149.4:1999"
        #slug: "ieee-1149-4-1999-ieee00001732-240806"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.<br />\n
          \t\t\t\t<br />\n
          Interface system between mixed-signal electronic components, assemblies, and systems, and external or built-in-test equipment to provide those components, assemblies, and systems with testability attributes.<br />\n
          To define and describe the signals, functions, and characteristics of the testability bus and to describe how the bus shall be implemented to improve the controllability and observability of mixed-signal designs and to support mixed-signal built-in test structures in order to reduce test development time, testing costs, and improve test quality.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100258 …}
    #channels: Doctrine\ORM\PersistentCollection {#100252 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100256 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100254 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100268 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100235
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#100274
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @953506800 {#100273
      date: 2000-03-20 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 84
    -documents: Doctrine\ORM\PersistentCollection {#100265 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100263 …}
  }
  "showFullLabel" => "true"
]

[
  "showFullLabel" => "true"
]

App\Twig\Components\ProductState {#100321
  +product: App\Entity\Product\Product {#100267
    #id: 9154
    #code: "IEEE00001732"
    #attributes: Doctrine\ORM\PersistentCollection {#100250 …}
    #variants: Doctrine\ORM\PersistentCollection {#100247 …}
    #options: Doctrine\ORM\PersistentCollection {#100243 …}
    #associations: Doctrine\ORM\PersistentCollection {#100245 …}
    #createdAt: DateTime @1751038016 {#100275
      date: 2025-06-27 17:26:56.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#100248
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100261 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100285
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100267}
        #id: 31625
        #name: "IEEE 1149.4:1999"
        #slug: "ieee-1149-4-1999-ieee00001732-240806"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.<br />\n
          \t\t\t\t<br />\n
          Interface system between mixed-signal electronic components, assemblies, and systems, and external or built-in-test equipment to provide those components, assemblies, and systems with testability attributes.<br />\n
          To define and describe the signals, functions, and characteristics of the testability bus and to describe how the bus shall be implemented to improve the controllability and observability of mixed-signal designs and to support mixed-signal built-in test structures in order to reduce test development time, testing costs, and improve test quality.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100258 …}
    #channels: Doctrine\ORM\PersistentCollection {#100252 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100256 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100254 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100268 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100235
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#100274
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @953506800 {#100273
      date: 2000-03-20 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 84
    -documents: Doctrine\ORM\PersistentCollection {#100265 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100263 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#100267
    #id: 9154
    #code: "IEEE00001732"
    #attributes: Doctrine\ORM\PersistentCollection {#100250 …}
    #variants: Doctrine\ORM\PersistentCollection {#100247 …}
    #options: Doctrine\ORM\PersistentCollection {#100243 …}
    #associations: Doctrine\ORM\PersistentCollection {#100245 …}
    #createdAt: DateTime @1751038016 {#100275
      date: 2025-06-27 17:26:56.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#100248
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100261 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100285
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100267}
        #id: 31625
        #name: "IEEE 1149.4:1999"
        #slug: "ieee-1149-4-1999-ieee00001732-240806"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.<br />\n
          \t\t\t\t<br />\n
          Interface system between mixed-signal electronic components, assemblies, and systems, and external or built-in-test equipment to provide those components, assemblies, and systems with testability attributes.<br />\n
          To define and describe the signals, functions, and characteristics of the testability bus and to describe how the bus shall be implemented to improve the controllability and observability of mixed-signal designs and to support mixed-signal built-in test structures in order to reduce test development time, testing costs, and improve test quality.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100258 …}
    #channels: Doctrine\ORM\PersistentCollection {#100252 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100256 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100254 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100268 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100235
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#100274
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @953506800 {#100273
      date: 2000-03-20 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 84
    -documents: Doctrine\ORM\PersistentCollection {#100265 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100263 …}
  }
]

App\Twig\Components\ProductMostRecent {#100388
  +product: App\Entity\Product\Product {#100267
    #id: 9154
    #code: "IEEE00001732"
    #attributes: Doctrine\ORM\PersistentCollection {#100250 …}
    #variants: Doctrine\ORM\PersistentCollection {#100247 …}
    #options: Doctrine\ORM\PersistentCollection {#100243 …}
    #associations: Doctrine\ORM\PersistentCollection {#100245 …}
    #createdAt: DateTime @1751038016 {#100275
      date: 2025-06-27 17:26:56.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#100248
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100261 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100285
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100267}
        #id: 31625
        #name: "IEEE 1149.4:1999"
        #slug: "ieee-1149-4-1999-ieee00001732-240806"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.<br />\n
          \t\t\t\t<br />\n
          Interface system between mixed-signal electronic components, assemblies, and systems, and external or built-in-test equipment to provide those components, assemblies, and systems with testability attributes.<br />\n
          To define and describe the signals, functions, and characteristics of the testability bus and to describe how the bus shall be implemented to improve the controllability and observability of mixed-signal designs and to support mixed-signal built-in test structures in order to reduce test development time, testing costs, and improve test quality.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100258 …}
    #channels: Doctrine\ORM\PersistentCollection {#100252 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100256 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100254 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100268 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100235
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#100274
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @953506800 {#100273
      date: 2000-03-20 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 84
    -documents: Doctrine\ORM\PersistentCollection {#100265 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100263 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#7311
    #id: 10264
    #code: "IEEE00004022"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038949 {#7274
      date: 2025-06-27 17:42:29.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 36065
        #name: "IEEE 1149.4:2010"
        #slug: "ieee-1149-4-2010-ieee00004022-241916"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.<br />\n
          \t\t\t\t<br />\n
          This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended effectively to provide similar facilities for mixed-signal circuits. In addition to testing of interconnections in the conventional sense of IEEE Std 1149.1-2001, the mixed-signal test bus defined by this standard also provides the means for parametric testing and, optionally, the means to access internal test structures. The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration. Further, the standard develops extensions to Boundary-Scan Description Language (BSDL) as a means of describing key aspects of the implementation of this standard within a particular component. At present, the extensions to BSDL defined by this standard specifically omit the description of any and all analog parameters defined by the standard.<br />\n
          Where structures defined by this standard are incorporated into mixed-signal circuits, the testability problems posed by such circuits are mitigated by way of improving the controllability and observability of mixed-signal designs and supporting mixed-signal built-in test structures in order to reduce both test development time and testing costs and to improve test quality. In particular, these standardized test features allow mixed-signal (analog and/or digital) electronic components, printed circuit assemblies, and electronic systems to be accessible to external or built-in test equipment for interconnect test, parametric test, and internal test.<br />\n
          A further purpose of this standard is to define the descriptive elements of BSDL and specified extensions sufficient to support the development of automated test algorithms used for testing interconnections between devices that adhere to this standard and, where practical, between such devices intermixed with devices that incorporate IEEE Std 1149.1 or IEEE Std 1149.6 as well. The descriptive elements defined by this standard also largely support the automated construction of analog tests for external components attached to or between components that implement this standard with the caveat that such tests may subsequently require modification to account for undocumented analog features within the conformant components.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618351200 {#7292
      date: 2021-04-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1300402800 {#7318
      date: 2011-03-18 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#7316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 116
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  "showFullLabel" => "true"
]

[
  "showFullLabel" => "true"
]

App\Twig\Components\ProductState {#106829
  +product: App\Entity\Product\Product {#7311
    #id: 10264
    #code: "IEEE00004022"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038949 {#7274
      date: 2025-06-27 17:42:29.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 36065
        #name: "IEEE 1149.4:2010"
        #slug: "ieee-1149-4-2010-ieee00004022-241916"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.<br />\n
          \t\t\t\t<br />\n
          This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended effectively to provide similar facilities for mixed-signal circuits. In addition to testing of interconnections in the conventional sense of IEEE Std 1149.1-2001, the mixed-signal test bus defined by this standard also provides the means for parametric testing and, optionally, the means to access internal test structures. The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration. Further, the standard develops extensions to Boundary-Scan Description Language (BSDL) as a means of describing key aspects of the implementation of this standard within a particular component. At present, the extensions to BSDL defined by this standard specifically omit the description of any and all analog parameters defined by the standard.<br />\n
          Where structures defined by this standard are incorporated into mixed-signal circuits, the testability problems posed by such circuits are mitigated by way of improving the controllability and observability of mixed-signal designs and supporting mixed-signal built-in test structures in order to reduce both test development time and testing costs and to improve test quality. In particular, these standardized test features allow mixed-signal (analog and/or digital) electronic components, printed circuit assemblies, and electronic systems to be accessible to external or built-in test equipment for interconnect test, parametric test, and internal test.<br />\n
          A further purpose of this standard is to define the descriptive elements of BSDL and specified extensions sufficient to support the development of automated test algorithms used for testing interconnections between devices that adhere to this standard and, where practical, between such devices intermixed with devices that incorporate IEEE Std 1149.1 or IEEE Std 1149.6 as well. The descriptive elements defined by this standard also largely support the automated construction of analog tests for external components attached to or between components that implement this standard with the caveat that such tests may subsequently require modification to account for undocumented analog features within the conformant components.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618351200 {#7292
      date: 2021-04-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1300402800 {#7318
      date: 2011-03-18 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#7316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 116
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +appearance: "state-withdrawn"
  +labels: [
    "Withdrawn"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#7311
    #id: 10264
    #code: "IEEE00004022"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038949 {#7274
      date: 2025-06-27 17:42:29.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 36065
        #name: "IEEE 1149.4:2010"
        #slug: "ieee-1149-4-2010-ieee00004022-241916"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.<br />\n
          \t\t\t\t<br />\n
          This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended effectively to provide similar facilities for mixed-signal circuits. In addition to testing of interconnections in the conventional sense of IEEE Std 1149.1-2001, the mixed-signal test bus defined by this standard also provides the means for parametric testing and, optionally, the means to access internal test structures. The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration. Further, the standard develops extensions to Boundary-Scan Description Language (BSDL) as a means of describing key aspects of the implementation of this standard within a particular component. At present, the extensions to BSDL defined by this standard specifically omit the description of any and all analog parameters defined by the standard.<br />\n
          Where structures defined by this standard are incorporated into mixed-signal circuits, the testability problems posed by such circuits are mitigated by way of improving the controllability and observability of mixed-signal designs and supporting mixed-signal built-in test structures in order to reduce both test development time and testing costs and to improve test quality. In particular, these standardized test features allow mixed-signal (analog and/or digital) electronic components, printed circuit assemblies, and electronic systems to be accessible to external or built-in test equipment for interconnect test, parametric test, and internal test.<br />\n
          A further purpose of this standard is to define the descriptive elements of BSDL and specified extensions sufficient to support the development of automated test algorithms used for testing interconnections between devices that adhere to this standard and, where practical, between such devices intermixed with devices that incorporate IEEE Std 1149.1 or IEEE Std 1149.6 as well. The descriptive elements defined by this standard also largely support the automated construction of analog tests for external components attached to or between components that implement this standard with the caveat that such tests may subsequently require modification to account for undocumented analog features within the conformant components.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618351200 {#7292
      date: 2021-04-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1300402800 {#7318
      date: 2011-03-18 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#7316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 116
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
]

App\Twig\Components\ProductMostRecent {#106871
  +product: App\Entity\Product\Product {#7311
    #id: 10264
    #code: "IEEE00004022"
    #attributes: Doctrine\ORM\PersistentCollection {#7701 …}
    #variants: Doctrine\ORM\PersistentCollection {#7744 …}
    #options: Doctrine\ORM\PersistentCollection {#7916 …}
    #associations: Doctrine\ORM\PersistentCollection {#7900 …}
    #createdAt: DateTime @1751038949 {#7274
      date: 2025-06-27 17:42:29.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#7322
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#7922 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#7921
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#7311}
        #id: 36065
        #name: "IEEE 1149.4:2010"
        #slug: "ieee-1149-4-2010-ieee00004022-241916"
        #description: """
          Revision Standard - Inactive-Reserved.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.<br />\n
          \t\t\t\t<br />\n
          This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended effectively to provide similar facilities for mixed-signal circuits. In addition to testing of interconnections in the conventional sense of IEEE Std 1149.1-2001, the mixed-signal test bus defined by this standard also provides the means for parametric testing and, optionally, the means to access internal test structures. The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration. Further, the standard develops extensions to Boundary-Scan Description Language (BSDL) as a means of describing key aspects of the implementation of this standard within a particular component. At present, the extensions to BSDL defined by this standard specifically omit the description of any and all analog parameters defined by the standard.<br />\n
          Where structures defined by this standard are incorporated into mixed-signal circuits, the testability problems posed by such circuits are mitigated by way of improving the controllability and observability of mixed-signal designs and supporting mixed-signal built-in test structures in order to reduce both test development time and testing costs and to improve test quality. In particular, these standardized test features allow mixed-signal (analog and/or digital) electronic components, printed circuit assemblies, and electronic systems to be accessible to external or built-in test equipment for interconnect test, parametric test, and internal test.<br />\n
          A further purpose of this standard is to define the descriptive elements of BSDL and specified extensions sufficient to support the development of automated test algorithms used for testing interconnections between devices that adhere to this standard and, where practical, between such devices intermixed with devices that incorporate IEEE Std 1149.1 or IEEE Std 1149.6 as well. The descriptive elements defined by this standard also largely support the automated construction of analog tests for external components attached to or between components that implement this standard with the caveat that such tests may subsequently require modification to account for undocumented analog features within the conformant components.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Inactive-Reserved"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#7534 …}
    #channels: Doctrine\ORM\PersistentCollection {#7628 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#7613 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#7645 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7321 …}
    -apiLastModifiedAt: DateTime @1754517600 {#7317
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1618351200 {#7292
      date: 2021-04-14 00:00:00.0 Europe/Paris (+02:00)
    }
    -author: ""
    -publishedAt: DateTime @1300402800 {#7318
      date: 2011-03-18 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: DateTime @1616626800 {#7316
      date: 2021-03-25 00:00:00.0 Europe/Paris (+01:00)
    }
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 116
    -documents: Doctrine\ORM\PersistentCollection {#7465 …}
    -favorites: Doctrine\ORM\PersistentCollection {#7500 …}
  }
  +label: "Most Recent"
  +icon: "check-xs"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#100267
    #id: 9154
    #code: "IEEE00001732"
    #attributes: Doctrine\ORM\PersistentCollection {#100250 …}
    #variants: Doctrine\ORM\PersistentCollection {#100247 …}
    #options: Doctrine\ORM\PersistentCollection {#100243 …}
    #associations: Doctrine\ORM\PersistentCollection {#100245 …}
    #createdAt: DateTime @1751038016 {#100275
      date: 2025-06-27 17:26:56.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#100248
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100261 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100285
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100267}
        #id: 31625
        #name: "IEEE 1149.4:1999"
        #slug: "ieee-1149-4-1999-ieee00001732-240806"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.<br />\n
          \t\t\t\t<br />\n
          Interface system between mixed-signal electronic components, assemblies, and systems, and external or built-in-test equipment to provide those components, assemblies, and systems with testability attributes.<br />\n
          To define and describe the signals, functions, and characteristics of the testability bus and to describe how the bus shall be implemented to improve the controllability and observability of mixed-signal designs and to support mixed-signal built-in test structures in order to reduce test development time, testing costs, and improve test quality.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100258 …}
    #channels: Doctrine\ORM\PersistentCollection {#100252 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100256 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100254 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100268 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100235
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#100274
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @953506800 {#100273
      date: 2000-03-20 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 84
    -documents: Doctrine\ORM\PersistentCollection {#100265 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100263 …}
  }
  "showFullLabel" => "true"
]

[
  "showFullLabel" => "true"
]

App\Twig\Components\ProductState {#106936
  +product: App\Entity\Product\Product {#100267
    #id: 9154
    #code: "IEEE00001732"
    #attributes: Doctrine\ORM\PersistentCollection {#100250 …}
    #variants: Doctrine\ORM\PersistentCollection {#100247 …}
    #options: Doctrine\ORM\PersistentCollection {#100243 …}
    #associations: Doctrine\ORM\PersistentCollection {#100245 …}
    #createdAt: DateTime @1751038016 {#100275
      date: 2025-06-27 17:26:56.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#100248
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100261 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100285
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100267}
        #id: 31625
        #name: "IEEE 1149.4:1999"
        #slug: "ieee-1149-4-1999-ieee00001732-240806"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.<br />\n
          \t\t\t\t<br />\n
          Interface system between mixed-signal electronic components, assemblies, and systems, and external or built-in-test equipment to provide those components, assemblies, and systems with testability attributes.<br />\n
          To define and describe the signals, functions, and characteristics of the testability bus and to describe how the bus shall be implemented to improve the controllability and observability of mixed-signal designs and to support mixed-signal built-in test structures in order to reduce test development time, testing costs, and improve test quality.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100258 …}
    #channels: Doctrine\ORM\PersistentCollection {#100252 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100256 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100254 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100268 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100235
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#100274
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @953506800 {#100273
      date: 2000-03-20 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 84
    -documents: Doctrine\ORM\PersistentCollection {#100265 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100263 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#100267
    #id: 9154
    #code: "IEEE00001732"
    #attributes: Doctrine\ORM\PersistentCollection {#100250 …}
    #variants: Doctrine\ORM\PersistentCollection {#100247 …}
    #options: Doctrine\ORM\PersistentCollection {#100243 …}
    #associations: Doctrine\ORM\PersistentCollection {#100245 …}
    #createdAt: DateTime @1751038016 {#100275
      date: 2025-06-27 17:26:56.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#100248
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100261 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100285
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100267}
        #id: 31625
        #name: "IEEE 1149.4:1999"
        #slug: "ieee-1149-4-1999-ieee00001732-240806"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.<br />\n
          \t\t\t\t<br />\n
          Interface system between mixed-signal electronic components, assemblies, and systems, and external or built-in-test equipment to provide those components, assemblies, and systems with testability attributes.<br />\n
          To define and describe the signals, functions, and characteristics of the testability bus and to describe how the bus shall be implemented to improve the controllability and observability of mixed-signal designs and to support mixed-signal built-in test structures in order to reduce test development time, testing costs, and improve test quality.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100258 …}
    #channels: Doctrine\ORM\PersistentCollection {#100252 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100256 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100254 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100268 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100235
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#100274
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @953506800 {#100273
      date: 2000-03-20 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 84
    -documents: Doctrine\ORM\PersistentCollection {#100265 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100263 …}
  }
]

App\Twig\Components\ProductMostRecent {#106963
  +product: App\Entity\Product\Product {#100267
    #id: 9154
    #code: "IEEE00001732"
    #attributes: Doctrine\ORM\PersistentCollection {#100250 …}
    #variants: Doctrine\ORM\PersistentCollection {#100247 …}
    #options: Doctrine\ORM\PersistentCollection {#100243 …}
    #associations: Doctrine\ORM\PersistentCollection {#100245 …}
    #createdAt: DateTime @1751038016 {#100275
      date: 2025-06-27 17:26:56.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607004 {#100248
      date: 2025-08-08 00:50:04.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#100261 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#100285
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#100267}
        #id: 31625
        #name: "IEEE 1149.4:1999"
        #slug: "ieee-1149-4-1999-ieee00001732-240806"
        #description: """
          New IEEE Standard - Superseded.<br />\n
          The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.<br />\n
          \t\t\t\t<br />\n
          Interface system between mixed-signal electronic components, assemblies, and systems, and external or built-in-test equipment to provide those components, assemblies, and systems with testability attributes.<br />\n
          To define and describe the signals, functions, and characteristics of the testability bus and to describe how the bus shall be implemented to improve the controllability and observability of mixed-signal designs and to support mixed-signal built-in test structures in order to reduce test development time, testing costs, and improve test quality.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard for a Mixed-Signal Test Bus"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#100258 …}
    #channels: Doctrine\ORM\PersistentCollection {#100252 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#100256 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#100254 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#100268 …}
    -apiLastModifiedAt: DateTime @1754517600 {#100235
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#100274
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @953506800 {#100273
      date: 2000-03-20 00:00:00.0 Europe/Paris (+01:00)
    }
    -releasedAt: null
    -confirmedAt: null
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.4"
    -bookCollection: ""
    -pageCount: 84
    -documents: Doctrine\ORM\PersistentCollection {#100265 …}
    -favorites: Doctrine\ORM\PersistentCollection {#100263 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#128428
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#128411 …}
    #variants: Doctrine\ORM\PersistentCollection {#128409 …}
    #options: Doctrine\ORM\PersistentCollection {#128404 …}
    #associations: Doctrine\ORM\PersistentCollection {#128406 …}
    #createdAt: DateTime @1751038014 {#128401
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#128436
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128422 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128513
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128428}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128420 …}
    #channels: Doctrine\ORM\PersistentCollection {#128413 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128417 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128415 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128430 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128387
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#128435
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#128394
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#128407
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#128426 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128424 …}
  }
  "layout" => "vertical"
  "showPrice" => true
  "showStatusBadges" => true
  "additionalClasses" => "product__teaser--with-grey-border"
  "hasStretchedLink" => true
  "hoverType" => "shadow"
  "linkLabel" => "See more"
]

App\Twig\Components\ProductCard {#128484
  +product: App\Entity\Product\Product {#128428
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#128411 …}
    #variants: Doctrine\ORM\PersistentCollection {#128409 …}
    #options: Doctrine\ORM\PersistentCollection {#128404 …}
    #associations: Doctrine\ORM\PersistentCollection {#128406 …}
    #createdAt: DateTime @1751038014 {#128401
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#128436
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128422 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128513
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128428}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128420 …}
    #channels: Doctrine\ORM\PersistentCollection {#128413 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128417 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128415 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128430 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128387
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#128435
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#128394
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#128407
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#128426 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128424 …}
  }
  +layout: "vertical"
  +showPrice: true
  +showStatusBadges: true
  +additionalClasses: "product__teaser--with-grey-border"
  +linkLabel: "See more"
  +imageFilter: "product_thumbnail_teaser"
  +hasStretchedLink: true
  +backgroundColor: "white"
  +hoverType: "shadow"
}

[
  "product" => App\Entity\Product\Product {#128428
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#128411 …}
    #variants: Doctrine\ORM\PersistentCollection {#128409 …}
    #options: Doctrine\ORM\PersistentCollection {#128404 …}
    #associations: Doctrine\ORM\PersistentCollection {#128406 …}
    #createdAt: DateTime @1751038014 {#128401
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#128436
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128422 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128513
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128428}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128420 …}
    #channels: Doctrine\ORM\PersistentCollection {#128413 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128417 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128415 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128430 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128387
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#128435
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#128394
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#128407
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#128426 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128424 …}
  }
]

[
  "showFullLabel" => false
]

App\Twig\Components\ProductState {#128517
  +product: App\Entity\Product\Product {#128428
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#128411 …}
    #variants: Doctrine\ORM\PersistentCollection {#128409 …}
    #options: Doctrine\ORM\PersistentCollection {#128404 …}
    #associations: Doctrine\ORM\PersistentCollection {#128406 …}
    #createdAt: DateTime @1751038014 {#128401
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#128436
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128422 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128513
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128428}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128420 …}
    #channels: Doctrine\ORM\PersistentCollection {#128413 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128417 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128415 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128430 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128387
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#128435
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#128394
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#128407
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#128426 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128424 …}
  }
  +appearance: "state-suspended"
  +labels: [
    "Superseded"
  ]
  -stateAttributeCode: "state"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}

[
  "product" => App\Entity\Product\Product {#128428
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#128411 …}
    #variants: Doctrine\ORM\PersistentCollection {#128409 …}
    #options: Doctrine\ORM\PersistentCollection {#128404 …}
    #associations: Doctrine\ORM\PersistentCollection {#128406 …}
    #createdAt: DateTime @1751038014 {#128401
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#128436
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128422 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128513
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128428}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128420 …}
    #channels: Doctrine\ORM\PersistentCollection {#128413 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128417 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128415 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128430 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128387
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#128435
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#128394
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#128407
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#128426 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128424 …}
  }
]

App\Twig\Components\ProductMostRecent {#128595
  +product: App\Entity\Product\Product {#128428
    #id: 9152
    #code: "IEEE00001728"
    #attributes: Doctrine\ORM\PersistentCollection {#128411 …}
    #variants: Doctrine\ORM\PersistentCollection {#128409 …}
    #options: Doctrine\ORM\PersistentCollection {#128404 …}
    #associations: Doctrine\ORM\PersistentCollection {#128406 …}
    #createdAt: DateTime @1751038014 {#128401
      date: 2025-06-27 17:26:54.0 Europe/Paris (+02:00)
    }
    #updatedAt: DateTime @1754607611 {#128436
      date: 2025-08-08 01:00:11.0 Europe/Paris (+02:00)
    }
    #enabled: true
    #translations: Doctrine\ORM\PersistentCollection {#128422 …}
    #translationsCache: [
      "en_US" => App\Entity\Product\ProductTranslation {#128513
        #locale: "en_US"
        #translatable: App\Entity\Product\Product {#128428}
        #id: 31617
        #name: "IEEE 1149.1:2001 (R2008)"
        #slug: "ieee-1149-1-2001-r2008-ieee00001728-240804"
        #description: """
          Revision Standard - Superseded.<br />\n
          Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.<br />\n
          \t\t\t\t<br />\n
          This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to<br />\n
          — testing the interconnections between integrated circuits once they have been assembled onto a<br />\n
          printed circuit board or other substrate;<br />\n
          — testing the integrated circuit itself; and<br />\n
          — observing or modifying circuit activity during the component's normal operation. The test logic consists of a boundary-scan register and other building blocks and is accessed through a Test Access Port (TAP).<br />\n
          As technology has changed, the original 1149.1 standard does not address the new needs of the end users. The purpose of this PAR is to address these new needs in the IEEE 1149.1 standard. The intended users are silicon vendors, silicon designers, board and system electronic manufacturers and test equiment manufacturers. The benefits are additional capabilities and ease-of-use of 1149.1 for the current technology of mix-signal devices, differential logic and programmable devices.
          """
        #metaKeywords: null
        #metaDescription: null
        #shortDescription: "IEEE Standard Test Access Port and Boundary Scan Architecture"
        -notes: "Superseded"
      }
    ]
    #currentLocale: "en_US"
    #currentTranslation: null
    #fallbackLocale: "en_US"
    #variantSelectionMethod: "match"
    #productTaxons: Doctrine\ORM\PersistentCollection {#128420 …}
    #channels: Doctrine\ORM\PersistentCollection {#128413 …}
    #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7309 …}
    #reviews: Doctrine\ORM\PersistentCollection {#128417 …}
    #averageRating: 0.0
    #images: Doctrine\ORM\PersistentCollection {#128415 …}
    -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7324 …}
    -subscriptionCollections: Doctrine\ORM\PersistentCollection {#128430 …}
    -apiLastModifiedAt: DateTime @1754517600 {#128387
      date: 2025-08-07 00:00:00.0 Europe/Paris (+02:00)
    }
    -lastUpdatedAt: DateTime @1578006000 {#128435
      date: 2020-01-03 00:00:00.0 Europe/Paris (+01:00)
    }
    -author: ""
    -publishedAt: DateTime @995839200 {#128394
      date: 2001-07-23 00:00:00.0 Europe/Paris (+02:00)
    }
    -releasedAt: null
    -confirmedAt: DateTime @1206572400 {#128407
      date: 2008-03-27 00:00:00.0 Europe/Paris (+01:00)
    }
    -canceledAt: null
    -edition: null
    -coreDocument: "1149.1"
    -bookCollection: ""
    -pageCount: 212
    -documents: Doctrine\ORM\PersistentCollection {#128426 …}
    -favorites: Doctrine\ORM\PersistentCollection {#128424 …}
  }
  +label: "Historical"
  +icon: "historical"
  -mostRecentAttributeCode: "most_recent"
  -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …}
}